Product Reliability Monitor Report

Quality & Reliability Quarterly Report
Q2, 2015
Macronix Confidential
The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part
without prior written permission of Macronix.
Page 1 of 8
1. Quality/Reliability monitoring test items and condition-----------------------------------------------------------------------
3
2. Flash Quarterly reliability monitor results
------------------------------------------------------------------------------------
4
2-1. Quality Validation & Early Life Failure Rate ------------------------------------------------------------------------------------
4
2-2. Non-Volatile Memory Cycling Endurance Test----------------------------------------------------------------------------------
4
2-3 Data Retention test--------------------------------------------------------------------------------------------------------------------
5
2-4.Non-Volatile Memory Cycling Endurance Test (For extended temperature products) -------------------------------------
5
2-5. High Temperature Operating Life and High Temperature Storage Life Test------------------------------------------------
5
2-6. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and
Humidity Stress Test ----------------------------------------------------------------------------------------------------------------
6
3. XtraRom Quarterly reliability monitor results---------------------------------------------------------------------------------
6
3-1. Quality Validation & Early Life Failure Rate -----------------------------------------------------------------------------------
6
3-2. High Temperature Operating Life and High Temperature Storage Life Test ------------------------------------------------
7
3-3. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and
Humidity Stress Test ----------------------------------------------------------------------------------------------------------------
7
3-4. Electrostatic Discharge Sensitivity Test-------------------------------------------------------------------------------------------
8
The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part
without prior written permission of Macronix.
Page 2 of 8
1. Quality/Reliability monitoring test items and conditions:
Test Item
Test Method
Test Conditions
Typical Sample Size
(units)
QV
(Quality Validation)
JESD86
Per datasheet, at high/room/cold
temperatures
All samples
ELFR
(Early Life Failure Rate)
JESD22-A108 and
JESD74
125 oC, Vcc(max), 48 hrs
2000
NVCE
(Non-Volatile Memory
Cycling Endurance)
LTDR
(NVM Low Temperature
Retention and Read Disturb)
HTDR
(High Temperature Data
Retention)
HTOL
(High Temperature Operating
Life)
HTSL
(High Temperature Storage
Life)
JESD47
JESD22-A117
AEC-Q100-005D
(For Automotive
Product)
JESD47
JESD22-A117
AEC-Q100-005D
((For Automotive
Product)
JESD47
JESD22-A117
AEC-Q100-005D
(For Automotive
Product)
JESD22-A108
JESD85
AEC-Q100-005D
(For Automotive
Product)
JESD22-A103
Half samples at 25 oC, half samples at max
77
operating Temperature, 1K/10K/100K
Automotive Product: Sum
Program/Erase cycles. For flash products of sample size for HTDR,
only.
LTDR, and HTOL
38
25 oC, Vcc(max), 168hrs/500hrs. For flash
products only.
Automotive Product:154
125 oC, 10hrs/100hrs or equivalent stress
time per lifetime model. For flash products
39
only.
Automotive Product:154
(10 hrs for 100K-cyc, 100 hrs for
1K/10K-cyc)
125 oC, Vcc(max), 168hrs/500hrs/1000hrs
77
Automotive Product:77
150 oC, 168hrs/500hrs/1000hrs
77
TCT(-65 oC to 150 oC) 10 cycles,
All SMD samples before
IR reflow 3 cycles, HTSL 125 oC 24hrs, 30
TCT, PCT, HAST
o
C/60%RH 192hrs (MSL 3)
PC
(Pre-conditioning)
JESD22-A113
TCT
(Temperature Cycle Test)
JESD22-A104
-65oC←→150oC (condition C), 200/500
cycles
77
JESD22-A102
121 oC, 100%RH, 2 atm, 96hrs
77
JESD22-A110
130oC, 85% RH, 33.3 psia, Vcc(max), 96hrs
77
JS-001-2012(HBM)
JESD22-A115 (MM)
JESD22-C101(CDM)
NTD: 1000V or till failure
HBM: 500~2000V or till failure
MM: 50~200V or till failure
CDM:750V or till failure
Optional test in response to specific
customer
3
PCT
(Pressure Cooker Test)
HAST
(Highly Accelerated
Temperature and Humidity
Stress Test)
ESD
(Electro-Static Discharge)
The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part
without prior written permission of Macronix.
Page 3 of 8
2. Flash Quarterly reliability monitor results:
2-1. Quality Validation & Early Life Failure Rate :
Tech.
EPN Code
0.15 µm
0.13 µm
MX29F400CT
MX29LV160DT
MX25L12845E
MX25L3206E
MX25U1635E
MX29GL256EH
MX25L3206E
MX29GL256FH
MX25L12835F
MX25U12835F
MX30LF1G08AA
MX29GL128FH
MX25L51245G
MX30LF4G28AB
MX30LF1G18AC
0.11 µm
75 nm
55 nm
36 nm
*1:
QV
SS
2000
2000
2000
2000
2000
1200
1200
2000
2000
2000
2000
1200
4000
2000
2000
ELFR
Reject
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
SS
2000
2000
2000
*1
*1
*2
*2
2000
2000
*1
*1
*2
*1
2000
2000
Reject
0
0
0
0
0
NA
NA
0
0
0
0
NA
0
0
0
Means the test is “on going”. The results will be updated next quarter. The way of expression is applied to all tables in
this document.
*2
: No ELFR test, the samples are only used for QV and NVCE test.
2-2. Non-Volatile Memory Cycling Endurance Test :
NVCE@25°C
Tech.
EPN Code
SS
Reject
0.15 µm
MX29F400CT
0
*1
0.13 µm
MX29LV160DT
38
0
MX25L12845E
38
0
0.11 µm
MX25L3206E
38
0
MX25U1635E
0
*1
MX29GL256F
38
0
MX25L12835F
38
0
75 nm
MX25U12835F
38
0
MX30LF1G08AA
0
*1
MX29GL128FH
308
0
55 nm
MX25L51245G
0
*1
MX30LF4G28AB
114
0
36 nm
MX30LF1G18AC
114
0
NVCE@85°C
SS
Reject
77
0
39
0
39
0
39
0
0
*1
39
0
39
0
39
0
39
0
NA
*2
0
*1
117
0
117
0
The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part
without prior written permission of Macronix.
Page 4 of 8
2-3.Data Retention Test :
LTDR@25°C 500hrs
HTDR@125°C 100hrs
SS
Reject
SS
Reject
0.13 µm
MX29LV160DT
38
0
39
0
MX25L12845E
38
0
39
0
0.11 µm
MX25L3206E
38
0
39
0
MX25U1635E
0
0
*1
*1
MX29GL256F
38
0
39
0
MX25L12835F
38
0
39
0
75 nm
MX25U12835F
0
0
*1
*1
MX30LF1G08AA
0
0
*1
*1
55 nm
MX25L51245G
0
0
*1
*1
MX30LF4G28AB
114
0
117
0
36 nm
MX30LF1G18AC
0
117
0
*1
2-4. Non-Volatile Memory Cycling Endurance Test (For extended temperature products)
Tech.
EPN Code
Tech.
EPN Code
0.11 µm
75 nm
NVCE@105°C
SS
Reject
308
0
HTDR@150°C 500hrs
SS
Reject
154
0
MX25L3206E
308
0
154
0
MX29GL128FH
462
0
308
0
MX29GL256EH
2-5. High Temperature Operating Life and High Temperature Storage Life Test:
HTOL 1000hrs
HTSL 1000hrs
Tech.
EPN Code
SS
Reject
SS
Reject
0.15 µm
0.13 µm
0.11 µm
75 nm
55 nm
36 nm
MX29F400CT
MX29LV160DT
MX25L12845E
MX25L3206E
MX25U1635E
MX29GL256F
MX25L12835F
MX25U12835F
MX30LF1G08AA
MX25L51245G
MX30LF4G28AB
MX30LF1G18AC
77
77
77
77
*1
77
77
*1
*1
*1
77
*1
0
0
0
0
0
0
0
0
0
0
0
0
77
77
77
77
*1
77
77
*1
*1
*1
77
*1
0
0
0
0
0
0
0
0
0
0
0
0
The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part
without prior written permission of Macronix.
Page 5 of 8
2-6. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated
Temperature and Humidity Stress Test:
PC
Tech.
EPN Code
SS
Reject
0.15 µm MX29F400CT
231
0
0.13 µm MX29LV160DT
231
0
MX25L12845E
231
0
0.11 µm MX25L3206E
231
0
MX25U1635E
231
0
MX29GL256F
231
0
MX25L12835F
231
0
75 nm
MX25U12835F
231
0
MX30LF1G08AA 231
0
55 nm
MX25L51245G
231
0
MX30LF4G28AB 231
0
36 nm
MX30LF1G18AC 231
0
TCT 500cycles
SS
Reject
77
0
77
0
77
0
77
0
0
*1
77
0
77
0
77
0
0
*1
0
*1
77
0
77
0
PCT 96hrs
SS
Reject
77
0
77
0
77
0
77
0
0
*1
77
0
77
0
77
0
77
0
0
*1
77
0
77
0
HAST 96hrs
SS
Reject
77
0
77
0
77
0
77
0
0
*1
77
0
77
0
77
0
77
0
0
*1
77
0
77
0
3. XtraROM Quarterly reliability monitor results:
3-1. Quality Validation & Early Life Failure Rate:
*1:
Tech.
EPN Code
0.18 µm
75 nm
65 nm
45 nm
45 nm
32 nm
32 nm
MX23L6454MC
MX23J51208YC
MX23J4GC0TC
MX23J16GC0TC
MX23S16GFC0TC
MX23J32GC1TC
MX23J16GC0TC
QV
SS
385
385
385
385
4000
6000
2000
ELFR
Reject
0
0
0
0
0
0
0
SS
385
385
385
385
2000
6000
2000
Reject
0
0
0
0
0
0
0
Means the test is “on going”. The results will be updated next quarter. The way of expression is applied to all tables in
this document.
The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part
without prior written permission of Macronix.
Page 6 of 8
3-2. High Temperature Operating Life and High Temperature Storage Life Test:
HTOL 1000hrs
HTSL 1000hrs
Tech.
EPN Code
SS
Reject
SS
Reject
0.18 µm
MX23L6454MC
0
0
*1
*1
75 nm
MX23J51208YC
77
0
77
0
65 nm
MX23J4GC0TC
77
0
77
0
45 nm
MX23J16GC0TC
0
0
*1
*1
45 nm
MX23S16GFC0TC
77
0
77
0
32 nm
MX23J32GC1TC
231
0
231
0
32 nm
MX23J16GC0TC
77
0
77
0
3-3. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated
Temperature and Humidity Stress Test:
PC
Tech.
EPN Code
SS
Reject
0.18 µm MX23L6454MC
75 nm
MX23J51208YC
65 nm
MX23J4GC0TC
45 nm
MX23J16GC0TC
45 nm MX23S16GFC0TC
32 nm
MX23J32GC1TC
32 nm
MX23J16GC0TC
231
231
231
231
462
693
231
0
0
0
0
0
0
0
TCT 500cycles
SS
*1
77
77
*1
77
231
77
PCT 96hrs
HAST 96hrs
Reject
SS
Reject
SS
Reject
0
0
0
0
0
0
0
77
77
77
0
0
0
0
0
0
0
77
77
77
0
0
0
0
0
0
0
*1
77
231
77
*1
77
231
77
The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part
without prior written permission of Macronix.
Page 7 of 8
3-4. Electrostatic Discharge Sensitivity Test:
Tech.
EPN Code
Mode
HBM
75 nm
MX23J51208YC
CDM
NTD
HBM
65 nm
MX23J4GC0TC
CDM
NTD
HBM
45 nm
MX23J16GC0TC
CDM
NTD
HBM
45 nm
MX23S16GFC0TC
CDM
NTD
HBM
MX23J32GC1TC
CDM
NTD
32 nm
HBM
MX23J16GC0TC
CDM
NTD
Classification
2.0 KV
2.5 KV
3.0 KV
0.75 KV
1.0 KV
2.0 KV
2.5 KV
3.0 KV
0.75 KV
1.0 KV
2.0 KV
2.5 KV
3.0 KV
0.75 KV
1.0 KV
2.0 KV
2.5 KV
3.0 KV
0.75 KV
1.0 KV
2.0 KV
2.5 KV
3.0 KV
0.75 KV
1.0 KV
2.0 KV
2.5 KV
3.0 KV
0.75 KV
1.0 KV
SS
3
3
3
3
12
3
3
3
3
12
3
3
3
3
12
3
3
3
3
45
9
9
9
9
36
3
3
3
3
12
Reject
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part
without prior written permission of Macronix.
Page 8 of 8