Quality & Reliability Quarterly Report Q2, 2015 Macronix Confidential The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 1 of 8 1. Quality/Reliability monitoring test items and condition----------------------------------------------------------------------- 3 2. Flash Quarterly reliability monitor results ------------------------------------------------------------------------------------ 4 2-1. Quality Validation & Early Life Failure Rate ------------------------------------------------------------------------------------ 4 2-2. Non-Volatile Memory Cycling Endurance Test---------------------------------------------------------------------------------- 4 2-3 Data Retention test-------------------------------------------------------------------------------------------------------------------- 5 2-4.Non-Volatile Memory Cycling Endurance Test (For extended temperature products) ------------------------------------- 5 2-5. High Temperature Operating Life and High Temperature Storage Life Test------------------------------------------------ 5 2-6. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and Humidity Stress Test ---------------------------------------------------------------------------------------------------------------- 6 3. XtraRom Quarterly reliability monitor results--------------------------------------------------------------------------------- 6 3-1. Quality Validation & Early Life Failure Rate ----------------------------------------------------------------------------------- 6 3-2. High Temperature Operating Life and High Temperature Storage Life Test ------------------------------------------------ 7 3-3. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and Humidity Stress Test ---------------------------------------------------------------------------------------------------------------- 7 3-4. Electrostatic Discharge Sensitivity Test------------------------------------------------------------------------------------------- 8 The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 2 of 8 1. Quality/Reliability monitoring test items and conditions: Test Item Test Method Test Conditions Typical Sample Size (units) QV (Quality Validation) JESD86 Per datasheet, at high/room/cold temperatures All samples ELFR (Early Life Failure Rate) JESD22-A108 and JESD74 125 oC, Vcc(max), 48 hrs 2000 NVCE (Non-Volatile Memory Cycling Endurance) LTDR (NVM Low Temperature Retention and Read Disturb) HTDR (High Temperature Data Retention) HTOL (High Temperature Operating Life) HTSL (High Temperature Storage Life) JESD47 JESD22-A117 AEC-Q100-005D (For Automotive Product) JESD47 JESD22-A117 AEC-Q100-005D ((For Automotive Product) JESD47 JESD22-A117 AEC-Q100-005D (For Automotive Product) JESD22-A108 JESD85 AEC-Q100-005D (For Automotive Product) JESD22-A103 Half samples at 25 oC, half samples at max 77 operating Temperature, 1K/10K/100K Automotive Product: Sum Program/Erase cycles. For flash products of sample size for HTDR, only. LTDR, and HTOL 38 25 oC, Vcc(max), 168hrs/500hrs. For flash products only. Automotive Product:154 125 oC, 10hrs/100hrs or equivalent stress time per lifetime model. For flash products 39 only. Automotive Product:154 (10 hrs for 100K-cyc, 100 hrs for 1K/10K-cyc) 125 oC, Vcc(max), 168hrs/500hrs/1000hrs 77 Automotive Product:77 150 oC, 168hrs/500hrs/1000hrs 77 TCT(-65 oC to 150 oC) 10 cycles, All SMD samples before IR reflow 3 cycles, HTSL 125 oC 24hrs, 30 TCT, PCT, HAST o C/60%RH 192hrs (MSL 3) PC (Pre-conditioning) JESD22-A113 TCT (Temperature Cycle Test) JESD22-A104 -65oC←→150oC (condition C), 200/500 cycles 77 JESD22-A102 121 oC, 100%RH, 2 atm, 96hrs 77 JESD22-A110 130oC, 85% RH, 33.3 psia, Vcc(max), 96hrs 77 JS-001-2012(HBM) JESD22-A115 (MM) JESD22-C101(CDM) NTD: 1000V or till failure HBM: 500~2000V or till failure MM: 50~200V or till failure CDM:750V or till failure Optional test in response to specific customer 3 PCT (Pressure Cooker Test) HAST (Highly Accelerated Temperature and Humidity Stress Test) ESD (Electro-Static Discharge) The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 3 of 8 2. Flash Quarterly reliability monitor results: 2-1. Quality Validation & Early Life Failure Rate : Tech. EPN Code 0.15 µm 0.13 µm MX29F400CT MX29LV160DT MX25L12845E MX25L3206E MX25U1635E MX29GL256EH MX25L3206E MX29GL256FH MX25L12835F MX25U12835F MX30LF1G08AA MX29GL128FH MX25L51245G MX30LF4G28AB MX30LF1G18AC 0.11 µm 75 nm 55 nm 36 nm *1: QV SS 2000 2000 2000 2000 2000 1200 1200 2000 2000 2000 2000 1200 4000 2000 2000 ELFR Reject 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 SS 2000 2000 2000 *1 *1 *2 *2 2000 2000 *1 *1 *2 *1 2000 2000 Reject 0 0 0 0 0 NA NA 0 0 0 0 NA 0 0 0 Means the test is “on going”. The results will be updated next quarter. The way of expression is applied to all tables in this document. *2 : No ELFR test, the samples are only used for QV and NVCE test. 2-2. Non-Volatile Memory Cycling Endurance Test : NVCE@25°C Tech. EPN Code SS Reject 0.15 µm MX29F400CT 0 *1 0.13 µm MX29LV160DT 38 0 MX25L12845E 38 0 0.11 µm MX25L3206E 38 0 MX25U1635E 0 *1 MX29GL256F 38 0 MX25L12835F 38 0 75 nm MX25U12835F 38 0 MX30LF1G08AA 0 *1 MX29GL128FH 308 0 55 nm MX25L51245G 0 *1 MX30LF4G28AB 114 0 36 nm MX30LF1G18AC 114 0 NVCE@85°C SS Reject 77 0 39 0 39 0 39 0 0 *1 39 0 39 0 39 0 39 0 NA *2 0 *1 117 0 117 0 The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 4 of 8 2-3.Data Retention Test : LTDR@25°C 500hrs HTDR@125°C 100hrs SS Reject SS Reject 0.13 µm MX29LV160DT 38 0 39 0 MX25L12845E 38 0 39 0 0.11 µm MX25L3206E 38 0 39 0 MX25U1635E 0 0 *1 *1 MX29GL256F 38 0 39 0 MX25L12835F 38 0 39 0 75 nm MX25U12835F 0 0 *1 *1 MX30LF1G08AA 0 0 *1 *1 55 nm MX25L51245G 0 0 *1 *1 MX30LF4G28AB 114 0 117 0 36 nm MX30LF1G18AC 0 117 0 *1 2-4. Non-Volatile Memory Cycling Endurance Test (For extended temperature products) Tech. EPN Code Tech. EPN Code 0.11 µm 75 nm NVCE@105°C SS Reject 308 0 HTDR@150°C 500hrs SS Reject 154 0 MX25L3206E 308 0 154 0 MX29GL128FH 462 0 308 0 MX29GL256EH 2-5. High Temperature Operating Life and High Temperature Storage Life Test: HTOL 1000hrs HTSL 1000hrs Tech. EPN Code SS Reject SS Reject 0.15 µm 0.13 µm 0.11 µm 75 nm 55 nm 36 nm MX29F400CT MX29LV160DT MX25L12845E MX25L3206E MX25U1635E MX29GL256F MX25L12835F MX25U12835F MX30LF1G08AA MX25L51245G MX30LF4G28AB MX30LF1G18AC 77 77 77 77 *1 77 77 *1 *1 *1 77 *1 0 0 0 0 0 0 0 0 0 0 0 0 77 77 77 77 *1 77 77 *1 *1 *1 77 *1 0 0 0 0 0 0 0 0 0 0 0 0 The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 5 of 8 2-6. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and Humidity Stress Test: PC Tech. EPN Code SS Reject 0.15 µm MX29F400CT 231 0 0.13 µm MX29LV160DT 231 0 MX25L12845E 231 0 0.11 µm MX25L3206E 231 0 MX25U1635E 231 0 MX29GL256F 231 0 MX25L12835F 231 0 75 nm MX25U12835F 231 0 MX30LF1G08AA 231 0 55 nm MX25L51245G 231 0 MX30LF4G28AB 231 0 36 nm MX30LF1G18AC 231 0 TCT 500cycles SS Reject 77 0 77 0 77 0 77 0 0 *1 77 0 77 0 77 0 0 *1 0 *1 77 0 77 0 PCT 96hrs SS Reject 77 0 77 0 77 0 77 0 0 *1 77 0 77 0 77 0 77 0 0 *1 77 0 77 0 HAST 96hrs SS Reject 77 0 77 0 77 0 77 0 0 *1 77 0 77 0 77 0 77 0 0 *1 77 0 77 0 3. XtraROM Quarterly reliability monitor results: 3-1. Quality Validation & Early Life Failure Rate: *1: Tech. EPN Code 0.18 µm 75 nm 65 nm 45 nm 45 nm 32 nm 32 nm MX23L6454MC MX23J51208YC MX23J4GC0TC MX23J16GC0TC MX23S16GFC0TC MX23J32GC1TC MX23J16GC0TC QV SS 385 385 385 385 4000 6000 2000 ELFR Reject 0 0 0 0 0 0 0 SS 385 385 385 385 2000 6000 2000 Reject 0 0 0 0 0 0 0 Means the test is “on going”. The results will be updated next quarter. The way of expression is applied to all tables in this document. The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 6 of 8 3-2. High Temperature Operating Life and High Temperature Storage Life Test: HTOL 1000hrs HTSL 1000hrs Tech. EPN Code SS Reject SS Reject 0.18 µm MX23L6454MC 0 0 *1 *1 75 nm MX23J51208YC 77 0 77 0 65 nm MX23J4GC0TC 77 0 77 0 45 nm MX23J16GC0TC 0 0 *1 *1 45 nm MX23S16GFC0TC 77 0 77 0 32 nm MX23J32GC1TC 231 0 231 0 32 nm MX23J16GC0TC 77 0 77 0 3-3. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and Humidity Stress Test: PC Tech. EPN Code SS Reject 0.18 µm MX23L6454MC 75 nm MX23J51208YC 65 nm MX23J4GC0TC 45 nm MX23J16GC0TC 45 nm MX23S16GFC0TC 32 nm MX23J32GC1TC 32 nm MX23J16GC0TC 231 231 231 231 462 693 231 0 0 0 0 0 0 0 TCT 500cycles SS *1 77 77 *1 77 231 77 PCT 96hrs HAST 96hrs Reject SS Reject SS Reject 0 0 0 0 0 0 0 77 77 77 0 0 0 0 0 0 0 77 77 77 0 0 0 0 0 0 0 *1 77 231 77 *1 77 231 77 The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 7 of 8 3-4. Electrostatic Discharge Sensitivity Test: Tech. EPN Code Mode HBM 75 nm MX23J51208YC CDM NTD HBM 65 nm MX23J4GC0TC CDM NTD HBM 45 nm MX23J16GC0TC CDM NTD HBM 45 nm MX23S16GFC0TC CDM NTD HBM MX23J32GC1TC CDM NTD 32 nm HBM MX23J16GC0TC CDM NTD Classification 2.0 KV 2.5 KV 3.0 KV 0.75 KV 1.0 KV 2.0 KV 2.5 KV 3.0 KV 0.75 KV 1.0 KV 2.0 KV 2.5 KV 3.0 KV 0.75 KV 1.0 KV 2.0 KV 2.5 KV 3.0 KV 0.75 KV 1.0 KV 2.0 KV 2.5 KV 3.0 KV 0.75 KV 1.0 KV 2.0 KV 2.5 KV 3.0 KV 0.75 KV 1.0 KV SS 3 3 3 3 12 3 3 3 3 12 3 3 3 3 12 3 3 3 3 45 9 9 9 9 36 3 3 3 3 12 Reject 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 8 of 8