NTMFS4833N Power MOSFET 30 V, 191 A, Single N−Channel, SO−8FL Features • • • • Low RDS(on) to Minimize Conduction Losses Low Capacitance to Minimize Driver Losses Optimized Gate Charge to Minimize Switching Losses These are Pb−Free Devices http://onsemi.com V(BR)DSS Applications • • • • Refer to Application Note AND8195/D CPU Power Delivery DC−DC Converters Low Side Switching RDS(ON) MAX ID MAX 2.0 mW @ 10 V 30 V 191 A 3.0 mW @ 4.5 V D (5) MAXIMUM RATINGS (TJ = 25°C unless otherwise stated) Parameter Symbol Value Unit Drain−to−Source Voltage VDSS 30 V Gate−to−Source Voltage VGS ±20 V ID 28 A Continuous Drain Current RqJA (Note 1) TA = 25°C Power Dissipation RqJA (Note 1) TA = 25°C PD 2.7 W Continuous Drain Current RqJA (Note 2) TA = 25°C ID 16 A Power Dissipation RqJA (Note 2) TA = 85°C Steady State TA = 85°C N−CHANNEL MOSFET D W Continuous Drain Current RqJC (Note 1) TC = 25°C ID 191 A Power Dissipation RqJC (Note 1) TC = 25°C TC = 85°C 113.6 W IDM 288 A TJ, TSTG −55 to +150 °C IS 104 A Drain to Source dV/dt dV/dt 6 V/ns Single Pulse Drain−to−Source Avalanche Energy (TJ = 25°C, VDD = 30 V, VGS = 10 V, IL = 35 Apk, L = 1.0 mH, RG = 25 W) EAS 612.5 mJ TL 260 °C Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Surface−mounted on FR4 board using 1 sq−in pad, 1 oz Cu. 2. Surface−mounted on FR4 board using the minimum recommended pad size. (Cu area = 50 mm2 [1 oz]) © Semiconductor Components Industries, LLC, 2014 March, 2014 − Rev. 10 SO−8 FLAT LEAD CASE 488AA STYLE 1 D 4833N AYWZZ D D 138 PD Source Current (Body Diode) S S S G 1 1.1 Operating Junction and Storage Temperature MARKING DIAGRAM 12 PD TA = 25°C, tp = 10 ms S (1,2,3) 20.5 TA = 25°C Pulsed Drain Current G (4) 1 A Y W ZZ = Assembly Location = Year = Work Week = Lot Traceability ORDERING INFORMATION Device Package Shipping† NTMFS4833NT1G SO−8FL 1500/Tape & Reel (Pb−Free) NTMFS4833NT3G SO−8FL 5000/Tape & Reel (Pb−Free) †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. Publication Order Number: NTMFS4833N/D NTMFS4833N THERMAL RESISTANCE MAXIMUM RATINGS Symbol Value Junction−to−Case (Drain) Parameter RqJC 1.1 Junction−to−Ambient – Steady State (Note 3) RqJA 45.6 Junction−to−Ambient – t < 10s (Note 3) RqJA 17.1 Junction−to−Ambient – Steady State (Note 4) RqJA 117.4 Unit °C/W 3. Surface−mounted on FR4 board using 1 sq−in pad, 1 oz Cu. 4. Surface−mounted on FR4 board using the minimum recommended pad size. (Cu area = 50 mm2 [1 oz]) ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min Drain−to−Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 250 mA 30 Drain−to−Source Breakdown Voltage Temperature Coefficient V(BR)DSS/ TJ Typ Max Unit OFF CHARACTERISTICS Zero Gate Voltage Drain Current Gate−to−Source Leakage Current IDSS V 17 VGS = 0 V, VDS = 24 V mV/°C TJ = 25 °C 1 TJ = 125°C 10 IGSS VDS = 0 V, VGS = ±20 V VGS(TH) VGS = VDS, ID = 250 mA mA ±100 nA 2.5 V ON CHARACTERISTICS (Note 5) Gate Threshold Voltage Negative Threshold Temperature Coefficient Drain−to−Source On Resistance Forward Transconductance VGS(TH)/TJ RDS(on) 1.5 7.12 VGS = 10 V to 11.5 V ID = 30 A 1.3 ID = 15 A 1.3 VGS = 4.5 V ID = 30 A 2.3 ID = 15 A 2.3 gFS VDS = 15 V, ID = 15 A mV/°C 2.0 3.0 30 mW S CHARGES, CAPACITANCES & GATE RESISTANCE Input Capacitance CISS Output Capacitance COSS Reverse Transfer Capacitance CRSS 650 Total Gate Charge QG(TOT) 39 Threshold Gate Charge QG(TH) Gate−to−Source Charge QGS Gate−to−Drain Charge QGD Total Gate Charge 5600 VGS = 0 V, f = 1 MHz, VDS = 12 V VGS = 4.5 V, VDS = 15 V; ID = 30 A 1200 6.0 16 pF 58 nC 17 QG(TOT) VGS = 11.5 V, VDS = 15 V; ID = 30 A 88 nC SWITCHING CHARACTERISTICS (Note 6) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time td(ON) tr td(OFF) 25 VGS = 4.5 V, VDS = 15 V, ID = 15 A, RG = 3.0 W 34 35 tf 17 td(ON) 14 tr td(OFF) VGS = 11.5 V, VDS = 15 V, ID = 15 A, RG = 3.0 W tf 19 50 10 5. Pulse Test: pulse width v 300 ms, duty cycle v 2%. 6. Switching characteristics are independent of operating junction temperatures. http://onsemi.com 2 ns ns NTMFS4833N ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min Typ Max TJ = 25°C − 0.8 1.0 TJ = 125°C − 0.68 − − 38 − − 19 − Unit DRAIN−SOURCE DIODE CHARACTERISTICS Forward Diode Voltage Reverse Recovery Time Charge Time Discharge Time VSD VGS = 0 V, IS = 30 A tRR ta ns − 19 − QRR − 36 − nC Source Inductance LS − 0.50 − nH Drain Inductance LD − 0.005 − nH Gate Inductance LG − 1.84 − nH Gate Resistance RG − 1.0 − W Reverse Recovery Charge tb VGS = 0 V, dIS/dt = 100 A/ms, IS = 30 A V PACKAGE PARASITIC VALUES TA = 25°C 5. Pulse Test: pulse width v 300 ms, duty cycle v 2%. 6. Switching characteristics are independent of operating junction temperatures. http://onsemi.com 3 NTMFS4833N TYPICAL PERFORMANCE CURVES TJ = 25°C 150 3.8 V 125 3.6 V 100 3.4 V 75 50 3.2 V 25 3.0 V 2.8 V 0 1 2 4 3 5 100 TJ = 125°C 75 50 TJ = 25°C 25 TJ = −55°C 0 2 1 4 3 5 Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics ID = 30 A TJ = 25°C 0.006 0.004 0.002 1.5 125 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 0.008 1.75 150 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 0.010 0 VDS ≥ 10 V 175 0 RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) VGS = 4.0 V ID, DRAIN CURRENT (AMPS) 175 0 RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) 200 4.2 V thru 10 V 2 6 4 8 10 12 0.004 TJ = 25°C 0.003 VGS = 4.5 V 0.002 VGS = 11.5 V 0.001 0 25 50 100 75 125 150 175 200 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) ID, DRAIN CURRENT (AMPS) Figure 3. On−Resistance vs. Gate−to−Source Voltage Figure 4. On−Resistance vs. Drain Current and Gate Voltage 100,000 ID = 30 A VGS = 10 V VGS = 0 V IDSS, LEAKAGE (nA) ID, DRAIN CURRENT (AMPS) 200 1.25 TJ = 150°C 10,000 1.0 0.75 0.5 TJ = 125°C 1,000 0.25 0 −50 100 −25 0 25 50 75 100 125 150 0 5 10 15 20 25 TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 5. On−Resistance Variation with Temperature Figure 6. Drain−to−Source Leakage Current vs. Voltage http://onsemi.com 4 30 NTMFS4833N TYPICAL PERFORMANCE CURVES C, CAPACITANCE (pF) 7000 12 TJ = 25°C Ciss Ciss 5000 Crss 3000 2000 Coss 1000 0 10 VDS = 0 V 5 VGS VGS = 0 V 0 VDS 5 10 15 20 25 GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS) t, TIME (ns) 100 td(off) tr td(on) 1 8 6 Q1 4 10 RG, GATE RESISTANCE (W) 2 0 ID = 30 A TJ = 25°C 0 TJ = 25°C 20 15 10 5 100 ms 1 ms 0.01 0.01 RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 100 ms dc 0.1 1 10 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 100 EAS, SINGLE PULSE DRAIN−TO−SOURCE AVALANCHE ENERGY (mJ) I D, DRAIN CURRENT (AMPS) 0.1 0.2 0 0.4 0.6 0.8 1.0 Figure 10. Diode Forward Voltage vs. Current 10 ms 1 90 80 VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS) 10 ms VGS = 20 V SINGLE PULSE TC = 25°C 50 20 30 60 70 40 QG, TOTAL GATE CHARGE (nC) VGS = 0 V 0 100 1000 10 10 25 Figure 9. Resistive Switching Time Variation vs. Gate Resistance 100 Q2 30 IS, SOURCE CURRENT (AMPS) VDD = 15 V ID = 15 A VGS = 11.5 V tf 10 VGS Figure 8. Gate−To−Source and Drain−To−Source Voltage vs. Total Charge Figure 7. Capacitance Variation 1000 QT 10 6000 4000 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 8000 650 600 550 500 450 400 350 300 250 200 150 100 50 0 ID = 35 A 25 Figure 11. Maximum Rated Forward Biased Safe Operating Area 50 75 100 125 150 TJ, STARTING JUNCTION TEMPERATURE (°C) Figure 12. Maximum Avalanche Energy vs. Starting Junction Temperature http://onsemi.com 5 NTMFS4833N TYPICAL PERFORMANCE CURVES I D, DRAIN CURRENT (AMPS) 1000 100 25°C 100°C 10 125°C 1 10 1 1,000 100 PULSE WIDTH (ms) 10,000 Figure 13. Avalanche Characteristics 100 Duty Cycle = 0.5 R(t) (°C/W) 10 1 0.2 0.1 0.05 0.02 0.01 0.1 0.01 0.000001 Single Pulse 0.00001 0.0001 0.001 0.01 0.1 1 t, time (s) Figure 14. FET Thermal Response http://onsemi.com 6 10 100 1000 NTMFS4833N PACKAGE DIMENSIONS DFN5 5x6, 1.27P (SO−8FL) CASE 488AA ISSUE G 2X NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION D1 AND E1 DO NOT INCLUDE MOLD FLASH PROTRUSIONS OR GATE BURRS. 0.20 C D 2 A B D1 2X 0.20 C 4X E1 2 3 q E 2 1 DIM A A1 b c D D1 D2 E E1 E2 e G K L L1 M q c A1 4 TOP VIEW C 3X e 0.10 C SEATING PLANE DETAIL A A STYLE 1: PIN 1. SOURCE 2. SOURCE 3. SOURCE 4. GATE 5. DRAIN 0.10 C SIDE VIEW SOLDERING FOOTPRINT* DETAIL A 3X 8X 0.10 C A B 0.05 c 4X e/2 1 4 0.965 K G 0.750 1.000 L PIN 5 (EXPOSED PAD) 4X 1.270 b MILLIMETERS MIN NOM MAX 0.90 1.00 1.10 0.00 −−− 0.05 0.33 0.41 0.51 0.23 0.28 0.33 5.15 BSC 4.50 4.90 5.10 3.50 −−− 4.22 6.15 BSC 5.50 5.80 6.10 3.45 −−− 4.30 1.27 BSC 0.51 0.61 0.71 1.20 1.35 1.50 0.51 0.61 0.71 0.05 0.17 0.20 3.00 3.40 3.80 0_ −−− 12 _ 1.330 2X 0.905 2X E2 L1 M 0.495 4.530 3.200 0.475 D2 2X BOTTOM VIEW 1.530 4.560 *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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