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Circuit Note
CN-0104
Devices Connected/Referenced
Circuit Designs Using Analog Devices Products
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AD5522
Quad Parametric Measurement Unit with
Integrated 16-Bit Level Setting DACs
AD7685
16-Bit, 250 kSPS PulSAR® ADC
ADR435
5 V Ultralow Noise XFET® Voltage
Reference
ADG1209
Low Capacitance, 4 Channel Differential
Multiplexer
ADG412
Quad SPST Switch
Parametric Measurement Unit and Supporting Components for ATE Applications
Using the AD5522 PMU and the AD7685 16-Bit ADC
CIRCUIT FUNCTION AND BENEFITS
This circuit is a quad parametric measurement unit (PMU) with
supporting components to service a minimum of four deviceunder-test (DUT) channels. Typically, PMU channels are shared
among a number of DUT channels. Although the AD5522 is
very integrated and delivers four full PMU solutions, an
external reference and an ADC are required as a minimum to
complete this portion of the ATE signal chain. Typically, this
reference and the ADC can be shared among multiple PMU
packages. For further flexibility, additional external switches
can be used to extend the capabilities of the PMU by extending
the range of DUT capacitances that the AD5522 can drive.
CIRCUIT DESCRIPTION
The AD5522 quad PMU provides the forcing and measuring
functions for the DUT, but digitizing is required external to the
PMU. This can be achieved as follows:
•
An ADC can be dedicated to each individual PMU
channel, providing the fastest throughput and result.
•
An ADC can be shared across multiple channels. In
Figure 1, one AD7685 ADC is shared across the four PMU
channels. In some applications, an ADC might be shared
across many more channels, sometimes 8 or 16 PMU
channels.
The ADC can be shared across channels using the internal
Disable feature of each MEASOUTx pin. This requires a write
command to the PMU register to enable/disable the appropriate
switches. If this method is chosen, note that no more than one
MEASOUTx channel should be selected at any one time.
Alternatively, an external 4:1 multiplexer can be used to control
the measurement channel selection. In this way, all four
MEASOUTx paths can be enabled, and the multiplexer makes
the selection. Similarly, an 8:1 or 16:1 multiplexer would allow
more measurement paths to share the one ADC. The choice of
this multiplexer will depend on the ADC used and its input
voltage range. For bipolar input ADCs, one member of the
ADG1404/ADG1204 family would be ideal; for single-supply
usage, the ADG706 and ADG708 would be more suitable. The
output impedance of the MEASOUTx path is typically 60 Ω in
addition to the switch impedance. Therefore, an ADC buffer,
such as the ADA4898-1, should be considered to drive the ADC
(buffer not shown).
The AD7685 16-bit, 250 kSPS ADC was chosen for this
application because of its ability to handle the 0 V to 4.5 V
output range of the MEASOUTx path. In addition, the
availability of other ADCs with faster speeds in the same
footprint (for example, the 16-bit, 500 kSPS AD7686) also
makes it very attractive for upgrade paths.
The AD5522 requires a 5 V reference if a 20 V output range is
required. The ADR435 5 V XFET reference was chosen because
of its low tempco (10 ppm/°C, A Grade; 3 ppm/°C, B Grade),
low noise (8 µV p-p, 0.1 Hz to 10 Hz), and ability to drive
multiple PMU channels (30 mA source, 20 mA sink).
Some applications require the PMU to drive a wide range of
DUT capacitances, especially applications where the PMU is
connected to a power supply pin or where the PMU is used as a
device power supply and will see the decoupling/bypass
capacitance of the DUT. In such cases, an external switch
connected to the CCOMP pin, rather than a fixed capacitor,
allows for additional CCOMP capacitors to be switched in and
out, thereby allowing for optimization of settling time and
stability with various capacitive loads. The switch chosen for
this circuit was the ADG412 quad SPST, which has an onresistance of less than 50 Ω. The quad SPST switch was chosen
Rev. 0
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CN-0104
Circuit Note
AVDD
+5V
VOUT
VIN
VIO
GND
VREF
TRIM
0.1µF
22nF
ADR435
0.1µF
VDD
10µF
+5V
+5V
SDI
SCK
SDO
IN– GND CNV
IN+
AVSS
AVDD DVCC
10µF
10µF
2.7nF
ADG412
10µF
VL = +5V
10µF
0.1µF
0.1µF
AVSS
AVDD
0.1µF
ADG1209 (1/2)
S1, S2, S3, S4
DVCC VREF MEASOUT CCOMP[0:2] CCOMP[3]
A0, A1
EXTFOH3
EXTFOH0
CFF0
CFF3
AVSS
FOH3
FOH0
MEASVH3
MEASVH0
EXTMEASIH3
EXTMEASIH0
RSENSE
RSENSE
EXTMEASIL0
12.5Ω
MIN
EXTMEASIL3
AD5522
DUT
AVDD ≥ +10V
AVSS ≤ –5V
|AVDD – AVSS| ≥ 20V
|AVDD – AVSS| ≤ 33V
DVCC = 2.3V TO 5.25V
DUT
EXTFOH2
EXTFOH1
CFF2
CFF1
FOH2
FOH1
MEASVH2
MEASVH1
EXTMEASIH2
EXTMEASIH1
RSENSE
RSENSE
12.5Ω
MIN
12.5Ω
MIN
EXTMEASIL1
DUTGND AGND DGND
EXTMEASIL2
SERIAL INTERFACE
DUT
DUT
08387-001
12.5Ω
MIN
SERIAL
INTERFACE
AVDD
10µF
AVSS AVDD
AD7685
Figure 1. Parametric Measurement Unit and Supporting Components (Simplified Schematic)
instead of a multiplexer because most multiplexers allow only
one of a number of channels to be on at any one time. Using the
quad switch, each of the drains can be connected together and
the sources connected to the each of the compensation capacitors, thereby providing 24 − 1 possible combinations of CCOMP.
Similarly, the ADG1209 differential multiplexer is used in this
circuit to accommodate a wider range of feedforward
capacitances connected to the CFFx pins, enabling the AD5522
to drive a wider range of DUT capacitance. The series
resistance of the multiplexer used should be such that
1/(2π × RON × CDUT) > 100 kHz. In this example, the ADG1209
services two AD5522 channels.
voltage rating of the switch and capacitors should take this into
account. CFF capacitors can have a ≤10% tolerance; this extra
variation directly affects settling times, especially in the
measure current mode for low currents. Selection of CCOMP
capacitors should be ≤5% tolerance. Table 1 gives suggested
nominal compensation capacitors CCOMP and CFF for various
values of load capacitance.
Table 1. Suggested Compensation Capacitor Selection
CCOMP
CFF
CLOAD
≤1 nF
100 pF
220 pF
≤10 nF
100 pF
1 nF
≤100 nF
CLOAD/100
CLOAD/10
The switch and capacitors will see the same voltage excursion as
the voltage range at the FOH pin of the AD5522. Therefore, the
Rev. 0 | Page 2 of 4
Circuit Note
CN-0104
The circuit must be constructed on a multilayer PC board with
a large area ground plane. Proper layout, grounding, and
decoupling techniques must be used to achieve optimum
performance (see Tutorial MT-031, Grounding Data Converters
and Solving the Mystery of "AGND" and "DGND" and Tutorial
MT-101, Decoupling Techniques). Note that Figure 1 is a
simplified schematic and does not show all the necessary
decoupling.
12
10
CCOMP = 1nF
CCOMP = 220pF
6
0V TO 11.25V FORCE VOLTAGE
CLOAD = 220pF
ADG412 USED TO PROVIDE
SELECTABLE CCOMP
4
0
–60
–40
–20
0
20
40
60
80
100
120
140
08387-002
2
TIME (µs)
Figure 2. Output Voltage Step Response for 11.25 V Force Voltage Step with
220 pFLoad for Various Values of CCOMP Using ADG412 SPST Switch
Careful consideration of the power supply and ground return
layout helps to ensure the rated performance. Design the
printed circuit board (PCB) on which the AD5522 is mounted
so that the analog and digital sections are separated and
confined to certain areas of the board. If the AD5522 is in a
system where multiple devices require an AGND-to-DGND
connection, the connection should be made at one point only.
Establish the star ground point as close as possible to the device.
0.010
0.015
0.008
MEASURE VOLTAGE INTEGRAL
LINEARTY ERROR (%FSR)
MEASURE VOLTAGE INTEGRAL
LINEARTY ERROR (%FSR)
0.010
0.005
0
–0.005
–0.010
–0.015
–0.020
0.006
0.004
0.002
0
–0.002
–0.004
–0.006
08387-003
–0.008
–0.025
0
10k
20k
30k
40k
50k
60k
–0.010
–10
–5
5
10
FORCE VOLTAGE (V)
AD5522 FIN DAC CODE (FI MODE)
Figure 5. Integral Linearity Performance Using the AD7685 to Measure
FVMV Error (FV Range = ±10 V, Measout Gain = 0.2)
Figure 3. Integral Linearity Performance Using the AD7685 to
Measure FIMV Error (FI Range = ±2 mA, Measout Gain = 0.2)
0.015
0.015
0.010
0.010
MEASURE CURRENT INTEGRAL
LINEARTY ERROR (%FSR)
MEASURE CURRENT INTEGRAL
LINEARTY ERROR (%FSR)
0
08387-005
OUTPUT (V)
8
0.005
0
–0.005
–0.010
0.005
0
–0.005
–0.010
–0.015
–8
–6
–4
–2
0
2
4
6
8
10
–0.025
0
FORCE VOLTAGE (V)
10k
20k
30k
40k
50k
60k
FORCE CURRENT (DAC CODE)
Figure 4. Integral Linearity Pperformance Using the AD7685 to Measure
FVMI Error (FV Range = ±10 V in 2mA Range into a 5.6 kΩ Load)
Figure 6. Integral Linearity Performance Using the AD7685 to Measure
FIMI Error (FI Range = ±2 mA, Measout Gain = 0.2)
Rev. 0 | Page 3 of 4
08387-006
–0.015
–10
08387-004
–0.020
CN-0104
Circuit Note
For supplies with multiple pins (AVSS and AVDD), it is
recommended that these pins be tied together and that each
supply be decoupled only once.
The AD5522 should have ample supply decoupling of 10 μF in
parallel with 0.1 μF on each supply located as close to the
package as possible, ideally right up against the device. The
10 μF capacitors are the tantalum bead type. The 0.1 μF
capacitors should have low effective series resistance (ESR) and
low effective series inductance (ESL)—typical of the common
ceramic types that provide a low impedance path to ground at
high frequencies—to handle transient currents due to internal
logic switching.
Avoid running digital lines under the device because they can
couple noise onto the device. However, allow the analog ground
plane to run under the AD5522 to avoid noise coupling (this
applies only to the package with paddle up). The power supply
lines of the AD5522 should use as large a trace as possible to
provide low impedance paths and reduce the effects of glitches
on the power supply line. Fast switching digital signals should
be shielded with digital ground to avoid radiating noise to other
parts of the board, and they should never be run near the
reference inputs. It is essential to minimize noise on all
VREF lines.
Avoid crossover of digital and analog signals. Traces on
opposite sides of the board should run at right angles to each
other to reduce the effects of feedthrough through the board. As
is the case for all thin packages, care must be taken to avoid
flexing the package and to avoid a point load on the surface of
this package during the assembly process.
DUT requirements by using the on-chip OFFSET DAC. (See
the AD5522 data sheet for more detail). There is also the added
benefit of being able to use lower supply rails. This helps by
reducing the power dissipated in the AD5522, especially when
operating at the full 80 mA current range per channel.
Variations in terms of the partitioning of PMU measurement
channels per ADC channel could mean that one ADC channel
is shared among more PMU channels (sometimes in 8:1 or 16:1
ratios). Alternatively, the on-chip MEASOUT disable feature or
an analog multiplexer can be used for this function.
Multiplexers add more series resistance to the measurement
path; therefore, buffering may be required prior to the ADC
input.
Other variations include the use of ADCs, which handle bipolar
signal ranges, or ADCs with faster sampling rates.
LEARN MORE
Automatic Test Equipment (ATE).
MT-031 Tutorial, Grounding Data Converters and Solving the
Mystery of AGND and DGND. Analog Devices.
MT-101 Tutorial, Decoupling Techniques. Analog Devices.
Voltage Reference Wizard Design Tool.
Data Sheets and Evaluation Boards
AD5522 Data Sheet.
AD5522 Evaluation Board.
AD7685 Data Sheet.
Also, note that the exposed paddle of the AD5522 is connected
to the negative supply, AVSS.
AD7685 Evaluation Board.
COMMON VARIATIONS
ADG412 Data Sheet.
PMU circuits do not always need to use the full 20 V output
range of the AD5522. Many applications require only a portion
of that voltage. For example, the use of the ADR421 2.5 V
voltage reference will allow the user to achieve a nominal output
voltage range of ±5.6 V, which can be further scaled to suit the
ADR435 Data Sheet.
ADG1209 Data Sheet.
REVISION HISTORY
7/09—Revision 0: Initial Version
(Continued from first page) "Circuits from the Lab" are intended only for use with Analog Devices products and are the intellectual property of Analog Devices or its licensors. While you may
use the "Circuits from the Lab" in the design of your product, no other license is granted by implication or otherwise under any patents or other intellectual property by application or use of
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by Analog Devices for their use, nor for any infringements of patents or other rights of third parties that may result from their use. Analog Devices reserves the right to change any "Circuits
from the Lab" at any time without notice, but is under no obligation to do so. Trademarks and registered trademarks are the property of their respective owners.
©2009 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
CN08387-0-7/09(0)
Rev. 0 | Page 4 of 4