REVISIONS LTR A DESCRIPTION DATE (YR-MO-DA) APPROVED 95-03-17 K. A. Cottongim Added device type 05 with vendor CAGE code U4388. Made changes to table I, figure 2 , and figure 5. Redrew entire document REV SHEET REV A A A A SHEET 15 16 17 18 REV STATUS OF SHEETS PMIC N/A STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REV A A A A A A A A A A A A A A SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PREPARED BY Steve L. Duncan DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 CHECKED BY Mike Jones MICROCIRCUIT, DIGITAL, LOW POWER, SINGLE CHANNEL, DRIVER-RECEIVER, HYBRID APPROVED BY D. M. Cool DRAWING APPROVAL DATE 92-08-11 REVISION LEVEL A SIZE A SHEET DESC FORM 193 JUL 94 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. CAGE CODE 5962-92085 67268 1 OF 18 5962-E049-95 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). This drawing describes device requirements for hybrid microcircuits to be processed in accordance with MIL-H-38534. Two product assurance classes, military high reliability (device class H) and space application (device class K) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - Federal stock class designator \ RHA designator (see 1.2.1) 92085 01 H X X Device type (see 1.2.2) / Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) \/ Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-H-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number 01 NHI-1551 02 ARX-4451 03 ARX-4418 04 NHI-1515 05 FC155377 Circuit function Single channel, driver-receiver (universal transceiver) low power, receiver standby low Single channel, driver-receiver (universal transceiver) low power, receiver standby low Single channel, driver-receiver (universal transceiver) low power, receiver standby low Single channel, driver-receiver (universal transceiver) low power, receiver standby low Single channel, driver-receiver (universal transceiver) low power, receiver standby low 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level as follows: Device class Device requirements documentation H or K Certification and qualification to MIL-H-38534 1.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter X Y Descriptive designator Terminals See figure 1 See figure 1 24 24 Package style Hybrid package Flat package 1.2.5 Lead finish. The lead finish shall be as specified in MIL-H-38534 for classes H and K. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 2 1.3 Absolute maximum ratings. 1/ Supply voltage ranges: VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VCCL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Logic input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Receiver differential input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Receiver common mode input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . Driver peak output current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . Junction temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Power dissipation (PD) total hybrid: 100 percent duty cycle (TC = +25(C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Power dissipation (PD) hottest die: 100 percent duty cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Standby mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Thermal resistance: Junction-to-case ( JC) hottest die . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Case-to-ambient . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Maximum junction-to-case temperature rise for the hottest die at 100 percent duty cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3 V dc to +18 V dc +0.3 V dc to -18 V dc -0.3 V dc to +7 V dc -0.3 V dc to +5.5 V dc 40 Vp-p -10 V dc to +10 V dc ±300 mA -65(C to +150(C +300(C +160(C 3.24 W 545 mW Derates to zero 38(C/W 21(C/W 21(C 1.4 Recommended operating conditions. Supply voltage ranges: VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VCCL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Logic input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Receiver differential voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Receiver common mode voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Driver peak output current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Maximum serial data rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Case operating temperature range (TC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1/ +11.4 V dc to +15.75 V dc -11.4 V dc to -15.75 V dc +4.5 V dc to +5.5 V dc 0 V dc to +5.0 V dc 40 Vp-p -10 V dc to +10 V dc ±180 mA 1.0 MHz -55(C to +125(C Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 3 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbook. Unless otherwise specified, the following specification, standards, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-H-38534 - Hybrid Microcircuits, General Specification for. STANDARDS MILITARY MIL-STD-883 MIL-STD-973 MIL-STD-1835 - Test Methods and Procedures for Microelectronics. - Configuration Management. - Microcircuit Case Outlines. HANDBOOK MILITARY MIL-HDBK-780 - Standardized Military Drawings. (Copies of the specification, standards, and handbook required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-H-38534 and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-H-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Test circuit. The test circuit shall be as specified on figure 3. 3.2.4 Timing waveforms. The timing waveforms shall be as specified on figure 4. 3.2.5 Coupling diagram. The coupling diagram shall be as specified on figure 5. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-H-38534. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in QML-38534. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 4 Electrical performance characteristics. Test Symbol Conditions 1/ -55(C TC +125(C unless otherwise specified Group A subgroups Device type Limits Min Unit Max RECEIVER Output low voltage VOL IOL = 10 mA 1, 2, 3 IOL = 4 mA Output high voltage VOH Differential input voltage level VI IOH = -0.4 mA ZIN 1 MHz sinewave Common mode input voltage range VICR 1 MHz sinewave, see figure 3 VTH Receiver delay tDR 0.5 All 4, 5, 6 01, 02, 03, 04 2/ 2.5 V 40 4, 5, 6 All 10 4, 5, 6 01, 02, 03, 04 10 2/ Threshold voltage 05 V Vp-p 05 Differential input impedance CIN 0.5 1, 2, 3 2/ Input capacitance 01, 02, 03, 04 k 6 Vp-p 05 1 MHz sinewave 2/ 4 All 5 pF Vp-p 3/ 4/ 6/ 4, 5, 6 01, 02, 03, 04 0.6 1.05 3/ 4/ 10/ 4 05 1.10 1.20 3/ 4/ 6/ 5, 6 05 0.56 1.20 Input zero crossing to DATA or D A T A , see figure 3 2/ 4, 5, 6 All 450 ns 0.7 V RECEIVER STROBE Input low voltage VSIL 8/ 1, 2, 3 All Input high voltage VSIH 8/ 1, 2, 3 All 2.0 V Input low current ISIL VSIL = 0.4 V 1, 2, 3 01, 02, 03, 04 -0.4 mA 05 -1.6 See footnotes at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 5 Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55(C TC +125(C unless otherwise specified Group A subgroups Device type Limits Min Unit Max RECEIVER STROBE - CONTINUED. Input high current Strobe delay ISIH tDS VSIH = 2.7 V 1, 2, 3 Turn-on or turn-off, See figure 4 2/ 01, 02, 03, 04 80 µA 05 40 9, 10, 11 All 200 ns 0.7 V TRANSMITTER Input low voltage VIL 8/ 1, 2, 3 All Input high voltage VIH 8/ 1, 2, 3 All 2.0 V Input low current IIL 1, 2, 3 01, 02, 03, 04 -0.4 mA 05 -1.6 VIL = 0.4 V Input high current IIH VIH = 2.7 V Differential output VO 35 6 load 140 Differential output noise VON 6 load Inhibited, 35 140 6 load 4/ 2/ All 1, 2, 3 01, 04, 05 5/ 6 load 2/ 1, 2, 3 4/ 4, 5, 6 40 µA 6.5 9.0 Vp-p 02, 03 7.0 9.0 01, 04, 05 26 36 02, 03 28 36 All 5/ ZOUT 1 MHz sinewave, (transmitter off) 2/ 4, 5, 6 All Output capacitance COUT 1 MHz sinewave 2/ 4 All Differential output offset voltage VOS 35 4, 5, 6 01, 02, 03, 04 6 load 6 load 1406 load 10/ 2/ mVp-p 40 Differential output impedance 35 10 10 k 6 5 pF -90 +90 mVpk -360 +360 05 5/ 7/ See footnotes at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 6 Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55(C TC +125(C unless otherwise specified Group A subgroups Device type Limits Min Unit Max TRANSMITTER - Continued. Receiver filter response FILTER Rise time tr Fall time tf Transmitter delay tdt Variable amplitude 2/ 5/ VAL level f = 2 MHz 2/ f = 4 MHz 2/ 4, 5, 6 All -4.0 dB -13.0 6 load, see figure 4 356 load, see figure 4 35 Transmitter-in to 2/ transmitter-out, see figure 4 6 load VIN = 0 V dc, 1406 load VIN = 10 V dc, 140 9, 10, 11 All 220 300 9, 10, 11 All 220 300 9, 10, 11 01, 04 550 02, 03, 05 300 1 03, 04 ns 30 V 03, 04 2 0.7 TRANSMITTER INHIBIT Input low voltage VIIL 8/ 1, 2, 3 All Input high voltage VIIH 8/ 1, 2, 3 All 2.0 V Input low current IIIL VSIL = 0.4 V 1, 2, 3 01, 02, 03, 04 -0.4 mA 05 -1.6 Input high current IIIH VSIH = 2.7 V Transmitter inhibit delay (high) tDI-H 0-1 inhibited output, See figure 4 Transmitter inhibit delay (low) tDI-L 1-0 active output, See figure 4 V 1, 2, 3 All 40 µA 2/ 9, 10, 11 All 450 ns 2/ 9, 10, 11 All 450 See footnotes at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 7 Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55(C TC +125(C unless otherwise specified Group A subgroups Device type Limits Min Unit Max POWER SUPPLY +Supply (VCC) ICC-SB -Supply (VEE) IEE-SB +5 V supply (VCCL) Standby mode 1, 2, 3 ICC1-SB +Supply (VCC) ICC-50 -Supply (VEE) IEE-50 +Supply (VCC) ICC-100 -Supply (VEE) IEE-100 50 percent duty cycle 4, 5, 6 100 percent duty cycle All 50 01, 04, 05 40 02, 03 65 01, 04, 05 20 02, 03 45 All 110 All 110 All 165 All 165 mA mA Unless otherwise specified supply voltage ranges are as follows: (+14.9 V dc VCC +15.1 V dc), (-14.9 V dc VEE -15.1 V dc), and (+4.9 V dc VCCL 5.1 V dc). 2/ Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I. 3/ Threshold determined by first missing word of a 33 word transmission to a Harris HD-15530 CMOS Manchester encoderdecoder. 4/ Measured at point AA' of figure 5. 5/ Measured at point BB' of figure 5. 6/ Assumes the internal threshold option is used. 7/ Offset is measured 2.5 µs after the mid-bit zero crossing of the last parity bit of a 600 µs transmission cycle of contiguous words (no dead time in between words). 8/ These parameters are tested on a go-no-go basis in conjuction with other measured parameters and are not directly testable. 9/ This parameter is adjusted and measured with pins 6 and 11 each grounded through a 3830 resistor. 10/ Measured 2.5 µs after parity bit mid zero crossing of a 660 µs message with worse case data word. This parameter is adjusted and tested at 25(C only, -55(C and +125(C limits are guaranteed by design. 1/ 6 SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 8 3.6 Manufacturer eligibility. In addition to the general requirements of MIL-H-38534, the manufacturer of the part described herein shall maintain the electrical test data from the initial quality conformance inspection group A lot sample, produced on the certified line, for each device type listed herein. The data should also include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision control by the manufacturer and be made available to preparing activity (DESC-EC) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance submitted to DESC-EC shall affirm that the manufacturer's product meets the requirements of MIL-H-38534 and the requirements herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-H-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-H-38534. 4.2 Screening. Screening shall be in accordance with MIL-H-38534. The following additional criteria shall apply: a. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DESC-EC or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1015 of MIL-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 9 Case X FIGURE 1. Case outlines. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 10 Case Y Inches .002 .003 .005 .009 .015 .017 .018 .025 mm 0.05 0.08 0.13 0.23 0.64 0.43 0.46 0.64 Inches .080 .100 .175 .200 .275 .400 1.100 1.27 mm 2.03 2.54 4.46 5.08 6.98 10.16 27.94 32.3 NOTES (for case X and case Y): 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. Unless otherwise specified, tolerance for three place decimal shall be .005 (0.13 mm). FIGURE 1. Case outlines - Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 11 Pin Function Pin Function 1 TX DATA OUT 13 VCC RX 2 TX DA TA OUT 14 Amp control or NC See note 3 GND C 15 RX DATA IN 4 VCC TX 16 RX DA TA IN 5 EXTERNAL DATA THRESHOLD 17 GND A 6 INTERNAL DATA THRESHOLD 18 CASE GND 7 RX DATA OUT 19 VEE RX 8 STROBE 20 VCCL 9 GND B 21 TX INHIBIT 10 RX DA TA OUT 22 TX DATA IN 11 INTERNAL DA TA THRESHOLD 23 TX DA TA IN 12 EXTERNAL DA TA THRESHOLD 24 VEE TX NOTE: Pin 14 is a no connection for device types 01,02 and 05 and amp control for device types 03 and 04. FIGURE 2. Terminal connections. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 12 COMMON - MODE TEST NOTE: Observe no transmission of data at RX DATA and RX DA TA. FIGURE 3. Test circuit. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 13 RECEIVER TIMING TRANSMITTER TIMING FIGURE 4. Timing waveforms. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 14 FIGURE 5. Coupling diagram. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 15 TABLE II. Electrical test requirements. MIL-H-38534 test requirements Subgroups (in accordance with MIL-H-38534, group A test table) Interim electrical parameters 1 Final electrical test parameters 1*, 2, 3, 4, 5, 6, 9, 10, 11 Group A test requirements 1, 2, 3, 4, 5, 6, 9, 10, 11 Group C end-point electrical parameters 1, 2, 3 MIL-STD-883, group E end-point electrical parameters for RHA devices Subgroups ** (per method 5005, group A test table) * PDA applies to subgroup 1. ** When applicable to this standardized military drawing, the subgroups shall be defined. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-H-38534 and as specified herein. 4.3.1 Group A inspection. Group A inspection shall be in accordance with MIL-H-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7 and 8 shall be omitted. 4.3.2 Group B inspection. Group B inspection shall be in accordance with MIL-H-38534. 4.3.3 Group C inspection. Group C inspection shall be in accordance with MIL-H-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DESC-EC or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection. Group D inspection shall be in accordance with MIL-H-38534. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 16 4.3.5 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). RHA levels for device classes H and K shall be M, D, R, and H. RHA quality conformance inspection sample tests shall be performed at the RHA level specified in the acquisition document. a. RHA tests for device classes H and K for levels M, D, R, and H shall be performed through each level to determine at what levels the devices meet the RHA requirements. These RHA tests shall be performed for initial qualification and after design or process changes which may affect the RHA performance of the device. b. End-point electrical parameters shall be as specified in table II herein. c. Prior to total dose irradiation, each selected sample shall be assembled in its qualified package. It shall pass the specified group A electrical parameters in table I for subgroups specified in table II herein. d. For device classes H and K, the devices shall be subjected to radiation hardness assured tests as specified in MIL-H-38534 for RHA level being tested, and meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25(C ±5 percent, after exposure. e. Prior to and during total dose irradiation testing, the devices shall be biased to establish a worst case condition as specified in the radiation exposure circuit. f. For device classes H and K, subgroups 1 and 2 in table V, method 5005 of MIL-STD-883 shall be tested as appropriate for device construction. g. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-H-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Electronics Supply Center when a system application requires configuration control and the applicable SMD. DESC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DESC-EC, telephone (513) 296-6047. 6.5 Comments. Comments on this drawing should be directed to DESC-EC, Dayton, Ohio 45444, or telephone (513) 296-5374. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 17 6.6 One part - one part number system. The one part - one part number system described below has been developed to allow for transitions between identical generic devices covered by the three major microcircuit requirements documents (MIL-H-38534, MIL-I-38535, and 1.2.1 of MIL-STD-883) without the necessity for the generation of unique PIN's. The three military requirements documents represent different class levels, and previously when a device manufacturer upgraded military product from one class level to another, the benefits of the upgraded product were unavailable to the Original Equipment Manufacturer (OEM), that was contractually locked into the original unique PIN. By establishing a one part number system covering all three documents, the OEM can acquire to the highest class level available for a given generic device to meet system needs without modifying the original contract parts selection criteria. Military documentation format Example PIN under new system Manufacturing source listing Document listing New MIL-H-38534 Standardized Military Drawings 5962-XXXXXZZ(H or K)YY QML-38534 MIL-BUL-103 New MIL-I-38535 Standardized Military Drawings 5962-XXXXXZZ(Q or V)YY QML-38535 MIL-BUL-103 New 1.2.1 of MIL-STD-883 Standardized Military Drawings 5962-XXXXXZZ(M)YY MIL-BUL-103 MIL-BUL-103 6.7 Sources of supply for device classes H and K. Sources of supply for device classes H and K are listed in QML-38534. The vendors listed in QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DESC-ECT and have agreed to this drawing. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-92085 A REVISION LEVEL A SHEET 18 STANDARDIZED MILITARY DRAWING SOURCE APPROVAL BULLETIN DATE: 95-03-17 Approved sources of supply for SMD 5962-92085 are listed below for immediate acquisition only and shall be added to QML-38534 during the next revision. QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DESC-EC. This bulletin is superseded by the next dated revision of QML-38534. Standardized military drawing PIN Vendor CAGE number Vendor similar PIN 1/ 5962-9208501HXX 57363 NHI-1551 5962-9208501HYX 57363 NHI-1551FP 5962-9208502HXX 88379 ARX4451 5962-9208502HYX 88379 ARX4451FP 5962-9208503HXX 88379 ARX4418 5962-9208503HYX 88379 ARX4418FP 5962-9208504HXX 57363 NHI-1515 5962-9208504HYX 57363 NHI-1515FP 5962-9208505HXX U4388 FC155377 5962-9208505HYX U4388 FC155377FP 1/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number Vendor name and address 57363 National Hybrid, Incorporated 2200 Smithtown Avenue Ronkonkoma, NY 11779 88379 Aeroflex Laboratories 35 South Service Road Plainview, NY 11803 U4388 C-MAC Microcircuits Limited South Denes Great Yarmouth Norfolk NR30 3PX England The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in this information bulletin.