NTMFS4854NS SENSEFET® Power MOSFET 25 V, 149 A, Single N−Channel, SO−8 FL Features • • • • • Accurate, Lossless Current Sensing Low RDS(on) to Minimize Conduction Losses Low Capacitance to Minimize Driver Losses Optimized Gate Charge to Minimize Switching Losses These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant http://onsemi.com V(BR)DSS 25 V Applications RDS(ON) MAX ID MAX 2.5 mW @ 10 V 149 A 3.9 mW @ 4.5 V 119 A • CPU Power Delivery • DC−DC Converters • Low Side Switching DRAIN MAXIMUM RATINGS (TJ = 25°C unless otherwise stated) Parameter Symbol Value Unit Drain−to−Source Voltage VDSS 25 V Gate−to−Source Voltage VGS ±16 V ID 24.4 A Continuous Drain Current RqJA (Note 1) TA = 25°C Power Dissipation RqJA (Note 1) TA = 25°C PD 2.31 W Continuous Drain Current RqJA (Note 2) TA = 25°C ID 15.2 A Power Dissipation RqJA (Note 2) TA = 85°C Steady State TA = 85°C 0.9 W Continuous Drain Current RqJC (Note 1) TC = 25°C ID 149 A Power Dissipation RqJC (Note 1) TC = 25°C TC = 85°C 86.2 W IDM 298 A TJ, TSTG −55 to +150 °C IS 71 A Drain to Source DV/DT dV/dt 6 V/ns Single Pulse Drain−to−Source Avalanche Energy (TJ = 25°C, VDD = 30 V, VGS = 10 V, IL = 20 Apk, L = 1.0 mH, RG = 25 W) EAS 200 mJ Lead Temperature for Soldering Purposes (1/8” from case for 10 s) TL 260 °C Source Current (Body Diode) MARKING DIAGRAM S 1 S SO−8 FLAT LEAD S CASE 506BQ G A Y W ZZ (Do Not Connect) NC 4854NS SENSE AYWZZ KELVIN K1 (Do Not Connect) D D = Assembly Location = Year = Work Week = Lot Traceability 107.5 PD Operating Junction and Storage Temperature SENSE SOURCE 11 PD TA = 25°C, tp = 10 ms Kelvin 17.6 TA = 25°C Pulsed Drain Current GATE ORDERING INFORMATION Package Shipping† NTMFS4854NST1G SO−8 FL (Pb−Free) 1500 Tape / Reel NTMFS4854NST3G SO−8 FL (Pb−Free) 5000 Tape / Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Surface−mounted on FR4 board using 1 sq−in pad, 1 oz Cu. 2. Surface−mounted on FR4 board using the minimum recommended pad size. © Semiconductor Components Industries, LLC, 2012 May, 2012 − Rev. 1 1 Publication Order Number: NTMFS4854NS/D NTMFS4854NS THERMAL RESISTANCE MAXIMUM RATINGS Symbol Value Junction−to−Case (Drain) Parameter RqJC 1.45 Junction−to−Ambient – Steady State (Note 3) RqJA 54 Junction−to−Ambient – Steady State (Note ) RqJA 138.7 Unit °C/W 3. Surface−mounted on FR4 board using 1 sq−in pad, 1 oz Cu. 4. Surface−mounted on FR4 board using the minimum recommended pad size. ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min Drain−to−Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 250 mA 25 Drain−to−Source Breakdown Voltage Temperature Coefficient V(BR)DSS/ TJ Typ Max Unit OFF CHARACTERISTICS Zero Gate Voltage Drain Current Gate−to−Source Leakage Current IDSS V 30 VGS = 0 V, VDS = 20 V mV/°C TJ = 25°C 10 TJ = 125°C 200 IGSS VDS = 0 V, VGS = ±16 V VGS(TH) VGS = VDS, ID = 250 mA mA ±100 nA 2.5 V ON CHARACTERISTICS (Note 5) Gate Threshold Voltage Negative Threshold Temperature Coefficient Drain−to−Source On Resistance Forward Transconductance VGS(TH)/TJ RDS(on) 1.0 6.8 mV/°C VGS = 10 V ID = 15 A 1.5 2.5 VGS = 4.5 V ID = 15 A 2.5 3.9 VGS = 3.2 V, ID = 10 A TJ = 75°C 6.0 10 TJ = 25°C 5.1 8.8 gFS VDS = 15 V, ID = 15 A 28 mW S CHARGES, CAPACITANCES & GATE RESISTANCE Input Capacitance CISS 4830 Output Capacitance COSS Reverse Transfer Capacitance CRSS VGS = 0 V, f = 1 MHz, VDS = 12 V 1130 550 Total Gate Charge QG(TOT) 36 Threshold Gate Charge QG(TH) 4.7 Gate−to−Source Charge QGS Gate−to−Drain Charge QGD Total Gate Charge pF VGS = 4.5 V, VDS = 15 V; ID = 30 A 13 66 nC 15 QG(TOT) VGS = 11.5 V, VDS = 15 V; ID = 30 A 85 nC SWITCHING CHARACTERISTICS (Note 6) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time td(ON) 20 tr td(OFF) VGS = 4.5 V, VDS = 15 V, ID = 15 A, RG = 3.0 W tf 54 38 45 5. Pulse Test: pulse width v 300 ms, duty cycle v 2%. 6. Switching characteristics are independent of operating junction temperatures. 7. With 0V potential from sense lead to source lead, i.e. using a virtual ground. http://onsemi.com 2 ns NTMFS4854NS ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min Typ Max Unit SWITCHING CHARACTERISTICS (Note 6) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time td(ON) 11 tr td(OFF) 32 VGS = 11.5 V, VDS = 15 V, ID = 15 A, RG = 3.0 W ns 54 tf 34 DRAIN−SOURCE DIODE CHARACTERISTICS Forward Diode Voltage Reverse Recovery Time VSD TJ = 25°C 0.80 TJ = 125°C 0.65 tRR Charge Time ta Discharge Time tb Reverse Recovery Charge VGS = 0 V, IS = 30 A 1.2 V 36 17 VGS = 0 V, dIS/dt = 100 A/ms, IS = 30 A ns 19 QRR 33 nC Source Inductance LS 0.65 nH Drain Inductance LD 0.005 nH Gate Inductance LG 1.84 nH Gate Resistance RG 1.4 W PACKAGE PARASITIC VALUES TA = 25°C CURRENT SENSE CHARACTERISTICS Current Sensing Ratio Iratio VGS = 5 V, 0-70°C, 5-20 A 374 399 424 Current Sensing Ratio Iratio VGS = 5 V, 0-70°C, 1−5 A 362 399 436 Current Sense Temperature Coefficient (Note 7) 0.006 5. Pulse Test: pulse width v 300 ms, duty cycle v 2%. 6. Switching characteristics are independent of operating junction temperatures. 7. With 0V potential from sense lead to source lead, i.e. using a virtual ground. http://onsemi.com 3 %/°C NTMFS4854NS TYPICAL PERFORMANCE CURVES TJ = 25°C 120 ID, DRAIN CURRENT (AMPS) 140 3.6 V 3.4 V 100 3.2 V 80 60 3.0 V 40 2.8 V 20 2.6 V 0 1 0.5 1.5 2 3 2.5 4 3.5 4.5 120 100 80 60 TJ = 125°C 40 TJ = 25°C 20 TJ = −55°C 1 2 1.5 3 2.5 3.5 4 Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics TJ = 25°C ID = 30 A 0.008 0.007 0.006 0.005 0.004 ID = 10 A 0.002 0.001 2 140 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 0.010 0 160 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 0.009 0.003 VDS ≥ 10 V 180 0 5 3 4 5 6 7 9 8 RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) VGS = 4.0 to 10 V 160 0 200 3.8 V 180 10 4.5 0.01 TJ = 25°C 0.009 0.008 0.007 0.006 0.005 VGS = 3.2 V 0.004 VGS = 4.5 V 0.003 0.002 0.001 0 VGS = 10 V 0 20 10 30 40 50 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) ID, DRAIN CURRENT (AMPS) Figure 3. On−Resistance vs. Gate−to−Source Voltage Figure 4. On−Resistance vs. Drain Current and Gate Voltage RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) ID, DRAIN CURRENT (AMPS) 200 1.8 Each curve is individually normalized to its value at 25°C 1.6 ID = 30 A VGS = 10 V 1.4 1.2 1.0 ID = 10 A VGS = 3.2 V 0.8 0.6 −50 −25 0 25 50 75 100 125 TJ, JUNCTION TEMPERATURE (°C) Figure 5. On−Resistance Variation with Temperature http://onsemi.com 4 150 60 NTMFS4854NS TYPICAL PERFORMANCE CURVES 3000 Coss 2000 0 Crss 0 10 5 15 20 25 DRAIN−TO−SOURCE VOLTAGE (VOLTS) 15 8 10 6 5 2 0 ID = 30 A TJ = 25°C 0 IS, SOURCE CURRENT (AMPS) t, TIME (ns) tf tr td(on) 10 1 1 10 60 70 20 40 50 30 QG, TOTAL GATE CHARGE (nC) 10 RG, GATE RESISTANCE (W) 1.0 0.1 0.3 100 VGS = 0 V TJ = 25°C 0.4 10 ms 1 RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 0.6 0.7 0.8 0.9 1.0 1.1 Figure 9. Diode Forward Voltage vs. Current VGS(th), THRESHOLD VOLTAGE (V) I D, DRAIN CURRENT (AMPS) 10 0.5 VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS) 1000 VGS = 20 V SINGLE PULSE TC = 25°C 0 90 10 Figure 8. Resistive Switching Time Variation vs. Gate Resistance 100 80 Figure 7. Gate−To−Source and Drain−To−Source Voltage vs. Total Charge td(off) 100 Qgd Qgs 4 100 VGS = 11.5 V VDD = 15 V ID = 15 A VGS VDS Figure 6. Capacitance Variation 1000 20 QT 10 4000 1000 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 5000 C, CAPACITANCE (pF) 12 VGS = 0 V TJ = 25°C Ciss VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 6000 100 ms 1 ms 10 ms dc 10 1 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 100 ID = 250 mA VGS = VDS 1.0 0.5 −50 Figure 10. Maximum Rated Forward Biased Safe Operating Area −25 25 0 50 75 100 125 TJ, JUNCTION TEMPERATURE (°C) Figure 11. Threshold Voltage http://onsemi.com 5 150 NTMFS4854NS R(t), EFFECTIVE TRANSIENT THERMAL RESPONSE TYPICAL CHARACTERISTICS 100 50% (DUTY CYCLE) 10 1.0 0.1 20% 10% 5.0% 2.0% 1.0% SINGLE PULSE RqJA = 54°C/W 0.01 0.000001 0.00001 0.0001 0.001 0.01 0.1 t, TIME (s) Figure 12. FET Thermal Response http://onsemi.com 6 1.0 10 100 1000 NTMFS4854NS PACKAGE DIMENSIONS DFN8 5x6, 1.27P CASE 506BQ−01 ISSUE C 2X NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.15 AND 0.30 MM FROM THE TERMINAL TIP. 4. PROFILE TOLERANCE APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINAL. 5. DIMENSION D1 AND E1 DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR GATE BURRS. 6. SEATING PLANE IS DEFINED BY THE TERMINALS. A1 IS DEFINED AS THE DISTANCE FROM THE SEATING PLANE TO THE LOWEST POINT ON THE PACKAGE BODY. 7. A VISUAL INDICATOR FOR PIN 1 MUST BE LOCATED IN THIS AREA. 0.20 C D A B D1 8 7 6 2X 0.20 C 5 E1 E PIN ONE IDENTIFIER NOTE 7 4X DIM A A1 b c D D1 D2 E E1 E2 e G h K L M N h 1 2 3 c 4 A1 TOP VIEW 0.10 C A DETAIL A 0.10 C NOTE 4 SIDE VIEW SEATING PLANE NOTE 6 C DETAIL A D2 1 8X M SOLDERING FOOTPRINT* 4 1.27 PITCH 8X 0.75 L N K e G 5 8X BOTTOM VIEW 4X 0.92 E2 4.84 8 MILLIMETERS MAX MIN 1.10 0.90 −−− 0.05 0.33 0.51 0.20 0.33 5.15 BSC 4.50 5.10 3.90 4.30 6.15 BSC 5.50 6.10 3.00 3.50 1.27 BSC 0.80 1.20 −−− 12 _ 0.20 −−− 0.51 0.71 3.25 3.75 1.80 2.20 4X 0.90 2.00 6.59 3.70 b 0.10 C A B 0.05 c NOTE 3 0.99 4X 1.00 4.56 5.55 DIMENSION: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. SENSEFET is a registered trademark of Semiconductor Components Industries, LLC (SCILLC). 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