IRF IRG4ZH71KD

PD - 91729
IRG4ZH71KD
PRELIMINARY
Surface Mountable
Short Circuit Rated
UltraFast IGBT
INSULATED GATE BIPOLAR TRANSISTOR WITH
ULTRAFAST SOFT RECOVERY DIODE
Features
• High short circuit rating optimized for motor
control, tsc =10µs, VCC = 720V , TJ = 125°C,
VGE = 15V
• IGBT co-packaged with HEXFRED ultrafast,
ultra-soft-recovery antiparallel diodes for use in
bridge configurations
• Combines low conduction losses with high
switching speed
• Low profile low inductance SMD-10 Package
• Separated control & Power-connections for easy
paralleling
• Inherently Good coplanarity
• Easy solder inspection and cleaning
n-channel
C
VCES = 1200V
VCE(ON)typ = 2.89V
G
@VGE = 15V, IC = 42A
E(k)
E
Benefits
• Highest power density and efficiency available
• HEXFRED Diodes optimized for performance with
IGBTs. Minimized recovery characteristics
• IGBTs optimized for specific application conditions
Absolute Maximum Ratings
Parameter
VCES
IC @ TC = 25°C
IC @ TC = 100°C
ICM
ILM
IF @ TC = 100°C
IFM
tsc
VGE
PD @ TC = 25°C
PD @ TC = 100°C
TJ
TSTG
Collector-to-Emitter Voltage
Continuous Collector Current
Continuous Collector Current
Pulsed Collector Current 
Clamped Inductive Load Current ‚
Diode Continuous Forward Current
Diode Maximum Forward Current
Short Circuit Withstand Time
Gate-to-Emitter Voltage
Maximum Power Dissipation
Maximum Power Dissipation
Operating Junction and
Storage Temperature Range
Max.
Units
1200
78
42
156
156
42
156
10
± 20
350
140
-55 to +150
V
A
µs
V
W
°C
Thermal Resistance
Parameter
RθJC
RθJC
RθCS
Junction-to-Case - IGBT
Junction-to-Case - Diode
SMD-10 Case-to-Heatsink (typical), *
Weight
Min.
Typ.
Max.
–––
–––
–––
–––
–––
–––
0.44
6.0(0.21)
0.36
0.69
–––
–––
Units
°C/W
g (oz)
* Assumes device soldered to 3.0 oz. Cu on 3.0mm IMS/Aluminum board, mounted to flat, greased heatsink.
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1
IRG4ZH71KD
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
V(BR)CES
∆V(BR)CES/∆TJ
VCE(on)
VGE(th)
∆VGE(th)/∆TJ
gfe
ICES
VFM
IGES
Parameter
Min. Typ. Max. Units
Collector-to-Emitter Breakdown Voltageƒ 1200 —
—
V
Temperature Coeff. of Breakdown Voltage — 0.26 — V/°C
Collector-to-Emitter Saturation Voltage
— 2.89 3.9
— 3.73 —
V
— 2.55 —
Gate Threshold Voltage
3.0
—
6.0
Temperature Coeff. of Threshold Voltage
—
-11
— mV/°C
Forward Transconductance„
23
34
—
S
Zero Gate Voltage Collector Current
—
—
500
µA
—
—
10
mA
Diode Forward Voltage Drop
— 2.45 3.7
V
— 2.40 —
Gate-to-Emitter Leakage Current
—
— ±100 nA
Conditions
VGE = 0V, IC = 250µA
VGE = 0V, IC = 4.0mA
IC = 42A
VGE = 15V
IC = 78A
See Fig. 2, 5
IC = 42A, TJ = 150°C
VCE = VGE, IC = 250µA
VCE = VGE, IC = 1.5mA
VCE = 50V, IC = 42A
VGE = 0V, VCE = 1200V
VGE = 0V, VCE = 1200V, TJ = 150°C
IC = 42A
See Fig. 13
IC = 42A, TJ = 150°C
VGE = ±20V
Switching Characteristics @ TJ = 25°C (unless otherwise specified)
Qg
Qge
Qgc
td(on)
tr
td(off)
tf
Eon
Eoff
Ets
tsc
Parameter
Total Gate Charge (turn-on)
Gate - Emitter Charge (turn-on)
Gate - Collector Charge (turn-on)
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Turn-On Switching Loss
Turn-Off Switching Loss
Total Switching Loss
Short Circuit Withstand Time
td(on)
tr
td(off)
tf
Ets
LE
Cies
Coes
Cres
trr
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Switching Loss
Internal Emitter Inductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Diode Reverse Recovery Time
Irr
Diode Peak Reverse Recovery Current
Qrr
Diode Reverse Recovery Charge
di(rec)M/dt
Diode Peak Rate of Fall of Recovery
During tb
2
Min.
—
—
—
—
—
—
—
—
—
—
10
Typ.
380
48
120
80
45
215
220
3.64
3.17
6.81
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
91
48
430
400
14.6
2.0
5620
400
94
107
160
10
16
680
1400
250
320
Max. Units
Conditions
570
IC = 42A
72
nC VCC = 400V
See Fig.8
180
VGE = 15V
—
—
TJ = 25°C
ns
320
IC = 42A, VCC = 800V
330
VGE = 15V, RG = 5.0Ω
—
Energy losses include "tail"
—
mJ and diode reverse recovery
9.8
See Fig. 9,10,18
—
µs
VCC = 720V, TJ = 125°C
VGE = 15V, RG = 5.0Ω
—
TJ = 150°C,
See Fig. 10,11,18
—
IC = 42A, VCC = 800V
ns
—
VGE = 15V, RG = 5.0Ω,
—
Energy losses include "tail"
—
mJ and diode reverse recovery
—
nH Measured 5mm from package
—
VGE = 0V
—
pF
VCC = 30V
See Fig. 7
—
ƒ = 1.0MHz
160
ns
TJ = 25°C See Fig.
240
TJ = 125°C
14
IF = 42A
15
A
TJ = 25°C See Fig.
24
TJ = 125°C
15
VR = 200V
1020 nC TJ = 25°C See Fig.
2100
TJ = 125°C
16
di/dt = 200A/µs
—
A/µs TJ = 25°C See Fig.
—
TJ = 125°C
17
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IRG4ZH71KD
40
LOAD CURRENT (A)
F or b oth:
D uty c y c le : 50%
T J = 12 5° C
T sink = 90 °C
G a te d riv e a s s pe c ified
30
P ow er D is s ipation = 44 W
S q u a re w a v e :
60% of rated
voltage
20
I
10
Id e a l d io d es
0
0.1
1
10
100
f, Frequency (KHz)
Fig. 1 - Typical Load Current vs. Frequency
(Load Current = IRMS of fundamental)
1000
100
I C , Collector-to-Emitter Current (A)
I C , Collector Current (A)
1000
100
TJ = 150 ° C
10
TJ = 25 °C
V GE = 15V
80µs PULSE WIDTH
1
1.0
2.0
3.0
4.0
5.0
VCE , Collector-to-Emitter Voltage (V)
Fig. 2 - Typical Output Characteristics
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TJ = 150 ° C
TJ = 25 °C
10
V CC = 50V
5µs PULSE WIDTH
1
5
6
7
8
9
VGE , Gate-to-Emitter Voltage (V)
Fig. 3 - Typical Transfer Characteristics
3
IRG4ZH71KD
5.0
VCE , Collector-to-Emitter Voltage(V)
Maximum DC Collector Current(A)
80
60
40
20
0
25
50
75
100
125
4.0
IC = 84 A
3.0
IC = 42 A
IC = 21 A
2.0
1.0
-60 -40 -20
150
TC , Case Temperature (° C)
Fig. 4 - Maximum Collector Current vs. Case
Temperature
VGE = 15V
80 us PULSE WIDTH
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature (° C)
Fig. 5 - Typical Collector-to-Emitter Voltage
vs. Junction Temperature
T he rm a l R es p on se (Zth JC )
1
D = 0.50
0.1
0.20
PDM
0.10
t
1
t2
0.05
0.02
0.01
Notes:
1. Duty factor D = t
S IN G LE P U LS E
(TH E R M A L R E S P O N S E )
1 / t2
2. Peak TJ = PDM x Z thJC + TC
0.01
0.0001
0.001
0.01
0.1
1
10
A
100
t 1 , R e cta n g u la r P u ls e D u ra tio n (se c)
Fig. 6 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
4
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IRG4ZH71KD
VGE =
Cies =
Cres =
Coes =
C, Capacitance (pF)
6000
0V,
f = 1MHz
Cge + Cgc , Cce SHORTED
Cgc
Cce + Cgc
Cies
4000
2000
Coes
20
VGE , Gate-to-Emitter Voltage (V)
8000
VCC = 400V
I C = 42A
16
12
8
4
Cres
0
1
10
0
100
0
VCE , Collector-to-Emitter Voltage (V)
Total Switching Losses (mJ)
Total Switching Losses (mJ)
100
15
10
5
10
20
30
40
50
RG , Gate Resistance (Ω)
Fig. 9 - Typical Switching Losses vs. Gate
Resistance
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240
320
400
Fig. 8 - Typical Gate Charge vs.
Gate-to-Emitter Voltage
V CC = 800V
V GE = 15V
TJ = 25 ° C
I C = 42A
0
160
QG , Total Gate Charge (nC)
Fig. 7 - Typical Capacitance vs.
Collector-to-Emitter Voltage
20
80
RG = 5.0 Ω
VGE = 15V
VCC = 800V
IC = 84 A
IC = 42 A
10
IC = 21 A
1
-60 -40 -20
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature (° C )
Fig. 10 - Typical Switching Losses vs.
Junction Temperature
5
IRG4ZH71KD
1000
= 5.0Ω
= 150 ° C
= 800V
= 15V
I C , Collector Current (A)
RG
TJ
VCC
VGE
30
VGE = 20V
T J = 125 oC
100
20
10
10
SAFE OPERATING AREA
1
0
20
30
40
50
60
70
80
1
90
10
100
1000
10000
VCE , Collector-to-Emitter Voltage (V)
I C , Collector Current (A)
Fig. 11 - Typical Switching Losses vs.
Collector Current
Fig. 12 - Turn-Off SOA
1000
Instantaneous forward current - IF (A)
Total Switching Losses (mJ)
40
100
TJ = 150°C
TJ = 125°C
TJ = 25°C
10
1
0.0
2.0
4.0
6.0
Forward Voltage Drop - V FM (V)
Fig. 13 - Typical Forward Voltage Drop vs. Instantaneous Forward Current
6
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IRG4ZH71KD
300
100
I F = 84A
I F = 42A
I F = 21A
I F = 84A
I F = 42A
I F = 21A
Irr- ( A)
trr- (nC)
200
10
100
V R = 2 00 V
T J = 12 5 °C
T J = 25 °C
VR = 200 V
T J = 12 5°C
T J = 25 °C
0
100
di f /dt - (A/µ s)
1
100
1000
1000
d i f /dt - (A /µ s )
Fig. 15 - Typical Recovery Current vs. dif/dt
Fig. 14 - Typical Reverse Recovery vs. dif/dt
5000
10000
VR = 2 00V
T J = 12 5°C
T J = 25 °C
4000
I F = 84A
di (rec) M/dt- (A /µs)
I F = 42A
I F = 84A
Qrr- (nC)
3000
I F = 42A
I F = 21A
2000
IF = 21A
1000
1000
V R = 2 00V
T J = 1 2 5 °C
T J = 2 5 °C
0
100
di f /dt - (A/µ s)
1000
Fig. 16 - Typical Stored Charge vs. dif/dt
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100
100
1000
di f /dt - (A/µ s)
Fig. 17 - Typical di(rec)M/dt vs. dif/dt
7
IRG4ZH71KD
90% V ge
Same type
device as
D .U.T.
+V ge
V ce
430µF
80%
of Vce
D .U .T.
Ic
90% Ic
10% V ce
Ic
5% Ic
td (off)
tf
E off =
Fig. 18a - Test Circuit for Measurement of
∫ Vce Ic dt
t1+5µ S
V ce ic dt
t1
ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf
t1
t2
Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining
Eoff, td(off), tf
G A T E V O LT A G E D .U .T .
10% + V g
trr
Q rr =
Ic
trr
id
Icdtdt
tx
∫
+V g
tx
10% V c c
10% Irr
Vcc
D U T V O LT A G E
AND CURRENT
Vce
V pk
Irr
Vcc
10% Ic
Ipk
90% Ic
Ic
D IO D E R E C O V E R Y
W AVEFORMS
tr
td(on)
5% V c e
t1
∫
t2
c e ieIcdt dt
E on = VVce
t1
t2
E rec =
D IO D E R E V E R S E
RECOVERY ENERG Y
t3
Fig. 18c - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr
8
∫ Vc Ic dt
t4
V d id dt
t3
t4
Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining Erec, trr, Qrr, Irr
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IRG4ZH71KD
V g G A T E S IG N A L
D E V IC E U N D E R T E S T
C U R R E N T D .U .T .
V O LT A G E IN D .U .T .
C U R R E N T IN D 1
t0
t1
t2
Figure 18e. Macro Waveforms for Figure 18a's Test Circuit
D.U.T.
L
1000V
Vc*
RL=
960V
4 X IC @25°C
0 - 960V
50V
600 0µ F
100 V
Figure 19. Clamped Inductive Load Test Circuit
Figure 20. Pulsed Collector Current
Test Circuit
Notes:
➀ Repetitive rating: VGE=20V; pulse width limited by maximum junction
temperature (figure 20)
➁ VCC=80%(VCES), VGE=20V, L=10µH, RG= 5.0Ω (figure 19)
➂ Pulse width ≤ 80µs; duty factor ≤ 0.1%
➃ Pulse width 5.0µs, single shot
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9
IRG4ZH71KD
Case Outline — SMD-10
17.30
Dimensions are shown in millimeters
14.20
E(k) G
4.27
n/c
0.90
5.55
29.00
C
0.90
E
E
Recommended footprint
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Data and specifications subject to change without notice.
5/98
10
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