PD -95486 IRF1407SPbF IRF1407LPbF Benefits O O O O O O O Advanced Process Technology Ultra Low On-Resistance Dynamic dv/dt Rating 175°C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Lead-Free Description HEXFET® Power MOSFET D VDSS = 75V RDS(on) = 0.0078Ω G Advanced HEXFET® Power MOSFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. ID = 100A S The D2Pak is a surface mount power package capable of accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on-resistance in any existing surface mount package. The D2Pak is suitable for high current applications because of its low internal connection resistance and can dissipate up to 2.0W in a typical surface mount application. The through-hole version (IRF1407L) is available for lowprofile applications. D2Pak IRF1407S TO-262 IRF1407L Absolute Maximum Ratings ID @ TC = 25°C ID @ TC = 100°C IDM PD @TA = 25°C PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Parameter Max. Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds 100 70 520 3.8 200 1.3 ± 20 390 See Fig.12a, 12b, 15, 16 Units 4.6 -55 to + 175 A W W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) Thermal Resistance Parameter RθJC RθJA Junction-to-Case Junction-to-Ambient(PCB Mounted,steady-state)** Typ. Max. Units ––– ––– 0.75 40 °C/W **When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994. www.irf.com 1 06/30/04 IRF1407S/LPbF Electrical Characteristics @ TJ = 25°C (unless otherwise specified) RDS(on) VGS(th) gfs Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Min. 75 ––– ––– 2.0 74 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– 0.09 ––– ––– ––– ––– ––– ––– ––– 160 35 54 11 150 150 140 Max. ––– ––– 0.0078 4.0 ––– 20 250 200 -200 250 52 81 ––– ––– ––– ––– IDSS Drain-to-Source Leakage Current LD Internal Drain Inductance ––– 4.5 ––– LS Internal Source Inductance ––– 7.5 ––– Ciss Coss Crss Coss Coss Coss eff. Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Output Capacitance Effective Output Capacitance ––– ––– ––– ––– ––– ––– 5600 890 190 5800 560 1100 ––– ––– ––– ––– ––– ––– V(BR)DSS ∆V(BR)DSS/∆TJ IGSS Units V V/°C Ω V S µA nA nC ns nH pF Conditions VGS = 0V, ID = 250µA Reference to 25°C, ID = 1mA VGS = 10V, ID = 78A VDS = 10V, ID = 250µA VDS = 25V, ID = 78A VDS = 75V, VGS = 0V VDS = 60V, VGS = 0V, TJ = 150°C VGS = 20V VGS = -20V ID = 78A VDS = 60V VGS = 10V VDD = 38V ID = 78A RG = 2.5Ω VGS = 10V D Between lead, 6mm (0.25in.) G from package and center of die contact S VGS = 0V VDS = 25V ƒ = 1.0KHz, See Fig. 5 VGS = 0V, VDS = 1.0V, ƒ = 1.0KHz VGS = 0V, VDS = 60V, ƒ = 1.0KHz VGS = 0V, VDS = 0V to 60V Source-Drain Ratings and Characteristics IS ISM VSD trr Qrr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Notes: Repetitive rating; pulse width limited by max. junction temperature. (See fig. 11). Starting TJ = 25°C, L = 0.13mH RG = 25Ω, IAS = 78A. (See Figure 12). ISD ≤ 78A, di/dt ≤ 320A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C Pulse width ≤ 400µs; duty cycle ≤ 2%. 2 Min. Typ. Max. Units Conditions D MOSFET symbol ––– ––– 100 showing the A G integral reverse ––– ––– 520 S p-n junction diode. ––– ––– 1.3 V TJ = 25°C, IS = 78A, VGS = 0V ––– 110 170 ns TJ = 25°C, IF = 78A ––– 390 590 nC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS . Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 75A. Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive avalanche performance. Uses IRF1407 data and test conditions. www.irf.com IRF1407S/LPbF 1000 1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V 100 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP 4.5V 10 100 4.5V 10 20µs PULSE WIDTH Tj = 25°C 20µs PULSE WIDTH Tj = 175°C 1 1 0.1 1 10 100 0.1 1 VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 3.0 5.0 7.0 9.0 11.0 VGS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com 13.0 2.0 (Normalized) RDS(on) , Drain-to-Source On Resistance ID, Drain-to-Source Current (Α) VDS = 15V 20µs PULSE WIDTH 3.0 I D = 130A 2.5 TJ = 175°C 100.00 10.00 100 Fig 2. Typical Output Characteristics 1000.00 T J = 25°C 10 VDS, Drain-to-Source Voltage (V) 1.5 1.0 0.5 V GS = 10V 0.0 -60 -40 -20 0 20 40 60 80 TJ, Junction Temperature 100 120 140 160 180 ( °C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRF1407S/LPbF 100000 15 VGS = 0V, f = 1 MHZ Ciss = Cgs + Cgd, Cds SHORTED Crss = Cgd VGS , Gate-to-Source Voltage (V) C, Capacitance(pF) Ciss Coss 1000 Crss 100 VDS = 37V VDS = 15V 9 6 3 0 1 10 0 100 1000.00 120 160 200 10000 ID, Drain-to-Source Current (A) ISD, Reverse Drain Current (A) 80 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 100.00 40 QG, Total Gate Charge (nC) VDS, Drain-to-Source Voltage (V) T J = 175°C OPERATION IN THIS AREA LIMITED BY R DS(on) 1000 100 10.00 T J = 25°C 1.00 100µsec 10 1msec Tc = 25°C Tj = 175°C Single Pulse VGS = 0V 10msec 1 0.10 0.0 1.0 2.0 VSD, Source-toDrain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 VDS = 60V 12 Coss = Cds + Cgd 10000 ID = 78A 3.0 1 10 100 1000 VDS , Drain-toSource Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRF1407S/LPbF RD 120 VDS LIMITED BY PACKAGE VGS 100 D.U.T. RG + -VDD I D , Drain Current (A) 80 10V 60 Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 40 Fig 10a. Switching Time Test Circuit VDS 20 90% 0 25 50 75 100 125 TC , Case Temperature 150 175 ( °C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms 1 (Z thJC) D = 0.50 Thermal Response 0.20 0.1 0.10 P DM 0.05 t1 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = 2. Peak T 0.01 0.00001 0.0001 0.001 0.01 t1/ t 2 J = P DM x Z thJC +TC 0.1 1 t 1, Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRF1407S/LPbF 650 15V ID TOP + V - DD IAS 20V 0.01Ω tp Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp A EAS , Single Pulse Avalanche Energy (mJ) D.U.T RG 520 DRIVER L VDS 32A 55A 78A BOTTOM 390 260 130 0 25 50 75 100 125 150 175 ( °C) Starting T , Junction Temperature J I AS Fig 12c. Maximum Avalanche Energy Vs. Drain Current Fig 12b. Unclamped Inductive Waveforms QG 10 V QGD 3.5 VG Charge Fig 13a. Basic Gate Charge Waveform Current Regulator Same Type as D.U.T. 50KΩ 12V .2µF .3µF D.U.T. + V - DS VGS(th) Gate threshold Voltage (V) QGS 3.0 ID = 250µA 2.5 2.0 1.5 VGS -75 -50 -25 0 25 50 75 100 125 150 175 200 T J , Temperature ( °C ) 3mA IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit 6 Fig 14. Threshold Voltage Vs. Temperature www.irf.com IRF1407S/LPbF 1000 Avalanche Current (A) Duty Cycle = Single Pulse Allowed avalanche Current vs avalanche pulsewidth, tav assuming ∆ Tj = 25°C due to avalanche losses 0.01 100 0.05 0.10 10 1 1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 tav (sec) Fig 15. Typical Avalanche Current Vs.Pulsewidth EAR , Avalanche Energy (mJ) 400 TOP Single Pulse BOTTOM 10% Duty Cycle ID = 78A 300 200 100 0 25 50 75 100 125 150 Starting T J , Junction Temperature (°C) Fig 16. Maximum Avalanche Energy Vs. Temperature www.irf.com Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 12a, 12b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. ∆T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 15, 16). t av = Average time in avalanche. 175 D = Duty cycle in avalanche = t av ·f ZthJC(D, tav) = Transient thermal resistance, see figure 11) PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC Iav = 2DT/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav 7 IRF1407S/LPbF Peak Diode Recovery dv/dt Test Circuit + D.U.T* Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + RG • dv/dt controlled by RG • ISD controlled by Duty Factor "D" • D.U.T. - Device Under Test V GS * + - V DD Reverse Polarity of D.U.T for P-Channel Driver Gate Drive P.W. Period D= P.W. Period [VGS=10V ] *** D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode [VDD] Forward Drop Inductor Curent Ripple ≤ 5% [ISD] *** VGS = 5.0V for Logic Level and 3V Drive Devices Fig 17. For N-channel HEXFET® power MOSFETs 8 www.irf.com IRF1407S/LPbF D2Pak Package Outline Dimensions are shown in millimeters (inches) D2Pak Part Marking Information T HIS IS AN IRF530S WIT H LOT CODE 8024 AS S EMB LED ON WW 02, 2000 IN T HE AS S EMB LY L INE "L" INT ERNAT IONAL RECT IFIER LOGO Note: "P" in assembly line pos ition indicates "Lead-Free" PART NUMB ER F530S AS SEMB LY LOT CODE DAT E CODE YEAR 0 = 2000 WEEK 02 L INE L OR INT ERNAT IONAL RE CT IF IER LOGO AS SE MB LY LOT CODE www.irf.com PART NUMBER F530S DAT E CODE P = DES IGNAT E S LE AD-F RE E PRODUCT (OPT IONAL) YEAR 0 = 2000 WEE K 02 A = ASS EMBLY SIT E CODE 9 IRF1407S/LPbF TO-262 Package Outline Dimensions are shown in millimeters (inches) TO-262 Part Marking Information EXAMPLE: T HIS IS AN IRL 3103L LOT CODE 1789 AS S EMBLED ON WW 19, 1997 IN T HE AS S EMBL Y LINE "C" Note: "P" in as s embly line pos ition indicates "Lead-Free" INT ERNAT IONAL RECT IFIER LOGO AS S EMBLY LOT CODE PART NUMBER DAT E CODE YEAR 7 = 1997 WEEK 19 LINE C OR INT ERNAT IONAL RE CT IFIER LOGO AS S E MBLY LOT CODE 10 PART NU MBER DAT E CODE P = DES IGNAT ES LEAD-FREE PRODUCT (OPT IONAL) YE AR 7 = 1997 WEE K 19 A = AS S EMBLY S IT E CODE www.irf.com IRF1407S/LPbF D2Pak Tape & Reel Information Dimensions are shown in millimeters (inches) TRR 1.60 (.063) 1.50 (.059) 4.10 (.161) 3.90 (.153) FEED DIRECTION 1.85 (.073) 1.60 (.063) 1.50 (.059) 0.368 (.0145) 0.342 (.0135) 11.60 (.457) 11.40 (.449) 1.65 (.065) 15.42 (.609) 15.22 (.601) 24.30 (.957) 23.90 (.941) TRL 10.90 (.429) 10.70 (.421) 1.75 (.069) 1.25 (.049) 4.72 (.136) 4.52 (.178) 16.10 (.634) 15.90 (.626) FEED DIRECTION 13.50 (.532) 12.80 (.504) 27.40 (1.079) 23.90 (.941) 4 330.00 (14.173) MAX. 60.00 (2.362) MIN. NOTES : 1. COMFORMS TO EIA-418. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. 26.40 (1.039) 24.40 (.961) 30.40 (1.197) MAX. 4 3 Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.06/04 www.irf.com 11 Note: For the most current drawings please refer to the IR website at: http://www.irf.com/package/