INITIAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 31-JAN-2003 SUBJECT: ON Semiconductor Initial Product/Process Change Notification #12687 TITLE: Schottky Die Shrinks EFFECTIVE DATE: 31-May-2003 AFFECTED CHANGE CATEGORY: Die Shrink AFFECTED PRODUCT DIVISION: Bipolar Discretes Products Div ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office or Dianne Von Borstel <[email protected]> FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Office or Louis Tsai <[email protected]> DISCLAIMER: Initial Product/Process Change Notification (IPCN) - First Notification distributed to customers. Distributed at least 120 days from the effective date of the change. This is an 'early warning' about an upcoming change and contains general information regarding the change details and devices affected. It also contains at least a reliability qualification plan, but the actual qualification data will be identified in the Final Product/Process Change Notification (FPCN). This notification will be followed by a Final Product/Process Change Notification (FPCN) at least 60 days from effective date of change. DESCRIPTION AND PURPOSE: On Semiconductor is qualifying a reduction in die size for these Schottky Rectifier devices. Datasheet specifications and critical product electrical performance will remain unchanged. This die size reduction will help ON Semiconductor meet the increasing demand for its Schottky Rectifier product. Issue Date: 31 Jan, 2003 Page 1 of 3 Initial Product/Process Change Notification #12687 QUALIFICATION PLAN: RELIABILITY Plan: Phase 1 Package: SOD123, Device = MBR0540 Test Conditions HTRB 150 deg C, 80% rated Voltage IOL Delta Tj of 100 deg C max. Temp Cycle Ta = -65 to +150 deg C Interval 504 and 1008 hrs 7500 and 15000 cycles 500 and 1000 cycles Sample Size (Lots x Units) 1x80 1x80 1x80 Package: Powermite, Device = MBRM120E Test Conditions HTRB 150 deg C, 80% rated Voltage IOL Delta Tj of 100 deg C max. Temp Cycle Ta = -65 to +150 deg C Interval 504 and 1008 hrs 7500 and 15000 cycles 500 and 1000 cycles Sample Size (Lots x Units) 2x80 2x80 2x80 Package: TO220, Device = MBR20100CT Test Conditions HTRB 150 deg C, 80% rated Voltage IOL Delta Tj of 100 deg C max. Temp Cycle Ta = -65 to +150 deg C Interval 504 and 1008 hrs 4286 and 8572 cycles 500 and 1000 cycles Sample Size (Lots x Units) 2x80 2x80 2x80 Package: DPAK, Device = MBRD835L Test Conditions HTRB 150 deg C, 80% rated Voltage IOL Delta Tj of 100 deg C max. Temp Cycle Ta = -65 to +150 deg C Interval 504 and 1008 hrs 7500 and 15000 cycles 500 and 1000 cycles Sample Size (Lots x Units) 1x80 1x80 1x80 Package: SMC, Device = MBRS340 Test Conditions HTRB 150 deg C, 80% rated Voltage IOL Delta Tj of 100 deg C max. Temp Cycle Ta = -65 to +150 deg C Interval 504 and 1008 hrs 4286 and 8572 cycles 500 and 1000 cycles Sample Size (Lots x Units) 1x80 1x80 1x80 Package: SMB, Device = MBRS140 Test Conditions HTRB 150 deg C, 80% rated Voltage IOL Delta Tj of 100 deg C max. Temp Cycle Ta = -65 to +150 deg C Interval 504 and 1008 hrs 7500 and 15000 cycles 500 and 1000 cycles Sample Size (Lots x Units) 1x80 1x80 1x80 RELIABILITY Plan: Phase 2 Issue Date: 31 Jan, 2003 Page 2 of 3 Initial Product/Process Change Notification #12687 AFFECTED DEVICE LIST (WITHOUT SPECIALS): PART MBR0520LT1 MBR0520LT3 MBR0530T1 MBR0530T3 MBR0540T1 MBR0540T3 MBR130T1 MBR130T3 MBR16100CT MBR20100CT MBR2080CT MBR2090CT MBR2090CTLFAJ MBRA120ET3 MBRA140T3 MBRB20100CT MBRB20100CTT4 MBRD835L MBRD835LT4 MBRF20100CT MBRF2060CT MBRM110ET1 MBRM110ET3 MBRM120ET1 MBRM120ET3 MBRM140T1 MBRM140T3 MBRS1100T3 MBRS120T3 MBRS130T3 MBRS140T3 MBRS190T3 MBRS240LT3 MBRS320T3 MBRS330T3 MBRS340T3 Issue Date: 31 Jan, 2003 Page 3 of 3