FINAL PRODUCT/PROCESS CHANGE NOTIFICATION # 20210A Generic Copy Issue Date: 24-Sep-2013 TITLE: Qualification of ON Semiconductor Vietnam (OSV) for the Assembly and Test of Trench Mosfet, Ultrafast Rectifier and Bipolar Power Transistors packaged in DPAK case 369C, 369AA & 369AD. PROPOSED FIRST SHIP DATE: 24-Dec-2013 AFFECTED CHANGE CATEGORY(S): ON Semiconductor Assembly & Test FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact your local ON Semiconductor Sales Office or following contact Product Engineers: Bipolar Power Transistor Trench Mosfet Ultrafast Rectifiers Farrah Omar Sew Seng Tam Raja Roziah [email protected] [email protected] [email protected] SAMPLES: Contact your local ON Semiconductor Sales Office ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Reliability Engineer Chean Ching Sim <[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. implementation of the change. FPCNs are issued at least 90 days prior to ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact <[email protected]>. DESCRIPTION AND PURPOSE: This FPCN announces the planned capacity expansion of ON Semiconductor’s assembly and test operations of DPAK discrete packaged products, currently built at ON Semiconductor Seremban, Malaysia facility to ON Semiconductor Vietnam (OSV). Upon the expiration of this FPCN, Trench Mosfet, Ultrafast Rectifier, Bipolar Power Transistor devices may be processed at either location. These products have been qualified to commodity/commercial requirements. These products will continue being Pb-free, Halide free and RoHS compliant. Issue Date: 24-Sep-2013 Rev. 06-Jan-2010 Page 1 of 5 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION # 20210A RELIABILITY DATA SUMMARY: Reliability Test Results: Device MJD340T4G Test: HTRB Autoclave H3TRB IOL TC HTSL RSH Solderability Conditions: Interval: Results Ta=150°C 80% Rated Voltage 1008 hrs 0/84 Ta=121°C RH=100% 15 psig 96 hrs 0/84 Ta=85°C RH=85% 1008 hrs 0/84 bias=80% rated V or 100V Max Ta=25°C, Delta TJ = 100°C, 15,000 cycles 0/84 Ton/off = 2 min. Ta= -65°C to 150°C 1000 cycles 0/84 Ta = 150°C 1008 hrs 0/84 Ta=260°C, 10 sec dwell 0/30 Ta=245°C, 10 sec dwell 0/15 Device MJD350T4G Test: HTRB Autoclave H3TRB IOL TC HTSL RSH Solderability Conditions: Interval: Results Ta=150°C 80% Rated Voltage 1008 hrs 0/84 Ta=121°C RH=100% 15 psig 96 hrs 0/84 Ta=85°C RH=85% 1008 hrs 0/84 bias=80% rated V or 100V Max Ta=25°C, Delta TJ = 100°C, 15,000 cycles 0/84 Ton/off = 2 min. Ta= -65°C to 150°C 1000 cycles 0/84 Ta = 150°C 1008 hrs 0/84 Ta=260°C, 10 sec dwell 0/30 Ta=245°C, 10 sec dwell 0/15 Device MURHD560T4G Test: Conditions: HTRB Autoclave H3TRB Ta=150°C 80% Rated Voltage Ta=121°C RH=100% 15 psig Ta=85°C RH=85% bias=80% rated V or 100V Max Ta=25°C, Delta TJ = 100°C, Ton/off = 2 min. Ta= -65°C to 150°C Ta = 150°C Ta=260°C, 10 sec dwell Ta=245°C, 10 sec dwell IOL TC HTSL RSH Solderability Issue Date: 24-Sep-2013 Interval: Results 1008 hrs 96 hrs 1008 hrs 0/252 0/252 0/252 15,000 cycles 0/252 1000 cycles 1008 hrs 0/252 0/252 0/90 0/45 Rev. 06-Jan-2010 Page 2 of 5 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION # 20210A RELIABILITY DATA SUMMARY: Reliability Test Results: Device NTD5862NT4G Test: Conditions: HTRB HTGB Autoclave H3TRB Ta=175°C 80% Rated Voltage Ta=175°C 100% Rated Voltage Ta=121°C RH=100% 15 psig Ta=85°C RH=85% bias=80% rated V or 100V Max Ta=25°C, Delta TJ = 100°C, Ton/off = 2 min. Ta= -55°C to 150°C Ta = 150°C Ta=260°C, 10 sec dwell Ta=245°C, 10 sec dwell IOL TC HTSL RSH Solderability Interval: Results 1008 hrs 1008 hrs 96 hrs 1008 hrs 0/252 0/252 0/252 0/252 15,000 cycles 0/252 1000 cycles 1008 hrs 0/252 0/252 0/90 0/45 Device NTD4904NT4G Test: Conditions: HTRB HTGB Autoclave H3TRB Ta=175°C 80% Rated Voltage Ta=175°C 100% Rated Voltage Ta=121°C RH=100% 15 psig Ta=85°C RH=85% bias=80% rated V or 100V Max Ta=25°C, Delta TJ = 100°C, Ton/off = 2 min. Ta= -55°C to 150°C Ta = 150°C Ta=260°C, 10 sec dwell Ta=245°C, 10 sec dwell IOL TC HTSL RSH Solderability Interval: Results 1008 hrs 1008 hrs 96 hrs 1008 hrs 0/252 0/252 0/252 0/252 15,000 cycles 0/252 1000 cycles 1008 hrs 0/252 0/252 0/90 0/45 ELECTRICAL CHARACTERISTIC SUMMARY: There are no changes in electrical characteristics; product performance meets data sheet specifications. Characterization data is available upon request. CHANGED PART IDENTIFICATION: Product from On Semiconductor Vietnam will be marked with site code VN prior to date code. Issue Date: 24-Sep-2013 Rev. 06-Jan-2010 Page 3 of 5 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION # 20210A List of affected General Parts: AFFECTED DEVICE LIST BIPOLAR POWER: MJD50G MJD50T4G MJD47G NJD35N04T4G NJD35N04G MJD47T4G BUD42DT4G MJD5731T4G MJD44H11T5G MJD44H11T4G MJD44H11G MJD44E3T4G MJD350T4G MJD340T4G MJD340RLG MJD45H11G MJD253T4G MJD243G MJD210T4G MJD200G MJD243T4G MJD210RLG Issue Date: 24-Sep-2013 MJD45H11T4G MJD45H11RLG MJD44H11RLG MJD210G MJD340G MJD200T4G MJD200RLG NSS1C300ET4G NSS1C301ET4G MJD6039T4G MJD32RLG MJD42CRLG MJD41CT4G MJD41CRLG MJD32CRLG MJD31T4G MJD31CT4G MJD31CRLG MJD31CG MJD127G MJD32T4G MJD117T4G Rev. 06-Jan-2010 MJD3055T4G MJD148T4G MJD128T4G MJD32CT4G MJD32CG MJD42CG MJD2955T4G MJD2955G MJD42CT4G MJD127T4G MJD122T4G MJD122G MJD117RLG MJD117G MJD3055G MJD42C1G MJD31C1G NJD2873T4G NJD1718T4G MJD112T4G MJD112RLG MJD112G Page 4 of 5 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION # 20210A AFFECTED DEVICE LIST TRENCH MOSFET: NTD4906NT4G NTD4963NT4G NTD5807NT4G NTD4906N-35H NTD4909NT4G NTD5802NT4G NTD4979N-35G NTD4965NT4G NTD4906NAT4H NTD4969NT4G NTD4906NA-35G NTD4906NA-35H NTD4906NAT4G NTD4906NT4H NTD5804NT4G NTD5806NT4G NTD5862NT4G NTD5865NLT4G NTD4806NT4G NTD4809NT4G NTD4858N-35G NTD4858NT4G NTD4906N-35G NTD4970NT4G NTD4805NT4G NTD4909NAT4H NTD4965N-35G NTD4806N-35G NTD4806NT4H NTD4809N-35G NTD4813N-35G NTD4909N-35G NTD4909N-35H NTD4909NA-35G NTD4909NA-35H NTD4909NT4H NTD4910NT4G NTD4969N-35G NTD4970N-35G NTD4979NT4G NTD4809N-35H NTD4809NAT4H NTD4813NT4H NTD4863NT4G NTD5865NT4G NTD5867NLT4G NTD4813NHT4G NTD4815N-35G NTD4860NT4G NTD4963N-35G NTD5805NT4G NTD5803NT4G STD4963NT4G NTD5863NLT4G NTD4804NT4G NTD4809NHT4G AFFECTED DEVICE LIST ULTRAFAST RECTIFIERS: MSRD620CTG MSRD620CTRG MSRD620CTT4G MSRD620CTT4RG MURD320T4G MURD330T4G MURD340T4G MURD530T4G MURD550PFT4G MURD620CTG MURD620CTH MURD620CTT4G MURHD560T4G MURHD560W1T4G Issue Date: 24-Sep-2013 Rev. 06-Jan-2010 Page 5 of 5