FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #16814 Generic Copy Issue Date: 22-Feb-2012 TITLE: NCS1002 Design Change PROPOSED FIRST SHIP DATE: 22-May-2012 AFFECTED CHANGE CATEGORY(S): Design Change FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact your local ON Semiconductor Sales Office or Tim Gurnett <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office or Tim Gurnett <[email protected]> ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Ken Fergus <[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. implementation of the change. FPCNs are issued at least 90 days prior to ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact <[email protected]>. DESCRIPTION AND PURPOSE: This customer notification details the redesign of the NCS1002 family of CV/CC controllers. Only the part numbers listed below are included in this change. The device designs will be revised to match the latest design rules for the wafer process. Parts will be pin-for-pin replacements for existing devices, with no change in datasheet parameters or part nomenclature. The wafer fab location remains as the ON Semiconductor wafer fab located in Roznov, Czech Republic. Customer Samples are available at the issuance of the Final PCN. Issue Date: 22-Feb-2012 Rev. 06-Jan-2010 Page 1 of 2 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #16814 RELIABILITY DATA SUMMARY: Reliability Test Results: # Test Name Test Conditions 1 Prep Sample preparation and initial part testing Various 2 HTOL High Temp Operatiing Life 125°C Biased 3 PC MSL1 Preconditioning 5 TC-PC 6 UHASTPC End Point Req’s Test Results (rej/ ss) Read Point Initial Electrical Lot A Done c = 0, Room 504 Hrs 0/80 3 IR @ 260 deg C c = 0, Room - done Precond. Temp Cycle -65/+150 C c = 0, Room 500 cyc 0/80 Precond. UHast TA = 130 C, RH = 85%,PSIG = 18.8 c = 0, Room 96 hrs 0/80 --- Table 1: Reliability Evaluation Results for NCS1002DR2G Qualification Points in BOLD. ELECTRICAL CHARACTERISTIC SUMMARY: Product performance continues to meet datasheet specifications. CHANGED PART IDENTIFICATION: Upon effectivity of this notification, devices will be transitioned to the new die. Manufacturing traceability will be maintained to allow identification of the die version. Part nomenclature will not be changed. List of affected General Parts: NCS1002DR2G Issue Date: 22-Feb-2012 Rev. 06-Jan-2010 Page 2 of 2