CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1998 Rev 1 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/3/98 STANDARD STRESS TEST DESCRIPTIONS TEST DESCRIPTION HTOL HTOL2 HTSSL HTSSL2 DRET DRET2 PCT HAST TC TC2 HTS High Temp Op Life, 150ºC, 5.75V High Temp Op Life, 125ºC, 5.75V High Temp Steady State Life, 150ºC, 5.75V High Temp Steady State Life, 125ºC, 5.75V Data Retension Test, Data Bake 165ºC, Plastic Data Retension Test, Data Bake 250ºC, Hermetic Pressure Cooker Test, 121ºC, 100%RH, No Bias Hi-Accel Saturation Test, 140ºC, 85%RH, 5.5V Bias Temp Cycle, 125ºC to -40ºC Temp Cycle, 150ºC to -65ºC High Temp Storage, 165ºC, No Bias Page 2 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/3/98 WAFER FAB AREAS FAB # LOCATION CA TX MN FR San Jose, California Round Rock, Texas Bloomington, Minnesota MHS, France ASSEMBLY LOCATION ID COMPANY/LOCATION KOREA-A ASAT-B USA-C PHIL-D USA-E INDNS-F TAIWAN-G KOREA-H MALAY-J THLAND-K KOREA-L PHIL-M USA-N INDNS-O USA-P KOREA-Q PHIL-R USA-S TAIWAN-T MALAY-U USA-V USA-W ALPHA-X ALPHA-Y THLAND-Z Anam-Buchon/Korea Asat/Hongkong Cypress/USA Dynesem/Philippines Cypress-Minnesota/USA Astra/Indonesia ASE/Taiwan Hyundai/Korea ASE/Malaysia TMS/Thailand Anam-Seoul/Korea Anam/Philippines Express/USA Omedata/Indonesia Pantronix/USA Anam-Bupyong/Korea Cypress/Philippines ATM/USA OSE/Taiwan Unisem/Malaysia Aplus/USA Toshiba/USA Cypress Bangkok/Thailand Alphatech/Thailand Hana/Thailand Page 3 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/3/98 DESCRIPTION OF DATA TABLE COLUMN HEADINGS COLUMN HEADING DESCRIPTION OF COLUMN CONTENTS Division Test Test Condition Device ID Date Code Lot Number Function Description Technology Process Pkg Material Pkg Type Pkg Location # Pins Duration # Test # Failed Fail Mode Cypress Manufacturing Division Common code for the stress performed. See table on previous page for detail. Tem/humidity/bias condition for the stress. See table on previous for detail Cypress part number Week in which specific lot was marked/sealed/molded. Manufacturing (assembly) lot number Generic product family at Cypress Brief description of device function Fabrication process technology. Generic fabrication process Generic packaging material Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package). Country Location + Initial of assembly house (see table on prvious page for detail). Pin cont of package in which device is assembled. Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours. Quantity of devices submitted to this stress/test. Quantity of devices failing at this specific readpoint. Failure analysis results from this test, if any. Page 4 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/3/98 RELIABILITY DATA SUMMARY (Q298) 1 Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress conditions. Page 5 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/3/98 RELIABILITY DATA SUMMARY (Q298) Page 6 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- BICMOS-SM1 CY7B991-JC DRET 165C/N/A DCD CHNL M82027 9807 219800993 PSCB BiCMOS TX PLCC ALPHA-X No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------32 168 1000 76 76 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST 140C/5.5V DCD CHNL CY7B991-JC M74070 9733 219708729 PSCB BiCMOS TX PLCC ALPHA-X 32 128 128 128 128 12 15 21 29 0 0 15 EOS 0 0 M80156 9746 219711890 PSCB BiCMOS TX PLCC ALPHA-X 32 128 128 13 16 0 3 EOS 0 2 THERMAL EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V DCD CHNL CY7B991-JC M74066 9733 219708729 PSCB BiCMOS TX PLCC ALPHA-X 32 96 500 1000 2000 115 115 115 114 0 0 0 1 1 EOS/1 UNKNOWN M80152 9746 219711890 PSCB BiCMOS TX PLCC ALPHA-X 32 96 500 1000 2000 114 113 112 99 0 1 1 EOS/1 UNKNOWN 0 0 13 EOS M82006 9807 219800993 PSCB BiCMOS TX PLCC ALPHA-X 32 96 96 176 324 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH DCD CHNL CY7B991-JC M82024 9807 219800993 PSCB BiCMOS TX PLCC ALPHA-X 32 168 71 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C DCD CHNL CY7B991-JC M82028 9807 219800993 PSCB BiCMOS TX PLCC ALPHA-X 32 300 45 0 ENET CY7B8392-JC M74078 9716 519704354 TRANSCEIVER BiCMOS TX PLCC INDNS-O 28 300 45 4 4 TOPSIDE CRACKS M74091 9708 519701901 TRANSCEIVER BiCMOS TX PLCC INDNS-O 28 300 46 0 Page 7 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- BICMOS-SM1 CY7B8392-JC TC2 150C/-65C DCD ENET No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- M80195 9752 519714771 TRANSCEIVER BiCMOS TX PLCC INDNS-O 28 300 45 1 1 TOPSIDE CRACKS M80196 9802 519800401 TRANSCEIVER BiCMOS TX PLCC INDNS-O 28 300 45 1 1 TOPSIDE CRACKS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 8 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- FAMOS-P20 CY7C341-JC HTOL 140C/5.75V 150C/5.75V PLD MPD MAX PROM CY7C251-TMB 97497 97454 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 9748 219712389 REPROG.PAL CMOS TX PLCC ALPHA-X 84 72 251 0 219712390 REPROG.PAL CMOS TX PLCC ALPHA-X 84 72 212 0 16K x 8 CMOS TX WCER PHIL-M 28 184 48 0 9746 349705494 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V PLD MAX CY7C341-JC 97497 619804184P REPROG.PAL CMOS TX PLCC ALPHA-X 84 96 202 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C MPD PROM CY7C251-TMB 97454 9746 349705494 16K x 8 CMOS TX WCER PHIL-M 28 100 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 9 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- FAMOS-P26 CY27C010-PC DRET 165C/N/A MPD PROM M82022 9747 619709651 128K x 8 CMOS TX PDIP KOREA-H No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------32 168 1000 84 84 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 140C/5.75V 150C/5.75V PLD MPD MAX PROM CY7C342B-HMB 97356 9731 219708281P REPROG.PAL CMOS TX CERQ ALPHA-X 68 72 184 0 9810 219801652 REPROG.PAL CMOS TX CERQ ALPHA-X 68 72 207 0 1 EOS CY7C342B-RMB 97356 9734 219708941 REPROG.PAL CMOS TX WPGA ALPHA-X 68 72 185 0 CY27H010-WMB 97458 9742 349705318 128K x 8 CMOS TX WCER PHIL-M 32 184 49 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V MPD PROM CY27C010-PC M80168 9738 619707247 128K x 8 CMOS TX PDIP KOREA-H 32 96 500 1000 2000 118 118 118 118 0 0 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V MPD PROM CY27C010-PC M80169 9738 619707247 128K x 8 CMOS TX PDIP KOREA-H 32 96 500 118 118 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C MPD PROM CY27C010-PC M82023 9747 619709651 128K x 8 CMOS TX PDIP KOREA-H 32 300 48 0 CY27H010-WMB 97458 9742 349705318 128K x 8 CMOS TX WCER PHIL-M 32 100 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 10 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FLASH-FL28D CY7C375I-AC 160 PCT 121C/100%RH PLD FLASH M82041 9811 619802675 128 MCEL FL CMOS TX TQFP KOREA-Q 96 168 77 77 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C PLD FLASH CY7C375I-AC M82043 9811 619802675 128 MCEL FL CMOS TX TQFP KOREA-Q 160 300 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 11 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-C2AN VIC068A-BC 144 PCT 121C/100%RH DCD VME M80164 9746 349705554 VME INTERF. CMOS MN PPGA PHIL-M 96 168 77 77 0 0 23 EXTERNAL CONTAMINATION ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C DCD VME VIC068A-BC M80166 9746 349705554 VME INTERF. CMOS MN PPGA PHIL-M 144 300 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 12 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-L1 CY7C9101-LMB HTOL 150C/5.75V DCD VME 97459 9741 349705366 16-BITS SLI CMOS TX LCC PHIL-M No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------68 184 49 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 13 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-L20 CY7C611A-NC 160 PCT 121C/100%RH DCD VME M80182 9731 349704147 RISC CONTRL CMOS TX PQFP HK-B 96 168 78 71 7 4 TOPSIDE CRACKS/3 POPCOR 7 7 LIFTING BOND ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 14 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-L27 CY74FCT2574TQC PCT 121C/100%RH CPD FCT MR81076 9806 619801650 8 BIT REG. CMOS MN SSOP CSPI-R No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------20 96 168 76 76 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 15 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-L28 CY2310NZPVC HAST 140C/3.63V CPD TTECH 98108 9811 349800519 SDRAM BUFF. CMOS MN SSOP PHIL-M No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------28 128 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/N/A CPD TTECH CY2310NZPVC 98108 9811 349800519 SDRAM BUFF. CMOS MN SSOP PHIL-M 28 336 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CPD TTECH CY22751PVC M82054 9804 619800214 CLOCK SYN. CMOS MN SSOP CSPI-R 48 168 80 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S 150C/-55C CPD TTECH CY2310NZPVC 98108 9811 349800519 SDRAM BUFF. CMOS MN SSOP PHIL-M 28 100 200 47 47 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C CPD TTECH CY2310NZPVC 98108 9811 349800519 SDRAM BUFF. CMOS MN SSOP PHIL-M 28 300 47 0 349800520 SDRAM BUFF. CMOS MN SSOP PHIL-M 28 300 47 0 349800521 SDRAM BUFF. CMOS MN SSOP PHIL-M 28 300 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 16 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-L31 CY74FCT163LD952 98074 HAST 140C/3.63V CPD FCT 9747 349705947 16 BIT REG. CMOS MN TSSO MALAY-U No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------56 128 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/N/A CPD FCT CY74FCT163LD952 98074 9747 349705947 16 BIT REG. CMOS MN TSSO MALAY-U 56 336 1000 48 48 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S 150C/-55C CPD FCT CY74FCT163LD952 98074 9747 349705947 16 BIT REG. CMOS MN TSSO MALAY-U 56 100 200 48 48 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C CPD FCT CY74FCT163LD952 98074 9747 349705947 16 BIT REG. CMOS MN TSSO MALAY-U 56 300 48 0 349705948 16 BIT REG. CMOS MN TSSO MALAY-U 56 300 48 0 349705949 16 BIT REG. CMOS MN TSSO MALAY-U 56 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 17 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R21 HAST 140C/3.3V MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C188-VC MR82049 9529 349514426 32K x 9 CMOS TX SOJ KOREA-L No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------32 128 76 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/3.65V MPD COMDTY CY7C188-VC MR82048 9529 349514426 32K x 9 CMOS TX SOJ KOREA-L 32 96 500 0 125C/5.75V MPD COMDTY CY7C185-VC M80145 SML/64K CMOS TX SOJ CSPI-R 28 96 500 1000 2000 116 116 114 114 0 0 0 2 EOS 0 9745 619709631 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V MPD COMDTY CY7C185-VC M80146 9745 619709631 SML/64K CMOS TX SOJ CSPI-R 28 96 500 116 116 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY7C188-VC MR82087 9529 349514426 32K x 9 CMOS TX SOJ KOREA-L 32 96 168 80 80 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 18 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R28 HAST No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 130C/5.5V DCD SPCM CY7C4245-AC M82011 9745 619709392 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 128 76 0 140C/5.5 DCD SPCM CY7C136-JC M82016 9704 349700386 2K x 8 DP CMOS MN PLCC PHIL-M 52 128 80 0 MPD COMDTY CY7C109-VC MR82026 9802 519714897 128K x 8 CMOS MN SOJ 32 128 79 0 CY7C199-ZC MR81069 9808 619802243 32K x 8 CMOS MN TSOP CSPI-R 28 128 76 1 1 TOPSIDE DAMAGE INDNS-O 140C/5.5V MPD COMDTY CY7C1009-VC MR82062 9807 619711668 256K x 4 CMOS MN SOJ CSPI-R 32 128 45 2 2 LIFTING BONDS 140C/5.75V MPD COMDTY CY7C199-VC MR82032 9806 619801593 32K x 8 CMOS TX SOJ CSPI-R 28 128 76 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/3.65V 125C/5.75V MPD COMDTY CY7C1009-VC MR82010 9803 619711085 256K x 4 CMOS MN SOJ CSPI-R 32 96 487 0 CY7C109-VC MR82001 9802 519714897 128K x 8 CMOS MN SOJ INDNS-O 32 96 496 0 CY7C199-VC MR82002 9806 619801593 32K x 8 CMOS TX SOJ CSPI-R 28 96 489 0 CY7C199-ZI MR82014 9808 619802112 32K x 8 CMOS MN TSOP CSPI-R 28 96 489 0 CY7C136-JC M82007 9704 349700386 2K x 8 DP CMOS MN PLCC PHIL-M 52 96 500 0 M80127 9741 619708282 256K x 4 CMOS MN SOJ CSPI-R 32 96 500 1000 2000 117 117 116 116 0 0 0 1 EOS 0 M80135 9745 349705798 32K x 9 CMOS MN SOJ PHIL-M 32 96 500 1000 2000 116 116 113 113 0 0 0 0 DCD SPCM MPD COMDTY CY7C1009-VC CY7C188-VC Page 19 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- SRAM/LOGIC-R28 HTOL2 125C/5.75V MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C199-VC No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- M80113 9746 619709733 32K x 8 CMOS TX SOJ CSPI-R 28 96 500 1000 2000 117 117 117 117 0 0 0 0 M80181 9748 619710553 32K x 8 CMOS MN SOJ PHIL-GW 28 96 500 1000 2000 117 117 117 117 0 0 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V MPD COMDTY CY7C1009-VC M80128 9741 619708282 256K x 4 CMOS MN SOJ CSPI-R 32 96 500 117 113 0 0 4 EOS CY7C188-VC M80136 9745 349705798 32K x 9 CMOS MN SOJ PHIL-M 32 96 500 115 115 0 0 CY7C199-VC M80114 9746 619709733 32K x 8 CMOS TX SOJ CSPI-R 28 96 500 117 117 0 0 M80180 9748 619710553 32K x 8 CMOS MN SOJ PHIL-GW 28 96 500 118 116 0 0 2 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH DCD MPD SPCM CY7C136-JC M82018 9704 349700386 2K x 8 DP CMOS MN PLCC PHIL-M 52 96 168 80 80 0 0 CY7C4245-AC M82013 9750 619710597 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 96 168 77 77 0 0 M83009 9746 619710040 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 168 77 0 MR82064 9807 619711668 256K x 4 CMOS MN SOJ CSPI-R 32 96 168 76 76 0 0 M80185 9749 519713657 128K x 8 CMOS MN SOJ INDNS-O 32 96 168 76 76 0 0 MR82028 9802 519714897 128K x 8 CMOS MN SOJ INDNS-O 32 96 79 0 COMDTY CY7C1009-VC CY7C109-VC Page 20 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R28 PCT 121C/100%RH MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- COMDTY CY7C109-VC MR82028 9802 519714897 128K x 8 CMOS MN SOJ INDNS-O 32 168 79 0 CY7C199-VC MR82034 9806 619801593 32K x 8 CMOS TX SOJ CSPI-R 28 96 168 76 76 0 0 CY7C199-ZI MR82082 9808 619802112 32K x 8 CMOS MN TSOP CSPI-R 28 168 73 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C MPD COMDTY CY7C109-VC 9812 519802968 128K x 8 CMOS MN SOJ INDNS-O 32 300 48 0 519802969 128K x 8 CMOS MN SOJ INDNS-O 32 300 48 0 519802970 128K x 8 CMOS MN SOJ INDNS-O 32 300 48 0 MR82027 9802 519714897 128K x 8 CMOS MN SOJ INDNS-O 32 300 46 0 CY7C188-VC MR81012 9748 349705698 32K x 9 CMOS MN SOJ PHIL-M 32 300 45 0 CY7C199-DMB 97458 9745 349705478 32K x 8 CMOS MN CERD PHIL-M 28 100 50 0 CY7C199-VC MR82033 9806 619801593 32K x 8 CMOS TX SOJ CSPI-R 28 300 45 0 CY7C199-ZC MR81068 9808 619802243 32K x 8 CMOS MN TSOP CSPI-R 28 300 45 0 MR81071 9807 619801847 32K x 8 CMOS MN TSOP CSPI-R 28 300 45 0 MR81075 9803 619801783 32K x 8 CMOS MN TSOP CSPI-R 28 300 45 0 MR82081 9808 619802112 32K x 8 CMOS MN TSOP CSPI-R 28 300 45 1 1 TOPSIDE DAMAGE CY7C199-ZI 98071 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 21 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R3 HAST Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 140C/ MPD COMDTY CY62256V-ZC M74093 9705 349700731 32K x 8 CMOS CA TSOP PHIL-M 28 128 71 0 140C/5.5V MPD COMDTY CY7C1021-ZSC 98109 9813 619802984 64K x16 CMOS MN TSOP CSPI-R 44 128 45 0 SYNC M82049 9804 519800339 64K x 18 CMOS MN PLCC INDNS-O 52 128 80 0 CY7C1031-JC ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V MPD COMDTY CY7C1021-ZSC SYNC CY7C1031-JC 98092 M80159 9747 619709892N 64K x16 CMOS MN TSOP KOREA-H 44 96 1000 0 9802 619711733N 64K x16 CMOS MN TSOP KOREA-H 44 96 1129 0 619711734N 64K x16 CMOS MN TSOP KOREA-H 44 96 1118 0 CMOS MN PLCC INDNS-O 52 96 500 1000 2000 116 116 113 113 9742 519710953 64K x 18 0 0 0 3 EOS 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/N/A MPD COMDTY CY7C1021-ZSC 98109 9813 619802984 64K x16 CMOS MN TSOP CSPI-R 44 336 1000 45 45 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V MPD COMDTY CY7C199-VC M80194 9802 619711953 256K CMOS MN SOJ SYNC M80160 9742 519710953 64K x 18 CMOS MN PLCC INDNS-O CY7C1031-JC CSPI-R 28 96 500 116 116 0 0 52 96 500 116 116 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD SYNC CY7C1031-JC M82047 9804 519800339 Page 22 of 36 64K x 18 CMOS MN PLCC INDNS-O 52 96 168 80 80 0 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-R3 T/S 150C/-55C MPD COMDTY CY7C1021-ZSC 98109 9813 619802984 64K x16 CMOS MN TSOP CSPI-R 44 100 200 45 45 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C MPD COMDTY CY7C1021-ZSC CY7C199-VC SYNC CY7C1031-JC 98109 9813 619802984 64K x16 CMOS MN TSOP CSPI-R 44 300 45 0 619803206 64K x16 CMOS MN TSOP CSPI-R 44 300 45 0 619803207 64K x16 CMOS MN TSOP CSPI-R 44 300 45 0 MR81043 9802 619711953 256K CMOS MN SOJ CSPI-R 28 300 45 0 MR81044 256K CMOS MN TSOP CSPI-R 28 300 45 0 64K x 18 CMOS MN PLCC INDNS-O 52 300 50 0 M82048 619716685 9804 519800339 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 23 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R31 CY7C1399-VC HTOL2 125C/3.45V MPD SYNC M80109 9744 619709194 32K x 8 CMOS MN SOJ PHIL-M No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------28 96 500 1000 2000 117 117 114 114 0 0 0 3 EOS 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 24 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32 HAST Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- 140C/5.5 MPD COMDTY CY7C109-VC MR82044 9807 519801541 128K x 8(5) CMOS MN SOJ 140C/5.5V MPD COMDTY CY62128-ZAC 98107 128K x 8 MN STSO CSPI-R 9816 619802494 CMOS INDNS-O No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------32 128 80 0 32 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.8V MPD COMDTY CY62256V-NSC 98042 9806 519801279 32K x 8 CMOS MN NSOI INDNS-O 28 48 513 0 519801280 32K x 8 CMOS MN NSOI INDNS-O 28 48 513 0 519801295 32K x 8 CMOS MN NSOI INDNS-O 28 48 513 0 519801296 32K x 8 CMOS MN NSOI INDNS-O 28 48 513 0 519801310 32K x 8 CMOS MN NSOI INDNS-O 28 48 513 0 519801311 32K x 8 CMOS MN NSOI INDNS-O 28 48 513 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/3.65V MPD COMDTY CY7C109-VC MR82004 9807 519801541 128K x 8(5) CMOS MN SOJ INDNS-O 32 96 202 0 125C/5.75V MPD COMDTY CY62256-SNC M80117 9744 519710283 32K x 8 CMOS CA NSOI INDNS-O 28 96 500 1000 2000 117 116 114 113 0 0 2 1 POLY DEFECT/1 SPEED DEG 0 M80131 9745 519712223 128K x 8(5) CMOS MN SOJ 32 96 500 1000 2000 117 117 117 117 0 0 0 0 CY7C109-VC INDNS-O ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/N/A MPD COMDTY CY62128-ZAC 98107 9816 619802494 128K x 8 CMOS MN STSO CSPI-R 32 336 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 25 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32 HTSSL2 125C/3.63V 125C/5.5V Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- MPD COMDTY CY62256V-ZC M80143 9749 619710170 32K x 8 CMOS MN TSOP CSPI-G 28 96 500 116 115 0 0 MPD COMDTY CY62256-SNC M80118 9744 519710283 32K x 8 CMOS CA NSOI INDNS-O 28 96 500 116 116 0 1 EOS 0 M80132 9745 519712223 128K x 8(5) CMOS MN SOJ 32 96 500 117 117 0 0 CY7C109-VC INDNS-O ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY62256V-ZC CY7C109-VC M80140 9749 619710170 MR82046 9807 519801541 32K x 8 CMOS MN TSOP CSPI-G 28 96 168 77 11 0 0 128K x 8(5) CMOS MN SOJ 32 96 168 77 77 0 0 INDNS-O ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S 150C/-55C MPD COMDTY CY62128-ZAC 98107 9816 619802494 128K x 8 CMOS MN STSO CSPI-R 32 100 200 45 45 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C MPD COMDTY CY62128-ZAC 98107 - 619802568 128K x 8 CMOS MN STSO CSPI-R 32 300 45 0 9816 619802528 128K x 8 CMOS MN STSO CSPI-R 32 300 45 0 CY62256V-ZC MR81048 9802 349706405 32K x 8 CMOS MN TSOP PHIL-M 28 300 40 0 CY7C109-VC M80100 9806 519801045 128K x 8(5) CMOS MN SOJ INDNS-O 32 300 45 0 M80199 9805 519800982 128K x 8(5) CMOS MN SOJ INDNS-O 32 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 26 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32D DRET 165C/N/A MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1049-VC M80107 9747 619709647 512K x 8 CMOS MN SOJ KOREA-L No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------36 168 1000 78 78 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST 140C/ MPD COMDTY CY7C1049-VC 98148 9816 619804072 512K x 8 CMOS MN SOJ CSPI-R 36 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75V MPD COMDTY CY7C109-DMB 98021 9745 219711624 128K x 8 CMOS MN CERD ALPHA-X 32 48 80 500 1007 120 120 1 1 UNKNOWN 0 0 CY7C109-LMB 98021 9734 219708960 128K x 8 CMOS MN LCC ALPHA-X 32 48 184 522 48 0 0 9803 219800288 128K x 8 CMOS MN LCC ALPHA-X 32 48 1024 0 219800289 128K x 8 CMOS MN LCC ALPHA-X 32 48 80 500 479 115 115 0 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/N/A MPD COMDTY CY7C1049-VC 98148 9816 619804072 512K x 8 CMOS MN SOJ CSPI-R 36 336 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.50V MPD COMDTY CY7C109-LMB 98021 9734 219708960 128K x 8 CMOS MN LCC ALPHA-X 32 80 168 78 78 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S 150C/-55C MPD COMDTY CY7C1049-VC 98148 9816 619804072 512K x 8 CMOS MN SOJ CSPI-R 36 100 200 45 45 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C MPD COMDTY CY7C1049-VC 98148 9816 619804072 Page 27 of 36 512K x 8 CMOS MN SOJ CSPI-R 36 300 300 45 45 0 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- SRAM/LOGIC-R32D TC2 150C/-65C MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1049-VC 98148 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 9816 619804129 512K x 8 CMOS MN SOJ CSPI-R 36 300 44 0 9817 619804088 512K x 8 CMOS MN SOJ CSPI-R 36 300 45 0 CY7C109-DMB 98021 9745 219711624 128K x 8 CMOS MN CERD ALPHA-X 32 100 100 20 23 0 0 CY7C109-LMB 98021 9803 219800289 128K x 8 CMOS MN LCC 32 100 83 0 ALPHA-X ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 28 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R33 CY7C1329-AC 100 HAST 140C/3.63V MPD SYNC 98075 9743 619708021 64K x 32 CMOS MN TQFP CSPI-R 128 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/N/A MPD SYNC CY7C1329-AC 98075 9743 619708050 64K x 32 CMOS MN TQFP CSPI-R 100 336 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C MPD SYNC CY7C1329-AC 98075 9740 619708099 64K x 32 CMOS MN TQFP CSPI-R 100 300 48 0 9743 619708021 64K x 32 CMOS MN TQFP CSPI-R 100 300 48 0 619708050 64K x 32 CMOS MN TQFP CSPI-R 100 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 29 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42 HAST 140C/3.63V MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C62127V-ZSI 97506 9810 619802140L 1 MEG SRAM CMOS MN TSOP KOREA-H No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------44 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.8V MPD COMDTY CY7C62127V-ZSI 97506 9810 619802140L 1 MEG SRAM CMOS MN TSOP KOREA-H 44 80 500 120 120 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C MPD COMDTY CY7C62127V-ZSI 97506 CY7C62127V-ZSIB 97506 9810 619802140L 1 MEG SRAM CMOS MN TSOP KOREA-H 44 300 48 0 9810 619802141 CMOS MN TSOP KOREA-H 44 300 48 0 1 MEG SRAM ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 30 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R42D HAST 140C/3.63V No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- DCD SPCM CY7C4285V-JC 97483 9807 219801126 64Kx18 FIFO CMOS MN PLCC ALPHA-X 68 128 45 0 MPD SYNC CY7C1334-AC 98075 9809 619801906 64K x 32 CMOS MN TQFP CSPI-R 100 128 43 0 1 EOS 140C/3/63 MPD COMDTY CY7C1041V33-VC 98043 9813 619802985 256K X 16 CMOS MN SOJ CSPI-R 44 128 45 0 140C/5.5V MPD COMDTY CY7C1020V33-VC 98131 9813 619802649 32K x16 CMOS MN SOJ CSPI-R 44 128 44 0 619802650 32K x16 CMOS MN SOJ CSPI-R 44 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.63V 150C/3.8V MPD DCD COMDTY CY7C1021V33-VC SPCM 97416 9809 619801835 64K x16 CMOS MN SOJ CY7C1021V33-ZSC 97416 9810 619801885 64K x16 CMOS MN CY7C4285V-JC 9807 219801126 64Kx18 FIFO CMOS MN 97483 CSPI-R 44 48 80 500 1550 119 119 0 0 0 TSOP KOREA-H 44 48 50 0 PLCC ALPHA-X 68 48 80 500 405 405 405 0 1 EOS 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/3.8V MPD COMDTY CY7C1020V33-ZSC 97517 9811 619802538/ 32K x16 CMOS MN TSOP KOREA-H 44 96 168 1500 261 0 0 125C/5.75V MPD COMDTY CY7C1020V33-VC 9813 619802649 32K x16 CMOS MN SOJ CSPI-R 44 80 500 116 116 0 0 619802650 32K x16 CMOS MN SOJ CSPI-R 44 80 500 116 116 0 0 98131 Page 31 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-R42D HTS 165C/N/A MPD COMDTY CY7C1020V33-VC CY7C1041V33-VC 98131 98043 9813 619802649 32K x16 CMOS MN SOJ CSPI-R 44 336 38 0 619802650 32K x16 CMOS MN SOJ CSPI-R 44 336 45 0 619802651 32K x16 CMOS MN SOJ CSPI-R 44 336 45 0 256K X 16 CMOS MN SOJ CSPI-R 44 336 45 0 9813 619802985 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/3.63V DCD SPCM CY7C4285V-JC 97483 9807 219801126 64Kx18 FIFO CMOS MN PLCC ALPHA-X 68 80 168 76 76 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY7C1021V33-BAC MR82013 9803 619710085 64K x16 CMOS MN SBGA TAIWN-G 48 96 168 61 60 0 0 MR82106 9816 619804057 64K x16 CMOS MN SBGA TAIWN-G 48 96 168 80 80 0 0 97396 512K x 8 CMOS MN SOJ 36 168 50 0 CY7C1049V33-VC 9802 619711944 KOREA-L ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S 125C/-55C MPD COMDTY CY7C1041V33-VC 98043 9813 619802985 256K X 16 CMOS MN SOJ CPSI-R CSPI-R 44 44 200 100 45 45 0 0 150C/-55C MPD SYNC 98075 9807 619801352 64K x 32 CMOS MN TQFP CSPI-R 100 100 200 48 47 0 0 CY7C1334-AC ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC 125C/-40C MPD SYNC CY7C1334-AC 98075 9809 619801906 64K x 32 CMOS MN TQFP CSPI-R 100 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 32 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R42D CY7C4285V-JC TC2 150C/-65C DCD SPCM MPD No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 97483 9807 219801126 64Kx18 FIFO CMOS MN PLCC ALPHA-X 68 300 45 0 COMDTY CY7C1019V33-VC 97416 9811 519801735 128K x 8 CMOS MN SOJ INDNS-O 44 300 46 0 CY7C1020V33-VC 98131 9813 619802649 32K x16 CMOS MN SOJ CSPI-R 44 300 45 0 619802650 32K x16 CMOS MN SOJ CSPI-R 44 300 45 0 619802651 32K x16 CMOS MN SOJ CSPI-R 44 300 45 0 9811 619802538/ 32K x16 CMOS MN TSOP KOREA-H 44 300 48 0 CY7C1020V33-ZSC 97517 CY7C1021V33-BAC MR82007 9803 619710085 64K x16 CMOS MN SBGA TAIWN-G 48 300 45 0 MR82107 9816 619804057 64K x16 CMOS MN SBGA TAIWN-G 48 300 50 0 97416 9809 619801835 64K x16 CMOS MN SOJ 44 300 300 48 50 0 0 CY7C1021V33-ZSC MR82051 9816 619803608 64K x16 CMOS MN TSOP KOREA-H 44 300 55 0 CY7C1041V33-VC 9813 619802893 256K X 16 CMOS MN SLJ CSPI-R 44 300 48 0 619802985 256K X 16 CMOS MN SOJ CSPI-R 44 300 48 0 619803035 256K X 16 CMOS MN SOJ CSPI-R 44 300 48 0 64K x 32 CMOS MN TQFP CSPI-R 100 300 45 0 CY7C1021V33-VC SYNC CY7C1334-AC 98043 98075 9809 619801906 CSPI-R ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 33 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HAST 140C/5.5V 140C/5.75V MPD MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1049-VC No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 98248 9805 619800740 512K x 8 CMOS MN SOJ KOREA-L 36 128 47 0 CY7C1049-VCB 98086 9813 619803319 512K x 8 CMOS MN SOJ KOREA-L 36 128 50 0 CY7C109-VC 98064 9745 519712560 128K x 8(5) CMOS MN SOJ INDNS-O 32 128 46 0 9746 519712898 128K x 8(5) CMOS MN SOJ INDNS-O 32 128 256 46 46 0 0 9751 519714390 128K x 8(5) CMOS MN SOJ INDNS-O 32 128 46 0 9811 519802689/ 128K x 8(5) CMOS MN SOJ INDNS-O 32 128 46 0 COMDTY CY7C109-VC 98085 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75V MPD COMDTY CY7C1049-VC CY7C1049-VCB CY7C109-VC 98248 9805 619800740 512K x 8 CMOS MN SOJ KOREA-L 36 80 500 385 385 0 0 98086 9813 619803319 512K x 8 CMOS MN SOJ KOREA-L 36 48 48 48 80 80 200 500 440 490 756 55 324 378 377 0 0 0 0 1 1 PARTICLE 0 1 1 PARTICLE 98248 9807 619801747 512K x 8 CMOS MN SOJ KOREA-L 36 80 500 400 400 0 0 98064 9751 519714390 128K x 8(5) CMOS MN SOJ INDNS-O 32 80 500 1000 528 527 527 0 0 0 9803 519800651L 128K x 8(5) CMOS MN SOJ INDNS-O 32 80 500 529 529 0 0 9811 519802689/ 128K x 8(5) CMOS MN SOJ INDNS-O 32 48 48 48 80 500 498 1494 1664 385 383 98085 Page 34 of 36 0 2 1 PARTICLE/1 OTHERS 2 1 PARTICLE/1 OTHERS 0 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-R42HD HTS 165C/N/A MPD COMDTY CY7C109-VC 98064 9745 519712560 128K x 8(5) CMOS MN SOJ INDNS-O 32 336 1000 46 46 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.5V MPD COMDTY CY7C1049-VC CY7C1049-VCB CY7C109-VC 98248 9805 619800740 512K x 8 CMOS MN SOJ KOREA-L 36 80 168 79 79 0 1 EOS 0 98086 9813 619803319 512K x 8 CMOS MN SOJ KOREA-L 36 80 168 80 80 0 0 98248 9807 619801747 512K x 8 CMOS MN SOJ KOREA-L 36 80 168 80 80 0 0 98064 9745 519712560 128K x 8(5) CMOS MN SOJ INDNS-O 32 80 168 78 78 0 0 9751 519714390 128K x 8(5) CMOS MN SOJ INDNS-O 32 80 168 78 78 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL -30C/6.50V MPD COMDTY CY7C109-VC 98064 9745 519712560 128K x 8(5) CMOS MN SOJ INDNS-O 32 500 1000 45 45 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY7C1021-VC 98115 9819 619804711 64K x16 CMOS MN SOJ CSPI-R 44 96 168 50 50 0 0 CY7C1049-VCB 98086 9813 619803319 512K x 8 CMOS MN SOJ KOREA-L 36 168 48 0 CY7C109-VC 98085 9811 519802689/ 128K x 8(5) CMOS MN SOJ INDNS-O 32 96 168 46 46 0 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 150C/-65C MPD COMDTY CY7C1021-VC 98115 9819 619804711 64K x16 CMOS MN SOJ CSPI-R 44 300 50 0 CY7C1049-VC 98248 9805 619800740 512K x 8 CMOS MN SOJ KOREA-L 36 300 47 0 Page 35 of 36 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1998 Issued: 12/03/98 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- SRAM/LOGIC-R42HD TC2 150C/-65C MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1049-VCB CY7C109-VC No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 98086 9813 619803319 512K x 8 CMOS MN SOJ KOREA-L 36 300 48 0 98248 9807 619801747 512K x 8 CMOS MN SOJ KOREA-L 36 300 48 0 9812 619802812L 512K x 8 98064 98085 CMOS MN SOJ KOREA-L 36 300 47 0 9745 519712560 128K x 8(5) CMOS MN SOJ INDNS-O 32 300 46 0 9746 519712898 128K x 8(5) CMOS MN SOJ INDNS-O 32 300 46 0 9751 519714390 128K x 8(5) CMOS MN SOJ INDNS-O 32 300 46 0 9811 519802689/ 128K x 8(5) CMOS MN SOJ INDNS-O 32 300 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 36 of 36