TOSHIBA SSM6K18TU

SSM6K18TU
TOSHIBA Field Effect Transistor
Silicon N Channel MOS Type (U-MOSⅢ)
SSM6K18TU
High Current Switching Applications
Unit: mm
•
Suitable for high-density mounting due to compact package
•
Low on resistance:
Ron = 54 mΩ (max) (@VGS = 2.5 V)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Drain-Source voltage
VDS
20
V
Gate-Source voltage
VGSS
±12
V
DC
ID
4
Pulse
IDP
8
PD
(Note 1)
500
mW
Channel temperature
Tch
150
°C
Storage temperature range
Tstg
−55~150
°C
Drain current
Drain power dissipation
Note:
A
1,2,5,6 : Drain
3
: Gate
4
: Source
JEDEC
⎯
Using continuously under heavy loads (e.g. the application of
JEITA
⎯
high temperature/current/voltage and the significant change in
TOSHIBA
⎯
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
Weight: 7 mg (typ.)
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Mounted on FR4 board.
2
(25.4 mm × 25.4 mm × 1.6 t, Cu Pad: 645 mm )
Marking
6
Equivalent Circuit (Top View)
5
4
6
5
4
3
1
2
3
KNA
1
2
Handling Precaution
When handling individual devices (which are not yet mounting on a circuit board), be sure that the environment
is protected against electrostatic discharge. Operators should wear anti-static clothing and use containers and
other objects that are made of anti-static materials.
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SSM6K18TU
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Gate leakage current
Min
Typ.
Max
Unit
VGS = ±12 V, VDS = 0
⎯
⎯
±1
μA
V (BR) DSS
ID = 1 mA, VGS = 0
20
⎯
⎯
V (BR) DSX
ID = 1 mA, VGS = −12 V
12
⎯
⎯
IGSS
Drain-Source breakdown voltage
Drain cut-off current
IDSS
Gate threshold voltage
Vth
Forward transfer admittance
⏐Yfs⏐
Drain-Source ON resistance
RDS (ON)
Test Condition
V
VDS = 20 V, VGS = 0
⎯
⎯
1
μA
VDS = 3 V, ID = 0.1 mA
0.5
⎯
1.1
V
S
VDS = 3 V, ID = 2 A
(Note2)
5.5
⎯
⎯
ID = 2 A, VGS = 4 V
(Note2)
⎯
34
40
ID = 2 A, VGS = 2.5 V
(Note2)
⎯
41
54
mΩ
Input capacitance
Ciss
VDS = 10 V, VGS = 0, f = 1 MHz
⎯
1100
⎯
pF
Reverse transfer capacitance
Crss
VDS = 10 V, VGS = 0, f = 1 MHz
⎯
160
⎯
pF
Output capacitance
Coss
VDS = 10 V, VGS = 0, f = 1 MHz
⎯
185
⎯
pF
Switching time
Turn-on time
ton
VDD = 10 V, ID = 2 A,
⎯
43
⎯
Turn-off time
toff
VGS = 0~2.5 V, RG = 4.7 Ω
⎯
50
⎯
ns
Note2: Pulse test
Switching Time Test Circuit
(a) Test Circuit
(b) VIN
2.5 V
OUT
2.5 V
90%
IN
0V
RG
0
10 μs
VDD
(c) VOUT
VDD = 10 V
RG = 4.7 Ω
< 1%
D.U. =
VIN: tr, tf < 5 ns
Common Source
Ta = 25°C
10%
VDD
VDS (ON)
90%
10%
tr
ton
tf
toff
Precaution
Vth can be expressed as voltage between gate and source when low operating current value is ID = 100 μA for this
product. For normal switching operation, VGS (on) requires higher voltage than Vth and VGS (off) requires lower
voltage than Vth.
(Relationship can be established as follows: VGS (off) < Vth < VGS (on) )
Please take this into consideration for using the device.
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ID – VDS
ID – VGS
2.5V
8
4V
Common Source
Ta = 25°C
1.8V
7
10000
Common Source
VDS = 3 V
1000
(mA)
(A)
6
1.5V
Drain current ID
Drain current ID
5
4
3
2
VGS=1.2V
100
Ta = 100°C
10
25°C
1
−25°C
0.1
1
0
0
0.5
1
1.5
Drain-Source voltage
VDS
0.01
0
2
0.5
1
1.5
Gate-Source voltage
(V)
2
VGS (V)
RDS (ON) – VGS
RDS (ON) – ID
200
100
ID = 2 A
Common Source
Ta = 25°C
Common Source
80
Drain-Source on resistance
RDS (ON) (mΩ)
Drain-Source on resistance
RDS (ON) (mΩ)
2.5
60
2.5V
40
4V
20
150
100
Ta = 100°C
25°C
50
−25°C
0
0
2
4
6
0
0
8
2
Drain current ID (A)
4
6
8
Gate-Source voltage
RDS (ON) – Ta
VGS (V)
1.2
Common Source
Common Source
Vth (V)
ID = 2A
80
60
Gate threshold voltage
Drain-Source on resistance
RDS (ON) (mΩ)
12
Vth – Ta
100
2.5 V
40
VGS = 4 V
20
0
−50
10
0
50
100
ID = 0.1 mA
0.8
0.6
0.4
0.2
0
−25
150
VDS = 3V
1.0
0
25
50
75
100
125
150
Ambient temperature Ta (°C)
Ambient temperature Ta (°C)
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SSM6K18TU
|Yfs| – ID
C – VDS
5000
30
3000
Ciss
1000
(pF)
3
1
Capacitance C
Forward transfer admittance
|Yfs| (S)
10
0.3
0.1
Common Source
300
50
Ta = 25°C
0.01
1
10
100
1000
Coss
Crss
100
30
VDS = 3V
0.03
500
Common Source
Ta = 25°C
f = 1 MHz
VGS = 0 V
10
0.1
10000
1
Drain current ID (mA)
10
Drain-Source voltage
Dynamic Input Characteristic
Switching Time
Common Source
VDD = 10 V
VGS = 0∼2.5V
Ta = 25°C
RG = 4.7 Ω
9
8
Switching time t (ns)
VGS (V)
(V)
1000
10
Gate-Source voltage
100
VDS
7
VDD = 10V
6
VDD = 16 V
5
4
3
100
toff
tf
ton
10
tr
2
Common Source
ID = 4 A
Ta = 25°C
1
0
0
10
20
30
1
0.01
35
0.1
1
10
Drain current ID (A)
Total gate charge Qg (nC)
IDR – VDS
8
Drain reverse current
IDR
(A)
Common Source
VGS = 0
Ta = 25°C
D
6
IDR
G
S
4
2
0
0
−0.2
−0.4
−0.6
Drain-Source voltage
−0.8
VDS
−1
−1.2
(V)
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SSM6K18TU
Transient thermal impedance
rth (°C/W )
rth – tw
1000
Single pulse
Mounted on FR4 board
2
(25.4 mm × 25.4 mm × 1.6 t, Cu Pad: 645 mm )
100
10
1
0.001
0.01
0.1
1
Pulse width
10
tw
100
1000
(s)
Safe Operating Area
10
PD – Ta
ID max (pulse) *
1.2
3
1 ms*
Mounted on FR4 board
10 ms*
Power dissipation PD
(A)
10s*
Drain current
ID
0.3
(W)
1
ID max
(continuous)
DC operation
Ta = 25°C
0.1
Mounted on FR4 board
0.03
(25.4 mm × 25.4 mm × 1.6 t,
2
Cu Pad: 645 mm )
1
(25.4 mm × 25.4 mm × 1.6 t
2
Cu pad: 645 mm )
t = 10 s
0.8
0.6
DC
0.4
0.2
0.01
0
0
* Single Pulse Ta = 25°C
0.003
50
100
150
Curves must be derated
Ambient temperature Ta (°C)
linearly with increase in
temperature.
0.001
0.1
0.3
1
3
Drain-Source voltage
10
30
VDS
(V)
100
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SSM6K18TU
RESTRICTIONS ON PRODUCT USE
20070701-EN GENERAL
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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