SSM6K22FE TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOSⅢ) SSM6K22FE High Current Switching Applications DC-DC Converter Unit: mm • Suitable for high-density mounting due to compact package • Low on resistance: Ron = 170 mΩ (max) (@VGS = 4.0 V) Ron = 230 mΩ (max) (@VGS = 2.5 V) Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Drain-Source voltage VDS 20 V Gate-Source voltage VGSS ±12 V DC ID 1.4 Pulse IDP 5.6 PD (Note 1) 500 Channel temperature Tch 150 °C Storage temperature range Tstg −55~150 °C Drain current Drain power dissipation Note: 1,2,5,6 : Drain 3 : Gate 4 : Source A mW JEDEC - JEITA - TOSHIBA 2-2N1A Using continuously under heavy loads (e.g. the application of Weight: 3 mg (typ.) high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Mounted on FR4 board. 2 (25.4 mm × 25.4 mm × 1.6 t, Cu Pad: 645 mm ) Marking 6 Equivalent Circuit (Top View) 5 4 6 5 4 3 1 2 3 KD 1 2 Handling Precaution When handling individual devices (which are not yet mounted on a circuit board), ensure that the environment is protected against static electricity. Operators should wear anti-static clothing, and containers and other objects that come into direct contact with devices should be made of anti-static materials. 1 2007-11-01 SSM6K22FE Electrical Characteristics (Ta = 25°C) Characteristics Symbol Gate leakage current IGSS V (BR) DSS Drain-Source breakdown voltage V (BR) DSX Drain cut-off current IDSS Gate threshold voltage Vth Forward transfer admittance ⏐Yfs⏐ Drain-Source on-resistance RDS (ON) Test Condition Min Typ. Max Unit − − ±1 μA 20 − − 12 − − − − 1 μA 0.4 − 1.1 V 1.4 2.8 − S − 150 170 (注 2) − 190 230 VGS = ±12 V, VDS = 0 ID = 1 mA, VGS = 0 ID = 1 mA, VGS = -12 V VDS =20 V, VGS = 0 VDS = 3 V, ID = 0.1 mA VDS = 3 V, ID = 0.6A ID = 0.7 A, VGS = 4 V ID = 0.7 A, VGS = 2.5 V (注 2) (注 2) V mΩ Input capacitance Ciss VDS = 10 V, VGS = 0, f = 1 MHz − 125 − pF Reverse transfer capacitance Crss VDS = 10 V, VGS = 0, f = 1 MHz − 17 − pF Output capacitance Coss VDS = 10 V, VGS = 0, f = 1 MHz − 42 − pF Switching time Turn-on time ton VDD = 10 V, ID = 0.7 A − 15.5 − Turn-off time toff VGS = 0~2.5 V, RG = 4.7 Ω − 8.5 − ns Note2: Pulse test Switching Time Test Circuit (a) Test Circuit 2.5 V (b) VIN 0V RG 10 μs 90% OUT IN 0 2.5 V (c) VOUT 10% VDD 90% VDD 10% VDS (ON) VDD = 10 V RG = 4.7 Ω < 1% D.U. = VIN: tr, tf < 5 ns Common Source Ta = 25°C tr ton tf toff Precaution Vth can be expressed as the voltage between the gate and source when the low operating current value is ID = -1mA for this product. For normal switching operation, VGS (on) requires a higher voltage than Vth and VGS (off) requires a lower voltage than Vth. (The relationship can be established as follows: VGS (off) < Vth < VGS (on).) Be sure to take this into consideration when using the device. 2 2007-11-01 SSM6K22FE ID - V G S ID - V D S 2.5 10000 4.0V 2.0 1000 2.0V Drain current I D (mA) Drain current I D (mA) Common Source VDS =3V Common Source Ta=25℃ 2.5V 1.5 VGS =1.8V 1.0 100 Ta=85℃ 25℃ 10 1 -25℃ 0.5 0.1 0.0 0.01 0.0 0.5 1.0 1.5 2.0 0 1 2 3 R D S(O N) - V G S R D S (O N) - I D 0.5 500 Common Source Ta=25℃ Common Source I D=0.7A 0.4 300 200 2.5V VGS =4.0V R DS(ON) (Ω) Drain-Source on-resistance R DS(ON) (mΩ) Drain-Source on-resistance 400 0.3 25℃ 0.2 Ta=85℃ 0.1 100 -25℃ 0 0 0 0.5 1 1.5 2 0 2.5 2 Drain current I D (A) 4 6 8 Gate-Source voltage V GS (V) V th - Ta R D S (O N) - Ta 2 0.5 Common Source I D=0.7A 0.4 1.8 Common Source I D=0.1mA 1.6 VDS =3V Gate threshold voltage Vth(V) 1.4 R DS(ON) (Ω) Drain-Source on-resistance 4 Gate-Source voltage V GS (V) Drain-Source voltage V DS (V) 0.3 2.5V 0.2 4.0V 0.1 1.2 1 0.8 0.6 0.4 0.2 0 0 -25 0 25 50 75 100 125 -25 150 0 25 50 75 100 125 150 Ambient temperture Ta (℃) Ambient temperture Ta (℃) 3 2007-11-01 SSM6K22FE |Yfs| - ID C - VDS 100 1000 10 Capacitance C (pF) Forward transfer admittance |Yfs| (S) Common Source VDS=-3V Ta=25℃ 1 C iss 100 C oss C rss 10 Common Source VGS =0V f=1MHz Ta=25℃ 0.1 1 0.01 0.001 0.01 0.1 1 0.1 10 1 ID R - V D S 100 t - ID 2.5 1000 Common Source VDD=10V Common Source VGS =0 Ta=25℃ 2 Drain reverse current I DR (mA) 10 Drain-Source voltage V DS (V) Drain current ID (A) VGS =0~2.5V Ta=25℃ toff 100 Switching time t (ns) tf 1.5 1 ton tr 10 1 0.5 0 0 -0.2 -0.4 -0.6 -0.8 0.1 0.01 -1 Drain-Source voltage V DS (V) 0.1 1 10 Drain current I D (A) Dyn a mic In p u t Ch a racteristic 10 Common Source VDD=10V I D=1.4A Ta=25℃ Gate-Source voltage V GS (V) 8 6 4 2 0 0 0.5 1 1.5 2 2.5 3 3.5 Tatal gate charge Q g (nC) 4 2007-11-01 SSM6K22FE S a fe o p era tin g area 10 I D max (Pulsed) * 1ms 1 10ms Drain current I D (A) I D max (Continuous) 100ms DC operation Ta=25℃ 0.1 Mounted on FR4 board (25.4 mm ・ 25.4 mm ・ 1.6 t Cu pad: 645 mm2 ) *:Single nonrepetive Pulse Ta ・ 25°C Curves must be derated linealy with increase in temperture. 0.01 0.001 0.1 1 10 100 Drain-Source voltage V DS (V) P D - Ta 600 FR4基板実装時 (25.4mm×25.4mm×1.6t) Cu pad:645mm2 Drain power dissipation P D (mW) 500 400 300 200 100 0 0 20 40 60 80 100 120 140 Ambient temperature Ta (℃) 5 2007-11-01 SSM6K22FE RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 6 2007-11-01