TD62C851,852PG TOSHIBA Bi−CMOS INTEGRATED CIRCUIT SILICON MONOLITHIC TD62C851PG,TD62C852PG 8BIT SERIAL−IN PARALLEL−OUT SHIFT REGISTER / LATCH DRIVERS The TD62C851PG and TD62C852PG are monolithic circuits designed to be used together with Bi−CMOS integrated circuits. The devices consist of a 8bit shift register, 8bit latches, and 8 output circuits (integral clamp diodes for switching inductive loads). The suffix (G) appended to the part number represents a Lead (Pb)-Free product. FEATURES z 8bit serial−in parallel−out shift register / latch driver (Bi−CMOS process) Weight: 2.25 g (typ.) z Output sustaining voltage ; 50 V z Output current ; TD62C851PG 200 mA / ch (Low saturation type) TD62C852PG 500 mA / ch (darlington type) z Built−in output clamp diodes z CMOS compatible inputs z Package ; DIP20−P−300A PIN CONNECTION (TOP VIEW) 1 2006-06-14 TD62C851,852PG BLOCK DIAGRAM TIMING DIAGRAM 2 2006-06-14 TD62C851,852PG EQUIVALENT OF INPUTS AND OUTPUTS S−IN, clock terminal equivalent circuits LATCH , RESET terminal equivalent circuits ENABLE terminal equivalent circuits S−OUT terminal equivalent circuits Output terminal equivalent circuits Output terminal equivalent circuits (TD62C852PG) (TD62C851PG) Note: The output parasitic diode cannot be used as clamp diode. 3 2006-06-14 TD62C851,852PG TRUTH TABLE CK E R LATCH S−IN L H H L H L OUT S−OUT O1 On L OFF On - 1 Q7 H H ON On - 1 Q7 H L (*) NC NC Q7 H H (*) (*) OFF NC Q7 (*) (*) (*) (*) NC NC Q7 (*) (*) L H (*) OFF OFF L (*) H L (*) NC NC L CK = CLOCK E = ENABLE R = RESET LATCH = LATCH S−IN = SERIAL IN OUT = PARALLEL OUT S−OUT = SERIAL OUT (*) = DON’T CARE NC = NO CHANGE L = LOW LEVEL H = HIGH LEVEL ABSOLUTE MAXIMUM RATINGS (Ta = 25°C) CHARACTERISTIC Supply Voltage Output Sustaining Voltage Output Current TD62C851PG TD62C852PG SYMBOL RATING UNIT VDD −0.3~7.0 V VCE (SUS) −0.5~50 V 200 IOUT 500 mA / ch Input Voltage VIN ~0.4~VDD + 0.3 V Power Dissipation PD 1.47 W Operating Temperature Topr −40~85 °C Storage Temperature Tstg −55~150 °C 4 2006-06-14 TD62C851,852PG RECOMMENDED OPERATING CONDITIONS (Ta = −40~85°C) CHARACTERISTIC SYMBOL CONDITION MIN TYP. MAX UNIT Supply Voltage VDD ― 4.5 5.0 5.5 V Input Voltage VIN ― 0 ― VDD V Output Current (“H” Level) S−OUT IOH Output Voltage (“L” Level) On VOH Ta = 25°C ― ― −0.4 mA ― 0 ― 50 V ― ― ― 0.4 DC 1 circuit, Ta = 25°C 0 ― 160 8 circuit on Tpw = 25 ms Ta = 85°C VDD = 5.5 V Duty = 10% 0 ― 160 Duty = 40% 0 ― 95 D C 1 circuit, Ta = 25°C 0 ― 400 8 circuit on Tpw = 25 ms Ta = 85°C VDD = 5.5 V Duty = 10% 0 ― 400 Duty = 50% 0 ― 170 S−OUT TD62C 851PG Output Current (“L” Level) On IOL TD62C 852PG Clock Frequency mA / ch fCLOCK ― 1.5 ― ― MHz Clock Pulse Width fw CLOCK ― 0.33 ― ― µs Data Set Up Time tsetup ― 100 ― ― ns Data Hold Time thold ― 100 ― ― ns VR ― 0 ― 50 V ― 0 ― 160 ― 0 ― 400 Clamp Diode Reverse Voltage Clamp Diode Forward Current TD62C851PG TD62C852PG IF 5 mA 2006-06-14 TD62C851,852PG ELECTRICAL CHARACTERISTICS (Ta = −40~85°C) SYMBOL TEST CIR− CUIT TEST CONDITION MIN TYP. MAX “H” Level VIH ― ― 0.7 VDD ― ― “L” Level VIL ― ― ― ― 0.3 VDD “H” Level IIH ― ENABLE, VDD = 5.5 V VIH = VDD 28 55 110 “L” Level IIL ― LATCH, RESET VDD = 5.5 V, VIL = GND −55 −110 −275 IIN ― CLOCK, S−IN VIN = VCC or GND ― ― ±1.0 VOH ― VDD = 4.5 V IOH = −10 µA 3.9 4.1 ― IOL = 0.8 mA ― 0.2 0.4 IOL = 100 mA ― 0.29 0.50 IOL = 160 mA ― 0.39 0.65 IOL = 250 mA ― 1.24 1.90 IOL = 400 mA ― 1.54 2.30 ― ― 100 CHARACTERISTIC Input Voltage Input Current “H” Level S−OUT S−OUT Output Voltage “L” Level TD62C 851P On VOL ― VDD = 4.5 V TD62C 852P Output Current On “H” Level IOH TD62C852PG Clamp Diode Reverse Current Clamp Diode Froward Voltage TD62C851PG TD62C852PG VDD = 5.5 V, VOH = 50.0 V IDD1 ENABLE = “H” ― 130 200 IDD2 fCLK = 1 MHz Output open DATA = 1 / 2 ENABLE = “H” ― 2.0 5.0 ― 35 40 ― 1.0 1.5 VR = 50 V ― ― 50 IF = 160 mA ― 1.0 2.0 IF = 400 mA ― 1.5 2.0 Operating Supply Current TD62C851PG ― ― VDD = 5.5 V Ta = 25°C 1 circuit on fCLK = 1 MHz ENABLE = “L” IDD3 IR ― VF ― 6 UNIT V µA V V µA mA µA V 2006-06-14 TD62C851,852PG SWITCHING CHARACTERISTICS (Ta = 25°C) CHARACTERISTIC SYMBOL TEST CIR− CUIT TEST CONDITION CK−S−OUT Propagation Delay Time High−to −Low MAX ― 0.40 0.65 ― 1.80 3.00 2.10 3.50 R− On ― 1.50 2.50 E− On ― 1.50 2.50 CK−S−OUT ― 0.33 0.55 L− On tpLH ― CK− On VDD = 5.0 V, VIH = 5.0 V ― 0.41 0.70 L− On VIL = 0 V, Duty = 50% ― 0.30 0.50 ― 0.25 0.42 ― 0.21 0.35 1.5 2.0 ― ― 250 330 ― 116 160 ― 107 140 ― 30 60 ― 14 40 ― 70 ― ― 70 ― tpHL ― RL = R−S−OUT E− On Maximum Clock Frequency Minimum Pulse Width TYP. ― CK− On Low−to −High MIN fMAX CLOCK twCK LATCH twL RESET twR Data Set Up Time tsetup Data Hold Time thold Maximum Clock Rise Time tr Maximum Clock Fall Time tf ― ― ― ― 7 300 Ω (TD62C851) 120 Ω (TD62C852) UNIT µs MHz ns ns ns 2006-06-14 TD62C851,852PG TD62C851PG TD62C851PG TD62C852PG TD62C852PG 8 2006-06-14 TD62C851,852PG TD62C851PG TD62C852PG TD62C851PG TD62C852PG PRECAUTIONS FOR USING This IC does not integrate protection circuits such as overcurrent and overvoltage protectors. Thus, if excess current or voltage is applied to the IC, the IC may be damaged. Please design the IC so that excess current or voltage will not be applied to the IC. Utmost care is necessary in the design of the output line, VCC and GND line since IC may be destroyed due to short−circuit between outputs, air contamination fault, or fault by improper grounding. 9 2006-06-14 TD62C851,852PG PACKAGE DIMENSIONS DIP20−P−300−2.54A Unit: mm Weight: 2.25 g (Typ.) 10 2006-06-14 TD62C851,852PG Notes on Contents 1. Block Diagrams Some of the functional blocks, circuits, or constants in the block diagram may be omitted or simplified for explanatory purposes. 2. Equivalent Circuits The equivalent circuit diagrams may be simplified or some parts of them may be omitted for explanatory purposes. 3. Timing Charts Timing charts may be simplified for explanatory purposes. IC Usage Considerations Notes on Handling of ICs (1) The absolute maximum ratings of a semiconductor device are a set of ratings that must not be exceeded, even for a moment. Do not exceed any of these ratings. Exceeding the rating(s) may cause the device breakdown, damage or deterioration, and may result injury by explosion or combustion. (2) Use an appropriate power supply fuse to ensure that a large current does not continuously flow in case of over current and/or IC failure. The IC will fully break down when used under conditions that exceed its absolute maximum ratings, when the wiring is routed improperly or when an abnormal pulse noise occurs from the wiring or load, causing a large current to continuously flow and the breakdown can lead smoke or ignition. To minimize the effects of the flow of a large current in case of breakdown, appropriate settings, such as fuse capacity, fusing time and insertion circuit location, are required. (3) If your design includes an inductive load such as a motor coil, incorporate a protection circuit into the design to prevent device malfunction or breakdown caused by the current resulting from the inrush current at power ON or the negative current resulting from the back electromotive force at power OFF. IC breakdown may cause injury, smoke or ignition. Use a stable power supply with ICs with built-in protection functions. If the power supply is unstable, the protection function may not operate, causing IC breakdown. IC breakdown may cause injury, smoke or ignition. (4) Do not insert devices in the wrong orientation or incorrectly. Make sure that the positive and negative terminals of power supplies are connected properly. Otherwise, the current or power consumption may exceed the absolute maximum rating, and exceeding the rating(s) may cause the device breakdown, damage or deterioration, and may result injury by explosion or combustion. In addition, do not use any device that is applied the current with inserting in the wrong orientation or incorrectly even just one time. (5) Carefully select external components (such as inputs and negative feedback capacitors) and load components (such as speakers), for example, power amp and regulator. If there is a large amount of leakage current such as input or negative feedback condenser, the IC output DC voltage will increase. If this output voltage is connected to a speaker with low input withstand voltage, overcurrent or IC failure can cause smoke or ignition. (The over current can cause smoke or ignition from the IC itself.) In particular, please pay attention when using a Bridge Tied Load (BTL) connection type IC that inputs output DC voltage to a speaker directly. 11 2006-06-14 TD62C851,852PG Points to Remember on Handling of ICs (1) Heat Radiation Design In using an IC with large current flow such as power amp, regulator or driver, please design the device so that heat is appropriately radiated, not to exceed the specified junction temperature (Tj) at any time and condition. These ICs generate heat even during normal use. An inadequate IC heat radiation design can lead to decrease in IC life, deterioration of IC characteristics or IC breakdown. In addition, please design the device taking into considerate the effect of IC heat radiation with peripheral components. (2) Back-EMF When a motor rotates in the reverse direction, stops or slows down abruptly, a current flow back to the motor’s power supply due to the effect of back-EMF. If the current sink capability of the power supply is small, the device’s motor power supply and output pins might be exposed to conditions beyond absolute maximum ratings. To avoid this problem, take the effect of back-EMF into consideration in system design. 12 2006-06-14 TD62C851,852PG About solderability, following conditions were confirmed • Solderability (1) Use of Sn-37Pb solder Bath · solder bath temperature = 230°C · dipping time = 5 seconds · the number of times = once · use of R-type flux (2) Use of Sn-3.0Ag-0.5Cu solder Bath · solder bath temperature = 245°C · dipping time = 5 seconds · the number of times = once · use of R-type flux RESTRICTIONS ON PRODUCT USE 060116EBA • The information contained herein is subject to change without notice. 021023_D • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. 021023_A • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer’s own risk. 021023_B • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. 060106_Q • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of TOSHIBA or others. 021023_C • The products described in this document are subject to the foreign exchange and foreign trade laws. 021023_E 13 2006-06-14