ROHM ES6U41

ES6U41
Transistors
2.5V Drive Nch+SBD MOSFET
ES6U41
zDimensions (Unit : mm)
zStructure
Silicon N-channel MOSFET /
Schottky barrier diode
WEMT6
zFeatures
1) Nch MOSFET and schottky barrier diode
are put in WEMT6 package.
2) High-speed switching, Low On-resistance.
3) Low voltage drive (2.5V drive).
4) Built-in Low VF schottky barrier diode.
(6)
(5)
(4)
(1)
(2)
(3)
Abbreviated symbol : U41
zApplications
Switching
zPackage specifications
Package
Type
zInner circuit
Taping
Code
T2R
Basic ordering unit (pieces)
8000
(6)
(4)
(5)
ES6U41
∗2
∗1
(1)
∗1 ESD protection diode
∗2 Body diode
(2)
(3)
(1)Gate
(2)Source
(3)Anode
(4)Cathode
(5)Drain
(6)Drain
zAbsolute maximum ratings (Ta=25°C)
<MOSFET>
Parameter
Drain-source voltage
Gate-source voltage
Symbol
VDSS
VGSS
ID
IDP ∗1
IS
ISP ∗1
Limits
30
±12
Channel temperature
Tch
150
°C
Power dissipation
PD
0.7
W / ELEMENT
Limits
25
20
0.5
Unit
V
V
A
Drain current
Source current
(Body diode)
Continuous
Pulsed
Continuous
Pulsed
∗2
±1.5
±6.0
0.75
6.0
Unit
V
V
A
A
A
A
∗1 Pw≤10µs, Duty cycle≤1%
∗2 Mounted on a ceramic board
<Di>
Parameter
Repetitive peak reverse voltage
Reverse voltage
Forward current
Forward current surge peak
Junction temperature
Power dissipation
Symbol
VRM
VR
IF
IFSM
Tj
PD
∗1
2.0
A
∗2
150
0.5
°C
W / ELEMENT
∗1 60Hz 1cycle
∗2 Mounted on ceramic board
1/5
ES6U41
Transistors
<MOSFET and Di>
Parameter
Symbol
PD ∗
Tstg
Power dissipation
Range of storage temperature
Limits
Unit
0.8
−55 to +150
W / TOTAL
°C
Unit
µA
V
µA
V
mΩ
mΩ
mΩ
S
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
∗ Mounted on a ceramic board
zElectrical characteristics (Ta=25°C)
<MOSFET>
Parameter
Symbol
Min.
Typ.
Max.
IGSS
Gate-source leakage
Drain-source breakdown voltage V(BR) DSS
Zero gate voltage drain current
IDSS
Gate threshold voltage
VGS (th)
−
30
−
0.5
−
−
−
1.5
−
−
−
−
−
−
−
−
−
−
−
−
−
−
170
180
240
−
80
14
12
7
9
15
6
1.6
0.5
0.3
±10
−
1
1.5
240
250
340
−
−
−
−
−
−
−
−
2.2
−
−
<Body diode characteristics (Source-drain)>
Parameter
Symbol Min.
Static drain-source on-state
resistance
Forward transfer admittance
Input capacitance
Output capacitance
Reverse transfer capacitance
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Total gate charge
Gate-source charge
Gate-drain charge
RDS (on)∗
Yfs
Ciss
Coss
Crss
td (on)
tr
td (off)
tf
Qg
Qgs
Qgd
∗
∗
∗
∗
∗
∗
∗
∗
Conditions
VGS=±12V, VDS=0V
ID= 1mA, VGS=0V
VDS= 30V, VGS=0V
VDS= 10V, ID= 1mA
ID= 1.5A, VGS= 4.5V
ID= 1.5A, VGS= 4V
ID= 1.5A, VGS= 2.5V
VDS= 10V, ID= 1.5A
VDS= 10V
VGS=0V
f=1MHz
VDD 15V
ID= 0.75A
VGS= 4.5V
RL 20Ω
RG= 10Ω
VDD 15V, VGS= 4.5V
ID= 1.5A, RL 10Ω
RG= 10Ω
∗Pulsed
Forward voltage
Typ.
Max.
VSD
−
−
1.2
Unit
V
Conditions
Symbol
Min.
Typ.
Max.
Unit
−
−
0.36
V
−
−
0.52
V
IF= 0.5A
−
−
100
µA
VR= 20V
IS= 0.75A, VGS=0V
<Di>
Parameter
Forward voltage
VF
Reverse current
IR
Conditions
IF= 0.1A
2/5
ES6U41
Transistors
zElectrical characteristics curves
<MOSFET>
2
1.5
1
VGS= 1.7V
VGS= 1.6V
0.5
1.5
VGS= 1.7V
1
VGS= 1.6V
0.5
0
0.2
0.4
0.6
0.8
1
0
2
DRAIN-SOURCE VOLTAGE : VDS[V]
100
VGS= 2.5V
VGS= 4.0V
VGS= 4.5V
10
1
8
1.0
10
Ta=125°C
Ta=75°C
Ta=25°C
Ta= -25°C
10
0.01
0.1
1
VGS= 4.0V
Pulsed
100
Ta=125°C
Ta=75°C
Ta=25°C
Ta= -25°C
10
0.01
10
0.1
Ta=125°C
Ta=75°C
Ta=25°C
Ta= -25°C
10
10
DRAIN-CURRENT : ID[A]
Fig.7 Static Drain-Source On-State
Resistance vs. Drain Current(Ⅳ)
FORWARD TRANSFER ADMITTANCE : |Yfs| [S]
100
10
10
Fig.6 Static Drain-Source On-State
Resistance vs. Drain Current(Ⅲ)
10
VDS= 10V
Pulsed
1
Ta= -25°C
Ta=25°C
Ta=75°C
Ta=125°C
0.1
0.01
1
DRAIN-CURRENT : ID[A]
DRAIN-CURRENT : ID[A]
VGS= 2.5V
Pulsed
2.0
GATE-SOURCE VOLTAGE : VGS[V]
Fig.5 Static Drain-Source On-State
Resistance vs. Drain Current(Ⅱ)
1000
1.5
Fig.3 Typical Transfer Characteristics
1000
100
DRAIN-CURRENT : ID[A]
1
0.01
0.001
0.5
10
VGS= 4.5V
Pulsed
Fig.4 Static Drain-Source On-State
Resistance vs. Drain Current(Ⅰ)
0.1
0.1
STATIC DRAIN-SOURCE ON-STATE
RESISTANCE : RDS(ON)[mΩ]
STATIC DRAIN-SOURCE ON-STATE
RESISTANCE : RDS(ON)[mΩ]
STATIC DRAIN-SOURCE ON-STATE
RESISTANCE : RDS(ON)[mΩ]
6
1000
0.1
Ta= 125°C
Ta= 75°C
Ta= 25°C
Ta= - 25°C
Fig.2 Typical Output Characteristics(Ⅱ)
Ta=25°C
Pulsed
0.01
1
DRAIN-SOURCE VOLTAGE : VDS[V]
Fig.1 Typical Output Characteristics(Ⅰ)
0.01
4
REVERSE DRAIN CURRENT : Is [A]
0
VDS= 10V
Pulsed
VGS= 1.5V
0
STATIC DRAIN-SOURCE ON-STATE
RESISTANCE : RDS(ON)[mΩ]
VGS= 1.8V
Ta=25°C
Pulsed
1000
10
Ta=25°C
Pulsed
VGS= 10V
VGS= 2.5V
VGS= 2.2V
DRAIN CURRENT : ID[A]
VGS= 10V
VGS= 4.5V
VGS= 4.0V
VGS= 2.5V
VGS= 2.2V
VGS= 1.8V
DRAIN CURRENT : ID[A]
DRAIN CURRENT : ID[A]
2
0.1
1
10
DRAIN-CURRENT : ID[A]
Fig.8 Forward Transfer Admittance
vs. Drain Current
VGS=0V
Pulsed
1
Ta=125°C
Ta=75°C
Ta=25°C
Ta=-25°C
0.1
0.01
0.2
0.4
0.6
0.8
1.0
1.2
SOURCE-DRAIN VOLTAGE : VSD [V]
Fig.9 Reverse Drain Current
vs. Sourse-Drain Voltage
3/5
ES6U41
Transistors
1000
800
ID= 1.50A
600
ID= 0.75A
400
200
5
td(off)
100
tf
10
tr
td(on)
0
Ta=25°C
VDD= 15V
VGS= 4.5V
RG=10Ω
Pulsed
GATE-SOURCE VOLTAGE : VGS [V]
Ta=25°C
Pulsed
SWITCHING TIME : t [ns]
STATIC DRAIN-SOURCE ON-STATE
RESISTANCE : RDS(ON)[mΩ]
1000
1
0
2
4
6
8
10
GATE-SOURCE VOLTAGE : VGS[V]
Fig.10 Static Drain-Source On-State
Resistance vs. Gate Source Voltage
0.01
0.1
1
4
3
2
Ta=25°C
VDD= 15V
ID= 1.5A
RG=10Ω
Pulsed
1
0
10
0
0.5
1
1.5
DRAIN-CURRENT : ID[A]
Fig.11 Switching Characteristics
Fig.12 Dynamic Input Characteristics
CAPACITANCE : C [pF]
1000
Ciss
100
Crss
10
Coss
Ta=25°C
f=1MHz
VGS=0V
1
0.01
0.1
1
10
100
DRAIN-SOURCE VOLTAGE : VDS[V]
Fig.13 Typical Capacitance
vs. Drain-Source Voltage
<Di>
100000
1
pulsed
REVERSE CURRENT : IF (A)
Ta = 75℃
1000
Ta = 25℃
100
10
Ta= - 25℃
1
0.1
0.01
FORWARD CURRENT : IF (A)
pulsed
10000
0.1
Ta = 75℃
Ta = 25℃
Ta= - 25℃
0.01
0.001
0
5
10
15
20
25
REVERSE VOLTAGE : VR[V]
Fig.1 Reverse Current vs. Reverse Voltage
2
TOTAL GATE CHARGE : Qg [nC]
0
0.1
0.2
0.3
0.4
0.5
0.6
FORWARD VOLTAGE : VF[V]
Fig.2 Forward Current vs. Forward Voltage
4/5
ES6U41
Transistors
zMeasurement circuit
Pulse Width
ID
VDS
VGS
RL
90%
50%
10%
VGS
50%
VDS
D.U.T.
10%
VDD
RG
90%
tr
td(on)
ton
Fig.1-1 Switching Time Measurement Circuit
10%
90%
td(off)
tf
toff
Fig.1-2 Switching Waveforms
VG
ID
VDS
VGS
RL
D.U.T.
IG(Const.)
RG
Qg
VGS
Qgs
Qgd
VDD
Charge
Fig.2-1 Gate Charge Measurement Circuit
FIg.2-2 Gate Charge Waveform
zNotice
1. SBD has a large reverse leak current compared to other type of diode. Therefore; it would raise a junction temperature,
and increase a reverse power loss. Further rise of inside temperature would cause a thermal runaway.
This built-in SBD has low VF characteristics and therefore, higher leak current. Please consider enough the
surrounding temperature, generating heat of MOSFET and the reverse current.
2. This product might cause chip aging and breakdown under the large electrified environment. Please consider to design
ESD protection circuit.
5/5
Appendix
Notes
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CO.,LTD.
The content specified herein is subject to change for improvement without notice.
The content specified herein is for the purpose of introducing ROHM's products (hereinafter "Products"). If you
wish to use any such Product, please be sure to refer to the specifications, which can be obtained from ROHM
upon request.
Examples of application circuits, circuit constants and any other information contained herein illustrate the
standard usage and operations of the Products. The peripheral conditions must be taken into account when
designing circuits for mass production.
Great care was taken in ensuring the accuracy of the information specified in this document. However, should
you incur any damage arising from any inaccuracy or misprint of such information, ROHM shall bear no responsibility for such damage.
The technical information specified herein is intended only to show the typical functions of and examples of
application circuits for the Products. ROHM does not grant you, explicitly or implicitly, any license to use or
exercise intellectual property or other rights held by ROHM and other parties. ROHM shall bear no responsibility
whatsoever for any dispute arising from the use of such technical information.
The Products specified in this document are intended to be used with general-use electronic equipment or
devices (such as audio visual equipment, office-automation equipment, communication devices, electronic
appliances and amusement devices).
The Products are not designed to be radiation tolerant.
While ROHM always makes efforts to enhance the quality and reliability of its Products, a Product may fail or
malfunction for a variety of reasons.
Please be sure to implement in your equipment using the Products safety measures to guard against the
possibility of physical injury, fire or any other damage caused in the event of the failure of any Product, such as
derating, redundancy, fire control and fail-safe designs. ROHM shall bear no responsibility whatsoever for your
use of any Product outside of the prescribed scope or not in accordance with the instruction manual.
The Products are not designed or manufactured to be used with any equipment, device or system
which requires an extremely high level of reliability the failure or malfunction of which may result in a direct
threat to human life or create a risk of human injury (such as a medical instrument, transportation equipment,
aerospace machinery, nuclear-reactor controller, fuel-controller or other safety device). ROHM shall bear no
responsibility in any way for use of any of the Products for the above special purposes. If a Product is intended
to be used for any such special purpose, please contact a ROHM sales representative before purchasing.
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Thank you for your accessing to ROHM product informations.
More detail product informations and catalogs are available, please contact your nearest sales office.
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Appendix1-Rev3.0