TI SN74ALVC16245

SN74ALVC16245
16-BIT BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCAS419D – JANUARY 1993 – REVISED AUGUST 1995
D
D
D
D
D
D
EPIC  (Enhanced-Performance Implanted
CMOS) Submicron Process
Member of the Texas Instruments
Widebus  Family
ESD Protection Exceeds 2000 V Per
MIL-STD-883C, Method 3015; Exceeds
200 V Using Machine Model
(C = 200 pF, R = 0)
Latch-Up Performance Exceeds 250 mA
Per JEDEC Standard JESD-17
Bus Hold on Data Inputs Eliminates the
Need for External Pullup / Pulldown
Resistors
Package Options Include Plastic 300-mil
Shrink Small-Outline (DL) and Thin Shrink
Small-Outline (DGG) Packages
DGG OR DL PACKAGE
(TOP VIEW)
1DIR
1B1
1B2
GND
1B3
1B4
VCC
1B5
1B6
GND
1B7
1B8
2B1
2B2
GND
2B3
2B4
VCC
2B5
2B6
GND
2B7
2B8
2DIR
description
The SN74ALVC16245 16-bit (dual-octal)
noninverting bus transceiver is designed for 2.3-V
to 3.6-V VCC operation; it is tested at 2.5-V, 2.7-V,
and 3.3-V VCC.
The SN74ALVC16245 is designed for
asynchronous communication between data
buses. The control-function implementation
minimizes external timing requirements.
1
48
2
47
3
46
4
45
5
44
6
43
7
42
8
41
9
40
10
39
11
38
12
37
13
36
14
35
15
34
16
33
17
32
18
31
19
30
20
29
21
28
22
27
23
26
24
25
1OE
1A1
1A2
GND
1A3
1A4
VCC
1A5
1A6
GND
1A7
1A8
2A1
2A2
GND
2A3
2A4
VCC
2A5
2A6
GND
2A7
2A8
2OE
This device can be used as two 8-bit transceivers
or one 16-bit transceiver. It allows data
transmission from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the
direction-control (DIR) input. The output-enable (OE) input can be used to disable the device so that the buses
are effectively isolated.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The SN74ALVC16245 is available in TI’s shrink small-outline (DL) and thin shrink small-outline (DGG)
packages, which provide twice the I/O pin count and functionality of standard small-outline packages in the
same printed-circuit-board area.
The SN74ALVC16245 is characterized for operation from – 40°C to 85°C.
FUNCTION TABLE
(each 8-bit section)
INPUTS
OE
DIR
OPERATION
L
L
B data to A bus
L
H
A data to B bus
H
X
Isolation
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC and Widebus are trademarks of Texas Instruments Incorporated.
Copyright  1995, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
SN74ALVC16245
16-BIT BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCAS419D – JANUARY 1993 – REVISED AUGUST 1995
logic symbol†
48
1OE
1DIR
1
logic diagram (positive logic)
G3
1DIR
1
3 EN1 [BA]
3 EN2 [AB]
25
2OE
2DIR
24
48
G6
6 EN4 [BA]
6 EN5 [AB]
1A1
1A2
1A3
1A4
1A5
1A6
1A7
1A8
2A1
47
1A1
2
1
2
46
3
44
5
43
6
41
8
40
9
38
11
37
12
36
13
4
47
1B1
2
1B3
1B4
1B5
To Seven Other Channels
1B6
1B7
1B8
2DIR
24
2B1
25
2A3
2A4
2A5
2A6
2A7
2A8
35
14
33
16
32
17
30
19
29
20
27
22
26
23
2OE
2B2
2B3
2B4
2A1
36
2B5
13
2B6
2B7
2B8
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
2
1B1
1B2
5
2A2
1OE
POST OFFICE BOX 655303
To Seven Other Channels
• DALLAS, TEXAS 75265
2B1
SN74ALVC16245
16-BIT BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCAS419D – JANUARY 1993 – REVISED AUGUST 1995
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 4.6 V
Input voltage range, VI: Except I/O ports (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to VCC + 4.6 V
I/O ports (see Notes 1 and 2) . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to VCC + 0.5 V
Output voltage range, VO (see Notes 1 and 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to VCC + 0.5 V
Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 50 mA
Output clamp current, IOK (VO < 0 or VO > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 50 mA
Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 50 mA
Continuous current through VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 100 mA
Maximum power dissipation at TA = 55°C (in still air) (see Note 3): DGG package . . . . . . . . . . . . . . . 0.85 W
DL package . . . . . . . . . . . . . . . . . . 1.2 W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. This value is limited to 4.6 V maximum.
3. The maximum package power dissipation is calculated using a junction temperature of 150°C and a board trace length of 750 mils.
For more information, refer to the Package Thermal Considerations application note in the 1994 ABT Advanced BiCMOS Technology
Data Book, literature number SCBD002B.
recommended operating conditions (see Note 4)
VCC
Supply voltage
MIN
MAX
2.3
3.6
VIH
High level input voltage
High-level
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V
VIL
Low level input voltage
Low-level
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V
VI
VO
Input voltage
0
Output voltage
0
IOH
High-level output current
IOL
∆t / ∆v
Low-level output current
0.7
0.8
VCC
VCC
– 12
VCC = 3 V
VCC = 2.3 V
– 24
VCC = 2.7 V
VCC = 3 V
12
Input transition rise or fall rate
• DALLAS, TEXAS 75265
V
V
2
VCC = 2.3 V
VCC = 2.7 V
TA
Operating free-air temperature
NOTE 4: Unused control inputs must be held high or low to prevent them from floating.
POST OFFICE BOX 655303
1.7
UNIT
– 12
V
V
V
mA
12
mA
24
0
10
ns/ V
– 40
85
°C
3
SN74ALVC16245
16-BIT BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCAS419D – JANUARY 1993 – REVISED AUGUST 1995
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
IOH = – 100 µA
IOH = – 6 mA,
VOH
VOL
MIN to MAX
VIH = 1.7 V
VIH = 1.7 V
2.3 V
VCC – 0.2
2.0
2.3 V
1.7
IOH = – 12 mA
VIH = 2 V
VIH = 2 V
2.7 V
2.2
3V
2.4
IOH = – 24 mA,
IOL = 100 µA
VIH = 2 V
3V
2
MIN to MAX
0.2
IOL = 6 mA,
VIL = 0.7 V
VIL = 0.7 V
2.3 V
0.4
2.3 V
0.7
VIL = 0.8 V
VIL = 0.8 V
2.7 V
0.4
3V
0.55
IOL = 12 mA
IOL = 24 mA,
VI = VCC or GND
II
Ihold
h ld
23V
2.3
VI = 0.8 V
VI = 2 V
3V
VO = VCC or GND
VI = VCC or GND,
nICC
VCC = 3 V to 3.6 V,
Other inputs at VCC or GND
Control inputs
IO = 0
One input at VCC – 0.6 V,
VI = VCC or GND
VO = VCC or GND
UNIT
V
±5
3.6 V
VI = 0.7 V
VI = 1.7 V
IOZ§
ICC
Ci
TA = – 40°C to 85°C
MIN TYP‡
MAX
VCC†
TEST CONDITIONS
V
µA
45
–45
µA
75
–75
3.6 V
±10
µA
3.6 V
40
µA
750
µA
3.3 V
Cio
A or B ports
3.3 V
† For conditions shown as MIN or MAX, use the appropriate values under recommended operating conditions.
‡ All typical values are at VCC = 3.3 V.
§ For I/O ports, the parameter IOZ includes the input leakage current.
4
pF
9
pF
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figures 1 and 2)
FROM
(INPUT)
TO
(OUTPUT)
tpd
A or B
ten
tdis
PARAMETER
VCC = 2.5 V
± 0.2 V
MIN
MAX
B or A
1
5
OE
B or A
1
OE
B or A
1
VCC = 2.7 V
MIN
VCC = 3.3 V ±
0.3 V
UNIT
MAX
MIN
MAX
4
1
3.6
ns
6.8
6
1
5
ns
6
5.2
1
5
ns
operating characteristics, TA = 25° C
PARAMETER
Cpd
d
4
Power dissipation capacitance
TEST CONDITIONS
Outputs enabled
Outputs disabled
pF
CL = 50 pF,
POST OFFICE BOX 655303
f = 10 MHz
• DALLAS, TEXAS 75265
VCC = 2.5 V
± 0.2 V
VCC = 3.3 V
± 0.3 V
TYP
TYP
22
29
4
5
UNIT
pF
SN74ALVC16245
16-BIT BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCAS419D – JANUARY 1993 – REVISED AUGUST 1995
"
PARAMETER MEASUREMENT INFORMATION
0.2 V
VCC = 2.5 V
4.6 V
S1
500 Ω
From Output
Under Test
Open
GND
CL = 50 pF
(see Note A)
500 Ω
TEST
S1
tpd
tPLZ/tPZL
tPHZ/tPZH
Open
4.6 V
GND
tw
LOAD CIRCUIT
2.3 V
2.3 V
Timing
Input
0V
0V
VOLTAGE WAVEFORMS
PULSE DURATION
th
2.3 V
Data
Input
1.2 V
1.2 V
0V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.2 V
1.2 V
0V
tPLH
tPHL
VOH
1.2 V
2.3 V
Output
Control
(low-level
enabling)
1.2 V
1.2 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
tPLZ
2.3 V
Output
Waveform 1
S1 at 4.6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
1.2 V
0V
tPZL
2.3 V
Output
1.2 V
1.2 V
tsu
Input
Input
1.2 V
1.2 V
VOL + 0.3 V
VOL
tPHZ
tPZH
1.2 V
VOH – 0.3 V
VOH
0V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR 10 MHz, ZO = 50 Ω, tr 2.5 ns, tf 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd.
v
v
v
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
5
SN74ALVC16245
16-BIT BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCAS419D – JANUARY 1993 – REVISED AUGUST 1995
"
PARAMETER MEASUREMENT INFORMATION
0.3 V
VCC = 2.7 V AND 3.3 V
6V
S1
500 Ω
From Output
Under Test
Open
GND
CL = 50 pF
(see Note A)
500 Ω
TEST
S1
tpd
tPLZ/tPZL
tPHZ/tPZH
Open
6V
GND
tw
LOAD CIRCUIT
2.7 V
2.7 V
Timing
Input
0V
0V
VOLTAGE WAVEFORMS
PULSE DURATION
th
2.7 V
Data
Input
1.5 V
1.5 V
0V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V
1.5 V
0V
tPLH
tPHL
VOH
1.5 V
2.7 V
Output
Control
(low-level
enabling)
1.5 V
1.5 V
VOL
tPLZ
3V
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
1.5 V
0V
tPZL
2.7 V
Output
1.5 V
1.5 V
tsu
Input
Input
1.5 V
1.5 V
VOL + 0.3 V
VOL
tPHZ
tPZH
1.5 V
VOH – 0.3 V
VOH
0V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR 10 MHz, ZO = 50 Ω, tr 2.5 ns, tf 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd.
v
Figure 2. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
v
v
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright  1998, Texas Instruments Incorporated