NTMFS4897NF Power MOSFET 30 V, 171 A, Single N−Channel, SO−8 FL Features • • • • • Low RDS(on) to Minimize Conduction Losses Low Capacitance to Minimize Driver Losses Includes Schottky Diode Optimized Gate Charge to Minimize Switching Losses These are Pb−Free Device http://onsemi.com V(BR)DSS Applications • CPU Power Delivery • DC−DC Converters • Low Side Switching RDS(ON) MAX 2.0 mW @ 10 V 30 V Parameter Gate−to−Source Voltage N−CHANNEL MOSFET Symbol Value Unit VDSS 30 V VGS ±20 V ID 29 A Continuous Drain Current RqJA (Note 1) TA = 25°C Power Dissipation RqJA (Note 1) TA = 25°C PD 2.74 W Continuous Drain Current RqJA v 10 sec TA = 25°C ID 47 A Power Dissipation RqJA, t v 10 sec TA = 25°C PD 7.3 W TA = 25°C ID 17 A Continuous Drain Current RqJA (Note 2) TA = 85°C Steady State 12 TA = 25°C Continuous Drain Current RqJC (Note 1) TC = 25°C PD Power Dissipation RqJC (Note 1) TC = 25°C PD 96.2 W TA = 25°C IDM 288 A TA = 25°C IDmaxpkg 100 A TJ, TSTG −55 to +150 °C IS 120 A Drain to Source dV/dt dV/dt 6 V/ns Single Pulse Drain−to−Source Avalanche Energy (VDD = 50 V, VGS = 10 V, IL = 50 Apk, L = 0.3 mH, RG = 25 W) EAS 375 mJ Lead Temperature for Soldering Purposes (1/8” from case for 10 s) TL 260 °C ID TC = 85°C Current limited by package Operating Junction and Storage Temperature Source Current (Body Diode) 0.95 W A 171 123 Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. © Semiconductor Components Industries, LLC, 2010 June, 2010 − Rev. 1 MARKING DIAGRAM D TA = 85°C tp=10ms S 34 Power Dissipation RqJA (Note 2) Pulsed Drain Current D G 21 TA = 85°C 171 A 3.0 mW @ 4.5 V MAXIMUM RATINGS (TJ = 25°C unless otherwise stated) Drain−to−Source Voltage ID MAX 1 1 SO−8 FLAT LEAD CASE 488AA STYLE 1 S S S G 4897NF AYWWG G D D D A = Assembly Location Y = Year WW = Work Week G = Pb−Free Package (Note: Microdot may be in either location) ORDERING INFORMATION Device Package Shipping† NTMFS4897NFT1G SO−8FL (Pb−Free) 1500 / Tape & Reel NTMFS4897NFT3G SO−8FL (Pb−Free) 5000 / Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. Publication Order Number: NTMFS4897NF/D NTMFS4897NF THERMAL RESISTANCE MAXIMUM RATINGS Symbol Value Junction−to−Case (Drain) Parameter RqJC 1.3 Junction−to−Ambient – Steady State (Note 1) RqJA 45.7 Junction−to−Ambient – Steady State (Note 2) RqJA 132.1 Junction−to−Ambient − t v 10 sec RqJA 17.2 Unit °C/W 1. Surface−mounted on FR4 board using 1 sq−in pad, 1 oz Cu. 2. Surface−mounted on FR4 board using the minimum recommended pad size. ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Symbol Test Condition Min Drain−to−Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 1.0 mA 30 Drain−to−Source Breakdown Voltage Temperature Coefficient V(BR)DSS/ TJ Parameter Typ Max Unit OFF CHARACTERISTICS V 28.5 Zero Gate Voltage Drain Current IDSS VGS = 0 V, VDS = 24 V TJ = 25 °C Gate−to−Source Leakage Current IGSS VDS = 0 V, VGS = ±20 V VGS(TH) VGS = VDS, ID = 1.0 mA 60 mV/°C 500 mA ±100 nA 2.5 V ON CHARACTERISTICS (Note 3) Gate Threshold Voltage Negative Threshold Temperature Coefficient Drain−to−Source On Resistance VGS(TH)/TJ RDS(on) 2.0 4 VGS = 10 V VGS = 4.5 V Forward Transconductance 1.5 gFS ID = 22 A 1.3 ID = 20 A 1.3 ID = 20 A 2.0 ID = 18 A 2.0 VDS = 15 V, ID = 15 A 90 mV/°C 2.0 3.0 mW S CHARGES AND CAPACITANCES Input Capacitance CISS Output Capacitance COSS Reverse Transfer Capacitance CRSS 495 Total Gate Charge QG(TOT) 40.2 Threshold Gate Charge QG(TH) Gate−to−Source Charge QGS Gate−to−Drain Charge QGD Total Gate Charge 5660 VGS = 0 V, f = 1 MHz, VDS = 15 V VGS = 4.5 V, VDS = 15 V; ID = 23 A 1150 6.4 15.3 pF nC 13.4 QG(TOT) VGS = 10 V, VDS = 15 V, ID = 23 A 83.6 nC SWITCHING CHARACTERISTICS (Note 4) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time td(ON) 26 tr td(OFF) VGS = 4.5 V, VDS = 15 V, ID = 15 A, RG = 3.0 W tf 24 36 13 3. Pulse Test: pulse width v 300 ms, duty cycle v 2%. 4. Switching characteristics are independent of operating junction temperatures. http://onsemi.com 2 ns NTMFS4897NF ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min Typ Max Unit SWITCHING CHARACTERISTICS (Note 4) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time td(ON) 15.7 tr td(OFF) VGS = 10 V, VDS = 15 V, ID = 15 A, RG = 3.0 W tf 21.2 ns 44.6 14.5 DRAIN−SOURCE DIODE CHARACTERISTICS Forward Diode Voltage Reverse Recovery Time VSD TJ = 25°C 0.35 TJ = 125°C 0.26 tRR Charge Time ta Discharge Time tb Reverse Recovery Charge VGS = 0 V, IS = 2.0 A 0.70 V 39.1 VGS = 0 V, dIS/dt = 100 A/ms, IS = 23 A 20.1 ns 19 QRR 34 nC Source Inductance LS 0.66 nH Drain Inductance LD Gate Inductance LG Gate Resistance RG PACKAGE PARASITIC VALUES TA = 25°C 0.20 1.5 0.7 3. Pulse Test: pulse width v 300 ms, duty cycle v 2%. 4. Switching characteristics are independent of operating junction temperatures. http://onsemi.com 3 2.0 W NTMFS4897NF TJ = 25°C ID, DRAIN CURRENT (A) VGS = 4.0 V 4.2 V thru 10 V 3.8 V 3.6 V 3.4 V 3.2 V 3.0 V 2.8 V 0 1 2 4 3 5 300 280 260 240 220 200 180 160 140 120 100 80 60 40 20 0 VDS = 10 V TJ = 25°C TJ = 125°C TJ = −55°C 1 2.5 2 1.5 3.5 3 4 5 4.5 VDS, DRAIN−TO−SOURCE VOLTAGE (V) VGS, GATE−TO−SOURCE VOLTAGE (V) Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) 300 280 260 240 220 200 180 160 140 120 100 80 60 40 20 0 0.0035 0.010 ID = 20 A TJ = 25°C 0.008 TJ = 25°C 0.0030 0.0025 0.006 VGS = 4.5 V 0.0020 0.0015 0.004 VGS = 10 V 0.0010 0.002 0 0.0005 2 3 4 5 6 7 8 9 10 1.6 1.5 1.4 10 30 70 90 110 130 150 170 190 210 Figure 3. On−Resistance vs. Gate−to−Source Voltage Figure 4. On−Resistance vs. Drain Current and Gate Voltage 1.0E−01 ID = 20 A VGS = 10 V VGS = 0 V TJ = 150°C 1.0E−02 1.3 1.2 1.1 1.0 0.9 0.8 0.7 0.6 −50 50 ID, DRAIN CURRENT (A) 1.8 1.7 0 VGS, GATE−TO−SOURCE VOLTAGE (V) IDSS, LEAKAGE (A) RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) ID, DRAIN CURRENT (A) TYPICAL PERFORMANCE CURVES TJ = 125°C 1.0E−03 1.0E−04 TJ = 25°C 1.0E−05 1.0E−06 −25 0 25 50 75 100 125 150 5 TJ, JUNCTION TEMPERATURE (°C) 10 15 20 25 VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 5. On−Resistance Variation with Temperature Figure 6. Drain−to−Source Leakage Current vs. Voltage http://onsemi.com 4 30 NTMFS4897NF 8000 VGS = 0 V C, CAPACITANCE (pF) 7000 VGS, GATE−TO−SOURCE VOLTAGE (V) TYPICAL PERFORMANCE CURVES TJ = 25°C 6000 Ciss 5000 4000 3000 2000 0 Coss Crss 1000 0 8 4 12 16 20 24 28 11 QT 10 9 8 7 6 5 Qgs 4 ID = 30 A TJ = 25°C VDD = 15 V VGS = 30 A 3 2 1 0 0 VDS, DRAIN−TO−SOURCE VOLTAGE (V) t, TIME (ns) IS, SOURCE CURRENT (A) tf 100 tr td(on) 10 1 1 10 RG, GATE RESISTANCE (W) 20 15 10 5 0 100 VGS = 0 V TJ = 25°C 25 0.1 10 ms 100 ms 10 1 ms 10 ms 1 RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 0.01 0.1 0.3 0.4 0.5 0.6 0.7 0.8 Figure 10. Diode Forward Voltage vs. Current dc 10 1 VDS, DRAIN−TO−SOURCE VOLTAGE (V) 100 EAS, SINGLE PULSE DRAIN−TO−SOURCE AVALANCHE ENERGY (mJ) I D, DRAIN CURRENT (A) 100 VGS = 30 V Single Pulse TC = 25°C 0.2 VSD, SOURCE−TO−DRAIN VOLTAGE (V) Figure 9. Resistive Switching Time Variation vs. Gate Resistance 1000 80 30 td(off) VDD = 15 V ID = 15 A VGS = 10 V 40 50 20 30 60 70 QG, TOTAL GATE CHARGE (nC) 10 Figure 8. Gate−to−Source and Drain−to−Source Voltage vs. Total Charge Figure 7. Capacitance Variation 1000 Qgd 400 ID = 50 A 350 300 250 200 150 100 50 0 25 Figure 11. Maximum Rated Forward Biased Safe Operating Area 50 75 150 100 125 TJ, STARTING JUNCTION TEMPERATURE (°C) Figure 12. Maximum Avalanche Energy vs. Starting Junction Temperature http://onsemi.com 5 NTMFS4897NF PACKAGE DIMENSIONS DFN6 5x6, 1.27P (SO8 FL) CASE 488AA−01 ISSUE C 2X NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION D1 AND E1 DO NOT INCLUDE MOLD FLASH PROTRUSIONS OR GATE BURRS. 0.20 C D 2 A B D1 6 2X 0.20 C 5 4X E1 1 2 3 q E 2 c A1 4 TOP VIEW C 3X e 0.10 C SEATING PLANE DETAIL A A 0.10 C SIDE VIEW 8X C A B 0.05 c 3X 4X 1.270 STYLE 1: PIN 1. SOURCE 2. SOURCE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN e/2 L 1 4 K 0.750 4X 1.000 0.965 1.330 2X 0.905 2X E2 L1 0.495 M 4.530 3.200 0.475 5 6 G MILLIMETERS MIN NOM MAX 1.10 0.90 1.00 0.00 −−− 0.05 0.33 0.41 0.51 0.23 0.28 0.33 5.15 BSC 4.50 4.90 5.10 3.50 −−− 4.22 6.15 BSC 5.50 5.80 6.10 3.45 −−− 4.30 1.27 BSC 0.51 0.61 0.71 0.51 −−− −−− 0.51 0.61 0.71 0.05 0.17 0.20 3.00 3.40 3.80 0_ −−− 12 _ SOLDERING FOOTPRINT* DETAIL A b 0.10 DIM A A1 b c D D1 D2 E E1 E2 e G K L L1 M q D2 2X 1.530 BOTTOM VIEW 4.560 *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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