ONSEMI NTMD3P03R2

NTMD3P03R2
Power MOSFET
−3.05 Amps, −30 Volts
Dual P−Channel SO−8
Features
•
•
•
•
•
•
•
High Efficiency Components in a Dual SO−8 Package
High Density Power MOSFET with Low RDS(on)
Miniature SO−8 Surface Mount Package − Saves Board Space
Diode Exhibits High Speed with Soft Recovery
IDSS Specified at Elevated Temperature
Avalanche Energy Specified
Mounting Information for the SO−8 Package is Provided
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VDSS
RDS(ON) TYP
ID MAX
−30 V
85 mΩ @ −10 V
−3.05 A
Applications
• DC−DC Converters
• Low Voltage Motor Control
• Power Management in Portable and Battery−Powered Products, i.e.:
P−Channel
D
Computers, Printers, PCMCIA Cards, Cellular & Cordless Telephones
MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating
G
Symbol
Value
Unit
Drain−to−Source Voltage
VDSS
−30
V
Gate−to−Source Voltage − Continuous
VGS
±20
V
Thermal Resistance −
Junction−to−Ambient (Note 1)
Total Power Dissipation @ TA = 25°C
Continuous Drain Current @ 25°C
Continuous Drain Current @ 70°C
Pulsed Drain Current (Note 4)
RθJA
PD
ID
ID
IDM
171
0.73
−2.34
−1.87
−8.0
°C/W
W
A
A
A
Thermal Resistance −
Junction−to−Ambient (Note 2)
Total Power Dissipation @ TA = 25°C
Continuous Drain Current @ 25°C
Continuous Drain Current @ 70°C
Pulsed Drain Current (Note 4)
RθJA
PD
ID
ID
IDM
100
1.25
−3.05
−2.44
−12
°C/W
W
A
A
A
Thermal Resistance −
Junction−to−Ambient (Note 3)
Total Power Dissipation @ TA = 25°C
Continuous Drain Current @ 25°C
Continuous Drain Current @ 70°C
Pulsed Drain Current (Note 4)
RθJA
PD
ID
ID
IDM
62.5
2.0
−3.86
−3.1
−15
°C/W
W
A
A
A
TJ, Tstg
−55 to
+150
°C
140
mJ
Operating and Storage
Temperature Range
Single Pulse Drain−to−Source Avalanche
Energy − Starting TJ = 25°C
(VDD = −30 Vdc, VGS = −4.5 Vdc, Peak
IL = −7.5 Apk, L = 5 mH, RG = 25 Ω)
EAS
Maximum Lead Temperature for Soldering
Purposes, 1/8″ from case for 10 seconds
TL
May, 2004 − Rev. 1
MARKING
DIAGRAM
8
1
ED3P03
LYWW
SO−8
CASE 751
STYLE 11
ED3P03
L
Y
WW
= Device Code
= Assembly Location
= Year
= Work Week
PIN ASSIGNMENT
Source−1
1
8
Drain−1
Gate−1
2
7
Drain−1
Source−2
3
6
Drain−2
Gate−2
4
5
Drain−2
Top View
°C
260
1. Minimum FR−4 or G−10 PCB, t = Steady State.
2. Mounted onto a 2″ square FR−4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), t = steady state.
3. Mounted onto a 2″ square FR−4 Board (1″ sq. 2 oz Cu 0.06″ thick single
sided), t ≤ 10 seconds.
4. Pulse Test: Pulse Width = 300 s, Duty Cycle = 2%.
 Semiconductor Components Industries, LLC, 2004
S
1
ORDERING INFORMATION
Device
NTMD3P03R2
Package
Shipping†
SO−8
2500/Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Publication Order Number:
NTMD3P03R2/D
NTMD3P03R2
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (Note 5)
Symbol
Characteristic
Min
Typ
Max
Unit
−30
−
−
−30
−
−
−
−
−
−
−
−
−1.0
−20
−2.0
−
−
−100
−
−
100
−1.0
−
−1.7
3.6
−2.5
−
−
−
0.063
0.090
0.085
0.125
gFS
−
5.0
−
Mhos
Ciss
−
520
750
pF
Coss
−
170
325
Crss
−
70
135
td(on)
−
12
22
OFF CHARACTERISTICS
V(BR)DSS
Drain−to−Source Breakdown Voltage
(VGS = 0 Vdc, ID = −250 µAdc)
Temperature Coefficient (Positive)
Zero Gate Voltage Drain Current
(VDS = −24 Vdc, VGS = 0 Vdc, TJ = 25°C)
(VDS = −24 Vdc, VGS = 0 Vdc, TJ = 125°C)
(VDS = −30 Vdc, VGS = 0 Vdc, TJ = 25°C)
IDSS
Gate−Body Leakage Current
(VGS = −20 Vdc, VDS = 0 Vdc)
IGSS
Gate−Body Leakage Current
(VGS = +20 Vdc, VDS = 0 Vdc)
IGSS
Vdc
mV/°C
µAdc
nAdc
nAdc
ON CHARACTERISTICS
Gate Threshold Voltage
(VDS = VGS, ID = −250 µAdc)
Temperature Coefficient (Negative)
VGS(th)
Static Drain−to−Source On−State Resistance
(VGS = −10 Vdc, ID = −3.05 Adc)
(VGS = −4.5 Vdc, ID = −1.5 Adc)
RDS(on)
Forward Transconductance (VDS = −15 Vdc, ID = −3.05 Adc)
Vdc
Ω
DYNAMIC CHARACTERISTICS
Input Capacitance
(VDS = −24
24 Vdc,
Vd VGS = 0 Vdc,
Vd
f = 1.0 MHz)
Output Capacitance
Reverse Transfer Capacitance
SWITCHING CHARACTERISTICS (Notes 6 and 7)
Turn−On Delay Time
(VDD = −24 Vdc, ID = −3.05 Adc,
VGS = −10
10 Vdc
Vdc,
RG = 6.0 Ω)
Rise Time
Turn−Off Delay Time
Fall Time
Turn−On Delay Time
(VDD = −24 Vdc, ID = −1.5 Adc,
VGS = −4.5
4 5 Vdc
Vdc,
RG = 6.0 Ω)
Rise Time
Turn−Off Delay Time
Fall Time
Total Gate Charge
(VDS = −24 Vdc,
VGS = −10 Vdc,
ID = −3.05
3 05 Adc)
Ad )
Gate−Source Charge
Gate−Drain Charge
ns
tr
−
16
30
td(off)
−
45
80
tf
−
45
80
td(on)
−
16
−
tr
−
42
−
td(off)
−
32
−
tf
−
35
−
Qtot
−
16
25
Qgs
−
2.0
−
Qgd
−
4.5
−
VSD
−
−
−0.96
−0.78
−1.25
−
Vdc
trr
−
34
−
ns
ta
−
18
−
tb
−
16
−
QRR
−
0.03
−
ns
nC
BODY−DRAIN DIODE RATINGS (Note 6)
Diode Forward On−Voltage
(IS = −3.05 Adc, VGS = 0 V)
(IS = −3.05 Adc, VGS = 0 V, TJ = 125°C)
Reverse Recovery Time
(IS = −3.05
3 05 Adc,
Ad VGS = 0 Vdc,
Vd
dIS/dt = 100 A/µs)
Reverse Recovery Stored Charge
5. Handling precautions to protect against electrostatic discharge is mandatory.
6. Indicates Pulse Test: Pulse Width = 300 µs max, Duty Cycle = 2%.
7. Switching characteristics are independent of operating junction temperature.
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2
µC
NTMD3P03R2
TYPICAL ELECTRICAL CHARACTERISTICS
−ID, DRAIN CURRENT (AMPS)
VGS = −4 V
VGS = −4.6 V
VGS = −6 V
4
VGS = −4.8 V
TJ = 25°C
VGS = −3.6 V
VGS = −2.8 V
VGS = −3.2 V
VGS = −5 V
3
2
VGS = −2.6 V
VGS = −3 V
1
0
0.25
0.5
0.75
1
1.25
1.5
1.75
TJ = 25°C
2
TJ = −55°C
1
1
2
3
4
5
Figure 1. On−Region Characteristics
Figure 2. Transfer Characteristics
0.6
0.5
0.4
0.3
0.2
0.1
5
4
6
7
8
0.7
ID = −1.5 A
TJ = 25°C
0.6
0.5
0.4
0.3
0.2
0.1
0
2
4
3
5
6
7
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
Figure 4. On−Resistance vs. Gate−to−Source
Voltage
0.25
TJ = 25°C
0.2
VGS = −4.5 V
0.15
VGS = −10 V
0.1
0.05
1
TJ = 100°C
3
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
ID = −3.05 A
TJ = 25°C
3
4
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
0.7
0
VDS > = −10 V
5
0
2
RDS(on), DRAIN−TO−SOURCE RESISTANCE (Ω)
RDS(on), DRAIN−TO−SOURCE RESISTANCE (Ω)
VGS = −4.4 V
VGS = −8 V
5
0
RDS(on), DRAIN−TO−SOURCE RESISTANCE (Ω)
6
VGS = −10 V
2
3
4
5
6
RDS(on), DRAIN−TO−SOURCE RESISTANCE
(NORMALIZED)
−ID, DRAIN CURRENT (AMPS)
6
1.6
1.4
ID = −3.05 A
VGS = −10 V
1.2
1
0.8
0.6
−50
−25
0
25
50
75
100
125
−ID, DRAIN CURRENT (AMPS)
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On−Resistance vs. Drain Current and
Gate Voltage
Figure 6. On Resistance Variation with
Temperature
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3
150
NTMD3P03R2
10000
VDS = 0 V
1200
C, CAPACITANCE (pF)
IDSS, LEAKAGE (nA)
VGS = 0 V
TJ = 150°C
1000
TJ = 125°C
100
VGS = 0 V
Ciss
1000
800
Ciss
Crss
600
400
Coss
200
Crss
TJ = 25°C
10
14
18
22
26
0
10
30
0
5
−VDS
10
15
20
25
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
GATE−TO−SOURCE OR DRAIN−TO−SOURCE
VOLTAGE (VOLTS)
Figure 7. Drain−to−Source Leakage Current
vs. Voltage
Figure 8. Capacitance Variation
30
30 1000
12
QT
10
VDS = −24 V
ID = −3.05 A
VGS = −10 V
25
VDS
20
8
VGS
15
6
Q1
4
tf
tr
td(on)
5
ID = −3.05 A
TJ = 25°C
0
2
4
6
8
10
12
0
16
14
1
10
1
100
Qg, TOTAL GATE CHARGE (nC)
RG, GATE RESISTANCE (Ω)
Figure 9. Gate−to−Source and
Drain−to−Source Voltage vs. Total Charge
Figure 10. Resistive Switching Time Variation
vs. Gate Resistance
3
100
tr
tf
1
10
IS, SOURCE CURRENT (AMPS)
VDS = −24 V
ID = −1.5 A
VGS = −4.5 V
10
td(off)
10
10
Q2
2
0
100
1000
t, TIME (ns)
5
−VGS
t, TIME (ns)
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
10
6
td(off)
td(on)
100
VGS = 0 V
TJ = 25°C
2.5
2
1.5
1
0.5
0
0.2
0.4
0.6
0.8
1
RG, GATE RESISTANCE (Ω)
−VSD, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 11. Resistive Switching Time Variation
vs. Gate Resistance
Figure 12. Diode Forward Voltage vs. Current
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4
1.2
NTMD3P03R2
VGS = 12 V
SINGLE PULSE
TC = 25°C
10
1.0 ms
di/dt
10 ms
IS
dc
1.0
trr
ta
0.01
tb
TIME
0.1
RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT
1.0
1
0.25 IS
tp
10
IS
100
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 13. Maximum Rated Forward Biased
Safe Operating Area
Figure 14. Diode Reverse Recovery Waveform
1.0
Rthja(t), EFFECTIVE TRANSIENT
THERMAL RESPONSE
−ID, DRAIN CURRENT (AMPS)
100
D = 0.5
0.2
0.1
0.1
Normalized to RθJA at Steady State (1″ pad)
Chip
Junction 2.32 Ω
18.5 Ω
50.9 Ω
37.1 Ω
56.8 Ω
0.05
0.02
0.0014 F
0.01
0.0073 F
0.022 F
0.105 F
0.484 F
1E−02
3.68 F
Ambient
Single Pulse
0.01
1E−03
24.4 Ω
1E−01
1E+00
1E+01
t, TIME (s)
Figure 15. FET Thermal Response
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5
1E+02
1E+03
NTMD3P03R2
PACKAGE DIMENSIONS
SO−8
CASE 751−07
ISSUE AB
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
6. 751−01 THRU 751−06 ARE OBSOLETE. NEW
STANDARD IS 751−07.
−X−
A
8
5
0.25 (0.010)
S
B
1
Y
M
M
4
K
−Y−
G
C
N
DIM
A
B
C
D
G
H
J
K
M
N
S
X 45 SEATING
PLANE
−Z−
0.10 (0.004)
H
D
0.25 (0.010)
M
Z Y
S
X
M
J
S
STYLE 11:
PIN 1.
2.
3.
4.
5.
6.
7.
8.
SOLDERING FOOTPRINT*
1.52
0.060
7.0
0.275
MILLIMETERS
MIN
MAX
4.80
5.00
3.80
4.00
1.35
1.75
0.33
0.51
1.27 BSC
0.10
0.25
0.19
0.25
0.40
1.27
0
8
0.25
0.50
5.80
6.20
INCHES
MIN
MAX
0.189
0.197
0.150
0.157
0.053
0.069
0.013
0.020
0.050 BSC
0.004
0.010
0.007
0.010
0.016
0.050
0 8 0.010
0.020
0.228
0.244
SOURCE 1
GATE 1
SOURCE 2
GATE 2
DRAIN 2
DRAIN 2
DRAIN 1
DRAIN 1
4.0
0.155
0.6
0.024
1.270
0.050
SCALE 6:1
mm inches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and
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“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
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6
For additional information, please contact your
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NTMD3P03R2/D