FUJITSU FLC167WF

FLC167WF
C-Band Power GaAs FET
FEATURES
•
•
•
•
•
High Output Power: P1dB = 31.8dBm(Typ.)
High Gain: G1dB = 7.5dB(Typ.)
High PAE: ηadd = 35%(Typ.)
Proven Reliability
Hermetic Metal/Ceramic Package
DESCRIPTION
The FLC167WF is a power GaAs FET that is designed for general
purpose applications in the C-Band frequency range as it provides
superior power, gain, and efficiency.
Fujitsu’s stringent Quality Assurance Program assures the highest
reliability and consistent performance.
ABSOLUTE MAXIMUM RATING (Ambient Temperature Ta=25°C)
Item
Condition
Symbol
Rating
Unit
Drain-Source Voltage
VDS
15
V
Gate-Source Voltage
VGS
-5
V
7.5
W
Total Power Dissipation
Tc = 25°C
PT
Storage Temperature
Tstg
-65 to +175
°C
Channel Temperature
Tch
175
°C
Limit
Typ. Max.
Unit
Fujitsu recommends the following conditions for the reliable operation of GaAs FETs:
1. The drain-source operating voltage (VDS) should not exceed 10 volts.
2. The forward and reverse gate currents should not exceed 9.6 and -1.0 mA respectively with
gate resistance of 200Ω.
3. The operating channel temperature (Tch) should not exceed 145°C.
ELECTRICAL CHARACTERISTICS (Ambient Temperature Ta=25°C)
Item
Saturated Drain Current
Symbol
IDSS
Test Conditions
Min.
VDS = 5V, VGS = 0V
-
600
900
mA
Transconductance
gm
VDS = 5V, IDS = 400mA
-
300
-
mS
Pinch-off Voltage
Vp
VDS = 5V, IDS = 30mA
-1.0
-2.0
-3.5
V
-5
-
-
V
30.5
31.8
-
dBm
6.5
7.5
-
dB
-
35
-
%
-
15
20
°C/W
Gate Source Breakdown Voltage
VGSO
Output Power at 1dB G.C.P.
P1dB
Power Gain at 1dB G.C.P.
G1dB
Power-added Efficiency
ηadd
Thermal Resistance
Rth
IGS = -30µA
VDS = 10V,
IDS = 0.6 IDSS (Typ.),
f = 6 GHz
Channel to Case
CASE STYLE: WF
Edition 1.1
July 1999
G.C.P.: Gain Compression Point
1
FLC167WF
C-Band Power GaAs FET
DRAIN CURRENT
vs. DRAIN-SOURCE VOLTAGE
8
Drain Current (mA)
Total Power Dissipation (W)
POWER DERATING CURVE
10
6
4
2
VGS =0V
600
-0.5V
400
-1.0V
200
-1.5V
-2.0V
0
50 100 150 200
0
2
Case Temperature (°C)
4
6
8
10
Drain-Source Voltage (V)
VDS=10V
f1 = 6.0 GHz
f2 = 6.01GHz
2-tone Test
27
25
23
-10
-20
Pout
21
-30
IM3
19
-40
17
IM3 (dBc)
Output Power (S.C.L.) (dBm)
OUTPUT POWER
& IM3 vs. INPUT POWER
-50
10 12 14 16 18
Input Power (S.C.L.) (dBm)
S.C.L.: Single Carrier Level
P1dB & ηadd vs. VDS
OUTPUT POWER vs. INPUT POWER
28
26
24
22
20
50
40
4 GHz
6 GHz
ηadd
30
20
10
P1dB (dBm)
out
50
32
P1dB
31
40
ηadd
30
30
8
14 16 18 20 22 24
9
10
Drain-Source Voltage (V)
Input Power (dBm)
2
ηadd (%)
4 GHz
f=6GHz
IDS ≈ 0.6 IDSS
6 GHz
ηadd (%)
Output Power (dBm)
VDS=10V
32 IDS ≈ 0.6 IDSS
30
P
FLC167WF
C-Band Power GaAs FET
S11
S22
+j50
+j100
11
SCALE FOR |S12|
10
9
8
+j25
7
12
12
6
11
5
+j250
10
9
+j10
4
8
7
3
10
0
2GHz
6
5
25
4 3
50Ω
100
180°
250
4
3
2
-j10
.08
2GHz
.06
.04
3
.02
1
12
SCALE FOR |S21|
2GHz
S21
S12
+90°
4
9 7
10
5 2GHz
5
6
4 6
7
8 9
10
0°
11
-j250
12
-j25
-j100
-j50
-90°
S11
S-PARAMETERS
VDS = 10V, IDS = 360mA
S21
S12
MAG
ANG
MAG
ANG
FREQUENCY
(MHZ)
MAG
500
.922
-104.6
11.190
119.4
.025
1000
.895
-142.7
6.587
94.0
2000
.887
-171.4
3.424
3000
.884
174.4
4000
.877
5000
ANG
S22
MAG
ANG
36.5
.234
-124.6
.029
18.2
.290
-142.9
67.1
.030
5.3
.360
-150.5
2.295
47.9
.030
1.0
.423
-153.5
163.1
1.762
30.6
.031
0.1
.475
-158.3
.873
149.8
1.452
13.0
.034
-1.9
.511
-165.9
6000
.870
134.2
1.227
-6.0
.038
-5.5
.547
-177.6
7000
.867
118.6
1.019
-24.9
.040
-12.7
.585
168.5
8000
.860
106.0
.843
-40.9
.044
-13.1
.625
157.3
9000
.866
95.5
.725
-54.7
.051
-17.7
.664
148.4
10000
.875
84.0
.656
-69.2
.060
-22.9
.692
138.4
11000
.877
70.5
.596
-85.7
.072
-32.1
.717
124.3
12000
.871
57.3
.525
-101.4
.082
-42.2
.747
110.6
Download S-Parameters, click here
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FLC167WF
C-Band Power GaAs FET
Ø1.6±0.01
(0.063)
1.0 Min.
(0.039)
Case Style "WF"
Metal-Ceramic Hermetic Package
2.5
(0.098)
2.5±0.15
(0.098)
1
2
3
0.1±0.05
(0.004)
1.0 Min.
(0.039)
0.6
(0.024)
6.1±0.1
(0.240)
0.8±0.1
(0.031)
2.5 Max.
(0.098)
8.5±0.2
(0.335)
1.
2.
3.
4.
Gate
Source (Flange)
Drain
Source (Flange)
Unit: mm(inches)
For further information please contact:
FUJITSU COMPOUND SEMICONDUCTOR, INC.
2355 Zanker Rd.
San Jose, CA 95131-1138, U.S.A.
Phone: (408) 232-9500
FAX: (408) 428-9111
www.fcsi.fujitsu.com
FUJITSU MICROELECTRONICS, LTD.
Compound Semiconductor Division
Network House
Norreys Drive
Maidenhead, Berkshire SL6 4FJ
Phone:+44 (0)1628 504800
FAX:+44 (0)1628 504888
CAUTION
Fujitsu Compound Semiconductor Products contain gallium arsenide
(GaAs) which can be hazardous to the human body and the environment.
For safety, observe the following procedures:
• Do not put these products into the mouth.
• Do not alter the form of this product into a gas, powder, or liquid
through burning, crushing, or chemical processing as these by-products
are dangerous to the human body if inhaled, ingested, or swallowed.
• Observe government laws and company regulations when discarding this
product. This product must be discarded in accordance with methods
specified by applicable hazardous waste procedures.
Fujitsu Limited reserves the right to change products and specifications without notice.
The information does not convey any license under rights of Fujitsu Limited or others.
© 1998 FUJITSU COMPOUND SEMICONDUCTOR, INC.
Printed in U.S.A. FCSI0598M200
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