FAIRCHILD SCAN182541ASSCX

Revised August 2000
SCAN182541A
Non-Inverting Line Driver
with 25Ω Series Resistor Outputs
General Description
Features
The SCAN182541A is a high performance BiCMOS line
driver featuring separate data inputs organized into dual 9bit bytes with byte-oriented paired output enable control
signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary-Scan architecture
with the incorporation of the defined Boundary-Scan test
logic and test access port consisting of Test Data Input
(TDI), Test Data Out (TDO), Test Mode Select (TMS), and
Test Clock (TCK).
■ IEEE 1149.1 (JTAG) Compliant
■ High performance BiCMOS technology
■ 25Ω series resistor outputs eliminate need for external
terminating resistors
■ Dual output enable signals per byte
■ 3-STATE outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
EXTEST-OUT
■ Power up 3-STATE for hot insert
■ Member of Fairchild’s SCAN Products
Ordering Code:
Order Number
Package
Number
SCAN182541ASSC
MS56A
Package Description
56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagram
Pin Descriptions
Pin
Names
© 2000 Fairchild Semiconductor Corporation
DS011543
Description
AI(0–8)
Input Pins, A Side
BI(0–8)
Input Pins, B Side
AOE1,
AOE2
3-STATE Output Enable Input Pins, A Side
BOE1,
BOE2
3-STATE Output Enable Input Pins, B Side
AO(0–8)
Output Pins, A Side
BO(0–8)
Output Pins, B Side
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SCAN182541A Non-Inverting Line Driver with 25Ω Series Resistor Outputs
January 1993
SCAN182541A
Truth Tables
Inputs
†AOE1
Inputs
†AOE2
AI(0–8)
AO(0–8)
†BOE1
†BOE2
BI(0–8)
BO(0–8)
L
L
H
H
L
L
H
H
H
X
X
Z
H
X
X
Z
X
H
X
Z
X
H
X
Z
L
L
L
L
L
L
L
L
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance
† = Inactive-to-active transition must occur to enable outputs upon
power-up.
Block Diagrams
Byte A
Tap Controller
Byte B
Note: BSR stands for Boundary Scan Register.
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2
The INSTRUCTION register is an 8-bit register which captures the default value of 10000001 (SAMPLE/PRELOAD)
during the CAPTURE-IR instruction command. The benefit
of capturing SAMPLE/PRELOAD as the default instruction
during CAPTURE-IR is that the user is no longer required
to shift in the 8-bit instruction for SAMPLE/PRELOAD. The
sequence of: CAPTURE-IR→EXIT1-IR→ UPDATE-IR will
update the SAMPLE/PRELOAD instruction. For more information refer to the section on instruction definitions.
The scan cells used in the BOUNDARY-SCAN register are
one of the following two types depending upon their location. Scan cell TYPE1 is intended to solely observe system
data, while TYPE2 has the additional ability to control system data.
Scan cell TYPE1 is located on each system input pin while
scan cell TYPE2 is located at each system output pin as
well as at each of the two internal active-high output enable
signals. AOE controls the activity of the A-outputs while
BOE controls the activity of the B-outputs. Each will activate their respective outputs by loading a logic high.
Instruction Register Scan Chain Definition
The BYPASS register is a single bit shift register stage
identical to scan cell TYPE1. It captures a fixed logic low.
Bypass Register Scan Chain Definition
Logic 0
MSB→LSB
Instruction Code
SCAN182541A Product IDCODE
(32-Bit Code per IEEE 1149.1)
Version Entity
Part
Number
0000
MSB
Manufacture Required b
r
y
ID
111111 000000100 00000001111
1
1149.1
1
LSB
Instruction
00000000
EXTEST
10000001
SAMPLE/PRELOAD
10000010
CLAMP
00000011
HIGH-Z
01000001
SAMPLE-IN
01000010
SAMPLE-OUT
00100010
EXTEST-OUT
10101010
IDCODE
11111111
BYPASS
All Others
BYPASS
Scan Cell TYPE1
Scan Cell TYPE2
3
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SCAN182541A
Description of BOUNDARY-SCAN Circuitry
SCAN182541A
Description of BOUNDARY-SCAN Circuitry
(Continued)
BOUNDARY-SCAN Register
Scan Chain Definition (42 Bits in Length)
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4
SCAN182541A
Description of BOUNDARY-SCAN Circuitry
(Continued)
Input BOUNDARY-SCAN Register
Scan Chain Definition (22 Bits in Length)
When SAMPLE-IN is Active
5
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SCAN182541A
Description of BOUNDARY-SCAN Circuitry
(Continued)
Output BOUNDARY-SCAN Register
Scan Chain Definition (20 Bits in Length)
When SAMPLE-OUT and EXTEXT Out are Active
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6
(Continued)
BOUNDARY-SCAN Register Definition Index
Bit No.
Pin Name
Pin No.
Pin Type
41
AOE1
3
Input
40
AOE2
54
39
AOE
38
BOE1
26
37
BOE2
31
36
BOE
35
AI0
34
AI1
33
Scan Cell Type
TYPE1
Input
TYPE1
Internal
TYPE2
Input
TYPE1
Input
TYPE1
Internal
TYPE2
55
Input
TYPE1
53
Input
TYPE1
AI2
52
Input
TYPE1
32
AI3
50
Input
TYPE1
31
AI4
49
Input
TYPE1
30
AI5
47
Input
TYPE1
29
AI6
46
Input
TYPE1
28
AI7
44
Input
TYPE1
27
AI8
43
Input
TYPE1
26
BI0
42
Input
TYPE1
25
BI1
41
Input
TYPE1
24
BI2
39
Input
TYPE1
23
BI3
38
Input
TYPE1
22
BI4
36
Input
TYPE1
21
BI5
35
Input
TYPE1
20
BI6
33
Input
TYPE1
19
BI7
32
Input
TYPE1
18
BI8
30
Input
TYPE1
17
AO0
2
Output
TYPE2
16
AO1
4
Output
TYPE2
15
AO2
5
Output
TYPE2
14
AO3
7
Output
TYPE2
13
AO4
8
Output
TYPE2
12
AO5
10
Output
TYPE2
11
AO6
11
Output
TYPE2
10
AO7
13
Output
TYPE2
9
AO8
14
Output
TYPE2
8
BO0
15
Output
TYPE2
7
BO1
16
Output
TYPE2
6
BO2
18
Output
TYPE2
5
BO3
19
Output
TYPE2
4
BO4
21
Output
TYPE2
3
BO5
22
Output
TYPE2
2
BO6
24
Output
TYPE2
1
BO7
25
Output
TYPE2
0
BO8
27
Output
TYPE2
7
Control
Signals
A–in
B–in
A–out
B–out
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SCAN182541A
Description of BOUNDARY-SCAN Circuitry
SCAN182541A
Absolute Maximum Ratings(Note 1)
Recommended Operating
Conditions
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Free Air Ambient Temperature
Junction Temperature under Bias
−55°C to +150°C
Supply Voltage
VCC Pin Potential to Ground Pin
−0.5V to +7.0V
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
−40°C to +85°C
+4.5V to +5.5V
(∆V/∆t)
Minimum Input Edge Rate
Data Input
50 mV/ns
Enable Input
20 mV/ns
Voltage Applied to Any Output
−0.5V to +5.5V
in Disabled or Power-Off State
−0.5V to VCC
in the HIGH State
Current Applied to Output
in LOW State (Max)
Twice the Rated IOL (mA)
Note 1: Absolute Maximum Ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
−500 mA
DC Latchup Source Current
Over Voltage Latchup (I/O)
10V
EDS (HBM) Min.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
2000V
DC Electrical Characteristics
Symbol
VCC
Parameter
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VCD
Input Clamp Diode Voltage
VOH
Output HIGH Voltage
Min
Typ
Max
2.0
Min
Units
Conditions
V
Recognized HIGH Signal
0.8
V
Recognized LOW Signal
−1.2
V
IIN = −18 mA
Min
2.5
V
IOH = −3 mA
Min
2.0
V
IOH = −32 mA
VOL
Output LOW Voltage
Min
0.8
V
IOL = 15 mA
IIH
Input HIGH Current
Max
5
µA
VIN = 2.7V (Note 3)
All Others
TMS, TDI
Max
5
µA
VIN = VCC
Max
5
µA
VIN = VCC
IBVI
Input HIGH Current Breakdown Test
Max
7
µA
VIN = 7.0V
IBVIT
Input HIGH Current Breakdown Test (I/O)
Max
100
µA
VIN = 5.5V
IIL
Input LOW Current
Max
−5
µA
VIN = 0.5V (Note 3)
Max
−5
µA
VIN = 0.0V
−385
µA
VIN = 0.0V
V
IID = 1.9 µA
All Others
TMS, TDI
Max
VID
Input Leakage Test
0.0
4.75
IIH + IOZH
Output Leakage Current
Max
50
µA
VOUT = 2.7V
IIL + LOZL
Output Leakage Current
Max
−50
µA
VOUT = 0.5V
IOZH
Output Leakage Current
Max
50
µA
VOUT = 2.7V
IOZL
Output Leakage Current
Max
IOS
Output Short-Circuit Current
Max
ICEX
Output HIGH Leakage Current
IZZ
Bus Drainage Test
All Other Pins Grounded
−50
µA
VOUT = 0.5V
−275
mA
VOUT = 0.0V
Max
50
µA
VOUT = VCC
0.0
100
µA
VOUT = 5.5V
−100
All Others Grounded
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8
Symbol
VCC
Parameter
ICCH
Power Supply Current
ICCL
Power Supply Current
ICCZ
Power Supply Current
ICCT
Additional ICC/Input
ICCD
Dynamic ICC
(Continued)
All Other Inputs
Max
Units
Max
Min
Typ
250
µA
VOUT = VCC; TDI, TMS = VCC
Conditions
Max
1.0
mA
VOUT = VCC; TDI, TMS = GND
Max
65
mA
VOUT = LOW; TDI, TMS = VCC
Max
65.8
mA
VOUT = LOW; TDI, TMS = GND
Max
250
µA
TDI, TMS = VCC
Max
1.0
mA
TDI, TMS = GND
Max
2.9
mA
VIN = VCC − 2.1V
TDI, TMS Inputs
Max
3
mA
VIN = VCC − 2.1V
No Load
Max
0.2
mA/
Outputs Open
MHz
One Bit Toggling, 50% Duty Cycle
Note 3: Guaranteed not tested.
AC Electrical Characteristics
Normal Operation:
TA = −40°C to +85°C
VCC
Symbol
Parameter
tPLH
Propagation Delay
tPHL
Data to Q
tPLZ
Disable Time
Min
Typ
Max
5.0
1.0
3.4
5.2
1.9
4.1
6.5
2.0
5.2
8.7
1.9
5.6
9.2
2.4
6.1
9.6
1.6
5.1
8.5
5.0
Enable Time
5.0
tPZH
tPLH
Propagation Delay
tPHL
TCK to TDO
tPLZ
Disable Time
tPHZ
TCK to TDO
tPZL
Enable Time
tPZH
TCK to TDO
tPLH
Propagation Delay
tPHL
TCK to Data Out during Update-DR State
tPLH
Propagation Delay
tPHL
TCK to Data Out during Update-IR State
tPLH
Propagation Delay
tPHL
TCK to Data Out during Test Logic Reset State
tPLZ
Disable Time
tPHZ
TCK to Data Out during Update-DR State
tPLZ
Disable Time
tPHZ
TCK to Data Out during Update-IR State
tPLZ
Disable Time
tPHZ
TCK to Data Out during Test Logic Reset State
tPZL
Enable Time
tPZH
TCK to Data Out during Update-DR State
tPZL
Enable Time
tPZH
TCK to Data Out during Update-IR State
tPZL
Enable Time
tPZH
TCK to Data Out during Test Logic Reset State
Units
(Note 4)
tPHZ
tPZL
CL = 50 pF
(V)
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
3.2
6.0
9.4
4.5
7.6
11.3
2.5
5.8
9.9
3.7
7.4
11.8
4.9
8.6
12.9
3.1
6.7
10.7
3.7
6.7
10.3
4.9
8.3
12.4
4.2
7.9
12.2
5.3
9.2
13.8
5.0
9.4
14.6
6.2
10.9
16.4
3.7
7.9
13.0
4.3
8.7
13.7
3.7
8.5
14.2
4.3
9.4
14.8
4.7
10.1
16.6
5.5
10.9
17.3
5.5
9.8
14.7
4.0
7.9
12.5
5.8
10.9
16.5
4.3
9.0
14.4
6.6
12.5
19.1
4.9
10.5
16.9
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Note 4: Voltage Range 5.0V ± 0.5V
9
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SCAN182541A
DC Electrical Characteristics
SCAN182541A
AC Operating Requirements
Scan Test Operation:
VCC
Symbol
tS
CL = 50 pF
(Note 5)
Guaranteed Minimum
5.0
2.2
ns
5.0
1.8
ns
5.0
3.7
ns
5.0
1.8
ns
5.0
2.7
ns
5.0
1.8
ns
5.0
7.5
ns
5.0
1.8
ns
5.0
5.0
ns
5.0
2.0
ns
Setup Time
Data to TCK (Note 6)
tH
Hold Time
Data to TCK (Note 6)
tS
Setup Time, H or L
AOEn, BOEn to TCK (Note 7)
tH
Hold Time, H or L
TCK to AOEn, BOEn (Note 7)
tS
TA = −40°C to +85°C
(V)
Parameter
Units
Setup Time, H or L
Internal AOEn, BOEn,
to TCK (Note 8)
tH
Hold Time, H or L
TCK to Internal
AOEn, BOEn (Note 8)
tS
Setup Time, H or L
TMS to TCK
tH
Hold Time, H or L
TCK to TMS
tS
Setup Time, H or L
TDI to TCK
tH
Hold Time, H or L
TCK to TDI
tW
Pulse Width TCK
H
5.0
L
10.0
10.8
ns
fMAX
Maximum TCK Clock Frequency
5.0
50
tPU
Wait Time, Power Up to TCK
5.0
100
MHz
ns
tDN
Power Down Delay
0.0
100
ms
Note 5: Voltage Range 5.0V ± 0.5V
Note 6: This delay represents the timing relationship between the data input and TCK at the associated scan cells numbered 0-8, 9-17, 18-26 and 27-35.
Note 7: Timing pertains to BSR 38 and 41 or BSR 37 and 40.
Note 8: This delay represents the timing relationship between AOE/BOE and TCK for scan cells 36 and 39 only.
Note: All Input Timing Delays involving TCK are measured from the rising edge of TCK.
Capacitance
Symbol
Parameter
Typ
Units
Conditions, T A = 25°C
CIN
Input Capacitance
5.8
pF
VCC = 0.0V
COUT
Output Capacitance (Note 9)
13.8
pF
VCC = 5.0V
Note 9: COUT is measured at frequency f = 1 MHz, per MIL-STD-883B, Method 3012.
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SCAN182541A Non-Inverting Line Driver with 25Ω Series Resistor Outputs
Physical Dimensions inches (millimeters) unless otherwise noted
56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
Package Number MS56A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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