SuperFET TM FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET Features Description • 650V @TJ = 150°C SuperFETTM is, Farichild’s proprietary, new generation of high voltage MOSFET family that is utilizing an advanced charge balance mechanism for outstanding low on-resistance and lower gate charge performance. This advanced technology has been tailored to minimize conduction loss, provide superior switching performance, and withstand extreme dv/dt rate and higher avalanche energy. Consequently, SuperFET is very suitable for various AC/DC power conversion in switching mode operation for system miniaturization and higher efficiency. • Typ. Rds(on)=0.22Ω • Ultra low gate charge (typ. Qg=55nC) • Low effective output capacitance (typ. Coss.eff=110pF) • 100% avalanche tested D G TO-3P G DS FCA Series S Absolute Maximum Ratings Symbol Parameter VDSS Drain-Source Voltage ID Drain Current - Continuous (TC = 25°C) - Continuous (TC = 100°C) IDM Drain Current - Pulsed VGSS Gate-Source voltage EAS Single Pulsed Avalanche Energy (Note 2) (Note 1) FCA16N60 Unit 600 V 16 10.1 A A 48 A ± 30 V 450 mJ IAR Avalanche Current (Note 1) 16 A EAR Repetitive Avalanche Energy (Note 1) 16.7 mJ (Note 3) dv/dt Peak Diode Recovery dv/dt PD Power Dissipation TJ, TSTG Operating and Storage Temperature Range TL Maximum Lead Temperature for Soldering Purpose, 1/8” from Case for 5 Seconds (TC = 25°C) - Derate above 25°C 4.5 V/ns 167 1.33 W W/°C -55 to +150 °C 300 °C *Drain current limited by maximum junction temperature Thermal Characteristics Symbol Parameter FCA16N60 Unit RθJC Thermal Resistance, Junction-to-Case 0.75 °C/W RθJA Thermal Resistance, Junction-to-Ambient 41.7 °C/W ©2007 Fairchild Semiconductor Corporation FCA16N60 / FCA16N60_F109 REV. A2 1 www.fairchildsemi.com FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET August 2007 Device Marking Device Package Reel Size Tape Width Quantity FCA16N60 FCA16N60 TO-3P - - 30 FCA16N60 FCA16N60_F109 TO-3PN - - 30 Electrical Characteristics Symbol TC = 25°C unless otherwise noted Parameter Conditions Min Typ Max Units Off Characteristics BVDSS Drain-Source Breakdown Voltage VGS = 0V, ID = 250µA, TJ = 25°C 600 -- -- V VGS = 0V, ID = 250µA, TJ = 150°C -- 650 -- V ID = 250µA, Referenced to 25°C -- 0.6 -- V/°C ∆BVDSS / ∆TJ Breakdown Voltage Temperature Coefficient BVDS Drain-Source Avalanche Breakdown Voltage VGS = 0V, ID = 16A -- 700 -- V IDSS Zero Gate Voltage Drain Current VDS = 600V, VGS = 0V VDS = 480V, TC = 125°C --- --- 1 10 µA µA IGSSF Gate-Body Leakage Current, Forward VGS = 30V, VDS = 0V -- -- 100 nA IGSSR Gate-Body Leakage Current, Reverse VGS = -30V, VDS = 0V -- -- -100 nA 3.0 -- 5.0 V -- 0.22 0.26 Ω -- 11.5 -- S On Characteristics VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250µA RDS(on) Static Drain-Source On-Resistance VGS = 10V, ID = 8A gFS Forward Transconductance VDS = 40V, ID = 8A (Note 4) Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance VDS = 25V, VGS = 0V, f = 1.0MHz -- 1730 2250 pF -- 960 1150 pF Crss Reverse Transfer Capacitance Coss Output Capacitance VDS = 480V, VGS = 0V, f = 1.0MHz -- 85 -- pF -- 45 60 pF Coss eff. Effective Output Capacitance VDS = 0V to 400V, VGS = 0V -- 110 -- pF VDD = 300V, ID = 16A RG = 25Ω -- 42 85 ns -- 130 270 ns -- 165 340 ns -- 90 190 ns Switching Characteristics td(on) Turn-On Delay Time tr Turn-On Rise Time td(off) Turn-Off Delay Time tf Turn-Off Fall Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd Gate-Drain Charge (Note 4, 5) VDS = 480V, ID = 16A VGS = 10V (Note 4, 5) -- 55 70 nC -- 10.5 13 nC -- 28 -- nC 16 A Drain-Source Diode Characteristics and Maximum Ratings IS Maximum Continuous Drain-Source Diode Forward Current -- -- ISM Maximum Pulsed Drain-Source Diode Forward Current -- -- 48 A VSD Drain-Source Diode Forward Voltage VGS = 0V, IS = 16A -- -- 1.4 V trr Reverse Recovery Time 435 -- ns Reverse Recovery Charge VGS = 0V, IS = 16A dIF/dt =100A/µs -- Qrr -- 7.0 -- µC (Note 4) NOTES: 1. Repetitive Rating: Pulse width limited by maximum junction temperature 2. IAS = 8A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C 3. ISD ≤ 16A, di/dt ≤ 200A/µs, VDD ≤ BVDSS, Starting TJ = 25°C 4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2% 5. Essentially Independent of Operating Temperature Typical Characteristics 2 FCA16N60 / FCA16N60_F109 REV. A2 www.fairchildsemi.com FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET Package Marking and Ordering Information Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics 2 2 10 10 VGS 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V 1 10 ID , Drain Current [A] ID, Drain Current [A] Top : 0 10 * Notes : 1. 250µs Pulse Test 1 10 150° )C 25° )C -55° )C 0 10 * Note: 1. VDS = 40V o 2. TC = 25 C -1 0 10 2. 250µs Pulse Test 1 10 10 2 4 VDS, Drain-Source Voltage [V] Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage 10 2 10 IDR , Reverse Drain Current [A] RDS(ON) [Ω], 8 Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperatue 0.6 Drain-Source On-Resistance 6 VGS , Gate-Source Voltage [V] 0.5 VGS = 10V 0.4 0.3 VGS = 20V 0.2 0.1 1 10 150° )C 0 10 25° )C ∗ Notes : 1. VGS = 0V 2. 250 µs Pulse Test o * Note : ΤJ = 25 C 0.0 0 5 10 15 20 25 30 35 40 45 50 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 VSD , Source-Drain Voltage [V] ID, Drain Current [A] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics 7000 12 Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd 6000 VDS = 100V VGS, Gate-Source Voltage [V] Crss = Cgd Capacitance [pF] 5000 Coss 4000 3000 ∗ Notes : 1. VGS = 0 V Ciss 2. f = 1 MHz 2000 1000 0 -1 10 Crss 0 10 VDS = 250V VDS = 480V 8 6 4 2 ∗ Note : ID = 16A 0 1 0 10 10 20 30 40 50 60 QG, Total Gate Charge [nC] VDS, Drain-Source Voltage [V] 3 FCA16N60 / FCA16N60_F109 REV. A2 10 www.fairchildsemi.com FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET Typical Performance Characteristics Figure 7. Breakdown Voltage Variation vs. Temperature Figure 8. On-Resistance Variation vs. Temperature 3.0 RDS(ON), (Normalized) 1.1 1.0 * Notes : 1. VGS = 0 V 0.9 2. ID = 250 µA Drain-Source On-Resistance BVDSS, (Normalized) Drain-Source Breakdown Voltage 1.2 2.5 2.0 1.5 1.0 ∗ Notes : 1. VGS = 10 V 0.5 2. ID = 8 A 0.8 -100 -50 0 50 100 150 0.0 -100 200 -50 0 o 50 100 150 200 o TJ, Junction Temperature [ C] TJ, Junction Temperature [ C] Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature 20 Operation in This Area is Limited by R DS(on) 2 10 15 ID, Drain Current [A] ID, Drain Current [A] 10 us 100 us 1 ms 1 10 DC 0 10 ∗ Notes : o 1. TC = 25 C -1 10 10 5 o 2. TJ = 150 C 3. Single Pulse -2 10 0 10 1 2 10 0 25 3 10 10 50 75 100 125 150 TC, Case Temperature [°C] VDS, Drain-Source Voltage [V] Figure 11. Transient Thermal Response Curve ZθJC(t), Thermal Response 10 0 D = 0 .5 ∗ N o te s : 0 .2 o 1 . Z θ J C (t) = 0 .7 5 C /W M a x . 10 -1 2 . D u ty F a c to r, D = t 1 /t 2 0 .1 3 . T JM - T C = P D M * Z θ J C (t) 0 .0 5 PDM 0 .0 2 t1 0 .0 1 10 t2 -2 10 s in g le p u ls e -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ] 4 FCA16N60 / FCA16N60_F109 REV. A2 www.fairchildsemi.com FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET Typical Performance Characteristics (Continued) FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms 5 FCA16N60 / FCA16N60_F109 REV. A2 www.fairchildsemi.com FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET Peak Diode Recovery dv/dt Test Circuit & Waveforms 6 FCA16N60 / FCA16N60_F109 REV. A2 www.fairchildsemi.com FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET Mechanical Dimensions TO-3P 15.60 ±0.20 3.00 ±0.20 3.80 ±0.20 +0.15 1.00 ±0.20 18.70 ±0.20 23.40 ±0.20 19.90 ±0.20 1.50 –0.05 16.50 ±0.30 2.00 ±0.20 9.60 ±0.20 4.80 ±0.20 3.50 ±0.20 13.90 ±0.20 ø3.20 ±0.10 12.76 ±0.20 13.60 ±0.20 1.40 ±0.20 +0.15 5.45TYP [5.45 ±0.30] 5.45TYP [5.45 ±0.30] 0.60 –0.05 Dimensions in Millimeters 7 FCA16N60 / FCA16N60_F109 REV. A2 www.fairchildsemi.com FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET Mechanical Dimensions (continued) TO-3PN Dimensions in Millimeters 8 FCA16N60 / FCA16N60_F109 REV. A2 www.fairchildsemi.com The following are registered and unregistered trademarks and service marks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. 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A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild Semiconductor. The datasheet is printed for reference information only. Rev. I31 9 FCA16N60 / FCA16N60_F109 REV. A2 www.fairchildsemi.com FCA16N60 / FCA16N60_F109 600V N-Channel MOSFET TRADEMARKS