STMICROELECTRONICS 2DPFS20V

STS2DPFS20V
P-CHANNEL 20V - 0.14 Ω - 2.5A SO-8
2.7V-DRIVE STripFET™ II MOSFET PLUS SCHOTTKY DIODE
MAIN PRODUCT CHARACTERISTICS
MOSFET
SCHOTTKY
VDSS
RDS(on)
ID
20 V
< 0.20Ω (@4.5V)
< 0.25Ω (@2.7V)
2.5 A
IF(AV)
VRRM
VF(MAX)
3A
30 V
0.51 V
DESCRIPTION
This product associates the latest low voltage
StripFETœ in p-channel version to a low drop
Schottky diode. Such configuration is extremely
versatile in implementing, a large variety of DC-DC
converters for printers, portable equipment, and
cellular phones.
SO-8
INTERNAL SCHEMATIC DIAGRAM
MOSFET ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Value
Unit
Dain-source Voltage (VGS = 0)
Parameter
20
V
Drain-gate Voltage (RGS = 20 kW)
20
V
± 12
V
Gate- source Voltage
ID
Drain Current (continuous) at TC = 25°C
2.5
A
ID
Drain Current (continuous) at TC = 100°C
1.58
A
IDM(•)
Ptot
Drain Current (pulsed)
10
A
Total Dissipation at TC = 25°C
2
W
Value
Unit
SCHOTTKY ABSOLUTE MAXIMUM RATINGS
Symbol
VRRM
IF(RMS)
Parameter
Repetitive Peak Reverse Voltage
30
V
RMS Forward Curren
20
A
IF(AV)
Average Forward Current
TL=125 oC
δ =0.5
3
A
IFSM
Surge Non Repetitive Forward Current
tp= 10 ms
Sinusoidal
75
A
IRSM
Non Repetitive Peak Reverse Current
tp=100 µs
dv/dt
Critical Rate Of Rise Of Reverse Voltage
1
A
10000
V/µs
(•) Pulse width limited by safe operating area
Note: For the P-CHANNEL MOSFET actual polarity of voltages and current has to be reversed
November 2002
.
1/8
STS2DPFS20V
TERMAL DATA
Rthj-amb
Rthj-amb
Tstg
Tj
(*)Thermal
Resistance Junction-ambient MOSFET
Resistance Junction-ambient SCHOTTKY
Storage Temperature Range
Maximum Lead Temperature For Soldering Purpose
oC/W
62.5
100
-55 to 150
150
MAX
(*)Thermal
oC/W
oC
oC
(*) When Mounted on 1 inch2 FR-4 board, 2 oz of Cu and t [ 10 sec
ELECTRICAL CHARACTERISTICS (Tcase = 25 °C unless otherwise specified)
OFF
Symbol
Parameter
Test Conditions
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
VDS = Max Rating TC = 125°C
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 12 V
V(BR)DSS
Min.
Typ.
Max.
20
Unit
V
1
10
µA
µA
±100
nA
Max.
Unit
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS
ID = 250 µA
RDS(on)
Static Drain-source On
Resistance
VGS = 4.5 V
VGS = 2.7 V
ID = 1 A
ID = 1 A
Min.
Typ.
0.6
V
0.14
0.20
0.20
0.25
Ω
Ω
Typ.
Max.
Unit
SCHOTTCKY STATIC ELECTRICAL CHARACTERISTICS
Symbol
Parameter
Test Conditions
Min.
IR(*)
Reversed Leakage Current
TJ= 25 oC
TJ= 125 oC
VR= 30 V
VR= 30 V
30
0.2
100
mA
mA
VF(*)
Forward Voltage drop
TJ= 25 oC
TJ= 125 oC
IF= 3 A
IF= 3 A
0.40
0.51
0.46
mA
mA
Typ.
Max.
Unit
DYNAMIC
Symbol
2/8
Parameter
Test Conditions
gfs (*)
Forward Transconductance
VDS= 15 V
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
VDS = 15V, f = 1 MHz, VGS = 0
ID=1 A
Min.
4
S
315
87
17
pF
pF
pF
STS2DPFS20V
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol
Parameter
Test Conditions
td(on)
tr
Turn-on Delay Time
Rise Time
ID = 1 A
VDD = 10 V
RG = 4.7 Ω
VGS = 4.5 V
(Resistive Load, Figure 3)
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD= 10V ID= 2A VGS=4.5V
Min.
Typ.
Max.
38
30
Unit
ns
ns
3.5
0.34
0.8
4.7
nC
nC
nC
Typ.
Max.
Unit
SWITCHING OFF
Symbol
td(off)
tf
Parameter
Turn-off Delay Time
Fall Time
Test Conditions
Min.
ID = 1 A
VDD = 10 V
RG = 4.7Ω,
VGS = 4.5 V
(Resistive Load, Figure 3)
45
11
ns
ns
SOURCE DRAIN DIODE
Symbol
Parameter
ISD
ISDM (•)
Source-drain Current
Source-drain Current (pulsed)
VSD (*)
Forward On Voltage
ISD = 2 A
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
di/dt = 100A/µs
ISD = 2 A
VDD = 10 V
Tj = 150°C
(see test circuit, Figure 5)
trr
Qrr
IRRM
Test Conditions
Min.
Typ.
VGS = 0
15
7.5
1
Max.
Unit
2
10
A
A
1.2
V
ns
nC
A
(*)Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
(•)Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedance
3/8
STS2DPFS20V
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/8
STS2DPFS20V
Normalized Gate Threshold Voltage vs Temperature
Normalized on Resistance vs Temperature
Source-drain Diode Forward Characteristics
Normalized Breakdown Voltage vs Temperature.
.
.
5/8
STS2DPFS20V
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/8
STS2DPFS20V
SO-8 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
A
a1
MAX.
MIN.
TYP.
1.75
0.1
0.003
0.009
1.65
0.65
MAX.
0.068
0.25
a2
a3
inch
0.064
0.85
0.025
0.033
b
0.35
0.48
0.013
0.018
b1
0.19
0.25
0.007
0.010
C
0.25
0.5
0.010
0.019
c1
45 (typ.)
D
4.8
5.0
0.188
0.196
E
5.8
6.2
0.228
0.244
e
1.27
0.050
e3
3.81
0.150
F
3.8
4.0
0.14
0.157
L
0.4
1.27
0.015
0.050
M
S
0.6
0.023
8 (max.)
0016023
7/8
STS2DPFS20V
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is registered trademark of STMicroelectronics
 2002 STMicroelectronics - All Rights Reserved
All other names are the property of their respective owners.
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - United States.
http://www.st.com
8/8