STMICROELECTRONICS STP14NF10

STP14NF06
N-CHANNEL 60V - 0.1Ω - 14A TO-220
STripFET™ POWER MOSFET
■
■
■
■
TYPE
VDSS
RDS(on)
ID
STP14NF10
60 V
< 0.12 Ω
14 A
TYPICAL RDS(on) = 0.1Ω
EXCEPTIONAL dv/dt CAPABILITY
LOW GATE CHARGE AT 100 °C
APPLICATION ORIENTED
CHARACTERIZATION
3
1
2
TO-220
DESCRIPTION
This Power MOSFET is the latest development of
STMicroelectronics unique "Single Feature Size™"
strip-based process. The resulting transistor shows
extremely high packing density for low on-resistance, rugged avalanche characteristics and less
critical alignment steps therefore a remarkable
manufacturing reproducibility.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ DC-DC & DC-AC CONVERTERS
■ MOTOR CONTROL, AUDIO AMPLIFIERS
■ HIGH CURRENT, HIGH SPEED SWITCHING
■ SOLENOID AND RELAY DRIVERS
■ AUTOMOTIVE ENVIRONMENT
ABSOLUTE MAXIMUM RATINGS
Symbol
Value
Unit
Drain-source Voltage (VGS = 0)
60
V
Drain-gate Voltage (RGS = 20 kΩ)
60
V
Gate- source Voltage
±20
V
ID
Drain Current (continuos) at TC = 25°C
14
A
ID
Drain Current (continuos) at TC = 100°C
10
A
Drain Current (pulsed)
56
A
Total Dissipation at TC = 25°C
45
W
Derating Factor
VDS
VDGR
VGS
IDM (●)
PTOT
Parameter
0.3
W/°C
dv/dt (1)
Peak Diode Recovery voltage slope
6
V/ns
EAS (2)
Single Pulse Avalanche Energy
50
mJ
Tstg
Tj
Storage Temperature
Max. Operating Junction Temperature
(●) Pulse width limited by safe operating area
December 2000
–65 to 175
°C
175
°C
(1) I SD ≤7A, di/dt ≤300A/µs, VDD ≤ V(BR)DSS, T j ≤ TJMAX.
(2) Starting T j = 25°C, I D = 114A, VDD = 15V
1/8
STP14NF06
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
3.33
°C/W
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Maximum Lead Temperature For Soldering Purpose
300
°C
Tl
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
V(BR)DSS
IDSS
IGSS
Parameter
Test Conditions
Min.
Typ.
Max.
60
Unit
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
V
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
1
µA
VDS = Max Rating, TC = 125 °C
10
µA
Gate-body Leakage
Current (VDS = 0)
VGS = ±20V
±100
nA
Max.
Unit
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10V, ID = 7 A
ID(on)
On State Drain Current
VDS > ID(on) x RDS(on)max,
VGS = 10V
Min.
Typ.
2
V
0.10
0.12
14
Ω
A
DYNAMIC
Symbol
gfs (1)
2/8
Parameter
Forward Transconductance
Test Conditions
VDS > ID(on) x RDS(on)max,
ID = 7 A
VDS = 25V, f = 1 MHz, VGS = 0
Min.
Typ.
Max.
Unit
7
S
Ciss
Input Capacitance
361
pF
Coss
Output Capacitance
54
pF
Crss
Reverse Transfer
Capacitance
21
pF
STP14NF06
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
Qg
Qgs
Qgd
Parameter
Turn-on Delay Time
Rise Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Test Conditions
Min.
Typ.
Max.
Unit
VDD = 30V, ID = 7 A
RG = 4.7Ω VGS = 10V
(see test circuit, Figure 3)
12.5
ns
32
ns
VDD = 48 V, ID = 14 A,
VGS = 10V
11.2
3.7
3.2
15
nC
nC
nC
Typ.
Max.
Unit
SWITCHING OFF
Symbol
td(off)
tf
Parameter
Turn-off-Delay Time
Fall Time
Test Conditions
Min.
VDD = 30 V, ID = 7 A,
RG = 4.7Ω, VGS = 10V
(see test circuit, Figure 3)
30
9.5
ns
ns
SOURCE DRAIN DIODE
Symbol
ISD
Parameter
Test Conditions
Source-drain Current (pulsed)
VSD (2)
Forward On Voltage
ISD = 14 A, VGS = 0
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 14 A, di/dt = 100A/µs,
VDD = 30 V, Tj = 150°C
(see test circuit, Figure 5)
IRRM
Typ.
Source-drain Current
ISDM (1)
trr
Qrr
Min.
38
61
3.2
Max.
Unit
14
A
56
A
1.3
V
ns
nC
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedence
3/8
STP14NF06
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/8
STP14NF06
Normalized Gate Thereshold Voltage vs Temp.
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/8
STP14NF06
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/8
STP14NF06
TO-220 MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
4.40
4.60
0.173
0.181
C
1.23
1.32
0.048
0.051
D
2.40
2.72
0.094
D1
0.107
1.27
0.050
E
0.49
0.70
0.019
0.027
F
0.61
0.88
0.024
0.034
F1
1.14
1.70
0.044
0.067
F2
1.14
1.70
0.044
0.067
G
4.95
5.15
0.194
0.203
G1
2.4
2.7
0.094
0.106
H2
10.0
10.40
0.393
0.409
L2
16.4
0.645
13.0
14.0
0.511
0.551
L5
2.65
2.95
0.104
0.116
L6
15.25
15.75
0.600
0.620
L7
6.2
6.6
0.244
0.260
L9
3.5
3.93
0.137
0.154
DIA.
3.75
3.85
0.147
0.151
D1
C
D
A
E
L4
H2
G
G1
F1
L2
F2
F
Dia.
L5
L9
L7
L6
L4
P011C
7/8
STP14NF06
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a trademark of STMicroelectronics
© 2000 STMicroelectronics – Printed in Italy – All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A.
http://www.st.com
8/8