CENTRAL CP709_06

PROCESS
CP709
Power Transistor
PNP - Low Saturation Transistor Chip
PROCESS DETAILS
Process
EPITAXIAL PLANAR
Die Size
41.3 x 41.3 MILS
Die Thickness
9.0 MILS
Base Bonding Pad Area
9.5 x 9.2 MILS
Emitter Bonding Pad Area
12.8 x 10.2 MILS
Top Side Metalization
Al - 30,000Å
Back Side Metalization
Au - 18,000Å
GEOMETRY
GROSS DIE PER 4 INCH WAFER
6,670
PRINCIPAL DEVICE TYPES
CMPT7090L
CXT7090L
CZT7090L
CMXT7090L
145 Adams Avenue
Hauppauge, NY 11788 USA
Tel: (631) 435-1110
Fax: (631) 435-1824
www.centralsemi.com
R3 (23- August 2006)
PROCESS
CP709
Typical Electrical Characteristics
145 Adams Avenue
Hauppauge, NY 11788 USA
Tel: (631) 435-1110
Fax: (631) 435-1824
www.centralsemi.com
R3 (23- August 2006)