FAIRCHILD NDT2955(J23Z)

September 1996
NDT2955
P-Channel Enhancement Mode Field Effect Transistor
General Description
Features
Power SOT P-Channel enhancement mode power field
effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This very
high density process is especially tailored to minimize
on-state resistance and provide superior switching
performance. These devices are particularly suited for low
voltage applications such as notebook computer power
management and DC motor control.
-2.5A, -60V. RDS(ON) = 0.3Ω @ VGS = -10V.
High density cell design for extremely low RDS(ON).
High power and current handling capability in a widely used
surface mount package.
_______________________________________________________________________________________________________
D
D
G
Absolute Maximum Ratings
D
S
G
S
T A = 25°C unless otherwise noted
Symbol
Parameter
NDT2955
Units
VDSS
Drain-Source Voltage
-60
V
VGSS
Gate-Source Voltage
±20
V
ID
Drain Current
-2.5
A
- Continuous
(Note 1a)
- Pulsed
PD
TJ,TSTG
Maximum Power Dissipation
-15
(Note 1a)
3
(Note 1b)
1.3
(Note 1c)
1.1
Operating and Storage Temperature Range
W
-65 to 150
°C
THERMAL CHARACTERISTICS
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1a)
42
°C/W
RθJC
Thermal Resistance, Junction-to-Case
(Note 1)
12
°C/W
* Order option J23Z for cropped center drain lead.
© 1997 Fairchild Semiconductor Corporation
NDT2955 Rev. B2
Electrical Characteristics (TA = 25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
-60
Typ
Max
Units
OFF CHARACTERISTICS
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, ID = -250 µA
IDSS
Zero Gate Voltage Drain Current
VDS = -60 V, VGS = 0 V
V
o
TJ = 125 C
-10
µA
-100
µA
IGSSF
Gate - Body Leakage, Forward
VGS = 20 V, VDS = 0 V
100
nA
IGSSR
Gate - Body Leakage, Reverse
VGS = -20 V, VDS= 0 V
-100
nA
V
ON CHARACTERISTICS (Note 2)
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = -250 µA
o
TJ = 125 C
RDS(ON)
Static Drain-Source On-Resistance
-2
-2.4
-4
-0.8
-2
-2.6
VGS = -10 V, ID = -2.5 A
TJ = 125oC
VGS = -4.5 V, ID = -2 A
0.21
0.3
0.3
0.45
0.36
0.5
-12
Ω
ID(on)
On-State Drain Current
VGS = -10 V, VDS = -5 V
A
gFS
Forward Transconductance
VDS = -10 V, ID = -2.5 A
3.5
S
VDS = -25 V, VGS = 0 V,
f = 1.0 MHz
570
pF
140
pF
40
pF
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
SWITCHING CHARACTERISTICS (Note 2)
tD(on)
Turn - On Delay Time
tr
Turn - On Rise Time
tD(off)
Turn - Off Delay Time
tf
Turn - Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = -30 V, ID = -1 A,
VGEN = -10 V, RGEN = 6 Ω
VDS = -30 V,
ID = -2.5 A, VGS = -10 V
8
15
ns
20
40
ns
20
40
ns
5
20
ns
16
25
nC
2
5
nC
4
8
nC
NDT2955 Rev. B2
Electrical Characteristics (TA = 25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
-2.3
A
-1.3
V
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
IS
Maximum Continuous Drain-Source Diode Forward Current
VSD
Drain-Source Diode Forward Voltage
VGS = 0 V, IS = -2.5 A
(Note2)
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RθJC is guaranteed by
design while RθCA is determined by the user's board design.
PD (t ) =
T J −TA
R θJ A(t )
=
T J −TA
R θJ C+RθCA(t )
= I 2D (t ) × RDS (ON )
TJ
Typical RθJA using the board layouts shown below on 4.5"x5" FR-4 PCB in a still air environment:
a. 42oC/W when mounted on a 1 in2 pad of 2oz copper.
b. 95oC/W when mounted on a 0.066 in2 pad of 2oz copper.
c. 110oC/W when mounted on a 0.0123 in2 pad of 2oz copper.
1a
1b
1c
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.
NDT2955 Rev. B2
Typical Electrical Characteristics
3
-12
GS
= -10V
-8.0
V
-7.0
GS
-9
R DS(on), NORMALIZED
I D , DRAIN-SOURCE CURRENT (A)
-6.0
-5.5
-5.0
-6
-4.5
-3
-4.0
DRAIN-SOURCE ON-RESISTANCE
V
= -4.0V
-4.5
-5.0
2.5
-5.5
2
-6.0
1.5
-7.0
-8.0
1
-10
-3.5
0
0
-1
-2
-3
-4
VDS , DRAIN-SOURCE VOLTAGE (V)
-5
0.5
-6
0
Figure 1. On-Region Characteristics.
-15
V GS = -10 V
R DS(ON), NORMALIZED
V GS = -10V
1.2
1
0.8
-25
0
25
50
75
100
T , JUNCTION TEMPERATURE (°C)
125
DRAIN-SOURCE ON-RESISTANCE
1.4
2
TJ = 125°C
25°C
1
-55°C
0
150
0
-3
-6
I
J
D
-9
-12
-15
, DRAIN CURRENT (A)
Figure 4. On-Resistance Variation with Drain
Current and Temperature.
Figure 3. On-Resistance Variation
with Temperature.
1.2
-10
V DS = -10V
T = -55°C
J
25°C
125°C
V th, NORMALIZED
-8
-6
-4
-2
0
-2
-3
V
GS
-4
-5
-6
, GATE TO SOURCE VOLTAGE (V)
Figure 5. Drain Current Variation with Gate
Voltage and Temperature.
-7
GATE-SOURCE THRESHOLD VOLTAGE (V)
R DS(ON), NORMALIZED
-12
3
I D = -2.5A
0.6
-50
ID , DRAIN CURRENT (A)
-6
-9
ID , DRAIN CURRENT (A)
Figure 2. On-Resistance Variation with Gate Voltage
and Drain Current.
1.6
DRAIN-SOURCE ON-RESISTANCE
-3
V DS = V GS
1.1
I D = -250µA
1
0.9
0.8
0.7
-50
-25
0
25
50
75
100
T J , JUNCTION TEMPERATURE (°C)
125
150
Figure 6. Gate Threshold Variation with
Temperature.
NDT2955 Rev. B2
Typical Electrical Characteristics (continued)
10
5
I D = -250µA
-I S , REVERSE DRAIN CURRENT (A)
BV DSS, NORMALIZED
DRAIN-SOURCE BREAKDOWN VOLTAGE (V)
1.15
1.1
1.05
1
0.95
0.9
-50
-25
0
TJ
25
50
75
100
, JUNCTION TEMPERATURE (°C)
125
V GS = 0V
1
125°C
0.5
25°C
T J = -55°C
0.1
0.01
0.001
-0.3
150
-0.6
-0.9
V
SD
Figure 7. Breakdown Voltage Variation with
Temperature.
-1.8
-2.1
10
C iss
, GATE-SOURCE VOLTAGE (V)
300
C oss
200
100
30
V GS = 0V
20
0.1
C rss
GS
f = 1 MHz
-30V
8
-20V
6
4
2
-V
50
VDS = -10V
IDS = -2.5A
500
CAPACITANCE (pF)
-1.5
Figure 8. Body Diode Forward Voltage Variation
with Current and Temperature
1000
0
0.2
0.5
1
2
5
10
-V DS , DRAIN TO SOURCE VOLTAGE (V)
20
0
50
5
15
20
Figure 10. Gate Charge Characteristics.
-VDD
ton
t d(on)
t off
tr
RL
V IN
10
Q g , GATE CHARGE (nC)
Figure 9. Capacitance Characteristics.
t d(off)
tf
90%
90%
V OUT
D
VGS
-1.2
, BODY DIODE FORWARD VOLTAGE (V)
VOUT
R GEN
10%
10%
DUT
G
90%
S
V IN
50%
50%
10%
PULSE WIDTH
Figure 11. Switching Test Circuit.
INVERTED
Figure 12. Switching Waveforms.
NDT2955 Rev. B2
Typical Electrical Characteristics (continued)
20
TJ = -55°C
V DS = -15V
10
0
1m us
s
10
5
-I D, DRAIN CURRENT (A)
25°C
4
125°C
2
2
R
(
DS
ON
IM
)L
IT
10
10
1
0m
1s
10
s
DC
0.5
m
s
s
V GS = -10V
0.1
SINGLE PULSE
0.05
R θJ A = 42 o C/W
T A = 25°C
g
FS
, TRANSCONDUCTANCE (SIEMENS)
6
0
0
-2
-4
-6
I D , DRAIN CURRENT (A)
-8
-10
0.01
0.1
0.2
0.5
1
2
5
10
60
100
- V DS , DRAIN-SOURCE VOLTAGE (V)
Figure 13. Transconductance Variation with Drain
Current and Temperature.
Figure 14. Maximum Safe Operating Area.
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
1
0.5
D = 0.5
0.2
0.2
0.1
0.1
0.05
0.05
0.02
0.02
0.01
R JA (t) = r(t) * R JA
θ
θ
R JA = See Note 1 c
θ
P(pk)
0.01
t1
0.005
(t)
θJA
Duty Cycle, D = t 1 / t 2
Single Pulse
0.002
0.001
0.0001
t2
TJ - TA = P * R
0.001
0.01
0.1
t 1 , TIME (sec)
1
10
100
300
Figure 15. Transient Thermal Response Curve.
Note:
Thermal characterization performed using the conditions described in note 1c. Transient thermal response will change
depending on the circuit board design.
NDT2955 Rev. B2