ispLSI and pLSI 1016E ® ® High-Density Programmable Logic • HIGH-PERFORMANCE E2CMOS® TECHNOLOGY — fmax = 125 MHz Maximum Operating Frequency — tpd = 7.5 ns Propagation Delay — TTL Compatible Inputs and Outputs — Electrically Erasable and Reprogrammable — Non-Volatile — 100% Tested at Time of Manufacture — Unused Product Term Shutdown Saves Power • ispLSI OFFERS THE FOLLOWING ADDED FEATURES — In-System Programmable™ (ISP™) 5-Volt Only — Increased Manufacturing Yields, Reduced Time-toMarket and Improved Product Quality — Reprogram Soldered Device for Faster Prototyping • OFFERS THE EASE OF USE AND FAST SYSTEM SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY OF FIELD PROGRAMMABLE GATE ARRAYS — Complete Programmable Device Can Combine Glue Logic and Structured Designs — Enhanced Pin Locking Capability — Three Dedicated Clock Input Pins — Synchronous and Asynchronous Clocks — Programmable Output Slew Rate Control to Minimize Switching Noise — Flexible Pin Placement — Optimized Global Routing Pool Provides Global Interconnectivity • pLSI/ispLSI DEVELOPMENT TOOLS pDS® Software — Easy to Use PC Windows™ Interface — Boolean Logic Compiler — Manual Partitioning — Automatic Place and Route — Static Timing Table ispDS+™ Software — Industry Standard, Third-Party Design Environments — Schematic Capture, State Machine, HDL — Automatic Partitioning and Place and Route — Comprehensive Logic and Timing Simulation — PC and Workstation Platforms B7 A0 D Q A1 A2 Logic A3 Array B6 B5 D Q D Q GLB B4 B3 A4 D Q B2 A5 B1 A6 A7 Global Routing Pool (GRP) Output Routing Pool • HIGH-DENSITY PROGRAMMABLE LOGIC — 2000 PLD Gates — 32 I/O Pins, Four Dedicated Inputs — 96 Registers — High-Speed Global Interconnect — Wide Input Gating for Fast Counters, State Machines, Address Decoders, etc. — Small Logic Block Size for Random Logic Functional Block Diagram Output Routing Pool Features B0 CLK 0139C1-isp Description The ispLSI and pLSI 1016E are High-Density Programmable Logic Devices containing 96 Registers, 32 Universal I/O pins, four Dedicated Input pins, three Dedicated Clock Input pins, one Global OE input pin and a Global Routing Pool (GRP). The GRP provides complete interconnectivity between all of these elements. The ispLSI 1016E features 5-Volt in-system programming and in-system diagnostic capabilities. The ispLSI 1016E offers non-volatile “on-the-fly” reprogrammability of the logic, as well as the interconnect to provide truly reconfigurable systems. It is architecturally and parametrically compatible to the pLSI 1016E device, but multiplexes four input pins to control in-system programming. A functional superset of the ispLSI and pLSI 1016 architecture, the ispLSI and pLSI 1016E devices add a new global output enable pin. The basic unit of logic on the ispLSI and pLSI 1016E devices is the Generic Logic Block (GLB). The GLBs are labeled A0, A1...B7 (see figure 1). There are a total of 16 GLBs in the ispLSI and pLSI 1016E devices. Each GLB has 18 inputs, a programmable AND/OR/Exclusive OR array, and four outputs which can be configured to be either combinatorial or registered. Inputs to the GLB come from the GRP and dedicated inputs. All of the GLB outputs are brought back into the GRP so that they can be connected to the inputs of any other GLB on the device. Copyright © 1997 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice. LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. Tel. (503) 681-0118; 1-800-LATTICE; FAX (503) 681-3037; http://www.latticesemi.com 1016E_04 February 1997 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E Functional Block Diagram Figure 1. ispLSI and pLSI 1016E Functional Block Diagram Generic Logic Blocks (GLBs) GOE 0/IN 3 MODE*/IN 2 I/O 31 I/O 30 I/O 29 I/O 28 B7 I/O 12 I/O 13 I/O 14 I/O 15 B5 A2 A3 Global Routing Pool (GRP) A4 B4 B3 B2 A5 lnput Bus Output Routing Pool (ORP) I/O 8 I/O 9 I/O 10 I/O 11 B6 A1 Input Bus I/O 4 I/O 5 I/O 6 I/O 7 A0 Output Routing Pool (ORP) I/O 0 I/O 1 I/O 2 I/O 3 I/O 27 I/O 26 I/O 25 I/O 24 I/O 23 I/O 22 I/O 21 I/O 20 I/O 19 I/O 18 I/O 17 I/O 16 B1 A6 B0 A7 *SDI/IN 0 *SDO/IN 1 Clock Distribution Network CLK 0 CLK 1 CLK 2 IOCLK 0 IOCLK 1 Megablock Y0 Y1** *SCLK/Y2 *ispEN/NC * ispLSI 1016E Only **Note: Y1 and RESET are multiplexed on the same pin 0139B(1a)-isp The GRP has, as its inputs, the outputs from all of the GLBs and all of the inputs from the bi-directional I/O cells. All of these signals are made available to the inputs of the GLBs. Delays through the GRP have been equalized to minimize timing skew. The devices also have 32 I/O cells, each of which is directly connected to an I/O pin. Each I/O cell can be individually programmed to be a combinatorial input, registered input, latched input, output or bi-directional I/O pin with 3-state control. The signal levels are TTL compatible voltages and the output drivers can source 4 mA or sink 8 mA. Each output can be programmed independently for fast or slow output slew rate to minimize overall output switching noise. Clocks in the ispLSI and pLSI 1016E devices are selected using the Clock Distribution Network. Three dedicated clock pins (Y0, Y1 and Y2) are brought into the distribution network, and five clock outputs (CLK 0, CLK 1, CLK 2, IOCLK 0 and IOCLK 1) are provided to route clocks to the GLBs and I/O cells. The Clock Distribution Network can also be driven from a special clock GLB (B0 on the ispLSI and pLSI 1016E devices). The logic of this GLB allows the user to create an internal clock from a combination of internal signals within the device. Eight GLBs, 16 I/O cells, two dedicated inputs and one ORP are connected together to make a Megablock (see figure 1). The outputs of the eight GLBs are connected to a set of 16 universal I/O cells by the ORP. Each ispLSI and pLSI 1016E device contains two Megablocks. 2 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E Absolute Maximum Ratings 1 Supply Voltage VCC ................................. -0.5 to +7.0V Input Voltage Applied ........................ -2.5 to VCC +1.0V Off-State Output Voltage Applied ..... -2.5 to VCC +1.0V Storage Temperature ................................ -65 to 150°C Case Temp. with Power Applied .............. -55 to 125°C Max. Junction Temp. (TJ) with Power Applied ... 150°C 1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specifica tion is not implied (while programming, follow the programming specifications). DC Recommended Operating Conditions PARAMETER SYMBOL MIN. MAX. UNITS 5.25 V Commercial TA = 0°C to + 70°C 4.75 Industrial TA = -40°C to + 85°C 4.5 5.5 V 0 0.8 V VCC Supply Voltage VIL VIH Input Low Voltage Input High Voltage 2.0 Vcc+1 V Table 2-0005/1016E Capacitance (TA=25oC, f=1.0 MHz) TYPICAL UNITS C1 Dedicated Input, I/O, Y1, Y2, Y3, Clock Capacitance (Commercial/Industrial) 8 pf VCC = 5.0V, VPIN = 2.0V C2 Y0 Clock Capacitance 12 pf VCC = 5.0V, VPIN = 2.0V SYMBOL PARAMETER TEST CONDITIONS Table 2-0006/1016E Data Retention Specifications PARAMETER MINIMUM MAXIMUM UNITS 20 – Years 10000 – Cycles 100 – Cycles Data Retention ispLSI Erase/Reprogram Cycles pLSI Erase/Reprogram Cycles Table 2-0008/1016E 3 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E Switching Test Conditions Figure 2. Test Load GND to 3.0V Input Pulse Levels Input Rise and Fall Time 10% to 90% -125 ≤ 2 ns -100, -80 ≤ 3 ns Input Timing Reference Levels 1.5V Ouput Timing Reference Levels 1.5V Output Load + 5V R1 Device Output See figure 2 Table 2-0003/1016E 3-state levels are measured 0.5V from steady-state active level. Test Point R2 CL* Output Load Conditions (see figure 2) TEST CONDITION R1 R2 CL 470Ω 390Ω 35pF Active High ∞ 390Ω 35pF Active Low 470Ω 390Ω 35pF Active High to Z at VOH -0.5V ∞ 390Ω 5pF Active Low to Z at VOL +0.5V 470Ω 390Ω 5pF A B C *CL includes Test Fixture and Probe Capacitance. 0213a Table 2-0004/1016E DC Electrical Characteristics Over Recommended Operating Conditions SYMBOL CONDITION PARAMETER 3 MIN. TYP. MAX. UNITS VOL VOH IIL IIH IIL-isp IIL-PU IOS1 Output Low Voltage IOL= 8 mA – – Output High Voltage IOH = -4 mA 2.4 – – V Input or I/O Low Leakage Current 0V ≤ VIN ≤ VIL (Max.) – – -10 µA Input or I/O High Leakage Current 3.5V ≤ VIN ≤ VCC – – 10 µA ispEN Input Low Leakage Current 0V ≤ VIN ≤ VIL – – -150 µA I/O Active Pull-Up Current 0V ≤ VIN ≤ VIL – – -150 µA Output Short Circuit Current VCC = 5V, VOUT = 0.5V – – -200 mA ICC2, 4 Operating Power Supply Current VIL = 0.5V, VIH = 3.0V Commercial – 90 – mA fCLOCK = 1 MHz Industrial – 90 – mA 0.4 V Table 2-0007/1016E 1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test problems by tester ground degradation. Guaranteed but not 100% tested. 2. Measured using four 16-bit counters. 3. Typical values are at VCC = 5V and TA= 25°C. 4. Maximum I CC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book to estimate maximum I CC . 4 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E External Timing Parameters Over Recommended Operating Conditions 4 PARAMETER tpd1 tpd2 fmax fmax (Ext.) fmax (Tog.) tsu1 tco1 th1 tsu2 tco2 th2 tr1 trw1 tptoeen tptoedis tgoeen tgoedis twh twl tsu3 th3 1. 2. 3. 4. TEST 2 # COND. -80 -100 -125 DESCRIPTION1 MIN. MAX. MIN. MAX. MIN. MAX. UNITS A 1 Data Prop. Delay, 4PT Bypass, ORP Bypass – 7.5 – 10.0 – 15.0 ns A 2 Data Prop. Delay, Worst Case Path – 10.0 – 13.0 – 18.5 ns 125 – 100 – 84.0 – MHz 100 – 77 – 57.0 – MHz – MHz A – 3 Clk. Frequency with Int. Feedback 3 4 Clk. Frequency with Ext. Feedback( 1 tsu2 + tco1 1 twh + tw1 ) – 5 Clk. Frequency, Max. Toggle( – 6 GLB Reg. Setup Time before Clk., 4 PT Bypass ) A – 167 – 125 – 100 5.0 – 7.0 – 8.5 – ns 7 GLB Reg. Clk. to Output Delay, ORP Bypass – 4.5 – 5.0 – 8.0 ns 8 GLB Reg. Hold Time after Clk., 4 PT Bypass 0.0 – 0.0 – 0.0 – ns – 9 GLB Reg. Setup Time before Clk. 5.5 – 8.0 – 9.5 – ns – 10 GLB Reg. Clk. to Output Delay – 5.5 – 6.0 – 9.5 ns – 11 GLB Reg. Hold Time after Clk. 0.0 – 0.0 – 0.0 – ns 13.5 – 17.0 ns A 12 Ext. Reset Pin to Output Delay – 10.0 – – 13 Ext. Reset Pulse Duration 5.0 – 6.5 – ns 14 Input to Output Enable – 12.0 – 15.0 10.0 – – B 20.0 ns C 15 Input to Output Disable – 12.0 – 15.0 – 20.0 ns B 16 Global OE Output Enable – 7.0 – 9.0 – 10.5 ns C 17 Global OE Output Disable – 7.0 – 9.0 – 10.5 ns – 18 Ext. Sync. Clk. Pulse Duration, High 3.0 – 4.0 – 5.0 – ns – 19 Ext. Sync. Clk. Pulse Duration, Low 3.0 – 4.0 – 5.0 – ns – 20 I/O Reg. Setup Time before Ext. Sync. Clk. (Y2, Y3) 3.0 – 3.5 – 4.5 – ns – 0.0 – ns – 21 I/O Reg. Hold Time after Ext. Sync. Clk. (Y2, Y3) 0.0 – Unless noted otherwise, all parameters use the GRP, 20 PTXOR path, ORP and Y0 clock. Refer to Timing Model in this data sheet for further details. Standard 16-bit counter using GRP feedback. Reference Switching Test Conditions Section. 5 0.0 Table 2-0030-16/125,100, 80 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E Internal Timing Parameters1 PARAMETER # 2 -125 DESCRIPTION -100 -80 MIN. MAX. MIN. MAX. MIN. MAX. UNITS Inputs tiobp tiolat tiosu tioh tioco tior tdin 22 I/O Register Bypass – 0.3 – 0.4 – 0.6 ns 23 I/O Latch Delay – 1.8 – 2.4 – 3.6 ns ns 24 I/O Register Setup Time before Clock 3.0 – 3.5 – 4.5 – 25 I/O Register Hold Time after Clock -0.3 – -0.4 – – ns – 4.0 – 5.0 -0.6 – 7.5 ns 5.0 – 7.5 ns 3.9 ns 26 I/O Register Clock to Out Delay 27 I/O Register Reset to Out Delay – 4.0 – 28 Dedicated Input Delay – 2.2 – 2.6 – 29 GRP Delay, 1 GLB Load – 1.8 – 1.9 – 2.9 ns 30 GRP Delay, 4 GLB Loads GRP tgrp1 tgrp4 tgrp8 tgrp16 – 1.9 – 2.2 – 3.3 ns 31 GRP Delay, 8 GLB Loads – 2.1 – 2.5 – 3.8 ns 32 GRP Delay, 16 GLB Loads – 2.4 – 3.1 – 4.7 ns 34 4 Product Term Bypass Path Delay (Combinatorial) – 3.9 – 5.7 – 8.1 ns 35 4 Product Term Bypass Path Delay (Registered) – 3.9 – 5.6 – 7.3 ns 36 1 Product Term/XOR Path Delay – 4.4 – 6.1 – 7.1 ns 37 20 Product Term/XOR Path Delay – 4.4 – 6.1 – 8.2 ns 38 XOR Adjacent Path Delay 3 – 4.4 – 6.6 – 8.3 ns 39 GLB Register Bypass Delay – 1.0 – 1.6 – 1.9 ns 40 GLB Register Setup Time before Clock 0.2 – 0.2 – -0.6 – ns 41 GLB Register Hold Time after Clock 1.5 – 2.5 – 4.3 – ns 42 GLB Register Clock to Output Delay – 1.8 – 1.9 – 2.9 ns 43 GLB Register Reset to Output Delay – 4.4 – 6.3 – 7.0 ns 44 GLB Product Term Reset to Register Delay – 3.5 – 5.1 – 7.2 ns GLB t4ptbpc t4ptbpr t1ptxor t20ptxor txoradj tgbp tgsu tgh tgco tgro tptre tptoe tptck – 5.5 – 7.1 – 9.7 ns 3.2 3.5 4.8 5.3 6.8 7.5 ns 47 ORP Delay – 1.0 – 1.0 – 1.5 ns 48 ORP Bypass Delay – 0.0 – 0.0 – 0.0 ns 45 GLB Product Term Output Enable to I/O Cell Delay 46 GLB Product Term Clock Delay ORP torp torpbp 1. Internal Timing Parameters are not tested and are for reference only. 2. Refer to Timing Model in this data sheet for further details. 3. The XOR Adjacent path can only be used by Lattice hard macros. 6 Table 2-0036-16/125,100, 80 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E Internal Timing Parameters1 PARAMETER 2 # -125 DESCRIPTION -80 -100 MIN. MAX. MIN. MAX. MIN. MAX. UNITS Outputs tob tsl toen todis tgoe 49 Output Buffer Delay – 1.4 – 1.7 – 3.0 ns 50 Output Slew Limited Delay Adder – 10.0 – 10.0 – 10.0 ns 51 I/O Cell OE to Output Enabled – 4.3 – 5.3 – 6.4 ns 52 I/O Cell OE to Output Disabled – 4.3 – 5.3 – 6.4 ns 53 Global Output Enable – 2.7 – 3.7 – 4.1 ns Clocks tgy0 tgy1/2 tgcp tioy1/2 tiocp 54 Clock Delay, Y0 to Global GLB Clock Line (Ref. clock) 1.3 1.3 1.4 1.4 2.1 2.1 ns 55 Clock Delay, Y1 or Y2 to Global GLB Clock Line 2.3 2.7 2.4 2.9 3.6 4.4 ns 56 Clock Delay, Clock GLB to Global GLB Clock Line 0.8 1.8 0.8 1.8 1.2 2.7 ns 57 Clock Delay, Y1 or Y2 to I/O Cell Global Clock Line 0.0 0.3 0.0 0.4 0.0 0.6 ns 58 Clock Delay, Clock GLB to I/O Cell Global Clock Line 0.8 1.8 0.8 1.8 1.2 2.7 ns – 3.2 – 4.5 – 5.5 ns Global Reset tgr 59 Global Reset to GLB and I/O Registers 1. Internal Timing Parameters are not tested and are for reference only. 2. Refer to Timing Model in this data sheet for further details. 7 Table 2-0037-16/125,100,80 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E ispLSI and pLSI 1016E Timing Model I/O Cell GRP GLB ORP I/O Cell Feedback Ded. In I/O Pin (Input) #59 Comb 4 PT Bypass #34 #28 Reg 4 PT Bypass GLB Reg Bypass ORP Bypass #35 #39 #48 GRP Loading Delay 20 PT XOR Delays GLB Reg Delay ORP Delay #29, 31, 32 #36-38 I/O Reg Bypass #22 #30 Input D Register Q RST #23 - 27 D Q #49, 50 I/O Pin (Output) #51, 52 #47 RST #59 Reset Clock Distribution Y1,2 #55-58 #40-43 Control RE PTs OE #44-46 CK #54 Y0 0491-16 #53 GOE 0 Derivations of tsu, th and tco from the Product Term Clock 1 tsu = = = 1.4 ns = Logic + Reg su - Clock (min) (tiobp + tgrp4 + t20ptxor) + (tgsu) - (tiobp + tgrp4 + tptck(min)) (#22 + #30 + #37) + (#40) - (#22 + #30 + #46) (0.3 + 1.9 + 4.4) + (0.2) - (0.3 + 1.9 + 3.2) th = = = 0.6 ns = Clock (max) + Reg h - Logic (tiobp + tgrp4 + tptck(max)) + (tgh) - (tiobp + tgrp4 + t20ptxor) (#22 + #30 + #46) + (#41) - (#22 + #30 + #37) (0.3 + 1.9 + 3.5) + (1.5) - (0.3 + 1.9 + 4.4) tco = = = 9.9 ns = Clock (max) + Reg co + Output (tiobp + tgrp4 + tptck(max)) + (tgco) + (torp + tob) (#22 + #30 + #46) + (#42) + (#47 + #49) (0.3 + 1.9 + 3.5) + (1.8) + (1.0 + 1.4) Derivations of tsu, th and tco from the Clock GLB 1 tsu = = = 2.9 ns = Logic + Reg su - Clock (min) (tiobp + tgrp4 + t20ptxor) + (tgsu) - (tgy0(min) + tgco + tgcp(min)) (#22 + #30 + #37) + (#40) - (#54 + #42 + #56) (0.3 + 1.9 + 4.4) + (0.2) - (1.3 + 1.8 + 0.8) th = = = -0.2 ns = Clock (max) + Reg h - Logic (tgy0(max) + tgco + tgcp(max)) + (tgh) - (tiobp + tgrp4 + t20ptxor) (#54 + #42 + #56) + (#41) - (#22 + #30 + #37) (1.3 + 1.8 + 1.8) + (1.5) - (0.3 + 1.9 + 4.4) tco = = = 9.1 ns = Clock (max) + Reg co + Output (tgy0(max) + tgco + tgcp(max)) + (tgco) + (torp + tob) (#54 + #42 + #56) + (#42) + (#47 + #49) (1.3 + 1.8 + 1.8) + (1.8) + (1.0 + 1.4) Table 2-0042-16 1. Calculations are based upon timing specifications for the ispLSI and pLSI 1016E-125 8 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E Maximum GRP Delay vs GLB Loads ispLSI and pLSI 1016E-80 3 ispLSI and pLSI 1016E-100 GRP Delay (ns) 2 ispLSI and pLSI 1016E-125 1 1 8 4 12 16 GLB Load 16E GRP/GLB.eps Power Consumption used. Figure 3 shows the relationship between power and operating speed. Power Consumption in the ispLSI and pLSI 1016E device depends on two primary factors: the speed at which the device is operating and the number of Product Terms Figure 3. Typical Device Power Consumption vs fmax 130 ispLSI and pLSI 1016E 120 ICC (mA) 110 100 90 80 0 20 40 60 80 100 120 140 fmax (MHz) Notes: Configuration of four 16-bit counters Typical current at 5V, 25°C ICC can be estimated for the ispLSI and pLSI 1016E using the following equation: ICC(mA) = 23 + (# of PTs * 0.52) + (# of nets * max freq * 0.004) Where: # of PTs = Number of product terms used in design # of nets = Number of signals used in device Max freq = Highest clock frequency to the device (in MHz) The ICC estimate is based on typical conditions (VCC = 5.0V, room temperature) and an assumption of four GLB loads on average exists and the device is filled with four 16-bit counters. These values are for estimates only. Since the value of ICC is sensitive to operating conditions and the program in the device, the actual ICC should be verified. 0127B-16-80-isp/1016 9 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E In-System Programmability The ispLSI devices are the in-system programmable versions of the Lattice Semiconductor High-Density Programmable Large Scale Integration (pLSI) devices. By integrating all the high voltage programming circuitry onchip, programming can be accomplished by simply shifting data into the device. Once the function is programmed, the non-volatile E2CMOS cells will not lose the pattern even when the power is turned off. interface include isp Enable (ispEN), Serial Data In (SDI), Serial Data Out (SDO), Serial Clock (SCLK) and Mode (MODE) control. Figure 4 illustrates the block diagram of one possible scheme for programming the ispLSI devices. For details on the operation of the internal state machine and programming of the device, please refer to the ISP Architecture and Programming section of the 1996 Lattice Data Book. All necessary programming is done via five TTL level logic interface signals. These five signals are fed into the on-chip programming circuitry where a state machine controls the programming. The simple signals for the The device identifier for the ispLSI 1016E is 0000 1011 (0B hex). This code is the unique device identifier which is generated when a read ID command is performed. Figure 4. ISP Programming Interface SDO SDI MODE SCLK ispEN 5-wire ISP Programming Interface ispEN SCLK MODE SCLK MODE ispLSI SDI ispGAL SDO SDI ispEN SCLK MODE SCLK MODE ispGDS SDO SDI SDO ispLSI SDI SDO 0294B 10 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E ispLSI 1016E Shift Register Layout D A T A Data In (SDI) 79... 159... D A T A High Order Shift Register Low Order Shift Register ...0 ...80 SDO SDI Address Shift Register 109 . . . E2CMOS Cell Array . . . 0 0182B-16 SDO Note: A logic “1” in the Address Shift Register bit position enables the row for programming or verification. A logic “0” disables it. 11 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E Pin Description NAME PLCC PIN NUMBERS 18, 22, 28, 32, 40, 44, 6, 10 TQFP PIN NUMBERS 9, 13, 19, 23, 31, 35, 41, 1, 10, 14, 20, 24, 32, 36, 42, 2, 11, 15, 21, 25, 33, 37, 43, 3, 12, 16, 22, 26, 34, 38, 44, 4 DESCRIPTION I/O 0 - I/O 3 I/O 4 - I/O 7 I/O 8 - I/O 11 I/O 12 - I/O 15 I/O 16 - I/O 19 I/O 20 - I/O 23 I/O 24 - I/O 27 I/O 28 - I/O 31 15, 19, 25, 29, 37, 41, 3, 7, GOE 0/IN 3 2 40 This is a dual function pin. It can be used either as Global Output Enable for all I/O cells or it can be used as a dedicated input pin. ispEN**/NC 13 7 Input - Dedicated in-system programming enable input pin. This pin is brought low to enable the programming mode. The MODE, SDI, SDO and SCLK controls become active. SDI*/IN 0 14 8 Input - This pin performs two functions. When ispEN is logic low, it functions as an input pin to load programming data into the device. It is a dedicated input pin when ispEN is logic high.SDI/IN0 also is used as one of the two control pins for the isp state machine. MODE*/IN 2 36 30 Input - This pin performs two functions. When ispEN is logic low, it functions as a pin to control the operation of the isp state machine. It is a dedicated input pin when ispEN is logic high. SDO*/IN 1 24 18 Output/Input - This pin performs two functions. When ispEN is logic low, it functions as an ouput pin to read serial shift register data. It is a dedicated input pin when ispEN is logic high. SCLK*/Y2 33 27 Input - This pin performs two functions. When ispEN is logic low, it functions as a clock pin for the Serial Shift Register. It is a dedicated clock input when ispEN is logic high. This clock input is brought into the Clock Distribution Network, and can optionally be routed to any GLB and/or I/O cell on the device. Y0 11 5 Dedicated Clock input. This clock input is connected to one of the clock inputs of all the GLBs on the device. Y1/RESET 35 29 This pin performs two functions: - Dedicated clock input. This clock input is brought into the Clock Distribution Network, and can optionally be routed to any GLB and/or I/O cell on the device. - Active Low (0) Reset pin which resets all of the GLB and I/O registers in the device. 16, 20, 26, 30, 38, 42, 4, 8, GND 1, VCC 12, 34 23 17, 21, 27, 31, 39, 43, 5, 9, 17, 39 6, 28 Input/Output Pins - These are the general purpose I/O pins used by the logic array. Ground (GND) Vcc * ispLSI 1016E only ** ispEN for ispLSI 1016E; NC for pLSI 1016E must be left floating or tied to Vcc, must not be grounded or tied to any other signal. 12 Table 2-0002C-16-isp 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E Pin Configurations I/O 19 I/O 21 I/O 20 I/O 22 **GOE 0/IN 3 GND I/O 23 I/O 24 I/O 26 I/O 25 I/O 27 ispLSI and pLSI 1016E 44-pin PLCC Pinout Diagram 6 5 4 3 2 1 44 43 42 41 40 I/O 28 I/O 29 I/O 30 I/O 31 7 8 9 10 11 39 I/O 18 38 37 I/O 17 I/O 16 36 *MODE/IN 2 35 34 Y1/RESET VCC 12 ispLSI 1016E pLSI 1016E *ispEN/NC 13 Top View 33 *SCLK/Y2 *SDI/IN 0 14 32 I/O 15 I/O 0 I/O 1 I/O 2 15 16 17 31 30 29 I/O 14 I/O 13 I/O 12 Y0 VCC I/O 11 I/O 9 I/O 10 I/O 8 GND *SDO/IN 1 I/O 7 I/O 6 I/O 4 I/O 5 I/O 3 18 19 20 21 22 23 24 25 26 27 28 * Pins have dual function capability for ispLSI 1016E only (except pin 13, which is ispEN only). ** Pins have dual function capability which is software selectable. 0123A-isp1016 I/O 21 I/O 20 I/O 19 I/O 22 GND I/O 23 **GOE 0/IN 3 I/O 24 I/O 26 I/O 25 I/O 27 ispLSI 1016E 44-pin TQFP Pinout Diagram 44 43 42 41 40 39 38 37 36 35 34 I/O 28 I/O 29 I/O 30 I/O 31 Y0 VCC 1 2 3 4 5 ispLSI 1016E 6 Top View 33 I/O 18 32 31 I/O 17 I/O 16 30 *MODE/IN 2 29 28 Y1/RESET VCC ispEN 7 27 *SCLK/Y2 *SDI/IN 0 8 26 I/O 15 9 10 11 25 24 23 I/O 14 I/O 13 I/O 12 I/O 0 I/O 1 I/O 2 I/O 9 I/O 10 I/O 11 I/O 8 GND *SDO/IN 1 I/O 7 I/O 6 I/O 4 I/O 5 I/O 3 12 13 14 15 16 17 18 19 20 21 22 * Pins have dual function capability. ** Pins have dual function capability which is software selectable. 0851-16E/TQFP 13 1996 ISP Encyclopedia Specifications ispLSI and pLSI 1016E Part Number Description (is)pLSI 1016E – XXX X XXX X Device Family ispLSI pLSI Grade Blank = Commercial I = Industrial Device Number Package J = PLCC T44 = TQFP Speed 125 = 125 MHz fmax 100 = 100 MHz fmax 80 = 84 MHz fmax Power L = Low 0212/1016E ispLSI and pLSI 1016E Ordering Information COMMERCIAL FAMILY ispLSI pLSI fmax (MHz) tpd (ns) ORDERING NUMBER PACKAGE 125 7.5 ispLSI 1016E-125LJ 44-Pin PLCC 125 7.5 ispLSI 1016E-125LT44 44-Pin TQFP 100 10 ispLSI 1016E-100LJ 44-Pin PLCC 100 10 ispLSI 1016E-100LT44 44-Pin TQFP 84 15 ispLSI 1016E-80LJ 44-Pin PLCC 84 15 ispLSI 1016E-80LT44 44-Pin TQFP 125 7.5 pLSI 1016E-125LJ 44-Pin PLCC 100 10 pLSI 1016E-100LJ 44-Pin PLCC 84 15 pLSI 1016E-80LJ 44-Pin PLCC Table 2-0041A/1016E INDUSTRIAL FAMILY ispLSI fmax (MHz) tpd (ns) 84 84 ORDERING NUMBER PACKAGE 15 ispLSI 1016E-80LJI 44-Pin PLCC 15 ispLSI 1016E-80LT44I 44-Pin TQFP Table 2-0041B/1016E 14 1996 ISP Encyclopedia Copyright © 1997 Lattice Semiconductor Corporation. E2CMOS, GAL, ispGAL, ispLSI, pLSI, pDS, Silicon Forest, UltraMOS, Lattice Semiconductor, L (stylized) Lattice Semiconductor Corp., L (stylized) and Lattice (design) are registered trademarks of Lattice Semiconductor Corporation. Generic Array Logic, ISP, ispATE, ispCODE, ispDOWNLOAD, ispGDS, ispDS, ispDS+, ispStarter, ispSTREAM, ispTEST, ispTURBO, Latch-Lock, pDS+, RFT, Total ISP and Twin GLB are trademarks of Lattice Semiconductor Corporation. ISP is a service mark of Lattice Semiconductor Corporation. All brand names or product names mentioned are trademarks or registered trademarks of their respective holders. Lattice Semiconductor Corporation (LSC) products are made under one or more of the following U.S. and international patents: 4,761,768 US, 4,766,569 US, 4,833,646 US, 4,852,044 US, 4,855,954 US, 4,879,688 US, 4,887,239 US, 4,896,296 US, 5,130,574 US, 5,138,198 US, 5,162,679 US, 5,191,243 US, 5,204,556 US, 5,231,315 US, 5,231,316 US, 5,237,218 US, 5,245,226 US, 5,251,169 US, 5,272,666 US, 5,281,906 US, 5,295,095 US, 5,329,179 US, 5,331,590 US, 5,336,951 US, 5,353,246 US, 5,357,156 US, 5,359,573 US, 5,394,033 US, 5,394,037 US, 5,404,055 US, 5,418,390 US, 5,493,205 US, 0194091 EP, 0196771B1 EP, 0267271 EP, 0196771 UK, 0194091 GB, 0196771 WG, P3686070.0-08 WG. LSC does not represent that products described herein are free from patent infringement or from any third-party right. The specifications and information herein are subject to change without notice. Lattice Semiconductor Corporation (LSC) reserves the right to discontinue any product or service without notice and assumes no obligation to correct any errors contained herein or to advise any user of this document of any correction if such be made. LSC recommends its customers obtain the latest version of the relevant information to establish, before ordering, that the information being relied upon is current. LSC warrants performance of its products to current and applicable specifications in accordance with LSC’s standard warranty. Testing and other quality control procedures are performed to the extent LSC deems necessary. Specific testing of all parameters of each product is not necessarily performed, unless mandated by government requirements. LSC assumes no liability for applications assistance, customer’s product design, software performance, or infringements of patents or services arising from the use of the products and services described herein. LSC products are not authorized for use in life-support applications, devices or systems. Inclusion of LSC products in such applications is prohibited. LATTICE SEMICONDUCTOR CORPORATION 5555 Northeast Moore Court Hillsboro, Oregon 97124 U.S.A. Tel.: (503) 681-0118 FAX: (503) 681-3037 http://www.latticesemi.com February 1997