www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 D 52 Pin HTQFP Package With Exposed FEATURES D 14 Bit Resolution D 105 MSPS Maximum Sample Rate D SNR = 74 dBc at 105 MSPS and 50-MHz IF D SFDR = 93 dBc at 105 MSPS and 50-MHz IF D 2.2 Vpp Differential Input Range D 5 V Supply Operation D 3.3 V CMOS Compatible Outputs D 1.9 W Total Power Dissipation D 2s Complement Output Format D On-Chip Input Analog Buffer, Track and Hold, Heatsink D Pin Compatible to the AD6644/45 D Industrial Temperature Range = −405C to 855C APPLICATIONS D Single and Multichannel Digital Receivers D Base Station Infrastructure D Instrumentation D Video and Imaging RELATED DEVICES D Clocking: CDC7005 D Amplifiers: OPA695, THS4509 and Reference Circuit DESCRIPTION The ADS5424 is a 14 bit 105 MSPS analog-to-digital converter (ADC) that operates from a 5 V supply, while providing 3.3 V CMOS compatible digital outputs. The ADS5424 input buffer isolates the internal switching of the on-chip Track and Hold (T&H) from disturbing the signal source. An internal reference generator is also provided to further simplify the system design. The ADS5424 has outstanding low noise and linearity, over input frequency. With only a 2.2 VPP input range, simplifies the design of multicarrier applications, where the carriers are selected on the digital domain. The ADS5424 is available in a 52 pin HTQFP with heatsink package and is pin compatible to the AD6645. The ADS5424 is built on state of the art Texas Instruments complementary bipolar process (BiCom3) and is specified over full industrial temperature range (−40°C to 85°C). FUNCTIONAL BLOCK DIAGRAM AVDD AIN AIN TH1 A1 + TH2 Σ A2 + TH3 ADC1 DAC1 A3 ADC3 − − VREF Σ DRVDD ADC2 DAC2 Reference 5 5 6 C1 C2 CLK+ CLK− Digital Error Correction Timing DMID OVR DRY D[13:0] GND Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PowerPad is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. Copyright 2005, Texas Instruments Incorporated ! " #$ " %$&# '( '$#" #! "%##" % ) !" *" "$!" "'' +,( '$# %#"" '" #"", #$' " %!"( www.ti.com www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 PACKAGE/ORDERING INFORMATION PRODUCT PACKAGE LEAD PACKAGE DESIGNATOR SPECIFIED TEMPERATURE RANGE PACKAGE MARKING ADS5424 HTQFP-52(1) PowerPAD PJY −40°C to +85°C ADS5424I ORDERING NUMBER TRANSPORT MEDIA, QUANTITY ADS5424IPJY Tray, 160 ADS5424IPJYR Tape and Reel, 1000 (1) Thermal pad size: Octagonal 2,5 mm side ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range unless otherwise noted(1) ADS5424 Supply voltage AVDD to GND DRVDD to GND 6 5 −0.3 to AVDD + 0.3 Analog input to GND −0.3 to AVDD + 0.3 ±2.5 Clock input to GND CLK to CLK Digital data output to GND Operating temperature range Maximum junction temperature Storage temperature range UNIT This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. V ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because small parametric changes could cause the device not to meet its published specifications. V RECOMMENDED OPERATING CONDITIONS V V PARAMETER −0.3 to DRVDD + 0.3 −40 to 85 °C 150 °C Output driver supply voltage, DRVDD −65 to 150 °C Analog Input V (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. MIN TYP MAX UNIT 4.75 5 5.25 V 3 3.3 3.6 V Supplies Analog supply voltage, AVDD Differential input range Input common-mode voltage, VCM Digital Output Maximum output load THERMAL CHARACTERISTICS(1) VPP 2.4 V 10 pF Clock Input PARAMETER TEST CONDITIONS TYP UNIT θJA Soldered slug, no airflow 22.5 °C/W θJA Soldered slug, 200-LPFM airflow 15.8 °C/W θJA Unsoldered slug, no airflow 33.3 °C/W θJA Unsoldered slug, 200-LPFM airflow 25.9 °C/W θJC Bottom of package (heatslug) 2 °C/W (1) Using 25 thermal vias (5 x 5 array). See the Application Section. 2 2.2 ADCLK input sample rate (sine wave) 1/tC Clock amplitude, sine wave, differential(1) Clock duty cycle(2) 30 105 3 MSPS VPP 50% Open free-air temperature range −40 85 (1) See Figure 22 and Figure 23 for more information. (2) See Figure 21 for more information. °C www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 ELECTRICAL CHARACTERISTICS Over full temperature range (TMIN = −40°C to TMAX = 85°C), sampling rate = 105 MSPS, 50% clock duty cycle, AVDD = 5 V, DRVDD = 3.3 V, −1 dBFS differential input, and 3 VPP differential sinusoidal clock, unless otherwise noted TEST CONDITIONS PARAMETER MIN Resolution TYP MAX UNIT 14 Bits 2.2 VPP kΩ Analog Inputs Differential input range Differential input resistance See Figure 32 Differential input capacitance See Figure 32 1 Analog input bandwidth 1.5 pF 570 MHz 2.4 V Internal Reference Voltages Reference voltage, VREF Dynamic Accuracy No missing codes Differential linearity error, DNL Integral linearity error, INL Tested fIN = 5 MHz fIN = 5 MHz −0.95 ±0.5 1.5 ±1.5 Offset error −5 Offset temperature coefficient 0 LSB 5 1.7 Gain error −5 0.9 LSB mV ppm/°C 5 %FS PSRR 1 mV/V Gain temperature coefficient 77 ppm/°C Power Supply Analog supply current, IAVDD VIN = full scale, fIN = 70 MHz FS = 92.16 MSPS FS = 105 MSPS 355 Output buffer supply current, IDRVDD VIN = full scale, fIN = 70 MHz FS = 92.16 MSPS FS = 105 MSPS 38 Total power with 10-pF load on each digital output to ground, fIN = 70 MHz FS = 92.16 MSPS 1.9 Power dissipation FS = 105 MSPS 1.9 2.2 FS = 105 MSPS 20 100 Power-up time 355 40 410 47 mA mA W ms 3 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 ELECTRICAL CHARACTERISTICS Over full temperature range (TMIN = −40°C to TMAX = 85°C), sampling rate = 105 MSPS, 50% clock duty cycle, AVDD = 5 V, DRVDD = 3.3 V, −1 dBFS differential input, and 3 VPP differential sinusoidal clock, unless otherwise noted TEST CONDITIONS PARAMETER MIN TYP MAX UNIT Dynamic AC Characteristics Signal-to-noise ratio, SNR Spurious-free dynamic range, SFDR Signal-to-noise + distortion, SINAD 4 fIN = 10 MHz FS = 92.16 MSPS FS = 105 MSPS 74.5 fIN = 30 MHz FS = 92.16 MSPS FS = 105 MSPS fIN = 50 MHz FS = 92.16 MSPS FS = 105 MSPS fIN = 70 MHz FS = 92.16 MSPS FS = 105 MSPS fIN = 100 MHz FS = 92.16 MSPS FS = 105 MSPS 73.5 fIN = 170 MHz FS = 92.16 MSPS FS = 105 MSPS 72 fIN = 230 MHz FS = 92.16 MSPS FS = 105 MSPS 71.5 fIN = 10 MHz FS = 92.16 MSPS FS = 105 MSPS 94 fIN = 30 MHz FS = 92.16 MSPS FS = 105 MSPS fIN = 50 MHz FS = 92.16 MSPS FS = 105 MSPS 94 fIN = 70 MHz FS = 92.16 MSPS FS = 105 MSPS 89 fIN = 100 MHz FS = 92.16 MSPS FS = 105 MSPS 88 fIN = 170 MHz FS = 92.16 MSPS FS = 105 MSPS 73 fIN = 230 MHz FS = 92.16 MSPS FS = 105 MSPS 64 fIN = 10 MHz FS = 92.16 MSPS FS = 105 MSPS 74.4 fIN = 30 MHz FS = 92.16 MSPS FS = 105 MSPS 74.3 fIN = 50 MHz FS = 92.16 MSPS FS = 105 MSPS fIN = 70 MHz FS = 92.16 MSPS FS = 105 MSPS fIN = 100 MHz FS = 92.16 MSPS FS = 105 MSPS 73.3 fIN = 170 MHz FS = 92.16 MSPS FS = 105 MSPS 69.3 fIN = 230 MHz FS = 92.16 MSPS FS = 105 MSPS 63.4 74.4 73 74.4 dBc 74.3 dBc 74.2 74.2 74 72.5 74 73.5 72 71.5 93 85 dBc dBc dBc dBc dBc dBc 95 dBc 95 dBc 93 88 87 73 64 74.3 72.8 dBc 74.3 74.1 74 74 73.9 73.3 69.1 63.4 dBc dBc dBc dBc dBc dBc dBc dBc dBc dBc dBc dBc www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 ELECTRICAL CHARACTERISTICS Over full temperature range (TMIN = −40°C to TMAX = 85°C), sampling rate = 105 MSPS, 50% clock duty cycle, AVDD = 5 V, DRVDD = 3.3 V, −1 dBFS differential input, and 3 VPP differential sinusoidal clock, unless otherwise noted PARAMETER Second harmonic, HD2 Third harmonic, HD3 Worst-harmonic / spur (other than HD2 and HD3) RMS idle channel noise TEST CONDITIONS MIN TYP MAX UNIT fIN = 10 MHz fIN = 30 MHz 100 dBc 105 dBc fIN = 50 MHz fIN = 70 MHz 98 dBc 98 dBc fIN = 100 MHz fIN = 170 MHz 98 dBc 98 dBc fIN = 230 MHz fIN = 10 MHz 96 dBc 93 dBc fIN = 30 MHz fIN = 50 MHz 95 dBc 93 dBc fIN = 100 MHz fIN = 170 MHz 87 dBc 73 dBc fIN = 230 MHz fIN = 10 MHz 64 dBc 93 dBc fIN = 30 MHz fIN = 50 MHz 95 dBc 93 dBc fIN = 70 MHz fIN = 100 MHz 88 dBc 88 dBc fIN = 170 MHz fIN = 230 MHz 88 dBc 88 dBc Input pins tied together 0.9 LSB DIGITAL CHARACTERISTICS Over full temperature range (TMIN = −40°C to TMAX = 85°C), AVDD = 5 V, DRVDD = 3.3 V, unless otherwise noted PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 0.1 0.6 V Digital Outputs Low-level output voltage High-level output voltage CLOAD = 10 pF(1) CLOAD = 10 pF(1) Output capacitance DMID 2.6 3.2 V 3 pF DRVDD/2 V (1) Equivalent capacitance to ground of (load + parasitics of transmission lines). 5 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 TIMING CHARACTERISTICS(3) Over full temperature range, AVDD = 5 V, DRVDD = 3.3 V, sampling rate = 105 MSPS DESCRIPTION PARAMETER MIN TYP MAX UNIT Aperture Time tA tJ Aperture delay 500 Clock slope independent aperture uncertainity (jitter) 150 ps fs kJ Clock slope dependent jitter factor 50 µV Clock period 9.5 ns Clock pulsewidth high 4.75 ns Clock pulsewidth low 4.75 ns Clock Input tCLK tCLKH(1) tCLKL(1) Clock to DataReady (DRY) tDR Clock rising 50% to DRY falling 50% 2.8 3.9 7.6 tDR + tCLKH 8.7 4.7 ns tC_DR Clock rising 50% to DRY rising 50% ns tC_DR_50% Clock to DATA, OVR(4) Clock rising 50% to DRY rising 50% with 50% duty cycle clock tr tf Data VOL to data VOH (rise time) 2 Data VOH to data VOL (fall time) 2 ns L Latency 3 Cycles tsu(C) tH(C) Valid DATA(2) to clock 50% with 50% duty cycle clock (setup time) Clock 50% to invalid DATA(2) (hold time) 1.8 3.4 ns 2.6 3.6 ns 1.8 2.6 ns 3.9 4.4 ns 9.5 ns ns DataReady (DRY) to DATA, OVR(4) tsu(DR)_50% Valid DATA(2) to DRY 50% with 50% duty cycle clock (setup time) th(DR)_50% DRY 50% to invalid DATA(2) with 50% duty cycle clock (hold time) (1) See Figure 21 for more information. (2) See VOH and VOL levels. (3) All values obtained from design and characterization. (4) Data is updated with clock rising edge or DRY falling edge. tA N+3 N AIN N+1 N+2 tCLKH tCLK CLK, CLK N+1 N N+4 tCLKL N+2 N+3 tC_DR D[13:0], OVR DRY N−3 tr N−2 tf tDR Figure 1. Timing Diagram 6 tsu(C) N−1 tsu(DR) N+4 th(DR) N th(C) www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 PIN CONFIGURATION DRY D13 (MSB) D12 D11 D10 D9 D8 D7 D6 DRVCC GND D5 D4 PJY PACKAGE (TOP VIEW) 52 51 50 49 48 47 46 45 44 43 42 41 40 DRVDD GND VREF GND CLK CLK GND AVDD AVDD GND AIN AIN GND 1 39 2 3 38 37 4 36 5 6 35 34 7 33 GND 8 9 32 31 10 30 11 12 29 28 13 27 D3 D2 D1 D0 (LSB) DMID GND DRVDD OVR DNC AVDD GND AVDD GND AVDD GND AVDD GND AVDD GND C1 GND AVDD GND C2 GND AVDD 14 15 16 17 18 19 20 21 22 23 24 25 26 PIN ASSIGNMENTS TERMINAL NAME NO. DRVDD 1, 33, 43 DESCRIPTION 3.3 V power supply, digital output stage only GND 2, 4, 7, 10, 13, 15, 17, 19, 21, 23, 25, 27, 29, 34, 42 VREF 3 2.4 V reference. Bypass to ground with a 0.1-µF microwave chip capacitor. CLK 5 Clock input. Conversion initiated on rising edge. CLK 6 Complement of CLK, differential input AVDD 8, 9, 14, 16, 18, 22, 26, 28, 30 Ground 5 V analog power supply AIN 11 Analog input AIN 12 Complement of AIN, differential analog input C1 20 Internal voltage reference. Bypass to ground with a 0.1-µF chip capacitor. C2 24 Internal voltage reference. Bypass to ground with a 0.1-µF chip capacitor. DNC 31 Do not connect OVR 32 Overrange bit. A logic level high indicates the analog input exceeds full scale. DMID 35 Output data voltage midpoint. Approximately equal to (DVCC)/2 36 Digital output bit (least significant bit); two’s complement D0 (LSB) D1−D5, D6−D12 37−41, 44−50 Digital output bits in two’s complement D13 (MSB) 51 Digital output bit (most significant bit); two’s complement DRY 52 Data ready output 7 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 DEFINITION OF SPECIFICATIONS Analog Bandwidth The analog input frequency at which the power of the fundamental is reduced by 3 dB with respect to the low frequency value. Aperture Delay The delay between the rising edge of the input sampling clock and the actual time at which the sampling occurs. Aperture Uncertainty (Jitter) The sample-to-sample variation in aperture delay. Clock Pulse Width/Duty Cycle The duty cycle of a clock signal is the ratio of the time the clock signal remains at a logic high (clock pulse width) to the period of the clock signal. Duty cycle is typically expressed as a percentage. A perfect differential sine wave clock results in a 50% duty cycle. Maximum Conversion Rate The maximum sampling rate at which certified operation is given. All parametric testing is performed at this sampling rate unless otherwise noted. Offset Error The offset error is the difference, given in number of LSBs, between the ADC’s actual value average idle channel output code and the ideal average idle channel output code. This quantity is often mapped into mV. Temperature Drift The temperature drift coefficient (with respect to gain error and offset error) specifies the change per degree celcius of the paramter from TMIN or TMAX. It is computed as the maximum variation of that parameter over the whole temperature range divided by TMAX − TMIN. Signal-to-Noise Ratio (SNR) SNR is the ratio of the power of the fundamental (PS) to the noise floor power (PN), excluding the power at dc and the first five harmonics. SNR + 10Log 10 PS PN Minimum Conversion Rate The minimum sampling rate at which the ADC functions. SNR is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the reference or dBFS (dB to full scale) when the power of the fundamental is extrapolated to the converter’s full-scale range. Differential Nonlinearity (DNL) An ideal ADC exhibits code transitions at analog input values spaced exactly 1 LSB apart. The DNL is the deviation of any single step from this ideal value, measured in units of LSB. Signal-to-Noise and Distortion (SINAD) SINAD is the ratio of the power of the fundamental (PS) to the power of all the other spectral components including noise (PN) and distortion (PD), but excluding dc. Integral Nonlinearity (INL) The INL is the deviation of the ADC’s transfer function from a best fit line determined by a least squares curve fit of that transfer function, measured in units of LSB. Gain Error The gain error is the deviation of the ADC’s actual input full-scale range from its ideal value. The gain error is given as a percentage of the ideal input full-scale range. 8 SINAD + 10Log 10 PS PN ) PD SINAD is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the reference or dBFS (dB to full scale) when the power of the fundamental is extrapolated to the converter’s full-scale range. www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 Total Harmonic Distortion (THD) THD is the ratio of the fundamental power (PS) to the power of the first five harmonics (PD). THD + 10Log 10 PS PD THD is typically given in units of dBc (dB to carrier). Two-Tone Intermodulation Distortion IMD3 is the ratio of the power of the fundamental (at frequiencies f1, f2) to the power of the worst spectral component at either frequency 2f1 − f2 or 2f2 − f1). IMD3 is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the reference or dBFS (dB to full scale) when it is referred to the full-scale range. Spurious-Free Dynamic Range (SFDR) The ratio of the power of the fundamental to the highest other spectral component (either spur or harmonic). SFDR is typically given in units of dBc (dB to carrier). 9 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 TYPICAL CHARACTERISTICS Typical values are at TA = 25°C, AVDD = 5 V, DRVDD = 3.3 V, differential input amplitude = −1 dBFS, sampling rate = 105 MSPS, 3 VPP sinusoidal clock, 50% duty cycle, 16k FFT points, unless otherwise noted SPECTRAL PERFORMANCE 1 0 fS = 105 MSPS fIN = 2 MHz SNR = 74.4 dBc SINAD = 74.4 dBc SFDR = 93 dBc THD = 95 dBc −40 −60 −80 −40 −60 −80 X 5 −100 6 2 2 6 4 −120 −120 0 10 20 30 40 50 0 10 Figure 3 SPECTRAL PERFORMANCE fS = 105 MSPS fIN = 100 MHz SNR = 73.5 dBc SINAD = 73.3 dBc SFDR = 87 dBc THD = 86 dBc Amplitude − dBFS −20 −60 −80 3 X 4 −40 −60 −80 3 X 5 2 −100 5 6 50 1 0 fS = 105 MSPS fIN = 70 MHz SNR = 74 dBc SINAD = 73.9 dBc SFDR = 92 dBc THD = 91 dBc −100 40 Figure 2 1 −40 30 f − Frequency − MHz SPECTRAL PERFORMANCE −20 20 f − Frequency − MHz 0 Amplitude − dBFS X 5 3 3 −100 fS = 105 MSPS fIN = 30 MHz SNR = 74.4 dBc SINAD = 74.3 dBc SFDR = 94 dBc THD = 93 dBc −20 Amplitude − dBFS −20 Amplitude − dBFS SPECTRAL PERFORMANCE 1 0 4 2 6 −120 −120 0 10 20 30 40 50 0 10 Figure 5 Amplitude − dBFS Amplitude − dBFS fS = 105 MSPS fIN = 230 MHz SNR = 71 dBc SINAD = 64.2 dBc SFDR = 65 dBc THD = 65 dBc −20 −60 3 X 5 2 −40 −60 3 −80 5 4 6 X 4 −100 −120 2 6 −120 0 10 1 0 fS = 105 MSPS fIN = 170 MHz SNR = 71.9 dBc SINAD = 69.1 dBc SFDR = 72 dBc THD = 72 dBc −80 50 SPECTRAL PERFORMANCE 1 −100 40 Figure 4 SPECTRAL PERFORMANCE −40 30 f − Frequency − MHz 0 −20 20 f − Frequency − MHz 10 20 30 40 50 0 10 20 30 f − Frequency − MHz f − Frequency − MHz Figure 6 Figure 7 40 50 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 Typical values are at TA = 25°C, AVDD = 5 V, DRVDD = 3.3 V, differential input amplitude = −1 dBFS, sampling rate = 105 MSPS, 3 VPP sinusoidal clock, 50% duty cycle, 16k FFT points, unless otherwise noted SPECTRAL PERFORMANCE −60 −80 −100 −40 −60 3 −80 X −100 2 6 −120 10 20 30 40 0 10 20 30 f − Frequency − MHz f − Frequency − MHz Figure 8 Figure 9 SPECTRAL PERFORMANCE 40 SPECTRAL PERFORMANCE 0 0 fS = 92.16 MSPS fIN 1 = 69.2 MHz, −7 dBFS fIN 2 = 70.7 MHz, −7 dBFS IMD3 = −93 dBFS −40 fS = 92.16 MSPS fIN 1 = 169.6 MHz, −7 dBFS fIN 2 = 170.4 MHz, −7 dBFS IMD3 = −82 dBFS −20 Amplitude − dBFS −20 Amplitude − dBFS 5 6 −120 0 −60 −80 −100 −120 −40 −60 −80 −100 −120 −140 −140 0 10 20 30 40 0 10 20 30 f − Frequency − MHz f − Frequency − MHz Figure 10 Figure 11 WCDMA CARRIER 40 WCDMA CARRIER 0 0 fS = 92.16 MSPS fIN = 70 MHz PAR = 5 dB ACPR Adj Top = 79.2 dB ACPR Adj Low = 79.7 dB −40 fS = 92.16 MSPS fIN = 170 MHz PAR = 5 dB ACPR Adj Top = 73.3 dB ACPR Adj Low = 74 dB −20 Amplitude − dBFS −20 Amplitude − dBFS 4 2 X 5 4 fS = 92.16 MSPS fIN = 170 MHz SNR = 71.6 dBc SINAD = 69 dBc SFDR = 73 dBc THD = 73 dBc −20 Amplitude − dBFS −40 1 0 fS = 92.16 MSPS fIN = 70 MHz SNR = 73.9 dBc SINAD = 73.8 dBc SFDR = 96 dBc THD = 95 dBc −20 Amplitude − dBFS SPECTRAL PERFORMANCE 1 0 −60 −80 −100 −120 −40 −60 −80 −100 −120 −140 −140 0 10 20 30 40 0 10 20 30 f − Frequency − MHz f − Frequency − MHz Figure 12 Figure 13 40 11 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 Typical values are at TA = 25°C, AVDD = 5 V, DRVDD = 3.3 V, differential input amplitude = −1 dBFS, sampling rate = 105 MSPS, 3 VPP sinusoidal clock, 50% duty cycle, 16k FFT points, unless otherwise noted AC PERFORMANCE vs INPUT AMPLITUDE AC PERFORMANCE vs INPUT AMPLITUDE 120 120 100 SFDR (dBFS) AC Performance − dB AC Performance − dB 100 80 SNR (dBFS) 60 SFDR (dBc) 40 20 SNR (dBc) 0 fS = 92.16 MSPS fIN = 70 MHz −80 −70 −60 −50 −40 −30 −20 −10 SNR (dBFS) 60 SFDR (dBc) 40 20 SNR (dBc) −20 −90 0 −80 −70 −50 −40 −30 −20 AIN − Input Amplitude − dBFS Figure 14 Figure 15 TWO-TONE SPURIOUS-FREE DYNAMIC RANGE vs INPUT AMPLITUDE −10 0 NOISE HISTOGRAM WITH INPUTS SHORTED 40 120 100 35 SFDR (dBFS) 30 80 60 40 SFDR (dBc) 20 90 dBFS Line 0 25 20 15 10 fIN1 = 69 MHz fIN2 = 71 MHz fS = 92.16 MSPS −20 −110−100 −90 −80 −70 −60 −50 −40 −30 −20 −10 5 0 8174 0 8175 8176 8177 AIN − Input Amplitude − dBFS Code Number Figure 16 Figure 17 8178 8179 INPUT BANDWIDTH 1.90 2 fIN= 70 MHz 1.89 0 1.88 Power Output − dB PT − Total Power − W −60 AIN − Input Amplitude − dB TOTAL POWER vs SAMPLING FREQUENCY 1.87 1.86 1.85 1.84 1.83 −2 −4 −6 −8 1.82 1.81 fS = 105 MSPS AIN = −1 dBFS −10 0 12 fS = 92.16 MSPS fIN = 170 MHz 0 Percentage − % SFDR − Two-Tone Spurious-Free Dynamic Range − dB −20 −90 SFDR (dBFS) 80 20 40 60 80 100 120 140 1 10 100 fS − Sampling Frequency − MSPS f − Frequency − MHz Figure 18 Figure 19 1k www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 AC PERFORMANCE vs CLOCK COMMON MODE 100 fS = 105 MSPS fIN = 69.6 MHz 95 AC Performance − dB SFDR SFDR (dBc) 90 85 80 SNR (dBc) SNR 75 70 65 60 0 1 2 3 4 5 SFDR − Spurious-Free Dynamic Range − dBc Typical values are at TA = 25°C, AVDD = 5 V, DRVDD = 3.3 V, differential input amplitude = −1 dBFS, sampling rate = 105 MSPS, 3 VPP sinusoidal clock, 50% duty cycle, 16k FFT points, unless otherwise noted SPURIOUS-FREE DYNAMIC RANGE vs DUTY CYCLE 100 fIN = 2 MHz 95 90 85 fIN = 50 MHz 75 70 65 40 50 55 Duty Cycle − % Figure 20 Figure 21 AC PERFORMANCE vs CLOCK LEVEL AC PERFORMANCE vs CLOCK LEVEL 60 75 90 SFDR (dBc) SFDR (dBc) 70 AC Performance − dB 85 80 75 70 SNR (dBc) 65 60 fS = 105 MSPS fIN = 70 MHz 55 50 0 1 2 3 SNR (dBc) 65 60 55 0 2 3 Differential Clock Level − VPP Figure 22 Figure 23 4 SIGNAL-TO-NOISE RATIO vs SUPPLY VOLTAGE AND AMBIENT TEMPERATURE 94 74.8 fS = 105 MSPS fIN = 69.6 MHz 100°C 92 91 60°C 85°C −20°C 90 89 88 87 86 85 2.6 1 Differential Clock Level − VPP SPURIOUS-FREE DYNAMIC RANGE vs SUPPLY VOLTAGE AND AMBIENT TEMPERATURE 93 fS = 105 MSPS fIN = 170 MHz 50 4 SNR − Signal-to-Noise Ratio − dBc AC Performance − dB 45 Clock Common Mode − V 95 SFDR − Sprious-Free Dynamic Range − dBc fIN = 70 MHz 80 20°C −40°C 2.8 3.0 3.2 3.4 3.6 3.8 74.6 fS = 105 MSPS fIN = 69.6 MHz −40°C 74.4 74.2 −20°C 20°C 74.0 73.8 60°C 73.6 85°C 73.4 100°C 73.2 73.0 2.6 2.8 3.0 3.2 3.4 DRVDD − Supply Voltage − V DRVDD − Supply Voltage − V Figure 24 Figure 25 3.6 3.8 13 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 SPURIOUS-FREE DYNAMIC RANGE vs SUPPLY VOLTAGE AND AMBIENT TEMPERATURE SIGNAL-TO-NOISE RATIO vs SUPPLY VOLTAGE AND AMBIENT TEMPERATURE 74.6 91.0 90.5 fS = 105 MSPS fIN = 69.6 MHz 60°C SNR − Signal-to-Noise Ratio − dBc SFDR − Sprious-Free Dynamic Range − dBc Typical values are at TA = 25°C, AVDD = 5 V, DRVDD = 3.3 V, differential input amplitude = −1 dBFS, sampling rate = 105 MSPS, 3 VPP sinusoidal clock, 50% duty cycle, 16k FFT points, unless otherwise noted 90.0 89.5 −20°C 85°C 89.0 88.5 88.0 87.5 87.0 20°C 86.5 −40°C 86.0 4.6 4.7 4.8 4.9 5.0 5.1 5.2 5.3 −40°C 74.2 0°C 74.0 40°C 73.8 73.6 60°C 100°C 73.4 85°C 73.2 73.0 4.6 5.4 5.0 5.2 AVDD − Supply Voltage − V Figure 26 Figure 27 DIFFERENTIAL NONLINEARITY 5.4 INTEGRAL NONLINEARITY 1.5 0.8 INL − Integral Nonlinearity − LSB DNL − Differential Nonlinearity − LSB 4.8 AVDD − Supply Voltage − V 1.0 0.6 0.4 0.2 −0.0 −0.2 −0.4 −0.6 −0.8 −1.0 1.0 0.5 0.0 −0.5 −1.0 −1.5 0 5000 10000 Code Figure 28 14 fS = 105 MSPS fIN = 69.6 MHz 74.4 15000 0 5000 10000 Code Figure 29 15000 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 Typical values are at TA = 25°C, AVDD = 5 V, DRVDD = 3.3 V, differential input amplitude = −1 dBFS, sampling rate = 105 MSPS, 3 VPP sinusoidal clock, 50% duty cycle, 16k FFT points, unless otherwise noted 73 120 71 74 fS − Sampling Frequency − MHz 110 72 74 100 90 73 71 80 70 74 72 73 70 60 71 74 69 50 72 74 40 73 69 71 70 30 73 71 70 69 10 20 0 40 68 60 80 67 66 120 100 68 69 72 20 68 70 67 64 65 140 160 66 65 62 63 180 200 220 fIN − Input Frequency − MHz 62 64 66 68 70 72 74 SNR − dBc Figure 30. 120 88 91 76 88 110 fS − Sampling Frequency − MHz 79 82 85 85 91 94 100 73 67 82 79 85 91 90 94 91 94 80 94 94 94 70 73 76 70 67 88 82 94 85 94 60 64 70 79 91 94 94 94 94 91 94 91 85 82 79 94 91 40 60 64 80 100 120 140 61 70 73 76 85 10 20 67 70 91 94 20 0 73 94 40 30 76 88 50 160 180 200 220 fIN − Input Frequency − MHz 60 65 70 75 80 85 90 SFDR − dBc Figure 31. 15 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 EQUIVALENT CIRCUITS AVDD AIN BUF T/H AVDD 500 Ω BUF VREF AVDD VREF − Bandgap 1.2 kΩ 500 Ω AIN 25 Ω + BUF 1.2 kΩ T/H Figure 35. Reference Figure 32. Analog Input DRVDD AVDD − DAC Bandgap + IOUTP IOUTM C1, C2 Figure 33. Digital Output Figure 36. Decoupling Pin AVDD DRVDD 10 kΩ CLK 1 kΩ Clock Buffer DMID Bandgap AVDD 1 kΩ 10 kΩ CLK Figure 34. Clock Input 16 Figure 37. DMID Generation www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 APPLICATION INFORMATION THEORY OF OPERATION The ADS5424 is a 14 bit, 105 MSPS, monolithic pipeline analog to digital converter. Its bipolar analog core operates from a 5 V supply, while the output uses 3.3 V supply for compatibility with the CMOS family. The conversion process is initiated by the rising edge of the external input clock. At that instant, the differential input signal is captured by the input track and hold (T&H) and the input sample is sequentially converted by a series of small resolution stages, with the outputs combined in a digital correction logic block. Both the rising and the falling clock edges are used to propagate the sample through the pipeline every half clock cycle. This process results in a data latency of three clock cycles, after which the output data is available as a 14 bit parallel word, coded in binary two’s complement format. INPUT CONFIGURATION The analog input for the ADS5424 (see Figure 32) consists of an analog differential buffer followed by a bipolar track-and-hold. The analog buffer isolates the source driving the input of the ADC from any internal switching. The input common mode is set internally through a 500 Ω resistor connected from 2.4 V to each of the inputs. This results in a differential input impedance of 1 kΩ. of 2.2 VPP. The maximum swing is determined by the internal reference voltage generator eliminating any external circuitry for this purpose. The ADS5424 obtains optimum performance when the analog inputs are driven differentially. The circuit in Figure 38 shows one possible configuration using an RF transformer with termination either on the primary or on the secondary of the transformer. If voltage gain is required a step up transformer can be used. For higher gains that would require impractical higher turn ratios on the transformer, a single-ended amplifier driving the transformer can be used (see Figure 39). Another circuit optimized for performance would be the one on Figure 40, using the THS4304 or the OPA695. Texas Instruments has shown excellent performance on this configuration up to 10 dB gain with the THS4304 and at 14 dB gain with the OPA695. For the best performance, they need to be configured differentially after the transformer (as shown) or in inverting mode for the OPA695 (see SBAA113); otherwise, HD2 from the op amps limits the useful frequency. R0 50W VIN AIN 1:1 R 50W AC Signal Source For a full-scale differential input, each of the differential lines of the input signal (pins 11 and 12) swings symmetrically between 2.4 +0.55 V and 2.4 –0.55 V. This means that each input is driven with a signal of up to 2.4 ±0.55 V, so that each input has a maximum signal swing of 1.1 VPP for a total differential input signal swing 5V Z0 50W ADS5424 AIN ADT1−1WT Figure 38. Converting a Single-Ended Input to a Differential Signal Using RF Transformers −5 V RS 100 Ω + OPA695 − 0.1 µF 1000 µF RIN 1:1 RT 100 Ω RIN AIN CIN ADS5424 AIN R1 400 Ω R2 57.5 Ω AV = 8V/V (18 dB) Figure 39. Using the OPA695 With the ADS5424 17 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 APPLICATION INFORMATION RG RF CM 5V − THS4304 + 1:1 VIN 49.9 Ω CM From 50 Ω Source 5V AIN ADS5424 VREF AIN + THS4304 − RG CM RF CM Figure 40. Using the THS4304 With the ADS5424 Besides these, Texas Instruments offers a wide selection of single-ended operational amplifiers (including the THS3201, THS3202 and OPA847) that can be selected depending on the application. An RF gain block amplifier, such as Texas Instrument’s THS9001, can also be used with an RF transformer for high input frequency applications. For applications requiring dc-coupling with the signal source, instead of using a topology with three single ended amplifiers, a differential input/differential output amplifier like the THS4509 (see Figure 41) can be used, which minimizes board space and reduce number of components. Figure 43 shows their combined SNR and SFDR performance versus frequency with −1 dBFS input signal level and sampling at 80MSPS. On this configuration, the THS4509 amplifier circuit provides 10 dB of gain, converts the single-ended input to differential, and sets the proper input common-mode voltage to the ADS5424. The 225 Ω resistors and 2.7 pF capacitor between the THS4509 outputs and ADS5424 inputs (along with the input capacitance of the ADC) limit the bandwidth of the signal to about 100 MHz (−3 dB). 18 For this test, an Agilent signal generator is used for the signal source. The generator is an ac-coupled 50 Ω source. A band-pass filter is inserted in series with the input to reduce harmonics and noise from the signal source. Input termination is accomplished via the 69.8 Ω resistor and 0.22 µF capacitor to ground in conjunction with the input impedance of the amplifier circuit. A 0.22 µF capacitor and 49.9 Ω resistor is inserted to ground across the 69.8 Ω resistor and 0.22 µF capacitor on the alternate input to balance the circuit. Gain is a function of the source impedance, termination, and 348 Ω feedback resistor. See the THS4509 data sheet for further component values to set proper 50 Ω termination for other common gains. Since the ADS5424 recommended input common-mode voltage is +2.4 V, the THS4509 is operated from a single power supply input with VS+ = +5 V and VS− = 0 V (ground). This maintains maximum headroom on the internal transistors of the THS4509. www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 APPLICATION INFORMATION From VIN 50 Ω Source 348 Ω 100 Ω 69.8 Ω +5V 225 Ω 0.22 µF CM 69.8 Ω 0.22 µF AIN ADS5424 AIN VREF 2.7 pF 225 Ω THS 4509 100 Ω 49.9 Ω 14-Bit 105 MSPS 49.9 Ω 0.22 µF 0.1 µF 348 Ω 0.1 µF Figure 41. Using the THS4509 With the ADS5424 configurations. In low input frequency applications, where jitter may not be a big concern, the use of single-ended clock (see Figure 43) could save some cost and board space without any trade-off in performance. When driven on this configuration, it is best to connect CLKM (pin 11) to ground with a 0.01 µF capacitor, while CLKP is ac-coupled with a 0.01 µF capacitor to the clock source, as shown in Figure 40. Clock Source 0.1 µF 1:4 CLK MA3X71600LCT−ND PERFORMANCE vs INPUT FREQUENCY CLK 95 Figure 44. Differential Clock Nevertheless, for jitter sensitive applications, the use of a differential clock will have some advantages (as with any other ADCs) at the system level. The first advantage is that it allows for common-mode noise rejection at the PCB level. A further analysis (see Clocking High Speed Data Converters, SLYT075) reveals one more advantage. The following formula describes the different contributions to clock jitter: 90 Performance − dB ADS5424 SFDR (dBc) 85 80 SNR (dBFS) 75 70 10 20 30 40 50 60 70 fIN − Input Frequency − MHz Figure 42. Performance vs Input Frequency for the THS4509 + ADS5424 Configuration Square Wave or Sine Wave CLK 0.01 µF ADS5424 CLK 0.01 µF Figure 43. Single-Ended Clock CLOCK INPUTS The ADS5424 clock input can be driven with either a differential clock signal or a single-ended clock input, with little or no difference in performance between both (Jittertotal)2 = (EXT_jitter)2+ (ADC_jitter)2= (EXT_jitter) 2 + (ADC_int)2 + (K/clock_slope)2 The first term would represent the external jitter, coming from the clock source, plus noise added by the system on the clock distribution, up to the ADC. The second term is the ADC contribution, which can be divided in two portions. The first does not depend directly on any external factor. That is the best we can get out of our ADC. The second contribution is a term inversely proportional to the clock slope. The faster the slope, the smaller this term will be. As an example, we could compute the ADC jitter contribution from a sinusoidal input clock of 3 Vpp amplitude and Fs = 80 MSPS: ADC_jitter = sqrt ((150fs)2+ (5 x 10−5/(1.5 x 2 x PI x 80 x 106))2) = 164fs The use of differential clock allows for the use of bigger clock amplitudes without exceeding the absolute maximum ratings. This, on the case of sinusoidal clock, results on higher slew rates which minimizes the impact of the jitter factor inversely proportional to the clock slope. 19 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 APPLICATION INFORMATION Figure 44 shows this approach. The back-to-back Schottky can be added to limit the clock amplitude in cases where this would exceed the absolute maximum ratings, even when using a differential clock. Figure 22 and Figure 23 show the performance versus input clock amplitude for a sinusoidal clock. 100 nF MC100EP16DT 100 nF D D CLK Q VBB Q 499 W 100 nF 100 nF ADS5424 CLK 499 W 50 Ω 50 Ω 100 nF 113 Ω Figure 45. Differential Clock Using PECL Logic Another possibility is the use of a logic based clock, as PECL. In this case, the slew rate of the edges will most likely be much higher than the one obtained for the same clock amplitude based on a sinusoidal clock. This solution would minimize the effect of the slope dependent ADC jitter. Nevertheless, observe that for the ADS5424, this term is small and has been optimized. Using logic gates to square a sinusoidal clock may not produce the best results as logic gates may not have been optimized to act as comparators, adding too much jitter while squaring the inputs. The common-mode voltage of the clock inputs is set internally to 2.4 V using internal 1 kΩ resistors. It is recommended to use an ac coupling, but if for any reason, this scheme is not possible, due to, for instance, asynchronous clocking, the ADS5424 presents a good tolerance to clock common-mode variation (see Figure 20). Additionally, the internal ADC core uses both edges of the clock for the conversion process. This means that, ideally, a 50% duty cycle should be provided. Figure 21 shows the performance variation of the ADC versus clock duty cycle. 20 DIGITAL OUTPUTS The ADC provides 14 data outputs (D13 to D0, with D13 being the MSB and D0 the LSB), a data-ready signal (DRY, pin 52), and an out-of-range indicator (OVR, pin 32) that equals 1 when the output reaches the full-scale limits. The output format is two’s complement. When the input voltage is at negative full scale (around −1.1 V differential), the output will be, from MSB to LSB, 10 0000 0000 0000. Then, as the input voltage is increased, the output switches to 10 0000 0000 0001, 10 0000 0000 0010 and so on until 11 1111 1111 1111 right before mid-scale (when both inputs are tight together if we neglect offset errors). Further increases on input voltage, outputs the word 00 0000 0000 0000, to be followed by 00 0000 0000 0001, 00 0000 0000 0010 and so on until reaching 01 1111 1111 1111 at full-scale input (1.1-V differential). Although the output circuitry of the ADS5424 has been designed to minimize the noise produced by the transients of the data switching, care must be taken when designing the circuitry reading the ADS5424 outputs. Output load capacitance should be minimized by minimizing the load on the output traces, reducing their length and the number of gates connected to them, and by the use of a series resistor with each pin. Typical numbers on the data sheet tables and graphs are obtained with 100 Ω series resistor on each digital output pin, followed by a 74AVC16244 digital buffer as the one used in the evaluation board. POWER SUPPLIES The use of low noise power supplies with adequate decoupling is recommended, being the linear supplies the first choice versus switched ones, which tend to generate more noise components that can be coupled to the ADS5424. www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 APPLICATION INFORMATION The ADS5424 uses two power supplies. For the analog portion of the design, a 5 V AVDD is used, while for the digital outputs supply (DRVDD), we recommend the use of 3.3 V. All the ground pins are marked as GND, although AGND pins and DRGND pins are not tied together inside the package. Customers willing to experiment with different grounding schemes should know that AGND pins are 4, 7, 10, 13, 15, 17, 19, 21, 23, 25, 27, and 29, while DRGND pins are 2, 34, and 42. Nevertheless, we recommend that both grounds are tied together externally, using a common ground plane. That is the case on the production test boards and modules provided to customer for evaluation. In order to obtain the best performance, user should layout the board to guarantee that the digital return currents do not flow under the analog portion of the board. This can be achieved without the need to split the board and just with careful component placing and increasing the number of vias and ground planes. Finally, notice that the metallic heat sink under the package is also connected to analog ground. LAYOUT INFORMATION The evaluation board represents a good guideline of how to layout the board to obtain the maximum performance out of the ADS5424. General design rules as the use of multilayer boards, single ground plane for both, analog and digital ADC ground connections and local decoupling ceramic chip capacitors should be applied. The input traces should be isolated from any external source of interference or noise, including the digital outputs as well as the clock traces. Clock should also be isolated from other signals, especially on applications where low jitter is required, as high IF sampling. Besides performance oriented rules, special care has to be taken when considering the heat dissipation out of the device. The thermal heat sink (octagonal, with 2,5 mm on each side) should be soldered to the board, and provision for more than 16 ground vias should be made. The thermal package information describes the TJA values obtained on the different configurations. 21 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 MECHANICAL DATA Center Power Pad Solder Stencil Stencil Thicknes s X 7.0 0.1m m 6.5 0.127m m 0.152m m 6.0 0.178m m 5.6 22 Opening Y 7.0 6.5 6.0 5.6 www.ti.com SLWS157A − JANUARY 2005 − REVISED MAY 2005 MECHANICAL DATA PJY (S−PQFP−G52) PLASTIC QUAD FLATPACK 23 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. 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