DATA SHEET E.S.D NOISE CLIPPING DIODES NNCD3.3G to NNCD7.5G, NNCD27G ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES (QUARTO TYPE : COMMON ANODE) 5 PIN MINI MOLD PACKAGE DIMENSIONS This product series is a diode developed for E.S.D (Electrostatic Discharge) noise protection. Based on the IEC1000-4-2 test on (in millimeters) electromagnetic interference (EMI), the diode assures an endur0.65 +0.1 –0.15 1.5 external interface circuit protection. With four elements mounted in the 5 PIN Mini Mold Package, the • Based on the electrostatic discharge immunity test (IEC1000-4- 0.95 1.9 FEATURES 1 2), the product assures the minimum endurance of 30 KV. 5 2 0.95 2.9 ± 0.2 product can cope with high density and automatic packaging. 0.32 +0.1 –0.06 2.8 ± 0.2 ance of no less than 30 KV, thus making itself most suitable for • Based on the reference supply of the set, the product achieves 3 4 a series over a wide range (11 product name lined up). automatic packaging. 0.8 1.1 to 1.4 MINI MOLD package, the product can achieve a high density and 0.16 +0.1 –0.06 • With 4 elements mounted (common anode) mounted in the 5 PIN 0 to 0.1 APPLICATIONS • External interface circuit E.S.D protection. • Circuits for Waveform clipper, Surge absorber. (5 PIN mini MOLD) (SC-74A) MAXIMUM RATINGS (TA = 25 ˚C) Power Dissipation P 200 mW (Total) Surge Reverse Power PRSM 85 W (t = 10 µs 1 pulse) Fig. 5 Junction Temperature Tj 150 ˚C Storage Temperature Tstg –55 ˚C to +150 ˚C PIN CONNECTION 5 1 2 3 4 5 1 Document No. D11645EJ1V1DS00 (1st edition) Date Published February 1998 N CP(K) Printed in Japan 4 2 : : : : : K1 A K2 K3 K4 Cathode 1 Anode (common) Cathode 2 Cathode 3 Cathode 4 3 © 1995 1996 NNCD3.3G to NNCD7.5G, NNCD27G ELECTRICAL CHARACTERISTICS (TA = 25 ˚C) (A-K1, A-K2, A-K3, A-K4) Parameter Breakdown Voltage* VBR (V) Dynamic** Impedance Zz (Ω) Reverse Leakage IR (µA) Capacitance Ct (pF) Test Condition E.S.D Voltage (KV) MIN. MAX. IT (mA) MAX. IT (mA) MAX. VR (V) TYP. NNCD3.3G 3.10 3.50 5 130 5 20 1.0 220 30 NNCD3.6G 3.40 3.80 5 130 5 10 1.0 210 30 NNCD3.9G 3.70 4.10 5 130 5 10 1.0 200 30 NNCD4.3G 4.01 4.48 5 130 5 10 1.0 180 30 NNCD4.7G 4.42 4.90 5 130 5 10 1.0 170 NNCD5.1G 4.84 5.37 5 130 5 5 1.5 160 MIN. 30 VR = 0 V f = 1 MHz 30 NNCD5.6G 5.31 5.92 5 80 5 5 2.5 140 30 NNCD6.2G 5.86 6.53 5 50 5 2 3.0 120 30 NNCD6.8G 6.47 7.14 5 30 5 2 3.5 110 30 NNCD7.5G 7.06 7.84 5 30 5 2 4.0 90 30 NNCD27G 25.10 28.90 2 70 2 2 21 25 30 Test Condition C = 150 pF R = 330 Ω (IEC1000 -4-2) 2 * Tested with pulse (40 ms) ** Zz is measured at IT give a small A.C. signal. NNCD3.3G to NNCD7.5G, NNCD27G TYPICAL CHARACTERISTICS (TA = 25 ˚C) Fig. 2 It - VBR CHARACTERISTICS (A-K1, A-K2, A-K3, A-K4) Fig. 1 P - TA RATING 250 NNCD6.8G NNCD7.5G 200 10 m NNCD3.3G NNCD3.6G 150 IT - On state Current - A P - Power Dissipation - mW 100 m 100 50 0 25 50 75 100 125 150 TA - Ambient Temperature - ˚C 1m NNCD3.9G 100 µ 10 µ 1µ 100 n NNCD4.3G 10 n 1n 0 NNCD4.7G NNCD6.2G NNCD5.1G NNCD5.6G 1 2 3 4 5 6 7 8 9 VBR - Breakdown Voltage - V Fig. 3 ZT - IT CHARACTERISTICS 1 000 TYP. NNCD3.9G 100 NNCD4.7G Zz - Ω NNCD5.6G NNCD5.1G 10 NNCD7.5G 1 0.1 1 10 100 IT - On state Current - A 3 10 NNCD3.3G to NNCD7.5G, NNCD27G Fig. 4 TRANSIENT THERMAL IMPEDANCE 1 000 Zth - Transient Thermal Impedance - (˚C/W) 625 ˚C/W 100 NNCD [ ] G 10 1 0.1 1m 10 m 100 m 1 10 100 t - Time - Sec Fig. 5 SURGE REVERSE POWER RATING 10 000 PRSM - Surge Reverse Power - W PRSM TA = 25 ˚C Non-Repetive tT 1 000 100 NNCD [ ] G 10 1 1µ 10 µ 100 µ 1m tT - Pulse Width - Sec 4 10 m 100 m NNCD3.3G to NNCD7.5G, NNCD27G Sample Application Circuits * Set Conecter Micro com. PC (CD ROM) Di Palallel Interface Di Imterface Cable * Set Printer, P.D.C, T.V Game etc 5 NNCD3.3G to NNCD7.5G, NNCD27G REFERENCE Document Name 6 Document No. NEC semiconductor device reliability/quality control system C11745E NEC semiconductor device reliability/quality control system MEI-1201 Quality grade on NEC semiconductor devices C11531E Semiconductor device mounting technology manual C10535E Guide to quality assurance for semiconductor device MEI-1202 NNCD3.3G to NNCD7.5G, NNCD27G [MEMO] 7 NNCD3.3G to NNCD7.5G, NNCD27G [MEMO] No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product. M4 96.5 8