DATA SHEET E.S.D NOISE CLIPPING DIODES NNCD3.3B to NNCD12B ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES (500 mW TYPE) This product series is a diode developed for E.S.D (Electrostatic PACKAGE DIMENSIONS Discharge) noise protection. Based on the IEC1000-4-2 test on (in millimeters) electromagnetic interference (EMI), the diode assures an endurance of no less than 30 kV. φ 0.5 DHD (Double Heatsink Diode) construction having allowable power dissipation of 500 mW. Cathode indication FEATURES • Based on the electrostatic discharge immunity test (IEC1000-4- φ 2.0 MAX. 25 MIN. 2), the product assures the minimum endurance of 30 kV. 4.2 MAX. 25 MIN. Type NNCD2.0B to NNCD12B Series is into DO-35 Package with • Based on the reference supply of the set, the product achieves a series over a wide range (15 product name lined up). • DHD (Double Heatsink Diode) construction. APPLICATIONS • Circuit E.S.D protection. • Circuits for Waveform clipper, Surge absorber. MAXIMUM RATINGS (TA = 25 °C) Power Dissipation P 500 mW Surge Reverse Power PRSM 100 W (tT = 10 µs 1 pulse) Junction Temperature Tj 175 °C Storage Temperature Tstg –65 °C to +175 °C Document No. D11770EJ2V0DS00 (2nd edition) Date Published December 1996 N Printed in Japan Fig. 7 © 1996 NNCD3.3B to NNCD12B ELECTRICAL CHARACTERISTICS (TA = 25 ˚C) Breakdown VoltageNote 1 VBR (V) Type Number Dynamic ImpedanceNote 2 Zz (Ω) Capacitance Ct (pF) TEST CONDITION E.S.D Voltage (kV) MIN. MAX. IT (mA) MAX. IT (mA) MAX. VR (V) TYP. NNCD3.3B 3.16 3.53 20 70 20 20 1.0 240 30 NNCD3.6B 3.47 3.83 20 60 20 10 1.0 230 30 NNCD3.9B 3.77 4.14 20 50 20 5 1.0 220 30 NNCD4.3B 4.05 4.53 20 40 20 5 1.0 210 30 NNCD4.7B 4.47 4.91 20 25 20 5 1.0 190 30 NNCD5.1B 4.85 5.35 20 20 20 5 1.5 160 30 NNCD5.6B 5.29 5.88 20 13 20 5 2.5 140 VR = 0 V f = 1 MHz MIN. C = 150 pF R = 330 Ω 30 (IEC1000 -4-2) 5.81 6.40 20 10 20 5 3.0 120 NNCD6.8B 6.32 6.97 20 8 20 2 3.5 110 30 NNCD7.5B 6.88 7.64 20 8 20 0.5 4.0 90 30 NNCD8.2B 7.56 8.41 20 8 20 0.5 5.0 90 30 NNCD9.1B 8.33 9.29 20 8 20 0.5 6.0 90 30 NNCD10B 9.19 10.3 20 8 20 0.2 7.0 80 30 NNCD11B 10.18 11.26 10 10 10 0.2 8.0 70 30 NNCD12B 11.13 12.30 10 10 10 0.2 9.0 70 30 2. Zz is measured at IT give a small A.C. signal. TEST CONDITION 30 NNCD6.2B Notes 1. Tested with pulse (40 ms) 2 Reverse Leakage IR (µA) NNCD3.3B to NNCD12B TYPICAL CHARACTERISTICS (TA = 25 °C) Fig. 1 POWER DISSIPATION vs. AMBIENT TEMPERATURE Fig. 2 THERMAL RESISTANCE vs. SIZE OF P.C BOARD 600 Rth - Thermal Resistance - °C/W 500 = 5 mm = 10 mm 400 300 10 mm 200 P.C Board 7 mm t = 0.035 mm P.C Board φ 3 mm t = 0.035 mm 100 0 0 20 40 60 500 400 S 300 = 10 mm 200 = 5 mm 100 0 80 100 120 140 160 180 200 Junction to anbient 0 20 Fig. 3 IT - VBR CHARACTERISTICS NNCD5.6B NNCD5.1B 100 m 40 60 80 S - Size of P.C Board - mm TA - Ambient Temperature - °C 100 2 Fig. 4 IT - VBR CHARACTERISTICS TA = 25 °C NNCD6.8B TYP. NNCD6.2B NNCD7.5B NNCD8.2B NNCD3.3B NNCD3.6B 10 m NNCD3.9B NNCD4.3B NNCD4.7B 1m TA = 25 °C TYP. 100 m NNCD11B NNCD12B NNCD10B NNCD9.1B 10 m 1m IT - On State Current - A IT - On State Current - A P - Power Dissipation - mW 600 100 µ 10 µ 1µ 100 µ 10 µ 1µ 100 n 100 n 10 n 10 n 1n 1n 0 1 2 3 4 5 6 7 VBR - Breakdown Voltage - V 8 9 0 7 8 9 10 11 12 13 14 15 VBR - Breakdown Voltage - V 3 NNCD3.3B to NNCD12B Fig. 5 Zz - IT CHARACTERISTICS TA = 25 °C TYP. NNCD3.3B 100 NNCD3.9B NNCD4.7B NN 5B 7. CD 1 0.01 0.1 6B 5. CD NN 10 NN ZZ - Dynamic Impedance - Ω 1 000 CD 10 B 1 10 100 IT - On State Current - mA Fig. 6 TRANSIENT THERMAL IMPEDANCE Zth - Transient Thermal Impedance - °C/W 5 000 1 000 300 °C/W NNCD [ ] B 100 10 5 1m 10 m 100 m 1 10 100 t - Time - s Fig. 7 SURGE REVERSE POWER RATING TA = 25 °C Non-repetitive PRSM PRSM - Surge Reverse Power - W 1 000 tT 100 NNCD [ ] B 10 1 1µ 10 µ 100 µ 1m tT - Pulse Width - s 4 10 m 100 m NNCD3.3B to NNCD12B REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system C11745E NEC semiconductor device reliability/quality control system MEI-1201 Quality grade on NEC semiconductor device C11531E Semiconductor device mounting technology manual C10535E Guide to quality assurance for semiconductor device MEI-1202 5 NNCD3.3B to NNCD12B [MEMO] 6 NNCD3.3B to NNCD12B [MEMO] 7 NNCD3.3B to NNCD12B [MEMO] No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product. M4 96.5 8