OKI MSM5117400B

¡ Semiconductor
MSM5117400B
¡ Semiconductor
MSM5117400B
E2G0035-17-41
4,194,304-Word ¥ 4-Bit DYNAMIC RAM : FAST PAGE MODE TYPE
DESCRIPTION
The MSM5117400B is a 4,194,304-word ¥ 4-bit dynamic RAM fabricated in Oki's silicon-gate CMOS
technology. The MSM5117400B achieves high integration, high-speed operation, and low-power
consumption because Oki manufactures the device in a quadruple-layer polysilicon/double-layer
metal CMOS process. The MSM5117400B is available in a 26/24-pin plastic SOJ or 26/24-pin plastic
TSOP.
FEATURES
• 4,194,304-word ¥ 4-bit configuration
• Single 5 V power supply, ±10% tolerance
• Input
: TTL compatible, low input capacitance
• Output : TTL compatible, 3-state
• Refresh : 2048 cycles/32 ms
• Fast page mode, read modify write capability
• CAS before RAS refresh, hidden refresh, RAS-only refresh capability
• Multi-bit test mode capability
• Package options:
26/24-pin 300 mil plastic SOJ (SOJ26/24-P-300-1.27) (Product : MSM5117400B-xxSJ)
26/24-pin 300 mil plastic TSOP (TSOPII26/24-P-300-1.27-K) (Product : MSM5117400B-xxTS-K)
(TSOPII26/24-P-300-1.27-L) (Product : MSM5117400B-xxTS-L)
xx indicates speed rank.
PRODUCT FAMILY
Family
Access Time (Max.)
tRAC
tAA
tCAC
tOEA
Cycle Time
Power Dissipation
(Min.)
Operating (Max.) Standby (Max.)
MSM5117400B-50
50 ns 25 ns 13 ns 13 ns
90 ns
660 mW
MSM5117400B-60
60 ns 30 ns 15 ns 15 ns
110 ns
605 mW
MSM5117400B-70
70 ns 35 ns 20 ns 20 ns
130 ns
550 mW
5.5 mW
16M
215
,
MSM5117400B
¡ Semiconductor
PIN CONFIGURATION (TOP VIEW)
VCC 1
26 VSS
VCC 1
26 VSS
VSS 26
1 VCC
DQ1 2
25 DQ4
DQ1 2
25 DQ4
DQ4 25
2 DQ1
DQ2 3
24 DQ3
DQ2 3
24 DQ3
DQ3 24
3 DQ2
WE 4
23 CAS
WE 4
23 CAS
CAS 23
4 WE
RAS 5
22 OE
RAS 5
22 OE
OE 22
5 RAS
NC 6
21 A9
NC 6
21 A9
A9 21
6 NC
A10 8
19 A8
A10 8
19 A8
A8 19
8 A10
A0 9
18 A7
A0 9
18 A7
A7 18
9 A0
A1 10
17 A6
A1 10
17 A6
A6 17
10 A1
A2 11
16 A5
A2 11
16 A5
A5 16
11 A2
A3 12
15 A4
A3 12
15 A4
A4 15
12 A3
VCC 13
14 VSS
VCC 13
14 VSS
VSS 14
13 VCC
26/24-Pin Plastic SOJ
26/24-Pin Plastic TSOP
(K Type)
Pin Name
A0 - A10
Note :
16M
216
Function
Address Input
RAS
Row Address Strobe
CAS
Column Address Strobe
DQ1 - DQ4
Data Input/Data Output
OE
26/24-Pin Plastic TSOP
(L Type)
Output Enable
WE
Write Enable
VCC
Power Supply (5 V)
VSS
Ground (0 V)
NC
No Connection
The same power supply voltage must be provided to every VCC pin, and the same GND
voltage level must be provided to every VSS pin.
¡ Semiconductor
MSM5117400B
BLOCK DIAGRAM
RAS
Timing
Generator
Timing
Generator
CAS
11
Column
Address
Buffers
11
Write
Clock
Generator
Column
Decoders
WE
OE
4
Internal
Address
Counter
A0 - A10
Refresh
Control Clock
Sense
Amplifiers
4
I/O
Selector
Row
Address
Buffers
11
Row
Decoders
Word
Drivers
4
4
4
4
11
Output
Buffers
Input
Buffers
DQ1 - DQ4
4
Memory
Cells
VCC
On Chip
VBB Generator
On Chip
IVCC Generator
VSS
16M
217
MSM5117400B
¡ Semiconductor
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
Symbol
Rating
Unit
Voltage on Any Pin Relative to VSS
VIN,VOUT
–0.5 to VCC + 0.5
V
Voltage on VCC Supply Relative to VSS
VCC
–0.5 to 7
V
Short Circuit Output Current
IOS
50
mA
Power Dissipation
PD*
1
W
Operating Temperature
Topr
0 to 70
°C
Storage Temperature
Tstg
–55 to 150
°C
Parameter
*: Ta = 25°C
Recommended Operating Conditions
(Ta = 0°C to 70°C)
Parameter
Power Supply Voltage
Symbol
Min.
Typ.
Max.
Unit
VCC
4.5
5.0
5.5
V
VSS
0
0
0
V
Input High Voltage
VIH
2.4
—
Input Low Voltage
VIL
–0.5*2
—
VCC +
0.5*1
0.8
V
V
Notes : *1. The input voltage is VCC + 2.0 V when the pulse width is less than 20 ns (the pulse width
is with respect to the point at which VCC is applied).
*2. The input voltage is VSS – 2.0 V when the pulse width is less than 20 ns (the pulse width
is with respect to the point at which VSS is applied).
Capacitance
(VCC = 5 V ±10%, Ta = 25°C, f = 1 MHz)
Parameter
Symbol
Typ.
Max.
Unit
Input Capacitance (A0 - A10)
CIN1
—
5
pF
Input Capacitance (RAS, CAS, WE, OE)
CIN2
—
7
pF
Output Capacitance (DQ1 - DQ4)
CI/O
—
7
pF
16M
218
¡ Semiconductor
MSM5117400B
DC Characteristics
Parameter
(VCC = 5 V ±10%, Ta = 0°C to 70°C)
Symbol
Condition
MSM5117400 MSM5117400 MSM5117400
B-50
B-60
B-70
Unit Note
Min.
Max.
Min.
Max.
Min.
Max.
Output High Voltage
VOH IOH = –5.0 mA
2.4
VCC
2.4
VCC
V
VOL IOL = 4.2 mA
0
VCC
0.4
2.4
Output Low Voltage
0
0.4
0
0.4
V
Input Leakage Current
ILI
–10
10
–10
10
–10
10
mA
–10
10
–10
10
–10
10
mA
—
120
—
110
—
100
mA
1, 2
—
2
—
2
—
2
mA
1
—
1
—
1
—
1
—
120
—
110
—
100
mA
1, 2
—
5
—
5
—
5
mA
1
—
120
—
110
—
100
mA
1, 2
—
110
—
100
—
90
mA
1, 3
0 V £ VI £ 6.5 V;
All other pins not
under test = 0 V
Output Leakage Current
ILO
Average Power
Supply Current
ICC1
(Operating)
Power Supply
Current (Standby)
ICC2
Current (Standby)
(CAS before RAS Refresh)
Average Power
Supply Current
(Fast Page Mode)
tRC = Min.
RAS, CAS = VIH
RAS, CAS
RAS cycling,
tRC = Min.
RAS = VIH,
ICC5 CAS = VIL,
DQ = enable
Average Power
Supply Current
RAS, CAS cycling,
ICC3 CAS = VIH,
(RAS-only Refresh)
Power Supply
0 V £ VO £ 5.5 V
≥ VCC –0.2 V
Average Power
Supply Current
DQ disable
ICC6
RAS cycling,
CAS before RAS
RAS = VIL,
ICC7 CAS cycling,
tPC = Min.
Notes : 1. ICC Max. is specified as ICC for output open condition.
2. The address can be changed once or less while RAS = VIL.
3. The address can be changed once or less while CAS = VIH.
16M
219
MSM5117400B
¡ Semiconductor
AC Characteristics (1/2)
(VCC = 5 V ±10%, Ta = 0°C to 70°C) Note 1, 2, 3, 11, 12
Parameter
MSM5117400 MSM5117400 MSM5117400
B-50
B-70
B-60
Unit Note
Min.
Max.
Min.
Max.
Min.
Max.
90
131
—
—
110
130
—
ns
35
—
155
40
—
—
—
185
45
—
—
ns
ns
tPRWC
76
—
85
—
100
—
ns
tRAC
—
50
—
60
—
70
ns
4, 5, 6
Access Time from CAS
tCAC
Access Time from Column Address
Access Time from CAS Precharge
tAA
tCPA
—
—
13
25
—
—
15
30
—
—
20
35
ns
ns
4, 5
4, 6
—
30
—
35
—
40
ns
4
Access Time from OE
Output Low Impedance Time from CAS
tOEA
tCLZ
—
0
13
—
—
0
15
—
—
0
20
—
ns
ns
4
4
CAS to Data Output Buffer Turn-off Delay Time
OE to Data Output Buffer Turn-off Delay Time
Transition Time
Refresh Period
tOFF
tOEZ
tT
tREF
0
0
3
—
13
13
50
32
0
0
3
—
15
15
50
32
0
0
3
—
20
20
50
32
ns
ns
ns
ms
7
RAS Precharge Time
tRP
30
—
40
—
50
—
ns
RAS Pulse Width
tRAS
50
10,000
60
10,000
70
10,000
ns
RAS Pulse Width (Fast Page Mode)
tRASP
50
100,000
60
100,000
70
100,000
ns
RAS Hold Time
RAS Hold Time referenced to OE
tRSH
tROH
13
13
—
—
15
15
—
—
20
20
—
—
ns
ns
CAS Precharge Time (Fast Page Mode)
tCP
7
—
10
—
10
—
ns
CAS Pulse Width
tCAS
13
10,000
15
10,000
20
10,000
ns
CAS Hold Time
CAS to RAS Precharge Time
tCSH
tCRP
50
5
—
60
5
—
ns
—
70
5
—
—
—
ns
RAS Hold Time from CAS Precharge
tRHCP
tRCD
tRAD
30
17
12
—
37
25
35
20
15
—
45
30
40
20
15
—
50
35
ns
ns
ns
Row Address Set-up Time
tASR
0
—
0
—
0
—
ns
Row Address Hold Time
tRAH
7
—
10
—
10
—
ns
Column Address Set-up Time
tASC
0
—
0
—
0
—
ns
Column Address Hold Time
Column Address to RAS Lead Time
tCAH
tRAL
7
25
—
—
15
30
—
—
15
35
—
—
ns
ns
Read Command Set-up Time
tRCS
0
—
0
—
0
—
ns
Read Command Hold Time
tRCH
0
—
0
—
0
—
ns
8
Read Command Hold Time referenced to RAS
tRRH
0
—
0
—
0
—
ns
8
Random Read or Write Cycle Time
Read Modify Write Cycle Time
Fast Page Mode Cycle Time
Fast Page Mode Read Modify Write
Cycle Time
Access Time from RAS
RAS to CAS Delay Time
RAS to Column Address Delay Time
16M
Symbol
220
tRC
tRWC
tPC
7
3
5
6
¡ Semiconductor
MSM5117400B
AC Characteristics (2/2)
(VCC = 5 V ±10%, Ta = 0°C to 70°C) Note 1, 2, 3, 11, 12
Parameter
Symbol
MSM5117400 MSM5117400 MSM5117400
B-50
B-60
B-70
Unit Note
Min. Max.
Min.
Max.
Min.
Max.
Write Command Set-up Time
tWCS
0
—
0
—
0
—
ns
Write Command Hold Time
tWCH
7
—
10
—
15
—
ns
Write Command Pulse Width
OE Command Hold Time
tWP
tOEH
7
13
—
—
10
15
—
—
10
20
—
—
ns
ns
Write Command to RAS Lead Time
tRWL
tCWL
13
13
—
—
15
—
ns
—
20
20
—
15
—
ns
tDS
0
7
13
—
—
—
0
10
15
—
—
—
0
15
20
—
—
—
10
10
—
—
—
40
55
—
—
50
65
—
—
85
—
100
—
ns
ns
ns
ns
ns
ns
9
Write Command to CAS Lead Time
Data-in Set-up Time
Data-in Hold Time
OE to Data-in Delay Time
CAS to WE Delay Time
Column Address to WE Delay Time
tCWD
tAWD
RAS to WE Delay Time
tRWD
36
48
73
CAS Precharge WE Delay Time
tDH
tOED
tCPWD
53
—
60
—
70
—
ns
CAS Active Delay Time from RAS Precharge
tRPC
5
—
5
—
5
—
ns
RAS to CAS Set-up Time (CAS before RAS)
RAS to CAS Hold Time (CAS before RAS)
WE to RAS Precharge Time (CAS before RAS)
WE Hold Time from RAS (CAS before RAS)
RAS to WE Set-up Time (Test Mode)
RAS to WE Hold Time (Test Mode)
tCSR
tCHR
tWRP
10
10
10
10
—
—
—
10
10
10
10
—
—
—
—
10
10
10
10
—
—
—
ns
ns
ns
ns
10
10
—
—
10
10
tWRH
tWTS
tWTH
10
10
—
—
—
—
—
—
9
9
9
9
ns
ns
16M
221
MSM5117400B
Notes:
¡ Semiconductor
1. A start-up delay of 200 µs is required after power-up, followed by a minimum of eight
initialization cycles (RAS-only refresh or CAS before RAS refresh) before proper device
operation is achieved.
2. The AC characteristics assume tT = 5 ns.
3. VIH (Min.) and VIL (Max.) are reference levels for measuring input timing signals.
Transition times (tT) are measured between VIH and VIL.
4. This parameter is measured with a load circuit equivalent to 2 TTL loads and 100 pF.
5. Operation within the tRCD (Max.) limit ensures that tRAC (Max.) can be met.
tRCD (Max.) is specified as a reference point only. If tRCD is greater than the specified
tRCD (Max.) limit, then the access time is controlled by tCAC.
6. Operation within the tRAD (Max.) limit ensures that tRAC (Max.) can be met.
tRAD (Max.) is specified as a reference point only. If tRAD is greater than the specified
tRAD (Max.) limit, then the access time is controlled by tAA.
7. tOFF (Max.) and tOEZ (Max.) define the time at which the output achieves the open
circuit condition and are not referenced to output voltage levels.
8. tRCH or tRRH must be satisfied for a read cycle.
9. tWCS, tCWD, tRWD, tAWD and tCPWD are not restrictive operating parameters. They are
included in the data sheet as electrical characteristics only. If tWCS ≥ tWCS (Min.), then
the cycle is an early write cycle and the data out will remain open circuit (high
impedance) throughout the entire cycle. If tCWD ≥ tCWD (Min.) , tRWD ≥ tRWD (Min.),
tAWD ≥ tAWD (Min.) and tCPWD ≥ tCPWD (Min.), then the cycle is a read modify write
cycle and data out will contain data read from the selected cell; if neither of the above
sets of conditions is satisfied, then the condition of the data out (at access time) is
indeterminate.
10. These parameters are referenced to the CAS leading edge in an early write cycle, and
to the WE leading edge in an OE control write cycle, or a read modify write cycle.
11. The test mode is initiated by performing a WE and CAS before RAS refresh cycle.
This mode is latched and remains in effect until the exit cycle is generated. In a test mode
CA0 and CA1 are not used and each DQ pin now accesses 4-bit locations. Since all 4 DQ
pins are used, a total of 16 data bits can be written in parallel into the memory array.
In a read cycle, if 4 data bits are equal, the DQ pin will indicate a high level. If the 4 data
bits are not equal, the DQ pin will indicate a low level. The test mode is cleared and the
memory device returned to its normal operating state by performing a RAS-only
refresh cycle or a CAS before RAS refresh cycle.
16M
12. In a test mode read cycle, the value of access time parameters is delayed for 5 ns for the
specified value. These parameters should be specified in test mode cycle by adding the
above value to the specified value in this data sheet.
See ADDENDUM F for AC Timing Waveforms
222