SEME-LAB 2N3209DCSM

SEME
2N3209DCSM
LAB
DUAL HIGH SPEED, MEDIUM POWER
PNP GENERAL PURPOSE TRANSISTOR
IN A HERMETICALLY SEALED
CERAMIC SURFACE MOUNT PACKAGE
MECHANICAL DATA
Dimensions in mm (inches)
FEATURES
3
1
4
A
6
5
6.22 ± 0.13
(0.245 ± 0.005)
0.23 rad.
(0.009)
A=
1.27 ± 0.13
(0.05 ± 0.005)
LCC2 PACKAGE
Underside View
PAD 1 - Collector 1
PAD 2 - Base 1
PAD 3 - Base 2
PAD 4 - Collector 2
PAD 5 - Emitter 2
PAD 6 - Emitter 1
4.32 ± 0.13
(0.170 ± 0.005)
2
• SILICON PLANAR EPITAXIAL DUAL PNP
TRANSISTOR
1.40 ± 0.15
(0.055 ± 0.006)
1.65 ± 0.13
(0.065 ± 0.005)
0.64 ± 0.08
(0.025 ± 0.003)
2.54 ± 0.13
(0.10 ± 0.005)
2.29 ± 0.20
(0.09 ± 0.008)
• HERMETIC CERAMIC SURFACE MOUNT
PACKAGE
• CECC SCREENING OPTIONS AVAILABLE
• SPACE QUALITY LEVELS OPTIONS
• HIGH SPEED SATURATED SWITCHING
APPLICATIONS:
For high reliablitity general purpose
applications requiring small size and low
weight devices.
ABSOLUTE MAXIMUM RATINGS(Tcase = 25°C unless otherwise stated) PER SIDE
VCBO
VCEO
VEBO
IC
PD
PD
Rja
Tj
Tstg
Semelab plc.
Collector – Base Voltage
Collector – Emitter Voltage
Emitter – Base Voltage
Collector Current
Device Dissipation
Derate above 50°C
Thermal Resistance Junction to Ambient
Max Junction Temperature
Storage Temperature
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: [email protected]
Website: http://www.semelab.co.uk
TOTAL
–20V
–20V
–4V
–200mA
300mW
500mW
2mW / °C
3.3mW / °C
420°C / W
250°C / W
200°C
–65 to 200°C
Prelim. 2/00
SEME
2N3209DCSM
LAB
ELECTRICAL CHARACTERISTICS (Tcase = 25°C unless otherwise stated)
Parameter
Test Conditions
Min.
Typ.
Max. Unit
VCEO(sus)*
Collector – Emitter Sustaining Voltage
IC = 10mA
-20
V
V(BR)CBO*
Collector – Base Breakdown Voltage
IC = 10mA
-20
V
V(BR)EBO*
Emitter – Base Breakdown Voltage
IE = 10mA
IC = 0
-4
V
VCE = 10V
VBE = 0
VCE = 10V
VBE = 0
ICES*
Collector Cut-off Current
TC = 125°C
VCE(sat)*
VBE(sat)*
hFE*
Collector – Emitter Saturation Voltage
Base – Emitter Saturation Voltage
DC Current Gain
80
nA
10
m
IC = 10mA
IB = 1mA
0.15
IC = 30mA
IB = 3mA
0.20
IC = 100mA
IB = 10mA
0.60
IC = 10mA
IB = 1mA
0.78
0.98
IC = 30mA
IB = 3mA
0.85
1.2
IC = 100mA
IB = 10mA
IC = 10mA
VCE = 0.3V
25
IC = 30mA
VCE = 0.5V
30
IC = 100mA
VCE = 1V
15
VCE = 0.5V
12
Tamb = –55°C IC = 30mA
A
V
V
1.7
120
—
* Pulse test tp = 300ms , d £ 2%
DYNAMIC CHARACTERISTICS (Tcase = 25°C unless otherwise stated)
Parameter
Test Conditions
Min.
Typ.
Max. Unit
fT
Transition Frequency
IC = 30mA
VCE = 10V
f = 100MHz
400
MHz
CEBO
Capacitance
VEB = 0.5V
IC = 0
f = 1.0MHz
6.0
pF
CCBO
Input Capacitance
VCB = 5V
IE = 0
f = 1.0MHz
5.0
pF
ELECTRICAL CHARACTERISTICS (Tcase = 25°C unless otherwise stated)
Parameter
ton
Turn-on Time
toff
Turn-off Time
Semelab plc.
Test Conditions
VCC = 2V
IC = 30mA
VCC = 2V
IB1 = 1.5mA
IC = 30mA
IB1 = IB2 = 1.5mA
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: [email protected]
Website: http://www.semelab.co.uk
Min.
Typ.
Max. Unit
60
ns
90
ns
Prelim. 2/00