TI ISO7421M

ISO7421, ISO7421M
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Low-Power Dual Digital Isolators
FEATURES
APPLICATIONS
• Highest Signaling Rate: up to 250 Mbps
• Low Power Consumption, Typical ICC per
Channel:
– 2.2 mA at 25 Mbps, 4.2 mA at 100 Mbps
• Very Low Propagation Delay – 9 ns Typ. and
Very Low Skew – 300 ps Typ.
• Widest TA Range Specified: –55°C to 125°C
• 4 kVpeak Maximum Isolation, 2.5 kVrms per UL
1577, IEC/VDE and CSA Approved, IEC
60950-1, IEC 61010-1 End Equipment
Standards Approved. All Approvals Pending.
• 50 kV/µs Transient Immunity, Typical
• Over 25-Year Isolation Integrity at Rated
Voltage
• Operates From 3-V to 5.5-V Supply and Logic
Levels
•
1
2
Optocoupler Replacement in:
– Industrial Fieldbus
– Profibus
– Modbus
– DeviceNet™ Data Buses
– Servo Control Interface
– Motor Control
– Power Supplies
– Battery Packs
DESCRIPTION
The ISO7421 and ISO7421M provide galvanic isolation up to 2.5 kVrms for 1 minute per UL. These digital
isolators have two isolated channels with bidirectional channel configuration. Each isolation channel has a logic
input and output buffer separated by a silicon dioxide (SiO2) insulation barrier. Used in conjunction with isolated
power supplies, these devices prevent noise currents on a data bus or other circuit from entering the local
ground and interfering with or damaging sensitive circuitry.
The devices have TTL input thresholds and require two supply voltages from 3 V to 5.5 V, or any combination.
All inputs are 5-V tolerant when supplied from a 3-V supply.
VCC1
1
OUTA
2
INB
3
GND1
4
Isolation
ISO7421
D Package
(Top View)
8
VCC2
7
INA
6
OUTB
5
GND2
P0066-08
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
DeviceNet is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009, Texas Instruments Incorporated
ISO7421, ISO7421M
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
TERMINAL FUNCTIONS
TERMINAL
NAME
I/O
NO.
DESCRIPTION
INA
7
I
Input, channel A
INB
3
I
Input, channel B
GND1
4
–
Ground connection for VCC1
GND2
5
–
Ground connection for VCC2
OUTA
2
O
Output, channel A
OUTB
6
O
Output, channel B
VCC1
1
–
Power supply, VCC1
VCC2
8
–
Power supply, VCC2
FUNCTION TABLE (1)
INPUT SIDE
VCC
OUTPUT SIDE
VCC
PU
PU
PD
(1)
PU
INPUT
IN
OUTPUT
OUT
H
H
L
L
Open
H
X
H
PU = Powered up (VCC ≥ 3 V); PD = Powered down (VCC ≤ 2.4 V);
X = Irrelevant; H = High level; L = Low level
AVAILABLE OPTIONS
PRODUCT
RATED
ISOLATION
INPUT
THRESHOLD
PACKAGE
ISO7421
RATED TA
CHANNEL
DIRECTION
–40°C to 105°C
2.5 kVrms
D-8
ISO7421M
(PREVIEW)
~1.5 V (TTL)
(CMOS compatible)
MARKED
AS
IS7421
Opposite
directions
–55°C to 125°C
ORDERING
NUMBER
ISO7421D (rail)
ISO7421DR (reel)
ISO7421MD (rail)
I7421M
ISO7421MDR
(reel)
ABSOLUTE MAXIMUM RATINGS (1)
VALUE
VCC
Supply voltage (2), VCC1, VCC2
–0.5 V to 6 V
VI
Voltage at IN, OUT
–0.5 V to 6 V
IO
Output current
ESD
Electrostatic
discharge
±15 mA
Human-body model
JEDEC Standard 22, Test Method A114-C.01
Field-induced charged-device
model
JEDEC Standard 22, Test Method C101
Machine model
ANSI/ESDS5.2-1996
TJ(Max) Maximum junction temperature
(1)
(2)
2
±4 kV
All pins
±1.5 kV
±200 V
150°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values except differential I/O bus voltages are with respect to network ground terminal and are peak voltage values.
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RECOMMENDED OPERATING CONDITIONS
MIN
TYP MAX
3
5.5
VCC1, VCC2
Supply voltage
IOH
High-level output current
IOL
Low-level output current
–4
VIH
High-level input voltage
2
VCC
VIL
Low-level input voltage
0
0.8
TJ
Junction temperature
–55
136
4
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UNIT
V
mA
V
°C
3
ISO7421, ISO7421M
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ELECTRICAL CHARACTERISTICS
VCC1 and VCC2 at 5 V ±10%; TA = –55°C to 125°C for ISO7421M, TA = –40°C to 105°C for ISO7421
PARAMETER
VOH
High-level output voltage
VOL
Low-level output voltage
MIN
TYP
IOH = –4 mA; see Figure 1.
TEST CONDITIONS
VCC – 0.8
4.6
IOH = –20 µA; see Figure 1.
VCC – 0.1
5
MAX
V
IOL = 4 mA; see Figure 1.
0.2
0.4
IOL = 20 µA; see Figure 1.
0
0.1
VI(HYS) Input threshold voltage hysteresis
400
IIH
High-level input current
IIL
Low-level input current
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient immunity
VI = VCC or 0 V; see Figure 3.
µA
µA
–10
25
V
mV
10
IN from 0 V or VCC
UNIT
1.2
pF
50
kV/µs
SUPPLY CURRENT
Quiescent
ICC1
Supply current for VCC1
ICC2
Supply current for VCC2
2
3
3.5
5
7.5
11
200 Mbps
12
17
Quiescent
2
3
25 Mbps
100 Mbps
25 Mbps
100 Mbps
VI = VCC or 0 V, no load
VI = VCC or 0 V, no load
200 Mbps
3.5
5
7.5
11
12
17
mA
mA
SWITCHING CHARACTERISTICS
VCC1 and VCC2 at 5 V ±10%; TA = –55°C to 125°C for ISO7421M, TA = –40°C to 105°C for ISO7421
PARAMETER
tPLH, tPHL
PWD
(1)
TEST CONDITIONS
Propagation delay time
MIN
See Figure 1.
Pulse duration distortion |tPHL – tPLH|
TYP
MAX
9
12
ns
0.3
1.5
ns
2
ns
1.6
ns
tsk(pp)
Part-to-part skew time
tsk(o)
Channel-to-channel output skew time
tr
Output signal rise time
tf
Output signal fall time
tfs
Fail-safe output delay time from input power loss
tui
Input pulse duration
5
4
1 / tui
Signaling rate
0
250
(1)
4
See Figure 1.
1
See Figure 2.
UNIT
ns
1
ns
6
µs
ns
200
Mbps
Also known as pulse skew.
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ELECTRICAL CHARACTERISTICS
VCC1 at 5 V ±10%, VCC2 at 3.3 V ±10%; TA = –55°C to 125°C for ISO7421M, TA = –40°C to 105°C for ISO7421
PARAMETER
VOH
TEST CONDITIONS
IOH = –4 mA;
see Figure 1.
High-level output voltage
ISO7421 (5-V side)
MIN
TYP
MAX
UNIT
VCC – 0.8
V
IOH = –20 µA; see Figure 1.
VCC – 0.1
IOL = 4 mA; see Figure 1.
0.4
IOL = 20 µA; see Figure 1.
0.1
VOL
Low-level output voltage
VI(HYS)
Input threshold voltage hysteresis
IIH
High-level input current
IIL
Low-level input current
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient immunity
VI = VCC or 0 V; see Figure 3.
400
mV
10
IN from 0 V or VCC
µA
µA
–10
25
V
1.2
pF
40
kV/µs
SUPPLY CURRENT
Quiescent
ICC1
25 Mbps
Supply current for VCC1
ICC2
3
3.5
5
7.5
11
200 Mbps
12
17
Quiescent
1.5
2.5
25 Mbps
2.2
3.5
4.2
6
7.2
9
100 Mbps
Supply current for VCC2
2
100 Mbps
VI = VCC or 0 V, no load
VI = VCC or 0 V, no load
200 Mbps
mA
mA
SWITCHING CHARACTERISTICS
VCC1 at 5 V ±10%, VCC2 at 3.3 V ±10%; TA = –55°C to 125°C for ISO7421M, TA = –40°C to 105°C for ISO7421
PARAMETER
TEST CONDITIONS
tPLH, tPHL
Propagation delay time
PWD (1)
Pulse duration distortion |tPHL – tPLH|
tsk(pp)
Part-to-part skew time
tsk(o)
Channel-to-channel output skew time
tr
Output signal rise time
tf
Output signal fall time
tfs
Fail-safe output delay time from input power loss
tui
Input pulse duration
1 / tui
Signaling rate
(1)
MIN
See Figure 1.
See Figure 1.
TYP
MAX
10
15
ns
0.5
2
ns
3
ns
2
ns
2
See Figure 2.
UNIT
ns
2
ns
6
µs
10
5
0
200
ns
100
Mbps
Also known as pulse skew.
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ELECTRICAL CHARACTERISTICS
VCC1 at 3.3 V ±10%, VCC2 at 5 V ±10%; TA = –55°C to 125°C for ISO7421M, TA = –40°C to 105°C for ISO7421
PARAMETER
VOH
TEST CONDITIONS
IOH = –4 mA;
see Figure 1.
High-level output voltage
ISO7421 (3.3-V side)
IOH = –20 µA; see Figure 1.
MIN
TYP
VCC – 0.4
Low-level output voltage
VI(HYS)
Input threshold voltage hysteresis
IIH
High-level input current
IIL
Low-level input current
V
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient immunity
VI = VCC or 0 V; see Figure 3.
0.4
IOL = 20 µA; see Figure 1.
0
0.1
400
µA
µA
–10
25
V
mV
10
IN from 0 V or VCC
UNIT
VCC – 0.1
IOL = 4 mA; see Figure 1.
VOL
MAX
1
pF
40
kV/µs
SUPPLY CURRENT
Quiescent
ICC1
25 Mbps
Supply current for VCC1
100 Mbps
VI = VCC or 0 V, no load
200 Mbps
1.5
2.5
2.2
3.5
4.2
6
7.2
9
2
3
Quiescent
ICC2
25 Mbps
Supply current for VCC2
100 Mbps
VI = VCC or 0 V, no load
200 Mbps
3.5
5
7.5
11
12
17
mA
mA
SWITCHING CHARACTERISTICS
VCC1 at 3.3 V ±10%, VCC2 at 5 V ±10%, TA = –55°C to 125°C for ISO7421M, TA = –40°C to 105°C for ISO7421
PARAMETER
TEST CONDITIONS
tPLH, tPHL
Propagation delay time
PWD (1)
Pulse duration distortion |tPHL – tPLH|
tsk(pp)
Part-to-part skew time
tsk(o)
Channel-to-channel output skew time
tr
Output signal rise time
tf
Output signal fall time
tfs
Fail-safe output delay time from input power loss
tui
Input pulse duration
1 / tui
Signaling rate
(1)
6
MIN
See Figure 1.
See Figure 1.
TYP
MAX
10
15
ns
0.5
2
ns
3
ns
2
ns
2
See Figure 2.
UNIT
ns
2
ns
6
µs
10
5
0
200
ns
100
Mbps
Also known as pulse skew.
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ELECTRICAL CHARACTERISTICS
VCC1 and VCC2 at 3.3 V ±10%, TA = –55°C to 125°C for ISO7421M, TA = –40°C to 105°C for ISO7421
PARAMETER
TEST CONDITIONS
VOH
High-level output voltage
VOL
Low-level output voltage
MIN
TYP
IOH = –4 mA; see Figure 1.
VCC – 0.4
3
IOH = –20 µA; see Figure 1.
VCC – 0.1
3.3
MAX
V
IOL = 4 mA; see Figure 1.
0.2
0.4
IOL = 20 µA; see Figure 1.
0
0.1
VI(HYS) Input threshold voltage hysteresis
400
IIH
High-level input current
IIL
Low-level input current
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient
immunity
VI = VCC or 0 V; see Figure 3.
µA
µA
–10
25
V
mV
10
IN from 0 V or VCC
UNIT
1
pF
40
kV/µs
SUPPLY CURRENT
Quiescent
ICC1
Supply current for VCC1
ICC2
Supply current for VCC2
1.5
2.5
2.2
3.5
4.2
6
200 Mbps
7.2
9
Quiescent
1.5
2.5
25 Mbps
2.2
3.5
4.2
6
7.2
9
25 Mbps
100 Mbps
100 Mbps
VI = VCC or 0 V, no load
VI = VCC or 0 V, no load
200 Mbps
mA
mA
SWITCHING CHARACTERISTICS
VCC1 and VCC2 at 3.3 V ± 10%, TA = –55°C to 125°C for ISO7421M, TA = –40°C to 105°C for ISO7421
PARAMETER
TEST CONDITIONS
tPLH, tPHL
Propagation delay time
PWD (1)
Pulse duration distortion |tPHL – tPLH|
tsk(pp)
Part-to-part skew time
tsk(o)
Channel-to-channel output skew time
tr
Output signal rise time
tf
Output signal fall time
tfs
Fail-safe output delay time from input power loss
tui
Input pulse duration
1 / tui
Signaling rate
(1)
MIN
See Figure 1.
TYP
MAX
12
18
ns
1
3
ns
4
ns
3.5
ns
2
See Figure 1.
See Figure 2.
UNIT
ns
2
ns
6
µs
10
5
0
200
ns
100
Mbps
Also known as pulse skew.
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Isolation Barrier
PARAMETER MEASUREMENT INFORMATION
IN
Input
Generator
(1)
50 W
VI
VCC1
VI
OUT
1.4 V
1.4 V
0V
tPLH
(2)
VO
tPHL
CL
90%
10%
VCC/2
VO
VCC/2
VOH
VOL
tr
tf
S0412-01
(1)
The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle,
tr ≤ 3 ns, tf ≤ 3 ns, ZO = 50 Ω.
(2)
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 1. Switching Characteristic Test Circuit and Voltage Waveforms
VI
VCC1
VCC1
Isolation Barrier
0 V IN
or
VCC1
VI
2.7 V
0V
OUT
tfs
VO
VOH
50%
VO
(1)
CL
Fail-Safe HIGH
VOL
S0413-01
(1)
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 2. Fail-Safe Output Delay-Time Test Circuit and Voltage Waveforms
S1
C = 0.1 mF ±1%
Isolation Barrier
VCC1
IN
GND1
VCC2
C = 0.1 mF ±1%
Pass-fail criteria –
output must remain
stable.
OUT
+
VOH or VOL
GND2
(1)
–
+ VCM –
S0414-01
(1)
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 3. Common-Mode Transient Immunity Test Circuit
8
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DEVICE INFORMATION
PACKAGE CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
L(I01)
Minimum air gap (clearance)
Shortest terminal-to-terminal distance through air
4.8
mm
L(I02)
Minimum external tracking
(creepage)
Shortest terminal-to-terminal distance across the
package surface
4.3
mm
CTI
Tracking resistance (comparative
tracking index)
DIN IEC 60112 / VDE 0303 Part 1
>175
V
Minimum internal gap (internal
clearance)
Distance through the insulation
0.008
mm
RIO
Isolation resistance
CIO
Barrier capacitance, input to output
Input to output, VIO = 500 V, all pins on each side of
the barrier tied together creating a two-terminal device,
TA < 100°C
>1012
Input to output
>1011
Ω
1
pF
VI = 0.4 sin (4E6πt)
Ω
NOTE:
Creepage and clearance requirements should be applied according to the specific
equipment isolation standards of an application. Care should be taken to maintain the
creepage and clearance distance of a board design to ensure that the mounting pads
of the isolator on the printed-circuit board do not reduce this distance.
Creepage and clearance on a printed-circuit board become equal according to the
measurement techniques shown in the Isolation Glossary. Techniques such as
inserting grooves and/or ribs on a printed circuit board are used to help increase
these specifications.
INSULATION CHARACTERISTICS (1)
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VIORM
Maximum working insulation voltage
VPR
Input-to-output test voltage
VIOTM
Transient overvoltage
VISO
Isolation voltage per UL
RS
Insulation resistance
t = 1 s (100% production), partial discharge 5 pC
t = 60 s (qualification)
t = 1 s (100% production)
UNIT
560
V
1050
V
4000
V
t = 60 s (qualification)
2500
t = 1 s (100% production)
3000
VIO = 500 V at TS
>109
Pollution degree
(1)
SPECIFICATION
Vrms
Ω
2
Climatic Classification 40/125/21
IEC 60664-1 RATINGS TABLE
PARAMETER
Basic isolation group
Installation classification
TEST CONDITIONS
SPECIFICATION
Material group
III-a
Rated mains voltage ≤ 150 Vrms
I–IV
Rated mains voltage ≤ 300 Vrms
I–III
Rated mains voltage ≤ 400 Vrms
I–II
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REGULATORY INFORMATION
VDE
CSA
UL
Certified according to IEC
60747-5-2
Approved under CSA Component
Acceptance Notice
Recognized under 1577 Component Recognition
Program (1)
File number: pending (40016131)
File number: pending (1698195)
File number: pending (E181974)
(1)
Production tested ≥ 3000 Vrms for 1 second in accordance with UL 1577.
LIFE EXPECTANCY vs WORKING VOLTAGE
Life Expectancy – Years
100
VIORM at 560 V
28 Years
10
0
120
250
500
750
880
1000
VIORM – Working Voltage – V
G001
Figure 4. Life Expectancy vs Working Voltage
IEC SAFETY LIMITING VALUES
Safety limiting intends to prevent potential damage to the isolation barrier upon failure of input or output circuitry. A failure of
the I/O can allow low resistance to ground or the supply and, without current limiting, dissipate sufficient power to overheat
the die and damage the isolation barrier, potentially leading to secondary system failures.
PARAMETER
IS
Safety input, output, or supply
current
TS
Maximum case temperature
TEST CONDITIONS
MIN
TYP
MAX
θJA = 212°C/W, VI = 5.5 V, TJ = 170°C, TA = 25°C
124
θJA = 212°C/W, VI = 3.6 V, TJ = 170°C, TA = 25°C
190
150
UNIT
mA
°C
The safety-limiting constraint is the absolute-maximum junction temperature specified in the Absolute Maximum
Ratings table. The power dissipation and junction-to-air thermal impedance of the device installed in the
application hardware determines the junction temperature. The assumed junction-to-air thermal resistance in the
Thermal Characteristics table is that of a device installed in the JESD51-3, Low-Effective-Thermal-Conductivity
Test Board for Leaded Surface-Mount Packages and is conservative. The power is the recommended maximum
input voltage times the current. The junction temperature is then the ambient temperature plus the power times
the junction-to-air thermal resistance.
PACKAGE THERMAL CHARACTERISTICS
(over recommended operating conditions unless otherwise noted)
PARAMETER
θJA
Junction-to-air thermal resistance
θJB
Junction-to-board thermal resistance
(1)
10
TEST CONDITIONS
MIN
TYP
Low-K thermal resistance (1)
212
High-K thermal resistance (1)
122
MAX
37
UNIT
°C/W
°C/W
Tested in accordance with the low-K or high-K thermal metric definitions of EIA/JESD51-3 for leaded surface mount packages
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(over recommended operating conditions unless otherwise noted)
PARAMETER
θJC
PD
TEST CONDITIONS
MIN
Junction-to-case thermal resistance
TYP
MAX
69.1
VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF,
Input a 150-Mbps 50% duty-cycle square wave
Device power dissipation
UNIT
°C/W
390
mW
200
Safety Limiting Current − mA
180
VCC1, VCC2 at 3.6 V
160
140
VCC1, VCC2 at 5.5 V
120
100
80
60
40
20
0
0
50
100
150
200
TC − Case Temperature − °C
G002
Figure 5. θJC Thermal Derating Curve per IEC 60747-5-2
VCC1
VCC2
2 mm
2 mm
max.
max.
ISO7421
from
from
VCC1
VCC2
1
8
OUTA
INA
2
7
INB
OUTB
3
6
4
5
0.1mF
OUTPUT
INPUT
0.1mF
INPUT
OUTPUT
GND1
GND2
S0417-01
Figure 6. Typical ISO7421 Application Circuit
Input
VCC1
VCC1
VCC1
Output
VCC2
1 MW
8W
500 W
IN
OUT
13 W
S0422-01
Figure 7. Device I/O Schematics
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TYPICAL CHARACTERISTICS
SUPPLY CURRENT
vs
SIGNAL RATE (ALL CHANNELS)
PROPAGATION DELAY TIME
vs
FREE-AIR TEMPERATURE
14
CL = 15 pF
TA = 25°C
18
16
tpd − Propagation Delay Time − ns
ICC1, ICC2 − Supply Current − mA
20
14
VCC1, VCC2 at 5 V
12
10
8
6
VCC1, VCC2 at 3.3 V
4
2
0
0
20
40
60
80
8
VCC1, VCC2 at 5 V
6
4
2
−35
−15
25
45
65
85
105
125
G004
Figure 9.
INPUT VOLTAGE SWITCHING THRESHOLD
vs
FREE-AIR TEMPERATURE
FAIL-SAFE VOLTAGE THRESHOLD
vs
FREE-AIR TEMPERATURE
2.62
1.5
VIT+, 5 V
1.4
1.3
VIT+, 3.3 V
1.2
1.1
VIT−, 5 V
1.0
VIT−, 3.3 V
0.9
0.8
−55
−35
−15
5
25
45
65
85
105
TA − Free-Air Temperature − °C
2.61
FS+
2.60
2.59
2.58
2.57
2.56
2.55
FS−
2.54
2.53
2.52
−55
125
−35
−15
5
25
45
65
85
105
TA − Free-Air Temperature − °C
G005
125
G006
Figure 10.
Figure 11.
HIGH-LEVEL OUTPUT CURRENT
vs
HIGH-LEVEL OUTPUT VOLTAGE
LOW-LEVEL OUTPUT CURRENT
vs
LOW-LEVEL OUTPUT VOLTAGE
80
IOL − Low-Level Output Current − mA
0
TA = 25°C
−10
−20
−30
−40
VCC1, VCC2 at 3.3 V
−50
−60
−70
VCC1, VCC2 at 5 V
−80
−90
TA = 25°C
70
60
VCC1, VCC2 at 5 V
50
40
VCC1, VCC2 at 3.3 V
30
20
10
0
0
1
2
3
4
5
VOH − High-Level Output Voltage − V
6
0
1
G007
Figure 12.
12
5
TA − Free-Air Temperature − °C
G003
Fail-Safe Voltage Threshold − V
Input Voltage Switching Threshold − V
10
Figure 8.
1.6
IOH − High-Level Output Current − mA
VCC1, VCC2 at 3.3 V
0
−55
100 120 140 160 180 200
Signal Rate − Mbps
12
2
3
4
VOL − Low-Level Output Voltage − V
5
6
G008
Figure 13.
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Copyright © 2009, Texas Instruments Incorporated
Product Folder Link(s): ISO7421 ISO7421M
ISO7421, ISO7421M
www.ti.com....................................................................................................................................................................................................... SLLS984 – JUNE 2009
TYPICAL CHARACTERISTICS (continued)
Figure 14. Eye Diagram at 250 MBPS, 5-V VCC, Typical
Figure 15. Eye Diagram at 200 MBPS, 5-V VCC, 125°C
Submit Documentation Feedback
Copyright © 2009, Texas Instruments Incorporated
Product Folder Link(s): ISO7421 ISO7421M
13
PACKAGE OPTION ADDENDUM
www.ti.com
29-Oct-2009
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
ISO7421D
ACTIVE
SOIC
D
8
ISO7421DR
ACTIVE
SOIC
D
8
ISO7421MD
PREVIEW
SOIC
D
8
75
TBD
Call TI
Call TI
ISO7421MDR
PREVIEW
SOIC
D
8
2500
TBD
Call TI
Call TI
75
Lead/Ball Finish
MSL Peak Temp (3)
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
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Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
30-Sep-2009
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
ISO7421DR
Package Package Pins
Type Drawing
SOIC
D
8
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
2500
330.0
12.4
Pack Materials-Page 1
6.4
B0
(mm)
K0
(mm)
P1
(mm)
5.2
2.1
8.0
W
Pin1
(mm) Quadrant
12.0
Q1
PACKAGE MATERIALS INFORMATION
www.ti.com
30-Sep-2009
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
ISO7421DR
SOIC
D
8
2500
358.0
335.0
35.0
Pack Materials-Page 2
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