TI TUSB6015IZQER

TUSB6015
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
TUSB6015 USB 2.0 High Speed Peripheral Controller Data Sheet
FEATURES
DESCRIPTION
ƒ
The TUSB6015 is a USB 2.0 HS Peripheral Controller
designed for seamless interface to an external Host
processor through the NOR FLASH-like interface.
USB 2.0 High-Speed (HS) Compliant Peripheral
Controller Core
ƒ
USB-IF TID # 40630005
ƒ
Integrated USB 2.0 PHY
ƒ
NOR FLASH - Like External Host Interface
ƒ
DP/DM lines are high impedance when the device is
not powered
ƒ
Six physical endpoints
ƒ
ƒ
Each endpoint is configurable as IN or OUT
with dedicated 1K buffer
NOR Flash Interface Access modes:
ƒ
Asynchronous 16-bit single access
ƒ
Asynchronous 32-bit single access
ƒ
Asynchronous 16x16 burst access w/ DMA
ƒ
Synchronous 16x16 burst access with DMA
(Max GPMC clock is 65 MHz)
The NOR FLASH-like interface is a 16-bit, multiplexed
address/data, interface with support for synchronous
burst and single asynchronous read/write access.
Configuration registers are accessible via the
asynchronous chip select only; the End Point FIFO’s
are accessible via both the synchronous and
asynchronous chip selects.
The device also has eight user configurable general
purpose I/0 interface pins. The GPIO can be configured
as an interrupt or wakeup source. Some GPIO have
secondary NOR-flash DMA Request functionality.
The device is fully compliant with the Universal Serial
Bus Specification Rev. 2.0.
ƒ
Interrupt on DP/DM line state change for CEA-936-A
detect
ƒ
VBUS MAX Voltage rating will be 6V for USB
Charging
ƒ
RoHS Complaint 80 Terminal BGA MICROSTAR
JUNIOR Package
The ESD protection level is 2KV HBM (JESD22A114D), 500V CDM (JESD22-C101C).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appear at the end of this data sheet.
PRODUCT PREVIEW information concerns products in the
formative or design phase of development. Characteristic data
and other specifications are design goals. Texas Instruments
reserves the right to change or discontinue these products
without notice.
Copyright © 2008, Texas Instruments Incorporated
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1
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
Ordering Information
1
PACKAGED DEVICES
TUSB6015IZQE
3
TUSB6015IZQER•
PACKAGE2
MARKING
ZQE
TUSB6015I
ZQE
TUSB6015I
1
For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI website at www.ti.com.
2
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
3
The tape and reel option is available for TUSB6015IZQE by adding an R suffix.
2
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TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
Device Block Diagram
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3
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
Electrical Characteristics
Absolute Maximum Ratings1
3.3V Supply Voltage, VDDA3P3...................................................................................................-0.5 V to 4.2 V
1.8V Supply Voltage VDD18.........................................................................................................-0.5 V to 2.1 V
1.5V Supply Voltage, VDD15, VDDD1P5, VDDCM1P5, VDDA1P5.............................................-0.5 V to 2.1 V
2
USB VBUS Supply Voltage ............................................................................................................ 0 V to 6.0 V
3
Input voltage, VI, 3.3V USB .................................................................................... -0.5 V to VDDA3P3 + 0.5 V
Output voltage, VO, 3.3V USB.................................................................................. -0.5 V to VDDA3P3 + 0.5 V
Input clamp current, IIK ........................................................................................................................... ±20 mA
Output clamp current, IOK ........................................................................................................................ ±20 mA
Storage temperature range, Tstg ...............................................................................................-65°C to 150°C
Recommended Operating Conditions
PARAMETER
VDDA3P3
Supply voltage for PHY Analog
MIN
TYP
MAX
UNIT
3
3.3
3.6
V
VDD18
Supply voltage for Digital I/O
1.62
1.8
1.98
V
VDD15
VDDD1P5
VDDCM1P5
VDDA1P5
Supply voltage for Digital Core
Supply voltage for PHY Digital
Supply voltage for PHY Common Module
Supply voltage for PHY Analog
1.35
1.5
1.65
V
TA
Operating Temperature
-40
85
°C
TUSB6015I (Industrial grade)
1
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only,
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
2
VBUS can tolerate 6V for the lifetime of the device. It can handle 6.5V for 36 hours.
3
TUSB6015 complies with short circuit withstand and AC stress conditions as described in Chapter 7.1.1 of the USB 2.0 specification.
4
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TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
Electrical Characteristics for the Digital I/O
TA = -30°C - 85°C, VDD18 = 1.8 V ±10%, VSS = 0 V (Unless otherwise noted)
TEST
CONDITIONS
PARAMETER
VI
MIN
TYP
MAX
UNIT
0
VDD18
V
0
VDD18
V
Input voltage
Output voltage
LVCMOS
LVCMOS
VIH
High–level
input voltage
LVCMOS
0.7 x
VDD18
VDD18
V
VIL
Low–level
input voltage
LVCMOS
0
0.3 x
VDD18
V
VOH
High–level
output voltage
LVCMOS
IOH = 8mA
LVCMOS open–drain
IOL = 4mA
0.22 x
VDD18
IOL = 8mA
0.22 x
VDD18
VO
VOL
Low–level output LVCMOS
voltage
LVCMOS
(1.5V_SWEN, 3.3V_SWEN only)
0.8 ×
VDD18
IOL = 100uA
V
10
V
mV
IIH
High–level input
current
LVCMOS
VI = VI max
±1
uA
IIL
Low–level input
current
LVCMOS
VI = VI min
±1
uA
IOZ
Output leakage current (high–Z)
VI = VI max or
VSS
±20
uA
Ci
Input Capacitance (1.8V NOR Interface)
2.43
pF
tr, tf
Input rise/fall time
25
ns
0
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5
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
Vbus - Electrical Characteristics for the Integrated USB 2.0 Transceiver,
TA = -30°C - 85°C,VDD15 = 1.5v±10%, VDD18 = 1.8V ±10%, VDDA1P5 = 1.5 V ±10%,
VDDA3P3 = 3.3 ±10%,VDDD1P5 = 1.5 V ±10%, VDDCM1P5 = 1.5 ±10%, VSS = 0 V (unless
otherwise noted)†
PARAMETER
MIN
TYP
MAX
UNIT
Input Levels
Vbus Input Impedance
360
690
kΩ
Vbus Valid Comparator
4.4
4.75
V
11
uA
Vbus leakage current (when device is powered off)
†Characterization only. Limits approved by design.
6
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TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
DP and DM - Electrical Characteristics for the Integrated USB 2.0 Transceiver
TA = -30°C - 85°C,VDD15 = 1.5v±10%, VDD18 = 1.8V ±10%, VDDA1P5 = 1.5 V ±10%, VDDA3P3 = 3.3
±10%,VDDD1P5 = 1.5, V ±10%, VDDCM1P5 = 1.5 ±10%, VSS = 0 V (unless otherwise noted)†
PARAMETER
MIN
TYP
MAX
UNIT
Input Levels for Full Speed
VDI
VCM
Full–speed differential input threshold
0.2
Input (was differential) common mode range
0.8
2.5
V
150
mV
V
Input Levels for High Speed
V(HSSQ)
High–speed squelch detection threshold (differential signal amplitude)
100
VDI
High–speed differential input threshold voltage
100
CHSLOAD
Capacitance to ground on each line
mV
5.5
pF
0
0.3
V
3.6
V
Output Levels for Full Speed
VOL
Low–level output voltage
VOH
High–level output voltage (driven)
2.8
VO(SE1)
Output voltage on SE1
0.8
VO(CRS)
Output signal crossover voltage
1.3
2
V
V
Output Levels for High Speed
V(HSOI)
High–speed idle level
-10
10
mV
V(HSOH)
High–speed data signaling high
360
440
mV
V(HSOL)
High–speed data signaling low
-10
10
mV
VID(CHIRPJ)
Chirp J level (differential voltage)
700
1100
mV
VID(CHIRPK) Chirp K level (differential voltage)
-900
-500
mV
Driver Characteristics (Full Speed)
tr
Full–speed rise time
4
20
ns
tf
Full–speed fall time
4
20
ns
90%
110%
t(RFM)
Full–speed rise/fall time matching
Driver Characteristics (High Speed)
tr
Rise time (10%-90%)
500
tf
Fall time (10%-90%)
500
ro(HSDRV)
Driver output resistance (serves as a high–speed termination)
40.5
49.5
t(FRFM)
Differential rise and fall time matching
90%
111.11%
479.76
480.24
Mb/s
2.0
V
ps
ps
Ω
Clock Timings
t(HSDRAT)
High–speed data rate
Single-Ended Receiver
VIT+
Positive–going input threshold voltage
VIT-
Negative–going input threshold voltage
0.8
Hysteresis voltage
200
Vhys
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V
500
mV
7
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
DP and DM - Electrical Characteristics for the Integrated USB 2.0 Transceiver (CONT’D)
INPUT LEAKAGE
TEST CONDITION
DP/DM
Measurement taken with pull-up/dn
disabled and device in idle mode
DP/DM Voltage = 0 – VDDA3.3
DP/DM
Measurement taken with pull-up/dn
disabled and device in active mode
DP/DM Voltage = 2V
†Characterization only. Limits approved by design.
1
Typical DP/DM Input Leakage with pull-up/dn disabled and device in active mode
8
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MIN
TYP
-1.3
See
1
Chart
MAX
UNIT
1.3
uA
1.3
uA
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
Power Sequencing Guidelines
Power-On Reset
The system reset function ensures an orderly start-up sequence for the TUSB6015. There is a one active low
external system reset input (RSTn). The reset initializes the Power/Reset/Clock Manager (PRCM) module, which
in turn generates all the internal resets to initialize USB 2.0 PHY Macro and synchronous logic in the core. While
reset is asserted (active low), the dual functional pin is sampled to determine device configuration after reset.
Since TUSB6015 relies on a dual function pin to configure the device during reset, the reset must be sufficiently
long for (external) marginal pull-up/pull-down to achieve the intended levels. Reset pulse duration should be at
least three times actual RC constant time (with typical 22 kOhm marginal pull-up resistor with 50 pF load, reset
pulse should be at least 3.3 µs).
All functional pins remain in same state even after RSTn is de-asserted and stay in that state until internal core
reset is cleared. The internal core reset is held for 16 system clock cycles following low-to-high RSTn transition.
Upon power-on reset, the following must be determined for proper device initialization:
ƒ System reference clock source
Device uses dual-mode pin to determine initial clock input setup. Dual function pin is latched during the reset. After
the reset this terminal assumes the normal functionality.
External Pin
Function
GPIO6
Reference Clock
Frequency Select
CLK_24_SEL
CLKIN_19_2_24
Frequency Select
Description
Determines the reference clock pin
0 – 38.4 MHz (CLKIN_38_4 pin is used)
1 – 19.2 MHz (CLKIN_19_2_24 pin is used)
Determines the reference frequency of the
CLKIN_19_2_24 pin
0 – RSVD
1 – 19.2 MHz
If GPIO6 is low at reset, this pin will have no effect
on clock selection.
Upon exiting reset, the USB 2.0 PHY is not in the suspend state and the system clock (60 MHz) is enabled and
free running. The USB 2.0 HS Peripheral Controller Core powers up and a session is not enabled. With session not
enabled, all the USB 2.0 HS Peripheral Controller Core State Machine’s are in the idle state.
After reset is de-asserted, the device asserts the DevReady interrupt to the External Host to indicate that it is
ready to be programmed. The host reads the NOR Flash Interrupt Source register and decides how to proceed
based on the device’s current status.
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9
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
System Power-Up Sequence
10
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TUSB6015
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
Input Supply Current
TA = 25°C
VDDA3.3 = 3.3V +/- 10%, VSS = 0V
PARAMETER
TEST CONDITIONS
TYP
1
Idle
IDD
Input supply
current
2
No Bus Activity
3
Active (Transmit / Receive)
4
Reset
UNIT
16.5
uA
3.7
mA
3.6
mA
2.7
mA
TYP
UNIT
0.26
uA
157.0
uA
350.0
uA
1.8
mA
TYP
UNIT
2.0
uA
56.5
mA
58.0
mA
29.2
mA
VDD1.87 = 1.8V +/- 10%, VSS = 0V
PARAMETER
TEST CONDITIONS
1
Idle
IDD
Input supply
current
2
No Bus Activity
3
Active (Transmit / Receive)
4
Reset
Cumulative VDD1.5 = 1.5V +/- 10%, VSS = 0V
(VDD1.5, VDDD1.5, VDDCM1.5, VDDA1.5)
PARAMETER
TEST CONDITIONS
1
Idle
IDD
Input supply
current
2
No Bus Activity
3
Active (Transmit / Receive)
4
Reset
1
DevIdle bit set in Device PRCM Management Register, USB cable unplugged.
Normal operation with no packets being transferred on the USB, except SOF every 125 µs.
3
Bulk IN and OUT on one End Point. Packet size is 512 bytes.
4
TUSB6015 RSTn asserted.
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appear at the end of this data sheet.
PRODUCT PREVIEW information concerns products in the
formative or design phase of development. Characteristic data
and other specifications are design goals. Texas Instruments
reserves the right to change or discontinue these products
without notice.
Copyright © 2008, Texas Instruments Incorporated
WWW.TI.COM
11
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
Input Clock Requirements
CLKIN 19.2 MHz Recommended Operating Conditions
PARAMETER
VALUE
Nominal Clock Frequency
(GPIO6 = high @ reset)
(CLK_24_SEL = high @ reset)
19.20 MHz
Frequency Accuracy
+/- 100 ppm
Maximum Rise/Fall Time
5ns (10% to 90%)
Input Clock Type
Square Wave
Duty Cycle
45% - 55%
Input Capacitance Loading
4pF
Jitter
118 ps
CLKIN 38.4 MHz Recommended Operating Conditions
PARAMETER
VALUE
Nominal Clock Frequency (GPIO6 = low @ reset)
38.40 MHz
Frequency Accuracy
+/- 100 ppm
Input Clock Type
Sinusoid
Duty Cycle
45% - 55%
Input Common Mode Voltage VCM (VCM)
1 V +/- 100 mV
Vp-p
200 mV – 800 mV
Input Capacitance Loading
5 pF
Rin
180 kOhms
Jitter
100 ps (peak-to-peak)
12
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TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
Timing Diagrams
Asynchronous Read Access
PARAMETER
t_acsnh_acsnl
t_scsnh_acsnl
t_add_advn_h
t_acsnl_advn_s
t_add_advn_s
t_advn_oen
t_advn
t_rd_acc
t_acsn_rdy
t_acsn_rdy_z
t_oen_data_z
t_rdy_data
MIN
Delay time, ACSn high to ACSn low
Delay time, SCSn high to ACSn low
Address Hold to ADVn high
ACSn low Setup to ADVn high
Address Setup to ADVn high
Sampled Address to OEn low
ADVn low pulse
OEn low to RDY high (16-bit Register Access)
st
OEn low to RDY high (32-bit Register Access) 1 16-bit
nd
OEn low to RDY high (32-bit Register Access) 2 16-bit
st
OEn low to RDY high (FIFO Access, with DMAREQ) 1 16-bit
nd
OEn low to RDY high (FIFO Access, with DMAREQ) 2 16-bit
ACSn low to RDY low
ACSn high to RDY high-Z
OEn high to Data high-Z
Delay time, RDY high to data valid
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8
8
0.8
18
18
1
7
6
5
2
3
3
-1
MAX
UNIT
8
7
4
4
4
7
7
8
6
ns
ns
ns
ns
ns
ns
ns
Sys Clk
Sys Clk
Sys Clk
Sys Clk
Sys Clk
ns
ns
ns
ns
13
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
Asynchronous Write Access
PARAMETER
t_acsnh_ascnl
t_scsnh_ascnl
t_add_advn_h
t_acsnl_advn_s
t_add_advn_s
t_advn
t_advn_wen
t_wr_acc
t_acsn_rdy
t_acsn_rdy_z
t_wen_datav
14
MIN
Delay time, ACSn high to ACSn low
Delay time, SCSn high to ACSn low
Address Hold to ADVn high
ACSn low Setup to ADVn high
Address Setup to ADVn high
ADVn low pulse
ADVn to WEn low
WEn low to RDY high (16-bit Register Access)
st
WEn low to RDY high (32-bit Register Access) 1 16-bit
nd
WEn low to RDY high (32-bit Register Access) 2 16-bit
st
WEn low to RDY high (FIFO Access, with DMAREQ) 1 16-bit
nd
WEn low to RDY high (FIFO Access, with DMAREQ) 2 16-bit
ACSn low to RDY low
ACSn high to RDY high-Z
Delay time, WEn low to Data valid
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8
8
0.8
18
18
7
1
3
2
3
3
3
MAX
UNIT
5
4
7
4
4
7
7
1-5ns
ns
ns
ns
ns
ns
ns
ns
Sys Clk
Sys Clk
Sys Clk
Sys Clk
Sys Clk
ns
ns
Sys Clk
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
Synchronous Burst Read Access
Notes: RDY going low is asynchronous to t_scsn_rdy. Going high, it is synchronous to CLK. Read Data output and RDY going high are
synchronous to CLK. Valid Data Time programmable through Device Wait Count Register. Wait Count is not used for non-DMA
synchronous reads.
PARAMETER
MIN
MAX
UNIT
t_clk
t_scsnh_scsnl
t_acsnh_scsnl
t_scsn
t_scs_off
t_rdata
t_rdy
t_advn
t_advn_oen
t_oen_off
t_oen
t_rd_acc
t_add_advn_h
t_scsnl_advn_s
t_add_advn_s
t_scsn_rdy
t_scsn_rdy_z
t_oen_data_z
Cycle Time (max 67.5 MHz)
Delay time, SCSn high to SCSn low
Delay time, ACSn high to SCSn low
Delay time, SCSn low to first rising edge of CLK
CLK to SCSn high
Read data output delay
RDY output delay
ADVn low pulse
ADVn high to OEn low
CLK to OEn high
OEn setup to CLK high
OEn hold time
Valid Data Time (with DMAREQ)
Addr Hold time to ADVn high
SCSn low Setup to ADVn high
Address Setup to ADVn high
SCSn low to RDY valid low
SCSn high to RDY high-Z
OEn high to Data high-Z
14.8
8
8
3ns
4
2.2
2.2
7
3
4
3.75
0
1
1
0.8
12
12
1+3ns
9.2
8.2
2
32
7
7
8
ns
ns
ns
CLK
ns
ns
Ns
Ns
Ns
Ns
Ns
CLK
Ns
Ns
Ns
ns
ns
ns
1
Device Wait Count Register = 0 or 1.
Device Wait Count Register = 31.
2
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TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
Synchronous Burst Write Access
Note: RDY going low is asynchronous to t_scsn_rdy. Going high, it is synchronous to CLK. Valid Data Time programmable through Device
Wait Count Register. For Wait Count values other than 0 or 1 (when DMAREQ is used), t_wr_acc = Wait Count + 1.
PARAMETER
t_clk
t_scsnh_scsnl
t_acsnh_scsnl
t_scsn
t_scs_off
t_wdata_s
t_wdata_h
t_rdy
t_add_advn_h
t_scsnl_advn_s
t_add_advn_s
t_advn
t_advn_wen
t_wen_off
t_wen
t_wr_acc
t_scsn_rdy
t_scsn_rdy_z
MIN
Cycle Time (max 67.5 MHz)
Delay time, SCSn high to SCSn low
Delay time, ACSn high to SCSn low
Delay time, SCSn low to first rising edge of CLK
CLK to SCSn high
Data setup to CLK high
Data hold time
CLK to RDY output delay
Address Hold
SCSn low Setup to ADVn high
Address Setup to ADVn high
ADVn low pulse
ADVn high to WEn low
CLK to WEn high
WEn setup to CLK high
WEn hold time
Valid Data Time (with DMAREQ)
SCSn low to RDY valid low
SCSn high to RDY high-Z
1
Device Wait Count Register = 0 or 1.
Device Wait Count Register = 31.
2
16
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14.8
8
8
3ns
1+3ns
3.75
0.6
2.2
0.8
12
12
7
1+3ns
1+3ns
3.75
0
1
1
MAX
1+3ns
8.2
2
32
7
7
UNIT
ns
ns
ns
CLK
Sys Clk
ns
ns
ns
ns
ns
ns
ns
CLK
Sys Clk
ns
CLK
ns
ns
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
Pin Descriptions
TERMINAL
NAME
BALL
TYPE
I/O
RESET STATE
DESCRIPTION
VDD15
A1
Supply
-
-
Digital core power supply, 1.5 V
VSS
A2
Supply
-
-
Ground
CLKIN_19_2_24 Frequency Select at Reset
CLK 24 SEL = HIGH, 19.2 MHz
CLK_24_SEL
A3
LVCMOS
1
Failsafe
I
In with Pull-up
CLK 24 SEL = LOW, RSVD
If GPIO6 is low at reset, this pin will have no
effect on clock selection.
CLKIN_38_4
A4
CLKIN_19_2_24
A5
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
I
In
System Clock In. Connect directly to ground if
not used.
I
In
System Clock In. Connect directly to ground if
not used.
VSS
A6
Supply
-
-
Ground
VDD18
A7
Supply
-
-
IO Power Supply, 1.8 V
OEn
A8
I
In with Pull-up
VDD15
A9
Supply
-
-
Digital core power supply, 1.5 V
VSSREF
B1
Supply
-
-
Ground reference for the reference circuits
GPIO7
B2
I/O
In with Pull-up
VDD15
B3
Supply
-
-
Digital core power supply, 1.5 V
VSS
B4
Supply
-
-
Ground
VDD18
B5
Supply
-
-
IO Power Supply, 1.8 V
1
I/O
In with Pull-up
GPIO 2 / DMA Request 2
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
Output Enable
GPIO 7
GPIO2_DMAREQ2
B6
ADAT15
B7
LVCMOS
I/O
In with Pull-up
Multiplexed ADDRESS.15/DATA.14
ADAT16
B8
LVCMOS
I/O
In with Pull-up
Multiplexed ADDRESS.16/DATA.15
VSS
B9
Supply
-
-
Ground
VDDA3P3
C1
Supply
-
-
3.3V Analog Supply
R1
C2
Bias
I
-
High precision external resistor used for
calibration. (R1 value: 10.7 K +/- 1%)
GPIO4_DMAREQ4
C4
I/O
In with Pull-up
VDD15
C5
-
-
I
In with Pull-up
Address Valid
I/O
In with Pull-up
Multiplexed ADDRESS.12/DATA.11
I/O
In with Pull-up
Multiplexed ADDRESS.14/DATA.13
ADVn
C6
ADAT12
C7
ADAT14
C8
Failsafe
LVCMOS
1
Failsafe
Supply
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
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GPIO 4 / DMA Request 4
Digital core power supply, 1.5 V
17
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
18
LVCMOS
In with Pull-up
NOR Interface Clock
I/O
-
USB Differential Pair
-
-
1.5V PLL Supply
Supply
-
-
1.5V PLL Ground
LVCMOS
I
-
Test Mode. Under normal operation this signal
should be tied directly to GND.
I/O
In with Pull-up
GPIO 1
I
In with Pull-up
Write Enable
I/O
In with Pull-up
Multiplexed ADDRESS.13/DATA.12
I/O
In with Pull-up
Multiplexed ADDRESS.11/DATA.10
Supply
-
-
Digital core power supply, 1.5 V
Supply
-
-
1.5V Analog Ground
E2
USB
I/O
-
USB Differential Pair
E3
Supply
-
-
1.5V Analog Supply
VSSA3P3
E4
Supply
-
-
3.3V Analog Ground
VSS
E5
Supply
-
-
Ground
ADAT2
E6
I/O
In with Pull-up
Multiplexed ADDRESS.2/DATA.1
GPIO5_DMAREQ5
E7
I/O
In with Pull-up
GPIO 5 / DMA Request 5
GPIO3_DMAREQ3
E8
I/O
In with Pull-up
GPIO 3 / DMA Request 3
VSS
E9
Supply
-
-
Ground
VDDD1P5
F1
Supply
-
-
1.5V Digital Supply
ID
F2
USB
I
-
Should be left floating as a USB device.
VBUS
F3
USB
I
-
USB VBUS
VSSD1P5
F4
Supply
-
-
1.5V Digital Ground
GPIO6
F5
I/O
In with Pull-up
CLK
C9
DP
D1
USB
VDDCM1P5
D2
Supply
VSSCM1P5
D3
TEST
D4
GPIO1
D5
WEn
D6
ADAT13
D7
ADAT11
D8
VDD15
D9
VSSA1P5
E1
DM
VDDA1P5
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
I
GPIO 6 / Input Clock Source Select at reset.
GPIO6 = HIGH, 19.2/24 MHz
GPIO6 = LOW, 38.4 MHz
I/O
In with Pull-up
Multiplexed ADDRESS.1/DATA.0
I/O
In with Pull-up
Multiplexed ADDRESS.10/DATA.9
I/O
In with Pull-up
Multiplexed ADDRESS.9/DATA.8
-
In with Pull-up
Digital core power supply, 1.5 V
ADAT1
F6
ADAT10
F7
ADAT9
F8
VDD15
F9
VSS
G1
Supply
-
-
Ground
1.5V_SWEN
G2
LVCMOS
O
0
Switch Enable for 1.5V supply for Vbat/Vbus
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
Supply
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TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
Switch, if applicable
1
Failsafe
3.3V_SWEN
G3
ACSn
G4
ADAT3
G5
ADAT4
G6
RDY
G7
SCSn
G8
VSS
G9
LVCMOS
Switch Enable for 3.3V supply for Vbat/Vbus
Switch, if applicable
O
0
I
In with Pull-up
Asynchronous Chip Select
I/O
In with Pull-up
Multiplexed ADDRESS.3/DATA.2
I/O
In with Pull-up
Multiplexed ADDRESS.4/DATA.3
LVCMOS
tri-state
O
high z
LVCMOS
I
In with Pull-up
Supply
-
-
I
In with Pull-up
O
0
5V Charge Pump Enable, if applicable
O
0
Use for external power supply low power mode
when idle, if applicable
I/O
In with Pull-up
GPIO 0
I/O
In with Pull-up
Multiplexed ADDRESS.5/DATA.4
I/O
In with Pull-up
Multiplexed ADDRESS.6/DATA.5
I/O
In with Pull-up
Multiplexed ADDRESS.7/DATA.6
I/O
In with Pull-up
Multiplexed ADDRESS.8/DATA.7
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
Ready
Synchronous Chip Select
Ground
RSTn
H1
CPEN
H2
SLEEP
H3
GPIO0
H4
ADAT5
H5
ADAT6
H6
ADAT7
H7
ADAT8
H8
VDD18
H9
Supply
-
-
IO Power Supply, 1.8 V
VDD18
J1
Supply
-
-
IO Power Supply, 1.8 V
VSS
J2
Supply
-
-
Ground
VDD15
J3
Supply
-
-
Digital core power supply, 1.5 V
VSS
J4
Supply
-
-
Ground
O
1
DMA Request 1
-
-
IO Power Supply, 1.8 V
O
1
DMA Request 0
-
-
Ground
O
1
Interrupt
DMAREQ1
J5
VDD18
J6
DMAREQ0
J7
VSS
J8
INT
J9
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
LVCMOS
1
Failsafe
Supply
LVCMOS
1
Failsafe
Supply
LVCMOS
1
Failsafe
Reset Active Low
1
Failsafe means that the signal can toggle when VDD18 is not present without damaging the device.
WWW.TI.COM
19
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
External Components
USB PHY Voltage and Current Bias Resistor Pin: R1
This signal must connect to a precision external resistance to set the internal operating reference currents and
cable driver output currents. A resistance of 10.7 k• ± 1% (temperature coefficient ±100ppm/°C) is necessary to
meet requirements set forth in the Universal Serial Bus Revision 2.0 specification.
The side of the resistor not connected to the R1 signal should connect through a low impedance path to the circuit
board ground plane.
USB PHY Voltage and Current Reference Ground: VSSREF
This signal is the reference ground for the voltage and current reference circuitry internal to the Data/Port macro.
This signal must connect to the low impedance circuit board ground plane.
USB PHY Power Connections: VDDCM1P5, VDDA1P5, VDDD1P5, VDDA3P3
Decoupling capacitors are required to suppress high-frequency switching noise and stabilize the supply voltage. A
decoupling capacitor is most effective when it is close to the chip. This minimizes the inductance of the circuit
board wiring and interconnects.
The USB 2.0 PHY Macro has two power rails, 1.5V (VDDCM1P5, VDDD1P5, VDDA1P5) and 3.3V (VDDA3P3).
Each power connection has its own associated ground connection, 1.5V (VSSCM1P5, VSSD1P5, VSSA1P5) and
3.3V (VSSA3P3). Each supply is isolated from the others to provide noise isolation.
A combination of high-frequency capacitors near each terminal is suggested, such as paralleled 1uF, 0.01uF, and
0.001uF capacitors. A lower frequency 10uF filter capacitor is also recommended. A series inductor on the
analog supplies is also recommended. All ground pins must connect through a low impedance path to the circuit
board ground plane. All grounds can be connected to each other.
• VDDCM1P5 (Common Module 1.5V Supply) - (1) 1µf , (1) 0.1µf, 0.01µf, (1) 0.001µf, (1) 10µf
• VSSCM1P5 (Common Module Ground)
• VDDD1P5 (Digital 1.5V Supply) - (1) 0.1µf, (1) 0.001µf, (1) 10µf
• VSSD1P5 (Digital 1.5V Ground)
• VDDA1P5 (Analog 1.5V Supply) - (1) 0.1µf, (1) 0.001µf, (1) 10µf, with a series inductor between the
main supply and the device, the caps between the inductor and the device.
• VSSA1P5 (Analog 1.5V Ground)
• VDDA3P3 (Analog 3.3V Supply) - (1) 0.1µf, (1) 0.001µf, (1) 10µf, with a series inductor between the
main supply and the device, the caps between the inductor and the device.
• VDDA3P3 (Analog 3.3V Ground)
20
WWW.TI.COM
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
Digital Power Connections: VDD18, VDD15
The digital portion of the TUSB6015 has two power rails, 1.5V (VDD15) and 1.8V (VDD18). There is one digital
ground connection (VSS). Each supply is isolated from the others to provide noise isolation.
A combination of high-frequency capacitors near each terminal is suggested, such as paralleled 0.01uF and
0.001uF capacitors. A lower frequency 10uF filter capacitor is also recommended. All ground pins must connect
through a low impedance path to the circuit board ground plane. All grounds can be connected to each other.
• VDD15 (Digital Core Voltage 1.5V Supply) - (5) 0.1µf, (5) 0.001µf, (1) 10µf
• VDD18 (Digital IO Voltage 1.8V Supply) - (5) 0.1µf, (5) 0.001µf, (1) 10µf
• VSS (Digital Ground)
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21
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
Mechanical Characteristics
TUSB6015 uses an 80-pin u*BGA package. The lead-free solder ball composition is Sn/Ag1.2Cu0.5 The substrate
plating on the die side where the die bonds to is NiAu, The substrate finish on the bottom side
where the solder balls attach to is bare Cu.
ZQE (S-PBGA-N80)
22
Plastic Ball Grid Array
WWW.TI.COM
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
Reflow Conditions
WWW.TI.COM
23
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 12, 2008
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements,
improvements, and other changes to its products and services at any time and to discontinue any product or service without
notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is
current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order
acknowledgment.
TI warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with TI’s
standard warranty. Testing and other quality control techniques are used to the extent TI deems necessary to support this
warranty. Except where mandated by government requirements, testing of all parameters of each product is not necessarily
performed.
TI assumes no liability for applications assistance or customer product design. Customers are responsible for their products
and applications using TI components. To minimize the risks associated with customer products and applications, customers
should provide adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any TI patent right, copyright,
mask work right, or other TI intellectual property right relating to any combination, machine, or process in which TI products or
services are used. Information published by TI regarding third-party products or services does not constitute a license from TI
to use such products or services or a warranty or endorsement thereof. Use of such information may require a license from a
third party under the patents or other intellectual property of the third party, or a license from TI under the patents or other
intellectual property of TI.
Reproduction of information in TI data books or data sheets is permissible only if reproduction is without alteration and is
accompanied by all associated warranties, conditions, limitations, and notices. Reproduction of this information with alteration
is an unfair and deceptive business practice. TI is not responsible or liable for such altered documentation.
Resale of TI products or services with statements different from or beyond the parameters stated by TI for that product or
service voids all express and any implied warranties for the associated TI product or service and is an unfair and deceptive
business practice. TI is not responsible or liable for any such statements.
Following are URLs where you can obtain information on other Texas Instruments products and application solutions:
Products
Amplifiers
amplifier.ti.com
Applications
Audio
www.ti.com/audio
Data Converters
dataconverter.ti.com
Automotive
www.ti.com/automotive
DSP
dsp.ti.com
Broadband
www.ti.com/broadband
Interface
interface.ti.com
Digital Control
www.ti.com/digitalcontrol
Logic
logic.ti.com
Military
www.ti.com/military
Power Mgmt
power.ti.com
Optical Networking
www.ti.com/opticalnetwork
Microcontrollers
microcontroller.ti.com
Security
www.ti.com/security
Mailing Address:
Telephony
www.ti.com/telephony
Video & Imaging
www.ti.com/video
Wireless
www.ti.com/wireless
Texas Instruments
Post Office Box 655303 Dallas, Texas 75265
Copyright © 2005, Texas Instruments Incorporated
24
WWW.TI.COM
TUSB6015ZQE
SLLS937
REVISION 1.4 SEPTEMBER 10, 2008
WWW.TI.COM
25
PACKAGE OPTION ADDENDUM
www.ti.com
22-Sep-2008
PACKAGING INFORMATION
Orderable Device
Status (1)
TUSB6015IZQE
ACTIVE
BGA MI
CROSTA
R JUNI
OR
ZQE
80
360
Green (RoHS &
no Sb/Br)
SNAGCU
Level-3-260C-168 HR
TUSB6015IZQER
ACTIVE
BGA MI
CROSTA
R JUNI
OR
ZQE
80
2500 Green (RoHS &
no Sb/Br)
SNAGCU
Level-3-260C-168 HR
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements,
and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should
obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are
sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment.
TI warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with TI’s standard
warranty. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where
mandated by government requirements, testing of all parameters of each product is not necessarily performed.
TI assumes no liability for applications assistance or customer product design. Customers are responsible for their products and
applications using TI components. To minimize the risks associated with customer products and applications, customers should provide
adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any TI patent right, copyright, mask work right,
or other TI intellectual property right relating to any combination, machine, or process in which TI products or services are used. Information
published by TI regarding third-party products or services does not constitute a license from TI to use such products or services or a
warranty or endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual
property of the third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied
by all associated warranties, conditions, limitations, and notices. Reproduction of this information with alteration is an unfair and deceptive
business practice. TI is not responsible or liable for such altered documentation. Information of third parties may be subject to additional
restrictions.
Resale of TI products or services with statements different from or beyond the parameters stated by TI for that product or service voids all
express and any implied warranties for the associated TI product or service and is an unfair and deceptive business practice. TI is not
responsible or liable for any such statements.
TI products are not authorized for use in safety-critical applications (such as life support) where a failure of the TI product would reasonably
be expected to cause severe personal injury or death, unless officers of the parties have executed an agreement specifically governing
such use. Buyers represent that they have all necessary expertise in the safety and regulatory ramifications of their applications, and
acknowledge and agree that they are solely responsible for all legal, regulatory and safety-related requirements concerning their products
and any use of TI products in such safety-critical applications, notwithstanding any applications-related information or support that may be
provided by TI. Further, Buyers must fully indemnify TI and its representatives against any damages arising out of the use of TI products in
such safety-critical applications.
TI products are neither designed nor intended for use in military/aerospace applications or environments unless the TI products are
specifically designated by TI as military-grade or "enhanced plastic." Only products designated by TI as military-grade meet military
specifications. Buyers acknowledge and agree that any such use of TI products which TI has not designated as military-grade is solely at
the Buyer's risk, and that they are solely responsible for compliance with all legal and regulatory requirements in connection with such use.
TI products are neither designed nor intended for use in automotive applications or environments unless the specific TI products are
designated by TI as compliant with ISO/TS 16949 requirements. Buyers acknowledge and agree that, if they use any non-designated
products in automotive applications, TI will not be responsible for any failure to meet such requirements.
Following are URLs where you can obtain information on other Texas Instruments products and application solutions:
Products
Amplifiers
Data Converters
DSP
Clocks and Timers
Interface
Logic
Power Mgmt
Microcontrollers
RFID
RF/IF and ZigBee® Solutions
amplifier.ti.com
dataconverter.ti.com
dsp.ti.com
www.ti.com/clocks
interface.ti.com
logic.ti.com
power.ti.com
microcontroller.ti.com
www.ti-rfid.com
www.ti.com/lprf
Applications
Audio
Automotive
Broadband
Digital Control
Medical
Military
Optical Networking
Security
Telephony
Video & Imaging
Wireless
www.ti.com/audio
www.ti.com/automotive
www.ti.com/broadband
www.ti.com/digitalcontrol
www.ti.com/medical
www.ti.com/military
www.ti.com/opticalnetwork
www.ti.com/security
www.ti.com/telephony
www.ti.com/video
www.ti.com/wireless
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2008, Texas Instruments Incorporated