Data sheet acquired from Cypress Semiconductor Corporation. Data sheet modified to remove devices not offered. CY74FCT2541T 8-Bit Buffer/Line Driver SCCS041 - September 1994 - Revised March 2000 Features • Function and pinout compatible with FCT and F logic • FCT-C speed at 4.1 ns max. FCT-A speed at 4.8 ns max. • 25Ω output series to reduce transmission line reflection noise • Reduced VOH (typically = 3.3V) versions of equivalent FCT functions • Edge-rate control circuitry for significantly improved noise characteristics • Power-off disable feature • ESD > 2000V • Matched rise and fall times • Fully compatible with TTL input and output logic levels • Sink current 12 mA Source current 15 mA Logic Block Diagram • Extended commercial temp. range of –40˚C to +85˚C • Three-state outputs Functional Description The FCT2541T is an octal buffer and line driver designed to be employed as a memory address driver, clock driver, and bus-oriented transmitter/receiver. On-chip termination resistors have been added to the outputs to reduce system noise caused by reflections. The FCT2541T can be used to replace the FCT541T to reduce noise in an existing design. The speed of the FCT2541T is comparable to bipolar logic counterparts while reducing power dissipation. The input and output voltage levels allow direct interface with TTL and CMOS devices without external components. The outputs are designed with a power-off disable feature to allow for live insertion of boards. Pin Configurations OEA OE B D0 O0 D1 SOIC/QSOP Top View O1 D2 O2 D3 O3 D4 O4 D5 O5 D6 O6 D7 O7 OEA 1 20 D0 2 19 OE B D1 3 18 O0 D2 4 17 O1 D3 5 16 O2 D4 6 15 O3 D5 7 14 O4 D6 8 13 O5 D7 9 12 O6 GND 10 11 O7 VCC FCT2541T–2 FCT2541T–3 ] Function Table[1] Inputs OEA OEB D Output L L H L L H L H X L H Z Note: 1. H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care Z = High Impedance Copyright © 2000, Texas Instruments Incorporated CY74FCT2541T Maximum Ratings[2,3] DC Output Current (Maximum Sink Current/Pin) ...... 120 mA Power Dissipation .......................................................... 0.5W (Above which the useful life may be impaired. For user guidelines, not tested.) Static Discharge Voltage............................................>2001V (per MIL-STD-883, Method 3015) Storage Temperature ..................................... −65°C to +150°C Operating Range Ambient Temperature with Power Applied .................................................. −65°C to +135°C Supply Voltage to Ground Potential..................−0.5V to +7.0V Range DC Input Voltage .................................................−0.5V to +7.0V Commercial DC Output Voltage ..............................................−0.5V to +7.0V Ambient Temperature VCC −40°C to +85°C 5V ± 5% Electrical Characteristics Over the Operating Range Parameter Description Test Conditions Min. Typ.[5] 2.4 3.3 VOH Output HIGH Voltage VCC = Min., IOH = −15 mA VOL Output LOW Voltage VCC = Min., IOL = 12 mA ROUT Output Resistance VCC = Min., IOL = 12 mA VIH Input HIGH Voltage VIL Input LOW Voltage VH Hysteresis[6] All inputs 0.2 VIK Input Clamp Diode Voltage VCC = Min., IIN = −18 mA −0.7 II Input HIGH Current IIH IIL 20 Max. Unit V 0.3 0.55 V 25 40 Ω 2.0 V 0.8 V V −1.2 V VCC = Max., VIN = VCC 5 µA Input HIGH Current VCC = Max., VIN = 2.7V ±1 µA Input LOW Current VCC = Max., VIN = 0.5V ±1 µA IOZH Off State HIGH-Level Output Current VCC = Max., VOUT = 2.7V 15 µA IOZL Off State LOW-Level Output Current VCC = Max., VOUT = 0.5V −15 µA IOS Output Short Circuit Current[7] VCC = Max., VOUT = 0.0V −225 mA IOFF Power-Off Disable VCC = 0V, VOUT = 4.5V ±1 µA −60 −120 Capacitance[6] Parameter Description Typ.[5] Max. Unit CIN Input Capacitance 5 10 pF COUT Output Capacitance 9 12 pF Notes: 2. Unless otherwise noted, these limits are over the operating free-air temperature range. 3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground. 4. TA is the “instant on” case temperature. 5. Typical values are at VCC=5.0V, TA=+25˚C ambient. 6. This parameter is specified but not tested. 7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last. 2 CY74FCT2541T Power Supply Characteristics Parameter Description Test Conditions Typ.[5] Max. Unit ICC Quiescent Power Supply Current VCC=Max., VIN≤0.2V, VIN≥VCC−0.2V 0.1 0.2 mA ∆ICC Quiescent Power Supply Current (TTL inputs) VCC=Max., VIN=3.4V,[8] f1=0, Outputs Open 0.5 2.0 mA ICCD Dynamic Power Supply Current[9] VCC=Max., 50% Duty Cycle, Outputs Open, One Bit Toggling, OEA=OEB=GND, VIN≤0.2V or VIN≥VCC−0.2V 0.06 0.12 mA/ MHz IC Total Power Supply Current[10] VCC=Max., 50% Duty Cycle, Outputs Open, One Bit Toggling at f1=10 MHz, OEA=OEB=GND, VIN≤0.2V or VIN≥VCC−0.2V 0.7 1.4 mA VCC=Max., 50% Duty Cycle, Outputs Open, One Bit Toggling at f1=10 MHz, OEA=OEB=GND, VIN=3.4V or VIN=GND 1.0 2.4 mA VCC=Max., 50% Duty Cycle, Outputs Open, Eight Bits Toggling at f1=2.5 MHz, OEA=OEB=GND, VIN≤0.2V or VIN≥VCC−0.2V 1.3 2.6[11] mA VCC=Max., 50% Duty Cycle, Outputs Open, Eight Bits Toggling at f1=2.5 MHz, OEA=OEB=GND, VIN=3.4V or VIN=GND 3.3 10.6[11] mA Switching Characteristics Over the Operating Range[12] CY74FCT2541T Parameter Description CY74FCT2541AT CY74FCT2541AT Min. Max. Min. Max. Min. Max. Unit Fig. No.[13] tPLH tPHL Propagation Delay Data to Output 1.5 8.0 1.5 4.8 1.5 4.1 ns 1, 3 tPZH tPZL Output Enable Time 1.5 10.0 1.5 6.2 1.5 5.8 ns 1, 7, 8 tPHZ tPLZ Output Disable Time 1.5 9.5 1.5 5.6 1.5 5.2 ns 1, 7, 8 Notes: 8. Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND. 9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations. = IQUIESCENT + IINPUTS + IDYNAMIC 10. IC IC = ICC+∆ICCDHNT+ICCD(f0/2 + f1N1) ICC = Quiescent Current with CMOS input levels ∆ICC = Power Supply Current for a TTL HIGH input (VIN=3.4V) = Duty Cycle for TTL inputs HIGH DH = Number of TTL inputs at DH NT ICCD = Dynamic Current caused by an input transition pair (HLH or LHL) = Clock frequency for registered devices, otherwise zero f0 = Input signal frequency f1 = Number of inputs changing at f1 N1 All currents are in milliamps and all frequencies are in megahertz. 11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested. 12. Minimum limits are specified but not tested on Propagation Delays. 13. See “Parameter Measurement Information” in the General Information section. 3 CY74FCT2541T Ordering Information Speed (ns) 4.1 4.8 8.0 Ordering Code Package Name Package Type CY74FCT2541CTQCT Q5 20-Lead (150-Mil) QSOP CY74FCT2541CTSOC/SOCT S5 20-Lead (300-Mil) Molded SOIC CY74FCT2541ATQCT Q5 20-Lead (150-Mil) QSOP CY74FCT2541ATSOC/SOCT S5 20-Lead (300-Mil) Molded SOIC CY74FCT2541TQCT Q5 20-Lead (150-Mil) QSOP CY74FCT2541TSOC/SOCT S5 20-Lead (300-Mil) Molded SOIC Document #: 38−00342−A 4 Operating Range Commercial Commercial Commercial CY74FCT2541T Package Diagrams 20-Lead Quarter Size Outline Q5 20-Lead (300-Mil) Molded SOIC S5 5 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. 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