TI 74FCT245

Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
CY54/74FCT245T
8-Bit Transceiver
SCCS018 - May 1994 - Revised February 2000
Features
Functional Description
• Function, pinout, and drive compatible with FCT, and
F logic
• FCT-D speed at 3.8 ns max. (Com’l),
FCT-C speed at 4.1 ns max. (Com’l),
FCT-A speed at 4.6 ns max. (Com’l)
• Reduced VOH (typically = 3.3V) versions of equivalent
FCT functions
• Edge-rate control circuitry for significantly improved
noise characteristics
• Power-off disable feature
• ESD > 2000V
• Matched rise and fall times
• Fully compatible with TTL input and output logic levels
• Extended commercial range of −40˚C to +85˚C
• Sink current
64 mA (Com’l), 48 mA (Mil)
Source current
32 mA (Com’l), 12 mA (Mil)
Logic Block Diagram
The FCT245T contains eight non-inverting bidirectional buffers with three-state outputs and is intended for bus oriented
applications. For the FCT245T, current sinking capability is 64
mA at the A and B ports.
The Transmit/Receiver (T/R) input determines the direction of
data flow through bidirectional transceiver. Transmit (Active
HIGH) enables data from A ports to B ports. The output enable
(OE), when HIGH, disables both the A and B ports by putting
them in a High Z condition.
The outputs are designed with a power-off disable feature to
allow for live insertion of boards.
Pin Configurations
T/R
OE
A0
B0
DIP/SOIC/QSOP
Top View
A2
8
A7
GND
A3
B7
B3
B6
B5
A4
3
2
1
20
19
14 1516 17 18
B4
B4
A5
1
20
VCC
A0
2
19
OE
A1
3
18
B0
A1
A0
A2
4
17
B1
A3
5
16
B2
T/R
VCC
A4
6
15
B3
A5
7
14
B4
A6
8
13
B5
A7
9
12
B6
10
11
B7
7 6 5 4
9
10
11
12
13
B3
B2
B1
B0
B2
T/R
A4
A3
A2
A6
B1
A5
LCC
Top View
A1
OE
GND
B5
A6
B6
A7
B7
Function Table[1]
OE
T/R
Operation
L
L
B Data to Bus A
L
H
A Data to Bus B
H
X
High Z State
Note:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.
Copyright
© 2000, Texas Instruments Incorporated
CY54/74FCT245T
Maximum Ratings[2,3]
Power Dissipation .......................................................... 0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
(Above which the useful life may be impaired. For user
guidelines, not tested.)
Storage Temperature ..................................... −65°C to +150°C
Operating Range
Ambient Temperature with
Power Applied .................................................. −65°C to +135°C
Range
Supply Voltage to Ground Potential..................−0.5V to +7.0V
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage ..............................................−0.5V to +7.0V
Ambient
Temperature
VCC
0°C to +70°C
5V ± 5%
Commercial
DT
Commercial
T, AT, CT
−40°C to +85°C
5V ± 5%
All
−55°C to +125°C
5V ± 10%
[4]
Military
DC Output Current (Maximum Sink Current/Pin).......120 mA
Range
Electrical Characteristics Over the Operating Range
Parameter
VOH
Description
Output HIGH Voltage
Test Conditions
Min.
Typ.[5]
Max.
Unit
VCC=Min., IOH=−32 mA
Com’l
2.0
VCC=Min., IOH=−15 mA
Com’l
2.4
3.3
V
V
VCC=Min., IOH=−12 mA
Mil
2.4
3.3
V
VCC=Min., IOL=64 mA
Com’l
VCC=Min., IOL=48mA
Mil
VOL
Output LOW Voltage
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VH
Hysteresis[6]
All inputs
0.2
VIK
Input Clamp Diode Voltage
VCC=Min., IIN=−18 mA
−0.7
−1.2
V
II
Input HIGH Current
VCC=Max., VIN=VCC
5
µA
IIH
Input HIGH Current
VCC=Max., VIN=2.7V
±1
µA
IIL
Input LOW Current
VCC=Max., VIN=0.5V
±1
µA
−225
mA
±1
µA
IOS
Output Short Circuit
IOFF
Power-Off Disable
0.3
0.55
V
0.3
0.55
V
2.0
V
0.8
Current[7]
−60
VCC=Max., VOUT=0.0V
−120
VCC=0V, VOUT=4.5V
V
V
Capacitance[6]
Parameter
Description
Typ.[5]
Max.
Unit
CIN
Input Capacitance
5
10
pF
COUT
Output Capacitance
9
12
pF
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
4. TA is the “instant on” case temperature.
5. Typical values are at VCC=5.0V, TA=+25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
2
CY54/74FCT245T
Power Supply Characteristics
Parameter
Description
Test Conditions
Typ.[5]
Max.
Unit
ICC
Quiescent Power Supply Current
VCC=Max., VIN≤0.2V, VIN≥VCC−0.2V
0.1
0.2
mA
∆ICC
Quiescent Power Supply Current
(TTL inputs HIGH)
VCC=Max., VIN=3.4V,[8]
f1=0, Outputs Open
0.5
2.0
mA
ICCD
Dynamic Power Supply Current[9]
VCC=Max., One Input Toggling,
50% Duty Cycle, Outputs Open,
T/R or OE=GND and
VIN≤0.2V or VIN≥VCC−0.2V
0.06
0.12
mA/MHz
IC
Total Power Supply Current[10]
VCC=Max., 50% Duty Cycle, Outputs Open,
One Bit Toggling at f1=10 MHz,
T/R or OE=GND and
VIN≤0.2V or VIN≥VCC−0.2V
0.7
1.4
mA
VCC=Max., 50% Duty Cycle, Outputs Open,
One Bit Toggling at f1=10 MHz,
T/R or OE=GND and VIN=3.4V or VIN=GND
1.2
3.4
mA
VCC=Max., 50% Duty Cycle, Outputs Open,
Eight Bits Toggling at f1=2.5 MHz,
T/R or OE=GND and
VIN≤0.2V or VIN≥VCC−0.2V
1.3
2.6[11]
mA
VCC=Max., 50% Duty Cycle, Outputs Open,
Eight Bits Toggling at f1=2.5 MHz,
T/R or OE=GND and VIN=3.4V or VIN=GND
3.3
10.6[11]
mA
Notes:
8. Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.
9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
= IQUIESCENT + IINPUTS + IDYNAMIC
10. IC
IC
= ICC+∆ICCDHNT+ICCD(f0/2 + f1N1)
ICC = Quiescent Current with CMOS input levels
∆ICC = Power Supply Current for a TTL HIGH input (VIN=3.4V)
DH = Duty Cycle for TTL inputs HIGH
NT = Number of TTL inputs at DH
ICCD = Dynamic Current caused by an input transition pair (HLH or LHL)
= Clock frequency for registered devices, otherwise zero
f0
= Input signal frequency
f1
= Number of inputs changing at f1
N1
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
3
CY54/74FCT245T
Switching Characteristics Over the Operating Range
FCT245T
Military
Parameter
Description
FCT245AT
Commercial
Military
Commercial
Min.[12]
Max.
Min.[12]
Max.
Min.[12]
Max.
Min.[12]
Max.
Unit
Fig.
No.[13]
tPLH
tPHL
Propagation Delay
A to B or B to A
1.5
7.5
1.5
7.0
1.5
4.9
1.5
4.6
ns
1, 3
tPZH
tPZL
Output Enable Time
OE or T/R to A or B
1.5
10.0
1.5
9.5
1.5
6.5
1.5
6.2
ns
1, 7, 8
tPHZ
tPLZ
Output Disable Time
OE or T/R to A or B
1.5
10.0
1.5
7.5
1.5
6.0
1.5
5.0
ns
1, 7, 8
Switching Characteristics Over the Operating Range (continued)
FCT245CT
Military
Parameter
Description
Min.[12]
FCT245DT
Commercial
Commercial
Max.
Min.[12]
Max.
Min.[12]
Max.
Unit
Fig.
No.[13]
tPLH
tPHL
Propagation Delay
A to B or B to A
1.5
4.5
1.5
4.1
1.5
3.8
ns
1, 3
tPZH
tPZL
Output Enable Time
OE or T/R to A or B
1.5
6.2
1.5
5.8
1.5
5.0
ns
1, 7, 8
tPHZ
tPLZ
Output Disable Time
OE or T/R to A or B
1.5
5.2
1.5
4.8
1.5
4.3
ns
1, 7, 8
Ordering Information
Speed
(ns)
3.8
4.1
4.5
4.6
4.9
7.0
7.5
Ordering Code
Package
Name
Package Type
CY74FCT245DTQCT
Q5
20-Lead (150-Mil) QSOP
CY74FCT245DTSOC/SOCT
S5
20-Lead (300-Mil) Molded SOIC
CY74FCT245CTQCT
Q5
20-Lead (150-Mil) QSOP
CY74FCT245CTSOC/SOCT
S5
20-Lead (300-Mil) Molded SOIC
CY54FCT245CTDMB
D6
20-Lead (300-Mil) CerDIP
CY54FCT245CTLMB
L61
20-Square Leadless Chip Carrier
CY74FCT245ATPC
P5
20-Lead (300-Mil) Molded DIP
CY74FCT245ATQCT
Q5
20-Lead (150-Mil) QSOP
CY74FCT245ATSOC/SOCT
S5
20-Lead (300-Mil) Molded SOIC
CY54FCT245ATDMB
D6
20-Lead (300-Mil) CerDIP
CY54FCT245ATLMB
L61
20-Square Leadless Chip Carrier
CY74FCT245TQCT
Q5
20-Lead (150-Mil) QSOP
CY74FCT245TSOC/SOCT
S5
20-Lead (300-Mil) Molded SOIC
CY54FCT245TDMB
D6
20-Lead (300-Mil) CerDIP
CY54FCT245TLMB
L61
20-Square Leadless Chip Carrier
Notes:
12. Minimum limits are specified but not tested on Propagation Delays.
13. See “Parameter Measurement Information” in the General Information section.
Document #: 38−00318−B
4
Operating
Range
Commercial
Commercial
Military
Commercial
Military
Commercial
Military
CY54/74FCT245T
Package Diagrams
20-Lead (300-Mil) CerDIP D6
MIL−STD−1835
20-Pin Square Leadless Chip Carrier L61
D−8 Config.A
MIL−STD−1835 C−2A
20-Lead (300-Mil) Molded DIP P5
5
CY54/74FCT245T
Package Diagrams (continued)
20-Lead Quarter Size Outline Q5
20-Lead (300-Mil) Molded SOIC S5
6
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