OKI MS81V26000

OKI Semiconductor
MS81V26000
FEDSMS81V26000-02
Issue Date: Dec 15, 2004
1,114,112-Word × 24-Bit Field Memory
GENERAL DESCRIPTION
The OKI MS81V26000 is a high performance 26-Mbit, 1,100K × 24-bit, Field Memory. It is especially designed
for high-speed serial access applications such as HDTVs, conventional NTSC TVs, VTRs, digital movies and
Multi-media systems. MS81V26000 is a FRAM for wide or low end use in general commodity TVs and VTRs
exclusively. MS81V26000 is not designed for the other use or high end use in medical systems, professional
graphics systems which require long term picture storage, data storage systems and others. More than two
MS81V26000s can be cascaded directly without any delay devices among the MS81V26000s. (Cascading of
MS81V26000 provides larger storage depth or a longer delay).
Each of the 24-bit planes has separate serial write and read ports. These employ independent control clocks to
support asynchronous read and write operations. Different clock rates are also supported that allow alternate data
rates between write and read data streams.
The MS81V26000 provides high speed FIFO, First-In First-Out, operation without external refreshing:
MS81V26000 refreshes its DRAM storage cells automatically, so that it appears fully static to the users.
Moreover, fully static type memory cells and decoders for serial access enable the refresh free serial access
operation, so that serial read and/or write control clock can be halted high or low for any duration as long as the
power is on. Internal conflicts of memory access and refreshing operations are prevented by special arbitration
logic.
The MS81V26000’s function is simple, and similar to a digital delay device whose delay-bit-length is easily set by
reset timing. The delay length, number of read delay clocks between write and read, is determined by externally
controlled write and read reset timings.
Additionally, the MS81V26000 has write mask function or input enable function (IE), and read-data skipping
function or output enable function (OE) . The differences between write enable (WE) and input enable (IE), and
between read enable (RE) and output enable (OE) are that WE and RE can stop serial write/read address
increments, but IE and OE cannot stop the increment, when write/read clocking is continuously applied to
MS81V26000. The input enable (IE) function allows the user to write into selected locations of the memory only,
leaving the rest of the memory contents unchanged. This facilitates data processing to display a “picture in picture”
on a TV screen.
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FEDS81V26000-02
OKI Semiconductor
MS81V26000
FEATURES
•
•
•
•
•
•
•
•
•
•
•
Single power supply: 3.3 V ±0.3 V
1,114,112 words × 24 bits
Fast FIFO (First-In First-Out) operation
High speed asynchronous serial access
Read/write cycle time 12 ns
Access time
9 ns
Randomly accessible leading address
Variable length delay bit (350 to 1,114,112)
Write/Read start address settable
Write mask function (Input enable control)
Data skipping function (Output enable control)
Self refresh (No refresh control is required)
Package options:
100-pin plastic TQFP
(TQFP100-P-1414-0.50-K)
(MS81V26000-xxTB)
xx indicates speed rank.
PRODUCT FAMILY
Family
Access Time (Max.)
Cycle Time (Min.)
Package
MS81V26000-12TB
9 ns
12 ns (83 MHz)
100-pin TQFP
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FEDS81V26000-02
OKI Semiconductor
MS81V26000
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
VSS
DI4
DI5
DI6
DI7
VSS
DI8
DI9
DI10
DI11
VSS
VCC
NC
NC
VSS
VCC
VSSQ
DO11
DO10
VCCQ
DO9
DO8
VSSQ
DO7
DO6
PIN CONFIGURATION (TOP VIEW)
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
VCC
VCCQ
DO5
DO4
VSSQ
VSS
DO3
DO2
VCCQ
DO1
DO0
VSS
VSSQ
VCC
DO12
DO13
VCCQ
DO14
DO15
VSS
VSSQ
DO16
DO17
VCCQ
VCC
VSS
DI16
DI17
DI18
DI19
VSS
DI20
DI21
DI22
DI23
VSS
VCC
NC
NC
VSS
VCC
VSSQ
DO23
DO22
VCCQ
DO21
DO20
VSSQ
DO19
DO18
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
VCC
DI3
DI2
DI1
DI0
VSS
WAD
IE
WE
RSTW
VCC
SWCK
VSS
SRCK
VCC
RSTR
RE
OE
RAD
VSS
DI12
DI13
DI14
DI15
VCC
100-Pin TQFP
Pin Name
SWCK
SRCK
WE
RE
IE
OE
RSTW
RSTR
Function
Serial Write Clock
Serial Read Clock
Write Enable
Read Enable
Input Enable
Output Enable
Write Reset Clock
Read Reset Clock
WAD
Write Address Input
RAD
Read Address Input
DIN0 to 23
DOUT0 to 23
VCC
VSS
VCCQ
VSSQ
NC
Data Input
Data Output
Power Supply (3.3 V)
Ground (0 V)
Power Supply for output
Ground for output
No Connection
Note: The same power supply voltage must be provided to every VCC pin and VCCQ pin, and the same
GND voltage level must be provided to every VSS pin and VSSQ pin.
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FEDS81V26000-02
OKI Semiconductor
MS81V26000
BLOCK DIAGRAM
DO (X24)
RAD
Data-output
Buffer
OE
Serial
RE
RSTR
Read
Controller
SRCK
Read Data Register
(X24)
1,114,112 x 24
X
Decoder
Memory
Read/Write
Refresh
Timing Generater
Array
(X24)
Refresh
Counter
Write Data Register
Data-input
Buffer
DI (X24)
Serial
WAD
IE
Write
WE
Controller
RSTW
SWCK
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MS81V26000
PIN DESCRIPTION
Serial Write Clock: SWCK
The SWCK latches the input data on chip when WE is high, and also increments the internal write address pointer.
Data-in setup time tDS, and hold time tDH are referenced to the rising edge of SWCK.
Write Reset: RSTW
RSTW is used to set the internal write address pointer. RSTW setup and hold times are referenced to the rising
edge of SWCK. The SWCK latches the write address data (21bits serial LSB) from WAD.
Write Enable: WE
WE is used for data write enable/disable control. WE high level enables the input, and WE low level disables the
input and holds the internal write address pointer. There are no WE disable time (low) and WE enable time (high)
restrictions, because the MS81V26000 is in fully static operation as long as the power is on. Note that WE setup
and hold times are referenced to the rising edge of SWCK. The latency for the write operation control by WE is 4.
After write reset, WE must remain low for more than 1600 ns (tFWD). After write reset, the write operation at
address 0 is started after a time tWL form the cycle in which WE is brought high.
After write reset, WE should be remained high for 2 cycles after driving WE high first.
Input Enable: IE
IE is used to enable/disable writing into memory. IE high level enables writing. The internal write address pointer
is always incremented by cycling SWCK regardless of the IE level. Note that IE setup and hold times are
referenced to the rising edge of SWCK. The latency for the write operation control by IE is 4.
Write Address Input: WAD
These pins are used for write address input.
Data Inputs: (DI0-23)
These pins are used for serial data inputs.
Write Reset: RSTW
RSTW is used to set the internal write address pointer. RSTW setup and hold times are referenced to the rising
edge of SWCK. The SWCK latches the write address data (21bits serial LSB) from WAD.
Data Out: (DO0-23)
These pins are used for serial data outputs.
Serial Read Clock: SRCK
Data is shifted out of the data registers. It is triggered by the rising edge of SRCK when RE is high during a read
operation. The SRCK input increments the internal read address pointer when RE is high.
The three-state output buffer provides direct TTL compatibility (no pullup resistor required). Data out is the same
polarity as data in. The output becomes valid after the access time interval tAC that begins with the rising edge of
SRCK. *There are no output valid time restriction on MS81V26000.
Read Reset: RSTR
RSTR is used to set the internal read address pointer. RSTR setup and hold times are referenced to the rising edge
of SRCK. The SWCK latches the read address data (21bits serial LSB) from RAD.
Read Enable: RE
The function of RE is to gate of the SRCK clock for incrementing the read pointer. When RE is high before the
rising edge of SRCK, the read pointer is incremented. When RE is low, the read pointer is not incremented. RE
setup times (tRENS and tRDSS) and RE hold times (tRENH and tRDSH) are referenced to the rising edge of the
SRCK clock.
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FEDS81V26000-02
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MS81V26000
The latency for the read operation control by RE is 4. After read reset, RE must remain low for more than 1600 ns
(tFRD). After read reset, the read data at address 0 is output after a time tRL from the cycle in which WE is brought
high.
After read reset, RE should be remained high for 2 cycles after driving RE high first.
Output Enable: OE
OE is used to enable/disable the outputs. OE high level enables the outputs. The internal read address pointer is
always incremented by cycling SRCK regardless of the OE level. Note that OE setup and hold times are referenced
to the rising edge of SRCK. The latency for the read operation control by OE is 4.
Read Address Input: RAD
These pins are used for read address input.
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MS81V26000
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
Parameter
Symbol
Conditon
Rating
Unit
Power Supply Voltage
VCC
Ta = 25°C
–0.5 to +4.6
V
Input Output Voltage
VT
at Ta = 25°C, VSS
–0.5 to +4.6
V
Output Current
IOS
Ta = 25°C
50
mA
Power Dissipation
PD
Ta = 25°C
1
W
Operating Temperature
Topr
—
0 to 70
°C
Storage Temperature
Tstg
—
–55 to +150
°C
Max.
Unit
Recommended Operating Conditions
Parameter
Symbol
Min.
Typ
Power Supply Voltage
VCC
3.0
3.3
3.6
V
Input High Voltage
VIH
2.0
VCC
VCC + 0.3
V
Input Low Voltage
VIL
–0.3
0
+0.8
V
DC Characteristics
Parameter
Symbol
Condition
Min.
Max.
Unit
Input Leakage Current
ILI
0 < VI < VCC + 0.3 V, Other Pins Tested at V = 0 V
–10
+10
µA
Output Leakage Current
ILO
0 < VO < VCC
–10
+10
µA
Output “H” Level Voltage
VOH
IOH = –2 mA
2.4
—
V
Output “L” Level Voltage
VOL
IOL = 2 mA
—
0.4
V
Operating Current
ICC1
Minimum Cycle Time, Output Open
—
200
mA
Standby Current
ICC2
Input Pin = VIH/VIL
—
5
mA
Capacitance
(VCC = 3.3 V ±0.3 V, Ta = 25°C, f = 1 MHz)
Symbol
Max.
Unit
Input Capacitance
Parameter
CI
6
pF
Output Capacitance
CO
7
pF
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FEDS81V26000-02
OKI Semiconductor
MS81V26000
AC Characteristics
(VCC = 3.3 V ±0.3 V, Ta = 0 to 70°C)
Parameter
Access Time from SRCK
Symbol
MS81V26000-12
Min.
Max.
Unit
tAC
—
9
ns
DOUT Hold Time from SRCK
tDDCK
3
—
ns
DOUT Enable Time from SRCK
tDECK
3
9
ns
SWCK “H” Pulse Width
tWSWH
4
—
ns
SWCK “L” Pulse Width
tWSWL
4
—
ns
Input Data Setup Time
tDS
3
—
ns
Input Data Hold Time
tDH
1
—
ns
WE Enable Setup Time
tWENS
3
—
ns
WE Enable Hold Time
tWENH
1
—
ns
WE Disable Setup Time
tWDSS
3
—
ns
WE Disable Hold Time
tWDSH
1
—
ns
IE Enable Setup Time
tIENS
3
—
ns
IE Enable Hold Time
tIENH
1
—
ns
IE Disable Setup Time
tIDSS
3
—
ns
IE Disable Hold Time
tIDSH
1
—
ns
WE “H” Pulse Width
tWWEH
4
—
ns
WE “L” Pulse Width
tWWEL
4
—
ns
IE “H” Pulse Width
tWIEH
4
—
ns
IE “L” Pulse Width
tWIEL
4
—
ns
RSTW Setup Time
tRSTWS
3
—
ns
RSTW Hold Time
tRSTWH
1
—
ns
SRCK “H” Pulse Width
tWSRH
4
—
ns
SRCK “L” Pulse Width
tWSRL
4
—
ns
RE Enable Setup Time
tRENS
3
—
ns
RE Enable Hold Time
tRENH
1
—
ns
RE Disable Setup Time
tRDSS
3
—
ns
RE Disable Hold Time
tRDSH
1
—
ns
OE Enable Setup Time
tOENS
3
—
ns
OE Enable Hold Time
tOENH
1
—
ns
OE Disable Setup Time
tODSS
3
—
ns
OE Disable Hold Time
tODSH
1
—
ns
RE “H” Pulse Width
tWREH
4
—
ns
RE “L” Pulse Width
tWREL
4
—
ns
OE “H” Pulse Width
tWOEH
4
—
ns
OE “L” Pulse Width
tWOEL
4
—
ns
RSTR Setup Time
tRSTRS
3
—
ns
RSTR Hold Time
tRSTRH
1
—
ns
SWCK Cycle Time
tSWC
12
—
ns
SRCK Cycle Time
tSRC
12
—
ns
tT
1
5
ns
Transition Time (Rise and Fall)
8/20
FEDS81V26000-02
OKI Semiconductor
Parameter
MS81V26000
Symbol
MS81V26000-12
Min.
Max.
Unit
WE “L” Period before W Reset
tLWE
4
—
clk
RE “L” Period before R Reset
tLRE
4
—
clk
RE Delay after Reset
tFRD
1,600
—
ns
WE Delay after Reset
tFWD
1,600
—
ns
Write address input period
TWAE
21
—
Clk
Read address input period
TRAE
21
—
clk
Latency
Parameter
Symbol
MS81V26000-12
Unit
Write Latency
tWL
4
clk
Read Latency
tRL
4
clk
WE Write Control Latency
tWEL
4
clk
IE Write Control Latency
tIEL
4
clk
RE Read Control Latency
tREL
4
clk
OE Read Control Latency
tOEL
4
clk
AC Characteristic Measuring Conditions
Output Compare Level
Output Load
Input Signal Level
1.4 V
1 TTL + 30 pF
2.4 V/0.4 V
Input Signal Rise/Fall Time
1 ns
Input Signal Measuring Reference Level
1.4 V
Note: When transition time tT becomes 1 ns or more, the input signal reference levels for the parameter
measurement are VIH (min.) and VIL (max.).
9/20
FEDS81V26000-02
OKI Semiconductor
MS81V26000
OPERATION MODE
Write Operation Cycle
The write operation is controlled by four control signals, SWCK, RSTW, WE and IE. The write operation is
accomplished by cycling SWCK, and holding WE high after the write address pointer reset operation or RSTW.
RSTW must be performed for internal circuit initialization before write operation. WE must be low before and
after the reset cycle (tLWE + tWAE + tFWD).
Each write operation, which begins after RSTW must contain at least 231 active write cycles, i.e., SWCK cycles
while WE and IE are high.
Settings of WE and IE to the operation mode of Write address pointer and Data input.
WE
IE
H
H
H
L
L
X
Internal Write address pointer
Incremented
Halted
Data input (Latency 4)
Input
Not input
X indicates "don't care"
Read Operation Cycle
The read operation is controlled by four control signals, SRCK, RSTR, RE, and OE. The read operation is
accomplished by cycling SRCK, and holding both RE and OE high after the read address pointer reset operation or
RSTR.
Each read operation, which begins after RSTR, must contain at least 231 active read cycles, i.e., SRCK cycles
while RE and OE are high. RE must be low before and after the reset cycle (tLRE + tRAE + tFWD).
Settings of RE and OE to the operation mode of read address pointer and Data output.
RE
OE
H
H
H
L
L
H
L
L
Internal Read address pointer
Incremented
Halted
Data output (Latency 4)
Output
High impedance
Output
High impedance
Power-up and Initialization
To assure proper operation of this Memory, place an interval of at least 200 µs after Vcc has stabilized to a value
within the range of recommended operating conditions after power-up prior to the operation start. After this 200 µs
stabilization interval, the following initialization sequence must be performed. Because the read and write address
pointers are undefined after power-up, a minimum of 150 dummy write operations (SWCK cycles) and read
operations (SRCK cycles) must be performed, followed by an RSTW operation and an RSTR operation, to
properly initialize the write and the read address pointer.
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FEDS81V26000-02
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MS81V26000
New Data Read Access
In order to read out “new data,” i.e., to read out data that has been written in a follow-up manner, read reset must be
input after write address 150 and the difference between the read address and the write address must be 350 or
more but 1,114,111 or less.
Old Data Read Access
In order to read out “old data,” i.e., to read out data that was written prior to the write operation being carried out,
the difference between the read address and the write address must be 0 or more but 30 or less. If the difference
between the read address and the write address is between 31 and 349 or 1,114,112 or more, it is unpredictable
whether the new data is output or whether the old data is output. In this case, however, the write data will be written
normally.
11/20
IE
WE
DI 0-23
WAD
RSTW
SWCK
Dn-2
tLWE
Dn-1
tWSWL
tWSWH
Dn
tWANS
WA1
tWANH
tRSTWH
WA0
tRSTWS
WA2
tWAE
W19
WA20
tFWD
tWAE (=21clk):Period of Address input from Write Reset.
After write reset, WE should be remained high for 2 cycles after driving WE high first.
Dn-3
tDS tDH
tSWC
Write Cycle Timing (Write Reset)
TIMING DIAGRAM
tWL
D0
D1
0 cycle 1 cycle
FEDS81V26000-02
OKI Semiconductor
MS81V26000
12/20
FEDS81V26000-02
OKI Semiconductor
MS81V26000
Write Cycle Timing (Write Enable)
1 cycle 2 cycle 3 cycle 4 cycle
5 cycle
6 cycle 7 cycle
SWCK
tWENH
tWWEL
tWENS
tWWEH
WE
tWDSH
DI 0-23
D0
D1
D2
tWDSS
D3
D5
D4
D6
D7
tWEL
RSTW
“L”
“H”
IE
Write Cycle Timing (Input Enable)
1 cycle
2 cycle 3 cycle 4 cycle
5 cycle 6 cycle 7 cycle 8 cycle 9 cycle 10 cycle 11 cycle
SWCK
tIENH
tWIEL
tIENS
tWIEH
IE
tIDSH
DI 0-23
D0
D1
D2
tIDSS
D3
D4
D5
D10
D11
tIEL
RSTW
WE
“L”
“H”
13/20
OE
RE
DO 0-23
RAD
RSTR
SRCK
tLRE
Qn-2
Qn-1
tWSRL
tWSRH
Qn
tRANS
RA1
tRANH
tRSTRH
RA0
tRSTRS
RA2
tRAE
RA19
RA20
tRAE (=21clk): Period of Address input from Read Reset.
After read reset, RE should be remained high for 2 cycles after driving RE high first.
“H”
Qn-3
tSRC
Read Cycle Timing (Read Reset)
tFRD
tRL
tAC
Q0
0 cycle 1 cycle
Q1
FEDS81V26000-02
OKI Semiconductor
MS81V26000
14/20
FEDS81V26000-02
OKI Semiconductor
MS81V26000
Read Cycle Timing (Read Enable)
1 cycle 2 cycle 3 cycle 4 cycle
6 cycle 7 cycle
5 cycle
SRCK
tRENH
tWREL
tRENS
tWREH
RE
tRDSH
DO 0-23
Q0
Q1
Q2
tAC
tRDSS
Q4
Q3
Q5
Q6
Q7
tREL
RSTR
“L”
OE
“H”
Read Cycle Timing (Output Enable)
1 cycle 2 cycle 3 cycle 4 cycle
5 cycle 6 cycle 7 cycle 8 cycle
9 cycle 10 cycle 11 cycle
SRCK
tOENH
tWOEL
tWOEH
tOENS
OE
tAC
tODSH
DO 0-23
Q0
Q1
Q2
tODSS
Q3
Q4
tDDCK
Q5
tDECK
Q10
Q11
tOEL
RSTR
“L”
RE
“H”
15/20
tWAE + tFWD
tWL
A1
2
tLRE
Xn
n
tRAE + tFRD
tRL
tAC
0
Address difference is 350 or more
and 1,114,111 or less.
148 149 150 151 152
Read Reset should be input
after write address 150.
A0
1
The setting address for reading and that for writing are the same.
“H”
“H”
Xn-3 Xn-2 Xn-1 Xn
tLWE
0
A0
1
A1
2
A2
3
A3
4
A4
5
A5
6
A6
7
OKI Semiconductor
OE
DO 0-23
RE
RSTR
SRCK
IE
DI 0-23
WE
RSTW
SWCK
n
Read / Write Cycle Timing (New Data Read)
FEDS81V26000-02
MS81V26000
16/20
tWAE + tFWD
tWL
tLRE
n
Xn
A0
1
A2
3
A3
4
A4
tRAE + tFRD
tRL
Address difference is 30 or less.
A1
2
The setting address for reading and that for writing are the same.
“H”
“H”
Bn-3 Bn-2 Bn-1 Bn
tLWE
0
0
B0
1
B1
2
B2
3
B3
4
B4
OKI Semiconductor
OE
DO 0-23
RE
RSTR
SRCK
IE
DI 0-23
WE
RSTW
SWCK
n
Read / Write Cycle Timing (Old Data Read)
FEDS81V26000-02
MS81V26000
17/20
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OKI Semiconductor
MS81V26000
PACKAGE DIMENSIONS
(Unit: mm)
TQFP100-P-1414-0.50-K
Mirror finish
5
Package material
Lead frame material
Pin treatment
Package weight (g)
Rev. No./Last Revised
Epoxy resin
42 alloy
Solder plating (≥5µm)
0.55 TYP.
4/Oct. 28, 1996
Notes for Mounting the Surface Mount Type Package
The surface mount type packages are very susceptible to heat in reflow mounting and humidity absorbed in storage.
Therefore, before you perform reflow mounting, contact Oki’s responsible sales person for the product name,
package name, pin number, package code and desired mounting conditions (reflow method, temperature and
times).
18/20
FEDS81V26000-02
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MS81V26000
REVISION HISTORY
Document
No.
Date
Page
Previous Current
Edition
Edition
Description
FEDS81V26000-01
May 14, 2004


Final edition 1
FEDS81V26000-01
Dec 15, 2004
20
20
P17 DI0-23 XnÆBn
19/20
FEDS81V26000-02
OKI Semiconductor
MS81V26000
NOTICE
1. The information contained herein can change without notice owing to product and/or technical improvements.
Before using the product, please make sure that the information being referred to is up-to-date.
2. The outline of action and examples for application circuits described herein have been chosen as an explanation
for the standard action and performance of the product. When planning to use the product, please ensure that the
external conditions are reflected in the actual circuit, assembly, and program designs.
3. When designing your product, please use our product below the specified maximum ratings and within the
specified operating ranges including, but not limited to, operating voltage, power dissipation, and operating
temperature.
4. Oki assumes no responsibility or liability whatsoever for any failure or unusual or unexpected operation
resulting from misuse, neglect, improper installation, repair, alteration or accident, improper handling, or
unusual physical or electrical stress including, but not limited to, exposure to parameters beyond the specified
maximum ratings or operation outside the specified operating range.
5. Neither indemnity against nor license of a third party’s industrial and intellectual property right, etc. is granted
by us in connection with the use of the product and/or the information and drawings contained herein. No
responsibility is assumed by us for any infringement of a third party’s right which may result from the use
thereof.
6. The products listed in this document are intended for use in general electronics equipment for commercial
applications (e.g., office automation, communication equipment, measurement equipment, consumer
electronics, etc.). These products are not, unless specifically authorized by Oki, authorized for use in any
system or application that requires special or enhanced quality and reliability characteristics nor in any system
or application where the failure of such system or application may result in the loss or damage of property, or
death or injury to humans.
Such applications include, but are not limited to, traffic and automotive equipment, safety devices, aerospace
equipment, nuclear power control, medical equipment, and life-support systems.
7. Certain products in this document may need government approval before they can be exported to particular
countries. The purchaser assumes the responsibility of determining the legality of export of these products and
will take appropriate and necessary steps at their own expense for these.
8. No part of the contents contained herein may be reprinted or reproduced without our prior permission.
Copyright 2004 Oki Electric Industry Co., Ltd.
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