SSM2305AGN P-channel Enhancement-mode Power MOSFET Low gate-charge -30V BV DSS D Simple drive requirement 80mΩ R DS(ON) Fast switching Pb-free; RoHS compliant. -3.2A ID G S DESCRIPTION D The SSM2305AGN is in a SOT-23-3 package, which is widely used for lower power commercial and industrial surface mount applications. This device is suitable for low-voltage applications such as DC/DC converters and and SOT-23-3 general switching applications. S G ABSOLUTE MAXIMUM RATINGS Parameter Symbol VDS Drain-Source Voltage VGS Gate-Source Voltage ID @ TA=25°C ID @ TA=70°C Rating Units -30 V ± 12 V Continuous Drain Current 3 -3.2 A Continuous Drain Current 3 -2.6 A 1,2 IDM Pulsed Drain Current -10 A PD @ TA=25°C Total Power Dissipation 1.38 W Linear Derating Factor 0.01 W/°C TSTG Storage Temperature Range -55 to 150 °C TJ Operating Junction Temperature Range -55 to 150 °C THERMAL DATA Symbol RΘJA 2/16/2005 Rev.2.1 Parameter Maximum Thermal Resistance, Junction-ambient 3 www.SiliconStandard.com Value Unit 90 °C/W 1 of 5 SSM2305AGN ELECTRICAL CHARACTERISTICS (at Tj = 25°C unless otherwise specified) Symbol Parameter Test Conditions Min. Typ. Max. Units -30 - - V V/°C BVDSS Drain-Source Breakdown Voltage ∆ BV DSS/ ∆Tj Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=-1mA - -0.1 - RDS(ON) Static Drain-Source On-Resistance VGS=-10V, ID=-3.2A - - 60 mΩ VGS=-4.5V, ID=-3.0A - - 80 mΩ VGS=-2.5V, ID=-2.0A - - 150 mΩ VGS=-1.8V, ID=-1.0A - - 250 mΩ VDS=VGS, ID=-250uA -0.5 - -1.2 V VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS VDS=-5V, ID=-3.0A - 9 - S o VDS=-30V, VGS=0V - - -1 uA o Drain-Source Leakage Current (Tj=70 C) VDS=-24V, VGS=0V - - -25 uA Gate-Source Leakage VGS= ± 12V - - ±100 nA ID=-3.2A - 10 18 nC Drain-Source Leakage Current (Tj=25 C) IGSS VGS=0V, ID=-250uA 2 Qg Total Gate Charge Qgs Gate-Source Charge VDS=-24V - 1.8 - nC Qgd Gate-Drain ("Miller") Charge VGS=-4.5V - 3.6 - nC VDS=-15V - 7 - ns 2 td(on) Turn-on Delay Time tr Rise Time ID=-3.2A - 15 - ns td(off) Turn-off Delay Time RG=3.3Ω , VGS=-10V - 21 - ns tf Fall Time RD=4.6Ω - 15 - ns Ciss Input Capacitance VGS=0V - 735 1325 pF Coss Output Capacitance VDS=-25V - 100 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 80 - pF Min. Typ. Source-Drain Diode Symbol Parameter 2 Test Conditions Max. Units VSD Forward On Voltage IS=-1.2A, VGS=0V - - -1.2 V trr Reverse Recovery Time IS=-3.2A, VGS=0V, - 24 - ns Qrr Reverse Recovery Charge dI/dt=100A/µs - 19 - nC Notes: 1.Pulse width limited by maximum junction temperature. 2.Pulse width <300us, duty cycle <2%. 3.Surface-mounted on 1 in2 copper pad on FR4 board ; 270°C/W when mounted on minimum copper pad. 2/16/2005 Rev.2.1 www.SiliconStandard.com 2 of 5 SSM2305AGN 36 40 T A =25 o C TA=150oC 32 -5.0V -4.0V 28 30 -4.0V 20 -3.0V 10 V G = -2.0V -ID , Drain Current (A) -ID , Drain Current (A) -5.0V 24 20 -3.0V 16 12 V G = -2.0V 8 4 0 0 0 1 2 3 4 5 6 7 8 9 0 Fig 1. Typical Output Characteristics 2 3 4 5 6 7 Fig 2. Typical Output Characteristics 300 1.8 I D = -1.0A T A =25 o C I D = -3.0A V GS = -4.5V 1.6 Normalized RDS(ON) RDS(ON) (mΩ ) 1 -V DS , Drain-to-Source Voltage (V) -V DS , Drain-to-Source Voltage (V) 200 100 1.4 1.2 1 0.8 0 0.6 0 2 4 6 8 10 12 -50 0 -V GS , Gate-to-Source Voltage (V) 50 100 150 T j , Junction Temperature ( o C) Fig 3. On-Resistance vs. Gate Voltage Fig 4. Normalized On-Resistance vs. Junction Temperature 100 1.5 10 1 T j =25 o C -VGS(th) (V) -IS(A) T j =150 o C 1 0.5 0.1 0 0.01 0 0.4 0.8 1.2 -V SD , Source-to-Drain Voltage (V) Fig 5. Forward Characteristic of Reverse Diode 2/16/2005 Rev.2.1 1.6 -50 0 50 T j , Junction Temperature ( 100 o 150 C) Fig 6. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 3 of 5 SSM2305AGN 12 I D = -3.2A V DS = -24V 10 -VGS , Gate to Source Voltage (V) f=1.0MHz 10000 8 1000 C (pF) Ciss 6 4 Coss Crss 100 2 0 10 0 2 4 6 8 10 12 1 5 9 13 17 21 25 29 -V DS , Drain-to-Source Voltage (V) Q G , Total Gate Charge (nC) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 1 100 Normalized Thermal Response (Rthja) DUTY=0.5 -ID (A) 10 1ms 1 10ms 0.1 100ms o T A =25 C Single Pulse 1s DC 0.01 0.2 0.1 0.1 0.05 PDM t 0.01 T Duty factor = t/T Peak T j = PDM x Rthja + Ta 0.01 Single pulse RΘja = 270°C/W 0.001 0.1 1 10 100 0.0001 0.001 0.01 -V DS , Drain-to-Source Voltage (V) Fig 9. Maximum Safe Operating Area VDS 90% 0.1 1 10 100 1000 t , Pulse Width (s) Fig 10. Effective Transient Thermal Impedance VG QG -4.5V QGS QGD 10% VGS td(on) tr td(off) tf Fig 11. Switching Time Circuit 2/16/2005 Rev.2.1 Charge Q Fig 12. Gate Charge Circuit www.SiliconStandard.com 4 of 5 SSM2305AGN Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 2/16/2005 Rev.2.1 www.SiliconStandard.com 5 of 5