SSM4880AGM N-CHANNEL ENHANCEMENT-MODE POWER MOSFET Low on-resistance D Fast switching, planar construction D D D Simple drive requirement S S 30V R DS(ON) 9mΩ 13A ID G SO-8 BV DSS S Description D Power MOSFETs from Silicon Standard provide the designer with the best combination of fast switching, ruggedized device design, low on-resistance and cost-effectiveness. G G S S The SO-8 package is widely preferred for commercial and industrial surface mount applications and the SSM4880AGM is well suited for for low-voltage applications such as DC/DC converters. Pb-free lead finish (second-level interconnect) Absolute Maximum Ratings Symbol Parameter VDS Drain-Source Voltage VGS Gate-Source Voltage ID @ TA=25°C ID @ TA=70°C Rating Units 30 V ±20 V 3 13 A 3 10 A Continuous Drain Current Continuous Drain Current 1 IDM Pulsed Drain Current 50 A PD @ TA=25°C Total Power Dissipation 2.5 W 0.02 W/°C 266 mJ 7.3 A Linear Derating Factor 4 EAS Single Pulse Avalanche Energy IAR Avalanche Current TSTG Storage Temperature Range -55 to 150 °C TJ Operating Junction Temperature Range -55 to 150 °C Thermal Data Symbol Rthj-a 3/08/2005 Rev.2.2 Parameter 3 Thermal Resistance Junction-ambient Max. www.SiliconStandard.com Value Unit 50 °C/W 1 of 5 SSM4880AGM Electrical Characteristics @ Tj=25oC (unless otherwise specified) Symbol Parameter Test Conditions VGS=0V, ID=250uA Min. Typ. Max. Units 30 - - V V/°C BVDSS Drain-Source Breakdown Voltage ∆ BV DSS/∆Tj Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA - 0.037 - RDS(ON) Static Drain-Source On-Resistance VGS=10V, ID=13A - - 9 mΩ VGS=4.5V, ID=10A - - 15 mΩ VGS(th) Gate Threshold Voltage VDS=VGS, ID=250uA 1 - 3 V gfs Forward Transconductance VDS=15V, ID=10A - 20 - S IDSS Drain-Source Leakage Current (Tj=25°C) VDS=30V, VGS=0V - - 1 uA Drain-Source Leakage Current (Tj=55°C) VDS=24V, VGS=0V - - 25 uA Gate-Source Leakage VGS= ± 20V - - IGSS nA Qg Total Gate Charge ID=13A - ±100 22.5 - Qgs Gate-Source Charge VDS=15V - 3.3 - nC Qgd Gate-Drain ("Miller") Charge VGS=5V - 15.4 - nC VDS=15V - 9 - ns - 16 - ns 2 2 nC td(on) Turn-on Delay Time tr Rise Time ID=1A td(off) Turn-off Delay Time RG=6.2Ω ,VGS=10V - 25 tf Fall Time RD=15Ω - 50 - ns Ciss Input Capacitance VGS=0V - 813 - pF Coss Output Capacitance VDS=25V - 516 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 224 - pF Min. Typ. - - 2.3 A - - 50 A - - 1.3 V - ns Source-Drain Diode Symbol IS ISM VSD Parameter Test Conditions VD=VG=0V , VS=1.3V Continuous Source Current ( Body Diode ) 1 Pulsed Source Current ( Body Diode ) 2 Forward On Voltage Tj=25°C, IS=2.3A, VGS=0V Max. Units Notes: 1.Pulse width limited by safe operating area. 2.Pulse width <300us , duty cycle <2%. 3.Surface mounted on 1 in2 copper pad of FR4 board ; 125°C/W when mounted on min. copper pad. 4.Starting Tj=25oC , VDD=25V , L=10mH , R G=25Ω 3/08/2005 Rev.2.2 www.SiliconStandard.com 2 of 5 SSM4880AGM 50 50 10V 8.0V 6.0V 5.0V ID , Drain Current (A) 40 40 V G = 4 .0 V 30 20 10 30 V G = 4 .0 V 20 10 0 0 0 1 2 3 4 5 6 0 V DS , Drain-to-Source Voltage (V) 1 2 3 4 5 6 V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 21 1.8 I D =10A T A =25°C I D =13A V G =10V 1.6 Normalized R DS(ON) 17 RDS(ON) (mΩ ) 10V 8.0V 6.0V 5.0V T A =150 o C ID , Drain Current (A) o T A =25 C 13 1.4 1.2 1 9 0.8 0.6 5 2 4 6 8 10 -50 0 100 150 Fig 4. Normalized On-Resistance vs. Junction Temperature 100 3 10 2 VGS(th) (V) IS(A) Fig 3. On-Resistance vs. Gate Voltage T j =150 o C 50 T j , Junction Temperature ( o C) V GS , Gate-to-Source Voltage (V) T j =25 o C 1 1 0.1 0 0.1 0.3 0.5 0.7 0.9 1.1 1.3 -50 0 V SD , Source-to-Drain Voltage (V) Fig 5. Forward Characteristic of Reverse Diode 3/08/2005 Rev.2.2 50 100 150 o T j , Junction Temperature( C) Fig 6. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 3 of 5 SSM4880AGM f=1.0MHz 16 10000 I D =13A V DS =15V 12 10 C (pF) VGS , Gate to Source Voltage (V) 14 8 1000 C iss C oss 6 4 C rss 2 100 0 0 10 20 30 40 1 50 6 Q G , Total Gate Charge (nC) 11 16 21 V DS , Drain-to-Source Voltage (V) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 1 100 Normalized Thermal Response (Rthja) Duty factor = 0.5 10 1ms ID (A) 10ms 1 100ms 0.1 1s 10s DC o T A =25 C Single Pulse 0.01 0.2 0.1 0.1 0.05 0.02 0.01 PDM 0.01 t Single Pulse T Duty Factor = t/T Peak Tj = PDM x Rthja + Ta Rthja=125oC/W 0.001 0.1 1 10 100 0.0001 0.001 0.01 V DS , Drain-to-Source Voltage (V) Fig 9. Maximum Safe Operating Area 0.1 1 10 100 1000 t , Pulse Width (s) Fig 10. Effective Transient Thermal Impedance VG VDS 90% QG 5V QGS QGD 10% VGS td(on) tr td(off) tf Fig 11. Switching Time Waveform 3/08/2005 Rev.2.2 Charge Q Fig 12. Gate Charge Waveform www.SiliconStandard.com 4 of 5 SSM4880AGM Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 3/08/2005 Rev.2.2 www.SiliconStandard.com 5 of 5