BUF11705 SBOS349 − DECEMBER 2005 22-V Supply, 10+1 Channel Gamma Correction Buffer FEATURES DESCRIPTION D D D D The BUF11705 is a multi-channel buffer targeted towards gamma correction in high-resolution LCD panels. It is pin-compatible with the existing BUF11702 and BUF11704 and operates at higher supply voltages up to 22 V (24 V absolute max). The higher supply voltage enables faster response times and brighter images in large-screen LCD panels. This is especially important in LCD TV applications. The BUF11705 offers 10 gamma channels. For additional space and cost savings, a VCOM channel with > 100 mA drive capability is integrated into the BUF11705. The BUF11705 is available in the TSSOP-28, PowerPAD package for dramatically increased power dissipation capability. This allows, a large number of channels to be handled safely in one package. A flow-through pinout has been adopted to allow simple PCB routing and maintain cost-effectiveness. All inputs and outputs of the BUF11705 incorporate internal ESD protection circuits that prevent functional failures at voltages up to 8 kV (HBM), 2 kV (CDM), and 300 V (MM). D D D D D D Wide Supply Range: 7 V to 22 V Gamma Correction Channels: 10 Integrated VCOM Buffer Excellent Output Current Drive: − Gamma Channels: > 30 mA at 0.5 V Swing to Rails(1) − VCOM: > 100 mA typ at 2 V Swing to Rails(1) Large Capacitive Load Drive Capability Rail-to-Rail Output PowerPAD Package Low-Power/Channel: < 500 µA High ESD Rating: 8 kV HBM, 2 kV CDM, 300 V MM Specified for −25°C to +85°C (1) See Typical Characteristic curves for details. V DD So urce Driver BUF117 05 Gamma 1 Gamma 2 Gamma 3 Gamma (n − 2) Gamma (n − 1) Gamma (n ) V COM Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PowerPAD is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. Copyright 2005, Texas Instruments Incorporated ! ! www.ti.com "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range unless otherwise noted(1) PARAMETERS Supply voltage, VDD(2) Input voltage range, VI BUF11705 UNIT 24 V Continuous total power dissipation ±VDD See dissipation rating table Operating free-air temperature range, TA −25 to +85 °C Maximum junction temperature, TJ +125 °C Storage temperature range, TSTG −65 to +150 °C +260 °C Human body model (HBM) 8 kV Charged-device model (CDM) 2 kV Lead temperature 1.6mm (1/16 inch) from case for 10s ESD rating: Machine model (MM) 300 V (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values are with respect to GND. ORDERING INFORMATION(1) PRODUCT PACKAGE-LEAD BUF11705 TSSOP-28 PACKAGE MARKING BUF11705 (1) For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet or see the TI website at www.ti.com. DISSIPATION RATING TABLE PACKAGE TYPE PACKAGE DESIGNATOR θJC(1) (°C/W) TSSOP-28 PWP (28) 0.72 (1) PowerPAD attached to PCB, 0 lfm airflow, and 76mm x 76mm copper area. qJA(1) (°C/W) TA ≤ 25°C POWER RATING 27.9 3.58 W RECOMMENDED OPERATING CONDITIONS MIN Supply voltage, VDD Operating free-air temperature, TA 2 NOM MAX UNIT 7 22 V −25 +85 °C "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 ELECTRICAL CHARACTERISTICS: BUF11705 Over operating free-air temperature range, VDD = 18 V, TA = +25°C, unless otherwise noted. PARAMETER TEST CONDITIONS Gamma buffers VIO Input offset voltage TA +25°C MIN VCOM +25°C −1 Full range(1) IIB Input bias current VI = VDD/2 PSRR Power-Supply Rejection Ratio VDD = 4.5 V to 22 V Buffer gain VI = 5 V 3dB bandwidth SR Slew rate Crosstalk IDD Supply current ALL 30 VOH1-5 62 Full range(1) 60 VOH6-10 VOL1-5 High-level output voltage V/V +25°C 1 0.6 MHz CL = 100 pF, RL = 2 kΩ VIN = 2 V to 16 V +25°C 1.6 4.6 V/µs VIPP = 6 V, f = 1 kHz +25°C 85 dB 25°C 5 VO = VDD/2 No Load Full range Low-level output voltage VOL6-10 VOHCOM VOLCOM Buffers 1-10 sinking Buffers 1-10 sourcing IO = −1 mA to −10 mA VIN = 17 V Buffers 6-10 High-level output voltage VCOM buffer Low-level output voltage VCOM buffer GND 1 IO = 1 mA to 100 mA, VIN = 2 V VIN = 18 V ISOURCE = 10 mA VIN = 17 V ISINK = 10 mA VIN = 17 V ISOURCE = 10 mA VIN = 1 V ISINK = 10 mA VIN = 1 V ISOURCE = 10 mA VIN = 0 V ISINK = 10 mA VIN = 16 V ISINK = 100 mA VIN = 16 V ISOURCE = 100 mA VIN = 2 V ISINK = 100 mA VIN = 2 V ISOURCE = 100 mA +25°C VDD VDD − 1 VDD 1 Full range mA V 5 5 +25°C 1 Full range 5 5 +25°C 1 Full range 5 mV/mA 5 +25°C 1 Full range +25°C 9.0 9.0 1 +25°C +25 C IO = 1 mA to 10 mA VIN = 1 V Buffers 1-5 dB 0.9995 IO = −1 mA to −100 mA VIN = 16 V Buffers 6-10 80 +25°C VCOM buffer sourcing Buffers 1-5 pA 200 +25°C VCOM buffer Load regulation mV CL = 100 pF, RL = 2 kΩ Buffers 6-10 VCOM buffer sinking 30 1 Full range(1) Buffers 1-5 Common-mode input range UNIT 20 20 +25°C BW_3dB MAX −1 Full range(1) VI = 9V Gamma buffers VCOM buffer Gamma buffers VCOM buffer TYP 5 5 17.85 17.9 17 V 17.15 +25°C V 16.85 17 1.0 1.15 +25°C V 0.85 +25°C 1.0 0 0.15 16 16.15 +25°C V V 15.85 16 2 +25°C 2.15 V 1.85 2 (1) Full range is −25°C to +85°C. 3 "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 EQUIVALENT SCHEMATICS OF INPUTS AND OUTPUTS INPUT STAGE OF BUFFERS BUF11705: 1 to 5 and VCOM VS OUTPUT STAGE OF ALL BUFFERS INPUT STAGE OF BUFFERS BUF11705: 6 to 10 VS VS Previous Stage Next Stage Next Stage Buffer Input Buffer Output Buffer Input Buffer Output Next Stage Next Stage GND Previous Stage GND GND Internal to BUF11705 Internal to BUF11705 PIN CONFIGURATION BUF11705 VDD 1 28 VDD NC 2 27 NC OUT1 3 26 IN1 OUT2 4 25 IN2 OUT3 5 24 IN3 OUT4 6 23 IN4 OUT5 7 22 IN5 OUT6 8 21 IN6 OUT7 9 20 IN7 OUT8 10 19 IN8 OUT9 11 18 IN9 OUT10 12 17 IN10 OUTCOM 13 16 INCOM GND 14 15 GND TSSOP−28 PowerPAD NC = No Internal Connection 4 Inverting Input Buffer Output "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 TYPICAL CHARACTERISTICS Over operating free-air temperature range, unless otherwise noted. DC CURVES INPUT OFFSET VOLTAGE vs INPUT VOLTAGE INPUT OFFSET VOLTAGE vs INPUT VOLTAGE 20 VS = 18 V Channels 1−5 15 VOS − Input Offset Voltage − mV VOS − Input Offset Voltage − mV 20 10 5 0 −5 −10 −15 −20 VS = 18 V Channels 6−10 15 10 5 0 −5 −10 −15 −20 0 3 6 9 12 15 18 0 6 12 15 Figure 1 Figure 2 18 INPUT BIAS CURRENT vs FREE−AIR TEMPERATURE 250 IIB − Input Bias Current − pA Channels VCOM VS = 18 V 15 10 5 0 −5 −10 200 150 100 50 −15 0 −20 0 3 6 9 12 15 0 18 10 20 30 40 50 60 70 80 85 TA − Free−Air Temperature − _C VIN − Input Voltage − V Figure 3 Figure 4 HIGH−LEVEL OUTPUT VOLTAGE vs HIGH−LEVEL OUTPUT CURRENT OUTPUT VOLTAGE vs OUTPUT CURRENT 18 −10_ C +25_C VDD = 18 V Channels 1−5 14 12 +85_ C 10 8 +25_C 6 4 2 −10_ C 0 VOH − High−Level Output Voltage − V 18.0 16 VO − Output Voltage − V 9 VIN − Input Voltage − V INPUT OFFSET VOLTAGE vs INPUT VOLTAGE 20 VOS − Input Offset Voltage − mV 3 VIN − Input Voltage − V TA = −10_ C 17.8 TA = +25_ C 17.6 17.4 TA = +85_ C 17.2 VDD = 18 V Channels 1−5 17.0 0 10 20 30 40 50 60 70 IO − Output Current − mA Figure 5 80 90 100 0 5 10 IOH 15 20 25 30 35 40 45 50 − High−Level Output Current − mA Figure 6 5 "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 TYPICAL CHARACTERISTICS (continued) Over operating free-air temperature range, unless otherwise noted. DC CURVES (continued) BLANK SPACE OUTPUT VOLTAGE vs OUTPUT CURRENT LOW−LEVEL OUTPUT VOLTAGE vs LOW−LEVEL OUTPUT CURRENT (Detailed View) 18 VOL − Low−Level Output Voltage − V 1.0 VO − Output Voltage − V 16 14 12 10 8 −10_ C 6 +25_ C 4 2 +85_C VSUPPLY = 18 V Channels 6−10 0 0 10 20 30 40 50 60 70 80 90 Channels 6−10 0.9 0.8 0.7 +85_C 0.6 0.5 0.4 0.3 +25_ C 0.2 −10_ C 0.1 0 100 0 10 I O − Output Current − mA 20 30 40 50 IOL − Low−Level Output Current − mA Figure 7 Figure 8 OUTPUT VOLTAGE vs OUTPUT CURRENT SUPPLY CURRENT vs SUPPLY VOLTAGE 18 6 5 14 Supply Current − mA VO − Output Voltage − V 16 12 VSUPPLY = 18 V VCOM Buffer 10 +85_ C +25_C −10_C 8 6 4 4 3 2 1 2 0 0 0 25 50 75 100 125 150 175 200 225 250 0 2 4 6 8 I O − Output Current − mA Figure 9 12 14 16 18 20 Figure 10 INPUT BIAS CURRENT vs INPUT VOLTAGE SUPPLY CURRENT vs FREE−AIR TEMPERATURE 6 5 VS = 18 V 4 5 IB − Input Bias Current − pA I Q − Supply Current − mA 10 Supply Voltage − V 4 3 2 1 3 2 1 0 −1 −2 −3 −4 −5 0 −50 −25 0 25 50 75 TA − Free−Air Temperature − _C Figure 11 6 100 125 0 2 4 6 8 10 12 14 VIN − Input Voltage − V Figure 12 16 18 20 "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 TYPICAL CHARACTERISTICS (continued) Over operating free-air temperature range, unless otherwise noted. POWER−SUPPLY REJECTION RATIO vs FREQUENCY VDD = 10 V RL = 2 k CL = 100 pF 80 70 60 50 Gamma Channels 40 VCOM Buffer 30 20 10 0 10 100 1k 10 k 100 k f − Frequency − Hz Figure 13 1M 10 M CMRR − Common−Mode Rejection Ratio − dB PSRR − Power−Supply Rejection Ratio − dB AC CURVES CROSSTALK vs FREQUENCY 0 VSUPPLY = 10 V VIN = 1 VPP 20 40 60 80 100 120 140 10 100 1k 10 k 100 k 1M f − Frequency − Hz Figure 14 7 "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 TYPICAL CHARACTERISTICS (continued) Over operating free-air temperature range, unless otherwise noted. SMALL- AND LARGE-SIGNAL WAVEFORM CURVES SMALL−SIGNAL WAVEFORM 50 mV/div 50 mV/div SMALL−SIGNAL WAVEFORM RLOAD = 2 kΩ CLOAD = 100 pF Channels 1−5 t − Time − 500 ns/div RLOAD = 2 kΩ CLOAD = 100 pF Channels 6−10 t − Time − 500 ns/div Figure 16 Figure 15 SMALL−SIGNAL WAVEFORMVCOM BUFFER LARGE−SIGNAL WAVEFORM RLOAD = 2 kΩ CLOAD = 100 pF VCOM Buffer 3 V/div 50 mV/div RLOAD = 2 kΩ CLOAD = 100 pF VDD = 15 V t − Time − 500 ns/div Channels 1−5 t − Time − 4 µs/div Figure 17 Figure 18 LARGE−SIGNAL WAVEFORMVCOM BUFFER LARGE−SIGNAL WAVEFORM RLOAD = 2 kΩ C LOAD = 100 pF VCOM Buffer VDD = 15 V 3 V/div 3 V/div RLOAD = 2 kΩ CLOAD = 100 pF VDD = 15 V Channels 6−10 8 t − Time − 4 µs/div t − Time − 4 µs/div Figure 19 Figure 20 "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 correction resistor ladder. The low output impedance of the BUF11705 forces the external gamma correction voltage on the respective reference node of the LCD source driver. Figure 21 shows an example of the BUF11705 in a typical block diagram driving an LCD source driver with 10-channel gamma correction reference inputs. APPLICATION INFORMATION The requirements on the number of gamma correction channels vary greatly from panel to panel. Therefore, the BUF11705 series of gamma correction buffer offers different channel combinations using 10 gamma channels plus one VCOM channel. The VCOM channel can be used to drive the VCOM node on the LCD panel. Gamma correction voltages are often generated using a simple resistor ladder, as shown in Figure 21. The BUF11705 buffers the various nodes on the gamma VDD Source Driver BUF11705 RS(1) Gamma 1 (2) (1) Gamma 2 (2) (1) Gamma 3 (2) (1) Gamma 8 (2) (1) Gamma 9 (2) (1) Gamma 10 (2) VCOM (1) Optional resistor increases stability. (2) Optional capacitor. Figure 21. LCD Source Driver Typical Block Diagram 9 "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 ESD RATINGS The BUF11705 has excellent ESD performance: 8 kV HBM; 2 kV CDM; and 300 V MM. These ESD ratings allow for increased manufacturability, fewer production failures, and higher reliability. INPUT VOLTAGE RANGE GAMMA BUFFERS Figure 22 shows a typical gamma correction curve with 10 gamma correction reference points (GMA1 through GMA10). As can be seen from this curve, the voltage requirements for each buffer vary greatly. The swing capability of the input stages of the various buffers is carefully matched to the application. Buffers 1 through 5 have input stages that include VDD, but will only swing within 1 V to GND. Buffers 1 through 5 have only a single NMOS input stage. Buffers 6 through 10 have only a single PMOS input stage. The input range of the PMOS input stage includes GND. VDD1 GMA1 VDD (typically, VCC − 100 mV at 10 mA). The ability of buffers 1 through 5 to swing to GND is limited. Buffers 6 through 10 swing closer to GND than VDD. Buffers 6 through 10 are designed to swing very close to GND; typically, GND + 100 mV at a 10 mA load current. See the Typical Characteristics for more details. This approach significantly reduces the silicon area and overall cost of the whole solution. However, due to this architecture, the correct buffer must be connected to the correct gamma correction voltage. Connect buffer 1 to the gamma voltage closest to VDD, and buffers 2 through 5 to the sequentially voltages. Buffer 10 should be connected to the gamma correction voltage closest to GND (or the negative rail), and buffers 9 through 6 to the sequentially higher voltages. COMMON BUFFER (VCOM) The common buffer output of the BUF11705 has a greater output drive capability than the gamma buffers in order to meet the heavier current demands of driving the common node of the LCD panel. The common buffer output was also designed to drive heavier capacitive loads. Excellent output swing is possible with high currents ( > 100 mA), as shown in Figure 23. GMA2 GMA3 GMA4 GMA5 OUTPUT VOLTAGE vs OUTPUT CURRENT GMA6 GMA10 VSS1 0 10 20 30 40 Input Data (Hex) Figure 22. Gamma Correction Curve Output Voltage − V GMA7 GMA8 GMA9 18 17 16 15 14 13 12 11 VDD = 18 V TA = 25_ C 7 6 5 4 3 2 1 0 0 OUTPUT VOLTAGE SWING GAMMA BUFFERS The output stages have been designed to match the characteristic of the input stage. This means that the output stage of buffers 1 through 5 swing very close to 10 25 50 75 100 125 150 175 200 225 250 Output Current − mA Figure 23. VCOM Output Drive Capability "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 CAPACITIVE LOAD DRIVE APPLICATIONS WITH >10 GAMMA CHANNELS The BUF11705 has been designed to sink/source large dc currents. Its output stage has been designed to deliver output current transients with little disturbance of the output voltage. However, there are times when very fast current pulses are required. Therefore, in LCD source driver buffer applications, it is quite normal for capacitors to be placed at the outputs of the reference buffers. These capacitors improve the transient load regulation and will typically have values of 100pF or more. The BUF11705 gamma buffers were designed to drive capacitances in excess of 100 pF. The output is able to swing within 150 mV of the rails on 10 mA of output current, as shown in Figure 24. When a greater number of gamma correction channels are required, two or more BUF11705 devices can be used in parallel, as shown in Figure 25. This capability provides a cost-effective way of creating more reference voltages over the use of quad-channel op amps or buffers. The suggested configuration in Figure 25 simplifies layout. The various different channel versions provide a high degree of flexibility and also minimize total cost and space. OUTPUT VOLTAGE vs OUTPUT CURRENT BUF11705 OUT1 GMA1 OUT2 2 OUT3 3 OUT4 4 OUT5 5 OUT6 6 OUT7 7 OUT8 8 OUT9 9 18.0 VDD = 18 V TA = 25_C 17.8 Channels 1−5 Output Voltage − V 17.6 17.4 17.2 17.0 1.0 0.8 0.6 0.4 OUT10 GMA10 OUT11 GMA11 OUT12 12 OUT13 13 OUT14 14 OUT15 15 OUT16 16 OUT17 17 OUT18 18 OUT19 19 OUT20 GMA20 Channels 6−10 0.2 0 0 5 10 15 20 25 30 35 40 45 Output Current − mA Figure 24. Gamma Buffer Drive Capability 50 BUF11705 Figure 25. Creating > 10 Gamma Voltage Channels 11 "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 COMPLETE LCD SOLUTION FROM TI In addition to the BUF11705 line of gamma correction buffers, TI offers a complete set of ICs for the LCD panel market, including various power-supply solutions, and audio power solutions. Figure 26 shows the total IC solution from TI. Reference VCOM Gamma Correction BUF11705 2.7 V to 5 V TPS651xx LCD Supply 15 V 26 V −14 V 3.3 V TPA300x Audio Speaker Driver n Logic and Timing Controller Gate Driver Source Driver High−Resolution TFT−LCS Panel Figure 26. TI LCD Solution 12 n "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 The BUF11705 is available in the thermally-enhanced PowerPAD package. This package is constructed using a downset leadframe upon which the die is mounted, as shown in Figure 27(a) and (b). This arrangement results in the lead frame being exposed as a thermal pad on the underside of the package; see Figure 27(c). Due to this thermal pad having direct thermal contact with the die, excellent thermal performance is achieved by providing a good thermal path away from the thermal pad. The PowerPAD package allows for both assembly and thermal management in one manufacturing operation. During the surface-mount solder operation (when the leads are being soldered), the thermal pad must be soldered to a copper area underneath the package. Through the use of thermal paths within this copper area, heat can be conducted away from the package into either a ground plane or other heat-dissipating device. Soldering the PowerPAD to the PCB is always required, even with applications that have low power dissipation. This provides the necessary thermal and mechanical connection between the lead frame die pad and the PCB. The PowerPAD must be connected to the most negative supply voltage of the device. 1. Prepare the PCB with a top-side etch pattern. There should be etching for the leads as well as etch for the thermal pad. 2. Place recommended holes in the area of the thermal pad. Ideal thermal land size and thermal via patterns can be seen in technical brief, SLMA002 PowerPAD Thermally-Enhanced Package, available for download at www.ti.com. These holes should be 13 mils in diameter. Keep them small, so that solder wicking through the holes is not a problem during reflow. DIE Side View (a) 3. Additional vias may be placed anywhere along the thermal plane outside of the thermal pad area. This helps dissipate the heat generated by the BUF11705 IC. These additional vias may be larger than the 13-mil diameter vias directly under the thermal pad. They can be larger because they are not in the thermal pad area to be soldered; so that, wicking is not a problem. 4. Connect all holes to the internal ground plane. 5. When connecting these holes to the ground plane, do not use the typical web or spoke via connection methodology. Web connections have a high thermal resistance connection that is useful for slowing the heat transfer during soldering operations. Web connections make the soldering of vias easier. In this application, however, low thermal resistance is desired for the most efficient heat transfer. Therefore, the holes under the BUF11705 PowerPAD package should make their connection to the internal ground plane with a complete connection around the entire circumference of the plated-through hole. 6. The top-side solder mask should leave the terminals of the package and the thermal pad area with its ten holes exposed. The bottom-side solder mask should cover the holes of the thermal pad area. This prevents solder from being pulled away from the thermal pad area during the reflow process. 7. Apply solder paste to the exposed thermal pad area and all of the IC terminals. 8. With these preparatory steps in place, the BUF11705 IC is simply placed in position and run through the solder reflow operation as any standard surface-mount component. This preparation results in a properly installed part. Thermal Pad GENERAL PowerPAD DESIGN CONSIDERATIONS DIE End View (b) Bottom View (c) The thermal pad is electrically isolated from all terminals in the package. Figure 27. Views of Thermally-Enhanced DGN Package 13 "#$$%&' www.ti.com SBOS349 − DECEMBER 2005 For a given qJA, the maximum power dissipation is shown in Figure 28, and is calculated by the following formula: T MAX * T A PD + q JA ǒ Where: PD = maximum power dissipation (W) TMAX = absolute maximum junction temperature (125°C) Ǔ TA = free-ambient air temperature (°C) qJA = qJC + qCA qJC = thermal coefficient from junction to case (°C/W) qCA = thermal coefficient from case-to-ambient air (°C/W) 8 TSSOP−28 Maximum Power Dissipation − W 7 6 5 4 3 2 1 0 Dissipation with PowerPAD soldered down. −40 −20 0 20 40 60 80 100 TA −Free−Air Temperature −_C Figure 28. Views of Thermally-Enhanced DGN Package 14 PACKAGE OPTION ADDENDUM www.ti.com 26-Dec-2005 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing BUF11705AIPWPR ACTIVE HTSSOP PWP Pins Package Eco Plan (2) Qty 28 2000 Green (RoHS & no Sb/Br) Lead/Ball Finish CU NIPDAU MSL Peak Temp (3) Level-2-260C-1 YEAR (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS) or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. 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