INTEL 300834

Dual-Core Intel® Xeon®
Processor 5000 Series
Datasheet
May 2006
Document Number: 313079-001
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Designers must not rely on the absence or characteristics of any features or instructions marked “reserved” or “undefined.” Intel
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The Dual-Core Intel® Xeon® Processor 5000 Series may contain design defects or errors known as errata which may cause the
product to deviate from published specifications. Current characterized errata are available on request.
Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.
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Copyright © 2004-2006, Intel Corporation.
2
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Contents
1
Introduction................................................................................................................. 9
1.1
Terminology ..................................................................................................... 11
1.2
State of Data .................................................................................................... 12
1.3
References ....................................................................................................... 12
2
Electrical Specifications ............................................................................................... 15
2.1
Front Side Bus and GTLREF ................................................................................ 15
2.2
Power and Ground Lands.................................................................................... 15
2.3
Decoupling Guidelines ........................................................................................ 16
2.3.1 VCC Decoupling...................................................................................... 16
2.3.2 VTT Decoupling ...................................................................................... 16
2.3.3 Front Side Bus AGTL+ Decoupling ............................................................ 16
2.4
Front Side Bus Clock (BCLK[1:0]) and Processor Clocking ....................................... 16
2.4.1 Front Side Bus Frequency Select Signals (BSEL[2:0]) .................................. 17
2.4.2 Phase Lock Loop (PLL) and Filter .............................................................. 18
2.5
Voltage Identification (VID) ................................................................................ 19
2.6
Reserved or Unused Signals................................................................................ 21
2.7
Front Side Bus Signal Groups .............................................................................. 21
2.8
GTL+ Asynchronous and AGTL+ Asynchronous Signals ........................................... 23
2.9
Test Access Port (TAP) Connection....................................................................... 23
2.10 Mixing Processors.............................................................................................. 24
2.11 Absolute Maximum and Minimum Ratings ............................................................. 24
2.12 Processor DC Specifications ................................................................................ 25
2.12.1 VCC Overshoot Specification .................................................................... 31
2.12.2 Die Voltage Validation ............................................................................. 32
3
Mechanical Specifications............................................................................................. 33
3.1
Package Mechanical Drawings ............................................................................. 33
3.2
Processor Component Keepout Zones................................................................... 37
3.3
Package Loading Specifications ........................................................................... 37
3.4
Package Handling Guidelines............................................................................... 38
3.5
Package Insertion Specifications.......................................................................... 38
3.6
Processor Mass Specifications ............................................................................. 38
3.7
Processor Materials............................................................................................ 38
3.8
Processor Markings............................................................................................ 39
3.9
Processor Land Coordinates ................................................................................ 40
4
Land Listing ............................................................................................................... 43
4.1
Dual-Core Intel Xeon Processor 5000 Series Land Assignments ............................... 43
4.1.1 Land Listing by Land Name ...................................................................... 43
4.1.2 Land Listing by Land Number ................................................................... 52
5
Signal Definitions ...................................................................................................... 61
5.1
Signal Definitions .............................................................................................. 61
6
Thermal Specifications ................................................................................................ 69
6.1
Package Thermal Specifications ........................................................................... 69
6.1.1 Thermal Specifications ............................................................................ 69
6.1.2 Thermal Metrology ................................................................................. 75
6.2
Processor Thermal Features ................................................................................ 77
6.2.1 Thermal Monitor..................................................................................... 77
6.2.2 On-Demand Mode .................................................................................. 77
6.2.3 PROCHOT# Signal .................................................................................. 78
6.2.4 FORCEPR# Signal................................................................................... 78
6.2.5 THERMTRIP# Signal ............................................................................... 78
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
3
6.2.6
6.2.7
Tcontrol and Fan Speed Reduction ............................................................79
Thermal Diode........................................................................................79
7
Features ....................................................................................................................83
7.1
Power-On Configuration Options ..........................................................................83
7.2
Clock Control and Low Power States .....................................................................83
7.2.1 Normal State .........................................................................................84
7.2.2 HALT or Enhanced Powerdown States ........................................................84
7.2.3 Stop-Grant State ....................................................................................85
7.2.4 Enhanced HALT Snoop or HALT Snoop State,
Stop Grant Snoop State...........................................................................86
7.3
Enhanced Intel SpeedStep® Technology ...............................................................86
8
Boxed Processor Specifications .....................................................................................89
8.1
Introduction ......................................................................................................89
8.2
Mechanical Specifications ....................................................................................90
8.2.1 Boxed Processor Heat Sink Dimensions (CEK).............................................91
8.2.2 Boxed Processor Heat Sink Weight ............................................................99
8.2.3 Boxed Processor Retention Mechanism and
Heat Sink Support (CEK) .........................................................................99
8.3
Electrical Requirements ......................................................................................99
8.3.1 Fan Power Supply (Active CEK).................................................................99
8.3.2 Boxed Processor Cooling Requirements.................................................... 100
8.4
Boxed Processor Contents................................................................................. 101
9
Debug Tools Specifications ......................................................................................... 103
9.1
Debug Port System Requirements ...................................................................... 103
9.2
Target System Implementation.......................................................................... 103
9.2.1 System Implementation......................................................................... 103
9.3
Logic Analyzer Interface (LAI) .......................................................................... 103
9.3.1 Mechanical Considerations ..................................................................... 104
9.3.2 Electrical Considerations ........................................................................ 104
Figures
2-1
2-2
2-3
2-4
2-5
3-1
3-2
3-3
3-4
3-5
3-6
3-7
3-8
6-1
6-2
6-3
6-4
7-1
4
Phase Lock Loop (PLL) Filter Requirements............................................................18
Dual-Core Intel® Xeon® Processor 5000 Series (1066 MHz)
Load Current versus Time ...................................................................................27
Dual-Core Intel® Xeon® Processor 5000 Series (667 MHz) and
Dual-Core Intel® Xeon® Processor 5063 (MV) Load Current versus Time..................28
VCC Static and Transient Tolerance Load Lines ......................................................29
VCC Overshoot Example Waveform ......................................................................32
Processor Package Assembly Sketch.....................................................................33
Processor Package Drawing (Sheet 1 of 3) ............................................................34
Processor Package Drawing (Sheet 2 of 3) ............................................................35
Processor Package Drawing (Sheet 3 of 3) ............................................................36
Dual-Core Intel Xeon Processor 5000 Series Top-side Markings................................39
Dual-Core Intel Xeon Processor 5063 (MV) Top-side Markings..................................39
Processor Land Coordinates, Top View ..................................................................40
Processor Land Coordinates, Bottom View .............................................................41
Dual-Core Intel Xeon Processor 5000 Series (1066 MHz)
Thermal Profiles A and B.....................................................................................71
Dual-Core Intel Xeon Processor 5000 Series (667 MHz) Thermal Profiles ...................73
Dual-Core Intel Xeon Processor 5063 (MV) Thermal Profile ......................................75
Case Temperature (TCASE) Measurement Location.................................................76
Stop Clock State Machine....................................................................................85
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
8-1
Boxed Dual-Core Intel Xeon Processor 5000 Series 1U
Passive/2U Active Combination Heat Sink (With Removable Fan) ............................. 89
8-2
Boxed Dual-Core Intel Xeon Processor 5000 Series 2U Passive Heat Sink .................. 90
8-3
2U Passive Dual-Core Intel Xeon Processor 5000 Series
Thermal Solution (Exploded View) ....................................................................... 90
8-4
Top Side Board Keep-Out Zones (Part 1) .............................................................. 92
8-5
Top Side Board Keep-Out Zones (Part 2) .............................................................. 93
8-6
Bottom Side Board Keep-Out Zones ..................................................................... 94
8-7
Board Mounting Hole Keep-Out Zones .................................................................. 95
8-8
Volumetric Height Keep-Ins ................................................................................ 96
8-9
4-Pin Fan Cable Connector (For Active CEK Heat Sink) ........................................... 97
8-10 4-Pin Base Board Fan Header (For Active CEK Heat Sink)........................................ 98
8-11 Fan Cable Connector Pin Out for 4-Pin Active CEK Thermal Solution ....................... 100
Tables
1-1
2-1
2-2
2-3
2-4
2-5
2-6
2-7
2-8
2-9
2-10
2-11
2-12
2-13
2-14
2-15
2-16
2-17
3-1
3-2
3-3
4-1
4-2
5-1
6-1
6-2
6-3
6-4
6-5
6-6
6-7
6-8
6-9
6-10
6-11
6-12
Dual-Core Intel® Xeon® Processor 5000 Series Features ....................................... 10
Core Frequency to FSB Multiplier Configuration ..................................................... 17
BSEL[2:0] Frequency Table ................................................................................ 17
Voltage Identification Definition........................................................................... 19
Loadline Selection Truth Table for LL_ID[1:0] ....................................................... 20
Market Segment Selection Truth Table for MS_ID[1:0] ........................................... 20
FSB Signal Groups............................................................................................. 22
Signal Description Table ..................................................................................... 23
Signal Reference Voltages .................................................................................. 23
Processor Absolute Maximum Ratings................................................................... 24
Voltage and Current Specifications....................................................................... 25
VCC Static and Transient Tolerance ..................................................................... 28
BSEL[2:0], VID[5:0] Signal Group DC Specifications .............................................. 30
AGTL+ Signal Group DC Specifications ................................................................. 30
PWRGOOD Input and TAP Signal Group DC Specifications ....................................... 30
GTL+ Asynchronous and AGTL+ Asynchronous Signal Group
DC Specifications .............................................................................................. 31
VTTPWRGD DC Specifications.............................................................................. 31
VCC Overshoot Specifications.............................................................................. 32
Package Loading Specifications ........................................................................... 37
Package Handling Guidelines............................................................................... 38
Processor Materials............................................................................................ 38
Land Listing by Land Name ................................................................................. 43
Land Listing by Land Number .............................................................................. 52
Signal Definitions .............................................................................................. 61
Dual-Core Intel Xeon Processor 5000 Series (1066 MHz) Thermal Specifications ........ 70
Dual-Core Intel Xeon Processor 5000 Series (1066 MHz) Thermal Profile A Table ....... 71
Dual-Core Intel Xeon Processor 5000 Series (1066 MHz) Thermal Profile B Table ....... 72
Dual-Core Intel Xeon Processor 5000 Series (667 MHz) Thermal Specifications .......... 72
Dual-Core Intel Xeon Processor 5000 Series (667 MHz) Thermal Profile A Table ......... 73
Dual-Core Intel Xeon 5000 Series (667 MHz) Thermal Profile B Table ....................... 74
Dual-Core Intel Xeon Processor 5063 (MV) Thermal Specifications ........................... 74
Dual-Core Intel Xeon Processor 5063 (MV) Thermal Profile Table ............................. 75
Thermal Diode Parameters using Diode Model ....................................................... 80
Thermal Diode Interface..................................................................................... 81
Thermal Diode Parameters using Transistor Model ................................................. 81
Parameters for Tdiode Correction Factor ............................................................... 81
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
5
7-1
8-1
8-2
8-3
6
Power-On Configuration Option Lands...................................................................83
PWM Fan Frequency Specifications for 4-Pin Active CEK Thermal Solution................ 100
Fan Specifications for 4-pin Active CEK Thermal Solution....................................... 100
Fan Cable Connector Pin Out for 4-Pin Active CEK Thermal Solution........................ 100
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Revision History
Revision
001
Description
Initial release
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Date
May 2006
7
Features
„
Dual-Core processor
„
Available at 3.73 GHz processor speed
„
Includes 16-KB Level 1 data cache per core (2 x 16-KB)
„
Includes 12-KB Level 1 trace cache per core (2 x 12-KB)
„
2-MB Advanced Transfer Cache per core (2 x 2-MB, On-die, full speed Level 2 (L2) Cache) with 8way associativity and Error Correcting Code (ECC)
„
667/1066 MHz front side bus
„
65 nm process technology
„
Dual processing (DP) server support
„
Intel® NetBurst® microarchitecture
„
Hyper-Threading Technology allowing up to 8 threads per platform
„
Hardware support for multi-threaded applications
„
Intel® Virtualization Technology
„
Intel® Extended Memory 64 Technology (Intel® EM64T)
„
Execute Disable Bit (XD Bit)
„
Enables system support of up to 64 GB of physical memory
„
Enhanced branch prediction
„
Enhanced floating-point and multimedia unit for enhanced video, audio, encryption, and 3D
performance
„
Advanced Dynamic Execution
„
Very deep out-of-order execution
„
System Management mode
„
Machine Check Architecture (MCA)
„
Interfaces to Memory Controller Hub
The Dual-Core Intel Xeon Processor 5000 series are designed for high-performance dual-processor
server and workstation applications. Based on the Intel NetBurst® microarchitecture and HyperThreading Technology (HT Technology), it is binary compatible with previous Intel® Architecture
(IA-32) processors. The Dual-Core Intel Xeon Processor 5000 series are scalable to two processors in
a multiprocessor system, providing exceptional performance for applications running on advanced
operating systems such as Windows* XP, Windows Server 2003, Linux*, and UNIX*.
The Dual-Core Intel Xeon Processor 5000 series deliver compute power at unparalleled value and
flexibility for powerful servers, internet infrastructure, and departmental server applications. The Intel
NetBurst micro-architecture, Intel Virtualization Technology and Hyper-Threading Technology deliver
outstanding performance and headroom for peak internet server workloads, resulting in faster
response times, support for more users, and improved scalability.
§
8
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Introduction
1
Introduction
The Dual-Core Intel® Xeon® Processor 5000 series are Intel dual core products for dual
processor (DP) servers and workstations. The Dual-Core Intel Xeon Processor 5000
series are 64-bit server/workstation processors utilizing two physical Intel NetBurst®
microarchitecture cores in one package. The Dual-Core Intel Xeon Processor 5000
series include enhancements to the Intel NetBurst microarchitecture while maintaining
the tradition of compatibility with IA-32 software. Some key features include Hyper
Pipelined Technology and an Execution Trace Cache. Hyper Pipelined Technology
includes a multi-stage pipeline depth, allowing the processor to reach higher core
frequencies. The Dual-Core Intel Xeon Processor 5000 series contain a total of 4 MB of
L2 Advanced Transfer Cache, 2 MB per core. The 1066 MHz Front Side Bus (FSB) is a
quad-pumped bus running off a 266 MHz system clock making 8.5 GBytes per second
data transfer rates possible. The 667 MHz Front Side Bus (FSB) is a quad-pumped bus
running off a 166 MHz system clock making 5.3 GBytes per second data transfer rates
possible.
In addition, enhanced thermal and power management capabilities are implemented
including Thermal Monitor (TM1) and Enhanced Intel SpeedStep® technology. These
technologies are targeted for dual processor (DP) systems in enterprise environments.
TM1 provides efficient and effective cooling in high temperature situations. Enhanced
Intel SpeedStep technology provides power management capabilities to servers and
workstations.
The Dual-Core Intel Xeon Processor 5000 series also include Hyper-Threading
Technology (HT Technology) resulting in four logical processors per package. This
feature allows multi-threaded applications to execute more than one thread per
physical processor core, increasing the throughput of applications and enabling
improved scaling for server and workstation workloads. More information on HyperThreading Technology can be found at http://www.intel.com/technology/hyperthread.
Other features within the Intel NetBurst microarchitecture include Advanced Dynamic
Execution, Advanced Transfer Cache, enhanced floating point and multi-media units,
and Streaming SIMD Extensions 3 (SSE3). Advanced Dynamic Execution improves
speculative execution and branch prediction internal to the processor. The Advanced
Transfer Cache in each core is a 2 MB level 2 (L2) cache. The floating point and multimedia units include 128-bit wide registers and a separate register for data movement.
Streaming SIMD3 (SSE3) instructions provide highly efficient double-precision floating
point, SIMD integer, and memory management operations. Other processor
enhancements include core frequency improvements and microarchitectural
improvements.
The Dual-Core Intel Xeon Processor 5000 series support Intel® Extended Memory 64
Technology (Intel® EM64T) as an enhancement to Intel's IA-32 architecture. This
enhancement allows the processor to execute operating systems and applications
written to take advantage of the 64-bit extension technology. Further details on Intel
Extended Memory 64 Technology and its programming model can be found in the
64-bit Extension Technology Software Developer's Guide at http://developer.intel.com/
technology/64bitextensions/.
In addition, the Dual-Core Intel Xeon Processor 5000 series support the Execute
Disable Bit functionality. When used in conjunction with a supporting operating system,
Execute Disable allows memory to be marked as executable or non executable. This
feature can prevent some classes of viruses that exploit buffer overrun vulnerabilities
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
9
Introduction
and can thus help improve the overall security of the system. For further information on
Execute Disable Bit functionality see http://www.intel.com/cd/ids/developer/asmo-na/
eng/149308.htm.
The Dual-Core Intel Xeon Processor 5000 series support Intel® Virtualization
Technology, virtualization within the processor. Intel Virtualization Technology is a set of
hardware enhancements that can improve virtualization solutions. Intel Virtualization
Technology is used in conjunction with Virtual Machine Monitor software enabling
multiple, independent software environments inside a single platform. More
information on Intel Virtualization Technology can be found at http://www.intel.com/
technology/computing/vptech/index.htm.
The Dual-Core Intel Xeon Processor 5000 series are intended for high performance
workstation and server systems. The Dual-Core Intel Xeon Processor 5063 is a lower
power version of the Dual-Core Intel Xeon Processor 5000 series. The Dual-Core Intel
Xeon Processor 5000 series support a new Dual Independent Bus (DIB) architecture
with one processor socket on each bus, up to two processor sockets in a system. The
DIB architecture provides improved performance by allowing increased FSB speeds and
bandwidth. The Dual-Core Intel Xeon Processor 5000 series will be packaged in an FCLGA6 Land Grid Array package with 771 lands for improved power delivery. It utilizes a
surface mount LGA771 socket that supports Direct Socket Loading (DSL).
Table 1-1.
Dual-Core Intel® Xeon® Processor 5000 Series Features
# Cores Per
Package
L2 Advanced
Transfer Cache1
Hyper-Threading
Technology
Front Side Bus
Frequency
Package
2
2 MB per core
4 MB total
Yes
667 MHz
1066 MHz
FC-LGA6
771 Lands
Notes:
1. Total accessible size of L2 caches may vary by one cache line pair (128 bytes) per core, depending on usage
and operating environment.
The Dual-Core Intel Xeon Processor 5000 series-based platforms implement
independent core voltage (VCC) power planes for each processor. FSB termination
voltage (VTT) is shared and must connect to all FSB agents. The processor core voltage
utilizes power delivery guidelines specified by VRM/EVRD 11.0 and its associated load
line. Refer to the appropriate platform design guidelines for implementation details.
The Dual-Core Intel Xeon Processor 5000 series support a 1066/667 MHz Front Side
Bus frequency. The FSB utilizes a split-transaction, deferred reply protocol and SourceSynchronous Transfer (SST) of address and data to improve performance. The
processor transfers data four times per bus clock (4X data transfer rate, as in AGP 4X).
Along with the 4X data bus, the address bus can deliver addresses two times per bus
clock and is referred to as a ‘double-clocked’ or a 2X address bus. In addition, the
Request Phase completes in one clock cycle. Working together, the 4X data bus and 2X
address bus provide a data bus bandwidth of up to 8.5 GBytes/second. (5.3 GBytes/
second for Dual-Core Intel Xeon Processor 5000 series 667) Finally, the FSB is also
used to deliver interrupts.
Signals on the FSB use Assisted Gunning Transceiver Logic (AGTL+) level voltages.
Section 2.1 contains the electrical specifications of the FSB while implementation
details are fully described in the appropriate platform design guidelines (refer to
Section 1.3).
10
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Introduction
1.1
Terminology
A ‘#’ symbol after a signal name refers to an active low signal, indicating a signal is in
the asserted state when driven to a low level. For example, when RESET# is low, a
reset has been requested. Conversely, when NMI is high, a nonmaskable interrupt has
occurred. In the case of signals where the name does not imply an active state but
describes part of a binary sequence (such as address or data), the ‘#’ symbol implies
that the signal is inverted. For example, D[3:0] = ‘HLHL’ refers to a hex ‘A’, and
D[3:0]# = ‘LHLH’ also refers to a hex ‘A’ (H= High logic level, L= Low logic level).
Commonly used terms are explained here for clarification:
• Dual-Core Intel® Xeon® Processor 5000 Series – Processor in the FC-LGA6
package with two physical processor cores. Dual-Core Intel Xeon processor 5000
series refers to the “Full Power” Dual-Core Intel Xeon Processor 5000 series with
1066 MHz Front Side Bus. For this document, “processor” is used as the generic
term for the “Dual-Core Intel® Xeon® Processor 5000 series”.
• Dual-Core Intel® Xeon® Processor 5063 (MV) – This is a lower power version
of the Dual-Core Intel Xeon Processor 5000 series. Dual-Core Intel Xeon Processor
5063 (MV) refers to the “Mid Power” Dual-Core Intel Xeon Processor 5000 series.
Unless otherwise noted, the terms “Dual-Core Intel Xeon 5000 series” and
“processor” also refer to the “Dual-Core Intel Xeon Processor 5063”.
• FC-LGA6 (Flip Chip Land Grid Array) Package – The Dual-Core Intel Xeon
Processor 5000 series package is a Land Grid Array, consisting of a processor core
mounted on a pinless substrate with 771 lands, and includes an integrated heat
spreader (IHS).
• FSB (Front Side Bus) – The electrical interface that connects the processor to the
chipset. Also referred to as the processor front side bus or the front side bus. All
memory and I/O transactions as well as interrupt messages pass between the
processor and chipset over the FSB.
• Functional Operation – Refers to the normal operating conditions in which all
processor specifications, including DC, AC, FSB, signal quality, mechanical and
thermal are satisfied.
• Storage Conditions – Refers to a non-operational state. The processor may be
installed in a platform, in a tray, or loose. Processors may be sealed in packaging or
exposed to free air. Under these conditions, processor lands should not be
connected to any supply voltages, have any I/Os biased or receive any clocks.
Upon exposure to “free air” (that is, unsealed packaging or a device removed from
packaging material) the processor must be handled in accordance with moisture
sensitivity labeling (MSL) as indicated on the packaging material.
• Priority Agent – The priority agent is the host bridge to the processor and is
typically known as the chipset.
• Symmetric Agent – A symmetric agent is a processor which shares the same I/O
subsystem and memory array, and runs the same operating system as another
processor in a system. Systems using symmetric agents are known as Symmetric
Multiprocessing (SMP) systems.
• Integrated Heat Spreader (IHS) – A component of the processor package used
to enhance the thermal performance of the package. Component thermal solutions
interface with the processor at the IHS surface.
• Enhanced Intel SpeedStep Technology – The next generation implementation
of Intel SpeedStep technology which extends power management capabilities of
servers and workstations.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
11
Introduction
• Thermal Design Power – Processor thermal solutions should be designed to meet
this target. It is the highest expected sustainable power while running known
power intensive real applications. TDP is not the maximum power that the
processor can dissipate.
• LGA771 socket – The Dual-Core Intel Xeon Processor 5000 series interfaces to
the baseboard through this surface mount, 771 Land socket. See the LGA771
Socket Design Guidelines for details regarding this socket.
• Processor – A single package that contains one or more complete execution cores.
• Processor core – Processor core die with integrated L2 cache. All AC timing and
signal integrity specifications are at the pads of the processor core.
• Intel® Virtualization Technology – Processor virtualization which when used in
conjunction with Virtual Machine Monitor software enables multiple, robust
independent software environments inside a single platform.
• VRM (Voltage Regulator Module) – DC-DC converter built onto a module that
interfaces with a card edge socket and supplies the correct voltage and current to
the processor based on the logic state of the processor VID bits.
• EVRD (Enterprise Voltage Regulator Down) – DC-DC converter integrated onto
the system board that provides the correct voltage and current to the processor
based on the logic state of the processor VID bits.
• VCC – The processor core power supply.
• VSS – The processor ground.
• VTT – FSB termination voltage.
1.2
State of Data
The data contained within this document is subject to change. It is the most accurate
information available by the publication date of this document and is based on final
silicon characterization. All specifications in this version of the Dual-Core Intel® Xeon®
Processor 5000 Series Datasheet can be used for platform design purposes (layout
studies, characterizing thermal capabilities, and so forth).
1.3
References
Material and concepts available in the following documents may be beneficial when
reading this document:
Document
Intel Order Number
AP-485, Intel® Processor Identification and the CPUID Instruction
241618
IA-32 Intel® Architecture Software Developer's Manual
• Volume 1: Basic Architecture
253665
253666
253667
253668
253669
• Volume 2A: Instruction Set Reference, A-M
• Volume 2B: Instruction Set Reference, N-Z
• Volume 3A: System Programming Guide
• Volume 3B: System Programming Guide
64-bit Extension Technology Software Developer's Guide
300834
300835
• Volume 1
• Volume 2
IA-32 Intel® Architecture Optimization Reference Manual
12
248966
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Introduction
Document
Dual-Core Intel
®
Xeon
®
Intel Order Number
Processor 5000 Series Specifications Update
313065
EPS12V Power Supply Design Guide: A Server system Infrastructure (SSI)
Specification for Entry Chassis Power Supplies
http://
www.ssiforum.org
Entry-Level Electronics-Bay Specifications: A Server System Infrastructure (SSI)
Specification for Entry Pedestal Servers and Workstations
http://
www.ssiforum.org
Dual-Core Intel® Xeon® Processor 5000 Series Thermal/Mechanical Design
Guidelines
313062
Dual-Core Intel® Xeon® Processor 5000 Series Boundary Scan Descriptive
Language (BSDL) Model
313064
Notes: Contact your Intel representative for the latest revision of those documents.
§
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
13
Introduction
14
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Electrical Specifications
2
Electrical Specifications
2.1
Front Side Bus and GTLREF
Most Dual-Core Intel Xeon Processor 5000 series FSB signals use Assisted Gunning
Transceiver Logic (AGTL+) signaling technology. This technology provides improved
noise margins and reduced ringing through low voltage swings and controlled edge
rates. AGTL+ buffers are open-drain and require pull-up resistors to provide the high
logic level and termination. AGTL+ output buffers differ from GTL+ buffers with the
addition of an active PMOS pull-up transistor to “assist” the pull-up resistors during the
first clock of a low-to-high voltage transition. Platforms implement a termination
voltage level for AGTL+ signals defined as VTT. Because platforms implement separate
power planes for each processor (and chipset), separate VCC and VTT supplies are
necessary. This configuration allows for improved noise tolerance as processor
frequency increases. Speed enhancements to data and address buses have made
signal integrity considerations and platform design methods even more critical than
with previous processor families.
The AGTL+ inputs require reference voltages (GTLREF), which are used by the
receivers to determine if a signal is a logical 0 or a logical 1. GTLREF must be generated
on the baseboard. GTLREF is a generic name for GTLREF_DATA_C[1:0], the reference
voltages for the 4X data bus and GTLREF_ADD_C[1:0], the reference voltages for the
2X address bus and common clock signals. Refer to the applicable platform design
guidelines for details. Termination resistors (RTT) for AGTL+ signals are provided on the
processor silicon and are terminated to VTT. The on-die termination resistors are always
enabled on the Dual-Core Intel Xeon Processor 5000 series to control reflections on the
transmission line. Intel chipsets also provide on-die termination, thus eliminating the
need to terminate the bus on the baseboard for most AGTL+ signals.
Some FSB signals do not include on-die termination (RTT) and must be terminated on
the baseboard. See Table 2-7 for details regarding these signals.
The AGTL+ bus depends on incident wave switching. Therefore, timing calculations for
AGTL+ signals are based on flight time as opposed to capacitive deratings. Analog
signal simulation of the FSB, including trace lengths, is highly recommended when
designing a system. Contact your Intel Field Representative to obtain the processor
signal integrity models, which includes buffer and package models.
2.2
Power and Ground Lands
For clean on-chip processor core power distribution, the processor has 223 VCC (power)
and 271 VSS (ground) inputs. All Vcc lands must be connected to the processor power
plane, while all VSS lands must be connected to the system ground plane. The
processor VCC lands must be supplied with the voltage determined by the processor
Voltage IDentification (VID) signals. See Table 2-3 for VID definitions.
Twenty two lands are specified as VTT, which provide termination for the FSB and power
to the I/O buffers. The platform must implement a separate supply for these lands
which meets the VTT specifications outlined in Table 2-10.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
15
Electrical Specifications
2.3
Decoupling Guidelines
Due to its large number of transistors and high internal clock speeds, the Dual-Core
Intel Xeon Processor 5000 series are capable of generating large average current
swings between low and full power states. This may cause voltages on power planes to
sag below their minimum values if bulk decoupling is not adequate. Larger bulk storage
(CBULK), such as electrolytic capacitors, supply current during longer lasting changes in
current demand by the component, such as coming out of an idle condition. Similarly,
they act as a storage well for current when entering an idle condition from a running
condition. Care must be taken in the baseboard design to ensure that the voltage
provided to the processor remains within the specifications listed in Table 2-10. Failure
to do so can result in timing violations or reduced lifetime of the component. For further
information and guidelines, refer to the appropriate platform design guidelines.
2.3.1
VCC Decoupling
Vcc regulator solutions need to provide bulk capacitance with a low Effective Series
Resistance (ESR), and the baseboard designer must assure a low interconnect
resistance from the regulator (EVRD or VRM pins) to the LGA771 socket. Bulk
decoupling must be provided on the baseboard to handle large current swings. The
power delivery solution must insure the voltage and current specifications are met (as
defined in Table 2-10). For further information regarding power delivery, decoupling
and layout guidelines, refer to the appropriate platform design guidelines.
2.3.2
VTT Decoupling
Bulk decoupling must be provided on the baseboard. Decoupling solutions must be
sized to meet the expected load. To insure optimal performance, various factors
associated with the power delivery solution must be considered including regulator
type, power plane and trace sizing, and component placement. A conservative
decoupling solution consists of a combination of low ESR bulk capacitors and high
frequency ceramic capacitors. For further information regarding power delivery,
decoupling and layout guidelines, refer to the appropriate platform design guidelines.
2.3.3
Front Side Bus AGTL+ Decoupling
The Dual-Core Intel Xeon Processor 5000 series integrate signal termination on the die,
as well as a portion of the required high frequency decoupling capacitance on the
processor package. However, additional high frequency capacitance must be added to
the baseboard to properly decouple the return currents from the FSB. Bulk decoupling
must also be provided by the baseboard for proper AGTL+ bus operation. Decoupling
guidelines are described in the appropriate platform design guidelines.
2.4
Front Side Bus Clock (BCLK[1:0]) and Processor
Clocking
BCLK[1:0] directly controls the FSB interface speed as well as the core frequency of the
processor. As in previous processor generations, the Dual-Core Intel Xeon Processor
5000 series core frequency is a multiple of the BCLK[1:0] frequency. The processor bus
ratio multiplier is set during manufacturing. The default setting is for the maximum
speed of the processor. It is possible to override this setting using software (see the
IA-32 Intel® Architecture Software Developer’s Manual, Volume 3A &3B). This permits
operation at lower frequencies than the processor’s tested frequency.
16
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Electrical Specifications
The processor core frequency is configured during reset by using values stored
internally during manufacturing. The stored value sets the highest bus fraction at which
the particular processor can operate. If lower speeds are desired, the appropriate ratio
can be configured via the IA32_FLEX_BRVID_SEL MSR. For details of operation at core
frequencies lower than the maximum rated processor speed, refer to the IA-32 Intel®
Architecture Software Developer’s Manual, Volume 3A &3B.
Clock multiplying within the processor is provided by the internal phase locked loop
(PLL), which requires a constant frequency BCLK[1:0] input, with exceptions for spread
spectrum clocking. The Dual-Core Intel Xeon Processor 5000 series utilize differential
clocks. Table 2-1 contains processor core frequency to FSB multipliers and their
corresponding core frequencies.
Table 2-1.
Core Frequency to FSB Multiplier Configuration
Core Frequency to FSB
Multiplier
Core Frequency with
166 MHz FSB Clock
1/16
2.67 GHz
5030
1, 2, 3, 4
1/18
3 GHz
5050
1, 2, 3, 4
Core Frequency to FSB
Multiplier
Core Frequency with
266 MHz FSB Clock
1/12
3.20 GHz
5063
1, 2, 3, 4
1/12
3.20 GHz
5060
1, 2, 3, 5
1/14
3.73 GHz
5080
1, 2, 3
Processor Number
Notes
Notes
Notes:
1.
Individual processors operate only at or below the frequency marked on the package.
2.
Listed frequencies are not necessarily committed production frequencies.
3.
For valid processor core frequencies, refer to the Dual-Core Intel® Xeon® Processor 5000 series
Specification Update.
4.
Mid-voltage (MV) processors only.
5.
The lowest bus ratio supported by the Dual-Core Intel Xeon Processor 5000 series is 1/12.
2.4.1
Front Side Bus Frequency Select Signals (BSEL[2:0])
Upon power up, the FSB frequency is set to the maximum supported by the individual
processor. BSEL[2:0] are open drain outputs which must be pulled up to VTT, and are
used to select the FSB frequency. Please refer to Table 2-12 for DC specifications.
Table 2-2 defines the possible combinations of the signals and the frequency associated
with each combination. The frequency is determined by the processor(s), chipset, and
clock synthesizer. All FSB agents must operate at the same core and FSB frequency.
See the appropriate platform design guidelines for further details.
Table 2-2.
BSEL[2:0] Frequency Table
BSEL2
BSEL1
BSEL0
Bus Clock Frequency
0
0
0
266.67 MHz
0
0
1
Reserved
0
1
0
Reserved
0
1
1
166.67 MHz
1
0
0
Reserved
1
0
1
Reserved
1
1
0
Reserved
1
1
1
Reserved
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
17
Electrical Specifications
2.4.2
Phase Lock Loop (PLL) and Filter
VCCA and VCCIOPLL are power sources required by the PLL clock generators on the DualCore Intel Xeon Processor 5000 series. Since these PLLs are analog in nature, they
require low noise power supplies for minimum jitter. Jitter is detrimental to the system:
it degrades external I/O timings as well as internal core timings (that is, maximum
frequency). To prevent this degradation, these supplies must be low pass filtered from
VTT.
The AC low-pass requirements are as follows:
• < 0.2 dB gain in pass band
• < 0.5 dB attenuation in pass band < 1 Hz
• > 34 dB attenuation from 1 MHz to 66 MHz
• > 28 dB attenuation from 66 MHz to core frequency
The filter requirements are illustrated in Figure 2-1. For recommendations on
implementing the filter, refer to the appropriate platform design guidelines.
Figure 2-1.
Phase Lock Loop (PLL) Filter Requirements
0.2 dB
0 dB
-0.5 dB
forbidden
zone
-28 dB
forbidden
zone
-34 dB
DC
passband
1 Hz
fpeak
1 MHz
66 MHz
fcore
high frequency
band
CS00141
Notes:
1.
Diagram not to scale.
2.
No specifications for frequencies beyond fcore (core frequency).
3.
fpeak, if existent, should be less than 0.05 MHz.
4.
fcore represents the maximum core frequency supported by the platform.
18
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Electrical Specifications
2.5
Voltage Identification (VID)
The Voltage Identification (VID) specification for the Dual-Core Intel Xeon Processor
5000 series set by the VID signals is the reference VR output voltage to be delivered to
the processor Vcc pins. VID signals are open drain outputs, which must be pulled up to
VTT. Please refer to Table 2-12 for the DC specifications for these signals. A minimum
voltage is provided in Table 2-10 and changes with frequency. This allows processors
running at a higher frequency to have a relaxed minimum voltage specification. The
specifications have been set such that one voltage regulator can operate with all
supported frequencies.
Individual processor VID values may be calibrated during manufacturing such that two
devices at the same core frequency may have different default VID settings. This is
reflected by the VID range values provided in Table 2-3.
The Dual-Core Intel Xeon Processor 5000 series use six voltage identification signals,
VID[5:0], to support automatic selection of power supply voltages. The processor uses
the VTTPWRGD input to determine that the supply voltage for VID[5:0] is stable and
within specification.Table 2-3 specifies the voltage level corresponding to the state of
VID[5:0]. A ‘1’ in this table refers to a high voltage level and a ‘0’ refers to a low
voltage level. The definition provided in Table 2-3 is not related in any way to previous
Intel® Xeon® processors or voltage regulator designs. If the processor socket is empty
(VID[5:0] = x11111), or the voltage regulation circuit cannot supply the voltage that is
requested, it must disable itself.
The Dual-Core Intel Xeon Processor 5000 series provide the ability to operate while
transitioning to an adjacent VID and its associated processor core voltage (VCC). This
will represent a DC shift in the load line. It should be noted that a low-to-high or highto-low voltage state change may result in as many VID transitions as necessary to
reach the target core voltage. Transitions above the specified VID are not permitted.
Table 2-10 includes VID step sizes and DC shift ranges. Minimum and maximum
voltages must be maintained as shown in Table 2-11 and Figure 2-4.
The VRM or EVRD utilized must be capable of regulating its output to the value defined
by the new VID. DC specifications for dynamic VID transitions are included in
Table 2-10 and Table 2-11.
Power source characteristics must be guaranteed to be stable whenever the supply to
the voltage regulator is stable.
Table 2-3.
Voltage Identification Definition (Sheet 1 of 2)
VID4
VID3
VID2
VID1
VID0
VID5
VCC_MAX
VID4
VID3
VID2
VID1
VID0
VID5
VCC_MAX
0
1
0
1
0
0
0.8375
1
1
0
1
0
0
1.2125
0
1
0
0
1
1
0.8500
1
1
0
0
1
1
1.2250
0
1
0
0
1
0
0.8625
1
1
0
0
1
0
1.2375
0
1
0
0
0
1
0.8750
1
1
0
0
0
1
1.2500
0
1
0
0
0
0
0.8875
1
1
0
0
0
0
1.2625
0
0
1
1
1
1
0.9000
1
0
1
1
1
1
1.2750
0
0
1
1
1
0
0.9125
1
0
1
1
1
0
1.2875
0
0
1
1
0
1
0.9250
1
0
1
1
0
1
1.3000
0
0
1
1
0
0
0.9375
1
0
1
1
0
0
1.3125
0
0
1
0
1
1
0.9500
1
0
1
0
1
1
1.3250
0
0
1
0
1
0
0.9625
1
0
1
0
1
0
1.3375
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
19
Electrical Specifications
Table 2-3.
Voltage Identification Definition (Sheet 2 of 2)
VID4
VID3
VID2
VID1
VID0
VID5
VCC_MAX
VID4
VID3
VID2
VID1
VID0
VID5
VCC_MAX
0
0
1
0
0
1
0.9750
1
0
1
0
0
1
1.3500
0
0
1
0
0
0
0.9875
1
0
1
0
0
0
1.3625
0
0
0
1
1
1
1.0000
1
0
0
1
1
1
1.3750
0
0
0
1
1
0
1.0125
1
0
0
1
1
0
1.3875
0
0
0
1
0
1
1.0250
1
0
0
1
0
1
1.4000
0
0
0
1
0
0
1.0375
1
0
0
1
0
0
1.4125
0
0
0
0
1
1
1.0500
1
0
0
0
1
1
1.4250
0
0
0
0
1
0
1.0625
1
0
0
0
1
0
1.4375
0
0
0
0
0
1
1.0750
1
0
0
0
0
1
1.4500
0
0
0
0
0
0
1.0875
1
0
0
0
0
0
1.4625
1
1
1
1
1
1
1
OFF
0
1
1
1
1
1
1.4750
1
1
1
1
1
0
OFF1
0
1
1
1
1
0
1.4875
1
1
1
1
0
1
1.1000
0
1
1
1
0
1
1.5000
1
1
1
1
0
0
1.1125
0
1
1
1
0
0
1.5125
1
1
1
0
1
1
1.1250
0
1
1
0
1
1
1.5250
1
1
1
0
1
0
1.1375
0
1
1
0
1
0
1.5375
1
1
1
0
0
1
1.1500
0
1
1
0
0
1
1.5500
1
1
1
0
0
0
1.1625
0
1
1
0
0
0
1.5625
1
1
0
1
1
1
1.1750
0
1
0
1
1
1
1.5750
1
1
0
1
1
0
1.1875
0
1
0
1
1
0
1.5875
1
1
0
1
0
1
1.2000
0
1
0
1
0
1
1.6000
Notes:
1.
When this VID pattern is observed, the voltage regulator output should be disabled.
2.
Shading denotes the expected VID range of the Dual-Core Intel Xeon Processor 5000 series [1.0750 V 1.3500 V].
Table 2-4.
Loadline Selection Truth Table for LL_ID[1:0]
LL_ID1
LL_ID0
Description
0
0
Reserved
0
1
Dual-Core Intel Xeon Processor 5000 Series
1
0
Reserved
1
1
Reserved
Note:
1.
The LL_ID[1:0] signals are used to select the correct loadline slope for the processor.
2.
These signals are not connected to the processor die.
3.
A logic 0 is achieved by pulling the signal to ground on the package.
4.
A logic 1 is achieved by leaving the signal as a no connect on the package.
Table 2-5.
20
Market Segment Selection Truth Table for MS_ID[1:0]
MS_ID1
MS_ID0
Description
0
0
Dual-Core Intel Xeon Processor 5000 Series
0
1
Reserved
1
0
Reserved
1
1
Reserved
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Electrical Specifications
Note:
1.
The MS_ID[1:0] signals are provided to indicate the Market Segment for the processor and may be used
for future processor compatibility or for keying. System management software may utilize these signals to
identify the processor installed.
2.
These signals are not connected to the processor die.
3.
A logic 0 is achieved by pulling the signal to ground on the package.
4.
A logic 1 is achieved by leaving the signal as a no connect on the package.
2.6
Reserved or Unused Signals
All Reserved signals must remain unconnected. Connection of these signals to VCC, VTT,
VSS, or to any other signal (including each other) can result in component malfunction
or incompatibility with future processors. See Chapter 4, “Land Listing” for a land
listing of the processor and the location of all Reserved signals.
For reliable operation, always connect unused inputs or bidirectional signals to an
appropriate signal level. Unused active high inputs, should be connected through a
resistor to ground (VSS). Unused outputs can be left unconnected; however, this may
interfere with some TAP functions, complicate debug probing, and prevent boundary
scan testing. A resistor must be used when tying bidirectional signals to power or
ground. When tying any signal to power or ground, a resistor will also allow for system
testability. Resistor values should be within ± 20% of the impedance of the baseboard
trace for FSB signals. For unused AGTL+ input or I/O signals, use pull-up resistors of
the same value as the on-die termination resistors (RTT).
TAP, Asynchronous GTL+ inputs, and Asynchronous GTL+ outputs do not include on-die
termination. Inputs and utilized outputs must be terminated on the baseboard. Unused
outputs may be terminated on the baseboard or left unconnected. Note that leaving
unused outputs unterminated may interfere with some TAP functions, complicate debug
probing, and prevent boundary scan testing. Signal termination for these signal types
is discussed in the appropriate platform design guidelines.
The TESTHI signals must be tied to the processor VTT using a matched resistor, where a
matched resistor has a resistance value within +/-20% of the impedance of the board
transmission line traces. For example, if the trace impedance is 50 Ω, then a value
between 40 Ω and 60 Ω is required.
The TESTHI signals may use individual pull-up resistors or be grouped together as
detailed below. A matched resistor must be used for each group:
• TESTHI[1:0] - can be grouped together with a single pull-up to VTT
• TESTHI[7:2] - can be grouped together with a single pull-up to VTT
• TESTHI8 – cannot be grouped with other TESTHI signals
• TESTHI9 – cannot be grouped with other TESTHI signals
• TESTHI10 – cannot be grouped with other TESTHI signals
• TESTHI11 – cannot be grouped with other TESTHI signals
2.7
Front Side Bus Signal Groups
The FSB signals have been combined into groups by buffer type. AGTL+ input signals
have differential input buffers, which use GTLREF as a reference level. In this
document, the term “AGTL+ Input” refers to the AGTL+ input group as well as the
AGTL+ I/O group when receiving. Similarly, “AGTL+ Output” refers to the AGTL+
output group as well as the AGTL+ I/O group when driving. AGTL+ asynchronous
outputs can become active anytime and include an active PMOS pull-up transistor to
assist the during the first clock of a low-to-high voltage transition.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
21
Electrical Specifications
With the implementation of a source synchronous data bus comes the need to specify
two sets of timing parameters. One set is for common clock signals whose timings are
specified with respect to rising edge of BCLK0 (ADS#, HIT#, HITM#, and so forth) and
the second set is for the source synchronous signals which are relative to their
respective strobe lines (data and address) as well as rising edge of BCLK0.
Asynchronous signals are still present (A20M#, IGNNE#, and so forth) and can become
active at any time during the clock cycle. Table 2-6 identifies which signals are common
clock, source synchronous and asynchronous.
Table 2-6.
FSB Signal Groups
Signal Group
Signals1
Type
AGTL+ Common Clock Input
Synchronous to BCLK[1:0]
BPRI#, DEFER#, RESET#, RS[2:0]#, RSP#,
TRDY#
AGTL+ Common Clock I/O
Synchronous to BCLK[1:0]
ADS#, AP[1:0]#, BINIT#2, BNR#2,
BPM[5:0]#, BR[1:0]#, DBSY#, DP[3:0]#,
DRDY#, HIT#2, HITM#2, LOCK#, MCERR#2
AGTL+ Source Synchronous I/O
Synchronous to assoc.
strobe
Signals
Associated Strobe
REQ[4:0]#,A[16:3]
#
ADSTB0#
A[35:17]#
ADSTB1#
D[15:0]#, DBI0#
DSTBP0#, DSTBN0#
D[31:16]#, DBI1#
DSTBP1#, DSTBN1#
D[47:32]#, DBI2#
DSTBP2#, DSTBN2#
D[63:48]#, DBI3#
DSTBP3#, DSTBN3#
AGTL+ Strobes I/O
Synchronous to BCLK[1:0]
ADSTB[1:0]#, DSTBP[3:0]#, DSTBN[3:0]#
AGTL+ Asynchronous Output
Asynchronous
FERR#/PBE#, IERR#, PROCHOT#
GTL+ Asynchronous Input
Asynchronous
A20M#, FORCEPR#, IGNNE#, INIT#, LINT0/
INTR, LINT1/NMI, SMI#, STPCLK#
GTL+ Asynchronous Output
Asynchronous
THERMTRIP#
FSB Clock
Clock
BCLK1, BCLK0
TAP Input
Synchronous to TCK
TCK, TDI, TMS TRST#
TAP Output
Synchronous to TCK
TDO
Power/Other
Power/Other
BSEL[2:0], COMP[7:0], GTLREF_ADD_C[1:0],
GTLREF_DATA_C[1:0], LL_ID[1:0],
MS_ID[1:0], PWRGOOD, Reserved, SKTOCC#,
TEST_BUS, TESTHI[11:0], THERMDA,
THEMRDA2, THERMDC, THERMDC2, VCC, VCCA,
VCCIOPLL, VCC_DIE_SENSE, VCC_DIE_SENSE2,
VID[5:0], VID_SELECT, VSS_DIE_SENSE,
VSS_DIE_SENSE2, VSS, VSSA, VTT, VTTOUT,
VTTPWRGD
Notes:
1.
Refer to Section 5 for signal descriptions.
2.
These signals may be driven simultaneously by multiple agents (Wired-OR).
22
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Electrical Specifications
Table 2-7 outlines the signals which include on-die termination (RTT). Open drain
signals are also included. Table 2-8 provides signal reference voltages.
Table 2-7.
Signal Description Table
Signals with RTT
Signals with no RTT
A[35:3]#, ADS#, ADSTB[1:0]#, AP[1:0]#, BINIT#,
BNR#, BPRI#, COMP[7:4], D[63:0]#, DBI[3:0]#,
DBSY#, DEFER#, DP[3:0]#, DRDY#, DSTBN[3:0]#,
DSTBP[3:0]#, FORCEPR#, HIT#, HITM#, LOCK#,
MCERR#, PROCHOT#, REQ[4:0]#, RS[2:0]#,
RSP#, TCK2, TDI2, TEST_BUS, TMS2, TRDY#,
TRST#2
A20M#, BCLK[1:0], BPM[5:0]#, BR[1:0]#, BSEL[2:0],
COMP[3:0], FERR#/PBE#, GTLREF_ADD_C[1:0],
GTLREF_DATA_C[1:0], IERR#, IGNNE#, INIT#, LINT0/
INTR, LINT1/NMI, LL_ID[1:0], MS_ID[1:0], PWRGOOD,
RESET#, SKTOCC#, SMI#, STPCLK#, TDO,
TESTHI[11:0], THERMDA, THERMDA2, THERMDC,
THERMDC2, THERMTRIP#, VCC_DIE_SENSE,
VCC_DIE_SENSE2, VID[5:0], VID_SELECT,
VSS_DIE_SENSE, VSS_DIE_SENSE2, VTTPWRGD
Open Drain Signals1
BPM[5:0]#, BR0#, FERR#/PBE#, IERR#, PROCHOT#, TDO, THERMTRIP#
Notes:
1.
Signals that do not have RTT, nor are actively driven to their high voltage level.
2.
The on-die termination for these signals is not RTT. TCK, TDI, and TMS have an approximately 150 KΩ
pullup to VTT.
Table 2-8.
Signal Reference Voltages
GTLREF
VTT / 2
A[35:3]#, ADS#, ADSTB[1:0]#, AP[1:0]#, BINIT#,
BNR#, BPM[5:0]#, BPRI#, BR[1:0]#, D[63:0]#,
DBI[3:0]#, DBSY#, DEFER#, DP[3:0]#, DRDY#,
DSTBN[3:0]#, DSTBP[3:0]#, FORCEPR#2, HIT#,
HITM#, IERR#, LINT0/INTR, LINT1/NMI, LOCK#,
MCERR#, RESET#, REQ[4:0]#, RS[2:0]#, RSP#,
TRDY#
A20M#, IGNNE#, INIT#, PWRGOOD1, SMI#, STPCLK#,
TCK1, TDI1, TMS1, TRST#1, VTTPWRGD
Notes:
1.
These signals also have hysteresis added to the reference voltage. See Table 2-14 for more information.
2.
Use Table 2-15 for signal FORCEPR# specifications.
2.8
GTL+ Asynchronous and AGTL+ Asynchronous
Signals
Input signals such as A20M#, FORCEPR#, IGNNE#, INIT#, LINT0/INTR, LINT1/NMI,
SMI# and STPCLK# utilize GTL+ input buffers. Legacy output FERR#/PBE# and other
non-AGTL+ signals IERR#, THERMTRIP# and PROCHOT# utilize GTL+ output buffers.
All of these asynchronous GTL+ signals follow the same DC requirements as AGTL+
signals; however, the outputs are not driven high (during the electrical 0-to-1
transition) by the processor. FERR#/PBE#, IERR#, and IGNNE# have now been defined
as AGTL+ asynchronous signals as they include an active p-MOS device. Asynchronous
GTL+ and asynchronous AGTL+ signals do not have setup or hold time specifications in
relation to BCLK[1:0]; however, all of the asynchronous GTL+ and asynchronous
AGTL+ signals are required to be asserted/deasserted for at least six BCLKs in order for
the processor to recognize them. See Table 2-15 for the DC specifications for the
asynchronous GTL+ signal groups.
2.9
Test Access Port (TAP) Connection
Due to the voltage levels supported by other components in the Test Access Port (TAP)
logic, it is recommended that the processor(s) be first in the TAP chain and followed by
any other components within the system. A translation buffer should be used to
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
23
Electrical Specifications
connect to the rest of the chain unless one of the other components is capable of
accepting an input of the appropriate voltage. Similar considerations must be made for
TCK, TMS, and TRST#. Two copies of each signal may be required with each driving a
different voltage level.
2.10
Mixing Processors
Intel supports and validates dual processor configurations only in which both
processors operate with the same FSB frequency, core frequency, and have the same
internal cache sizes. Mixing components operating at different internal clock
frequencies is not supported and will not be validated by Intel [Note: Processors within
a system must operate at the same frequency per bits [15:8] of the
IA32_FLEX_BRVID_SEL MSR; however this does not apply to frequency transitions
initiated due to thermal events, Enhanced HALT, Enhanced Intel SpeedStep®
Technology transitions, or assertion of the FORCEPR# signal (See Chapter 6, “Thermal
Specifications”)]. Low voltage (LV), mid-voltage (MV) and full-power 64-bit Intel Xeon
processors should not be mixed within a system. Not all operating systems can support
dual processors with mixed frequencies. Intel does not support or validate operation of
processors with different cache sizes. Mixing processors of different steppings but the
same model (as per CPUID instruction) is supported. Details regarding the CPUID
instruction are provided in the AP-485 Intel® Processor Identification and the CPUID
Instruction application note.
2.11
Absolute Maximum and Minimum Ratings
Table 2-9 specifies absolute maximum and minimum ratings. Within functional
operation limits, functionality and long-term reliability can be expected.
At conditions outside functional operation condition limits, but within absolute
maximum and minimum ratings, neither functionality nor long term reliability can be
expected. If a device is returned to conditions within functional operation limits after
having been subjected to conditions outside these limits, but within the absolute
maximum and minimum ratings, the device may be functional, but with its lifetime
degraded depending on exposure to conditions exceeding the functional operation
condition limits.
At conditions exceeding absolute maximum and minimum ratings, neither functionality
nor long-term reliability can be expected. Moreover, if a device is subjected to these
conditions for any length of time then, when returned to conditions within the
functional operating condition limits, it will either not function or its reliability will be
severely degraded.
Although the processor contains protective circuitry to resist damage from static
electric discharge, precautions should always be taken to avoid high static voltages or
electric fields
.
Table 2-9.
Processor Absolute Maximum Ratings
Symbol
24
Parameter
Min
Max
Unit
VCC
Core voltage with respect to VSS
-0.30
1.55
V
VTT
FSB termination voltage with respect to
VSS
-0.30
1.55
V
TCASE
Processor case temperature
See
Section 6
See
Section 6
°C
TSTORAGE
Storage temperature
-40
85
°C
Notes1, 2
3, 4, 5
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Electrical Specifications
Notes:
1.
For functional operation, all processor electrical, signal quality, mechanical and thermal specifications must
be satisfied.
2.
Overshoot and undershoot voltage guidelines for input, output, and I/O signals are outlined in Section 3.
Excessive overshoot or undershoot on any signal will likely result in permanent damage to the processor.
3.
Storage temperature is applicable to storage conditions only. In this scenario, the processor must not
receive a clock, and no lands can be connected to a voltage bias. Storage within these limits will not affect
the long-term reliability of the device. For functional operation, please refer to the processor case
temperature specifications.
4.
This rating applies to the processor and does not include any tray or packaging.
5.
Failure to adhere to this specification can affect the long term reliability of the processor.
2.12
Processor DC Specifications
The processor DC specifications in this section are defined at the processor
core (pads) unless noted otherwise. See Section 4.1 for the Dual-Core Intel Xeon
Processor 5000 series land listings and Section 5.1 for signal definitions. Voltage and
current specifications are detailed in Table 2-10. For platform planning refer to
Table 2-11, which provides Voltage-Current projections. This same information is
presented graphically in Figure 2-4.
BSEL[2:0] and VID[5:0] signals are specified in Table 2-12. The DC specifications for
the AGTL+ signals are listed in Table 2-13. Legacy signals and Test Access Port (TAP)
signals follow DC specifications similar to GTL+. The DC specifications for the
PWRGOOD input and TAP signal group are listed in Table 2-14 and the Asynchronous
GTL+ signal group is listed in Table 2-15. The VTTPWRGD signal is detailed in
Table 2-16.
Table 2-10 through Table 2-16 list the DC specifications for the processor and are valid
only while meeting specifications for case temperature (TCASE as specified in Table 6-1),
clock frequency, and input voltages. Care should be taken to read all notes
associated with each parameter.
Table 2-10. Voltage and Current Specifications (Sheet 1 of 2)
Symbol
VID
Parameter
Min
VID range
1.0750
Typ
Max
Unit
1.3500
V
Notes
1,13
VCC
VCC for Dual-Core Intel Xeon
Processor 5000 series core. FMB
processor.
VVID_STEP
VID step size during a transition
± 12.5
mV
VVID_SHIFT
Total allowable DC load line shift
from VID steps
425
mV
12
VTT
FSB termination voltage (DC + AC
specification)
1.260
V
10, 14
ICC
ICC for Dual-Core Intel Xeon
Processor 5000 series with multiple
VID (667 MHz)
115
A
4, 5, 6, 11
ICC
ICC for Dual-Core Intel Xeon
Processor 5000 series with multiple
VID (1066 MHz)
150
A
4, 5, 6, 11
ICC
ICC for Dual-Core Intel Xeon
Processor 5063 (MV) with multiple
VID
115
A
4, 5, 6, 11
ICC_RESET
ICC_RESET for Dual-Core Intel Xeon
Processor 5000 series with multiple
VID (667 MHz)
115
A
18
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
See Table 2-11 and Figure 2-4
1.140
1.20
V
2, 3, 4, 6,
11
25
Electrical Specifications
Table 2-10. Voltage and Current Specifications (Sheet 2 of 2)
Symbol
Parameter
Min
Typ
Max
Unit
Notes
1,13
ICC_RESET
ICC_RESET for Dual-Core Intel Xeon
Processor 5000 series with multiple
VID (1066 MHz)
150
A
18
ICC_RESET
ICC_RESET for Dual-Core Intel Xeon
Processor 5063 (MV) with multiple
VID
115
A
18
ITT
Steady-state FSB Termination
Current
6.1
A
16
ITT_POWER-UP
Power-up FSB Termination Current
8.0
A
19
ICC_TDC
Thermal Design Current (TDC) for
Dual-Core Intel Xeon Processor
5000 series (667 MHz)
100
A
6,15
ICC_TDC
Thermal Design Current (TDC) for
Dual-Core Intel Xeon Processor
5000 series (1066 MHz)
130
A
6,15
ICC_TDC
Thermal Design Current (TDC) for
Dual-Core Intel Xeon Processor
5063 (MV)
100
A
6,15
ICC_VTTOUT
DC current that may be drawn
from VTTOUT per land
580
mA
17
ICC_VCCA
ICC for PLL power lands
120
mA
8
ICC_VCCIOPLL
ICC for PLL power lands
100
mA
8
ICC_GTLREF
ICC for GTLREF
200
µA
9
ITCC
ICC during active thermal control
circuit (TCC) for Dual-Core Intel
Xeon Processor 5000 series
150
A
ITCC
ICC during active thermal control
circuit (TCC) for Dual-Core Intel
Xeon Processor 5063 (MV)
115
A
ISGNT
ICC Stop-Grant for Dual-Core Intel
Xeon Processor 5000 series (667
MHz)
50
A
7
ISGNT
ICC Stop-Grant for Dual-Core Intel
Xeon Processor 5000 series (1066
MHz)
60
A
7
ISGNT
ICC Stop-Grant for Dual-Core Intel
Xeon Processor 5063 (MV)
40
A
7
Notes:
1.
Unless otherwise noted, all specifications in this table apply to all processors and are based on final silicon
validation/characterization.
2.
These voltages are targets only. A variable voltage source should exist on systems in the event that a
different voltage is required. See Section 2.5 for more information.
3.
The voltage specification requirements are measured across the VCC_DIE_SENSE and VSS_DIE_SENSE
lands and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands with a 100 MHz bandwidth
oscilloscope, 1.5 pF maximum probe capacitance, and 1 MΩ minimum impedance. The maximum length of
ground wire on the probe should be less than 5 mm. Ensure external noise from the system is not coupled
in the scope probe.
4.
The processor must not be subjected to any static VCC level that exceeds the VCC_MAX associated with any
particular current. Failure to adhere to this specification can shorten processor lifetime.
5.
ICC_MAX is specified at VCC_MAX. The processor is capable of drawing ICC_MAX for up to 10 ms. Refer to
Figure 2-2 and Figure 2-3 for further details on the average processor current draw over various time
durations.
6.
FMB is the flexible motherboard guideline. These guidelines are for estimation purposes only.
7.
The current specified is also for HALT and Enhanced HALT State.
8.
These specifications apply to the PLL power lands VCCA, VCCIOPLL, and VSSA. See Section 2.4.2 for
details. These parameters are based on design characterization and are not tested.
9.
This specification represents the total current for GTLREF_DATA and GTLREF_ADD per core.
10. VTT must be provided via a separate voltage source and must not be connected to VCC. This specification is
measured at the land.
26
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Electrical Specifications
11. Minimum VCC and maximum ICC are specified at the maximum processor case temperature (TCASE)
shown in Table 6-1.
12. This specification refers to the total reduction of the load line due to VID transitions below the specified
VID.
13. Individual processor VID values may be calibrated during manufacturing such that two devices at the same
frequency may have different VID settings.
14. Baseboard bandwidth is limited to 20 MHz.
15. ICC_TDC is the sustained (DC equivalent) current that the processor is capable of drawing indefinitely and
should be used for the voltage regulator temperature assessment. The voltage regulator is responsible for
monitoring its temperature and asserting the necessary signal to inform the processor of a thermal
excursion. Please see the applicable design guidelines for further details. The processor is capable of
drawing ICC_TDC indefinitely. Refer to Figure 2-2 and Figure 2-3 for further details on the average processor
current draw over various time durations. This parameter is based on design characterization and is not
tested.
16. This specification is per-processor. This is a steady-state ITT current specification, which is applicable when
both VTT and VCC are high. This parameter is based on design characterization and is not tested. Please
refer to the ITT Analysis of System Bus Components - Bensley Platform Whitepaper for platform
implementation guidance.
17. ICC_VTTOUT is specified at 1.2 V.
18.ICC_RESET is specified while PWRGOOD and RESET# are asserted.
19. This specification is per-processor. This is a power-up peak current specification, which is applicable when
VTT is powered up and VCC is not. This parameter is based on design characterization and is not tested.
Figure 2-2.
Dual-Core Intel® Xeon® Processor 5000 Series (1066 MHz) Load Current
versus Time
155
Sustained Current (A)
150
145
140
135
130
125
0.01
0.1
1
10
100
1000
Time Duration (s)
Notes:
1.
Processor or Voltage Regulator thermal protection circuitry should not trip for load currents greater than
ICC_TDC.
2.
Not 100% tested. Specified by design characterization.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
27
Electrical Specifications
Figure 2-3.
Dual-Core Intel® Xeon® Processor 5000 Series (667 MHz) and Dual-Core
Intel® Xeon® Processor 5063 (MV) Load Current versus Time
Notes:
1.
Processor or Voltage Regulator thermal protection circuitry should not trip for load currents greater than
ICC_TDC.
2.
Not 100% tested. Specified by design characterization.
Table 2-11. VCC Static and Transient Tolerance (Sheet 1 of 2)
28
ICC (A)
VCC_Max (V)
VCC_Typ (V)
VCC_Min (V)
Notes
0
VID - 0.000
VID - 0.015
VID - 0.030
1, 2, 3, 4
5
VID - 0.006
VID - 0.021
VID - 0.036
10
VID - 0.013
VID - 0.028
VID - 0.043
15
VID - 0.019
VID - 0.034
VID - 0.049
20
VID - 0.025
VID - 0.040
VID - 0.055
25
VID - 0.031
VID - 0.046
VID - 0.061
30
VID - 0.038
VID - 0.053
VID - 0.068
35
VID - 0.044
VID - 0.059
VID - 0.074
40
VID - 0.050
VID - 0.065
VID - 0.080
45
VID - 0.056
VID - 0.071
VID - 0.086
50
VID - 0.063
VID - 0.078
VID - 0.093
55
VID - 0.069
VID - 0.084
VID - 0.099
60
VID - 0.075
VID - 0.090
VID - 0.105
65
VID - 0.081
VID - 0.096
VID - 0.111
70
VID - 0.087
VID - 0.103
VID - 0.118
75
VID - 0.094
VID - 0.109
VID - 0.124
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Electrical Specifications
Table 2-11. VCC Static and Transient Tolerance (Sheet 2 of 2)
ICC (A)
VCC_Max (V)
VCC_Typ (V)
VCC_Min (V)
80
VID - 0.100
VID - 0.115
VID - 0.130
85
VID - 0.106
VID - 0.121
VID - 0.136
90
VID - 0.113
VID - 0.128
VID - 0.143
95
VID - 0.119
VID - 0.134
VID - 0.149
100
VID - 0.125
VID - 0.140
VID - 0.155
105
VID - 0.131
VID - 0.146
VID - 0.161
110
VID - 0.138
VID - 0.153
VID - 0.168
115
VID - 0.144
VID - 0.159
VID - 0.174
120
VID - 0.150
VID - 0.165
VID - 0.180
125
VID - 0.156
VID - 0.171
VID - 0.186
130
VID - 0.163
VID - 0.178
VID - 0.193
135
VID - 0.169
VID - 0.184
VID - 0.199
140
VID - 0.175
VID - 0.190
VID - 0.205
145
VID - 0.181
VID - 0.196
VID - 0.211
150
VID - 0.188
VID - 0.203
VID - 0.218
Notes
Notes:
1.
The VCC_MIN and VCC_MAX loadlines represent static and transient limits. Please see Section 2.12.1 for VCC
overshoot specifications.
2.
This table is intended to aid in reading discrete points on Figure 2-4.
3.
The loadlines specify voltage limits at the die measured at the VCC_DIE_SENSE and VSS_DIE_SENSE lands
and at the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Voltage regulation feedback for voltage
regulator circuits must also be taken from processor VCC_DIE_SENSE and VSS_DIE_SENSE lands and
VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Please refer to the appropriate platform design guide for
details on VR implementation.
4.
Non-shading denotes the expected ICC range applies to both Dual-Core Intel Xeon Processor 5000 series
(1066 MHz & 667 MHz) and Dual-Core Intel Xeon Processor 5063 (MV). Shading denotes the expected ICC
range applies to Dual-Core Intel Xeon Processor 5000 series (1066 MHz) only. [120 A - 150 A]
Figure 2-4.
VCC Static and Transient Tolerance Load Lines
Icc [A]
0
10
20
30
40
50
60
70
80
90
100
110
120
130
140
150
VID - 0.000
VID - 0.020
Vcc
Maximum
VID - 0.040
VID - 0.060
VID - 0.080
Vcc [V]
VID - 0.100
VID - 0.120
VID - 0.140
Vcc
Minimum
VID - 0.160
VID - 0.180
Vcc
Typical
VID - 0.200
VID - 0.220
VID - 0.240
VID - 0.260
Notes:
1.
The VCC_MIN and VCC_MAX loadlines represent static and transient limits. Please see Section 2.12.1 for VCC
overshoot specifications.
2.
Refer to Table 2-10 for processor VID information.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
29
Electrical Specifications
3.
4.
Refer to Table 2-11 for processor VCC information.
The load lines specify voltage limits at the die measured at the VCC_DIE_SENSE and VSS_DIE_SENSE
lands and at the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Voltage regulation feedback for voltage
regulator circuits must also be taken from processor VCC_DIE_SENSE and VSS_DIE_SENSE lands and
VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Please refer to the appropriate platform design guide for
details on VR implementation.
Table 2-12. BSEL[2:0], VID[5:0] Signal Group DC Specifications
Symbol
Parameter
RON
BSEL[2:0], VID[5:0]
Buffer On Resistance
Min
Max
Units
Notes1
N/A
120
Ω
2
IOL
Output Low Current
N/A
2.4
mA
2, 3
IOH
Output High Current
N/A
460
µA
2, 3
VTOL
Voltage Tolerance
0.95 * VTT
1.05 * VTT
V
4
Notes:
1.
Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2.
These parameters are based on design characterization and are not tested.
3.
IOL is measured at 0.10*VTT, IOH is measured at 0.90*VTT.
4.
Please refer to the appropriate platform design guide for implementation details.
Table 2-13. AGTL+ Signal Group DC Specifications
Symbol
Parameter
Min
Max
Unit
Notes1
VIL
Input Low Voltage
0.0
GTLREF - (0.10 * VTT)
V
2
VIH
Input High Voltage
GTLREF + (0.10 * VTT)
VTT
V
3, 4
VOH
Output High Voltage
0.90 * VTT
VTT
V
4
IOL
Output Low Current
N/A
VTT /
mA
4
ILI
Input Leakage Current
N/A
± 200
µA
5, 6
ILO
Output Leakage Current
N/A
± 200
µA
5, 6
RON
Buffer On Resistance
7
11
Ω
7
(0.50 * RTT_MIN + RON_MIN)
Notes:
1.
Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2.
VIL is defined as the voltage range at a receiving agent that will be interpreted as an electrical low value.
3.
VIH is defined as the voltage range at a receiving agent that will be interpreted as an electrical high value.
4.
VIH and VOH may experience excursions above VTT. However, input signal drivers must comply with the
signal quality specifications in Section 3.
5.
Leakage to VSS with land held at VTT.
6.
Leakage to VTT with land held at 300 mV.
7.
This parameter is based on design characterization and is not tested
Table 2-14. PWRGOOD Input and TAP Signal Group DC Specifications (Sheet 1 of 2)
Symbol
Parameter
VHYS
Input Hysteresis
Vt+
PWRGOOD Input Low to
High Threshold Voltage
TAP Input Low to High
Threshold Voltage
Vt-
PWRGOOD Input High to
Low Threshold Voltage
TAP Input High to Low
Threshold Voltage
VOH
30
Output High Voltage
Min
Max
Unit
120
396
mV
0.5 * (VTT + VHYS_MIN +
0.24)
0.5 * (VTT + VHYS_MAX +
0.24)
V
0.5 * (VTT + VHYS_MIN)
0.5 * (VTT + VHYS_MAX)
V
0.4 * VTT
0.6 * VTT
V
0.5 * (VTT -VHYS_MAX)
0.5 * (VTT - VHYS_MIN)
V
N/A
VTT
V
Notes 1,
2
3
4
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Electrical Specifications
Table 2-14. PWRGOOD Input and TAP Signal Group DC Specifications (Sheet 2 of 2)
Symbol
Parameter
Min
Max
Unit
ILI
Input Leakage Current
N/A
± 200
µA
ILO
Output Leakage Current
N/A
± 200
µA
RON
Buffer On Resistance
7
11
Ω
Notes 1,
2
5
Notes:
1.
Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2.
All outputs are open drain.
3.
VHYS represents the amount of hysteresis, nominally centered about 0.5 * VTT for all PWRGOOD and TAP
inputs.
4.
PWRGOOD input and the TAP signal group must meet system signal quality specification in Section 3.
5.
The maximum output current is based on maximum current handling capability of the buffer and is not
specified into the test load.
Table 2-15. GTL+ Asynchronous and AGTL+ Asynchronous Signal Group
DC Specifications
Notes1
Symbol
Parameter
Min
Max
Unit
VIL
Input Low Voltage
0.0
(0.5 * VTT) - (0.10 * VTT)
V
3, 11
VTT
V
4, 5, 7,
11
VIH
Input High Voltage
(0.5 * VTT) + (0.10 * VTT)
VOH
Output High Voltage
0.90*VTT
VTT
V
2, 5, 7
A
8
IOL
Output Low Current
-
VTT/
[(0.50*RTT_MIN)+(RON_MIN)]
ILI
Input Leakage Current
N/A
± 200
µA
9
ILO
Output Leakage
Current
N/A
± 200
µA
10
RON
Buffer On Resistance
7
11
Ω
6
Notes:
1.Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2.All outputs are open drain.
3.VIL is defined as the voltage range at a receiving agent that will be interpreted as a logical low value.
4.VIH is defined as the voltage range at a receiving agent that will be interpreted as a logical high value.
5.VIH and VOH may experience excursions above VTT. However, input signal drivers must comply with the signal
quality specifications in Section 3.
6.Refer to the processor HSPICE* I/O Buffer Models for I/V characteristics.
7.The VTT referred to in these specifications refers to instantaneous VTT.
8.The maximum output current is based on maximum current handling capability of the buffer and is not
specified into the test load.
9.Leakage to VSS with land held at VTT.
10.Leakage to VTT with land held at 300 mV.
11.LINT0/INTR and LINT1/NMI use GTLREF_ADD as a reference voltage. For these two signals VIH =
GTLREF_ADD + (0.10 * VTT) and VIL= GTLREF_ADD - (0.10 * VTT).
Table 2-16. VTTPWRGD DC Specifications
Symbol
2.12.1
Parameter
Min
Max
Unit
VIL
Input Low Voltage
0.0
0.30
V
VIH
Input High Voltage
0.90
VTT
V
VCC Overshoot Specification
The Dual-Core Intel Xeon Processor 5000 series can tolerate short transient overshoot
events where VCC exceeds the VID voltage when transitioning from a high-to-low
current load condition. This overshoot cannot exceed VID + VOS_MAX (VOS_MAX is the
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
31
Electrical Specifications
maximum allowable overshoot above VID). These specifications apply to the processor
die voltage as measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands and
across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands.
Table 2-17. VCC Overshoot Specifications
Symbol
Figure 2-5.
Parameter
Min
Max
Units
Figure
VOS_MAX
Magnitude of VCC overshoot above VID
50
mV
2-5
TOS_MAX
Time duration of VCC overshoot above VID
25
µs
2-5
Notes
VCC Overshoot Example Waveform
Example Overshoot Waveform
VOS
Voltage [V]
VID + 0.050
VID - 0.000
TOS
0
5
10
15
20
25
Time [us]
TOS: Overshoot time above VID
VOS: Overshoot above VID
Notes:
1.
VOS is the measured overshoot voltage above VID.
2.
TOS is the measured time duration above VID.
2.12.2
Die Voltage Validation
Core voltage (VCC) overshoot events at the processor must meet the specifications in
Table 2-17 when measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands
and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Overshoot events that
are < 10 ns in duration may be ignored. These measurement of processor die level
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
§
32
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Mechanical Specifications
3
Mechanical Specifications
The Dual-Core Intel Xeon Processor 5000 series are packaged in a Flip Chip Land Grid
Array (FC-LGA6) package that interfaces to the baseboard via a LGA771 socket. The
package consists of a processor core mounted on a pinless substrate with 771 lands. An
integrated heat spreader (IHS) is attached to the package substrate and core and
serves as the interface for processor component thermal solutions such as a heatsink.
Figure 3-1 shows a sketch of the processor package components and how they are
assembled together. .
The package components shown in Figure 3-1 include the following:
1. Integrated Heat Spreader (IHS)
2. Thermal Interface Material (TIM)
3. Processor Core (die)
4. Package Substrate
5. Landside capacitors
6. Package Lands
Figure 3-1.
Processor Package Assembly Sketch
IHS
Core (die)
TIM
Substrate
Package Lands
Capacitors
LGA771 Socket
System Board
Note:
3.1
This drawing is not to scale and is for reference only.
Package Mechanical Drawings
The package mechanical drawings are shown in Figure 3-2 through Figure 3-4. The
drawings include dimensions necessary to design a thermal solution for the processor
including:
1. Package reference and tolerance dimensions (total height, length, width, an so
forth)
2. IHS parallelism and tilt
3. Land dimensions
4. Top-side and back-side component keepout dimensions
5. Reference datums
Note:
All drawing dimensions are in mm [in.].
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
33
Mechanical Specifications
Figure 3-2.
Processor Package Drawing (Sheet 1 of 3)
Note:
34
Guidelines on potential IHS flatness variation with socket load plate actuation and installation of the
cooling solution is available in the processor Thermal/Mechanical Design Guidelines.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Mechanical Specifications
Figure 3-3.
Processor Package Drawing (Sheet 2 of 3)
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
35
Mechanical Specifications
Figure 3-4.
36
Processor Package Drawing (Sheet 3 of 3)
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Mechanical Specifications
3.2
Processor Component Keepout Zones
The processor may contain components on the substrate that define component
keepout zone requirements. A thermal and mechanical solution design must not intrude
into the required keepout zones. Decoupling capacitors are typically mounted to either
the topside or land-side of the package substrate. See Figure 3-4 for keepout zones.
3.3
Package Loading Specifications
Table 3-1 provides dynamic and static load specifications for the processor package.
These mechanical load limits should not be exceeded during heatsink assembly,
mechanical stress testing or standard drop and shipping conditions. The heatsink
attach solutions must not include continuous stress onto the processor with the
exception of a uniform load to maintain the heatsink-to-processor thermal interface.
Also, any mechanical system or component testing should not exceed these limits. The
processor package substrate should not be used as a mechanical reference or loadbearing surface for thermal or mechanical solutions. Please refer to the Dual-Core
Intel® Xeon® Processor 5000 Series Thermal/Mechanical Design Guidelines for further
details.
Table 3-1.
Package Loading Specifications
Parameter
Static
Compressive Load
Dynamic
Compressive Load
Transient Bend
Limits
Board
Thickness
Apply for all
board thickness
from 1.57 mm
(0.062”) to
2.54 mm
(0.100”)
R
Min
Max
Unit
Notes
25mm
<R<
45mm
80
18
133
30
N
lbf
1, 2, 3, 9,
10, 11,
12, 13
R>45mm
80
18
311
70
N
lbf
NA
311 N (max static
compressive load) +
222 N dynamic loading
70 lbf (max static
compressive load) +
50 lbf dynamic loading
N
lbf
750
µε
NA
1.57 mm
0.062”
NA
NA
NA
2.16 mm
0.085”
700
2.54 mm
0.100”
650
1, 3, 4, 5,
6
1,3,7,8
Notes:
1.
These specifications apply to uniform compressive loading in a direction perpendicular to the IHS top
surface.
2.
This is the minimum and maximum static force that can be applied by the heatsink and retention solution
to maintain the heatsink and processor interface.
3.
Loading limits are for the LGA771 socket.
4.
Dynamic compressive load applies to all board thickness.
5.
Dynamic loading is defined as an 11 ms duration average load superimposed on the static load
requirement.
6.
Test condition used a heatsink mass of 1 lbm with 50 g acceleration measured at heatsink mass. The
dynamic portion of this specification in the product application can have flexibility in specific values, but the
ultimate product of mass times acceleration should not exceed this dynamic load.
7.
Transient bend is defined as the transient board deflection during manufacturing such as board assembly
and system integration. It is a relatively slow bending event compared to shock and vibration tests.
8.
For more information on the transient bend limits, please refer to the MAS document entitled
Manufacturing with Intel® Components using 771-land LGA Package that Interfaces with the Motherboard
via a LGA771 Socket.
9.
Refer to the Dual-Core Intel® Xeon® Processor 5000 Series Thermal/Mechanical Design Guidelines for
information on heatsink clip load metrology.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
37
Mechanical Specifications
10. R is defined as the radial distance from the center of the LGA771 socket ball array to the center of heatsink
load reaction point closest to the socket.
11. Applies to populated sockets in fully populated and partially populated socket configurations.
12. Through life or product. Condition must be satisfied at the beginning of life and at the end of life.
13. Rigid back is not allowed. The board should flex in the enabled configuration.
3.4
Package Handling Guidelines
Table 3-2 includes a list of guidelines on a package handling in terms of recommended
maximum loading on the processor IHS relative to a fixed substrate. These package
handling loads may be experienced during heatsink removal.
Table 3-2.
Package Handling Guidelines
Parameter
Maximum Recommended
Units
Notes
Shear
311
70
N
lbf
1,4,5
Tensile
111
25
N
lbf
2,4,5
Torque
3.95
35
N-m
LBF-in
3,4,5
Notes:
1.
A shear load is defined as a load applied to the IHS in a direction parallel to the IHS top surface.
2.
A tensile load is defined as a pulling load applied to the IHS in a direction normal to the IHS surface.
3.
A torque load is defined as a twisting load applied to the IHS in an axis of rotation normal to the IHS top
surface.
4.
These guidelines are based on limited testing for design characterization and incidental applications (one
time only).
5.
Handling guidelines are for the package only and do not include the limits of the processor socket.
3.5
Package Insertion Specifications
The Dual-Core Intel Xeon Processor 5000 Series can be inserted and removed 15 times
from an LGA771 socket.
3.6
Processor Mass Specifications
The typical mass of the Dual-Core Intel Xeon Processor 5000 series is 21.5 grams [0.76
oz.]. This includes all components which make up the entire processor product.
3.7
Processor Materials
The Dual-Core Intel Xeon Processor 5000 series are assembled from several
components. The basic material properties are described in Table 3-3.
Table 3-3.
Processor Materials
Component
38
Material
Integrated Heat Spreader (IHS)
Nickel over copper
Substrate
Fiber-reinforced resin
Substrate Lands
Gold over nickel
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Mechanical Specifications
3.8
Processor Markings
Figure 3-5 and Figure 3-6 shows the topside markings on the processor. This diagram
aids in the identification of the Dual-Core Intel Xeon Processor 5000 series.
Figure 3-5.
Dual-Core Intel Xeon Processor 5000 Series Top-side Markings
GROUP1LINE1
GROUP1LINE2
GROUP1LINE3
GROUP1LINE4
GROUP1LINE5
Legend:
Mark Text (Production Mark):
GROUP1LINE1
GROUP1LINE2
GROUP1LINE3
GROUP1LINE4
GROUP1LINE5
3733DP/4M/1066
Intel ® Xeon ®
5080 SXXX COO
i (M) © ‘05
FPO
ATPO
S/N
Figure 3-6.
Dual-Core Intel Xeon Processor 5063 (MV) Top-side Markings
GROUP1LINE1
GROUP1LINE2
GROUP1LINE3
GROUP1LINE4
GROUP1LINE5
Legend:
Mark Text (Production Mark):
GROUP1LINE1
GROUP1LINE2
GROUP1LINE3
GROUP1LINE4
GROUP1LINE5
3200DP/4M/1066/MV
Intel ® Xeon ®
5063 SXXX COO
i (M) © ‘05
FPO
ATPO
S/N
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
39
Mechanical Specifications
3.9
Processor Land Coordinates
Figure 3-7 and Figure 3-8 show the top and bottom view of the processor land
coordinates, respectively. The coordinates are referred to throughout the document to
identify processor lands.
Figure 3-7.
Processor Land Coordinates, Top View
VCC / VSS
30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9
AN
AM
AL
AK
AJ
AH
AG
AF
AE
AD
AC
AB
AA
Y
6 5
4 3
2 1
AN
AM
AL
AK
AJ
AH
AG
AF
AE
AD
AC
AB
AA
Y
Socket 771
Quadrants
Top View
W
V
U
T
R
P
N
M
L
K
J
W
V
U
T
R
P
N
M
L
K
J
H
G
F
H
G
F
E
D
C
B
E
D
C
B
A
A
30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9
VTT / Clocks
40
8 7
8 7
6 5
4 3
Address /
Common Clock /
Async
2 1
Data
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Mechanical Specifications
Figure 3-8.
Processor Land Coordinates, Bottom View
VCC / VSS
1
Address /
Common Clock /
Async
2 3
4
5 6
7 8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
AN
AM
AL
AN
AM
AL
AK
AJ
AH
AG
AF
AE
AD
AC
AK
AJ
AH
AG
AF
AE
AD
AC
AB
AA
Y
AB
AA
Y
Socket 771
Quadrants
Bottom View
W
V
U
T
R
P
N
M
W
V
U
T
R
P
N
M
L
K
J
H
L
K
J
H
G
F
E
D
C
B
A
G
F
E
D
C
B
A
1
2 3
4
5 6
7 8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
Data
VTT / Clocks
§
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
41
Mechanical Specifications
42
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Land Listing
4
Land Listing
4.1
Dual-Core Intel Xeon Processor 5000 Series Land
Assignments
This section provides sorted land list in Table 4-1 and Table 4-2. Table 4-1 is a listing of
all processor lands ordered alphabetically by land name. Table 4-2 is a listing of all
processor lands ordered by land number.
4.1.1
Land Listing by Land Name
Table 4-1.
Land Listing by Land Name (Sheet 1 of 9)
Land Name
Land Signal Buffer
No.
Type
Direction
Land Name
Land Signal Buffer
No.
Type
Direction
A03#
M5
Source Sync
Input/Output
A33#
AH5
Source Sync
A04#
P6
Source Sync
Input/Output
A34#
AJ5
Source Sync
Input/Output
Input/Output
A05#
L5
Source Sync
Input/Output
A35#
AJ6
Source Sync
Input/Output
A06#
L4
Source Sync
Input/Output
A20M#
K3
ASync GTL+
Input
A07#
M4
Source Sync
Input/Output
ADS#
D2
Common Clk
Input/Output
A08#
R4
Source Sync
Input/Output
ADSTB0#
R6
Source Sync
Input/Output
A09#
T5
Source Sync
Input/Output
ADSTB1#
AD5
Source Sync
Input/Output
A10#
U6
Source Sync
Input/Output
AP0#
U2
Common Clk
Input/Output
A11#
T4
Source Sync
Input/Output
AP1#
U3
Common Clk
Input/Output
A12#
U5
Source Sync
Input/Output
BCLK0
F28
Clk
Input
A13#
U4
Source Sync
Input/Output
BCLK1
G28
Clk
Input
A14#
V5
Source Sync
Input/Output
BINIT#
AD3
Common Clk
Input/Output
A15#
V4
Source Sync
Input/Output
BNR#
C2
Common Clk
Input/Output
Input/Output
A16#
W5
Source Sync
Input/Output
BPM0#
AJ2
Common Clk
A17#
AB6
Source Sync
Input/Output
BPM1#
AJ1
Common Clk
Input/Output
A18#
W6
Source Sync
Input/Output
BPM2#
AD2
Common Clk
Input/Output
A19#
Y6
Source Sync
Input/Output
BPM3#
AG2
Common Clk
Input/Output
A20#
Y4
Source Sync
Input/Output
BPM4#
AF2
Common Clk
Input/Output
A21#
AA4
Source Sync
Input/Output
BPM5#
AG3
Common Clk
Input/Output
A22#
AD6
Source Sync
Input/Output
BPRI#
G8
Common Clk
Input
A23#
AA5
Source Sync
Input/Output
BR0#
F3
Common Clk
Input/Output
A24#
AB5
Source Sync
Input/Output
BR1#
H5
Common Clk
Input
A25#
AC5
Source Sync
Input/Output
BSEL0
G29
Power/Other
Output
A26#
AB4
Source Sync
Input/Output
BSEL1
H30
Power/Other
Output
A27#
AF5
Source Sync
Input/Output
BSEL2
G30
Power/Other
Output
A28#
AF4
Source Sync
Input/Output
COMP0
A13
Power/Other
Input
A29#
AG6
Source Sync
Input/Output
COMP1
T1
Power/Other
Input
A30#
AG4
Source Sync
Input/Output
COMP2
G2
Power/Other
Input
A31#
AG5
Source Sync
Input/Output
COMP3
R1
Power/Other
Input
A32#
AH4
Source Sync
Input/Output
COMP4
J2
Power/Other
Input
COMP5
T2
Power/Other
Input
D40#
E19
Source Sync
Input/Output
COMP6
Y3
Power/Other
Input
D41#
F20
Source Sync
Input/Output
COMP7
AE3
Power/Other
Input
D42#
E21
Source Sync
Input/Output
D00#
B4
Source Sync
Input/Output
D43#
F21
Source Sync
Input/Output
D01#
C5
Source Sync
Input/Output
D44#
G21
Source Sync
Input/Output
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
43
Land Listing
Table 4-1.
Land Listing by Land Name (Sheet 2 of 9)
Land Name
44
Land Signal Buffer
No.
Type
Direction
Land Name
Land Signal Buffer
No.
Type
Direction
D02#
A4
Source Sync
Input/Output
D45#
E22
Source Sync
D03#
C6
Source Sync
Input/Output
D46#
D22
Source Sync
Input/Output
Input/Output
D04#
A5
Source Sync
Input/Output
D47#
G22
Source Sync
Input/Output
D05#
B6
Source Sync
Input/Output
D48#
D20
Source Sync
Input/Output
D06#
B7
Source Sync
Input/Output
D49#
D17
Source Sync
Input/Output
D07#
A7
Source Sync
Input/Output
D50#
A14
Source Sync
Input/Output
D08#
A10
Source Sync
Input/Output
D51#
C15
Source Sync
Input/Output
D09#
A11
Source Sync
Input/Output
D52#
C14
Source Sync
Input/Output
D10#
B10
Source Sync
Input/Output
D53#
B15
Source Sync
Input/Output
D11#
C11
Source Sync
Input/Output
D54#
C18
Source Sync
Input/Output
D12#
D8
Source Sync
Input/Output
D55#
B16
Source Sync
Input/Output
D13#
B12
Source Sync
Input/Output
D56#
A17
Source Sync
Input/Output
D14#
C12
Source Sync
Input/Output
D57#
B18
Source Sync
Input/Output
D15#
D11
Source Sync
Input/Output
D58#
C21
Source Sync
Input/Output
D16#
G9
Source Sync
Input/Output
D59#
B21
Source Sync
Input/Output
D17#
F8
Source Sync
Input/Output
D60#
B19
Source Sync
Input/Output
D18#
F9
Source Sync
Input/Output
D61#
A19
Source Sync
Input/Output
D19#
E9
Source Sync
Input/Output
D62#
A22
Source Sync
Input/Output
D20#
D7
Source Sync
Input/Output
D63#
B22
Source Sync
Input/Output
D21#
E10
Source Sync
Input/Output
DBI0#
A8
Source Sync
Input/Output
D22#
D10
Source Sync
Input/Output
DBI1#
G11
Source Sync
Input/Output
D23#
F11
Source Sync
Input/Output
DBI2#
D19
Source Sync
Input/Output
D24#
F12
Source Sync
Input/Output
DBI3#
C20
Source Sync
Input/Output
D25#
D13
Source Sync
Input/Output
DBR#
AC2
Power/Other
Output
D26#
E13
Source Sync
Input/Output
DBSY#
B2
Common Clk
Input/Output
D27#
G13
Source Sync
Input/Output
DEFER#
G7
Common Clk
Input
D28#
F14
Source Sync
Input/Output
DP0#
J16
Common Clk
Input/Output
D29#
G14
Source Sync
Input/Output
DP1#
H15
Common Clk
Input/Output
D30#
F15
Source Sync
Input/Output
DP2#
H16
Common Clk
Input/Output
D31#
G15
Source Sync
Input/Output
DP3#
J17
Common Clk
Input/Output
D32#
G16
Source Sync
Input/Output
DRDY#
C1
Common Clk
Input/Output
D33#
E15
Source Sync
Input/Output
DSTBN0#
C8
Source Sync
Input/Output
D34#
E16
Source Sync
Input/Output
DSTBN1#
G12
Source Sync
Input/Output
D35#
G18
Source Sync
Input/Output
DSTBN2#
G20
Source Sync
Input/Output
D36#
G17
Source Sync
Input/Output
DSTBN3#
A16
Source Sync
Input/Output
D37#
F17
Source Sync
Input/Output
DSTBP0#
B9
Source Sync
Input/Output
D38#
F18
Source Sync
Input/Output
DSTBP1#
E12
Source Sync
Input/Output
D39#
E18
Source Sync
Input/Output
DSTBP2#
G19
Source Sync
Input/Output
DSTBP3#
C17
Source Sync
Input/Output
RESERVED
E23
FERR#/PBE#
R3
ASync GTL+
Output
RESERVED
E24
FORCEPR#
AK6
ASync GTL+
Input
RESERVED
E5
GTLREF_ADD_C0
H1
Power/Other
Input
RESERVED
E6
GTLREF_ADD_C1
H2
Power/Other
Input
RESERVED
E7
GTLREF_DATA_C0
G10
Power/Other
Input
RESERVED
F23
F29
GTLREF_DATA_C1
F2
Power/Other
Input
RESERVED
HIT#
D4
Common Clk
Input/Output
RESERVED
F6
HITM#
E4
Common Clk
Input/Output
RESERVED
G5
IERR#
AB2
ASync GTL+
Output
RESERVED
G6
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Land Listing
Table 4-1.
Land Name
Land Listing by Land Name (Sheet 3 of 9)
Land Signal Buffer
No.
Type
Direction
Land Name
Land Signal Buffer
No.
Type
Direction
IGNNE#
N2
ASync GTL+
Input
RESERVED
J3
INIT#
P3
ASync GTL+
Input
RESERVED
N4
LINT0
K1
ASync GTL+
Input
RESERVED
N5
LINT1
L1
ASync GTL+
Input
RESERVED
P5
LL_ID0
V2
Power/Other
Output
RESERVED
W2
LL_ID1
AA2
Power/Other
Output
RESERVED
Y1
LOCK#
C3
Common Clk
Input/Output
RESET#
G23
Common Clk
Input
MCERR#
AB3
Common Clk
Input/Output
RS0#
B3
Common Clk
Input
MS_ID0
W1
Power/Other
Output
RS1#
F5
Common Clk
Input
MS_ID1
V1
Power/Other
Output
RS2#
A3
Common Clk
Input
PROCHOT#
AL2
ASync GTL+
Output
RSP#
H4
Common Clk
Input
PWRGOOD
N1
Power/Other
Input
SKTOCC#
AE8
Power/Other
Output
REQ0#
K4
Source Sync
Input/Output
SMI#
P2
ASync GTL+
Input
REQ1#
J5
Source Sync
Input/Output
STPCLK#
M3
ASync GTL+
Input
REQ2#
M6
Source Sync
Input/Output
TCK
AE1
TAP
Input
REQ3#
K6
Source Sync
Input/Output
TDI
AD1
TAP
Input
REQ4#
J6
Source Sync
Input/Output
TDO
AF1
TAP
Output
I
RESERVED
A20
TEST_BUS
AH2
Power/Other
RESERVED
AC4
TESTHI00
F26
Power/Other
RESERVED
AE4
TESTHI01
W3
Power/Other
Input
RESERVED
AE6
TESTHI02
F25
Power/Other
Input
RESERVED
AK3
TESTHI03
G25
Power/Other
Input
RESERVED
AJ3
TESTHI04
G27
Power/Other
Input
RESERVED
AM5
TESTHI05
G26
Power/Other
Input
RESERVED
AN5
TESTHI06
G24
Power/Other
Input
RESERVED
AN6
TESTHI07
F24
Power/Other
Input
RESERVED
B13
TESTHI08
G3
Power/Other
Input
RESERVED
C9
TESTHI09
G4
Power/Other
Input
RESERVED
D1
TESTHI10
P1
Power/Other
Input
RESERVED
D14
TESTHI11
L2
Power/Other
Input
RESERVED
D16
THERMDA
AL1
Power/Other
Output
RESERVED
D23
THERMDA2
AJ7
Power/Other
Output
RESERVED
E1
THERMDC
AK1
Power/Other
Output
THERMDC2
AH7
Power/Other
Output
VCC
AF8
Power/Other
THERMTRIP#
M2
ASync GTL+
Output
VCC
AF9
Power/Other
TMS
AC1
TAP
Input
VCC
AG11
Power/Other
TRDY#
E3
Common Clk
Input
VCC
AG12
Power/Other
TRST#
AG1
TAP
Input
VCC
AG14
Power/Other
VCC
AA8
Power/Other
VCC
AG15
Power/Other
VCC
AB8
Power/Other
VCC
AG18
Power/Other
VCC
AC23
Power/Other
VCC
AG19
Power/Other
VCC
AC24
Power/Other
VCC
AG21
Power/Other
VCC
AC25
Power/Other
VCC
AG22
Power/Other
VCC
AC26
Power/Other
VCC
AG25
Power/Other
VCC
AC27
Power/Other
VCC
AG26
Power/Other
VCC
AC28
Power/Other
VCC
AG27
Power/Other
VCC
AC29
Power/Other
VCC
AG28
Power/Other
VCC
AC30
Power/Other
VCC
AG29
Power/Other
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Input
45
Land Listing
Table 4-1.
Land Name
46
Land Listing by Land Name (Sheet 4 of 9)
Land Signal Buffer
No.
Type
Direction
Land Name
Land Signal Buffer
No.
Type
VCC
AC8
Power/Other
VCC
AG30
Power/Other
VCC
AD23
Power/Other
VCC
AG8
Power/Other
VCC
AD24
Power/Other
VCC
AG9
Power/Other
VCC
AD25
Power/Other
VCC
AH11
Power/Other
VCC
AD26
Power/Other
VCC
AH12
Power/Other
VCC
AD27
Power/Other
VCC
AH14
Power/Other
VCC
AD28
Power/Other
VCC
AH15
Power/Other
VCC
AD29
Power/Other
VCC
AH18
Power/Other
VCC
AD30
Power/Other
VCC
AH19
Power/Other
VCC
AD8
Power/Other
VCC
AH21
Power/Other
VCC
AE11
Power/Other
VCC
AH22
Power/Other
VCC
AE12
Power/Other
VCC
AH25
Power/Other
VCC
AE14
Power/Other
VCC
AH26
Power/Other
VCC
AE15
Power/Other
VCC
AH27
Power/Other
VCC
AE18
Power/Other
VCC
AH28
Power/Other
VCC
AE19
Power/Other
VCC
AH29
Power/Other
VCC
AE21
Power/Other
VCC
AH30
Power/Other
VCC
AE22
Power/Other
VCC
AH8
Power/Other
VCC
AE23
Power/Other
VCC
AH9
Power/Other
VCC
AE9
Power/Other
VCC
AJ11
Power/Other
VCC
AF11
Power/Other
VCC
AJ12
Power/Other
VCC
AF12
Power/Other
VCC
AJ14
Power/Other
VCC
AF14
Power/Other
VCC
AJ15
Power/Other
VCC
AF15
Power/Other
VCC
AJ18
Power/Other
VCC
AF18
Power/Other
VCC
AJ19
Power/Other
VCC
AF19
Power/Other
VCC
AJ21
Power/Other
VCC
AF21
Power/Other
VCC
AJ22
Power/Other
VCC
AF22
Power/Other
VCC
AJ25
Power/Other
VCC
AJ26
Power/Other
VCC
AN12
Power/Other
VCC
AJ8
Power/Other
VCC
AN14
Power/Other
VCC
AJ9
Power/Other
VCC
AN15
Power/Other
VCC
AK11
Power/Other
VCC
AN18
Power/Other
VCC
AK12
Power/Other
VCC
AN19
Power/Other
VCC
AK14
Power/Other
VCC
AN21
Power/Other
VCC
AK15
Power/Other
VCC
AN22
Power/Other
VCC
AK18
Power/Other
VCC
AN25
Power/Other
VCC
AK19
Power/Other
VCC
AN26
Power/Other
VCC
AK21
Power/Other
VCC
AN8
Power/Other
VCC
AK22
Power/Other
VCC
AN9
Power/Other
VCC
AK25
Power/Other
VCC
J10
Power/Other
VCC
AK26
Power/Other
VCC
J11
Power/Other
VCC
AK8
Power/Other
VCC
J12
Power/Other
VCC
AK9
Power/Other
VCC
J13
Power/Other
VCC
AL11
Power/Other
VCC
J14
Power/Other
VCC
AL12
Power/Other
VCC
J15
Power/Other
VCC
AL14
Power/Other
VCC
J18
Power/Other
VCC
AL15
Power/Other
VCC
J19
Power/Other
VCC
AL18
Power/Other
VCC
J20
Power/Other
Direction
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Land Listing
Table 4-1.
Land Name
Land Listing by Land Name (Sheet 5 of 9)
Land Signal Buffer
No.
Type
Direction
Land Name
Land Signal Buffer
No.
Type
VCC
AL19
Power/Other
VCC
J21
Power/Other
VCC
AL21
Power/Other
VCC
J22
Power/Other
VCC
AL22
Power/Other
VCC
J23
Power/Other
VCC
AL25
Power/Other
VCC
J24
Power/Other
VCC
AL26
Power/Other
VCC
J25
Power/Other
VCC
AL29
Power/Other
VCC
J26
Power/Other
VCC
AL30
Power/Other
VCC
J27
Power/Other
VCC
AL9
Power/Other
VCC
J28
Power/Other
VCC
AM11
Power/Other
VCC
J29
Power/Other
VCC
AM12
Power/Other
VCC
J30
Power/Other
VCC
AM14
Power/Other
VCC
J8
Power/Other
VCC
AM15
Power/Other
VCC
J9
Power/Other
VCC
AM18
Power/Other
VCC
K23
Power/Other
VCC
AM19
Power/Other
VCC
K24
Power/Other
VCC
AM21
Power/Other
VCC
K25
Power/Other
VCC
AM22
Power/Other
VCC
K26
Power/Other
VCC
AM25
Power/Other
VCC
K27
Power/Other
VCC
AM26
Power/Other
VCC
K28
Power/Other
VCC
AM29
Power/Other
VCC
K29
Power/Other
VCC
AM30
Power/Other
VCC
K30
Power/Other
VCC
AM8
Power/Other
VCC
K8
Power/Other
VCC
AM9
Power/Other
VCC
L8
Power/Other
VCC
AN11
Power/Other
VCC
M23
Power/Other
VCC
M24
Power/Other
VCC
W28
Power/Other
VCC
M25
Power/Other
VCC
W29
Power/Other
VCC
M26
Power/Other
VCC
W30
Power/Other
Direction
VCC
M27
Power/Other
VCC
W8
Power/Other
VCC
M28
Power/Other
VCC
Y23
Power/Other
VCC
M29
Power/Other
VCC
Y24
Power/Other
VCC
M30
Power/Other
VCC
Y25
Power/Other
VCC
M8
Power/Other
VCC
Y26
Power/Other
VCC
N23
Power/Other
VCC
Y27
Power/Other
VCC
N24
Power/Other
VCC
Y28
Power/Other
VCC
N25
Power/Other
VCC
Y29
Power/Other
VCC
N26
Power/Other
VCC
Y30
Power/Other
VCC
N27
Power/Other
VCC
Y8
Power/Other
VCC
N28
Power/Other
VCC_DIE_SENSE
AN3
Power/Other
Output
VCC
N29
Power/Other
VCC_DIE_SENSE2
AL8
Power/Other
Output
VCC
N30
Power/Other
VCCA
A23
Power/Other
Input
VCC
N8
Power/Other
VCCIOPLL
C23
Power/Other
Input
VCC
P8
Power/Other
VID0
AM2
Power/Other
Output
VCC
R8
Power/Other
VID1
AL5
Power/Other
Output
VCC
T23
Power/Other
VID2
AM3
Power/Other
Output
VCC
T24
Power/Other
VID3
AL6
Power/Other
Output
VCC
T25
Power/Other
VID4
AK4
Power/Other
Output
VCC
T26
Power/Other
VID5
AL4
Power/Other
Output
VCC
T27
Power/Other
VID_SELECT
AN7
Power/Other
Output
VCC
T28
Power/Other
VSS
A12
Power/Other
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
47
Land Listing
Table 4-1.
Land Name
48
Land Listing by Land Name (Sheet 6 of 9)
Land Signal Buffer
No.
Type
Direction
Land Name
Land Signal Buffer
No.
Type
VCC
T29
Power/Other
VSS
A15
VCC
T30
Power/Other
VSS
A18
Power/Other
VCC
T8
Power/Other
VSS
A2
Power/Other
VCC
U23
Power/Other
VSS
A21
Power/Other
VCC
U24
Power/Other
VSS
A24
Power/Other
VCC
U25
Power/Other
VSS
A6
Power/Other
VCC
U26
Power/Other
VSS
A9
Power/Other
VCC
U27
Power/Other
VSS
AA23
Power/Other
VCC
U28
Power/Other
VSS
AA24
Power/Other
VCC
U29
Power/Other
VSS
AA25
Power/Other
VCC
U30
Power/Other
VSS
AA26
Power/Other
VCC
U8
Power/Other
VSS
AA27
Power/Other
Power/Other
Direction
Power/Other
VCC
V8
Power/Other
VSS
AA28
VCC
W23
Power/Other
VSS
AA29
Power/Other
VCC
W24
Power/Other
VSS
AA3
Power/Other
VCC
W25
Power/Other
VSS
AA30
Power/Other
VCC
W26
Power/Other
VSS
AA6
Power/Other
VCC
W27
Power/Other
VSS
AA7
Power/Other
VSS
AB1
Power/Other
VSS
AF30
Power/Other
VSS
AB23
Power/Other
VSS
AF6
Power/Other
VSS
AB24
Power/Other
VSS
AF7
Power/Other
VSS
AB25
Power/Other
VSS
AG10
Power/Other
VSS
AB26
Power/Other
VSS
AG13
Power/Other
VSS
AB27
Power/Other
VSS
AG16
Power/Other
VSS
AB28
Power/Other
VSS
AG17
Power/Other
VSS
AB29
Power/Other
VSS
AG20
Power/Other
VSS
AB30
Power/Other
VSS
AG23
Power/Other
VSS
AB7
Power/Other
VSS
AG24
Power/Other
VSS
AC3
Power/Other
VSS
AG7
Power/Other
VSS
AC6
Power/Other
VSS
AH1
Power/Other
VSS
AC7
Power/Other
VSS
AH10
Power/Other
VSS
AD4
Power/Other
VSS
AH13
Power/Other
VSS
AD7
Power/Other
VSS
AH16
Power/Other
VSS
AE10
Power/Other
VSS
AH17
Power/Other
VSS
AE13
Power/Other
VSS
AH20
Power/Other
VSS
AE16
Power/Other
VSS
AH23
Power/Other
VSS
AE17
Power/Other
VSS
AH24
Power/Other
VSS
AE2
Power/Other
VSS
AH3
Power/Other
VSS
AE20
Power/Other
VSS
AH6
Power/Other
VSS
AE24
Power/Other
VSS
AJ10
Power/Other
VSS
AE25
Power/Other
VSS
AJ13
Power/Other
VSS
AE26
Power/Other
VSS
AJ16
Power/Other
VSS
AE27
Power/Other
VSS
AJ17
Power/Other
VSS
AE28
Power/Other
VSS
AJ20
Power/Other
VSS
AE29
Power/Other
VSS
AJ23
Power/Other
VSS
AE30
Power/Other
VSS
AJ24
Power/Other
VSS
AE5
Power/Other
VSS
AJ27
Power/Other
VSS
AE7
Power/Other
VSS
AJ28
Power/Other
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Land Listing
Table 4-1.
Land Name
Land Listing by Land Name (Sheet 7 of 9)
Land Signal Buffer
No.
Type
Direction
Land Name
Land Signal Buffer
No.
Type
VSS
AF10
Power/Other
VSS
AJ29
VSS
AF13
Power/Other
VSS
AJ30
Power/Other
VSS
AF16
Power/Other
VSS
AJ4
Power/Other
VSS
AF17
Power/Other
VSS
AK10
Power/Other
VSS
AF20
Power/Other
VSS
AK13
Power/Other
VSS
AF23
Power/Other
VSS
AK16
Power/Other
VSS
AF24
Power/Other
VSS
AK17
Power/Other
VSS
AF25
Power/Other
VSS
AK2
Power/Other
VSS
AF26
Power/Other
VSS
AK20
Power/Other
VSS
AF27
Power/Other
VSS
AK23
Power/Other
VSS
AF28
Power/Other
VSS
AK24
Power/Other
VSS
AF29
Power/Other
VSS
AK27
Power/Other
VSS
AF3
Power/Other
VSS
AK28
Power/Other
VSS
AK29
Power/Other
VSS
C10
Power/Other
VSS
AK30
Power/Other
VSS
C13
Power/Other
VSS
AK5
Power/Other
VSS
C16
Power/Other
VSS
AK7
Power/Other
VSS
C19
Power/Other
VSS
AL10
Power/Other
VSS
C22
Power/Other
Power/Other
VSS
AL13
Power/Other
VSS
C24
Power/Other
VSS
AL16
Power/Other
VSS
C4
Power/Other
VSS
AL17
Power/Other
VSS
C7
Power/Other
VSS
AL20
Power/Other
VSS
D12
Power/Other
VSS
AL23
Power/Other
VSS
D15
Power/Other
VSS
AL24
Power/Other
VSS
D18
Power/Other
VSS
AL27
Power/Other
VSS
D21
Power/Other
VSS
AL28
Power/Other
VSS
D24
Power/Other
VSS
AL3
Power/Other
VSS
D3
Power/Other
VSS
AM1
Power/Other
VSS
D5
Power/Other
VSS
AM10
Power/Other
VSS
D6
Power/Other
VSS
AM13
Power/Other
VSS
D9
Power/Other
VSS
AM16
Power/Other
VSS
E11
Power/Other
VSS
AM17
Power/Other
VSS
E14
Power/Other
VSS
AM20
Power/Other
VSS
E17
Power/Other
VSS
AM23
Power/Other
VSS
E2
Power/Other
VSS
AM24
Power/Other
VSS
E20
Power/Other
VSS
AM27
Power/Other
VSS
E25
Power/Other
VSS
AM28
Power/Other
VSS
E26
Power/Other
VSS
AM4
Power/Other
VSS
E27
Power/Other
VSS
AM7
Power/Other
VSS
E28
Power/Other
VSS
AN1
Power/Other
VSS
E29
Power/Other
VSS
AN10
Power/Other
VSS
E8
Power/Other
VSS
AN13
Power/Other
VSS
F1
Power/Other
VSS
AN16
Power/Other
VSS
F10
Power/Other
VSS
AN17
Power/Other
VSS
F13
Power/Other
VSS
AN2
Power/Other
VSS
F16
Power/Other
VSS
AN20
Power/Other
VSS
F19
Power/Other
VSS
AN23
Power/Other
VSS
F22
Power/Other
VSS
AN24
Power/Other
VSS
F4
Power/Other
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Direction
49
Land Listing
Table 4-1.
Land Name
50
Land Listing by Land Name (Sheet 8 of 9)
Land Signal Buffer
No.
Type
Direction
Land Name
Land Signal Buffer
No.
Type
VSS
B1
Power/Other
VSS
F7
Power/Other
VSS
B11
Power/Other
VSS
G1
Power/Other
VSS
B14
Power/Other
VSS
H10
Power/Other
VSS
B17
Power/Other
VSS
H11
Power/Other
VSS
B20
Power/Other
VSS
H12
Power/Other
VSS
B24
Power/Other
VSS
H13
Power/Other
VSS
B5
Power/Other
VSS
H14
Power/Other
VSS
B8
Power/Other
VSS
H17
Power/Other
VSS
H18
Power/Other
VSS
P28
Power/Other
VSS
H19
Power/Other
VSS
P29
Power/Other
VSS
H20
Power/Other
VSS
P30
Power/Other
VSS
H21
Power/Other
VSS
P4
Power/Other
VSS
H22
Power/Other
VSS
P7
Power/Other
VSS
H23
Power/Other
VSS
R2
Power/Other
VSS
H24
Power/Other
VSS
R23
Power/Other
VSS
H25
Power/Other
VSS
R24
Power/Other
VSS
H26
Power/Other
VSS
R25
Power/Other
VSS
H27
Power/Other
VSS
R26
Power/Other
VSS
H28
Power/Other
VSS
R27
Power/Other
VSS
H29
Power/Other
VSS
R28
Power/Other
VSS
H3
Power/Other
VSS
R29
Power/Other
VSS
H6
Power/Other
VSS
R30
Power/Other
VSS
H7
Power/Other
VSS
R5
Power/Other
VSS
H8
Power/Other
VSS
R7
Power/Other
VSS
H9
Power/Other
VSS
T3
Power/Other
VSS
J4
Power/Other
VSS
T6
Power/Other
VSS
J7
Power/Other
VSS
T7
Power/Other
VSS
K2
Power/Other
VSS
U1
Power/Other
VSS
K5
Power/Other
VSS
U7
Power/Other
VSS
K7
Power/Other
VSS
V23
Power/Other
VSS
L23
Power/Other
VSS
V24
Power/Other
VSS
L24
Power/Other
VSS
V25
Power/Other
VSS
L25
Power/Other
VSS
V26
Power/Other
VSS
L26
Power/Other
VSS
V27
Power/Other
VSS
L27
Power/Other
VSS
V28
Power/Other
VSS
L28
Power/Other
VSS
V29
Power/Other
VSS
L29
Power/Other
VSS
V3
Power/Other
Direction
VSS
L3
Power/Other
VSS
V30
Power/Other
VSS
L30
Power/Other
VSS
V6
Power/Other
VSS
L6
Power/Other
VSS
V7
Power/Other
VSS
L7
Power/Other
VSS
W4
Power/Other
VSS
M1
Power/Other
VSS
W7
Power/Other
VSS
M7
Power/Other
VSS
Y2
Power/Other
VSS
N3
Power/Other
VSS
Y5
Power/Other
VSS
N6
Power/Other
VSS
Y7
Power/Other
VSS
N7
Power/Other
VSS_DIE_SENSE
AN4
Power/Other
Output
VSS
P23
Power/Other
VSS_DIE_SENSE2
AL7
Power/Other
Output
VSS
P24
Power/Other
VSSA
B23
Power/Other
Input
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Land Listing
Table 4-1.
Land Name
Land Listing by Land Name (Sheet 9 of 9)
Land Signal Buffer
No.
Type
Direction
Land Name
Land Signal Buffer
No.
Type
VSS
P25
Power/Other
VTT
A25
VSS
P26
Power/Other
VTT
A26
Power/Other
VSS
P27
Power/Other
VTT
B25
Power/Other
VTT
B26
Power/Other
VTT
D26
Power/Other
VTT
B27
Power/Other
VTT
D27
Power/Other
VTT
B28
Power/Other
VTT
D28
Power/Other
VTT
B29
Power/Other
VTT
D29
Power/Other
VTT
B30
Power/Other
VTT
D30
Power/Other
VTT
C25
Power/Other
VTT
E30
Power/Other
Direction
Power/Other
VTT
C26
Power/Other
VTT
F30
Power/Other
VTT
C27
Power/Other
VTT_OUT
AA1
Power/Other
Output
VTT
C28
Power/Other
VTT_OUT
J1
Power/Other
Output
VTT
C29
Power/Other
RESERVED
F27
VTT
C30
Power/Other
VTTPWRGD
AM6
Power/Other
Input
VTT
D25
Power/Other
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
51
Land Listing
4.1.2
Land Listing by Land Number
Table 4-2.
Land Listing by Land Number (Sheet 1 of 9)
Land
No.
Land Name
Signal Buffer
Type
Direction
Land
No.
Land Name
Signal Buffer
Type
A10
D08#
Source Sync
Input/Output
A11
D09#
Source Sync
Input/Output
AB1
VSS
Power/Other
AB2
IERR#
A12
VSS
Power/Other
ASync GTL+
AB23
VSS
Power/Other
A13
COMP0
Power/Other
Input
AB24
VSS
Power/Other
A14
D50#
Source Sync
Input/Output
AB25
VSS
Power/Other
A15
VSS
Power/Other
AB26
VSS
Power/Other
A16
DSTBN3#
Source Sync
Input/Output
AB27
VSS
Power/Other
A17
D56#
Source Sync
Input/Output
AB28
VSS
Power/Other
A18
VSS
Power/Other
A19
D61#
Source Sync
A2
VSS
Power/Other
A20
RESERVED
A21
VSS
Power/Other
A22
D62#
Source Sync
A23
VCCA
Power/Other
A24
VSS
Power/Other
A25
VTT
A26
Direction
Output
AB29
VSS
Power/Other
AB3
MCERR#
Common Clk
AB30
VSS
Power/Other
AB4
A26#
Source Sync
AB5
A24#
Source Sync
Input/Output
Input/Output
AB6
A17#
Source Sync
Input/Output
Input
AB7
VSS
Power/Other
AB8
VCC
Power/Other
Power/Other
AC1
TMS
TAP
Input
VTT
Power/Other
AC2
DBR#
Power/Other
Output
A3
RS2#
Common Clk
Input
AC23
VCC
Power/Other
A4
D02#
Source Sync
Input/Output
AC24
VCC
Power/Other
A5
D04#
Source Sync
Input/Output
AC25
VCC
Power/Other
A6
VSS
Power/Other
AC26
VCC
Power/Other
A7
D07#
Source Sync
Input/Output
AC27
VCC
Power/Other
A8
DBI0#
Source Sync
Input/Output
AC28
VCC
Power/Other
A9
VSS
Power/Other
AC29
VCC
Power/Other
AA1
VTT_OUT
Power/Other
Output
AC3
VSS
Power/Other
AA2
LL_ID1
Power/Other
Output
AC30
VCC
Power/Other
Input/Output
AA23
VSS
Power/Other
AC4
RESERVED
AA24
VSS
Power/Other
AC5
A25#
Source Sync
AA25
VSS
Power/Other
AC6
VSS
Power/Other
AA26
VSS
Power/Other
AC7
VSS
Power/Other
AA27
VSS
Power/Other
AC8
VCC
Power/Other
Input/Output
Input/Output
Input/Output
AA28
VSS
Power/Other
AD1
TDI
TAP
Input
AA29
VSS
Power/Other
AD2
BPM2#
Common Clk
Input/Output
Power/Other
AA3
VSS
Power/Other
AD23
VCC
AA30
VSS
Power/Other
AD24
VCC
Power/Other
AA4
A21#
Source Sync
Input/Output
AD25
VCC
Power/Other
AA5
A23#
Source Sync
Input/Output
AD26
VCC
Power/Other
AA6
VSS
Power/Other
AD27
VCC
Power/Other
AA7
VSS
Power/Other
AD28
VCC
Power/Other
AA8
VCC
Power/Other
AD29
VCC
Power/Other
AD3
BINIT#
Common Clk
AF15
VCC
Power/Other
AD30
VCC
Power/Other
AF16
VSS
Power/Other
AD4
VSS
Power/Other
AF17
VSS
Power/Other
AD5
ADSTB1#
Source Sync
Input/Output
AF18
VCC
Power/Other
AD6
A22#
Source Sync
Input/Output
AF19
VCC
Power/Other
52
Input/Output
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Land Listing
Table 4-2.
Land
No.
Land Listing by Land Number (Sheet 2 of 9)
Land Name
Signal Buffer
Type
Direction
Land
No.
Land Name
Signal Buffer
Type
Direction
Input/Output
AD7
VSS
Power/Other
AF2
BPM4#
Common Clk
AD8
VCC
Power/Other
AF20
VSS
Power/Other
Power/Other
AE1
TCK
TAP
AF21
VCC
AE10
VSS
Power/Other
Input
AF22
VCC
Power/Other
AE11
VCC
Power/Other
AF23
VSS
Power/Other
AE12
VCC
Power/Other
AF24
VSS
Power/Other
AE13
VSS
Power/Other
AF25
VSS
Power/Other
AE14
VCC
Power/Other
AF26
VSS
Power/Other
AE15
VCC
Power/Other
AF27
VSS
Power/Other
AE16
VSS
Power/Other
AF28
VSS
Power/Other
AE17
VSS
Power/Other
AF29
VSS
Power/Other
AE18
VCC
Power/Other
AF3
VSS
Power/Other
AE19
VCC
Power/Other
AF30
VSS
Power/Other
AE2
VSS
Power/Other
AF4
A28#
Source Sync
Input/Output
AE20
VSS
Power/Other
AF5
A27#
Source Sync
Input/Output
AE21
VCC
Power/Other
AF6
VSS
Power/Other
AE22
VCC
Power/Other
AF7
VSS
Power/Other
AE23
VCC
Power/Other
AF8
VCC
Power/Other
Power/Other
AE24
VSS
Power/Other
AF9
VCC
AE25
VSS
Power/Other
AG1
TRST#
TAP
AE26
VSS
Power/Other
AG10
VSS
Power/Other
AE27
VSS
Power/Other
AG11
VCC
Power/Other
AE28
VSS
Power/Other
AG12
VCC
Power/Other
AE29
VSS
Power/Other
AG13
VSS
Power/Other
AE3
COMP7
Power/Other
AG14
VCC
Power/Other
AE30
VSS
Power/Other
AG15
VCC
Power/Other
AE4
RESERVED
AG16
VSS
Power/Other
AE5
VSS
AE6
RESERVED
Input
Power/Other
AE7
VSS
Power/Other
AE8
SKTOCC#
Power/Other
AE9
VCC
Power/Other
Output
Output
AG17
VSS
Power/Other
AG18
VCC
Power/Other
AG19
VCC
Power/Other
AG2
BPM3#
Common Clk
AG20
VSS
Power/Other
Power/Other
AF1
TDO
TAP
AG21
VCC
AF10
VSS
Power/Other
AG22
VCC
Power/Other
AF11
VCC
Power/Other
AG23
VSS
Power/Other
AF12
VCC
Power/Other
AG24
VSS
Power/Other
AF13
VSS
Power/Other
AG25
VCC
Power/Other
AF14
VCC
Power/Other
AG26
VCC
Power/Other
AG27
VCC
Power/Other
AJ11
VCC
Power/Other
AG28
VCC
Power/Other
AJ12
VCC
Power/Other
AG29
VCC
Power/Other
AJ13
VSS
Power/Other
AG3
BPM5#
Common Clk
AJ14
VCC
Power/Other
AG30
VCC
Power/Other
AJ15
VCC
Power/Other
AG4
A30#
Source Sync
Input/Output
AJ16
VSS
Power/Other
AG5
A31#
Source Sync
Input/Output
AJ17
VSS
Power/Other
AG6
A29#
Source Sync
Input/Output
AJ18
VCC
Power/Other
Input/Output
AG7
VSS
Power/Other
AJ19
VCC
Power/Other
AG8
VCC
Power/Other
AJ2
BPM0#
Common Clk
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Input
Input/Output
Input/Output
53
Land Listing
Table 4-2.
Land Listing by Land Number (Sheet 3 of 9)
Land
No.
Signal Buffer
Type
Land
No.
Land Name
Signal Buffer
Type
AG9
VCC
Power/Other
AJ20
VSS
Power/Other
AH1
VSS
Power/Other
AJ21
VCC
Power/Other
Direction
Land Name
AH10
VSS
Power/Other
AJ22
VCC
Power/Other
AH11
VCC
Power/Other
AJ23
VSS
Power/Other
AH12
VCC
Power/Other
AJ24
VSS
Power/Other
AH13
VSS
Power/Other
AJ25
VCC
Power/Other
AH14
VCC
Power/Other
AJ26
VCC
Power/Other
AH15
VCC
Power/Other
AJ27
VSS
Power/Other
AH16
VSS
Power/Other
AJ28
VSS
Power/Other
Power/Other
Direction
AH17
VSS
Power/Other
AJ29
VSS
AH18
VCC
Power/Other
AJ3
RESERVED
AH19
VCC
Power/Other
AJ30
VSS
Power/Other
AH2
TEST_BUS
Power/Other
AJ4
VSS
Power/Other
AH20
VSS
Power/Other
AJ5
A34#
Source Sync
Input/Output
AH21
VCC
Power/Other
AJ6
A35#
Source Sync
Input/Output
AH22
VCC
Power/Other
AJ7
THERMDA2
Power/Other
Output
AH23
VSS
Power/Other
AJ8
VCC
Power/Other
Power/Other
AH24
VSS
Power/Other
AJ9
VCC
AH25
VCC
Power/Other
AK1
THERMDC
Power/Other
AH26
VCC
Power/Other
AK10
VSS
Power/Other
AH27
VCC
Power/Other
AK11
VCC
Power/Other
AH28
VCC
Power/Other
AK12
VCC
Power/Other
AH29
VCC
Power/Other
AK13
VSS
Power/Other
AH3
VSS
Power/Other
AK14
VCC
Power/Other
AH30
VCC
Power/Other
AK15
VCC
Power/Other
AH4
A32#
Source Sync
Input/Output
AK16
VSS
Power/Other
AH5
A33#
Source Sync
Input/Output
AK17
VSS
Power/Other
AH6
VSS
Power/Other
AK18
VCC
Power/Other
AH7
THERMDC2
Power/Other
AK19
VCC
Power/Other
AH8
VCC
Power/Other
AK2
VSS
Power/Other
AH9
VCC
Power/Other
AK20
VSS
Power/Other
AJ1
BPM1#
Common Clk
AK21
VCC
Power/Other
AJ10
VSS
Power/Other
AK22
VCC
Power/Other
AK23
VSS
Power/Other
AL8
VCC_DIE_SENSE2
Power/Other
AK24
VSS
Power/Other
AL9
VCC
Power/Other
Power/Other
Output
Input/Output
AK25
VCC
Power/Other
AM1
VSS
AK26
VCC
Power/Other
AM10
VSS
Power/Other
AK27
VSS
Power/Other
AM11
VCC
Power/Other
Power/Other
AK28
VSS
Power/Other
AM12
VCC
AK29
VSS
Power/Other
AM13
VSS
Power/Other
AK3
RESERVED
AM14
VCC
Power/Other
Power/Other
AK30
VSS
Power/Other
AK4
VID4
Power/Other
AK5
VSS
Power/Other
AK6
FORCEPR#
ASync GTL+
AK7
VSS
Power/Other
AK8
VCC
AK9
VCC
54
Output
Input
AM15
VCC
AM16
VSS
Power/Other
AM17
VSS
Power/Other
AM18
VCC
Power/Other
AM19
VCC
Power/Other
Power/Other
AM2
VID0
Power/Other
Power/Other
AM20
VSS
Power/Other
Output
Output
Output
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Land Listing
Table 4-2.
Land Listing by Land Number (Sheet 4 of 9)
Land
No.
Land Name
Signal Buffer
Type
Direction
Land
No.
Land Name
Signal Buffer
Type
Output
Power/Other
AL1
THERMDA
Power/Other
AM21
VCC
AL10
VSS
Power/Other
AM22
VCC
Power/Other
AL11
VCC
Power/Other
AM23
VSS
Power/Other
AL12
VCC
Power/Other
AM24
VSS
Power/Other
AL13
VSS
Power/Other
AM25
VCC
Power/Other
AL14
VCC
Power/Other
AM26
VCC
Power/Other
AL15
VCC
Power/Other
AM27
VSS
Power/Other
AL16
VSS
Power/Other
AM28
VSS
Power/Other
AL17
VSS
Power/Other
AM29
VCC
Power/Other
AL18
VCC
Power/Other
AM3
VID2
Power/Other
AL19
VCC
Power/Other
AM30
VCC
Power/Other
AL2
PROCHOT#
ASync GTL+
AM4
VSS
Power/Other
AL20
VSS
Power/Other
AM5
RESERVED
Output
AL21
VCC
Power/Other
AM6
VTTPWRGD
Power/Other
AL22
VCC
Power/Other
AM7
VSS
Power/Other
AL23
VSS
Power/Other
AM8
VCC
Power/Other
AL24
VSS
Power/Other
AM9
VCC
Power/Other
AL25
VCC
Power/Other
AN1
VSS
Power/Other
AL26
VCC
Power/Other
AN10
VSS
Power/Other
AL27
VSS
Power/Other
AN11
VCC
Power/Other
Power/Other
AL28
VSS
Power/Other
AN12
VCC
AL29
VCC
Power/Other
AN13
VSS
Power/Other
AL3
VSS
Power/Other
AN14
VCC
Power/Other
AL30
VCC
Power/Other
AN15
VCC
Power/Other
AL4
VID5
Power/Other
Output
AN16
VSS
Power/Other
AL5
VID1
Power/Other
Output
AN17
VSS
Power/Other
AL6
VID3
Power/Other
Output
AN18
VCC
Power/Other
Output
Direction
Output
Input
AL7
VSS_DIE_SENSE2
Power/Other
AN19
VCC
Power/Other
AN2
VSS
Power/Other
B8
VSS
Power/Other
AN20
VSS
Power/Other
B9
DSTBP0#
Source Sync
Input/Output
AN21
VCC
Power/Other
C1
DRDY#
Common Clk
Input/Output
AN22
VCC
Power/Other
C10
VSS
Power/Other
AN23
VSS
Power/Other
C11
D11#
Source Sync
Input/Output
AN24
VSS
Power/Other
C12
D14#
Source Sync
Input/Output
AN25
VCC
Power/Other
C13
VSS
Power/Other
AN26
VCC
Power/Other
AN3
VCC_DIE_SENSE
Power/Other
Output
AN4
VSS_DIE_SENSE
Power/Other
Output
AN5
RESERVED
AN6
RESERVED
C18
AN7
VID_SELECT
Power/Other
C19
VSS
Power/Other
AN8
VCC
Power/Other
C2
BNR#
Common Clk
AN9
VCC
Power/Other
C20
DBI3#
Source Sync
Input/Output
B1
VSS
Power/Other
C21
D58#
Source Sync
Input/Output
B10
D10#
Source Sync
C22
VSS
Power/Other
B11
VSS
Power/Other
C23
VCCIOPLL
Power/Other
B12
D13#
Source Sync
C24
VSS
Power/Other
B13
RESERVED
C25
VTT
Power/Other
Output
Input/Output
Input/Output
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
C14
D52#
Source Sync
Input/Output
C15
D51#
Source Sync
Input/Output
C16
VSS
Power/Other
C17
DSTBP3#
Source Sync
Input/Output
D54#
Source Sync
Input/Output
Input/Output
Input
55
Land Listing
Table 4-2.
Land Listing by Land Number (Sheet 5 of 9)
Direction
Land
No.
Land Name
Signal Buffer
Type
C26
VTT
Power/Other
Source Sync
Input/Output
C27
VTT
Power/Other
D55#
Source Sync
Input/Output
C28
VTT
Power/Other
VSS
Power/Other
C29
VTT
Power/Other
Land Name
Signal Buffer
Type
B14
VSS
Power/Other
B15
D53#
B16
B17
Land
No.
B18
D57#
Source Sync
Input/Output
C3
LOCK#
Common Clk
B19
D60#
Source Sync
Input/Output
C30
VTT
Power/Other
Input/Output
B2
DBSY#
Common Clk
B20
VSS
Power/Other
B21
D59#
Source Sync
B22
D63#
B23
B24
Direction
Input/Output
C4
VSS
Power/Other
C5
D01#
Source Sync
Input/Output
Input/Output
C6
D03#
Source Sync
Input/Output
Source Sync
Input/Output
C7
VSS
Power/Other
VSSA
Power/Other
Input
Source Sync
Input/Output
VSS
Power/Other
B25
VTT
B26
VTT
B27
B28
C8
DSTBN0#
C9
RESERVED
Power/Other
D1
RESERVED
Power/Other
D10
D22#
Source Sync
Input/Output
VTT
Power/Other
D11
D15#
Source Sync
Input/Output
VTT
Power/Other
D12
VSS
Power/Other
D13
D25#
Source Sync
D14
RESERVED
B29
VTT
Power/Other
B3
RS0#
Common Clk
B30
VTT
Power/Other
B4
D00#
Source Sync
B5
VSS
Power/Other
B6
D05#
Source Sync
Input
D15
VSS
Input/Output
D16
RESERVED
D17
D49#
Source Sync
Input/Output
D18
VSS
Power/Other
Input/Output
Power/Other
Input/Output
B7
D06#
Source Sync
Input/Output
D19
DBI2#
Source Sync
Input/Output
D2
ADS#
Common Clk
Input/Output
E4
HITM#
Common Clk
Input/Output
D20
D48#
Source Sync
Input/Output
D21
VSS
Power/Other
D22
D46#
Source Sync
D23
RESERVED
D24
VSS
D25
Input/Output
E5
RESERVED
E6
RESERVED
E7
RESERVED
E8
VSS
Power/Other
E9
D19#
Power/Other
Source Sync
VTT
Power/Other
F1
VSS
Power/Other
D26
VTT
Power/Other
F10
VSS
Power/Other
D27
VTT
Power/Other
F11
D23#
Source Sync
Input/Output
D28
VTT
Power/Other
F12
D24#
Source Sync
Input/Output
D29
VTT
Power/Other
F13
VSS
Power/Other
Input/Output
D3
VSS
Power/Other
F14
D28#
Source Sync
Input/Output
D30
VTT
Power/Other
F15
D30#
Source Sync
Input/Output
D4
HIT#
Common Clk
F16
VSS
Power/Other
D5
VSS
Power/Other
F17
D37#
Source Sync
Input/Output
D6
VSS
Power/Other
F18
D38#
Source Sync
Input/Output
D7
D20#
Source Sync
Input/Output
F19
VSS
Power/Other
D8
D12#
Source Sync
Input/Output
D9
VSS
Power/Other
E1
RESERVED
E10
D21#
Source Sync
E11
VSS
Power/Other
E12
DSTBP1#
Source Sync
Input/Output
F24
TESTHI07
Power/Other
Input
E13
D26#
Source Sync
Input/Output
F25
TESTHI02
Power/Other
Input
E14
VSS
Power/Other
F26
TESTHI00
Power/Other
Input
56
Input/Output
Input/Output
F2
GTLREF_DATA_C1
Power/Other
Input
F20
D41#
Source Sync
Input/Output
F21
D43#
Source Sync
Input/Output
F22
VSS
Power/Other
F23
RESERVED
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Land Listing
Table 4-2.
Land Listing by Land Number (Sheet 6 of 9)
Signal Buffer
Type
Direction
Clk
Input
BR0#
Common Clk
Input/Output
VTT
Power/Other
Land
No.
Land Name
Signal Buffer
Type
Direction
Land
No.
Land Name
E15
D33#
Source Sync
Input/Output
F27
RESERVED
E16
D34#
Source Sync
Input/Output
F28
BCLK0
E17
VSS
Power/Other
F29
RESERVED
E18
D39#
Source Sync
Input/Output
F3
E19
D40#
Source Sync
Input/Output
F30
E2
VSS
Power/Other
F4
VSS
Power/Other
E20
VSS
Power/Other
F5
RS1#
Common Clk
E21
D42#
Source Sync
Input/Output
F6
RESERVED
E22
D45#
Source Sync
Input/Output
F7
VSS
Power/Other
E23
RESERVED
F8
D17#
Source Sync
Input/Output
E24
RESERVED
F9
D18#
Source Sync
Input/Output
E25
VSS
Power/Other
G1
VSS
Power/Other
E26
VSS
Power/Other
G10
GTLREF_DATA_C0
Power/Other
Input
E27
VSS
Power/Other
G11
DBI1#
Source Sync
Input/Output
E28
VSS
Power/Other
G12
DSTBN1#
Source Sync
Input/Output
E29
VSS
Power/Other
G13
D27#
Source Sync
Input/Output
E3
TRDY#
Common Clk
G14
D29#
Source Sync
Input/Output
Input/Output
Input
Input
E30
VTT
Power/Other
G15
D31#
Source Sync
G16
D32#
Source Sync
Input/Output
H28
VSS
Power/Other
G17
D36#
Source Sync
Input/Output
H29
VSS
Power/Other
G18
D35#
Source Sync
Input/Output
H3
VSS
Power/Other
G19
DSTBP2#
Source Sync
Input/Output
H30
BSEL1
Power/Other
Output
G2
COMP2
Power/Other
Input
H4
RSP#
Common Clk
Input
G20
DSTBN2#
Source Sync
Input/Output
H5
BR1#
Common Clk
Input
G21
D44#
Source Sync
Input/Output
H6
VSS
Power/Other
G22
D47#
Source Sync
Input/Output
H7
VSS
Power/Other
G23
RESET#
Common Clk
Input
H8
VSS
Power/Other
G24
TESTHI06
Power/Other
Input
H9
VSS
Power/Other
G25
TESTHI03
Power/Other
Input
J1
VTT_OUT
Power/Other
G26
TESTHI05
Power/Other
Input
J10
VCC
Power/Other
G27
TESTHI04
Power/Other
Input
J11
VCC
Power/Other
G28
BCLK1
Clk
Input
J12
VCC
Power/Other
G29
BSEL0
Power/Other
Output
J13
VCC
Power/Other
Power/Other
Output
G3
TESTHI08
Power/Other
Input
J14
VCC
G30
BSEL2
Power/Other
Output
J15
VCC
Power/Other
G4
TESTHI09
Power/Other
Input
J16
DP0#
Common Clk
Input/Output
G5
RESERVED
J17
DP3#
Common Clk
Input/Output
G6
RESERVED
G7
DEFER#
Common Clk
G8
BPRI#
Common Clk
G9
D16#
Source Sync
Input
J18
VCC
Power/Other
J19
VCC
Power/Other
Input
J2
COMP4
Power/Other
Input/Output
J20
VCC
Power/Other
Input
H1
GTLREF_ADD_C0
Power/Other
J21
VCC
Power/Other
H10
VSS
Power/Other
J22
VCC
Power/Other
H11
VSS
Power/Other
J23
VCC
Power/Other
H12
VSS
Power/Other
J24
VCC
Power/Other
H13
VSS
Power/Other
J25
VCC
Power/Other
H14
VSS
Power/Other
J26
VCC
Power/Other
H15
DP1#
Common Clk
J27
VCC
Power/Other
Input/Output
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Input
57
Land Listing
Table 4-2.
Land Listing by Land Number (Sheet 7 of 9)
Signal Buffer
Type
Land
No.
Land Name
Signal Buffer
Type
Direction
Land
No.
H16
DP2#
Common Clk
Input/Output
J28
VCC
Power/Other
H17
VSS
Power/Other
J29
VCC
Power/Other
H18
VSS
Power/Other
J3
RESERVED
H19
VSS
Power/Other
J30
VCC
Power/Other
H2
GTLREF_ADD_C1
Power/Other
J4
VSS
Power/Other
H20
VSS
Power/Other
J5
REQ1#
Source Sync
Input/Output
H21
VSS
Power/Other
J6
REQ4#
Source Sync
Input/Output
H22
VSS
Power/Other
J7
VSS
Power/Other
H23
VSS
Power/Other
J8
VCC
Power/Other
H24
VSS
Power/Other
J9
VCC
Power/Other
H25
VSS
Power/Other
K1
LINT0
ASync GTL+
H26
VSS
Power/Other
K2
VSS
Power/Other
Input
Land Name
Direction
Input
H27
VSS
Power/Other
K23
VCC
Power/Other
K24
VCC
Power/Other
M7
VSS
Power/Other
K25
VCC
Power/Other
M8
VCC
Power/Other
K26
VCC
Power/Other
N1
PWRGOOD
Power/Other
Input
K27
VCC
Power/Other
N2
IGNNE#
ASync GTL+
Input
K28
VCC
Power/Other
N23
VCC
Power/Other
K29
VCC
Power/Other
N24
VCC
Power/Other
K3
A20M#
ASync GTL+
N25
VCC
Power/Other
K30
VCC
Power/Other
N26
VCC
Power/Other
K4
REQ0#
Source Sync
K5
VSS
Power/Other
K6
REQ3#
Source Sync
K7
VSS
Power/Other
K8
VCC
Power/Other
L1
LINT1
ASync GTL+
Input
Input
Input
Input/Output
Input/Output
N27
VCC
Power/Other
N28
VCC
Power/Other
N29
VCC
Power/Other
N3
VSS
Power/Other
N30
VCC
Power/Other
N4
RESERVED
L2
TESTHI11
ASync GTL+
N5
RESERVED
L23
VSS
Power/Other
N6
VSS
L24
VSS
Power/Other
N7
VSS
Power/Other
L25
VSS
Power/Other
N8
VCC
Power/Other
L26
VSS
Power/Other
P1
TESTHI10
Power/Other
Input
L27
VSS
Power/Other
P2
SMI#
ASync GTL+
Input
L28
VSS
Power/Other
P23
VSS
Power/Other
Power/Other
L29
VSS
Power/Other
P24
VSS
Power/Other
L3
VSS
Power/Other
P25
VSS
Power/Other
L30
VSS
Power/Other
P26
VSS
Power/Other
L4
A06#
Source Sync
Input/Output
P27
VSS
Power/Other
L5
A05#
Source Sync
Input/Output
P28
VSS
Power/Other
L6
VSS
Power/Other
P29
VSS
Power/Other
L7
VSS
Power/Other
P3
INIT#
ASync GTL+
L8
VCC
Power/Other
P30
VSS
Power/Other
M1
VSS
Power/Other
P4
VSS
Power/Other
M2
THERMTRIP#
ASync GTL+
P5
RESERVED
Output
M23
VCC
Power/Other
P6
A04#
Source Sync
M24
VCC
Power/Other
P7
VSS
Power/Other
M25
VCC
Power/Other
P8
VCC
Power/Other
M26
VCC
Power/Other
R1
COMP3
Power/Other
58
Input
Input/Output
Input
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Land Listing
Table 4-2.
Land Listing by Land Number (Sheet 8 of 9)
Land
No.
Land Name
Signal Buffer
Type
Power/Other
R2
VSS
Power/Other
Power/Other
R23
VSS
Power/Other
R24
VSS
Power/Other
R25
VSS
Power/Other
R26
VSS
Power/Other
Input/Output
R27
VSS
Power/Other
Input/Output
R28
VSS
Power/Other
Source Sync
Input/Output
R29
VSS
Power/Other
FERR#/PBE#
ASync GTL+
Output
V24
VSS
Power/Other
R30
VSS
Power/Other
V25
VSS
Power/Other
R4
A08#
Source Sync
Input/Output
V26
VSS
Power/Other
R5
VSS
Power/Other
V27
VSS
Power/Other
R6
ADSTB0#
Source Sync
Input/Output
V28
VSS
Power/Other
R7
VSS
Power/Other
V29
VSS
Power/Other
R8
VCC
Power/Other
V3
VSS
Power/Other
T1
COMP1
Power/Other
Input
V30
VSS
Power/Other
Input
Signal Buffer
Type
Land
No.
Land Name
M27
VCC
M28
VCC
M29
VCC
Power/Other
M3
STPCLK#
ASync GTL+
M30
VCC
Power/Other
M4
A07#
Source Sync
M5
A03#
Source Sync
M6
REQ2#
R3
Direction
Input
Direction
T2
COMP5
Power/Other
V4
A15#
Source Sync
Input/Output
T23
VCC
Power/Other
V5
A14#
Source Sync
Input/Output
T24
VCC
Power/Other
V6
VSS
Power/Other
T25
VCC
Power/Other
V7
VSS
Power/Other
T26
VCC
Power/Other
V8
VCC
Power/Other
T27
VCC
Power/Other
W1
MS_ID0
Power/Other
T28
VCC
Power/Other
W2
RESERVED
T29
VCC
Power/Other
W23
VCC
Power/Other
T3
VSS
Power/Other
W24
VCC
Power/Other
T30
VCC
Power/Other
W25
VCC
Power/Other
T4
A11#
Source Sync
Input/Output
W26
VCC
Power/Other
T5
A09#
Source Sync
Input/Output
W27
VCC
Power/Other
T6
VSS
Power/Other
W28
VCC
Power/Other
Power/Other
T7
VSS
Power/Other
W29
VCC
T8
VCC
Power/Other
W3
TESTHI01
Power/Other
U1
VSS
Power/Other
W30
VCC
Power/Other
Input/Output
Output
Input
U2
AP0#
Common Clk
W4
VSS
Power/Other
U23
VCC
Power/Other
W5
A16#
Source Sync
Input/Output
U24
VCC
Power/Other
W6
A18#
Source Sync
Input/Output
U25
VCC
Power/Other
W7
VSS
Power/Other
U26
VCC
Power/Other
W8
VCC
Power/Other
U27
VCC
Power/Other
Y1
RESERVED
U28
VCC
Power/Other
Y2
VSS
U29
VCC
Power/Other
Y23
VCC
Power/Other
U3
AP1#
Common Clk
Input/Output
Y24
VCC
Power/Other
U30
VCC
Power/Other
Y25
VCC
Power/Other
U4
A13#
Source Sync
Input/Output
Y26
VCC
Power/Other
U5
A12#
Source Sync
Input/Output
Y27
VCC
Power/Other
U6
A10#
Source Sync
Input/Output
Y28
VCC
Power/Other
U7
VSS
Power/Other
Y29
VCC
Power/Other
U8
VCC
Power/Other
Y3
COMP6
Power/Other
V1
MS_ID1
Power/Other
Y30
VCC
Power/Other
I
Output
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Power/Other
Input
59
Land Listing
Table 4-2.
Land Listing by Land Number (Sheet 9 of 9)
Land
No.
Land Name
Signal Buffer
Type
Direction
Output
V2
LL_ID0
Power/Other
V23
VSS
Power/Other
Y6
A19#
Source Sync
Y7
VSS
Power/Other
Y8
VCC
Power/Other
Signal Buffer
Type
Direction
A20#
Source Sync
Input/Output
VSS
Power/Other
Land
No.
Land Name
Y4
Y5
Input/Output
§
60
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Signal Definitions
5
Signal Definitions
5.1
Signal Definitions
Table 5-1.
Signal Definitions (Sheet 1 of 8)
Name
A[35:3]#
Type
Description
Notes
36
I/O
A[35:3]# (Address) define a 2 -byte physical memory address space. In sub-phase
1 of the address phase, these signals transmit the address of a transaction. In subphase 2, these signals transmit transaction type information. These signals must
connect the appropriate pins of all agents on the FSB. A[35:3]# are protected by
parity signals AP[1:0]#. A[35:3]# are source synchronous signals and are latched
into the receiving buffers by ADSTB[1:0]#.
On the active-to-inactive transition of RESET#, the processors sample a subset of the
A[35:3]# lands to determine their power-on configuration. See Section 7.1.
3
I
If A20M# (Address-20 Mask) is asserted, the processor masks physical address bit
20 (A20#) before looking up a line in any internal cache and before driving a read/
write transaction on the bus. Asserting A20M# emulates the 8086 processor's
address wrap-around at the 1 MB boundary. Assertion of A20M# is only supported in
real mode.
A20M# is an asynchronous signal. However, to ensure recognition of this signal
following an I/O write instruction, it must be valid along with the TRDY# assertion of
the corresponding I/O write bus transaction.
2
ADS#
I/O
ADS# (Address Strobe) is asserted to indicate the validity of the transaction address
on the A[35:3]# lands. All bus agents observe the ADS# activation to begin parity
checking, protocol checking, address decode, internal snoop, or deferred reply ID
match operations associated with the new transaction. This signal must connect the
appropriate pins on all Dual-Core Intel Xeon Processor 5000 series FSB agents.
3
ADSTB[1:0]#
I/O
Address strobes are used to latch A[35:3]# and REQ[4:0]# on their rising and falling
edge. Strobes are associated with signals as shown below.
3
A20M#
AP[1:0]#
BCLK[1:0]
I/O
I
Signals
Associated Strobes
REQ[4:0], A[16:3]#
ADSTB0#
A[35:17]#
ADSTB1#
AP[1:0]# (Address Parity) are driven by the request initiator along with ADS#,
A[35:3]#, and the transaction type on the REQ[4:0]# signals. A correct parity signal
is high if an even number of covered signals are low and low if an odd number of
covered signals are low. This allows parity to be high when all the covered signals are
high. AP[1:0]# should connect the appropriate pins of all Dual-Core Intel Xeon
Processor 5000 series FSB agents. The following table defines the coverage model of
these signals.
Request Signals
Subphase 1
Subphase 2
A[35:24]#
AP0#
AP1#
A[23:3]#
AP1#
AP0#
REQ[4:0]#
AP1#
AP0#
The differential bus clock pair BCLK[1:0] (Bus Clock) determines the FSB frequency.
All processor FSB agents must receive these signals to drive their outputs and latch
their inputs.
All external timing parameters are specified with respect to the rising edge of BCLK0
crossing VCROSS.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
3
3
61
Signal Definitions
Table 5-1.
Name
Signal Definitions (Sheet 2 of 8)
Type
Description
BINIT#
I/O
BINIT# (Bus Initialization) may be observed and driven by all processor FSB agents
and if used, must connect the appropriate pins of all such agents. If the BINIT#
driver is enabled during power on configuration, BINIT# is asserted to signal any bus
condition that prevents reliable future operation.
If BINIT# observation is enabled during power-on configuration (see Figure 7.1) and
BINIT# is sampled asserted, symmetric agents reset their bus LOCK# activity and
bus request arbitration state machines. The bus agents do not reset their I/O Queue
(IOQ) and transaction tracking state machines upon observation of BINIT# assertion.
Once the BINIT# assertion has been observed, the bus agents will re-arbitrate for
the FSB and attempt completion of their bus queue and IOQ entries.
If BINIT# observation is disabled during power-on configuration, a priority agent
may handle an assertion of BINIT# as appropriate to the error handling architecture
of the system.
3
BNR#
I/O
BNR# (Block Next Request) is used to assert a bus stall by any bus agent who is
unable to accept new bus transactions. During a bus stall, the current bus owner
cannot issue any new transactions.
Since multiple agents might need to request a bus stall at the same time, BNR# is a
wired-OR signal which must connect the appropriate pins of all processor FSB agents.
In order to avoid wired-OR glitches associated with simultaneous edge transitions
driven by multiple drivers, BNR# is activated on specific clock edges and sampled on
specific clock edges.
3
BPM[5:0]#
I/O
BPM[5:0]# (Breakpoint Monitor) are breakpoint and performance monitor signals.
They are outputs from the processor which indicate the status of breakpoints and
programmable counters used for monitoring processor performance. BPM[5:0]#
should connect the appropriate pins of all FSB agents.
BPM4# provides PRDY# (Probe Ready) functionality for the TAP port. PRDY# is a
processor output used by debug tools to determine processor debug readiness.
BPM5# provides PREQ# (Probe Request) functionality for the TAP port. PREQ# is
used by debug tools to request debug operation of the processors.
BPM[5:4]# must be bussed to all bus agents. Please refer to the appropriate
platform design guidelines for more detailed information.
2
BPRI# (Bus Priority Request) is used to arbitrate for ownership of the processor FSB.
It must connect the appropriate pins of all processor FSB agents. Observing BPRI#
active (as asserted by the priority agent) causes all other agents to stop issuing new
requests, unless such requests are part of an ongoing locked operation. The priority
agent keeps BPRI# asserted until all of its requests are completed, then releases the
bus by deasserting BPRI#.
3
The BR[1:0]# signals are sampled on the active-to-inactive transition of RESET#.
The signal which the agent samples asserted determines its agent ID. BR0# drives
the BREQ0# signal in the system and is used by the processor to request the bus.
These signals do not have on-die termination and must be terminated.
3
BPRI#
I
BR[1:0]#
I/O
BSEL[2:0]
O
The BCLK[1:0] frequency select signals BSEL[2:0] are used to select the processor
input clock frequency. Table 2-2 defines the possible combinations of the signals and
the frequency associated with each combination. The required frequency is
determined by the processors, chipset, and clock synthesizer. All FSB agents must
operate at the same frequency. The Dual-Core Intel Xeon Processor 5000 series
currently operate at either 667 or 1066 MHz FSB frequency. For more information
about these signals, including termination recommendations, refer to the appropriate
platform design guideline.
COMP[3:0]
I
COMP[3:0] must be terminated to VSS on the baseboard using precision resistors.
These inputs configure the AGTL+ drivers of the processor. Refer to the appropriate
platform design guidelines for implementation details.
COMP[7:4]
I
COMP[7:4] must be terminated to VTT on the baseboard using precision resistors.
These inputs configure the AGTL+ drivers of the processor. Refer to the appropriate
platform design guidelines for implementation details.
62
Notes
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Signal Definitions
Table 5-1.
Name
D[63:0]#
Signal Definitions (Sheet 3 of 8)
Type
I/O
Description
D[63:0]# (Data) are the data signals. These signals provide a 64-bit data path
between the processor FSB agents, and must connect the appropriate pins on all
such agents. The data driver asserts DRDY# to indicate a valid data transfer.
Notes
3
D[63:0]# are quad-pumped signals, and will thus be driven four times in a
common clock period. D[63:0]# are latched off the falling edge of both
DSTBP[3:0]# and DSTBN[3:0]#. Each group of 16 data signals
correspond to a pair of one DSTBP# and one DSTBN#. The following table
shows the grouping of data signals to strobes and DBI#.
Data Group
DSTBN#/
DSTBP#
DBI#
D[15:0]#
0
0
D[31:16]#
1
1
D[47:32]#
2
2
D[63:48]#
3
3
Furthermore, the DBI# signals determine the polarity of the data signals.
Each group of 16 data signals corresponds to one DBI# signal. When the
DBI# signal is active, the corresponding data group is inverted and
therefore sampled active high.
DBI[3:0]#
I/O
DBI[3:0]# (Data Bus Inversion) are source synchronous and indicate the polarity of
the D[63:0]# signals. The DBI[3:0]# signals are activated when the data on the data
bus is inverted. If more than half the data bits, within, within a 16-bit group, would
have been asserted electronically low, the bus agent may invert the data bus signals
for that particular sub-phase for that 16-bit group.
3
DBI[3:0]# Assignment to Data Bus
Bus Signal
DBR#
Data Bus Signals
DBI0#
D[15:0]#
DBI1#
D[31:16]#
DBI2#
D[47:32]#
DBI3#
D[63:48]#
O
DBR# is used only in systems where no debug port connector is implemented on the
system board. DBR# is used by a debug port interposer so that an in-target probe
can drive system reset. If a debug port connector is implemented in the system,
DBR# is treated as a no connect for the processor socket. DBR# is not a processor
signal.
DBSY#
I/O
DBSY# (Data Bus Busy) is asserted by the agent responsible for driving data on the
processor FSB to indicate that the data bus is in use. The data bus is released after
DBSY# is deasserted. This signal must connect the appropriate pins on all processor
FSB agents.
3
DEFER#
I
DEFER# is asserted by an agent to indicate that a transaction cannot be guaranteed
in-order completion. Assertion of DEFER# is normally the responsibility of the
addressed memory or I/O agent. This signal must connect the appropriate pins of all
processor FSB agents.
3
DP[3:0]#
I/O
DP[3:0]# (Data Parity) provide parity protection for the D[63:0]# signals. They are
driven by the agent responsible for driving D[63:0]#, and must connect the
appropriate pins of all processor FSB agents.
3
DRDY#
I/O
DRDY# (Data Ready) is asserted by the data driver on each data transfer, indicating
valid data on the data bus. In a multi-common clock data transfer, DRDY# may be
deasserted to insert idle clocks. This signal must connect the appropriate pins of all
processor FSB agents.
3
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
63
Signal Definitions
Table 5-1.
Signal Definitions (Sheet 4 of 8)
Name
DSTBN[3:0]#
DSTBP[3:0]#
Type
I/O
I/O
Description
Data strobe used to latch in D[63:0]#.
Signals
Associated Strobes
D[15:0]#, DBI0#
DSTBN0#
D[31:16]#, DBI1#
DSTBN1#
D[47:32]#, DBI2#
DSTBN2#
D[63:48]#, DBI3#
DSTBN3#
Data strobe used to latch in D[63:0]#.
Signals
Associated Strobes
D[15:0]#, DBI0#
DSTBP0#
D[31:16]#, DBI1#
DSTBP1#
D[47:32]#, DBI2#
DSTBP2#
D[63:48]#, DBI3#
DSTBP3#
Notes
3
3
FERR#/PBE#
O
FERR#/PBE# (floating-point error/pending break event) is a multiplexed signal and
its meaning is qualified by STPCLK#. When STPCLK# is not asserted, FERR#/PBE#
indicates a floating-point error and will be asserted when the processor detects an
unmasked floating-point error. When STPCLK# is not asserted, FERR#/PBE# is
similar to the ERROR# signal on the Intel 387 coprocessor, and is included for
compatibility with systems using MS-DOS*-type floating-point error reporting. When
STPCLK# is asserted, an assertion of FERR#/PBE# indicates that the processor has a
pending break event waiting for service. The assertion of FERR#/PBE# indicates that
the processor should be returned to the Normal state. For additional information on
the pending break event functionality, including the identification of support of the
feature and enable/disable information, refer to Vol. 3 of the Intel Architecture
Software Developer’s Manual and the Intel Processor Identification and the CPUID
Instruction application note.
FORCEPR#
I
The FORCEPR# (force power reduction) input can be used by the platform to cause
the Dual-Core Intel Xeon Processor 5000 series to activate the Thermal Control
Circuit (TCC).
GTLREF_ADD_C0
GTLREF_ADD_C1
I
GTLREF_ADD_C0 and GTLREF_ADD_C1 determine the signal reference level for
AGTL+ address and common clock input lands on processor core 0 and processor
core 1 respectively. GTLREF_ADD is used by the AGTL+ receivers to determine if a
signal is a logical 0 or a logical 1. Please refer to the appropriate platform design
guidelines for additional details.
GTLREF_DATA_C0
GTLREF_DATA_C1
I
GTLREF_DATA_C0 AND GTLREF_DATA_C1 determine the signal reference level for
AGTL+ data input lands on processor core 0 and processor core 1 respectively.
GTLREF_DATA is used by the AGTL+ receivers to determine if a signal is a logical 0 or
a logical 1. Please refer to the appropriate platform design guidelines for additional
details.
HIT#
HITM#
I/O
I/O
HIT# (Snoop Hit) and HITM# (Hit Modified) convey transaction snoop operation
results. Any FSB agent may assert both HIT# and HITM# together to indicate that it
requires a snoop stall, which can be continued by reasserting HIT# and HITM#
together.
3
IERR#
O
IERR# (Internal Error) is asserted by a processor as the result of an internal error.
Assertion of IERR# is usually accompanied by a SHUTDOWN transaction on the
processor FSB. This transaction may optionally be converted to an external error
signal (for example, NMI) by system core logic. The processor will keep IERR#
asserted until the assertion of RESET#.
This signal does not have on-die termination.
2
64
2
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Signal Definitions
Table 5-1.
Name
Signal Definitions (Sheet 5 of 8)
Type
Description
Notes
IGNNE#
I
IGNNE# (Ignore Numeric Error) is asserted to force the processor to ignore a
numeric error and continue to execute noncontrol floating-point instructions. If
IGNNE# is deasserted, the processor generates an exception on a noncontrol
floating-point instruction if a previous floating-point instruction caused an error.
IGNNE# has no effect when the NE bit in control register 0 (CR0) is set.
IGNNE# is an asynchronous signal. However, to ensure recognition of this signal
following an I/O write instruction, it must be valid along with the TRDY# assertion of
the corresponding I/O write bus transaction.
2
INIT#
I
INIT# (Initialization), when asserted, resets integer registers inside all processors
without affecting their internal caches or floating-point registers. Each processor then
begins execution at the power-on Reset vector configured during power-on
configuration. The processor continues to handle snoop requests during INIT#
assertion. INIT# is an asynchronous signal and must connect the appropriate pins of
all processor FSB agents.
2
LINT[1:0]
I
LINT[1:0] (Local APIC Interrupt) must connect the appropriate pins of all FSB
agents. When the APIC functionality is disabled, the LINT0/INTR signal becomes
INTR, a maskable interrupt request signal, and LINT1/NMI becomes NMI, a
nonmaskable interrupt. INTR and NMI are backward compatible with the signals of
those names on the Pentium® processor. Both signals are asynchronous.
These signals must be software configured via BIOS programming of the APIC
register space to be used either as NMI/INTR or LINT[1:0]. Because the APIC is
enabled by default after Reset, operation of these pins as LINT[1:0] is the default
configuration.
2
LL_ID[1:0]
O
The LL_ID[1:0] signals are used to select the correct loadline slope for the processor.
The Dual-Core Intel Xeon Processor 5000 series pull these signals to ground on the
package for a logic 0 as these signals are not connected to the processor die. A logic
1 is a no-connect on the Dual-Core Intel Xeon Processor 5000 series package.
LOCK#
I/O
LOCK# indicates to the system that a transaction must occur atomically. This signal
must connect the appropriate pins of all processor FSB agents. For a locked series of
transactions, LOCK# is asserted from the beginning of the first transaction to the end
of the last transaction.
When the priority agent asserts BPRI# to arbitrate for ownership of the processor
FSB, it will wait until it observes LOCK# deasserted. This enables symmetric agents
to retain ownership of the processor FSB throughout the bus locked operation and
ensure the atomicity of lock.
MCERR#
I/O
MCERR# (Machine Check Error) is asserted to indicate an unrecoverable
error without a bus protocol violation. It may be driven by all processor
FSB agents.
MCERR# assertion conditions are configurable at a system level. Assertion
options are defined by the following options:
• Enabled or disabled.
• Asserted, if configured, for internal errors along with IERR#.
• Asserted, if configured, by the request initiator of a bus transaction
after it observes an error.
• Asserted by any bus agent when it observes an error in a bus
transaction.
3
For more details regarding machine check architecture, refer to the IA-32 Software
Developer’s Manual, Volume 3: System Programming Guide.
MS_ID[1:0]
O
These signals are provided to indicate the Market Segment for the processor and
may be used for future processor compatibility or for keying. The Dual-Core Intel
Xeon Processor 5000 series pull these signals to ground on the package for a logic 0
as these signals are not connected to the processor die. A logic 1 is a no-connect on
the Dual-Core Intel Xeon Processor 5000 series package.
PROCHOT#
O
PROCHOT# (Processor Hot) will go active when the processor’s temperature
monitoring sensor detects that the processor has reached its maximum safe
operating temperature. This indicates that the Thermal Control Circuit (TCC) has
been activated, if enabled. The TCC will remain active until shortly after the
processor deasserts PROCHOT#. See Section 6.2.3 for more details. PROCHOT#
from each processor socket should be kept separated and not tied together on
platform designs.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
65
Signal Definitions
Table 5-1.
Name
Signal Definitions (Sheet 6 of 8)
Type
Description
PWRGOOD
I
PWRGOOD (Power Good) is an input. The processor requires this signal to be a clean
indication that all processor clocks and power supplies are stable and within their
specifications. “Clean” implies that the signal will remain low (capable of sinking
leakage current), without glitches, from the time that the power supplies are turned
on until they come within specification. The signal must then transition monotonically
to a high state.PWRGOOD can be driven inactive at any time, but clocks and power
must again be stable before a subsequent rising edge of PWRGOOD. It must also
meet the minimum pulse width specification in Table 2-15, and be followed by a
1-10 ms RESET# pulse.
The PWRGOOD signal must be supplied to the processor; it is used to protect internal
circuits against voltage sequencing issues. It should be driven high throughout
boundary scan operation.
2
REQ[4:0]#
I/O
REQ[4:0]# (Request Command) must connect the appropriate pins of all processor
FSB agents. They are asserted by the current bus owner to define the currently
active transaction type. These signals are source synchronous to ADSTB[1:0]#.
Refer to the AP[1:0]# signal description for details on parity checking of these
signals.
3
RESET#
I
Asserting the RESET# signal resets all processors to known states and invalidates
their internal caches without writing back any of their contents. For a power-on
Reset, RESET# must stay active for at least 1 ms after VCC and BCLK have reached
their proper specifications. On observing active RESET#, all FSB agents will deassert
their outputs within two clocks. RESET# must not be kept asserted for more than 10
ms while PWRGOOD is asserted.
A number of bus signals are sampled at the active-to-inactive transition of RESET#
for power-on configuration. These configuration options are described in the
Section 7.1.
This signal does not have on-die termination and must be terminated on the
system board.
3
RS[2:0]#
I
RS[2:0]# (Response Status) are driven by the response agent (the agent responsible
for completion of the current transaction), and must connect the appropriate pins of
all processor FSB agents.
3
RSP#
I
RSP# (Response Parity) is driven by the response agent (the agent responsible for
completion of the current transaction) during assertion of RS[2:0]#, the signals for
which RSP# provides parity protection. It must connect to the appropriate pins of all
processor FSB agents.
A correct parity signal is high if an even number of covered signals are low and low if
an odd number of covered signals are low. While RS[2:0]# = 000, RSP# is also high,
since this indicates it is not being driven by any agent guaranteeing correct parity.
3
SKTOCC#
O
SKTOCC# (Socket occupied) will be pulled to ground by the processor to indicate that
the processor is present. There is no connection to the processor silicon for this
signal.
SMI#
I
SMI# (System Management Interrupt) is asserted asynchronously by system logic.
On accepting a System Management Interrupt, processors save the current state and
enter System Management Mode (SMM). An SMI Acknowledge transaction is issued,
and the processor begins program execution from the SMM handler.
If SMI# is asserted during the deassertion of RESET# the processor will tri-state its
outputs.
2
STPCLK#
I
STPCLK# (Stop Clock), when asserted, causes processors to enter a low power StopGrant state. The processor issues a Stop-Grant Acknowledge transaction, and stops
providing internal clock signals to all processor core units except the FSB and APIC
units. The processor continues to snoop bus transactions and service interrupts while
in Stop-Grant state. When STPCLK# is deasserted, the processor restarts its internal
clock to all units and resumes execution. The assertion of STPCLK# has no effect on
the bus clock; STPCLK# is an asynchronous input.
2
TCK
I
TCK (Test Clock) provides the clock input for the processor Test Bus (also known as
the Test Access Port).
TDI
I
TDI (Test Data In) transfers serial test data into the processor. TDI provides the
serial input needed for JTAG specification support.
TDO
O
TDO (Test Data Out) transfers serial test data out of the processor. TDO provides the
serial output needed for JTAG specification support.
TEST_BUS
66
Other
Notes
Must be connected to all other processor TEST_BUS signals in the system. See the
appropriate platform design guideline for termination details.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Signal Definitions
Table 5-1.
Signal Definitions (Sheet 7 of 8)
Name
Type
Description
I
TESTHI[11:0] must be connected to a VTT power source through a resistor for proper
processor operation. Refer to Section 2.6 for TESTHI grouping restrictions.
THERMDA
THERMDA2
Other
Thermal Diode Anode. THERMDA connects to processor core 0, THERMDA2 connects
to processor core 1. Refer to the appropriate platform design guidelines for
implementation details.
THERMDC
THERMDC2
Other
Thermal Diode Cathode. THERMDC connects to processor core 0. THERMDC2
connects to processor core 1. Refer to the appropriate platform design guidelines for
implementation details.
THERMTRIP#
O
Assertion of THERMTRIP# (Thermal Trip) indicates the processor junction
temperature has reached a temperature beyond which permanent silicon damage
may occur. Measurement of the temperature is accomplished through an internal
thermal sensor. Upon assertion of THERMTRIP#, the processor will shut off its
internal clocks (thus halting program execution) in an attempt to reduce the
processor junction temperature. To protect the processor its core voltage (VCC) must
be removed following the assertion of THERMTRIP#. Intel is currently evaluating
whether VTT must also be removed.
Driving of the THERMTRIP# signals is enabled within 10 ms of the assertion of
PWRGOOD and is disabled on de-assertion of PWRGOOD. Once activated,
THERMTRIP# remains latched until PWRGOOD is de-asserted. While the de-assertion
of the PWRGOOD signal will de-assert THERMTRIP#, if the processor’s junction
temperature remains at or above the trip level, THERMTRIP# will again be asserted
within 10 ms of the assertion of PWRGOOD.
TMS
I
TMS (Test Mode Select) is a JTAG specification support signal used by debug tools.
See the eXtended Debug Port: Debug Port Design Guide for UP and DP Platforms for
further information.
TRDY#
I
TRDY# (Target Ready) is asserted by the target to indicate that it is ready to receive
a write or implicit writeback data transfer. TRDY# must connect the appropriate pins
of all FSB agents.
TRST#
I
TRST# (Test Reset) resets the Test Access Port (TAP) logic. TRST# must be driven
low during power on Reset.
VCCA
I
VCCA provides isolated power for the analog portion of the internal processor core
PLL’s. Refer to the appropriate platform design guidelines for complete
implementation details.
VCCIOPLL
I
VCCIOPLL provides isolated power for digital portion of the internal processor core
PLL’s. Follow the guidelines for VCCA, and refer to the appropriate platform design
guidelines for complete implementation details.
VCC_DIE_SENSE
VCC_DIE_SENSE2
O
VCC_DIE_SENSE and VCC_DIE_SENSE2 provide an isolated, low impedance
connection to each processor core power and ground. These signals should be
connected to the voltage regulator feedback signal, which insures the output voltage
(that is, processor voltage) remains within specification. Please see the applicable
platform design guide for implementation details.
VID[5:0]
O
VID[5:0] (Voltage ID) pins are used to support automatic selection of power supply
voltages (VCC). These are CMOS signals that are driven by the processor and must be
pulled up through a resistor. Conversely, the voltage regulator output must be
disabled prior to the voltage supply for these pins becomes invalid. The VID pins are
needed to support processor voltage specification variations. See Table 2-3 for
definitions of these pins. The VR must supply the voltage that is requested by these
pins, or disable itself.
VID_SELECT
O
VID_SELECT is an output from the processor which selects the appropriate VID table
for the Voltage Regulator. Dual-Core Intel Xeon Processor 5000 series pull this signal
to ground on the package as this signal is not connected to the processor die.
VSS_DIE_SENSE
VSS_DIE_SENSE2
O
VSS_DIE_SENSE and VSS_DIE_SENSE2 provide an isolated, low impedance
connection to each processor core power and ground. These signals should be
connected to the voltage regulator feedback signal, which insures the output voltage
(that is, processor voltage) remains within specification. Please see the applicable
platform design guide for implementation details.
VSSA
I
VSSA provides an isolated, internal ground for internal PLL’s. Do not connect directly
to ground. This pin is to be connected to VCCA and VCCIOPLL through a discrete filter
circuit.
TESTHI[11:0]
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Notes
1
67
Signal Definitions
Table 5-1.
Name
Signal Definitions (Sheet 8 of 8)
Type
Description
VTT
P
The FSB termination voltage input pins. Refer to Table 2-10 for further details.
VTT_OUT
O
The VTT_OUT signals are included in order to provide a local VTT for some signals that
require termination to VTT on the motherboard.
VTTPWRGD
I
The processor requires this input to determine that the supply voltage for BSEL[2:0]
and VID[5:0] is stable and within specification.
Notes
Notes:
1.
For this pin on Dual-Core Intel Xeon Processor 5000 series, the maximum number of symmetric agents is one. Maximum
number of priority agents is zero.
2.
For this pin on Dual-Core Intel Xeon Processor 5000 series, the maximum number of symmetric agents is two. Maximum
number of priority agents is zero.
3.
For this pin on Dual-Core Intel Xeon Processor 5000 series, the maximum number of symmetric agents is two. Maximum
number of priority agents is one.
§
68
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Thermal Specifications
6
Thermal Specifications
6.1
Package Thermal Specifications
The Dual-Core Intel Xeon Processor 5000 series require a thermal solution to maintain
temperatures within its operating limits. Any attempt to operate the processor outside
these operating limits may result in permanent damage to the processor and
potentially other components within the system. As processor technology changes,
thermal management becomes increasingly crucial when building computer systems.
Maintaining the proper thermal environment is key to reliable, long-term system
operation.
A complete solution includes both component and system level thermal management
features. Component level thermal solutions can include active or passive heatsinks
attached to the processor integrated heat spreader (IHS). Typical system level thermal
solutions may consist of system fans combined with ducting and venting.
This section provides data necessary for developing a complete thermal solution. For
more information on designing a component level thermal solution, refer to the DualCore Intel® Xeon® Processor 5000 Series Thermal/Mechanical Design Guidelines.
Note:
The boxed processor will ship with a component thermal solution. Refer to Chapter 8,
“Boxed Processor Specifications”for details on the boxed processor.
6.1.1
Thermal Specifications
To allow the optimal operation and long-term reliability of Intel processor-based
systems, the processor must remain within the minimum and maximum case
temperature (TCASE) specifications as defined by the applicable thermal profile (refer to
Table 6-1, Table 6-4 and Table 6-7; Figure 6-1, Figure 6-2 and Figure 6-3). Thermal
solutions not designed to provide this level of thermal capability may affect the longterm reliability of the processor and system. For more details on thermal solution
design, please refer to the processor thermal/mechanical design guidelines.
The Dual-Core Intel Xeon Processor 5000 series implement a methodology for
managing processor temperatures, which is intended to support acoustic noise
reduction through fan speed control and to ensure processor reliability. Selection of the
appropriate fan speed is based on the temperature reported by the processor’s Thermal
Diode. If the diode temperature is greater than or equal to Tcontrol (refer to
Section 6.2.6), then the processor case temperature must remain at or below the
temperature specified by the thermal profile (refer to Figure 6-1, Figure 6-2 and
Figure 6-3). If the diode temperature is less than Tcontrol, then the case temperature
is permitted to exceed the thermal profile, but the diode temperature must remain at
or below Tcontrol. Systems that implement fan speed control must be designed to take
these conditions into account. Systems that do not alter the fan speed only need to
guarantee the case temperature meets the thermal profile specifications.
Intel has developed two thermal profiles, either of which can be implemented with the
Dual-Core Intel Xeon Processor 5000 series. Both ensure adherence to Intel reliability
requirements. Thermal Profile A (refer to Figure 6-1, Figure 6-2; Table 6-2 and
Table 6-5) is representative of a volumetrically unconstrained thermal solution (that is,
industry enabled 2U heatsink). In this scenario, it is expected that the Thermal Control
Circuit (TCC) would only be activated for very brief periods of time when running the
most power intensive applications. Thermal Profile B (refer to Figure 6-1 and
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
69
Thermal Specifications
Figure 6-2; Table 6-3 and Table 6-6) is indicative of a constrained thermal environment
(that is, 1U form factor). Because of the reduced cooling capability represented by this
thermal solution, the probability of TCC activation and performance loss is increased.
Additionally, utilization of a thermal solution that does not meet Thermal Profile B will
violate the thermal specifications and may result in permanent damage to the
processor. Intel has developed these thermal profiles to allow OEMs to choose the
thermal solution and environmental parameters that best suit their platform
implementation. Refer to the Dual-Core Intel® Xeon® Processor 5000 Series Thermal/
Mechanical Design Guidelines for details on system thermal solution design, thermal
profiles and environmental considerations.
The Dual-Core Intel Xeon Processor 5063 (MV) supports a single Thermal Profile
targeted at volumetrically constrained thermal environments (for example, blades, 1U
form factors.) With this Thermal Profile, it’s expected that the Thermal Control Circuit
(TCC) would only be activated for very brief periods of time when running the most
power-intensive applications. Refer to the Dual-Core Intel® Xeon® Processor 5000
Series Thermal/Mechanical Design Guidelines for further details.
The upper point of the thermal profile consists of the Thermal Design Power (TDP)
defined in Table 6-1, Table 6-4, Table 6-7 and the associated TCASE value. It should be
noted that the upper point associated with Thermal Profile B (x = TDP and y =
TCASE_MAX_B @ TDP) represents a thermal solution design point. In actuality the
processor case temperature will not reach this value due to TCC activation (refer to
Figure 6-1 and Figure 6-2). The lower point of the thermal profile consists of x =
P_profile_min and y = TCASE_MAX @ P_profile_min. P_profile_min is defined as the
processor power at which TCASE , calculated from the thermal profile, is equal to 50 ° C.
The case temperature is defined at the geometric top center of the processor IHS.
Analysis indicates that real applications are unlikely to cause the processor to consume
maximum power dissipation for sustained time periods. Intel recommends that
complete thermal solution designs target the Thermal Design Power (TDP) indicated in
Table 6-1, Table 6-4 and Table 6-7, instead of the maximum processor power
consumption. The Thermal Monitor feature is intended to help protect the processor in
the event that an application exceeds the TDP recommendation for a sustained time
period. For more details on this feature, refer to Section 6.2. To ensure maximum
flexibility for future requirements, systems should be designed to the Flexible
Motherboard (FMB) guidelines, even if a processor with lower power dissipation is
currently planned. The Thermal Monitor feature must be enabled for the
processor to remain within its specifications.
Table 6-1.
Dual-Core Intel Xeon Processor 5000 Series (1066 MHz) Thermal
Specifications
Core Frequency
Launch to FMB
Thermal
Design Power
(W)
Minimum
TCASE
(°C)
Maximum TCASE
(°C)
Notes
130
5
Refer to Figure 6-1; Table 6-2; Table 6-3
1, 2, 3, 4, 5
Notes:
1.
These values are specified at VCC_MAX for all processor frequencies. Systems must be designed to ensure
the processor is not to be subjected to any static VCC and ICC combination wherein VCC exceeds VCC_MAX at
specified ICC. Please refer to the loadline specifications in Chapter 2, “Electrical Specifications”.
2.
Thermal Design Power (TDP) should be used for processor thermal solution design targets. TDP is not the
maximum power that the processor can dissipate. TDP is measured at maximum TCASE.
3.
These specifications are based on final silicon validation/characterization.
4.
Power specifications are defined at all VIDs found in Table 2-10. The Dual-Core Intel Xeon Processor 5000
series may be shipped under multiple VIDs for each frequency.
5.
FMB, or Flexible Motherboard, guidelines provide a design target for meeting all planned processor
frequency requirements.
70
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Thermal Specifications
Figure 6-1.
Dual-Core Intel Xeon Processor 5000 Series (1066 MHz) Thermal Profiles A
and B
TCASE_M AX is a thermal solution design point. In actuality, units will not significantly
exceed TCASE_M AX_A due to TCC activation.
85
TCASE_MAX_B@ TDP
80
75
TCASE_MAX_A@ TDP
Tcase [C]
70
65
Thermal Profile B
Y = 0.260*x + 44.2
Thermal Profile A
Y = 0.203*x + 42.6
60
55
50
45
40
0
10
20
30
40
50
60
70
80
90
100
110
120
130
Pow e r [W]
Notes:
1.
Thermal Profile A is representative of a volumetrically unconstrained platform. Please refer to Table 6-2 for
discrete points that constitute the thermal profile.
2.
Implementation of Thermal Profile A should result in virtually no TCC activation. Furthermore, utilization of
thermal solutions that do not meet processor Thermal Profile A will result in increased probability of TCC
activation and may incur measurable performance loss. (Refer to Section 6.2 for details on TCC activation.)
3.
Thermal Profile B is representative of a volumetrically constrained platform. Please refer to Table 6-3 for
discrete points that constitute the thermal profile.
4.
Implementation of Thermal Profile B will result in increased probability of TCC activation and measurable
performance loss. Furthermore, utilization of thermal solutions that do not meet Thermal Profile B do not
meet the processor’s thermal specifications and may result in permanent damage to the processor.
5.
Refer to the Dual-Core Intel® Xeon® processor 5000 Series Thermal/Mechanical Design Guidelines for
system and environmental implementation details.
Table 6-2.
Dual-Core Intel Xeon Processor 5000 Series (1066 MHz) Thermal Profile A
Table
Power (W)
TCASE_MAX (° C)
Power (W)
P_profile_min_A=36.5
50.0
85
59.9
40
50.7
90
60.9
45
51.7
95
61.9
50
52.8
100
62.9
55
53.8
105
63.9
60
54.8
110
64.9
65
55.8
115
65.9
70
56.8
120
67.0
75
57.8
125
68.0
80
58.8
130
69.0
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
TCASE_MAX (° C)
71
Thermal Specifications
Table 6-3.
Dual-Core Intel Xeon Processor 5000 Series (1066 MHz) Thermal Profile B
Table
Power (W)
Table 6-4.
TCASE_MAX (° C)
Power (W)
TCASE_MAX (° C)
P_profile_min_B=22.3
50.0
80
65.0
30
52.0
85
66.3
35
53.3
90
67.6
40
54.6
95
68.9
45
55.9
100
70.2
50
57.2
105
71.5
55
58.5
110
72.8
60
59.8
115
74.1
65
61.1
120
75.4
70
62.4
125
76.7
75
63.7
130
78.0
Dual-Core Intel Xeon Processor 5000 Series (667 MHz) Thermal Specifications
Core Frequency
Launch to FMB
Thermal
Design Power
(W)
Minimum
TCASE
(°C)
95
5
Maximum TCASE
(°C)
Notes
Refer to Figure 6-2;
Table 6-5; Table 6-6
1, 2, 3, 4,
5
Notes:
1.
These values are specified at VCC_MAX for all processor frequencies. Systems must be designed to ensure
the processor is not to be subjected to any static VCC and ICC combination wherein VCC exceeds VCC_MAX at
specified ICC. Please refer to the loadline specifications in Chapter 2, “Electrical Specifications.”
2.
Thermal Design Power (TDP) should be used for processor thermal solution design targets. TDP is not the
maximum power that the processor can dissipate. TDP is measured at maximum TCASE.
3.
These specifications are based on final silicon validation/characterization.
4.
Power specifications are defined at all VIDs found in Table 2-10. The Dual-Core Intel Xeon Processor 5000
series may be shipped under multiple VIDs for each frequency.
5.
FMB, or Flexible Motherboard, guidelines provide a design target for meeting all planned processor
frequency requirements.
72
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Thermal Specifications
Figure 6-2.
Dual-Core Intel Xeon Processor 5000 Series (667 MHz) Thermal Profiles
TCASE_M AX is a thermal solution design point. In actuality, units w ill not significantly exceed
TCASE_M AX_A due to TCC activation.
70
TCASE_MAX_B@ TDP
65
TCASE_MAX_A@ TDP
Tcase [C]
60
Thermal Profile B
Y = 0.260*x + 42.3
55
Thermal Profile A
Y = 0.203*x + 41.7
50
45
40
0
10
20
30
40
50
60
70
80
90
100
Pow e r [W]
Notes:
1.
Thermal Profile A is representative of a volumetrically unconstrained platform. Please refer to Table 6-5 for
discrete points that constitute the thermal profile.
2.
Implementation of Thermal Profile A should result in virtually no TCC activation. Furthermore, utilization of
thermal solutions that do not meet processor Thermal Profile A will result in increased probability of TCC
activation and may incur measurable performance loss. (Refer to Section 6.2 for details on TCC activation).
3.
Thermal Profile B is representative of a volumetrically constrained platform. Please refer to Table 6-6 for
discrete points that constitute the thermal profile.
4.
Implementation of Thermal Profile B will result in increased probability of TCC activation and measurable
performance loss. Furthermore, utilization of thermal solutions that do not meet Thermal Profile B do not
meet the processor’s thermal specifications and may result in permanent damage to the processor.
5.
Refer to the Dual-Core Intel® Xeon® Processor 5000 Series Thermal/Mechanical Design Guidelines for
system and environmental implementation details.
Table 6-5.
Dual-Core Intel Xeon Processor 5000 Series (667 MHz) Thermal Profile A
Table
Power (W)
TCASE_MAX (° C)
Power (W)
TCASE_MAX (° C)
P_profile_min_A=40.9
50.0
80
57.9
45
50.8
85
59.0
50
51.9
90
60.0
55
52.9
95
61.0
60
53.9
65
54.9
70
55.9
75
56.9
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
73
Thermal Specifications
Table 6-6.
Table 6-7.
Dual-Core Intel Xeon 5000 Series (667 MHz) Thermal Profile B Table
Power (W)
TCASE_MAX (° C)
Power (W)
TCASE_MAX (° C)
P_profile_min_B=29.6
50.0
75
61.8
35
51.4
80
63.1
40
52.7
85
64.4
45
54.0
90
65.7
50
55.3
95
67.0
55
56.6
60
57.9
65
59.2
70
60.5
Dual-Core Intel Xeon Processor 5063 (MV) Thermal Specifications
Core Frequency
Launch to FMB
Thermal
Design Power
(W)
Minimum
TCASE
(°C)
95
5
Maximum TCASE
(°C)
Notes
Refer to Figure 6-3;
Table 6-8
1, 2, 3, 4,
5
Notes:
1.
These values are specified at VCC_MAX for all processor frequencies. Systems must be designed to ensure
the processor is not to be subjected to any static VCC and ICC combination wherein VCC exceeds VCC_MAX at
specified ICC. Please refer to the loadline specifications in Chapter 2, “Electrical Specifications.”
2.
Thermal Design Power (TDP) should be used for processor thermal solution design targets. TDP is not the
maximum power that the processor can dissipate. TDP is measured at maximum TCASE.
3.
These specifications are based on final silicon validation/characterization.
4.
Power specifications are defined at all VIDs found in Table 2-10. The Dual-Core Intel Xeon Processor 5000
series may be shipped under multiple VIDs for each frequency.
5.
FMB, or Flexible Motherboard, guideline provide a design target for meeting all planned processor
frequency requirements.
74
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Thermal Specifications
Figure 6-3.
Dual-Core Intel Xeon Processor 5063 (MV) Thermal Profile
Thermal Profile
70
TCASE_MAX@TDP
65
Thermal Profile
Y = 0.260*x + 42.3
Tcase [C]
60
55
50
45
40
0
10
20
30
40
50
60
70
80
90
100
Pow e r [W]
Notes:
1.
Thermal Profile is representative of a volumetrically constrained platform. Please refer to Table 6-8 for
discrete points that constitute the thermal profile.
2.
Implementation of Thermal Profile should result in virtually no TCC activation. Furthermore, utilization of
thermal solutions that do not meet Thermal Profile will not meet the processor’s thermal specifications and
may result in permanent damage to the processor.
3.
Refer to the Dual-Core Intel® Xeon® Processor 5000 Series Thermal/Mechanical Design Guidelines for
system and environment implementation details.
Table 6-8.
6.1.2
Dual-Core Intel Xeon Processor 5063 (MV) Thermal Profile Table
Power (W)
TCASE_MAX (° C)
Power (W)
TCASE_MAX (° C)
P_profile_min_B=29.6
50.0
75
61.8
35
51.4
80
63.1
40
52.7
85
64.4
45
54.0
90
65.7
50
55.3
95
67.0
55
56.6
60
57.9
65
59.2
70
60.5
Thermal Metrology
The minimum and maximum case temperatures (TCASE) specified in Table 6-2,
Table 6-3, Table 6-5, and Table 6-6 are measured at the geometric top center of the
processor integrated heat spreader (IHS). Figure 6-4 illustrates the location where
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
75
Thermal Specifications
TCASE temperature measurements should be made. For detailed guidelines on
temperature measurement methodology, refer to the Dual-Core Intel® Xeon®
Processor 5000 Series Thermal/Mechanical Design Guidelines.
Figure 6-4.
Case Temperature (TCASE) Measurement Location
Note:
76
Figure is not to scale and is for reference only.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Thermal Specifications
6.2
Processor Thermal Features
6.2.1
Thermal Monitor
The Thermal Monitor (TM1) feature helps control the processor temperature by
activating the Thermal Control Circuit (TCC) when the processor silicon reaches its
maximum operating temperature. The TCC reduces processor power consumption as
needed by modulating (starting and stopping) the internal processor core clocks. The
Thermal Monitor (TM1) must be enabled for the processor to be operating within
specifications. The temperature at which Thermal Monitor activates the thermal control
circuit is not user configurable and is not software visible. Bus traffic is snooped in the
normal manner, and interrupt requests are latched (and serviced during the time that
the clocks are on) while the TCC is active.
When the Thermal Monitor is enabled and a high temperature situation exists (that is,
TCC is active), the clocks will be modulated by alternately turning the clocks off and on
at a duty cycle specific to the processor (typically 30 -50%). Cycle times are processor
speed dependent and will decrease as processor core frequencies increase. A small
amount of hysteresis has been included to prevent rapid active/inactive transitions of
the TCC when the processor temperature is near its maximum operating temperature.
Once the temperature has dropped below the maximum operating temperature, and
the hysteresis timer has expired, the TCC goes inactive and clock modulation ceases.
With a thermal solution designed to meet Thermal Profile A, it is anticipated that the
TCC would only be activated for very short periods of time when running the most
power intensive applications. The processor performance impact due to these brief
periods of TCC activation is expected to be so minor that it would be immeasurable. A
thermal solution that is designed to Thermal Profile B may cause a noticeable
performance loss due to increased TCC activation. Thermal Solutions that exceed
Thermal Profile B will exceed the maximum temperature specification and affect the
long-term reliability of the processor. In addition, a thermal solution that is significantly
under designed may not be capable of cooling the processor even when the TCC is
active continuously. Refer to the Dual-Core Intel® Xeon® Processor 5000 Series
Thermal/Mechanical Design Guidelines for information on designing a thermal solution.
The duty cycle for the TCC, when activated by the TM1, is factory configured and
cannot be modified. The TM1 does not require any additional hardware, software
drivers, or interrupt handling routines.
6.2.2
On-Demand Mode
The processor provides an auxiliary mechanism that allows system software to force
the processor to reduce its power consumption. This mechanism is referred to as “OnDemand” mode and is distinct from the Thermal Monitor feature. On-Demand mode is
intended as a means to reduce system level power consumption. Systems utilizing the
Dual-Core Intel Xeon Processor 5000 series must not rely on software usage of this
mechanism to limit the processor temperature. If bit 4 of the
IA32_CLOCK_MODULATION MSR is set to a ‘1’, the processor will immediately reduce
its power consumption via modulation (starting and stopping) of the internal core clock,
independent of the processor temperature. When using On-Demand mode, the duty
cycle of the clock modulation is programmable via bits 3:1 of the same
IA32_CLOCK_MODULATION MSR. In On-Demand mode, the duty cycle can be
programmed from 12.5% on/ 87.5% off to 87.5% on/12.5% off in 12.5% increments.
On-Demand mode may be used in conjunction with the Thermal Monitor; however, if
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Thermal Specifications
the system tries to enable On-Demand mode at the same time the TCC is engaged, the
factory configured duty cycle of the TCC will override the duty cycle selected by the OnDemand mode.
6.2.3
PROCHOT# Signal
An external signal, PROCHOT# (processor hot) is asserted when the processor die
temperature has reached its factory configured trip point. If Thermal Monitor is enabled
(note that Thermal Monitor must be enabled for the processor to be operating within
specification), the TCC will be active when PROCHOT# is asserted. The processor can
be configured to generate an interrupt upon the assertion or de-assertion of
PROCHOT#. Refer to the Intel Architecture Software Developer’s Manual for specific
register and programming details.
PROCHOT# is designed to assert at or a few degrees higher than maximum TCASE (as
specified by Thermal Profile A) when dissipating TDP power and cannot be interpreted
as an indication of processor case temperature. This temperature delta accounts for
processor package, lifetime and manufacturing variations and attempts to ensure the
Thermal Control Circuit is not activated below maximum TCASE when dissipating TDP
power. There is no defined or fixed correlation between the PROCHOT# trip
temperature, the case temperature or the thermal diode temperature. Thermal
solutions must be designed to the processor specifications and cannot be adjusted
based on experimental measurements of TCASE, PROCHOT#, or Tdiode on random
processor samples.
6.2.4
FORCEPR# Signal
The FORCEPR# (force power reduction) input can be used by the platform to cause the
Dual-Core Intel Xeon Processor 5000 series to activate the TCC. If the Thermal Monitor
is enabled, the TCC will be activated upon the assertion of the FORCEPR# signal.
Assertion of the FORCEPR# signal will activate TCC for both processor cores. The TCC
will remain active until the system deasserts FORCEPR#. FORCEPR# is an
asynchronous input. FORCEPR# can be used to thermally protect other system
components. To use the VR as an example, when FORCEPR# is asserted, the TCC
circuit in the processor will activate, reducing the current consumption of the processor
and the corresponding temperature of the VR.
It should be noted that assertion of FORCEPR# does not automatically assert
PROCHOT#. As mentioned previously, the PROCHOT# signal is asserted when a high
temperature situation is detected. A minimum pulse width of 500 µs is recommended
when FORCEPR# is asserted by the system. Sustained activation of the FORCEPR#
signal may cause noticeable platform performance degradation. Refer to the
appropriate platform design guidelines for details on implementing the FORCEPR#
signal feature.
6.2.5
THERMTRIP# Signal
Regardless of whether or not Thermal Monitor is enabled, in the event of a catastrophic
cooling failure, the processor will automatically shut down when the silicon has reached
an elevated temperature (refer to the THERMTRIP# definition in Table 5-1). At this
point, the FSB signal THERMTRIP# will go active and stay active as described in
Table 5-1. THERMTRIP# activation is independent of processor activity and does not
generate any bus cycles. Intel also recommends the removal of VTT.
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Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Thermal Specifications
6.2.6
Tcontrol and Fan Speed Reduction
Tcontrol is a temperature specification based on a temperature reading from the
thermal diode. The value for Tcontrol will be calibrated in manufacturing and configured
for each processor. The Tcontrol value is set identically for both processor cores. The
Tcontrol temperature for a given processor can be obtained by reading the
IA32_TEMPERATURE_TARGET MSR in the processor. The Tcontrol value that is read
from the IA32_TEMPERATURE_TARGET MSR must be converted from Hexadecimal to
Decimal and added to a base value of 60° C. The value of Tcontrol may vary from 0x00h
to 0x1Eh.
When Tdiode is above Tcontrol, then TCASE must be at or below TCASE_MAX as defined by
the thermal profile. (Refer to Figure 6-1, Figure 6-2 and Figure 6-3 ; Table 6-2,
Table 6-3, Table 6-5, Table 6-6 and Table 6-8). Otherwise, the processor temperature
can be maintained at or below Tcontrol.
6.2.7
Thermal Diode
The Dual-Core Intel Xeon Processor 5000 series incorporates an on-die PNP transistor
whose base emitter junction is used as a thermal “diode”, one per core, with its
collector shorted to Ground. A thermal sensor located on the system board may
monitor the die temperature of the processor for thermal management and fan speed
control. Table 6-9, Table 6-11 and Table 6-12 provide the “diode” parameters and
interface specifications. Two different sets of “diode” parameters are listed in Table 6-9
and Table 6-11. The Diode Model parameters (Table 6-9) apply to traditional thermal
sensors that use the Diode Equation to determine the processor temperature.
Transistor Model parameters (Table 6-11) have been added to support thermal sensors
that use the transistor equation method. The Transistor Model may provide more
accurate temperature measurements when the diode ideality factor is closer to the
maximum or minimum limits. This thermal “diode” is separate from the Thermal
Monitor’s thermal sensor and cannot be used to predict the behavior of the Thermal
Monitor.
When calculating a temperature based on thermal diode measurements, a number of
parameters must be either measured or assumed. Most devices measure the diode
ideality and assume a series resistance and ideality trim value, although some are
capable of also measuring the series resistance. Calculating the temperature is then
accomplished by using the equations listed under Table 6-9. In most temperature
sensing devices, an expected value for the diode ideality is designed-in to the
temperature calculation equation. If the designer of the temperature sensing device
assumes a perfect diode, the ideality value (also called ntrim) will be 1.000. Given that
most diodes are not perfect, the designers usually select an ntrim value that more
closely matches the behavior of the diodes in the processor. If the processors diode
ideality deviates from that of ntrim, each calculated temperature will be offset by a fixed
amount. The temperature offset can be calculated with the equation:
Terror(nf) = Tmeasured X (1- nactual/ntrim )
where Terror(nf) is the offset in degrees C, Tmeasured is in Kelvin, nactual is the measured
ideality of the diode, and ntrim is the diode ideality assumed by the temperature sensing
device.
In order to improve the accuracy of diode based temperature measurements, a new
register (Tdiode_Offset) has been added to Dual-Core Intel Xeon Processor 5000 series
which will contain thermal diode characterization data. During manufacturing each
processor’s thermal diode will be evaluated for its behavior relative to a theoretical
diode. Using the equation above, the temperature error created by the difference
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79
Thermal Specifications
between ntrim and the actual ideality of the particular processor will be calculated. This
value (Tdiode_Offset) will be programmed into the new diode correction MSR and then
added to the Tdiode_Base value can be used to correct temperatures read by diode
based temperature sensing devices.
If the ntrim value used to calculating Tdiode_Offset differs from the ntrim value used in a
temperature sensing device, the Terror(nf) may not be accurate. If desired, the
Tdiode_Offset can be adjusted by calculating nactual and then recalculating the offset
using the actual ntrim as defined in the temperature sensor manufacturers’ datasheet.
The parameters used to calculate the Thermal Diode (Tdiode) Correction Factor are
listed in Table 6-12. For Dual-Core Intel Xeon Processor 5000 series, the range of
Tdiode Correction Factor is ±14°C.
.
Table 6-9.
Thermal Diode Parameters using Diode Model
Symbol
Parameter
Min
Typ
Max
Unit
IFW
Forward Bias Current
5
n
Diode Ideality Factor
1.000
RT
Series Resistance
2.79
4.52
Notes
-
200
µA
1
1.009
1.050
-
2, 3, 4
6.24
Ω
2, 3, 5
Notes:
1.
Intel does not support or recommend operation of the thermal diode under reverse bias.
2.
Characterized across a temperature range of 50-80°C.
3.
Not 100% tested. Specified by design characterization.
4.
The ideality factor, n, represents the deviation from ideal diode behavior as exemplified by the diode
equation: IFW = IS * (eqVD/nkT - 1)
Where IS = saturation current, q = electronic charge, VD = voltage across the diode, k = Boltzmann
Constant, and T = absolute temperature (Kelvin).
5.
The series resistance, RT, is provided to allow for a more accurate measurement of the junction
temperature. RT, as defined, includes the lands of the processor but does not include any socket resistance
or board trace resistance between the socket and external remote diode thermal sensor. RT can be used by
remote diode thermal sensors with automatic series resistance cancellation to calibrate out this error term.
Another application is that a temperature offset can be manually calculated and programmed into an offset
register in the remote diode thermal sensors as exemplified by the equation:
Terror = [RT * (N-1) * IFWmin] / [nk/q *ln N]
Where Terror=sensor temperature error, N=sensor current ratio, k=Boltzmann Constant, q=electronic
charge.
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Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Thermal Specifications
Table 6-10. Thermal Diode Interface
Land Name
Land Number
Description
THERMDA
AL1
diode anode
THERMDC
AK1
diode cathode
THERMDA2
AJ7
diode anode
THERMDC2
AH7
diode cathode
.
Table 6-11. Thermal Diode Parameters using Transistor Model
Symbol
Parameter
Min
Typ
Max
Unit
Notes
IFW
Forward Bias Current
5
-
200
µA
1, 2
IE
Emitter Current
5
-
200
µA
nQ
Transistor Ideality
0.997
1.001
1.005
-
3, 4, 5
Beta
-
0.391
-
0.760
-
3, 4
RT
Series Resistance
2.79
4.52
6.24
Ω
3, 6
Notes:
1.
Intel does not support or recommend operation of the thermal diode under reverse bias.
2.
Same as IFW in the diode model in Table 6-9.
3.
Characterized across a temperature range of 50-80°C.
4.
Not 100% tested. Specified by design characterization.
5.
The ideality factor, nQ, represents the deviation from ideal transistor model behavior as exemplified by the
equation for the collector current: IC = IS * (eqVBE/nQkT - 1)
Where IS = saturation current, q = electronic charge, VBE = voltage across the transistor based emitter
junction (same nodes as VD ), k = Boltzmann Constant, and T = absolute temperature (Kelvin).
6.
The series resistance, RT provided in Table 6-9 can be used for more accurate readings as needed.
Table 6-12. Parameters for Tdiode Correction Factor
Symbol
Parameter
Typ
ntrim
Diode Ideality used to calculate
Tdiode_Offset
1.008
Tdiode_Base
0
Unit
Notes
1
°C
1
Notes:
1.
See the Dual-Core Intel® Xeon® Processor 5000 Series Thermal/Mechanical Design Guidelines for more
information on how to use the Tdiode_Offset, Tdiode_Base and ntrim parameters for fan speed control.
§
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
81
Thermal Specifications
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Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Features
7
Features
7.1
Power-On Configuration Options
Several configuration options can be configured by hardware. The Dual-Core Intel Xeon
Processor 5000 series samples its hardware configuration at reset, on the active-toinactive transition of RESET#. For specifics on these options, please refer to Table 7-1.
The sampled information configures the processor for subsequent operation. These
configuration options cannot be changed except by another reset. All resets reconfigure
the processor, for reset configuration purposes, the processor does not distinguish
between a “warm” reset (PWRGOOD signal remains asserted during reset) and a
“power-on” reset.
Table 7-1.
Power-On Configuration Option Lands
Configuration Option
Land Name
Notes
SMI#
1,2
Execute BIST (Built-In Self Test)
A3#
1,2
In Order Queue de-pipelining (set IOQ depth to
1)
A7#
1,2
Output tri state
Disable MCERR# observation
A9#
1,2
Disable BINIT# observation
A10#
1,2
Disable bus parking
A15#
1,2
Symmetric agent arbitration ID
Force single logical processor
BR[1:0]#
1,2
A31#
1,2,3
Notes:
1.
2.
3.
7.2
Asserting this signal during RESET# will select the corresponding option.
Address pins not identified in this table as configuration options should not be asserted during RESET#.
This mode is not tested.
Clock Control and Low Power States
The Dual-Core Intel Xeon Processor 5000 series support the Enhanced HALT
Powerdown state in addition to the HALT Powerdown state and Stop-Grant states to
reduce power consumption by stopping the clock to internal sections of the processor,
depending on each particular state. See Figure 7-1 for a visual representation of the
processor low power states.
The Enhanced HALT state is enabled by default in the Dual-Core Intel Xeon Processor
5000 series. The Enhanced HALT state must remain enabled via the BIOS for the
processor to remain within its specifications. For processors that are already running at
the lowest core to bus ratio for its nominal operating point, the processor will transition
to the HALT Powerdown state instead of the Enhanced HALT state.
The Stop Grant state requires chipset and BIOS support on multiprocessor systems. In
a multiprocessor system, all the STPCLK# signals are bussed together, thus all
processors are affected in unison. The Hyper-Threading Technology feature adds the
conditions that all logical processors share the same STPCLK# signal internally. When
the STPCLK# signal is asserted, the processor enters the Stop Grant state, issuing a
Stop Grant Special Bus Cycle (SBC) for each processor or logical processor. The chipset
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
83
Features
needs to account for a variable number of processors asserting the Stop Grant SBC on
the bus before allowing the processor to be transitioned into one of the lower processor
power states. Refer to the applicable chipset specification for more information.
7.2.1
Normal State
This is the normal operating state for the processor.
7.2.2
HALT or Enhanced Powerdown States
The Enhanced HALT power down state is enabled by default in the Dual-Core Intel Xeon
Processor 5000 series. The Enhanced HALT power down state must remain enabled
via the BIOS. The Enhanced HALT state requires support for dynamic VID transitions in
the platform.
7.2.2.1
HALT Powerdown State
HALT is a low power state entered when all logical processors have executed the HALT
or MWAIT instruction. When one of the logical processors executes the HALT or MWAIT
instruction, that logical processor is halted; however, the other processor continues
normal operation. The processor will transition to the Normal state upon the occurrence
of SMI#, BINIT#, INIT#, LINT[1:0] (NMI, INTR), or an interrupt delivered over the
front side bus. RESET# will cause the processor to immediately initialize itself.
The return from a System Management Interrupt (SMI) handler can be to either
Normal Mode or the HALT Power Down state. Refer to the IA-32 Intel® Architecture
Software Developer's Manual, Volume III: System Programming Guide for more
information.
The system can generate a STPCLK# while the processor is in the HALT Power Down
state. When the system deasserts the STPCLK#, the processor will return execution to
the HALT state.
While in HALT Power Down state, the processor will process front side bus snoops and
interrupts.
7.2.2.2
Enhanced HALT Powerdown State
Enhanced HALT state is a low power state entered when all logical processors have
executed the HALT or MWAIT instructions. When one of the logical processors executes
the HALT instruction, that logical processor is halted; however, the other processor
continues normal operation. The Enhanced HALT state is generally a lower power state
than the Stop Grant state.
The processor will automatically transition to a lower core frequency and voltage
operating point before entering the Enhanced HALT state. Note that the processor FSB
frequency is not altered; only the internal core frequency is changed. When entering
the low power state, the processor will first switch to the lower bus ratio and then
transition to the lower VID.
While in the Enhanced HALT state, the processor will process bus snoops.
The processor exits the Enhanced HALT state when a break event occurs. When the
processor exits the Enhanced HALT state, it will first transition the VID to the original
value and then change the bus ratio back to the original value.
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Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Features
The Enhanced HALT state must be enabled by way of the BIOS for the processor to
remain within its specifications. The Enhanced HALT state requires support for dynamic
VID transitions in the platform.
Figure 7-1.
Stop Clock State Machine
HALT or MWAIT Instruction and
HALT Bus Cycle Generated
Normal State
Normal execution
S
De TPC
-a LK
ss #
er
te
d
STPCLK#
De-asserted
S
As TPC
se L
rte K#
d
STPCLK#
Asserted
INIT#, BINIT#, INTR, NMI, SMI#,
RESET#, FSB interrupts
Enhanced HALT or HALT State
BCLK running
Snoops and interrupts allowed
Snoop
Event
Occurs
Snoop
Event
Serviced
Enhanced HALT Snoop or HALT
Snoop State
BCLK running
Service snoops to caches
Stop Grant State
BCLK running
Snoops and interrupts allowed
7.2.3
Snoop Event Occurs
Snoop Event Serviced
Stop Grant Snoop State
BCLK running
Service snoops to caches
Stop-Grant State
When the STPCLK# pin is asserted, the Stop-Grant state of the processor is entered 20
bus clocks after the response phase of the processor-issued Stop Grant Acknowledge
special bus cycle. Once the STPCLK# pin has been asserted, it may only be deasserted
once the processor is in the Stop Grant state. For the Dual-Core Intel Xeon Processor
5000 series, all logical processor cores will enter the Stop-Grant state once the
STPCLK# pin is asserted. Additionally, all logical cores must be in the Stop Grant state
before the deassertion of STPCLK#.
Since the AGTL+ signal pins receive power from the front side bus, these pins should
not be driven (allowing the level to return to VTT) for minimum power drawn by the
termination resistors in this state. In addition, all other input pins on the front side bus
should be driven to the inactive state.
BINIT# will not be serviced while the processor is in Stop-Grant state. The event will be
latched and can be serviced by software upon exit from the Stop Grant state.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
85
Features
RESET# will cause the processor to immediately initialize itself, but the processor will
stay in Stop-Grant state. A transition back to the Normal state will occur with the deassertion of the STPCLK# signal.
A transition to the Grant Snoop state will occur when the processor detects a snoop on
the front side bus (see Section 7.2.4.1).
While in the Stop-Grant state, SMI#, INIT#, BINIT# and LINT[1:0] will be latched by
the processor, and only serviced when the processor returns to the Normal state. Only
one occurrence of each event will be recognized upon return to the Normal state.
While in Stop-Grant state, the processor will process snoops on the front side bus and it
will latch interrupts delivered on the front side bus.
The PBE# signal can be driven when the processor is in Stop-Grant state. PBE# will be
asserted if there is any pending interrupt latched within the processor. Pending
interrupts that are blocked by the EFLAGS.IF bit being clear will still cause assertion of
PBE#. Assertion of PBE# indicates to system logic that it should return the processor to
the Normal state.
7.2.4
Enhanced HALT Snoop or HALT Snoop State,
Stop Grant Snoop State
The Enhanced HALT Snoop state is used in conjunction with the Enhanced HALT state.
If the Enhanced HALT state is not enabled in the BIOS, the default Snoop state entered
will be the HALT Snoop state. Refer to the sections below for details on HALT Snoop
state, Stop Grant Snoop state and Enhanced HALT Snoop state.
7.2.4.1
HALT Snoop State, Stop Grant Snoop State
The processor will respond to snoop or interrupt transactions on the front side bus
while in Stop-Grant state or in HALT Power Down state. During a snoop or interrupt
transaction, the processor enters the HALT/Grant Snoop state. The processor will stay
in this state until the snoop on the front side bus has been serviced (whether by the
processor or another agent on the front side bus) or the interrupt has been latched.
After the snoop is serviced or the interrupt is latched, the processor will return to the
Stop-Grant state or HALT Power Down state, as appropriate.
7.2.4.2
Enhanced HALT Snoop State
The Enhanced HALT Snoop state is the default Snoop state when the Enhanced HALT
state is enabled via the BIOS. The processor will remain in the lower bus ratio and VID
operating point of the Enhanced HALT state.
While in the Enhanced HALT Snoop state, snoops and interrupt transactions are
handled the same way as in the HALT Snoop state. After the snoop is serviced or the
interrupt is latched, the processor will return to the Enhanced HALT state.
7.3
Enhanced Intel SpeedStep® Technology
The Dual-Core Intel Xeon Processor 5000 series support Enhanced Intel SpeedStep
Technology. This technology enables the processor to switch between multiple
frequency and voltage points, which results in platform power savings. Enhanced Intel
SpeedStep Technology requires support for dynamic VID transitions in the platform.
Switching between voltage/frequency states is software controlled.
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Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Features
Note:
Not all Dual-Core Intel Xeon Processor 5000 series are capable of supporting Enhanced
Intel SpeedStep Technology. More details on which processor frequencies will support
this feature will be provided in future releases of the Dual-Core Intel® Xeon® Processor
5000 Series Specification Update when available.
Enhanced Intel SpeedStep Technology creates processor performance states (P-states)
or voltage/frequency operating points. P-states are lower power capability states within
the Normal state as shown in Figure 7-1. Enhanced Intel SpeedStep Technology
enables real-time dynamic switching between frequency and voltage points. It alters
the performance of the processor by changing the bus to core frequency ratio and
voltage. This allows the processor to run at different core frequencies and voltages to
best serve the performance and power requirements of the processor and system. The
Dual-Core Intel Xeon Processor 5000 series have hardware logic that coordinates the
requested processor voltage between the processor cores. The highest voltage that is
requested for either of the processor cores is selected for that processor. Note that the
front side bus is not altered; only the internal core frequency is changed. In order to
run at reduced power consumption, the voltage is altered in step with the bus ratio.
The following are key features of Enhanced Intel SpeedStep Technology:
• Multiple voltage/frequency operating points provide optimal performance at
reduced power consumption.
• Voltage/frequency selection is software controlled by writing to processor MSR’s
(Model Specific Registers), thus eliminating chipset dependency.
— If the target frequency is higher than the current frequency, VCC is incremented
in steps (+12.5 mV) by placing a new value on the VID signals and the
processor shifts to the new frequency. Note that the top frequency for the
processor can not be exceeded.
— If the target frequency is lower than the current frequency, the processor shifts
to the new frequency and VCC is then decremented in steps (-12.5 mV) by
changing the target VID through the VID signals.
§
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
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Features
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Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Boxed Processor Specifications
8
Boxed Processor Specifications
8.1
Introduction
Intel boxed processors are intended for system integrators who build systems from
components available through distribution channels. The Dual-Core Intel® Xeon®
Processor 5000 series will be offered as an Intel boxed processor.
Intel will offer the Dual-Core Intel Xeon Processor 5000 series boxed processor with
two heat sink configurations available for each processor frequency: 1U passive/2U
active combination solution and a 2U passive only solution. The 1U passive/2U active
combination solution is based on a 1U passive heat sink with a removable fan that will
be pre-attached at shipping. This heat sink solution is intended to be used as either a
1U passive heat sink or a 2U+ active heat sink. Although the active combination
solution with removable fan mechanically fits into a 2U keepout, additional design
considerations may need to be addressed to provide sufficient airflow to the fan inlet.
The 1U passive/2U active combination solution in the active fan configuration is
primarily designed to be used in a pedestal chassis where sufficient air inlet space is
present and strong side directional airflow is not an issue. The 1U passive/active
combination solution with the fan removed and the 2U passive thermal solution require
the use of chassis ducting and are targeted for use in rack mount servers. The
retention solution used for these products is called the Common Enabling Kit, or CEK.
The CEK base is compatible with both thermal solutions and uses the same hole
locations as the Intel® Xeon® processor with 800 MHz FSB.
The 1U passive/active combination solution will utilize a removable fan with a 4-pin
pulse width modulated (PWM) T-diode control. Use of a 4-pin PWM T-diode controlled
active thermal solution helps customers meet acoustic targets in pedestal platforms
through the motherboards’s ability to directly control the RPM of the processor heat
sink fan. Please see Section 8.3 for more details. Figure 8-1 through Figure 8-3 are
representations of the two heat sink solutions.
Figure 8-1.
Boxed Dual-Core Intel Xeon Processor 5000 Series 1U Passive/2U Active
Combination Heat Sink (With Removable Fan)
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
89
Boxed Processor Specifications
Figure 8-2.
Boxed Dual-Core Intel Xeon Processor 5000 Series 2U Passive Heat Sink
Figure 8-3.
2U Passive Dual-Core Intel Xeon Processor 5000 Series Thermal Solution
(Exploded View)
Heat sink screw
springs
Heat sink
screws
Heat sink
Heat sink standoffs
Thermal Interface
Material
Motherboard
and
processor
Protective Tape
CEK spring
Chassis pan
Notes:
1.
The heat sinks represented in these images are for reference only, and may not represent the final boxed
processor heat sinks.
2.
The screws, springs, and standoffs will be captive to the heat sink. This image shows all of the components
in an exploded view.
3.
It is intended that the CEK spring will ship with the base board and be pre-attached prior to shipping.
8.2
Mechanical Specifications
This section documents the mechanical specifications of the boxed processor.
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Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Boxed Processor Specifications
8.2.1
Boxed Processor Heat Sink Dimensions (CEK)
The boxed processor will be shipped with an unattached thermal solution. Clearance is
required around the thermal solution to ensure unimpeded airflow for proper cooling.
The physical space requirements and dimensions for the boxed processor and
assembled heat sink are shown in Figure 8-4 through Figure 8-8. Figure 8-9 through
Figure 8-10 are the mechanical drawings for the 4-pin board fan header and 4-pin
connector used for the active CEK fan heat sink solution.
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
91
Boxed Processor Specifications
Figure 8-4.
92
Top Side Board Keep-Out Zones (Part 1)
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Boxed Processor Specifications
Figure 8-5.
Top Side Board Keep-Out Zones (Part 2)
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
93
Boxed Processor Specifications
Figure 8-6.
94
Bottom Side Board Keep-Out Zones
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
Boxed Processor Specifications
Figure 8-7.
Board Mounting Hole Keep-Out Zones
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
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Boxed Processor Specifications
Figure 8-8.
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Boxed Processor Specifications
Figure 8-9.
4-Pin Fan Cable Connector (For Active CEK Heat Sink)
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Boxed Processor Specifications
Figure 8-10. 4-Pin Base Board Fan Header (For Active CEK Heat Sink)
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Boxed Processor Specifications
8.2.2
Boxed Processor Heat Sink Weight
8.2.2.1
Thermal Solution Weight
The 1U passive/2U active combination heat sink solution and the 2U passive heat sink
solution will not exceed a mass of 1050 grams. Note that this is per processor, so a dual
processor system will have up to 2100 grams total mass in the heat sinks. This large
mass will require a minimum chassis stiffness to be met in order to withstand force
during shock and vibration.
See Section 3 for details on the processor weight.
8.2.3
Boxed Processor Retention Mechanism and
Heat Sink Support (CEK)
Baseboards and chassis designed for use by a system integrator should include holes
that are in proper alignment with each other to support the boxed processor. Refer to
the Server System Infrastructure Specification (SSI-EEB 3.6, TEB 2.1 or CEB 1.1).
These specification can be found at: http://www.ssiforum.org.
Figure 8-3 illustrates the Common Enabling Kit (CEK) retention solution. The CEK is
designed to extend air-cooling capability through the use of larger heat sinks with
minimal airflow blockage and bypass. CEK retention mechanisms can allow the use of
much heavier heat sink masses compared to legacy limits by using a load path directly
attached to the chassis pan. The CEK spring on the secondary side of the baseboard
provides the necessary compressive load for the thermal interface material. The
baseboard is intended to be isolated such that the dynamic loads from the heat sink are
transferred to the chassis pan via the stiff screws and standoffs. The retention scheme
reduces the risk of package pullout and solder joint failures.
All components of the CEK heat sink solution will be captive to the heat sink and will
only require a Phillips screwdriver to attach to the chassis pan. When installing the
CEK, the CEK screws should be tightened until they will no longer turn easily. This
should represent approximately 8 inch-pounds of torque. Avoid applying more than 10
inch-pounds of torque; otherwise, damage may occur to retention mechanism
components.
8.3
Electrical Requirements
8.3.1
Fan Power Supply (Active CEK)
The 4-pin PWM/T-diode controlled active thermal solution is being offered to help
provide better control over pedestal chassis acoustics. This is achieved though more
accurate measurement of processor die temperature through the processor’s
temperature diode (T-diode). Fan RPM is modulated through the use of an ASIC located
on the baseboard that sends out a PWM control signal to the 4th pin of the connector
labeled as Control. This thermal solution requires a constant +12 V supplied to pin 2 of
the active thermal solution and does not support variable voltage control or 3-pin PWM
control. See Table 8-2 for details on the 4-pin active heat sink solution connectors.
If the 4-pin active fan heat sink solution is connected to an older 3-pin baseboard CPU
fan header it will default back to a thermistor controlled mode, allowing compatibility
with legacy 3-wire designs. When operating in thermistor controlled mode, fan RPM is
automatically varied based on the TINLET temperature measured by a thermistor
located at the fan inlet of the heat sink solution.
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Boxed Processor Specifications
The fan power header on the baseboard must be positioned to allow the fan heat sink
power cable to reach it. The fan power header identification and location must be
documented in the suppliers platform documentation, or on the baseboard itself. The
baseboard fan power header should be positioned within 177.8 mm [7 in.] from the
center of the processor socket.
Table 8-1.
Table 8-2.
PWM Fan Frequency Specifications for 4-Pin Active CEK Thermal Solution
Description
Min Frequency
Nominal Frequency
Max Frequency
Unit
PWM Control
Frequency Range
21,000
25,000
28,000
Hz
Fan Specifications for 4-pin Active CEK Thermal Solution
Min
Typ
Steady
+12 V: 12 volt fan power supply
10.8
IC: Fan Current Draw
N/A
2
Description
SENSE: SENSE frequency
Max
Steady
Max
Startup
12
12
13.2
V
1
1.25
1.5
A
2
2
2
Pulses per fan
revolution
Unit
Figure 8-11. Fan Cable Connector Pin Out for 4-Pin Active CEK Thermal Solution
Table 8-3.
8.3.2
Fan Cable Connector Pin Out for 4-Pin Active CEK Thermal Solution
Pin Number
Signal
Color
1
Ground
Black
2
Power: (+12 V)
Yellow
3
Sense: 2 pulses per revolution
Green
4
Control: 21 KHz-28 KHz
Blue
Boxed Processor Cooling Requirements
As previously stated the boxed processor will be available in two product
configurations. Each configuration will require unique design considerations. Meeting
the processor’s temperature specifications is also the function of the thermal design of
the entire system, and ultimately the responsibility of the system integrator. The
processor temperature specifications are found in Chapter 6, “Thermal Specifications”
of this document.
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8.3.2.1
1U Passive/2U Active Combination Heat Sink Solution (1U Rack
Passive)
In the 1U configuration it is assumed that a chassis duct will be implemented to provide
sufficient airflow to pass through the heat sink fins. Currently the actual airflow target
is within the range of 15-27 CFM. The duct should be designed as precisely as possible
and should not allow any air to bypass the heat sink (0” bypass) and a back pressure of
0.38 in. H2O. It is assumed that a 40°C TLA is met. This requires a superior chassis
design to limit the TRISE at or below 5°C with an external ambient temperature of 35°C.
Following these guidelines will allow the designer to meet Thermal Profile B and
conform to the thermal requirements of the processor.
8.3.2.2
1U Passive/2U Active Combination Heat Sink Solution (Pedestal
Active)
The active configuration of the combination solution is designed to help pedestal
chassis users to meet the thermal processor requirements without the use of chassis
ducting. It may be still be necessary to implement some form of chassis air guide or air
duct to meet the TLA temperature of 40°C depending on the pedestal chassis layout.
Also, while the active thermal solution is designed to mechanically fit into a 2U
volumetric, it may require additional space at the top of the thermal solution to allow
sufficient airflow into the heat sink fan. Therefore, additional design criteria may need
to be considered if this thermal solution is used in a 2U rack mount chassis, or in a
chassis that has drive bay obstructions above the inlet to the fan heat sink. Use of the
active configuration in rackmount chassis is not recommended.
It is recommended that the ambient air temperature outside of the chassis be kept at
or below 35°C. The air passing directly over the processor thermal solution should not
be preheated by other system components. Meeting the processor’s temperature
specification is the responsibility of the system integrator.
8.3.2.3
2U Passive Heat Sink Solution (2U+ Rack or Pedestal)
A chassis duct is required for the 2U passive heat sink. In this configuration the thermal
profile (see Section 6) should be followed by supplying 27 CFM of airflow through the
fins of the heat sink with a 0” or no duct bypass and a back pressure of 0.182 in. H2O.
The TLA temperature of 40°C should be met. This may require the use of superior
design techniques to keep TRISE at or below 5°C based on an ambient external
temperature of 35°C.
8.4
Boxed Processor Contents
A direct chassis attach method must be used to avoid problems related to shock and
vibration, due to the weight of the thermal solution required to cool the processor. The
board must not bend beyond specification in order to avoid damage. The boxed
processor contains the components necessary to solve both issues. The boxed
processor will include the following items:
• Dual-Core Intel Xeon Processor 5000 series
• Unattached Heat Sink Solution
• 4 screws, 4 springs, and 4 heat sink standoffs (all captive to the heat sink)
• Thermal Interface Material (pre-applied on heat sink)
• Installation Manual
• Intel Branding Logo
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The other items listed in Figure 8-3 that are required to compete this solution will be
shipped with either the chassis or boards. They are as follows:
• CEK Spring (supplied by baseboard vendors)
• Heat sink standoffs (supplied by chassis vendors)
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Debug Tools Specifications
9
Debug Tools Specifications
Please refer to the eXtended Debug Port: Debug Port Design Guide for UP and DP
Platforms and the appropriate platform design guidelines for information regarding
debug tool specifications. Section 1.3 provides collateral details.
9.1
Debug Port System Requirements
The Dual-Core Intel Xeon Processor 5000 series debug port is the command and
control interface for the In-Target Probe (ITP) debugger. The ITP enables run-time
control of the processors for system debug. The debug port, which is connected to the
FSB, is a combination of the system, JTAG and execution signals. There are several
mechanical, electrical and functional constraints on the debug port that must be
followed. The mechanical constraint requires the debug port connector to be installed in
the system with adequate physical clearance. Electrical constraints exist due to the
mixed high and low speed signals of the debug port for the processor. While the JTAG
signals operate at a maximum of 75 MHz, the execution signals operate at the common
clock FSB frequency. The functional constraint requires the debug port to use the JTAG
system via a handshake and multiplexing scheme.
In general, the information in this chapter may be used as a basis for including all runcontrol tools in Dual-Core Intel Xeon Processor 5000 series-based system designs,
including tools from vendors other than Intel.
Note:
The debug port and JTAG signal chain must be designed into the processor board to
utilize the XDP for debug purposes except for interposer solutions.
9.2
Target System Implementation
9.2.1
System Implementation
Specific connectivity and layout guidelines for the Debug Port are provided in the
eXtended Debug Port: Debug Port Design Guide for UP and DP Platforms and the
appropriate platform design guidelines.
9.3
Logic Analyzer Interface (LAI)
Intel is working with two logic analyzer vendors to provide logic analyzer interfaces
(LAIs) for use in debugging Dual-Core Intel Xeon Processor 5000 series systems.
Tektronix and Agilent should be contacted to obtain specific information about their
logic analyzer interfaces. The following information is general in nature. Specific
information must be obtained from the logic analyzer vendor.
Due to the complexity of Dual-Core Intel Xeon Processor 5000 series-based
multiprocessor systems, the LAI is critical in providing the ability to probe and capture
FSB signals. There are two sets of considerations to keep in mind when designing a
Dual-Core Intel Xeon Processor 5000 series-based system that can make use of an LAI:
mechanical and electrical.
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Debug Tools Specifications
9.3.1
Mechanical Considerations
The LAI is installed between the processor socket and the processor. The LAI plugs into
the socket, while the processor plugs into a socket on the LAI. Cabling that is part of
the LAI egresses the system to allow an electrical connection between the processor
and a logic analyzer. The maximum volume occupied by the LAI, known as the keepout
volume, as well as the cable egress restrictions, should be obtained from the logic
analyzer vendor. System designers must make sure that the keepout volume remains
unobstructed inside the system. Note that it is possible that the keepout volume
reserved for the LAI may include differerent requirements from the space normally
occupied by the heatsink. If this is the case, the logic analyzer vendor will provide a
cooling solution as part of the LAI.
9.3.2
Electrical Considerations
The LAI will also affect the electrical performance of the FSB, therefore it is critical to
obtain electrical load models from each of the logic analyzer vendors to be able to run
system level simulations to prove that their tool will work in the system. Contact the
logic analyzer vendor for electrical specifications and load models for the LAI solution
they provide.
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