MICROSEMI 1N6467US

1N6461US – 1N6468US
Available on
commercial
versions
Voidless Hermetically Sealed Unidirectional
Transient Voltage Suppressors
Qualified Levels:
JAN, JANTX, and
JANTXV
Qualified per MIL-PRF-19500/551
DESCRIPTION
This surface mount series of 500 watt voidless hermetically sealed unidirectional Transient
Voltage Suppressors (TVS) are military qualified to MIL-PRF-19500/551 and are ideal for
high-reliability applications where a failure cannot be tolerated. Working peak “standoff”
voltages are available from 5.0 to 51.6 volts. They are very robust, using a hard glass casing
and internal Category 1 metallurgical bonds. These devices are also available in axial-leaded
packages for thru-hole mounting.
“B” SQ-MELF
Package
Important: For the latest information, visit our website http://www.microsemi.com.
FEATURES
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Surface mount equivalent of JEDEC registered 1N6461 thru 1N6468 series.
Available as 500 watt peak pulse power (P PP ).
Working peak “standoff” voltage (V WM ) from 5.0 to 51.6 volt.
High surge current and peak pulse power provides transient voltage protection for sensitive circuits.
Triple-layer passivation.
Internal “Category 1” metallurgical bonds.
Voidless hermetically sealed glass package.
JAN, JANTX, and JANTXV qualifications available per MIL-PRF-19500/551. Other screening in
reference to MIL-PRF-19500 is also available.
Also available in:
“B” Package
(axial –leaded)
1N6461 - 1N6468
(See part nomenclature for all available options.)
•
RoHS compliant versions available (commercial grade only).
APPLICATIONS / BENEFITS
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Military and other high-reliability applications.
Extremely robust construction.
ESD and EFT protection per IEC61000-4-2 and IEC61000-4-4 respectively.
Protection from secondary effects of lightning per select levels in IEC61000-4-5.
Square-end-cap terminals for easy placement.
Nonsensitive to ESD per MIL-STD-750 method 1020.
Inherently radiation hard as described in Microsemi “MicroNote 050”.
MAXIMUM RATINGS @ 25 ºC
Parameters/Test Conditions
Junction and Storage Temperature
Thermal Resistance, Junction to Endcap
Forward Surge Current @ 8.3 ms half-sine
Forward Voltage @ 1 Amp
Peak Pulse Power @ 10/1000 µs
(1)
Reverse Power Dissipation
Solder Temperature @ 10 s
Notes:
Symbol
T J and T STG
R ӨJEC
I FSM
VF
P PP
Value
-55 to +175
20
80
1.5
500
Unit
o
C
ºC/W
A
V
W
PR
2.5
260
W
o
C
1. Derate at 50 mW/oC (see figure 4).
MSC – Lawrence
6 Lake Street,
Lawrence, MA 01841
Tel: 1-800-446-1158 or
(978) 620-2600
Fax: (978) 689-0803
MSC – Ireland
Gort Road Business Park,
Ennis, Co. Clare, Ireland
Tel: +353 (0) 65 6840044
Fax: +353 (0) 65 6822298
Website:
www.microsemi.com
T4-LDS-0286-1, Rev. 1 (4/22/13)
©2013 Microsemi Corporation
Page 1 of 6
1N6461US – 1N6468US
MECHANICAL and PACKAGING
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CASE: Hermetically sealed voidless hard glass with tungsten slugs.
TERMINALS: Axial-leads are tin/lead over copper. RoHS compliant matte-tin is available for commercial grade only.
MARKING: Body paint and part number.
POLARITY: Cathode band.
TAPE & REEL option: Standard per EIA-296. Contact factory for quantities.
WEIGHT: Approximately 750 milligrams.
See Package Dimensions on last page.
PART NOMENCLATURE
JAN
1N6461
US
e3
Reliability Level
JAN = JAN Level
JANTX = JANTX Level
JANTXV = JANTXV Level
CDS (reference JANS)
Blank = commercial
RoHS Compliance
e3 = RoHS compliant (available
on commercial grade only)
Blank = non-RoHS compliant
MELF Package
JEDEC type number
See Electrical Characteristics
table
SYMBOLS & DEFINITIONS
Definition
Symbol
α V(BR)
V (BR)
V WM
ID
I PP
VC
P PP
Temperature Coefficient of Breakdown Voltage: The change in breakdown voltage divided by the change in
temperature expressed in %/°C or mV/°C.
Breakdown Voltage: The voltage across the device at a specified current I (BR) in the breakdown region.
Rated working standoff voltage: The maximum-rated value of dc or repetitive peak positive cathode-to-anode voltage
that may be continuously applied over the standard operating temperature.
Standby Current: The current through the device at rated stand-off voltage.
Peak Impulse Current: The maximum rated random recurring peak impulse current or nonrepetitive peak impulse
current that may be applied to a device. A random recurring or nonrepetitive transient current is usually due to an
external cause, and it is assumed that its effect will have completely disappeared before the next transient arrives.
Clamping Voltage: The voltage across the device in a region of low differential resistance during the application of an
impulse current (I PP ) for a specified waveform.
Peak Pulse Power. The rated random recurring peak impulse power or rated nonrepetitive peak impulse power. The
impulse power is the maximum-rated value of the product of I PP and V C .
T4-LDS-0286-1, Rev. 1 (4/22/13)
©2013 Microsemi Corporation
Page 2 of 6
1N6461US – 1N6468US
ELECTRICAL CHARACTERISTICS
TYPE
1N6461US
1N6462US
1N6463US
1N6464US
1N6465US
1N6466US
1N6467US
1N6468US
MINIMUM
BREAK
DOWN
VOLTAGE
BREAKDOWN
CURRENT
I (BR)
V (BR)
@ I (BR)
RATED
WORKING
STANDOFF
VOLTAGE
MAXIMUM
STANDBY
CURRENT
MAXIMUM
CLAMPING
VOLTAGE
ID
V WM
@ V RWM
VC
@ 10/1000 µs
Volts
mA
V (pk)
5.6
6.5
13.6
16.4
27.0
33.0
43.7
54.0
25
20
5
5
2
1
1
1
5
6
12
15
24
30.5
40.3
51.6
T4-LDS-0286-1, Rev. 1 (4/22/13)
µA
3000
2500
500
500
50
3
2
2
MAXIMUM
PEAK IMPULSE
CURRENT
I PP
MAXIMUM
TEMP. COEF.
OF
α V(BR)
V (pk)
@ 8/20
µs
A (pk)
@ 10/1000
µs
A (pk)
%/oC
9.0
11.0
22.6
26.5
41.4
47.5
63.5
78.5
315
258
125
107
69
63
45
35
56
46
22
19
12
11
8
6
-0.03, +0.045
+0.060
+0.085
+0.085
+0.096
+0.098
+0.101
+0.103
©2013 Microsemi Corporation
Page 3 of 6
1N6461US – 1N6468US
Reverse Peak Pulse Power (PPP) in kW
GRAPHS
Pulse Time (tp)
IPP – Peak Pulse Current - % IPP
FIGURE 1
Peak Pulse Power vs Pulse Time
Time (t) in Milliseconds
FIGURE 2
10/1000 µs Current Impulse Waveform
T4-LDS-0286-1, Rev. 1 (4/22/13)
©2013 Microsemi Corporation
Page 4 of 6
1N6461US – 1N6468US
IPP – Peak Pulse Current - % IPP
GRAPHS
Time (t) in Milliseconds
Peak Pulse Power (PPP), Current (IPP),
And DC Power in Percent of 25°C Rating
FIGURE 3
8/20 µs Current Impulse Waveform
T – Temperature - °C
FIGURE 4
Derating Curve
T4-LDS-0286-1, Rev. 1 (4/22/13)
©2013 Microsemi Corporation
Page 5 of 6
1N6461US – 1N6468US
PACKAGE DIMENSIONS
Inch
BL
Millimeters
Min
0.137
Max
0.148
Min
3.48
Max
3.76
BD
0.200
0.225
5.08
5.72
ECT
0.019
0.028
0.48
0.71
S
0.003
---
0.08
---
NOTES:
1. Dimensions are in inches.
2. Millimeter equivalents are given for information only.
3. Referencing to dimension S, minimum clearance of glass body to mounting surface on all orientations.
4. Dimensions are pre-solider dip.
5. In accordance with ASME Y14.5M, diameters are equivalent to Φx symbology.
PAD LAYOUT
A
B
C
INCH
0.288
0.070
0.155
MILLIMETERS
7.32
1.78
3.94
Note: If mounting requires adhesive
separate from the solder, an additional
0.080 inch diameter contact may be placed
in the center between the pads
as an optional spot for cement.
T4-LDS-0286-1, Rev. 1 (4/22/13)
©2013 Microsemi Corporation
Page 6 of 6