54F573,74F573 54F573 74F573 Octal D-Type Latch with TRI-STATE(RM) Outputs Literature Number: SNOS207A 54F/74F573 Octal D-Type Latch with TRI-STATEÉ Outputs General Description Features The ’F573 is a high speed octal latch with buffered common Latch Enable (LE) and buffered common Output Enable (OE) inputs. This device is functionally identical to the ’F373 but has different pinouts. Y Y Y Y Y Package Number Military 74F573PC N20A 20-Lead (0.300× Wide) Molded Dual-In-Line J20A 20-Lead Ceramic Dual-In-Line 74F573SC (Note 1) M20B 20-Lead (0.300× Wide) Molded Small Outline, JEDEC 74F573SJ (Note 1) M20D 20-Lead (0.300× Wide) Molded Small Outline, EIAJ 54F573FM (Note 2) W20A 20-Lead Cerpak 54F573LM (Note 2) E20A 20-Lead Ceramic Leadless Chip Carrier, Type C et 54F573DM (Note 2) Package Description e Commercial Inputs and outputs on opposite sides of package allowing easy interface with microprocessors Useful as input or output port for microprocessors Functionally identical to ’F373 TRI-STATE outputs for bus interfacing Guaranteed 4000V minimum ESD protection Note 1: Devices also available in 13× reel. Use suffix e SCX and SJX. bs ol Note 2: Military grade device with environmental and burn-in processing. Use suffix e DMQB, FMQB and LMQB. Logic Symbols Connection Diagrams Pin Assignment for DIP, SOIC and Flatpak Pin Assignment for LCC TL/F/9566–1 O IEEE/IEC TL/F/9566 – 3 TL/F/9566 – 2 TL/F/9566–4 TRI-STATEÉ is a registered trademark of National Semiconductor Corporation. C1995 National Semiconductor Corporation TL/F/9566 RRD-B30M115/Printed in U. S. A. 54F/74F573 Octal D-Type Latch with TRI-STATE Outputs August 1995 Unit Loading/Fan Out 54F/74F Pin Names D 0 – D7 LE OE O0 – O7 Description U.L. HIGH/LOW Input IIH/IIL Output IOH/IOL Data Inputs Latch Enable Input (Active HIGH) TRI-STATE Output Enable Input (Active LOW) TRI-STATE Latch Outputs 1.0/1.0 1.0/1.0 20 mA/b0.6 mA 20 mA/b0.6 mA 1.0/1.0 20 mA/b0.6 mA 150/40(33.3) b 3 mA/24 mA (20 mA) Functional Description The ’F573 contains eight D-type latches with 3-state output buffers. When the Latch Enable (LE) input is HIGH, data on the Dn inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its D input changes. When LE is LOW the latches store the information that was present on the D inputs a setup time preceding the HIGH-to-LOW transition of LE. The 3state buffers are controlled by the Output Enable (OE) input. When OE is LOW, the buffers are in the bi-state mode. When OE is HIGH the buffers are in the high impedance mode but this does not interfer with entering new data into the latches. Inputs Outputs LE D O L L L H H H L X H L X X H L O0 Z e OE et H e HIGH Voltage Level L e LOW Voltage Level X e Immaterial O0 e Value stored from previous clock cycle bs ol Logic Diagram Function Table TL/F/9566 – 5 O Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. 2 Absolute Maximum Ratings (Note 1) Recommended Operating Conditions If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. Storage Temperature b 65§ C to a 150§ C Ambient Temperature under Bias Junction Temperature under Bias Plastic b 55§ C to a 125§ C Free Air Ambient Temperature Military Commercial b 55§ C to a 125§ C 0§ C to a 70§ C Supply Voltage Military Commercial b 55§ C to a 175§ C b 55§ C to a 150§ C a 4.5V to a 5.5V a 4.5V to a 5.5V VCC Pin Potential to Ground Pin b 0.5V to a 7.0V b 0.5V to a 7.0V Input Voltage (Note 2) b 30 mA to a 5.0 mA Input Current (Note 2) Voltage Applied to Output in HIGH State (with VCC e 0V) b 0.5V to VCC Standard Output b 0.5V to a 5.5V TRI-STATE Output Current Applied to Output in LOW State (Max) twice the rated IOL (mA) 4000V e ESD Last Passing Voltage (Min) Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. DC Electrical Characteristics Symbol Parameter et Note 2: Either voltage limit or current limit is sufficient to protect inputs. 54F/74F Min Input HIGH Voltage VIL Input LOW Voltage VCD Input Clamp Diode Voltage VOH VOL IIH IBVI 2.0 Output HIGH Voltage 54F 10% VCC 54F 10% VCC 74F 10% VCC 74F 10% VCC 74F 5% VCC 74F 5% VCC VCC Conditions V Recognized as a HIGH Signal 0.8 V Recognized as a LOW Signal b 1.2 V 2.5 2.4 2.5 2.4 2.7 2.7 Min IIN e b18 mA V Min IOH IOH IOH IOH IOH IOH IOL e 20 mA IOL e 24 mA e e e e e e b 1 mA b 3 mA b 1 mA b 3 mA b 1 mA b 3 mA Output LOW Voltage 54F 10% VCC 74F 10% VCC 0.5 0.5 V Min Input HIGH Current 54F 74F 20.0 5.0 mA Max VIN e 2.7V Input HIGH Current Breakdown Test 54F 74F 100 7.0 mA Max VIN e 7.0V Output HIGH Leakage Current 54F 74F 250 50 mA Max VOUT e VCC V 0.0 IID e 1.9 mA All Other Pins Grounded 3.75 mA 0.0 VIOD e 150 mV All Other Pins Grounded VIN e 0.5V O ICEX Units Max bs ol VIH Typ VID Input Leakage Test 74F IOD Output Leakage Circuit Current 74F IIL Input LOW Current b 0.6 mA Max IOZH Output Leakage Current 50 mA Max VOUT e 2.7V IOZL Output Leakage Current b 50 mA Max VOUT e 0.5V IOS Output Short-Circuit Current b 150 mA Max VOUT e 0V IZZ Bus Drainage Test 500 mA 0.0V VOUT e 5.25V ICCL Power Supply Current 35 55 mA Max VO e LOW ICCZ Power Supply Current 35 55 mA Max VO e HIGH Z 4.75 b 60 3 AC Electrical Characteristics Symbol Parameter 74F 54F 74F TA e a 25§ C VCC e a 5.0V CL e 50 pF TA, VCC e Mil CL e 50 pF TA, VCC e Com CL e 50 pF Units Min Typ Max Min Max Min Max tPLH tPHL Propagation Delay Dn to On 3.0 2.0 5.3 3.7 7.0 6.0 3.0 2.0 9.0 7.0 3.0 2.0 8.0 6.5 ns tPLH tPHL Propagation Delay LE to On 5.0 3.0 9.0 5.2 11.0 7.0 5.0 3.0 13.5 7.5 5.0 3.0 12.0 7.0 ns tPZH tPZL Output Enable Time 2.0 2.0 5.0 5.6 8.0 8.5 2.0 2.0 10.0 10.0 2.0 2.0 9.0 9.5 tPHZ tPLZ Output Disable Time 1.5 1.5 4.5 3.8 5.5 5.5 1.5 1.5 7.0 5.5 1.5 1.5 6.5 5.5 Parameter 74F 54F TA e a 25§ C VCC e a 5.0V TA, VCC e Mil TA, VCC e Com Min Min Min Setup Time, HIGH or LOW Dn to LE 2.0 2.0 th(H) th(L) Hold Time, HIGH or LOW Dn to LE 3.0 3.5 tw(H) LE Pulse Width, HIGH Max Max 2.0 2.0 2.0 2.0 3.0 4.0 3.0 3.5 bs ol ts(H) ts(L) 74F Units et Symbol e AC Operating Requirements ns 4.0 O 4.0 4 4.0 Max ns ns Ordering Information The device number is used to form part of a simplified purchasing code where the package type and temperature range are defined as follows: 74F 573 S Temperature Range Family 74F e Commercial 54F e Military C X Special Variations QB e Military grade device with environmental and burn-in processing X e Devices shipped in 13× reels Device Type Package Code P e Plastic DIP D e Ceramic DIP F e Flatpak L e Leadless Chip Carrier (LCC) S e Small Outline SOIC JEDEC SJ e Small Outline SOIC EIAJ Temperature Range C e Commercial (0§ C to a 70§ C) M e Military (b55§ C to a 125§ C) O bs ol et e Physical Dimensions inches (millimeters) 20-Lead Ceramic Leadless Chip Carrier (L) NS Package Number E20A 5 et e Physical Dimensions inches (millimeters) (Continued) O bs ol 20-Lead Ceramic Dual-In-Line Package (D) NS Package Number J20A 20-Lead (0.300× Wide) Molded Small Outline Package, JEDEC (S) NS Package Number M20B 6 et e Physical Dimensions inches (millimeters) (Continued) O bs ol 20-Lead (0.300× Wide) Small Outline Package, EIAJ (SJ) NS Package Number M20D 20-Lead (0.300× Wide) Molded Dual-In-Line Package (P) NS Package Number N20A 7 e et 20 Lead Ceramic Flatpak (F) NS Package Number W20A bs ol 54F/74F573 Octal D-Type Latch with TRI-STATE Outputs Physical Dimensions inches (millimeters) (Continued) LIFE SUPPORT POLICY O NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. 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