SSM9934GM 2N AND 2P-CHANNEL ENHANCEMENT MODE POWER MOSFET PRODUCT SUMMARY N-CH BVDSS P2G N2D/P2D Simple Drive Requirement Low On-resistance Full Bridge Application on LCD Monitor Inverter 35V RDS(ON) P1S/P2S P1G ID N2G N1S/N2S 4.3A P-CH BVDSS N1D/P1D SO-8 48mΩ N1G DESCRIPTION The advanced power MOSFETs from Silicon Standard Corp. provide the designer with the best combination of fast switching, ruggedized device design, low on-resistance and cost-effectiveness. The SO-8 package is universally preferred for all commercialindustrial surface mount applications and suited for low voltage applications such as DC/DC converters. -35V RDS(ON) 72mΩ ID -3.6A P1S P2S P1G P2G P1N1D P2N2D N2G N1G N1S N2S Pb-free; RoHS-compliant ABSOLUTE MAXIMUM RATINGS Symbol Parameter Rating N-channel VDS Drain-Source Voltage VGS Gate-Source Voltage ID@TA=25℃ ID@TA=70℃ Units P-channel 35 -35 V ± 20 ± 20 V Continuous Drain Current 3 4.3 -3.6 A Continuous Drain Current 3 3.4 -2.8 A 20 -20 A 1 IDM Pulsed Drain Current PD@TA=25℃ Total Power Dissipation 1.38 W Linear Derating Factor 0.01 W/℃ TSTG Storage Temperature Range -55 to 150 ℃ TJ Operating Junction Temperature Range -55 to 150 ℃ THERMAL DATA Symbol Rthj-a 09/13/2007 Rev.1.00 Parameter Thermal Resistance Junction-ambient 3 Max. www.SiliconStandard.com Value Unit 90 ℃/W 1 SSM9934GM N-CH ELECTRICAL CHARACTERISTICS o @Tj=25 C (unless otherwise specified) Symbol Parameter Test Conditions Typ. Max. Units 35 - - V BVDSS Drain-Source Breakdown Voltage ΔBVDSS/ΔTj Breakdown Voltage Temperature Coefficient Reference to 25℃, ID=1mA - 0.03 - V/℃ RDS(ON) Static Drain-Source On-Resistance 2 VGS=10V, ID=4A - - 48 mΩ VGS=4.5V, ID=3A - - 70 mΩ VDS=VGS, ID=250uA 1 - 3 V VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS VDS=10V, ID=4A - 8 - S o VDS=30V, VGS=0V - - 1 uA o Drain-Source Leakage Current (Tj=70 C) VDS=24V, VGS=0V - - 25 uA Gate-Source Leakage VGS=±20V - - ±100 nA ID=4A - 6 10 nC Drain-Source Leakage Current (Tj=25 C) IGSS VGS=0V, ID=250uA Min. 2 Qg Total Gate Charge Qgs Gate-Source Charge VDS=28V - 2 - nC Qgd Gate-Drain ("Miller") Charge VGS=4.5V - 3 - nC 2 td(on) Turn-on Delay Time VDS=15V - 6 - ns tr Rise Time ID=1A - 5 - ns td(off) Turn-off Delay Time RG=3.3Ω,VGS=10V - 14 - ns tf Fall Time RD=15Ω - 4 - ns Ciss Input Capacitance VGS=0V - 490 780 pF Coss Output Capacitance VDS=25V - 130 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 55 - pF Min. Typ. IS=1.2A, VGS=0V - - 1.2 V SOURCE-DRAIN DIODE Symbol Parameter 2 Test Conditions Max. Units VSD Forward On Voltage trr Reverse Recovery Time IS=4A, VGS=0V - 18 - ns Qrr Reverse Recovery Charge dI/dt=100A/µs - 11 - nC 09/13/2007 Rev.1.00 www.SiliconStandard.com 2 SSM9934GM P-CH ELECTRICAL CHARACTERISTICS o @Tj=25 C (unless otherwise specified) Symbol Parameter Test Conditions Min. Typ. -35 - - V - -0.02 - V/℃ VGS=-10V, ID=-3A - - 72 mΩ VGS=-4.5V, ID=-2A - - 100 mΩ VDS=VGS, ID=-250uA -1 - -3 V BVDSS Drain-Source Breakdown Voltage ΔBVDSS/ΔTj Breakdown Voltage Temperature Coefficient Reference to 25℃,ID=-1mA RDS(ON) 2 Static Drain-Source On-Resistance VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS IGSS VGS=0V, ID=-250uA Max. Units VDS=-10V, ID=-3A - 6 - S o VDS=-30V, VGS=0V - - -1 uA o Drain-Source Leakage Current (Tj=70 C) VDS=-24V, VGS=0V - - -25 uA Gate-Source Leakage VGS=±20V - - ±100 nA Drain-Source Leakage Current (Tj=25 C) 2 Qg Total Gate Charge ID=-3A - 6 10 nC Qgs Gate-Source Charge VDS=-28V - 1 - nC Qgd Gate-Drain ("Miller") Charge VGS=-4.5V - 3 - nC VDS=-15V - 7 - ns 2 td(on) Turn-on Delay Time tr Rise Time ID=-1A - 5 - ns td(off) Turn-off Delay Time RG=3.3Ω,VGS=-10V - 19 - ns tf Fall Time RD=15Ω - 4 - ns Ciss Input Capacitance VGS=0V - 420 1100 pF Coss Output Capacitance VDS=-25V - 140 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 65 - pF Min. Typ. SOURCE-DRAIN DIODE Symbol Parameter Test Conditions 2 Max. Units VSD Forward On Voltage IS=-1.2A, VGS=0V - - -1.2 V trr Reverse Recovery Time IS=-3A, VGS=0V - 20 - ns Qrr Reverse Recovery Charge dI/dt=-100A/µs - 16 - nC Notes: 1.Pulse width limited by Max. junction temperature. 2.Pulse width <300us , duty cycle <2%. 2 3.Surface mounted on 1 in copper pad of FR4 board , t <10sec ; 186 ℃/W when mounted on Min. copper pad. 09/13/2007 Rev.1.00 www.SiliconStandard.com 3 SSM9934GM N-Channel 21 21 o T A =25 C 15 10V 7.0V 5.0V 18 ID , Drain Current (A) ID , Drain Current (A) T A = 150 o C 10V 7.0V 5.0V 4.5V 18 12 9 6 15 4.5V 12 9 6 V G =2.5V V G =2.5V 3 3 0 0 0 1 2 3 4 5 6 0 1 3 4 5 6 V DS , Drain-to-Source Voltage (V) V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 70 1.6 I D =3A I D =4A V G =10V 1.4 T A =25 o C Normalized RDS(ON) 60 RDS(ON) (mΩ ) 2 50 1.2 1.0 40 0.8 0.6 30 2 4 6 8 10 -50 V GS , Gate-to-Source Voltage (V) 0 50 100 150 o T j , Junction Temperature ( C) Fig 3. On-Resistance v.s. Gate Voltage Fig 4. Normalized On-Resistance v.s. Junction Temperature 5 2 Normalized VGS(th) (V) 4 IS(A) 3 T j =150 o C T j =25 o C 2 1.5 1 0.5 1 0 0 0 0.2 0.4 0.6 0.8 1 1.2 -50 0 50 100 o 150 V SD , Source-to-Drain Voltage (V) T j ,Junction Temperature ( Fig 5. Forward Characteristic of Fig 6. Gate Threshold Voltage v.s. Junction Temperature Reverse Diode 09/13/2007 Rev.1.00 www.SiliconStandard.com C) 4 SSM9934GM N-Channel f=1.0MHz 1000 VGS , Gate to Source Voltage (V) 12 ID=4A V DS = 2 8 V 10 C iss C (pF) 8 6 C oss 100 C rss 4 2 0 10 0 3 6 9 12 1 5 9 13 17 21 25 29 V DS , Drain-to-Source Voltage (V) Q G , Total Gate Charge (nC) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 100 1 ID (A) 10 100us 1ms 1 10ms 100ms 0.1 T A =25 o C Single Pulse 1s DC 0.01 Normalized Thermal Response (Rthja) Duty factor=0.5 0.2 0.1 0.1 0.05 0.02 P DM t 0.01 T Single Pulse 0.01 Duty factor = t/T Peak Tj = PDM x Rthja + Ta Rthja = 186℃ ℃ /W 0.001 0.1 1 10 100 0.0001 0.001 0.01 VDS 1 10 100 1000 t , Pulse Width (s) V DS , Drain-to-Source Voltage (V) Fig 9. Maximum Safe Operating Area 0.1 Fig 10. Effective Transient Thermal Impedance VG 90% QG 4.5V QGS QGD 10% VGS td(on) tr td(off) tf Fig 11. Switching Time Waveform 09/13/2007 Rev.1.00 Charge Q Fig 12. Gate Charge Waveform www.SiliconStandard.com 5 SSM9934GM P-Channel 21 21 T A =25 o C 15 T A = 150 C 18 12 9 V G = - 2.5V 6 3 15 -4.5V 12 9 V G = - 2.5V 6 3 0 0 0 1 2 3 4 5 0 1 2 3 4 5 -V DS , Drain-to-Source Voltage (V) -V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 100 1.6 I D = -3 A V G = - 10V I D = -2 A 1.4 T A =25 o C Normalized R DS(ON) 90 RDS(ON) (mΩ ) -10V -7.0V -5.0V o -10V -7.0V -5.0V -4.5V -ID , Drain Current (A) -ID , Drain Current (A) 18 80 1.2 1.0 70 0.8 0.6 60 2 4 6 8 -50 10 50 100 150 o -V GS , Gate-to-Source Voltage (V) T j , Junction Temperature ( C) Fig 3. On-Resistance v.s. Gate Voltage Fig 4. Normalized On-Resistance v.s. Junction Temperature 2 Normalized -VGS(th) (V) 4 3 -IS(A) 0 T j =25 o C T j =150 o C 2 1.5 1 0.5 1 0 0 0 0.2 0.4 0.6 0.8 1 1.2 -50 Fig 5. Forward Characteristic of Reverse Diode 09/13/2007 Rev.1.00 0 50 100 150 T j , Junction Temperature ( o C) -V SD , Source-to-Drain Voltage (V) Fig 6. Gate Threshold Voltage v.s. Junction Temperature www.SiliconStandard.com 6 SSM9934GM P-Channel f=1.0MHz -VGS , Gate to Source Voltage (V) 12 1000 I D = -3 A V DS = - 2 8 V 10 C iss C (pF) 8 6 C oss 100 C rss 4 2 0 10 0 3 6 9 12 1 5 9 13 17 21 25 29 -V DS , Drain-to-Source Voltage (V) Q G , Total Gate Charge (nC) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 100 1 Normalized Thermal Response (Rthja) Duty factor=0.5 10 -ID (A) 100us 1ms 1 10ms 100ms 0.1 T A =25 o C Single Pulse 1s DC 0.01 0.1 1 10 100 0.2 0.1 0.1 0.05 0.02 PDM t 0.01 T Single Pulse 0.01 Duty factor = t/T Peak Tj = PDM x Rthja + Ta Rthja = 186℃ ℃ /W 0.001 0.0001 0.001 0.01 -V DS , Drain-to-Source Voltage (V) 0.1 1 10 100 1000 t , Pulse Width (s) Fig 9. Maximum Safe Operating Area VDS Fig 10. Effective Transient Thermal Impedance VG 90% QG -4.5V QGS QGD 10% VGS td(on) tr td(off) tf Fig 11. Switching Time Waveform 09/13/2007 Rev.1.00 Charge Q Fig 12. Gate Charge Waveform www.SiliconStandard.com 7 SSM9934GM Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, expressed or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 09/13/2007 Rev.1.00 www.SiliconStandard.com 4