VISHAY SI6924AEDQ-T1-GE3

Si6924AEDQ
Vishay Siliconix
N-Channel 2.5-V (G-S) Battery Switch, ESD Protection
FEATURES
PRODUCT SUMMARY
VDS (V)
28
RDS(on) (Ω)
ID (A)
0.033 at VGS = 4.5 V
4.6
0.038 at VGS = 3.0 V
4.3
0.042 at VGS = 2.5 V
4.1
•
•
•
•
•
•
Halogen-free
Low RDS(on)
VGS Max Rating: 14 V
Exceeds 2 kV ESD Protection
28 V VDS Rated
Symmetrical Voltage Blocking (Off Voltage)
RoHS
COMPLIANT
DESCRIPTION
The Si6924AEDQ is a dual N-Channel MOSFET with ESD
protection and gate over-voltage protection circuitry
incorporated into the MOSFET. The device is designed for
use in Lithium Ion battery pack circuits. The common-drain
construction takes advantage of the typical battery pack
topology, allowing a further reduction of the device’s onresistance. The 2-stage input protection circuit is a unique
design, consisting of two stages of back-to-back zener
diodes separated by a resistor. The first stage diode is
designed to absorb most of the ESD energy. The second
stage diode is designed to protect the gate from any
remaining ESD energy and over-voltages above the gates
inherent safe operating range. The series resistor used to
limit the current through the second stage diode during over
voltage conditions has a maximum value which limits the
input current to ≤ 10 mA at 14 V and the maximum toff to 12
µs. The Si6924AEDQ has been optimized as a battery or
load switch in Lithium Ion applications with the advantage of
both a 2.5 V RDS(on) rating and a safe 14 V gate-to-source
maximum rating.
APPLICATION CIRCUITS
ESD and
Overvoltage
Protection
D
ESD and
Overvoltage
Protection
R**
G
S
Battery Protection Circuit
*Thermal connection to drain pins is required to achieve specific performance
Figure 1. Typical Use In a Lithium Ion Battery Pack
Document Number: 72215
S-81056-Rev. B, 12-May-08
**R typical value is 3.3 kΩ by design.
See Typical Characteristics,
Gate-Current vs. Gate-Source Voltage, Page 3.
Figure 2. Input ESD and Overvoltage Protection Circuit
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Si6924AEDQ
Vishay Siliconix
FUNCTIONAL BLOCK DIAGRAM AND PIN CONFIGURATION
*D
*D
3.3 kΩ
TSSOP-8
3.3 kΩ
G1
D
1
S1
2
S1
3
G1
4
Si6924AEDQ
G2
8 D
7 S2
6 S2
5 G2
S1
S2
N-Channel
Top View
Ordering Information: Si6924AEDQ-T1-GE3 (Lead (Pb)-free and Halogen-free)
N-Channel
*Thermal connection to drain pins is required to achieve specific performance.
Figure 3.
Figure 4.
ABSOLUTE MAXIMUM RATINGS TA = 25 °C, unless otherwise noted
Parameter
Symbol
10 s
Steady State
Drain-Source Voltage, Source-Drain Voltage
VDS
28
Gate-Source Voltage
VGS
± 14
Continuous Drain-to-Source Current (TJ = 150 °C)a
TA = 25 °C
TA = 70 °C
Pulsed Source Current (Diode Conduction)a
IS
TA = 25 °C
TA = 70 °C
PD
4.6
4.1
3.2
20
1.2
A
0.9
1.3
1.0
0.84
0.64
TJ, Tstg
Operating Junction and Storage Temperature Range
V
3.7
IDM
Pulsed Drain-to-Source Current
Maximum Power Dissipationa
ID
Unit
- 55 to 150
W
°C
THERMAL RESISTANCE RATINGS
Parameter
Maximum Junction-to-Ambienta
Maximum Junction-to-Foot (Drain)
Symbol
t ≤ 10 s
Steady State
Steady State
RthJA
RthJF
Typical
Maximum
71
95
96
125
56
70
Unit
°C/W
Notes:
a. Surface Mounted on FR4 board.
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Document Number: 72215
S-81056-Rev. B, 12-May-08
Si6924AEDQ
Vishay Siliconix
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min.
VGS(th)
VDS = VGS, ID = 250 µA
0.6
Typ.
Max.
Unit
1.5
V
Static
Gate Threshold Voltage
VDS = 0 V, VGS = ± 4.5 V
±1
µA
VDS = 0 V, VGS = ± 14 V
± 20
mA
Gate-Body Leakage
IGSS
Zero Gate Voltage Drain Current
IDSS
On-State Drain Currentb
ID(on)
VDS ≥ 5 V, VGS = 5 V
VGS = 4.5 V, ID = 4.6 A
0.022
0.033
RDS(on)
VGS = 3.0 V, ID = 4.3 A
0.025
0.038
VGS = 2.5 V, ID = 4.1 A
0.029
0.042
gfs
VDS = 10 V, ID = 4.6 A
25
VSD
IS = 1.2 A, VGS = 0 V
0.7
1.1
6.5
10
Drain-Source On-State Resistanceb
Forward Transconductanceb
Diode Forward Voltage
b
VDS = 22.4 V, VGS = 0 V
1
VDS = 22.4 V, VGS = 0 V, TJ = 55 °C
5
µA
10
A
Ω
S
V
Dynamica
Qg
Total Gate Charge
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
Turn-On Delay Time
td(on)
VDS = 10 V, VGS = 4.5 V, ID = 4.6 A
VDD = 10 V, RL = 10 Ω
ID ≅ 1 A, VGEN = 4.5 V, RG = 6 Ω
tr
Rise Time
td(off)
Turn-Off Delay Time
tf
Fall Time
nC
1.2
1.5
0.95
1.5
1.4
2.1
7
11
3.1
5
µs
Notes:
a. Guaranteed by design, not subject to production testing.
b. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
TYPICAL CHARACTERISTICS
25 °C, unless otherwise noted
0.020
10,000
0.015
I GSS - Gate Current (A)
I GSS - Gate Current (mA)
1,000
0.010
0.005
100
TJ = 150 °C
10
1
0.1
TJ = 25 °C
0.01
0.001
0.000
0
3
6
9
12
VGS - Gate-to-Source Voltage (V)
Gate-Current vs. Gate-Source Voltage
Document Number: 72215
S-81056-Rev. B, 12-May-08
15
0
2
4
6
8
10
12
14
VGS - Gate-to-Source Voltage (V)
Gate Current vs. Gate-Source Voltage
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Si6924AEDQ
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
25
25
VGS = 5 thru 2,5 V
20
I D - Drain Current (A)
I D - Drain Current (A)
20
15
2V
10
15
10
TC = 125 °C
5
5
25 °C
- 55 °C
0
0.00
0.25
0.50
0.75
1.00
1.25
0
0.0
1.50
1.0
2.0
2.5
VGS - Gate-to-Source Voltage (V)
Output Characteristics
Transfer Characteristics
3.0
V GS - Gate-to-Source Voltage (V)
5
0.04
VGS = 2.5 V
0.03
0.02
VGS = 4.5 V
VGS = 3 V
0.01
0.00
VDS = 10 V
ID = 4.6 A
4
3
2
1
0
0
4
8
12
16
20
0
1
2
ID - Drain Current (A)
4
5
6
7
Gate Charge
1.8
1.6
3
Qg - Total Gate Charge (nC)
On-Resistance vs. Drain Current
20
VGS = 4.5 V
ID = 4.6 A
10
I S - Source Current (A)
RDS(on) - On-Resistance
(Normalized)
1.5
VDS - Drain-to-Source Voltage (V)
0.05
RDS(on) - On-Resistance (Ω)
0.5
1.4
1.2
1.0
TJ = 150 °C
TJ = 25 °C
0.8
0.6
- 50
1
- 25
0
25
50
75
100
125
TJ - Junction Temperature (°C)
On-Resistance vs. Junction Temperature
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4
150
0
0.4
0.6
0.8
1.0
1.2
VSD - Source-to-Drain Voltage (V)
Source-Drain Diode Forward Voltage
Document Number: 72215
S-81056-Rev. B, 12-May-08
Si6924AEDQ
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
0.10
0.4
0.08
0.2
0.06
V GS(th) Variance (V)
R DS(on) - On-Resistance (Ω)
ID = 250 µA
ID = 4.6 AA
0.04
0.0
- 0.2
- 0.4
0.02
- 0.6
- 50
0.00
0
1
2
3
4
5
- 25
0
25
50
75
100
125
150
TJ - Temperature (°C)
VGS - Gate-to-Source Voltage (V)
On-Resistance vs. Gate-to-Source Voltage
Threshold Voltage
100
60
Limited
by R DS(on)*
50
ID - Drain Current (A)
10
Power (W)
40
30
20
1 ms
1
10 ms
100 ms
0.1
1s
TC = 25 °C
Single Pulse
10
10 s
DC
0.01
0
0.01
0.001
0.1
1
10
0.1
Time (s)
1
10
100
VDS - Drain-to-Source Voltage (V)
* VGS > minimum VGS at which RDS(on) is specified
Single Pulse Power
Safe Operating Area
2
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
Notes:
0.1
0.1
PDM
0.05
t1
t2
1. Duty Cycle, D =
0.02
t1
t2
2. Per Unit Base = RthJA = 96 °C/W
3. TJM - TA = PDMZthJA(t)
Single Pulse
0.01
10 -4
10 -3
4. Surface Mounted
10 -2
10 -1
1
10
100
600
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Ambient
Document Number: 72215
S-81056-Rev. B, 12-May-08
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Si6924AEDQ
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
2
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10 -4
10 -3
10 -2
10 -1
Square Wave Pulse Duration (s)
1
10
Normalized Thermal Transient Impedance, Junction-to-Foot
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?72215.
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Document Number: 72215
S-81056-Rev. B, 12-May-08
Package Information
Vishay Siliconix
TSSOP:
8ĆLEAD
JEDEC Part Number: MO-153
R 0.10
Corners)
e
A1
A
A2
D
0.25 (Gage Plane)
E1
MILLIMETERS
E
C
L
B
Document Number: 71201
06-Jul-01
R 0.10
(4 Corners)
oK1
L1
Dim
A
A1
A2
B
C
D
E
E1
e
L
L1
Y
oK1
Min
Nom
Max
–
–
1.20
0.05
0.10
0.15
0.80
1.00
1.05
0.19
0.28
0.30
–
0.127
–
2.90
3.00
3.10
6.20
6.40
6.60
4.30
4.40
4.50
–
0.65
–
0.45
0.60
0.75
0.90
1.00
1.10
–
–
0.10
0_
3_
6_
ECN: S-03946—Rev. G, 09-Jul-01
DWG: 5844
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AN1001
Vishay Siliconix
LITTLE FOOTR TSSOP-8
The Next Step in Surface-Mount Power MOSFETs
Wharton McDaniel and David Oldham
When Vishay Siliconix introduced its LITTLE FOOT
MOSFETs, it was the first time that power MOSFETs had been
offered in a true surface-mount package, the SOIC. LITTLE
FOOT immediately found a home in new small form factor disk
drives, computers, and cellular phones.
The new LITTLE FOOT TSSOP-8 power MOSFETs are the
natural evolutionary response to the continuing demands of
many markets for smaller and smaller packages. LITTLE
FOOT TSSOP-8 MOSFETs have a smaller footprint and a
lower profile than LITTLE FOOT SOICs, while maintaining low
rDS(on) and high thermal performance. Vishay Siliconix has
accomplished this by putting one or two high-density MOSFET
die in a standard 8-pin TSSOP package mounted on a custom
leadframe.
THE TSSOP-8 PACKAGE
LITTLE FOOT TSSOP-8 power MOSFETs require
approximately half the PC board area of an equivalent LITTLE
FOOT device (Figure 1). In addition to the reduction in board
area, the package height has been reduced to 1.1 mm.
This is the low profile demanded by applications such as
PCMCIA cards.
It reduces the power package to the same height as many
resistors and capacitors in 0805 and 0605 sizes. It also allows
placement on the “passive” side of the PC board.
The standard pinouts of the LITTLE FOOT TSSOP-8
packages have been changed from the standard established
by LITTLE FOOT. This change minimizes the contribution of
interconnection resistance to rDS(on) and maximizes the
transfer of heat out of the package.
Figure 2 shows the pinouts for a single-die TSSOP. Notice that
both sides of the package have Source and Drain
connections, whereas LITTLE FOOT has the Source and Gate
connections on one side of the package, and the Drain
connections are on the opposite side.
Drain
Drain
Source
Source
Source
Source
Gate
Figure 2.
Top View
Drain
Pinouts for Single Die TSSOP
Figure 3 shows the standard pinouts for a dual-die TSSOP-8.
In this case, the connections for each individual MOSFET
occupy one side.
Drain 1
Side View
Drain 2
Source 1
Source 2
Source 1
Source 2
Gate 1
Figure 1.
An TSSOP-8 Package Next to a SOIC-8 Package
with Views from Both Top and Side
Document Number: 70571
12-Dec-03
Figure 3.
Gate 2
Pinouts for Dual-Die TSSOP
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AN1001
Vishay Siliconix
Because the TSSOP has a fine pitch foot print, the pad layout
is somewhat more demanding than the layout of the SOIC.
Careful attention must be paid to silkscreen-to-pad and
soldermask-to-pad clearances. Also, fiduciary marks may be
required. The design and spacing of the pads must be dealt
with carefully. The pads must be sized to hold enough solder
paste to form a good joint, but should not be so large or so
placed as to extend under the body, increasing the potential for
solder bridging. The pad pattern should allow for typical pick
and place errors of 0.25 mm. See Application Note 826,
Recommended Minimum Pad Patterns With Outline
Drawing Access
for
Vishay
Siliconix
MOSFETs,
(http://www.vishay.com/doc?72286), for the recommended
pad pattern for PC board layout.
THERMAL ISSUES
LITTLE FOOT TSSOP MOSFETs have been given thermal
ratings using the same methods used for LITTLE FOOT. The
maximum thermal resistance junction-to-ambient is 83_C/W
for the single die and 125_C/W for dual-die parts. TSSOP relies
on a leadframe similar to LITTLE FOOT to remove heat from
the package. The single- and dual-die leadframes are shown
in Figure 4.
Figure 5.
The actual test is based on dissipating a known amount of
power in the device for a known period of time so the junction
temperature is raised to 150_C. The starting and ending
junction temperatures are determined by measuring the
forward drop of the body diode. The thermal resistance for that
pulse width is defined by the temperature rise of the junction
above ambient and the power of the pulse, DTja/P.
Figure 6 shows the single pulse power curve of the Si6436DQ
laid over the curve of the Si9936DY to give a comparison of the
thermal performance. The die in the two devices have
equivalent die areas, making this a comparison of the
packaging. This comparison shows that the TSSOP package
performs as well as the SOIC out to 150 ms, with long-term
performance being 0.5 W less. Although the thermal
performance is less, LITTLE FOOT TSSOP will operate in a
large percentage of applications that are currently being
served by LITTLE FOOT.
14.0
12.0
a) 8-Pin Single-Pad TSSOP
Power (W)
10.0
8.0
6.0
Si9936
4.0
Si6436
2.0
0.0
0.1
b) 8-Pin Dual-Pad TSSOP
Figure 4.
Leadframe
The MOSFETs are characterized using a single pulse power
test. For this test the device mounted on a one-square-inch
piece of copper clad FR-4 PC board, such as those shown in
Figure 5. The single pulse power test determines the
maximum amount of power the part can handle for a given
pulse width and defines the thermal resistance
junction-to-ambient. The test is run for pulse widths ranging
from approximately 10 ms to 100 seconds. The thermal
resistance at 30 seconds is the rated thermal resistance for the
part. This rating was chosen to allow comparison of packages
and leadframes. At longer pulse widths, the PC board thermal
charateristics become dominant, making all parts look the
same.
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2
Figure 6.
1
Time (Sec.)
10
100
Comparison of Thermal Performance
CONCLUSION
TSSOP power MOSFETs provide a significant reduction in PC
board footprint and package height, allowing reduction in
board size and application where SOICs will not fit. This is
accomplished using a standard IC package and a custom
leadframe, combining small size with good power handling
capability.
For the TSSOP-8 package outline visit:
http://www.vishay.com/doc?71201
For the SOIC-8 package outline visit:
http://www.vishay.com/doc?71192
Document Number: 70571
12-Dec-03
AN806
Vishay Siliconix
Mounting LITTLE FOOTR TSSOP-8 Power MOSFETs
Wharton McDaniel
Surface-mounted LITTLE FOOT power MOSFETs use integrated
circuit and small-signal packages which have been been modified
to provide the heat transfer capabilities required by power devices.
Leadframe materials and design, molding compounds, and die
attach materials have been changed, while the footprint of the
packages remains the same.
See Application Note 826, Recommended Minimum Pad
Patterns With Outline Drawing Access for Vishay Siliconix
MOSFET, (http://www.vishay.com/doc?72286), for the basis
of the pad design for a LITTLE FOOT TSSOP-8 power MOSFET
package footprint. In converting the footprint to the pad set for a
power device, designers must make two connections: an electrical
connection and a thermal connection, to draw heat away from the
package.
In the case of the TSSOP-8 package, the thermal connections
are very simple. Pins 1, 5, and 8 are the drain of the MOSFET
for a single MOSFET package and are connected together. In
the dual package, pins 1 and 8 are the two drains. For a
small-signal device or integrated circuit, typical connections
would be made with traces that are 0.020 inches wide. Since
the drain pins also provide the thermal connection to the
package, this level of connection is inadequate. The total
cross section of the copper may be adequate to carry the
current required for the application, but it presents a large
thermal impedance. Also, heat spreads in a circular fashion
from the heat source. In this case the drain pins are the heat
sources when looking at heat spread on the PC board.
0.284
7.6
0.032
0.8
0.026
0.66
0.018
0.45
0.073
1.78
0.122
3.1
The pad patterns with copper spreading for the single-MOSFET
TSSOP-8 (Figure 1) and dual-MOSFET TSSOP-8 (Figure 2)
show the starting point for utilizing the board area available for the
heat-spreading copper. To create this pattern, a plane of copper
overlies the drain pins. The copper plane connects the drain pins
electrically, but more importantly provides planar copper to draw
heat from the drain leads and start the process of spreading the
heat so it can be dissipated into the ambient air. These patterns
use all the available area underneath the body for this purpose.
0.284
7.6
0.032
0.8
0.026
0.66
0.018
0.45
0.073
1.78
0.122
3.1
0.091
1.65
FIGURE 2. Dual MOSFET TSSOP-8 Pad Pattern with
Copper Spreading
Since surface-mounted packages are small, and reflow soldering
is the most common way in which these are affixed to the PC
board, “thermal” connections from the planar copper to the pads
have not been used. Even if additional planar copper area is used,
there should be no problems in the soldering process. The actual
solder connections are defined by the solder mask openings. By
combining the basic footprint with the copper plane on the drain
pins, the solder mask generation occurs automatically.
A final item to keep in mind is the width of the power traces. The
absolute minimum power trace width must be determined by the
amount of current it has to carry. For thermal reasons, this
minimum width should be at least 0.020 inches. The use of wide
traces connected to the drain plane provides a low impedance
path for heat to move away from the device.
0.118
3.54
FIGURE 1. Single MOSFET TSSOP-8 Pad
Pattern with Copper Spreading
Document Number: 70738
17-Dec-03
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1
Application Note 826
Vishay Siliconix
RECOMMENDED MINIMUM PADS FOR TSSOP-8
0.092
(2.337)
0.026
(4.623)
(1.016)
0.182
0.040
(6.655)
0.262
(0.660)
0.014
0.012
(0.356)
(0.305)
Recommended Minimum Pads
Dimensions in Inches/(mm)
Return to Index
Return to Index
APPLICATION NOTE
Document Number: 72611
Revision: 21-Jan-08
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Document Number: 91000
Revision: 11-Mar-11
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