SSM4532M COMPLEMENTARY N AND P-CHANNEL ENHANCEMENT-MODE POWER MOSFETS N-ch Simple drive requirement BV D2 Low on-resistance G2 S2 SO-8 50mΩ R DS(ON) D2 D1 D1 Fast switching +30V DSS S1 P-ch G1 Description ID +5A BV DSS -30V RDS(ON) 70mΩ ID MOSFETs from Silicon Standard Corp. provide the designer with the best combination of fast switching, ruggedized device design, low on-resistance and costeffectiveness. -4A D2 D1 The SO-8 package is widely preferred for commercial and industrial surface mount applications and is well suited for low-voltage applications such as DC/DC converters. G2 G1 S2 S1 Absolute Maximum Ratings Symbol Parameter Rating VDS Drain-Source Voltage VGS Gate-Source Voltag I D @ TA=25°C I D @ TA=70°C Units N-channel P-channel +30 -30 V ±20 ±20 V 3 +5 -4 A 3 +4 -3.2 A +20 -20 A Continuous Drain Current Continuous Drain Current 1,4 I DM Pulsed Drain Current PD @ TA=25°C Total Power Dissipation 2.0 W Linear Derating Factor 0.016 W/°C TSTG Storage Temperature Range -55 to 150 °C TJ Operating Junction Temperature Range -55 to 150 °C Thermal Data Symbol Rthj-amb Rev.2.01 7/01/2004 Parameter Thermal Resistance Junction-ambient Max. www.SiliconStandard.com Value Unit 62.5 °C/W 1 of 11 SSM4532M N-channel Electrical Characteristics @ Tj=25oC (unless otherwise specified) Symbol Parameter Test Conditions Min. Typ. Max. Units 30 - - V BVDSS Drain-Source Breakdown Voltage ∆ BV DSS/∆ Tj Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA - 0.037 - V/°C RDS(ON) Static Drain-Source On-Resistance VGS=10V, ID=5A - - 50 mΩ VGS=4.5V, ID=4.2A - - 70 mΩ VDS=VGS, ID=250uA 1 - 3 V VDS=10V, ID=5A - 8 - S Drain-Source Leakage Current (Tj=25 C) VDS=30V, VGS=0V - - 1 uA Drain-Source Leakage Current (Tj=55oC) VDS=24V, VGS=0V - - 25 uA Gate-Source Leakage VGS=±20V - - ±100 nA ID=5A - 10.2 20 nC VGS(th) Gate Threshold Voltage gfs Forward Transconductance VGS=0V, ID=250uA o IDSS IGSS 2 Qg Total Gate Charge Qgs Gate-Source Charge VDS=10V - 1.2 - nC Qgd Gate-Drain ("Miller") Charge VGS=10V - 3.4 - nC VDS=10V - 6 12 ns 2 td(on) Turn-on Delay Time tr Rise Time ID=1A - 9 18 ns td(off) Turn-off Delay Time RG=6Ω,VGS=10V - 15 30 ns tf Fall Time RD=10Ω - 5.5 12 ns Ciss Input Capacitance VGS=0V - 240 360 pF Coss Output Capacitance VDS=25V - 145 210 pF Crss Reverse Transfer Capacitance f=1.0MHz - 55 80 pF Min. Typ. - - 1.7 A - - 20 A - 0.8 1.2 V Source-Drain Diode Symbol IS ISM VSD Parameter Test Conditions VD=VG=0V , VS=1.2V Continuous Source Current ( Body Diode ) Pulsed Source Current ( Body Diode ) 1 2 Forward On Voltage Tj=25°C, IS=1.7A, VGS=0V Max. Units Notes: 1.Pulse width limited by max. junction temperature. 2.Pulse width <300us , duty cycle <2%. 3.Surface mounted on FR4 board, t<10sec. 4.Pulse width <10us , duty cycle <1%. Rev.2.01 7/01/2004 www.SiliconStandard.com 2 of 11 SSM4532M P-channel Electrical Characteristics @ Tj=25oC (unless otherwise specified) Symbol Parameter Test Conditions Min. Typ. Max. Units -30 - - V BVDSS Drain-Source Breakdown Voltage ∆ BVDSS/∆ Tj Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=-1mA - -0.028 - V/°C RDS(ON) Static Drain-Source On-Resistance VGS=-10V, ID=-4A - - 70 mΩ VGS=-4.5V, ID=-3A - - 90 mΩ VDS=VGS, ID=-250uA -1 - -3 V VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS IGSS VGS=0V, ID=250uA VDS=-10V, ID=-4A - 5 - S o VDS=-30V, VGS=0V - - -1 uA o Drain-Source Leakage Current (Tj=55 C) VDS=-24V, VGS=0V - - -25 uA Gate-Source Leakage VGS= ± 20V - - ±100 nA Drain-Source Leakage Current (Tj=25 C) 2 Qg Total Gate Charge ID=-4A - 18.3 36 nC Qgs Gate-Source Charge VDS=-10V - 3.6 - nC Qgd Gate-Drain ("Miller") Charge VGS=-10V - 1.5 - nC VDS=-10V - 8 16 ns 2 td(on) Turn-on Delay Time tr Rise Time ID=-1A - 9 18 ns td(off) Turn-off Delay Time RG=6Ω,VGS=-10V - 21 40 ns tf Fall Time RD=10Ω - 10 20 ns Ciss Input Capacitance VGS=0V - 760 1140 pF Coss Output Capacitance VDS=-25V - 345 518 pF Crss Reverse Transfer Capacitance f=1.0MHz - 90 135 pF Min. Typ. - - -1.7 A - - -20 A - - -1.2 V Source-Drain Diode Symbol IS ISM VSD Parameter Test Conditions VD=VG=0V , VS=-1.2V Continuous Source Current ( Body Diode ) 1 Pulsed Source Current ( Body Diode ) 2 Forward On Voltage Tj=25°C, IS=-1.7A, VGS=0V Max. Units Notes: 1.Pulse width limited by max. junction temperature. 2.Pulse width <300us , duty cycle <2%. 3.Surface mounted on FR4 board, t<10sec. 4.Pulse width <10us , duty cycle <1%. Rev.2.01 7/01/2004 www.SiliconStandard.com 3 of 11 SSM4532M N-channel 50 70 T C =150 o C o T C =25 C V G =10V 60 V G =10V 40 V G =8.0V 40 ID , Drain Current (A) ID , Drain Current (A) 50 V G =6.0V 30 20 V G =8.0V 30 V G =6.0V 20 V G =4.0V V G =4.0V 10 V G =3.0V 10 V G =3.0V 0 0 0 1 2 3 4 5 6 7 8 9 0 V DS , Drain-to-Source Voltage (V) 2 3 4 5 6 7 V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 85 1.8 Id=5A T c =25°C I D =5A V G =10V 1.6 Normalized RDS(ON) 75 RDSON (mΩ ) 1 65 55 1.4 1.2 1.0 45 0.8 35 0.6 3 4 5 6 7 8 9 10 V GS (V) -50 0 50 100 150 T j , Junction Temperature ( o C) Fig 3. On-Resistance vs. Gate Voltage Rev.2.01 7/01/2004 11 Fig 4. Normalized On-Resistance vs. Junction Temperature www.SiliconStandard.com 4 of 11 SSM4532M N-channel 3 6 5 2 PD (W) ID , Drain Current (A) 4 3 1 2 1 0 0 25 50 75 100 125 0 150 50 100 150 T c ,Case Temperature ( o C) T c , Case Temperature ( o C) Fig 5. Maximum Drain Current vs. Fig 6. Typical Power Dissipation Case Temperature 1 100 Normalized Thermal Response (Rthja) DUTY=0.5 ID (A) 10 10us 1 0.1 0.1 0.05 0.02 0.01 P DM 0.01 100us 1ms T c =25 o C Single Pulse 0.2 t T SINGLE PULSE Duty factor = t/T Peak Tj = PDM x Rthja + Ta 10ms 100ms 0.001 0.1 0.1 1 10 100 Fig 7. Maximum Safe Operating Area Rev.2.01 7/01/2004 0.0001 0.001 0.01 0.1 1 10 100 1000 t , Pulse Width (s) V DS (V) Fig 8. Effective Transient Thermal Impedance www.SiliconStandard.com 5 of 11 SSM4532M N-channel 12 I D =5A V DS =10V 10 Ciss 8 C (pF) VGS , Gate to Source Voltage (V) f=1.0MHz 1000 6 Coss 100 Crss 4 2 0 10 0 2 4 6 8 10 12 1 5 9 13 17 21 25 29 V DS (V) Q G , Total Gate Charge (nC) Fig 9. Gate Charge Characteristics Fig 10. Typical Capacitance Characteristics 3 100.00 2.5 10.00 2 VGS(th) (V) IS(A) T j =150 o C T j =25 o C 1.00 1.5 1 0.10 0.5 0.01 0 0.1 0.3 0.5 0.7 0.9 1.1 1.3 Fig 11. Forward Characteristic of Rev.2.01 7/01/2004 -50 0 50 100 150 T j ,Junction Temperature ( o C) V SD (V) Reverse Diode 1.5 Fig 12. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 6 of 11 SSM4532M N-channel VDS 90% RD VDS D 0.33x RATED VDS G RG TO THE OSCILLOSCOPE 10% VGS S + VGS 10V - td(on) Fig 13. Switching Time Circuit td(off) tr tf Fig 14. Switching Time Waveform VG VDS 10V 0.33 x RATED VDS G S QG TO THE OSCILLOSCOPE D QGS QGD VGS + 1~ 3 mA I G I D Charge Fig 15. Gate Charge Circuit Rev.2.01 7/01/2004 Q Fig 16. Gate Charge Waveform www.SiliconStandard.com 7 of 11 SSM4532M P-channel 20 20 V G =-10V o T C =25 C V G =-10V T C =150 o C V G =-8.0V V G =-8.0V V G =-6.0V -ID , Drain Current (A) -ID , Drain Current (A) 15 V G =-4.0V 10 15 V G =-6.0V 10 V G =-4.0V 5 5 0 0 0 1 2 3 0 4 -V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 2 3 4 5 Fig 2. Typical Output Characteristics 90 1.8 I D =-4.0A Id=-4.0A T c =25°C 80 V G = -10V 1.6 Normalized RDS(ON) 70 RDSON (mΩ ) 1 -V DS , Drain-to-Source Voltage (V) 60 50 1.4 1.2 1 0.8 40 0.6 30 3 4 5 6 7 8 9 10 11 0 50 100 150 o T j , Junction Temperature ( C) -V GS (V) Fig 3. On-Resistance vs. Gate Voltage Rev.2.01 7/01/2004 -50 Fig 4. Normalized On-Resistance vs. Junction Temperature ww w.Sil ic onStandard .com 8 of 11 SSM4532M P-channel 3 5 2.5 2 3 PD (W) -ID , Drain Current (A) 4 1.5 2 1 1 0.5 0 0 25 50 75 100 125 0 150 50 100 150 T c ,Case Temperature ( o C) T c , Case Temperature ( o C) Fig 5. Maximum Drain Current vs. Fig 6. Typical Power Dissipation Case Temperature 1 100 Normalized Thermal Response (R thja) DUTY=0.5 -ID (A) 10 10us 100us 1 1ms T c =25 o C Single Pulse 10ms 0.1 0.1 0.05 0.02 0.01 PDM t 0.01 T SINGLE PULSE Duty factor = t/T Peak Tj = P DM x Rthja+ Ta 100ms 0.1 0.1 0.2 1 10 100 0.001 0.0001 0.001 Fig 7. Maximum Safe Operating Area Rev.2.01 7/01/2004 0.01 0.1 1 10 100 1000 t , Pulse Width (s) -V DS (V) Fig 8. Effective Transient Thermal Impedance www.SiliconStandard.com 9 of 11 SSM4532M P-channel 12 I D =-4A V DS =-10V 10 8 1000 Ciss C (pF) -VGS , Gate to Source Voltage (V) f=1.0MHz 10000 6 4 Coss Crss 100 2 0 10 0 2 4 6 8 10 12 14 16 18 20 1 5 9 13 17 21 25 29 -V DS (V) Q G , Total Gate Charge (nC) Fig 9. Gate Charge Characteristics Fig 10. Typical Capacitance Characteristics 3 100.00 2.5 10.00 2 -VGS(th) (V) -IS(A) T j =150 o C T j =25 o C 1.5 1.00 1 0.10 0.5 0.01 0 0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 -50 0 -V SD (V) Fig 11. Forward Characteristic of Reverse Diode Rev.2.01 7/01/2004 50 100 150 T j ,Junction Temperature ( o C) Fig 12. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 10 of 11 SSM4532M P-channel VDS 90% RD VDS D RG TO THE OSCILLOSCOPE 0.33 x RATED VDS G 10% S -10 V VGS VGS td(on) Fig 13. Switching Time Circuit td(off) tf tr Fig 14. Switching Time Waveform VG VDS -10V 0.33 x RATED VDS G S QG TO THE OSCILLOSCOPE D QGS QGD VGS -1~-3mA I G ID Charge Fig 15. Gate Charge Circuit Q Fig 16. Gate Charge Waveform Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 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