MOSEL V53C8129H50

MOSEL VITELIC
PRELIMINARY
V53C8129H
ULTRA-HIGH PERFORMANCE,
128K X 8 EDO PAGE MODE
CMOS DYNAMIC RAM
HIGH PERFORMANCE
35
40
45
50
Max. RAS Access Time, (tRAC)
35 ns
40 ns
45 ns
50 ns
Max. Column Address Access Time, (tCAA)
18 ns
20 ns
22 ns
24 ns
Min. Fast Page Mode With EDO Cycle Time, (t PC)
14 ns
15 ns
17 ns
19 ns
Min. Read/Write Cycle Time, (tRC)
70 ns
75 ns
80 ns
90 ns
Features
Description
■ 128K x 8-bit organization
■ RAS access time: 35, 40, 45, 50 ns
■ EDO Page Mode supports sustained I/O data
rates up to 71.5 MHz
■ Low power dissipation
• V53C8129H-50
— Operating Current: 135 mA max
— TTL Standby Current: 2.0 mA max
■ Low CMOS Standby Current: 1.0 mA max
■ Read-Modify-Write, RAS-Only Refresh,
CAS-Before-RAS Refresh capability
■ Refresh Interval: 512 cycles/8 ms
■ Available in 26/24 pin 300 mil SOJ package
The V53C8129H is a high speed 131,072 x 8 bit
CMOS dynamic random access memory. The
V53C8129H offers a combination of features: EDO
Page Mode for high data bandwidth, fast usable
speed, CMOS standby current.
All inputs and outputs are TTL compatible. Input
and output capacitances are significantly lowered to
allow increased system performance. Page Mode
with extended data out operation allows random access of up to 256 columns (x8) bits within a row with
cycle times as short as 14 ns. Because of static circuitry, the CAS clock is not in the critical timing path.
The flow-through column address latches allow address pipelining while relaxing many critical system
timing requirements for fast usable speed. These
features make the V53C8129H ideally suited for
graphics, digital signal processing and high performance peripherals.
Device Usage Chart
Operating
Temperature
Range
Package Outline
K
35
40
45
50
Std.
Temperature
Mark
0°C to 70 °C
•
•
•
•
•
•
Blank
V53C8129H Rev. 1.3 July 1997
Access Time (ns)
1
Power
V53C8129H
MOSEL VITELIC
V
5
3
C
8
1
FAMILY
2
9
H
DEVICE
PKG
.
SPEED
( t RAC)
TEMP.
PWR.
BLANK (0°C to 70°C)
K (SOJ)
Description
SOJ
Pkg.
Pin Count
K
26/24
35
40
45
50
26/24 Lead SOJ
PIN CONFIGURATION
Top View
VSS
I/O1
I/O2
I/O3
I/O4
WE
1
26
2
25
3
24
4
23
5
22
6
21
RAS
A0
A1
A2
A3
VCC
8
19
9
18
10
17
11
16
12
15
13
14
BLANK (NORMAL)
(35 ns)
(40 ns)
(45 ns)
(50 ns)
8129H-01
Pin Names
VSS
I/O8
I/O7
I/O6
I/O5
CAS
OE
A8 (Column Add. only)
A7
A6
A5
A4
A0–A8
Address Inputs (A8: Column Address only)
RAS
Row Address Strobe
CAS
Column Address Strobe
WE
Write Enable
OE
Output Enable
I/O1–I/O8
Data Input, Output
VCC
+5V Supply
VSS
0V Supply
8129H-02
Absolute Maximum Ratings*
Capacitance*
Ambient Temperature
Under Bias .............................. –10°C to +80°C
Storage Temperature (plastic) ..... –55°C to +125°C
Voltage Relative to VSS .................–1.0 V to +7.0 V
Data Output Current ..................................... 50 mA
Power Dissipation .......................................... 1.0 W
TA = 25°C, VCC = 5 V ± 10%, VSS = 0 V
Symbol
*Note: Operation above Absolute Maximum Ratings can
adversely affect device reliability.
V53C8129H Rev. 1.3 July 1997
Parameter
Typ.
Max.
Unit
CIN1
Address Input
3
4
pF
CIN2
RAS, CAS, WE, OE
4
5
pF
COUT
Data Input/Output
5
7
pF
* Note: Capacitance is sampled and not 100% tested
2
V53C8129H
MOSEL VITELIC
Block Diagram
128K x 8
OE
WE
CAS
RAS
RAS CLOCK
GENERATOR
CAS CLOCK
GENERATOR
WE CLOCK
GENERATOR
OE CLOCK
GENERATOR
VCC
VSS
I/O 1
DATA I/O BUS
I/O2
COLUMN DECODERS
Y0–Y8
I/O3
I/O
BUFFER
I/O4
I/O 5
SENSE AMPLIFIERS
I/O6
REFRESH
COUNTER
I/O7
I/O8
512 x 8
A1
•
•
•
A7
A8
V53C8129H Rev. 1.3 July 1997
X0–X7
ROW
DECODERS
A0
ADDRESS BUFFERS
AND PREDECODERS
9
256
MEMORY
ARRAY
8129H-03
3
V53C8129H
MOSEL VITELIC
DC and Operating Characteristics (1-2)
TA = 0°C to 70°C, VCC = 5 V ± 10%, VSS = 0 V, unless otherwise specified.
Symbol
Parameter
Access
Time
V53C8129H
Min.
Typ.
Max..
Unit
Test Conditions
Notes
ILI
Input Leakage Current
(any input pin)
–10
10
µA
VSS ≤ VIN ≤ VCC
ILO
Output Leakage Current
(for High-Z State)
–10
10
µA
VSS≤ VOUT ≤ VCC
RAS, CAS at VIH
ICC1
VCC Supply Current,
Operating
35
160
mA
tRC = tRC (min.)
40
150
45
145
50
135
4
mA
RAS, CAS at VIH
other inputs ≥ VSS
35
160
mA
tRC = tRC (min.)
2
40
150
45
145
50
135
35
95
mA
Minimum cycle
1, 2
40
90
45
85
50
80
ICC2
VCC Supply Current,
TTL Standby
ICC3
VCC Supply Current,
RAS-Only Refresh
ICC4
VCC Supply Current,
EDO Page Mode Operation
1, 2
ICC5
VCC Supply Current,
Standby, Output Enabled
2
mA
RAS = VIH, CAS = VIL
other inputs ≥ VSS
ICC6
VCC Supply Current,
CMOS Standby
1
mA
RAS ≥ VCC – 0.2 V,
CAS ≥ VCC – 0.2 V,
All other inputs ≥ VSS
VIL
Input Low Voltage
–1
0.8
V
3
VIH
Input High Voltage
2.4
VCC + 1
V
3
VOL
Output Low Voltage
0.4
V
IOL = 4.2 mA
VOH
Output High Voltage
V
IOH = –5 mA
V53C8129H Rev. 1.3 July 1997
2.4
4
1
V53C8129H
MOSEL VITELIC
AC Characteristics
TA = 0°C to 70°C, VCC = 5 V ±10%, VSS = 0V unless otherwise noted
AC Test conditions, input pulse levels 0 to 3V
35
40
45
50
#
JEDEC
Symbol
Symbol Parameter
1
tRL1RH1
tRAS
RAS Pulse Width
35
2
tRL2RL2
tRC
Read or Write Cycle Time
70
75
80
90
ns
3
tRH2RL2
tRP
RAS Precharge Time
25
25
25
30
ns
4
tRL1CH1
tCSH
CAS Hold Time
35
40
45
50
ns
5
tCL1CH1
tCAS
CAS Pulse Width
7
8
9
9
ns
6
tRL1CL1
tRCD
RAS to CAS Delay
16
7
tWH2CL2
tRCS
Read Command Setup Time
0
0
0
0
ns
8
tAVRL2
tASR
Row Address Setup Time
0
0
0
0
ns
9
tRL1AX
tRAH
Row Address Hold Time
6
7
8
9
ns
10
tAVCL2
tASC
Column Address Setup Time
0
0
0
0
ns
11
tCL1AX
tCAH
Column Address Hold Time
4
5
6
7
ns
12
tCL1RH1(R)
tRSH (R)
RAS Hold Time (Read Cycle)
14
14
15
15
ns
13
tCH2RL2
tCRP
CAS to RAS Precharge Time
5
5
5
5
ns
14
tCH2WX
tRCH
Read Command Hold Time Referenced
to CAS
0
0
0
0
ns
5
15
tRH2WX
tRRH
Read Command Hold Time Referenced
to RAS
0
0
0
0
ns
5
16
tOEL1RH2
tROH
RAS Hold Time Referenced to OE
8
9
10
10
ns
17
tGL1QV
tOAC
Access Time from OE
12
12
13
14
ns
18
tCL1QV
tCAC
Access Time from CAS (EDO)
12
12
13
14
ns
6, 7
19
tRL1QV
tRAC
Access Time from RAS
35
40
45
50
ns
6, 8, 9
20
tAVQV
tCAA
Access Time from Column Address
18
20
22
24
ns
6, 7, 10
21
tCL1QX
tLZ
CAS to Low-Z Output
0
ns
16
22
tCH2QZ
tHZ
Output buffer turn-off delay time
0
ns
16
23
tRL1AX
tAR
Column Address Hold Time from RAS
28
24
tRL1AV
tRAD
RAS to Column Address Delay Time
11
25
tCL1RH1(W) tRSH (W)
RAS or CAS Hold Time in Write Cycle
12
12
13
14
ns
26
tWL1CH1
tCWL
Write Command to CAS Lead Time
12
12
13
14
ns
27
tWL1CL2
tWCS
Write Command Setup Time
0
0
0
0
ns
28
tCL1WH1
tWCH
Write Command Hold Time
5
5
6
7
ns
29
tWL1WH1
tWP
Write Pulse Width
5
5
6
7
ns
30
tRL1WH1
tWCR
Write Command Hold Time from RAS
28
30
35
40
ns
31
tWL1RH1
tRWL
Write Command to RAS Lead Time
12
12
13
14
ns
V53C8129H Rev. 1.3 July 1997
Min. Max. Min. Max. Min. Max. Min. Max. Unit
5
75K
23
40
17
75K
28
0
6
0
12
18
75K
32
0
6
30
17
45
0
13
19
75K
36
0
7
35
20
50
0
8
40
23
14
Notes
ns
ns
4
ns
26
ns
11
12, 13
V53C8129H
MOSEL VITELIC
AC Characteristics (Cont’d)
35
40
45
50
#
JEDEC
Symbol
Symbol Parameter
32
tDVWL2
tDS
Data in Setup Time
0
0
0
0
ns
14
33
tWL1DX
tDH
Data in Hold Time
4
5
6
7
ns
14
34
tWL1GL2
tWOH
Write to OE Hold Time
5
6
7
8
ns
14
35
tGH2DX
tOED
OE to Data Delay Time
5
6
7
8
ns
14
36
tRL2RL2
(RMW)
tRWC
Read-Modify-Write Cycle Time
105
110
115
130
ns
37
tRL1RH1
(RMW)
tRRW
Read-Modify-Write Cycle RAS Pulse
Width
70
75
80
87
ns
38
tCL1WL2
tCWD
CAS to WE Delay
28
30
32
34
ns
12
39
tRL1WL2
tRWD
RAS to WE Delay in Read-Modify-Write
Cycle
54
58
62
68
ns
12
40
tCL1CH1
tCRW
CAS Pulse Width (RMW)
46
48
50
52
ns
41
tAVWL2
tAWD
Col. Address to WE Delay
35
38
41
42
ns
42
tCL2CL2
tPC
EDO Page Mode Read or Write Cycle
Time
14
15
17
19
ns
43
tCH2CL2
tCP
CAS Precharge Time
4
5
6
7
ns
44
tAVRH1
tCAR
Column Address to RAS Setup Time
18
20
22
24
ns
45
tCH2QV
tCAP
Access Time from Column Precharge
46
tRL1DX
tDHR
Data in Hold Time Referenced to RAS
28
30
35
40
ns
47
tCL1RL2
tCSR
CAS Setup Time CAS-before-RAS
Refresh
10
10
10
10
ns
48
tRH2CL2
tRPC
RAS to CAS Precharge Time
0
0
0
0
ns
49
tRL1CH1
tCHR
CAS Hold Time CAS-before-RAS Refresh
8
8
10
12
ns
50
tCL2CL2
(RMW)
tPCM
EDO Page Mode Read-Modify-Write
Cycle Time
58
60
65
70
ns
51
tT
tT
Transition Time (Rise and Fall)
3
52
tREF
Refresh Interval (512 Cycles)
53
tCOH
Output Hold After CAS Low
V53C8129H Rev. 1.3 July 1997
Min. Max. Min. Max. Min. Max. Min. Max. Unit
21
50
23
3
8
5
6
50
25
3
8
5
50
27
3
8
5
5
ns
50
ns
8
ms
ns
Notes
12
7
15
V53C8129H
MOSEL VITELIC
Notes:
1. ICC is dependent on output loading when the device output is selected. Specified ICC (max.) is measured with the
output open.
2. ICC is dependent upon the number of address transitions. Specified IDD (max.) is measured with a maximum of two
transitions per address cycle in EDO Page Mode.
3. Specified VIL (min.) is steady state operating. During transitions, VIL (min.) may undershoot to –1.0 V for a period
not to exceed 20 ns. All AC parameters are measured with VIL (min.) ≥ VSS and VIH (max.) ≤ VDD.
4. tRCD (max.) is specified for reference only. Operation within tRCD (max.) limits insures that tRAC (max.) and tCAA
(max.) can be met. If tRCD is greater than the specified tRCD (max.), the access time is controlled by tCAA and tCAC.
5. Either tRRH or tRCH must be satisified for a Read Cycle to occur.
6. Measured with a load equivalent to two TTL inputs and 50 pF.
7. Access time is determined by the longest of tCAA, tCAC and tCAP.
8. Assumes that tRAD ≤ tRAD (max.). If tRAD is greater than tRAD (max.), tRAC will increase by the amount that tRAD exceeds tRAD (max.).
9. Assumes that tRCD ≤ tRCD (max.). If tRCD is greater than tRCD (max.), tRAC will increase by the amount that tRCD
exceeds tRCD (max.).
10. Assumes that tRAD ≥ tRAD (max.).
11. Operation within the tRAD (max.) limit ensures that tRAC (max.) can be met. tRAD (max.) is specified as a reference
point only. If tRAD is greater than the specified tRAD (max.) limit, the access time is controlled by tCAA and tCAC.
12. tWCS, tRWD, tAWD and tCWD are not restrictive operating parameters.
13. tWCS (min.) must be satisfied in an Early Write Cycle.
14. tDS and tDH are referenced to the latter occurrence of CAS or WE.
15. tT is measured between VIH (min.) and VIL (max.). AC-measurements assume tT = 3 ns.
16. Assumes a three-state test load (5 pF and a 380 Ohm Thevenin equivalent).
17. An initial 200 µs pause and 8 RAS-containing cycles are required when exiting an extended period of bias without
clocks. An extended period of time without clocks is defined as one that exceeds the specified Refresh Interval.
V53C8129H Rev. 1.3 July 1997
7
V53C8129H
MOSEL VITELIC
Waveforms of Read Cycle
RAS
t RAS (1)
t AR (23)
VIH
t RC (2)
t RP (3)
VIL
t CRP (13)
CAS
t RSH (R)(12)
t CAS (5)
VIH
VIL
t RAH (9)
VIH
ROW ADDRESS
VIL
t CAH (11)
t ASC (10)
COLUMN ADDRESS
t RCH (14)
t CAR (44)
t RCS (7)
WE
t CRP (13)
t RAD (24)
t ASR (8)
ADDRESS
t CSH (4)
t RCD (6)
t RRH (15)
VIH
VIL
t ROH (16)
t HZ (22)
t CAA (20)
OE
t OAC (17)
VIH
VIL
t CAC (18)
t RAC (19)
I/O
t HZ (22)
t HZ (22)
VOH
VALID DATA-OUT
VOL
t LZ (21)
8129H-04
Waveforms of Early Write Cycle
RAS
t AR (23)
V IH
t CSH (4)
t RCD (6)
t RAH (9)
V IH
V IL
ROW ADDRESS
t WSR
t ASC (10)
t RWH
V IH
t CWL (26)
t WCH (28)
t WP (29)
t WCS (27)
V IL
t RWL (31)
V IH
V IL
t DS (32)
I/O
t CAR (44)
t CAH (11)
COLUMN ADDRESS
t WCR (30)
OE
t CRP (13)
V IL
t RAD (24)
WE
t RSH (W)(25)
t CAS (5)
V IH
t ASR (8)
ADDRESS
t RP (3)
V IL
t CRP (13)
CAS
t RC (2)
t RAS (1)
V IH
V IL
t DHR (46)
t DH (33)
VALID DATA-IN
HIGH-Z
8129H-05
Don’t Care
V53C8129H Rev. 1.3 July 1997
8
Undefined
V53C8129H
MOSEL VITELIC
Waveforms of OE-Controlled Write Cycle
RAS
t AR (23)
V IH
t CSH (4)
t RCD (6)
t RSH (W)(12)
t CAS (5)
V IH
t CRP (13)
V IL
t RAD (24)
t RAH (9)
t ASR (8)
ADDRESS
t RP (3)
V IL
t CRP (13)
CAS
t RC (2)
t RAS (1)
V IH
ROW ADDRESS
V IL
t CAR (44)
t CAH (11)
t ASC (10)
COLUMN ADDRESS
t CWL (26)
t RWL (31)
t WP (29)
WE
V IH
V IL
t WOH (34)
OE
V IH
V IL
t OED (35)
I/O
t DH (33)
t DS (32)
V IH
VALID DATA-IN
V IL
8129H-06
Waveforms of Read-Modify-Write Cycle
RAS
t AR (23)
VIH
t CSH (4)
t RCD (6)
t RP (3)
t RSH (W)(25)
t CRW (40)
VIH
t CRP (13)
VIL
t
t RAH (9)
t ASC (10)
t ASR (8)
ADDRESS
t RWC (36)
VIL
t CRP (13)
CAS
tRRW (37)
VIH
ROW
ADDRESS
VIL
CAH (11)
COLUMN
ADDRESS
t AWD (41)
t CWD (38)
t RAD (24)
t RWL (31)
t RWD (39)
t WP (29)
t RCS (17)
WE
t CWL (26)
VIH
VIL
t CAA (20)
t OAC (17)
OE
VIH
VIL
t OED (35)
t CAC (18)
t RAC (19)
I/O
VIH
VOH
VIL
VOL
t HZ (22)
VALID
DATA-OUT
t DH (33)
t DS (32)
VALID
DATA-IN
t LZ (21)
8129H-07
Don’t Care
V53C8129H Rev. 1.3 July 1997
9
Undefined
V53C8129H
MOSEL VITELIC
Waveforms of EDO Page Mode Read Cycle
RAS
V IH
t PC (42)
t CP (43)
V IH
t CSH (4)
t RAH (9)
t ASC (10)
ROW
ADDRESS
t CAR (44)
t ASC (10)
t CAH (11)
t CAH (11)
COLUMN
ADDRESS
COLUMN
ADDRESS
t RCH (14)
t CAH (11)
t RCS (7)
COLUMN
ADDRESS
t RCS (7)
t RCS (7)
V IL
t CAA (20)
t CAA (20)
t CAP (45)
t RRH (15)
t OAC (17)
V IH
V IL
t RAC (19)
t CAC (18)
t LZ (21)
t CAC (18)
t CAC (18)
t COH
I/O
t RCH (14)
V IH
t OAC (17)
OE
t CRP (13)
t CAS (5)
t CAS (5)
V IL
V IL
WE
t RSH (R)(12)
t CAS (5)
V IH
t ASR (8)
ADDRESS
RP (3)
t RCD (6)
V IL
t CRP (13)
CAS
t
t RAS (1)
t AR (23)
V OH
t HZ (22)
VALID
DATA OUT
V OL
t HZ (22)
t HZ (22)
t HZ (22)
VALID
DATA OUT
VALID
DATA OUT
t LZ
8129H-08
Waveforms of EDO Page Mode Write Cycle
t RP (3)
t AR (23)
RAS
t RAS (1)
V IH
V IL
t CRP (13)
t RCD (6)
CAS
t PC (42)
t CP (43)
t CAS (5)
V IH
t RSH (W)(25)
t CAS (5)
t CAS (5)
t CRP (13)
V IL
t CSH (4)
t RAH (9)
t ASC (10)
t ASR (8)
ADDRESS
V IH
ROW
ADD
V IL
t CAH (11)
t CAH (11)
COLUMN
ADDRESS
t RAD (24)
COLUMN
ADDRESS
t CWL (26)
t WCS (27)
t WCH (28)
t CAH (11)
COLUMN
ADDRESS
t CWL (26)
t WCS (27)
t WCS (27)
t CWL (26)
t WCH (28)
t RWL (31)
t WCH (28)
t WP (29)
t WP (29)
t WP (29)
WE
t CAR (44)
t ASC (10)
V IH
V IL
OE
VIH
V IL
t DH (33)
t DS (32)
I/O
V IH
V IL
VALID
DATA IN
t DH (33)
t DS (32)
VALID
DATA IN
OPEN
t DS (32)
t DH (33)
VALID
DATA IN
OPEN
8129H-09
Don’t Care
V53C8129H Rev. 1.3 July 1997
10
Undefined
V53C8129H
MOSEL VITELIC
Waveforms of EDO Page Mode Read-Write Cycle
RAS
t RAS (1)
VIH
V
IL
t CSH (4)
t RCD (6)
t PCM (50)
IH
V
t RSH (W)(25)
t CRP (13)
t CAS (5)
t CP (43)
t CAS (5)
V
CAS
t RP (3)
t CAS (5)
t RAD (24)
IL
t RAH (9)
t ASC (10)
t ASR (8)
V
ADDRESS
IH
IL
t CAH (11)
COLUMN
ADDRESS
COLUMN
ADDRESS
t RWD (39)
t RCS (7)
t CWL (26)
t CWD (38)
t CAR (44)
t ASC (10)
t CAH (11)
ROW
ADD
V
t ASC (10)
t CAH (11)
COLUMN
ADDRESS
t CWD (38)
t CWD (38)
t RWL (31)
t CWL (26)
t CWL (26)
V
WE
IH
V
IL
t CAA (20)
t OAC (17)
t WSR
t AWD (41)
t AWD (41)
t AWD (41)
t WP (29)
t WP (29)
t WP (29)
t OAC (17)
t OAC (17)
V
OE
IH
V
IL
t EMS
t EMH
t CAA (20)
t OED (35)
t CAC (18)
t RAC (19)
t CAP (43)
t CAP (43)
t CAA (20)
t OED (35)
t CAC (18)
t HZ (22)
t HZ (22)
t DH (33)
t DH (33)
t DS (32)
t DS (32)
I/O
V I/OH
OUT
V I/OL
OUT
IN
t LZ (21)
t OED (35)
t CAC (18)
t HZ (22)
t DH (33)
t DS (32)
OUT
IN
IN
8129H-10
t LZ
t LZ
Waveforms of RAS-Only Refresh Cycle
t RC (2)
RAS
t RAS (1)
V IH
t RP (3)
V IL
t CRP (13)
CAS
V IH
V IL
t ASR (8)
ADDRESS
V IH
t RAH (9)
ROW ADD
V IL
8129H-11
NOTE:
WE, OE = Don’t care
Don’t Care
V53C8129H Rev. 1.3 July 1997
11
Undefined
V53C8129H
MOSEL VITELIC
Waveforms of CAS-before-RAS Refresh Counter Test Cycle
t RAS (1)
RAS
t RP (3)
V IH
V IL
t CSR (47)
CAS
t CHR (49)
t RSH (W)(25)
t CAS (5)
t CP (43)
V IH
V IL
ADDRESS
V IH
V IL
READ CYCLE
WE
t RRH (15)
t RCH (14)
t RCS (7)
V IH
V IL
t ROH (16)
t OAC (17)
OE
V IH
V IL
t HZ (22)
t HZ (22)
t LZ (21)
I/O
V IH
DOUT
V IL
t RWL (31)
t CWL (26)
WRITE CYCLE
t WCH (28)
t WCS (27)
WE
t HZ (22)
V IH
V IL
OE
V IH
V IL
t
I/O
t DH (33)
DS (32)
V IH
D IN
V IL
8129H-12
Waveforms of CAS-before-RAS Refresh Cycle
t RC (2)
t RP (3)
RAS
V IL
t CP (43)
CAS
t RAS (1)
t RP (3)
V IH
t RPC (48)
t CSR (47)
t CHR (49)
V IH
V IL
t HZ (22)
I/O
V OH
V OL
8129H-13
NOTE: WE, OE, A 0 –A 8 = Don’t care
Don’t Care
V53C8129H Rev. 1.3 July 1997
12
Undefined
V53C8129H
MOSEL VITELIC
Waveforms of Hidden Refresh Cycle (Read)
t RC (2)
RAS
V IH
t RC (2)
tRP (3)
t RAS (1)
t AR (23)
t RAS (1)
t RP (3)
V IL
t RCD (6)
t CRP (13)
CAS
t CRP (13)
V IL
V IH
t RAD (24)
t ASC (10)
t CAH (11)
COLUMN
ADDRESS
ROW
ADD
V IL
t RCS (7)
WE
t CHR (49)
V IH
t ASR (8)
t RAH (9)
ADDRESS
t RSH (R)(12)
t RRH (15)
V IH
V IL
t CAA (20)
OE
t HZ (22)
t OAC (17)
V IH
V IL
t CAC (18)
t LZ (21)
t RAC (19)
I/O
t HZ (22)
V OH
t HZ (22)
VALID DATA
V OL
8129H-14
Waveforms of Hidden Refresh Cycle (Write)
t RC (2)
RAS
V IH
t RC (2)
t RAS (1)
t RP (3)
V IL
t RCD (6)
t CRP (13)
CAS
t RP (3)
t RAS (1)
t AR (23)
t RSH (12)
t CHR (49)
t CRP (13)
V IH
V IL
t RAD (24)
t ASC (10)
t ASR (8)
t RAH (9)
ADDRESS
V IH
V IL
ROW
ADD
COLUMN
ADDRESS
t WCH (28)
t WCS (27)
WE
OE
V IH
V IL
V IH
V IL
t DS (32)
I/O
t CAH (11)
V IH
V IL
t DH (33)
VALID DATA-IN
8129H-15
t DHR (46)
Don’t Care
V53C8129H Rev. 1.3 July 1997
13
Undefined
V53C8129H
MOSEL VITELIC
Functional Description
Refresh Cycle
The V53C8129H is a CMOS dynamic RAM optimized for high data bandwidth, low power applications. It is functionally similar to a traditional
dynamic RAM. The V53C8129H reads and writes
data by multiplexing an 17-bit address into a 8-bit
row and an 9-bit column address. The row address
is latched by the Row Address Strobe (RAS). The
column address “flows through” an internal address
buffer and is latched by the Column Address Strobe
(CAS). Because access time is primarily dependent
on a valid column address rather than the precise
time that the CAS edge occurs, the delay time from
RAS to CAS has little effect on the access time.
To retain data, 512 Refresh Cycles are required
in each 8 ms period. There are two ways to refresh
the memory:
1. By clocking each of the 512 row addresses (A0
through A8) with RAS at least once every 8 ms.
Any Read, Write, Read-Modify-Write or RASonly cycle refreshes the addressed row.
2. Using a CAS-before-RAS Refresh Cycle. If CAS
makes a transition from low to high to low after
the previous cycle and before RAS falls, CASbefore-RAS
refresh
is
activated.
The
V53C8129H uses the output of an internal 9-bit
counter as the source of row addresses and ignore external address inputs.
Memory Cycle
A memory cycle is initiated by bringing RAS low.
Any memory cycle, once initiated, must not be ended or aborted before the minimum tRAS time has expired. This ensures proper device operation and
data integrity. A new cycle must not be initiated until
the minimum precharge time tRP/tCP has elapsed.
CAS-before-RAS is a “refresh-only” mode and no
data access or device selection is allowed. Thus,
the output remains in the High-Z state during the cycle. A CAS-before-RAS counter test mode is provided to ensure reliable operation of the internal
refresh counter.
Read Cycle
Extended Data Out Page Mode
A Read cycle is performed by holding the Write
Enable (WE) signal High during a RAS/CAS operation. The column address must be held for a minimum specified by tAR. Data Out becomes valid only
when tOAC, tRAC, tCAA and tCAC are all satisifed. As
a result, the access time is dependent on the timing
relationships between these parameters. For example, the access time is limited by tCAA when tRAC,
tCAC and tOAC are all satisfied.
The V53C8129H offers fast access within a row.
Unlike ordinary fast page mode DRAM, the
V53C8129H output remains active and valid even
after CAS goes high and it will stay valid for 5ns after CAS changes low. The feature allows the
V53C8129H to CAS cycle faster than ordinary page
mode DRAM since the cycle time be short as data
access time.
The outputs are disabled at the tHZ time after
RAS and CAS are high. The tHZ time is referenced
from rising edge of RAS or CAS whichever occurs
last. In addition, high on OE input and activation of
the write-cycle will also disable the outputs.
The following equation can be used to calculate
the maximum data rate:
Write Cycle
A Write Cycle is performed by taking WE and
CAS low during a RAS operation. The column address is latched by CAS. The Write Cycle can be
WE controlled or CAS controlled depending on
whether WE or CAS falls later. Consequently, the
input data must be valid at or before the falling edge
of WE or CAS, whichever occurs last. In the CAScontrolled Write Cycle, when the leading edge of
WE occurs prior to the CAS low transition, the I/O
data pins will be in the High-Z state at the beginning
of the Write function. Ending the Write with RAS or
CAS will maintain the output in the High-Z state.
In the WE controlled Write Cycle, OE must be in
the high state and tOED must be satisfied.
V53C8129H Rev. 1.3 July 1997
256
Data Rate = ---------------------------------------t RC + 255 × t PC
14
V53C8129H
MOSEL VITELIC
Data Output Operation
Table 1. V53C8129H Data Output
Operation for Various Cycle Types
The V53C8129H Input/Output is controlled by
OE, CAS, WE and RAS. A RAS low transition enables the transfer of data to and from the selected
row address in the Memory Array. A RAS high transition disables data transfer and latches the output
data if the output is enabled. After a memory cycle
is initiated with a RAS low transition, a CAS low
transition or CAS low level enables the internal I/O
path. A CAS high transition or a CAS high level disables the I/O path and the output driver if it is enabled. A CAS low transition while RAS is high has
no effect on the I/O data path or on the output drivers. The output drivers, when otherwise enabled,
can be disabled by holding OE high. The OE signal
has no effect on any data stored in the output latches. A WE low level can also disable the output drivers when CAS is low. During a Write cycle, if WE
goes low at a time in relationship to CAS that would
normally cause the outputs to be active, it is necessary to use OE to disable the output drivers prior to
the WE low transition to allow Data In Setup Time
(tDS) to be satisfied.
Power-On
After application of the VCC supply, an initial
pause of 200 µs is required followed by a minimum
of 8 initialization cycles (any combination of cycles
containing a RAS clock). Eight initialization cycles
are required after extended periods of bias without
clocks (greater than the Refresh Interval).
During Power-On, the VCC current requirement of
the V53C8129H is dependent on the input levels of
RAS and CAS. If RAS is low during Power-On, the
device will go into an active cycle and ICC will exhibit
current transients. It is recommended that RAS and
CAS track with VCC or be held at a valid VIH during
Power-On to avoid current surges.
V53C8129H Rev. 1.3 July 1997
15
Cycle Type
I/O State
Read Cycles
Data from Addressed Memory
Cell
CAS-Controlled Write Cycle
(Early Write)
High-Z
WE-Controlled Write Cycle
(Late Write)
OE Controlled.
High OE = High-Z I/Os
Read-Modify-Write Cycles
Data from Addressed Memory
Cell
EDO Page Mode Read
Data from Addressed Memory
Cell
EDO Page Mode Write Cycle
(Early Write)
High-Z
EDO Page Mode ReadModify-Write Cycle
Data from Addressed Memory
Cell
RAS-only Refresh
High-Z
CAS-before-RAS Refresh
Cycle
Data remains as in previous
cycle
CAS-only Cycles
High-Z
V53C8129H
MOSEL VITELIC
Package Outlines
24-pin 300 mil PDIP
0.300 – 0.330
[7.62 – 8.38]
0.250 – 0.300
[6.35 – 7.62]
.180 Max.
[4.57 Max.]
1.310 Max.
[33.27 Max.]
Unit in inches [mm]
0.005 – 0.050
[0.127 – 1.27]
0.110 – 0.140
[2.79 – 3.56]
.100 Typ.
[2.54 Typ.]
.008 – .013
[.203 – .330]
0.018 – 0.024
[0.457 – 0.610]
0.320 – 0.390
[8.13 – 9.91]
0.048 – 0.065
[1.22 – 1.65]
26/24-pin 300 mil SOJ
0.332 – 0.342
[8.43 – 8.69]
0.296 – 0.304
[7.52 – 7.72]
0.665 – 0.698
[16.89 – 17.73]
0.125 – 0.135
[3.175 – 3.429]
0.082 – 0.093
[2.08 – 2.36]
0.028 Typ.
[0.711 Typ.]
V53C8129H Rev. 1.3 July 1997
0.05 Typ.
[1.27 Typ.]
0.018 Typ.
[0.457 Typ.]
0.025 Min.
[0.635 Min.]
16
0.255 – 0.275
[6.477 – 6.985]
Unit in inches [mm]
V53C8129H
MOSEL VITELIC
V53C8129H Rev. 1.3 July 1997
17
MOSEL VITELIC
WORLDWIDE OFFICES
V53C8129H
U.S.A.
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FAX: 011-886-35-792838
U.S. SALES OFFICES
NORTHWESTERN
SOUTHWESTERN
CENTRAL & SOUTHEASTERN
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PHONE: 408-433-6000
FAX: 408-433-0185
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© Copyright 1997, MOSEL VITELIC Inc.
The information in this document is subject to change without
notice.
MOSEL VITELIC makes no commitment to update or keep current the information contained in this document. No part of this
document may be copied or reproduced in any form or by any
means without the prior written consent of MOSEL-VITELIC.
MOSEL VITELIC
7/97
Printed in U.S.A.
MOSEL VITELIC subjects its products to normal quality control
sampling techniques which are intended to provide an assurance
of high quality products suitable for usual commercial applications. MOSEL VITELIC does not do testing appropriate to provide
100% product quality assurance and does not assume any liability for consequential or incidental arising from any use of its products. If such products are to be used in applications in which
personal injury might occur from failure, purchaser must do its
own quality assurance testing appropriate to such applications.
3910 N. First Street, San Jose, CA 95134-1501 Ph: (408) 433-6000 Fax: (408) 433-0952 Tlx: 371-9461