MOSEL V53C806H45

MOSEL VITELIC
PRELIMINARY
V53C806H
HIGH PERFORMANCE
1M x 8 BIT FAST PAGE MODE
CMOS DYNAMIC RAM
HIGH PERFORMANCE
40
45
50
60
Max. RAS Access Time, (tRAC)
40 ns
45 ns
50 ns
60 ns
Max. Column Address Access Time, (tCAA)
20 ns
22 ns
24 ns
30 ns
Min. Fast Page Mode Cycle Time, (tPC)
23 ns
25 ns
28 ns
40 ns
Min. Read/Write Cycle Time, (tRC)
75 ns
80 ns
90 ns
120 ns
Features
Description
■ 1M x 8-bit organization
■ Fast Page Mode for a sustained data rate of
43 MHz
■ RAS access time: 40, 45, 50, 60 ns
■ Read-Modify-Write, RAS-Only Refresh,
CAS-Before-RAS Refresh capability
■ Refresh Interval: 1024 cycle/16 ms
■ Available in 28-pin 400 mil SOJ package
■ Single +5V ±10% Power Supply
■ TTL Interface
The V53C806H is a ultra high speed 1,048,576 x
8 bit CMOS dynamic random access memory. The
V53C806H offers a combination of features: Fast
Page Mode for high data bandwidth, and Low
CMOS standby current.
All inputs and outputs are TTL compatible. Input
and output capacitances are significantly lowered to
allow increased system performance. Fast Page
Mode operation allows random access of up to
1024 x 8 bits within a row with cycle times as fast as
23 ns. Because of static circuitry, the CAS clock is
not in the critical timing path. The flow-through column address latches allow address pipelining while
relaxing many critical system timing requirements.
The V53C806H is ideally suited for graphics, digital signal processing and high-performance computing systems.
Device Usage Chart
Operating
Temperature
Range
Package Outline
K
40
45
50
60
Std.
Temperature
Mark
0°C to 70 °C
•
•
•
•
•
•
Blank
V53C806H Rev. 1.6 April 1998
Access Time (ns)
1
Power
V53C806H
MOSEL VITELIC
V
5
3
C
8
FAMILY
0
6
H
DEVICE
PKG
SPEED
( t RAC)
K (SOJ)
TEMP.
PWR.
BLANK (0¡C to 70¡C)
BLANK (NORMAL)
Description
SOJ
Pkg.
Pin Count
K
28
40
45
50
60
28-Pin SOJ
PIN CONFIGURATION
Top View
VCC
IO1
IO2
IO3
IO4
WE
RAS
1
28
2
27
3
26
4
25
5
24
6
23
7
22
NC
NC
A0
A1
A2
A3
V CC
8
21
9
20
10
19
11
18
12
17
13
16
14
15
(40 ns)
(45 ns)
(50 ns)
(60 ns)
808H-01
Pin Names
V SS
IO8
IO7
IO6
IO5
CAS
OE
A9
A8
A7
A6
A5
A4
VSS
A0–A9
Address Inputs
RAS
Row Address Strobe
CAS
Column Address Strobe
WE
Write Enable
OE
Output Enable
I/O1–I/O8
Data Input, Output
VCC
+5V Supply
VSS
0V Supply
NC
No Connect
806H-02
Absolute Maximum Ratings*
Capacitance*
TA = 25°C, VCC = 5 V ± 10%, f = 1 MHz
Ambient Temperature
Under Bias..................................–10°C to +80°C
Storage Temperature (plastic)......–55°C to +125°C
Voltage Relative to VSS .................–1.0 V to +7.0 V
Data Output Current ..................................... 50 mA
Power Dissipation.......................................... 1.4 W
*Note: Operation above Absolute Maximum Ratings can
adversely affect device reliability.
V53C806H Rev. 1.6 April 1998
Symbol
Parameter
Typ.
Max.
CIN1
Address Input
3
4
pF
CIN2
RAS, CAS, WE, OE
4
5
pF
COUT
Data Input/Output
5
7
pF
* Note: Capacitance is sampled and not 100% tested
2
Unit
V53C806H
MOSEL VITELIC
Block Diagram
1M x 8
OE
WE
CAS
RAS
RAS CLOCK
GENERATOR
CAS CLOCK
GENERATOR
WE CLOCK
GENERATOR
OE CLOCK
GENERATOR
VCC
VSS
Y0 -Y9
DATA I/O BUS
I/O1
COLUMN DECODERS
I/O2
I/O3
I/O
BUFFER
SENSE AMPLIFIERS
REFRESH
COUNTER
I/O7
I/O8
1024 x 8
•
•
•
A8
A9
V53C806H Rev. 1.6 April 1998
X 0 -X9
ROW
DECODERS
A1
ADDRESS BUFFERS
AND PREDECODERS
10
A0
1024
MEMORY
ARRAY
1024 x 1024 x 8
806H-03
3
I/O4
I/O5
I/O6
V53C806H
MOSEL VITELIC
DC and Operating Characteristics
TA = 0°C to 70°C, VCC = 5 V ± 10%, VSS = 0 V, unless otherwise specified.
Symbol
Parameter
ILI
Input Leakage Current
(any input pin)
ILO
Output Leakage Current
(for High-Z State)
ICC1
VCC Supply Current,
Operating
ICC2
VCC Supply Current,
TTL Standby
ICC3
VCC Supply Current,
RAS-Only Refresh
ICC4
VCC Supply Current,
Fast Page Mode
Operation
Access
Time
V53C806H
Min.
Typ.
Max.
Unit
Test Conditions
Notes
–10
10
mA
VSS £ VIN £ VCC
–10
10
mA
VSS £ VOUT £ VCC
RAS, CAS at VIH
40
220
mA
tRC = tRC (min.)
45
210
50
200
60
190
4
mA
RAS, CAS at VIH
other inputs ³ VSS
40
220
mA
tRC = tRC (min.)
2
45
210
50
200
60
190
40
110
mA
Minimum cycle
1, 2
45
100
50
90
60
80
1, 2
ICC5
VCC Supply Current,
Standby, Output Enabled
2.0
mA
RAS = VIH, CAS = VIL
other inputs ³ VSS
ICC6
VCC Supply Current,
CMOS Standby
2.0
mA
RAS ³ VCC – 0.2 V,
CAS ³ VCC– 0.2 V,
All other inputs ³ VSS
VCC
Supply Voltage
4.5
5.5
V
VIL
Input Low Voltage
–1
0.8
V
3
VIH
Input High Voltage
2.4
VCC + 1
V
3
VOL
Output Low Voltage
0.4
V
IOL = 4.2 mA
VOH
Output High Voltage
V
IOH = –5 mA
V53C806H Rev. 1.6 April 1998
5.0
2.4
4
1
V53C806H
MOSEL VITELIC
AC Characteristics
TA = 0°C to 70°C, VCC = 5 V ±10%, VSS = 0V unless otherwise noted
AC Test conditions, input pulse levels 0 to 3V
40
#
Symbol
Parameter
1
tRAS
2
45
50
60
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Unit
RAS Pulse Width
40
75K
45
75K
50
75K
60
75K
ns
tRC
Read or Write Cycle Time
75
80
90
110
ns
3
tRP
RAS Precharge Time
25
25
30
40
ns
4
tCSH
CAS Hold Time
40
45
50
60
ns
5
tCAS
CAS Pulse Width
12
13
14
15
ns
6
tRCD
RAS to CAS Delay
17
7
tRCS
Read Command Setup Time
0
0
0
0
ns
8
tASR
Row Address Setup Time
0
0
0
0
ns
9
tRAH
Row Address Hold Time
7
8
9
10
ns
10
tASC
Column Address Setup Time
0
0
0
0
ns
11
tCAH
Column Address Hold Time
5
6
7
10
ns
12
tRSH (R)
RAS Hold Time (Read Cycle)
12
13
14
15
ns
13
tCRP
CAS to RAS Precharge Time
5
5
5
5
ns
14
tRCH
Read Command Hold Time
Referenced to CAS
0
0
0
0
ns
5
15
tRRH
Read Command Hold Time
Referenced to RAS
0
0
0
0
ns
5
16
tROH
RAS Hold Time Referenced to OE
8
9
10
10
ns
17
tOAC
Access Time from OE
12
13
14
17
ns
18
tCAC
Access Time from CAS
12
13
14
17
ns
6, 7
19
tRAC
Access Time from RAS
40
45
50
60
ns
6, 8, 9
20
tCAA
Access Time from Column Address
20
22
24
30
ns
6, 7, 10
21
tLZ
CAS to Low-Z Output
0
ns
16
22
tHZ
Output buffer turn-off delay time
0
ns
16
23
tAR
Column Address Hold Time
from RAS
30
24
tRAD
RAS to Column Address
12
28
18
32
0
6
0
13
36
0
7
35
20
19
0
14
43
0
8
40
23
20
0
10
45
26
15
Notes
ns
4
ns
30
ns
11
Delay Time
25
tRSH (W)
RAS or CAS Hold Time in Write
Cycle
12
13
14
15
ns
26
tCWL
Write Command to CAS Lead Time
12
13
14
15
ns
27
tWCS
Write Command Setup Time
0
0
0
0
ns
28
tWCH
Write Command Hold Time
5
6
7
10
ns
29
tWP
Write Pulse Width
5
6
7
10
ns
V53C806H Rev. 1.6 April 1998
5
12, 13
V53C806H
MOSEL VITELIC
AC Characteristics (Cont’d)
40
Max.
Min.
50
Symbol
Parameter
30
tWCR
Write Command Hold Time
from RAS
30
35
40
45
ns
31
tRWL
Write Command to RAS Lead Time
12
13
14
15
ns
32
tDS
Data in Setup Time
0
0
0
0
ns
14
33
tDH
Data in Hold Time
5
6
7
10
ns
14
34
tWOH
Write to OE Hold Time
6
7
8
10
ns
14
35
tOED
OE to Data Delay Time
6
7
8
10
ns
14
36
tRWC
Read-Modify-Write Cycle Time
110
115
130
170
ns
37
tRRW
Read-Modify-Write Cycle RAS Pulse
Width
75
80
87
105
ns
38
tCWD
CAS to WE Delay
30
32
34
40
ns
12
39
tRWD
RAS to WE Delay in Read-ModifyWrite Cycle
58
62
68
85
ns
12
40
tCRW
CAS Pulse Width (RMW)
48
50
52
65
ns
41
tAWD
Col. Address to WE Delay
38
41
42
58
ns
42
tPC
Fast Page Mode
Read or Write Cycle Time
23
25
28
40
ns
43
tCP
CAS Precharge Time
5
6
7
8
ns
44
tCAR
Column Address to RAS Setup
Time
20
22
24
30
ns
45
tCAP
Access Time from Column
Precharge
46
tDHR
Data in Hold Time Referenced
to RAS
30
35
40
50
ns
47
tCSR
CAS Setup Time CAS-before-RAS
Refresh
10
10
10
10
ns
48
tRPC
RAS to CAS Precharge Time
0
0
0
0
ns
49
tCHR
CAS Hold Time CAS-before-RAS
Refresh
8
10
12
15
ns
50
tPCM
Fast Page Mode Read-Modify-Write
Cycle Time
60
65
70
85
ns
51
tT
Transition Time (Rise and Fall)
3
52
tREF
Refresh Interval (1024 Cycles)
23
50
16
6
Max.
Min.
60
#
V53C806H Rev. 1.6 April 1998
Min.
45
25
3
50
16
Max.
Min.
27
3
50
16
Max.
34
3
Unit
ns
50
ns
16
ms
Notes
12
7
15
V53C806H
MOSEL VITELIC
Notes:
1. ICC is dependent on output loading when the device output is selected. Specified ICC (max.) is measured with the
output open.
2. ICC is dependent upon the number of address transitions. Specified ICC (max.) is measured with a maximum of two
transitions per address cycle in Fast Page Mode.
3. Specified VIL (min.) is steady state operating. During transitions, VIL (min.) may undershoot to –1.0 V for a period
not to exceed 20 ns. All AC parameters are measured with VIL (min.) ³ VSS and VIH (max.) £ VCC.
4. tRCD (max.) is specified for reference only. Operation within tRCD (max.) limits insures that tRAC (max.) and tCAA
(max.) can be met. If tRCD is greater than the specified tRCD (max.), the access time is controlled by tCAA and tCAC.
5. Either tRRH or tRCH must be satisified for a Read Cycle to occur.
6. Measured with a load equivalent to two TTL inputs and 50 pF.
7. Access time is determined by the longest of tCAA, tCAC and tCAP.
8. Assumes that tRAD £ tRAD (max.). If tRAD is greater than tRAD (max.), tRAC will increase by the amount that tRAD exceeds tRAD (max.).
9. Assumes that tRCD £ tRCD (max.). If tRCD is greater than tRCD (max.), tRAC will increase by the amount that tRCD
exceeds tRCD (max.).
10. Assumes that tRAD ³ tRAD (max.).
11. Operation within the tRAD (max.) limit ensures that tRAC (max.) can be met. tRAD (max.) is specified as a reference
point only. If tRAD is greater than the specified tRAD (max.) limit, the access time is controlled by tCAA and tCAC.
12. tWCS, tRWD, tAWD and tCWD are not restrictive operating parameters.
13. tWCS (min.) must be satisfied in an Early Write Cycle.
14. tDS and tDH are referenced to the latter occurrence of CAS or WE.
15. tT is measured between VIH (min.) and VIL (max.). AC-measurements assume tT = 3 ns .
16.
Assumes a three-state test load (5 pF and a 380 Ohm Thevenin equivalent).
17. An initial 200 ms pause and 8 RAS-containing cycles are required when exiting an extended period of bias without
clocks. An extended period of time without clocks is defined as one that exceeds the specified Refresh Interval.
V53C806H Rev. 1.6 April 1998
7
V53C806H
MOSEL VITELIC
Waveforms of Read Cycle
RAS
t RAS (1)
t AR (23)
VIH
t RC (2)
t RP (3)
VIL
t CRP (13)
CAS
t RSH (R)(12)
t CAS (5)
VIH
VIL
t RAH (9)
VIH
ROW ADDRESS
VIL
t CAH (11)
t ASC (10)
COLUMN ADDRESS
t RCH (14)
t CAR (44)
t RCS (7)
WE
t CRP (13)
t RAD (24)
t ASR (8)
ADDRESS
t CSH (4)
t RCD (6)
t RRH (15)
VIH
VIL
t ROH (16)
t HZ (22)
t CAA (20)
OE
t OAC (17)
VIH
VIL
t CAC (18)
t RAC (19)
I/O
t HZ (22)
t HZ (22)
VOH
VALID DATA-OUT
VOL
t LZ (21)
806H-04
Waveforms of Early Write Cycle
RAS
t AR (23)
V IH
t CSH (4)
t RCD (6)
t RAH (9)
V IH
V IL
ROW ADDRESS
t ASC (10)
t CWL (26)
t WCH (28)
t WP (29)
t WCS (27)
V IH
V IL
t RWL (31)
V IH
V IL
t DS (32)
I/O
t CAR (44)
t CAH (11)
COLUMN ADDRESS
t WCR (30)
OE
t CRP (13)
V IL
t RAD (24)
WE
t RSH (W)(25)
t CAS (5)
V IH
t ASR (8)
ADDRESS
t RP (3)
V IL
t CRP (13)
CAS
t RC (2)
t RAS (1)
V IH
V IL
t DHR (46)
t DH (33)
VALID DATA-IN
HIGH-Z
806H-05
Don’t Care
V53C806H Rev. 1.6 April 1998
8
Undefined
V53C806H
MOSEL VITELIC
Waveforms of OE-Controlled Write Cycle
RAS
t AR (23)
V IH
t CSH (4)
t RCD (6)
t RSH (W)(12)
t CAS (5)
V IH
t CRP (13)
V IL
t RAD (24)
t RAH (9)
t ASR (8)
ADDRESS
t RP (3)
V IL
t CRP (13)
CAS
t RC (2)
t RAS (1)
V IH
ROW ADDRESS
V IL
t CAR (44)
t CAH (11)
t ASC (10)
COLUMN ADDRESS
t CWL (26)
t RWL (31)
t WP (29)
WE
V IH
V IL
t WOH (34)
OE
V IH
V IL
t OED (35)
I/O
t DH (33)
t DS (32)
V IH
VALID DATA-IN
V IL
806H-06
Waveforms of Read-Modify-Write Cycle
RAS
t AR (23)
VIH
t CSH (4)
t RCD (6)
t
t ASC (10)
VIH
VIL
ROW
ADDRESS
CAH (11)
COLUMN
ADDRESS
t AWD (41)
t CWD (38)
t RAD (24)
OE
t CRP (13)
VIL
t RAH (9)
WE
t RP (3)
t RSH (W)(25)
t CRW (40)
VIH
t ASR (8)
ADDRESS
t RWC (36)
VIL
t CRP (13)
CAS
tRRW (37)
t RWL (31)
t RWD (39)
t RCS (17)
t WP (29)
VIH
VIL
t CAA (20)
t OAC (17)
VIH
VIL
t OED (35)
t CAC (18)
t RAC (19)
I/O
t CWL (26)
t HZ (22)
VIH VOH
VALID
DATA-OUT
VIL VOL
t DH (33)
t DS (32)
VALID
DATA-IN
t LZ (21)
806H-07
Don’t Care
V53C806H Rev. 1.6 April 1998
9
Undefined
V53C806H
MOSEL VITELIC
Waveforms of Fast Page Mode Read Cycle
RAS
tPC (42)
tCP(43)
tCSH (4)
t RAH (9)
tCAR (44)
tASC (10)
t CAH (11)
tASC (10)
VIH
ROW
ADDRESS
COLUMN
ADDRESS
t CAH (11)
COLUMN
ADDRESS
COLUMN
ADDRESS
t RCH (14)
t CAH (11)
t RCS (7)
t RCS (7)
t RCS (7)
V IL
tCAA (20)
t CAA (20)
t CAP (45)
t OAC (17)
tRRH (15)
t OAC (17)
VIH
V IL
tHZ (22)
tRAC (19)
tCAC (18)
t LZ (21)
t CAC (18)
t CAC (18)
t HZ (22)
VOH
tHZ (22)
tHZ (22)
VALID
DATA OUT
VOL
tHZ (22)
tHZ (22)
t LZ (21)
t LZ (21)
I/O
tRCH (14)
VIH
t OAC (17)
OE
t CRP (13)
t CAS (5)
tCAS (5)
V IL
V IL
WE
tRSH (R)(12)
t CAS (5)
VIH
tASR (8)
ADDRESS
RP (3)
V IL
t RCD (6)
tCRP (13)
CAS
t
t RAS (1)
tAR (23)
VIH
VALID
DATA OUT
VALID
DATA OUT
806H-08
Waveforms of Fast Page Mode Write Cycle
tRP (3)
tAR (23)
RAS
t RAS (1)
V IH
V IL
t CRP (13)
tRCD (6)
CAS
tRSH (W)(25)
t PC (42)
t CP(43)
t CAS (5)
V IH
tCRP (13)
tCAS (5)
tCAS (5)
V IL
tCSH (4)
tRAH (9)
tCAR (44)
tASR (8)
V IH
ADDRESS
ROW
ADD
V IL
tASC (10)
tCAH (11)
tASC (10)
tCAH (11)
COLUMN
ADDRESS
tRAD (24)
COLUMN
ADDRESS
t CWL (26)
tWCS (27)
tCWL (26)
t WCS (27)
tRWL(31)
t WCH (28)
t WCH (28)
t WP(29)
t WP (29)
WE
COLUMN
ADDRESS
t CWL (26)
tWCS (27)
t WCH (28)
t CAH (11)
tWP(29)
V IH
V IL
OE
VIH
V IL
I/O
V IH
V IL
tDS (32)
tDH (33)
tDS (32)
tDH (33)
t DS (32)
VALID
DATA IN
OPEN
VALID
DATA IN
tDH (33)
VALID
DATA IN
OPEN
806H-09
Don’t Care
V53C806H Rev. 1.6 April 1998
10
Undefined
V53C806H
MOSEL VITELIC
Waveforms of Fast Page Mode Read-Write Cycle
RAS
t RASP (37)
VIH
V
IL
t CSH (4)
t RCD (6)
t PCM (50)
IH
V
t RSH (W)(25)
t CRP (13)
t CAS (5)
t CP (43)
t CAS (5)
V
CAS
t RP (3)
t CAS (5)
t RAD (24)
IL
t RAH (9)
t ASC (10)
t ASR (8)
V
ADDRESS
IH
ROW
ADD
V
IL
t ASC (10)
t CAH (11)
t CAH (11)
COLUMN
ADDRESS
t CAH (11)
COLUMN
ADDRESS
t RWD (39)
t RCS (7)
t CAR (44)
t ASC (10)
t CWL (26)
t CWD (38)
COLUMN
ADDRESS
t CWD (38)
t CWD (38)
t RWL (31)
t CWL (26)
t CWL (26)
V
WE
IH
V
IL
t CAA (20)
t OAC (17)
t AWD (41)
t AWD (41)
t AWD (41)
t WP (29)
t WP (29)
t WP (29)
t OAC (17)
t OAC (17)
V
OE
IH
V
IL
t CAA (20)
t OED (35)
t CAP (43)
t CAP (43)
t CAA (20)
t OED (35)
t CAC (18)
t CAC (18)
t RAC (19)
t HZ (22)
t HZ (22)
t DH (33)
t DH (33)
t DS (32)
t DS (32)
I/O
V I/OH
OUT
V I/OL
OUT
IN
t LZ (21)
t LZ (21)
t OED (35)
t CAC (18)
t HZ (22)
t DH (33)
t DS (32)
OUT
IN
IN
806H-10
t LZ (21)
Waveforms of RAS-Only Refresh Cycle
t RC (2)
RAS
t RAS (1)
V IH
t RP (3)
V IL
t CRP (13)
CAS
V IH
V IL
t ASR (8)
ADDRESS
V IH
t RAH (9)
ROWADDR
V IL
806H-11
NOTE:
WE, OE = Don’t care
Don’t Care
V53C806H Rev. 1.6 April 1998
11
Undefined
V53C806H
MOSEL VITELIC
Waveforms of CAS-before-RAS Refresh Counter Test Cycle
t RAS (1)
t RP (3)
V IH
RAS
V IL
t CSR (47)
t CHR (49)
t RSH (W)(25)
t CAS (5)
t CP (43)
V IH
CAS
V IL
V IH
ADDRESS
V IL
READ CYCLE
t RRH (15)
t RCH (14)
t RCS (7)
V IH
WE
V IL
t ROH (16)
t OAC (17)
V IH
OE
V IL
t HZ (22)
t HZ (22)
t LZ (21)
V IH
I/O
DOUT
V IL
t RWL (31)
t CWL (26)
WRITE CYCLE
t HZ (22)
t WCH (28)
t WCS (27)
V IH
WE
V IL
V IH
OE
V IL
t DH (33)
t DS (32)
V IH
I/O
D IN
V IL
806H-12
Waveforms of CAS-before-RAS Refresh Cycle
t RC (2)
t RP (3)
RAS
V IL
t CP (43)
CAS
t RAS (1)
t RP (3)
V IH
t RPC (48)
t CSR (47)
t CHR (49)
V IH
V IL
t HZ (22)
I/O
V OH
V OL
806H-13
NOTE: WE, OE, A 0 –A 9 = Don’t care
Don’t Care
V53C806H Rev. 1.6 April 1998
12
Undefined
V53C806H
MOSEL VITELIC
Waveforms of Hidden Refresh Cycle (Read)
t RC (2)
RAS
V IH
t RC (2)
tRP (3)
t RAS (1)
t AR (23)
t RAS (1)
t RP (3)
V IL
t RCD (6)
t CRP (13)
CAS
t CRP (13)
V IL
V IH
t RAD (24)
t ASC (10)
t CAH (11)
COLUMN
ADDRESS
ROW
ADD
V IL
t RCS (7)
WE
t CHR (49)
V IH
t ASR (8)
t RAH (9)
ADDRESS
t RSH (R)(12)
t RRH (15)
V IH
V IL
t CAA (20)
OE
t HZ (22)
t OAC (17)
V IH
V IL
t CAC (18)
t LZ (21)
t RAC (19)
I/O
t HZ (22)
V OH
t HZ (22)
VALID DATA
V OL
806H-14
Waveforms of Hidden Refresh Cycle (Write)
t RC (2)
RAS
V IH
t RC (2)
t RAS (1)
t RP (3)
V IL
t RCD (6)
t CRP (13)
CAS
t RP (3)
t RAS (1)
t AR (23)
t RSH (12)
t CHR (49)
t CRP (13)
V IH
V IL
t RAD (24)
t ASC (10)
t ASR (8)
t RAH (9)
ADDRESS
V IH
V IL
ROW
ADD
COLUMN
ADDRESS
t WCH (28)
t WCS (27)
WE
t CAH (11)
V IH
V IL
V IH
OE V IL
t DS (32)
I/O
V IH
V IL
t DH (33)
VALID DATA-IN
t DHR (46)
806H-15
Don’t Care
V53C806H Rev. 1.6 April 1998
13
Undefined
V53C806H
MOSEL VITELIC
Functional Description
Fast Page Mode Operation
The V53C806H is a CMOS dynamic RAM optimized for high data bandwidth, low power applications. It is functionally similar to a traditional
dynamic RAM. The V53C806H reads and writes
data by multiplexing an 20-bit address into a 10-bit
row and a 10-bit column address. The row address
is latched by the Row Address Strobe (RAS). The
column address “flows through” an internal address
buffer and is latched by the Column Address Strobe
(CAS). Because access time is primarily dependent
on a valid column address rather than the precise
time that the CAS edge occurs, the delay time from
RAS to CAS has little effect on the access time.
Fast Page Mode operation permits all 1024 columns within a selected row of the device to be randomly accessed at a high data rate. Maintaining
RAS low while performing successive CAS cycles
retains the row address internally and eliminates the
need to reapply it for each cycle. The column address buffer acts as a transparent or flow-through
latch while CAS is high. Thus, access begins from
the occurrence of a valid column address rather
than from the falling edge of CAS, eliminating tASC
and tT from the critical timing path. CAS latches the
address into the column address buffer and acts as
an output enable. During Fast Page Mode operation, Read, Write, Read-Modify-Write or ReadWrite-Read cycles are possible at random addresses within a row. Following the initial entry cycle into
Fast Page Mode, access is tCAA or tCAP controlled.
If the column address is valid prior to the rising edge
of CAS, the access time is referenced to the CAS
rising edge and is specified by tCAP. If the column
address is valid after the rising CAS edge, access
is timed from the occurrence of a valid address and
is specified by tCAA. In both cases, the falling edge
of CAS latches the address and enables the output.
Fast Page Mode provides a sustained data rate of
43 MHz for applications that require high data rates
such as bit-mapped graphics or high-speed signal
processing. The following equation can be used to
calculate the maximum data rate:
Memory Cycle
A memory cycle is initiated by bringing RAS low.
Any memory cycle, once initiated, must not be ended or aborted before the minimum tRAS time has expired. This ensures proper device operation and
data integrity. A new cycle must not be initiated until
the minimum precharge time tRP/tCP has elapsed.
Read Cycle
A Read cycle is performed by holding the Write
Enable (WE) signal High during a RAS/CAS operation. The column address must be held for a minimum specified by tAR. Data Out becomes valid only
when tOAC, tRAC, tCAA and tCAC are all satisifed. As
a result, the access time is dependent on the timing
relationships between these parameters. For example, the access time is limited by tCAA when tRAC,
tCAC and tOAC are all satisfied.
1024
Data Rate = -------------------------------------------t RC + 1023 ´ t PC
Write Cycle
Data Output Operation
A Write Cycle is performed by taking WE and
CAS low during a RAS operation. The column address is latched by CAS. The Write Cycle can be
WE controlled or CAS controlled depending on
whether WE or CAS falls later. Consequently, the
input data must be valid at or before the falling edge
of WE or CAS, whichever occurs last. In the CAScontrolled Write Cycle, when the leading edge of
WE occurs prior to the CAS low transition, the I/O
data pins will be in the High-Z state at the beginning
of the Write function. Ending the Write with RAS or
CAS will maintain the output in the High-Z state.
In the WE controlled Write Cycle, OE must be in
the high state and tOED must be satisfied.
The V53C806H Input/Output is controlled by OE,
CAS, WE and RAS. A RAS low transition enables
the transfer of data to and from the selected row address in the Memory Array. A RAS high transition
disables data transfer and latches the output data if
the output is enabled. After a memory cycle is initiated with a RAS low transition, a CAS low transition
enables the internal I/O path. A CAS high transition
or RAS high transition, whichever occurs later, disables the I/O path and the output driver if it is enabled. A CAS low transition while RAS is high has
no effect on the I/O data path or on the output drivers. The output drivers, when otherwise enabled,
can be disabled by holding OE high. The OE signal
V53C806H Rev. 1.6 April 1998
14
V53C806H
MOSEL VITELIC
Power-On
has no effect on any data stored in the output latches. A WE low level can also disable the output drivers. During a Write cycle, if WE goes low at a time
when the CAS is low, it is necessary to use OE to
disable the output drivers prior to the WE low transition to allow Data In Setup Time (tDS) to be satisfied.
To retain data, 1024 Refresh Cycles are required
in each 16 ms period. There are two ways to refresh
the memory:
After application of the VCC supply, an initial
pause of 200 ms is required followed by a minimum
of 8 initialization cycles (any combination of cycles
containing a RAS clock). Eight initialization cycles
are required after extended periods of bias without
clocks (greater than the Refresh Interval).
During Power-On, the VCC current requirement of
the V53C806H is dependent on the input levels of
RAS and CAS. If RAS is low during Power-On, the
device will go into an active cycle and ICC will exhibit
current transients. It is recommended that RAS and
CAS track with VCC or be held at a valid VIH during
Power-On to avoid current surges.
1. By clocking each of the 1024 row addresses
(A0 through A9) with RAS at least once every
16 ms. Any Read, Write, Read-Modify-Write or
RAS-only cycle refreshes the addressed row.
2. Using a CAS-before-RAS Refresh Cycle. If
CAS makes a transition from low to high to low
after the previous cycle and before RAS falls,
CAS-before-RAS refresh is activated. The
V53C806H uses the output of an internal
10-bit counter as the source of row addresses
and ignore external address inputs.
Table 1. V53C806H Data Output
Operation for Various Cycle Types
CAS-before-RAS is a “refresh-only” mode and no
data access or device selection is allowed. Thus,
the output remains in the High-Z state during the cycle. A CAS-before-RAS counter test mode is provided to ensure reliable operation of the internal
refresh counter.
Data Retention Mode
The V53C806H offers a CMOS standby mode
that is entered by causing the RAS clock to swing
between a valid VIL and an “extra high” VIH within
0.2 V of VCC. While the RAS clock is at the extra
high level, the V53C806H power consumption is reduced to the low ICC6 level. Overall ICC consumption when operating in this mode can be calculated
as follows:
( t RC ) ´ ( I CC1 ) + ( t RX – t RC ) ´ ( I CC6 )
I = -----------------------------------------------------------------------------------------------t RX
Where:
tRC = Refresh Cycle Time
tRX = Refresh Interval/1024
V53C806H Rev. 1.6 April 1998
15
Cycle Type
I/O State
Read Cycles
Data from Addressed
Memory Cell
CAS-Controlled Write
Cycle (Early Write)
High-Z
WE-Controlled Write
Cycle (Late Write)
OE Controlled.
High OE = High-Z I/Os
Read-Modify-Write
Cycles
Data from Addressed
Memory Cell
Fast Page Mode Read
Data from Addressed
Memory Cell
Fast Page Mode Write Cycle
(Early Write)
High-Z
Fast Read-Modify-Write
Cycle
Data from Addressed
Memory Cell
RAS-only Refresh
High-Z
CAS-before-RAS
Refresh Cycle
Data remains as in previous
cycles
CAS-only Cycles
High-Z
V53C806H
MOSEL VITELIC
Package Diagrams
28-Pin Plastic SOJ
Unit in inches [mm]
1
14
+0.007
0.138 –0.006
0.028
+0.102
+0.004
0.711
–0.051
–0.002
3.51
0.043 MAX
[1.09 MAX]
0.004 [0.102]
0.05 bsc
[1.27 bsc]
V53C806H Rev. 1.6 April 1998
0.015/0.020
[0.38/0.51]
0.025 MIN
[.635 MIN]
16
+0.178
–0.154
0.370 ± 0.010
[9.40 ± 0.26]
15
0.400 ± 0.005
[10.16 ± .0.13]
28
0.440 ±0.005
[11.18 ± 0.12]
0.725 ± 0.005
[18.42 ± 0.12]
V53C806H
MOSEL VITELIC
V53C806H Rev. 1.6 April 1998
17
MOSEL VITELIC
WORLDWIDE OFFICES
V53C806H
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© Copyright 1997, MOSEL VITELIC Inc.
The information in this document is subject to change without
notice.
MOSEL VITELIC makes no commitment to update or keep current the information contained in this document. No part of this
document may be copied or reproduced in any form or by any
means without the prior written consent of MOSEL-VITELIC.
MOSEL VITELIC
4/98
Printed in U.S.A.
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sampling techniques which are intended to provide an assurance
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