SILABS Si4313-B1-FM

Si4313-B1
Si4313 L OW -C O S T I S M R ECEIVER
Features





Ordering Information:
See page 44.
Pin Assignments
Si4313
Applications
Personal data logging
 Health monitors

VDD 1
20 19 18 17 16
NC 2
15 SCLK
NC 3
RX 4
12 VDD_DIG
6
7
8
9
GPIO_2
The Si4313 offers a simple, single-ended radio implementation over the
240–960 MHz frequency range. A receive sensitivity of up to –118 dBm
allows for the creation of communication links with an extended range.
The Si4313 offers excellent receiver performance in cost-sensitive radio
applications.
13 SDO
NC 5
GPIO_0
The Si4313 is a single-ended universal ISM receiver for cost-sensitive
applications featuring technology developed for the EZRadioPRO®
product family.
GPIO_1
Description
14 SDI
GND
PAD
NC
Remote control
 Weather station

nSEL

nIRQ

10 11 NC
VDR

Programmable RX BW
2.6–620 kHz
Preamble detector
RX 64 byte FIFO
–40 to +85 °C temperature range
Integrated voltage regulators
Frequency hopping capability
On-chip crystal tuning
20-pin QFN package
Low BOM
Single capacitor matching network
Power-On-Reset (POR)
 Single-ended antenna
configuration
XOUT

Frequency range = 240–960 MHz 
Sensitivity = –118 dBm

Low power consumption

Data rate = 0.2 to 128 kbps
FSK, GFSK, and OOK modulation 
schemes

Power supply = 1.8 to 3.6 V

Ultra low power shutdown mode 
Digital RSSI

Wake-up timer

Auto frequency calibration (AFC) 
Clear channel assessment

XIN

SDN

Patents pending
The Si4313 provides designers with advanced features to enable low
system power consumption by offloading a number of RF-related
activities from the system MCU allowing for extended MCU sleep periods.
Additional features, such as an automatic wake-up timer, 64-byte RX
FIFO, and a preamble detection circuit, are available.
The Si4313's digital receive architecture features an ADC and DSP based
modem that performs the radio demodulation and filtering for increased
performance.
Rev. 1.0 3/11
Copyright © 2011 by Silicon Laboratories
Si4313
Si4313-B1
Functional Block Diagram
2
Rev. 1.0
Si4313-B1
TABLE O F C ONTENTS
Section
Page
1. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
1.1. Test Condition Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
2. Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.1. Application Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.2. Operating Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
3. Controller Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3.1. Serial Peripheral Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3.2. Operating Mode Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.3. Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.4. System Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3.5. Frequency Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
4. Modulation Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
4.1. Modulation Type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25
4.2. FIFO Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25
4.3. Direct Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25
5. Internal Functional Blocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
5.1. RX LNA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
5.2. RX I-Q Mixer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26
5.3. Programmable Gain Amplifier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26
5.4. ADC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
5.5. Digital Modem . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
5.6. Synthesizer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27
5.7. Crystal Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27
5.8. Regulators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
6. Data Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
6.1. RX FIFO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
6.2. Preamble Length . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
6.3. Invalid Preamble Detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
7. RX Modem Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
8. Auxiliary Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
8.1. Smart Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .32
8.2. Microcontroller Clock . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33
8.3. Low Battery Detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .34
8.4. Wake-Up Timer and 32 kHz Clock Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
8.5. GPIO Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
8.6. RSSI and Clear Channel Assessment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
9. Reference Design . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40
10. Customer Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
10.1. RX LNA Matching . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Rev. 1.0
3
Si4313-B1
11. Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
12. Pin Descriptions: Si4313 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43
13. Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
14. Package Outline: Si4313-B1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
15. Landing Pattern: 20-Pin QFN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46
16. Top Marking: 20-Pin QFN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
16.1. Top Mark Explanation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Document Change List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
Contact Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50
4
Rev. 1.0
Si4313-B1
L I S T OF F IGURES
Figure
Page
Figure 1. Application Example................................................................................................... 15
Figure 2. SPI Timing.................................................................................................................. 17
Figure 3. SPI Timing—READ Mode ..........................................................................................18
Figure 4. SPI timing—Burst Write Mode ...................................................................................18
Figure 5. SPI timing—Burst Read Mode ...................................................................................18
Figure 6. State Machine Diagram.............................................................................................. 19
Figure 7. RX Timing .................................................................................................................. 22
Figure 8. Sensitivity at 1% PER vs. Carrier Frequency Offset .................................................. 23
Figure 9. FIFO Threshold .......................................................................................................... 29
Figure 10. POR Glitch Parameters............................................................................................ 32
Figure 11. WUT Interrupt and WUT Operation.......................................................................... 37
Figure 12. RSSI Value vs. Input Power..................................................................................... 39
Figure 13. Reference Test Card................................................................................................ 40
Figure 14. 20-Pin Quad Flat No-Lead (QFN) ............................................................................45
Figure 15. 20-Pin QFN Landing Pattern.................................................................................... 46
Figure 16. Si4313 Top Marking .................................................................................................48
Rev. 1.0
5
Si4313-B1
L I S T OF TABLES
Table
Page
Table 1. DC Characteristics1 ......................................................................................................7
Table 2. Synthesizer AC Electrical Characteristics1 ...................................................................8
Table 3. Receiver AC Electrical Characteristics1 .......................................................................9
Table 4. Auxiliary Block Specifications1 ...................................................................................10
Table 5. Digital IO Specifications (SDO, SDI, SCLK, nSEL, and nIRQ)1 ................................. 11
Table 6. GPIO Specifications (GPIO_0, GPIO_1 and GPIO_2) ............................................... 12
Table 7. Absolute Maximum Ratings ........................................................................................ 13
Table 8. Operating Modes ........................................................................................................16
Table 9. Serial Interface Timing Parameters ............................................................................17
Table 10. Operating Modes Response Time ............................................................................19
Table 11. PLL Synthesizer Block Diagram ............................................................................... 27
Table 12. Minimum Receiver Settling Time .............................................................................. 30
Table 13. POR Parameters ...................................................................................................... 32
Table 14. System Clock Frequency Options ............................................................................33
Table 15. LBD ADC Range ...................................................................................................... 35
Table 16. Register Descriptions ............................................................................................... 41
Table 17. Package Dimensions ................................................................................................ 45
Table 18. PCB Land Pattern Dimensions ................................................................................. 47
6
Rev. 1.0
Si4313-B1
1. Electrical Specifications
Table 1. DC Characteristics1
Parameter
Supply
Voltage
Range
Power
Saving
Modes
Tune Mode
Current
RX Mode
Current
Symbol
Conditions
VDD
Min
Typ
Max
Units
1.8
3.0
3.6
V
ISHUTDOWN
RC Oscillator, Main Digital Regulator, and Low Power
Digital Regulator OFF2
—
15
50
nA
ISTANDBY
Low Power Digital Regulator ON
(Register values retained)
and Main Digital Regulator, and RC Oscillator OFF
—
450
800
nA
ISLEEP
RC Oscillator and Low Power Digital Regulator ON
(Register values retained) and Main Digital Regulator
OFF
—
1
—
µA
ISENSOR-LBD
Main Digital Regulator and Low Battery Detector ON,
Crystal Oscillator and all other blocks OFF2
—
1
—
µA
ISENSOR-TS
Main Digital Regulator and Temperature Sensor ON,
Crystal Oscillator and all other blocks OFF2
—
1
—
µA
IREADY
Crystal Oscillator and Main Digital Regulator ON, all
other blocks OFF. Crystal Oscillator buffer disabled
—
800
—
µA
ITUNE
Synthesizer and regulators enabled
—
8.5
—
mA
—
18.5
—
mA
IRX
Notes:
1. All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in "1.1.1. Production Test Conditions" on page 14.
2. Guaranteed by qualification. Qualification test conditions are listed in "1.1.1. Production Test Conditions" on page 14.
Rev. 1.0
7
Si4313-B1
Table 2. Synthesizer AC Electrical Characteristics1
Parameter
Symbol
Conditions
Min
Typ
Max
Units
Synthesizer
Frequency
Range
FSYNTH-LB
Low Band
240
—
480
MHz
FSYNTH-HB
High Band
480
—
960
MHz
FRES-LB
Low Band
—
156.25
—
Hz
FRES-HB
High Band
—
312.5
—
Hz
Reference
Frequency
Input Level2
fREF_LV
When using external reference signal driving
XOUT pin, instead of using
crystal. Measured peak-to-peak (VPP)
0.7
—
1.6
V
Synthesizer
Settling
Time2
tLOCK
Measured from leaving Ready mode with
XOSC running to any frequency including
VCO Calibration
—
200
—
µs
Synthesizer
Frequency
Resolution2
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in "1.1.1. Production Test Conditions" on page 14.
2. Guaranteed by qualification. Qualification test conditions are listed in "1.1.1. Production Test Conditions" on page 14.
8
Rev. 1.0
Si4313-B1
Table 3. Receiver AC Electrical Characteristics1
Parameter
Synthesizer
Frequency Range
RX Sensitivity
Symbol
Conditions
FRX
Min
Typ
Max
Units
240
—
960
MHz
PRX_2
(BER < 0.1%)
(2 kbps, GFSK, BT = 0.5,
∆f = ±5 kHz)2
—
–118
—
dBm
PRX_40
(BER < 0.1%)
(40 kbps, GFSK, BT = 0.5,
∆f = ±20 kHz)2
—
–105
—
dBm
PRX_100
(BER < 0.1%)
(100 kbps, GFSK, BT = 0.5,
∆f = ±50 kHz)2
—
–101
—
dBm
PRX_125
(BER < 0.1%)
(125 kbps, GFSK, BT = 0.5,
∆f = ±62.5 kHz)1
—
–98
—
dBm
(BER < 0.1%)
(4.8 kbps, 350 kHz BW, OOK)2
—
–107
—
dBm
(BER < 0.1%)
(40 kbps, 400 kHz BW, OOK)1
—
–99
—
dBm
PRX_OOK
RX Bandwidth2
BW
2.6
—
620
kHz
RSSI Resolution
RESRSSI
—
±0.5
—
dB
—
–31
—
dB
—
–35
—
dB
—
–40
—
dB
—
–52
—
dB
—
–56
—
dB
—
–63
—
dB
—
–30
—
dB
—
—
–54
dBm
±1-Ch Offset
Selectivity2
C/I1-CH
±2-Ch Offset
Selectivity2
C/I2-CH
≥±3-Ch Offset
Selectivity2
C/I3-CH
Blocking at 1 MHz
offset2
1MBLOCK
Blocking at 4 MHz
offset 2
4MBLOCK
Blocking at 8 MHz
offset 2
8MBLOCK
Desired Ref Signal 3 dB above
sensitivity.
Interferer and desired modulated
with
40 kbps F = 20 kHz GFSK with
BT = 0.5
Image Rejection2
ImREJ
IF = 937 kHz
Spurious Emissions2
Desired Ref Signal 3 dB above sensitivity, BER <0.1%.
Interferer and desired modulated
with
40 kbps ∆F = 20 kHz GFSK with
BT = 0.5,
channel spacing = 150 kHz
POB_RX1
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in "1.1.1. Production Test Conditions" on page 14.
2. Guaranteed by qualification. Qualification test conditions are listed in "1.1.1. Production Test Conditions" on page 14.
Rev. 1.0
9
Si4313-B1
Table 4. Auxiliary Block Specifications1
Parameter
Symbol
Low Battery Detector
Resolution2
Low Battery Detector
Conversion Time2
Conditions
Min
Typ
Max
Units
LBDRES
—
50
—
mV
LBDCT
—
250
—
µs
32.768 k
—
30 M
Hz
Configurable to 30 MHz,
15 MHz, 10 MHz, 4 MHz,
3 MHz, 2 MHz, 1 MHz, or
32.768 kHz
Microcontroller Clock
Output Frequency
FMC
30 MHz XTAL
Start-Up time
t30M
—
600
—
µs
30MRES
—
97
—
fF
t32k
—
6
—
sec
32KRCRES
—
1000
—
ppm
t32kRC
—
500
—
µs
POR Reset Time
tPOR
—
16
—
ms
Software Reset Time2
tsoft
—
100
—
µs
30 MHz XTAL
Cap Resolution2
32 kHz XTAL
Start-Up Time2
32 kHz Accuracy
using Internal RC
Oscillator2
32 kHz RC Oscillator
Start-Up
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in "1.1.1. Production Test Conditions" on page 14.
2. Guaranteed by qualification. Qualification test conditions are listed in "1.1.1. Production Test Conditions" on page 14.
10
Rev. 1.0
Si4313-B1
Table 5. Digital IO Specifications (SDO, SDI, SCLK, nSEL, and nIRQ)1
Parameter
Symbol
Conditions
Min
Typ
Max
Units
Rise Time2
TRISE
0.1 x VDD to 0.9 x VDD, CL = 5 pF
—
—
8
ns
Fall Time2
TFALL
0.9 x VDD to 0.1 x VDD, CL = 5 pF
—
—
8
ns
Input Capacitance2
CIN
—
—
1
pF
Logic High Level
Input Voltage2
VIH
VDD–0.6
—
—
V
Logic Low Level
Input Voltage2
VIL
—
—
0.6
V
Input Current2
IIN
0<VIN< VDD
–100
—
100
nA
Logic High Level
Output Voltage2
VOH
IOH<1 mA source, VDD = 1.8 V
VDD–0.6
—
—
V
Logic Low Level
Output Voltage2
VOL
IOL<1 mA sink, VDD = 1.8 V
—
—
0.6
V
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in "1.1.1. Production Test Conditions" on page 14.
2. Guaranteed by qualification. Qualification test conditions are listed in "1.1.1. Production Test Conditions" on page 14.
Rev. 1.0
11
Si4313-B1
Table 6. GPIO Specifications (GPIO_0, GPIO_1 and GPIO_2)
Parameter
Symbol
Conditions
Min
Typ
Max
Units
Rise Time2
TRISE
0.1 x VDD to 0.9 x VDD,
CL = 10 pF, DRV<1:0> = HH
—
—
8
ns
Fall Time2
TFALL
0.9 x VDD to 0.1 x VDD,
CL = 10 pF, DRV<1:0> = HH
—
—
8
ns
Input Capacitance2
CIN
—
—
1
pF
Logic High Level
Input Voltage2
VIH
VDD–0.6
—
—
V
Logic Low Level
Input Voltage2
VIL
—
—
0.6
V
Input Current2
IIN
0<VIN< VDD
–100
—
100
nA
Input Current
if pull-up activated2
IINP
VIL = 0 V
5
—
25
µA
IOMAXLL
DRV<1:0> = LL
0.1
0.5
0.8
mA
IOMAXLH
DRV<1:0> = HL
0.9
2.3
3.5
mA
IOMAXHL
DRV<1:0> = HL
1.5
3.1
4.8
mA
IOMAXHH
DRV<1:0> = HH
1.8
3.6
5.4
mA
Logic High Level
Output Voltage2
VOH
IOH< IOmax source, VDD = 1.8 V
VDD–0.6
—
—
V
Logic Low Level
Output Voltage2
VOL
IOL< IOmax sink, VDD = 1.8 V
—
—
0.6
V
Maximum
Output Current2
Notes:
1. All specification guaranteed by production test unless otherwise noted.
2. Guaranteed by qualification. Qualification test conditions are listed in "1.1.1. Production Test Conditions" on page 14.
12
Rev. 1.0
Si4313-B1
Table 7. Absolute Maximum Ratings
Parameter
Value
Unit
VDD to GND
–0.3, +3.6
V
Voltage on Digital Control Inputs
–0.3, VDD +0.3
V
Voltage on Analog Inputs
–0.3, VDD +0.3
V
+10
dBm
–40 to +85
°C
Thermal Impedance JA
30
°C/W
Junction Temperature TJ
+125
°C
–55 to +125
°C
RX Input Power
Operating Ambient Temperature TA
Storage Temperature Range TSTG
*Note: Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These
are stress ratings only, and functional operation of the device at or beyond these ratings in the operational sections of
the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability. This is an ESD-sensitive device.
Rev. 1.0
13
Si4313-B1
1.1. Test Condition Definitions
1.1.1. Production Test Conditions






TA = +25 °C
VDD = +3.3 VDC
Sensitivity measured at 919 MHz.
External reference signal (XOUT) = 1.0 VPP at 30 MHz, centered around 0.8 VDC.
Production test schematic (unless noted otherwise).
All RF input levels refer to the pins of the Si4313 (not the RF module).
1.1.2. Qualification Test Conditions
TA = –40 to +85 °C.
 VDD = +1.8 to +3.6 VDC.
 Based upon standard reference design test cards.
 All RF input levels refer to the pins of the Si4313 (not the RF module).

14
Rev. 1.0
Si4313-B1
2. Functional Description
The Si4313 is an ISM wireless single-ended receiver with continuous frequency coverage over the entire
240–960 MHz band. The wide operating voltage range of 1.8–3.6 V and low current consumption make the Si4313
an ideal solution for low-cost, battery-powered applications.
The Si4313 receiver uses a low IF architecture with a digital modem that performs the signal demodulation. The
demodulated signal is output to the system MCU through a programmable GPIO or via the standard SPI bus by
reading the 64-byte RX FIFO.
A local oscillator (LO) is generated by an integrated VCO and  Fractional-N PLL synthesizer. The synthesizer is
designed to support configurable data rates, output frequency, frequency deviation, and Gaussian filtering at any
frequency between 240–960 MHz.
The Si4313 is designed to work with a microcontroller, crystal, and a few passives to create a very low-cost system.
Voltage regulators are integrated on-chip, which allows for a wide range of operating supply voltage conditions
from +1.8 to +3.6 V. A standard 4-pin SPI bus is used to communicate with the microcontroller. Three configurable
general-purpose I/Os are also available. Minimal antenna matching is required allowing the use of a single ac
coupling capacitor which simplifies the system design and lowers the solution cost.
2.1. Application Example
supply voltage
nSEL
16
nIRQ
17
XOUT
XIN
19
S C LK
GP3
SDI
GP4
SDO
GP5
m icrocontroller
V D D _D
12
11 N C
10
VDR
5
9
NC
13
4
GPIO2
C1
S i4313
3
8
RX
15
14
7
NC
VDD
GP1
GP2
2
GPIO1
150 pF
1
GPIO0
NC
20
VDD
18
1 uF
SDN
100 nF
6
100 pF
X1
30 M H z
C5
C4
NC
C3
C6
1 uF
VSS
Figure 1. Application Example
Rev. 1.0
15
Si4313-B1
2.2. Operating Modes
The Si4313 provides several operating modes, which can be used to optimize the power consumption of the
receive application. Depending upon the system communication protocol, an optimal trade-off between radio wake
time and power consumption can be achieved.
In general, any given operating mode may be classified as an Active mode or a Power Saving mode. Table 8
indicates which blocks are enabled (active) in each corresponding mode. With the exception of the Shutdown
mode, all can be dynamically selected by sending the appropriate commands over the SPI. An "X" in any table cell
means that the block can be independently programmed to be either ON or OFF (in that given operating mode)
without noticeably impacting current consumption. The SPI block includes the SPI interface hardware and the
register space. The 32 kHz OSC circuit block includes the 32.768 kHz RC oscillator or 32.768 kHz crystal oscillator
and wake-up timer. AUX (Auxiliary Blocks) includes the temperature sensor and low-battery detector.
Table 8. Operating Modes
Circuit Blocks
Mode
Name
Digital
LDC
SPI
32 kHz
OSC
AUX
30 MHz
XTAL
PLL
RX
IVDD
OFF
OFF
OFF
OFF
OFF
OFF
15 nA
OFF
OFF
OFF
OFF
OFF
OFF
450 nA
ON
ON
X
OFF
OFF
OFF
1 µA
ON
X
ON
OFF
OFF
OFF
1 µA
ON
X
X
ON
OFF
OFF
800 µA
ON
X
X
ON
ON
OFF
8.5 mA
ON
X
X
ON
ON
ON
18.5 mA
OFF
Shutdown
register
contents
lost
Standby
Sleep
Sensor
Ready
Tuning
Receive
16
ON
register
contents
retained
Rev. 1.0
Si4313-B1
3. Controller Interface
3.1. Serial Peripheral Interface
The Si4313 communicates with the host MCU over a standard three-wire SPI interface: SCLK, SDI, and nSEL. The
host MCU can read data from the device on the SDO output pin. An SPI transaction is a 16-bit sequence which
consists of a Read-Write (R/W) select bit followed by a 7-bit address field (ADDR) and an 8-bit data field (DATA).
The 7-bit address field supports reading from or writing to one of the 128 8-bit control registers. The R/W select bit
determines whether the SPI transaction is a read or write transaction. If R/W = 1, it signifies a WRITE transaction,
while R/W = 0 signifies a READ transaction. The contents (ADDR or DATA) are latched into the Si4313 every eight
clock cycles. Timing parameters are shown in Table 9. The SCLK rate is flexible with a maximum rate of 10 MHz.
Data
Address
MSB
SDI
LSB
RW A6 A5 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 xx xx RW A7
SCLK
nSEL
Figure 2. SPI Timing
Table 9. Serial Interface Timing Parameters
Symbol
Parameter
Min (nsec)
tCH
Clock high time
40
tCL
Clock low time
40
tDS
Data setup time
20
tDH
Data hold time
20
tDD
Output data delay time
20
tEN
Output enable time
20
tDE
Output disable time
50
tSS
Select setup time
20
tSH
Select hold time
50
tSW
Select high period
80
Diagram
SCLK
tSS
tCL
tCH
tDS tDH
tDD
tSH
tDE
SDI
SDO
tEN
tSW
nSEL
To read back data from the Si4313, the R/W bit must be set to 0 followed by the 7-bit address of the register from
which to read. The 8 bit DATA field following the 7-bit ADDR field is ignored on the SDI pin when R/W = 0. The next
eight negative edge transitions of the SCLK signal will clock out the contents of the selected register. The data read
from the selected register will be available on the SDO output pin. The READ function is shown in Figure 3. After
the READ function is completed, the SDO pin will remain at either a logic 1 or logic 0 state depending on the last
data bit clocked out (D0). When nSEL goes high, the SDO output pin will be pulled high by internal pull-up.
Rev. 1.0
17
Si4313-B1
First Bit
RW
=0
SDI
Last Bit
A6 A5 A4 A3 A2 A1 A0
D7
=X
D6
=X
D5
=X
D4
=X
D3
=X
D2
=X
D1
=X
D0
=X
SCLK
First Bit
SDO
Last Bit
D7 D6 D5 D4 D3
D2 D1 D0
nSEL
Figure 3. SPI Timing—READ Mode
The SPI interface contains a burst read/write mode, which allows for reading/writing sequential registers without
having to resend the SPI address. When the nSEL bit is held low while continuing to send SCLK pulses, the SPI
interface will automatically increment the ADDR and read from/write to the next address. An example burst write
transaction is shown in Figure 4, and a burst read is shown in Figure 5. As long as nSEL is held low, input data will
be latched into the Si4313 every eight SCLK cycles.
First Bit
SDI
RW
=1
Last Bit
A6 A5 A4 A3 A2 A1 A0
D7
=X
D6
=X
D5
=X
D4
=X
D3
=X
D2
=X
D1
=X
D0
=X
D7
=X
D6
=X
D5
=X
D4
=X
D3
=X
D2
=X
D1
=X
D0
=X
SCLK
nSEL
Figure 4. SPI timing—Burst Write Mode
First Bit
SDI
RW
=0
Last Bit
A6 A5 A4 A3 A2 A1 A0
D7
=X
D6
=X
D5
=X
D4
=X
D3
=X
D2
=X
D1
=X
D0
=X
SCLK
First Bit
SDO
D7 D6 D5 D4 D3
D2 D1 D0 D7 D6 D5 D4 D3
nSEL
Figure 5. SPI timing—Burst Read Mode
18
Rev. 1.0
D2 D1 D0
Si4313-B1
3.2. Operating Mode Control
There are three primary states in the Si4313 radio state machine: SHUTDOWN, IDLE, and RECEIVE. The
SHUTDOWN state is designed to completely shut down the radio to minimize current consumption. There are five
different configurations/options for the IDLE state that can be selected to optimize the Si4313 for the application
requirements.
"Register 07h. Operating Mode and Function Control 1" controls which operating mode/state is selected. The RX
state may be reached automatically from any of the IDLE states by setting the rxon bit in "Register 07h. Operating
Mode and Function Control 1". Table 10 shows each of the operating modes with the time required to reach RX
mode as well as the current consumption of each mode.
The Si4313 includes a low-power digital regulated supply (LPLDO), which is internally connected in parallel to the
output of the main digital regulator (and is available externally at the VR_DIG pin); this common digital supply
voltage is connected to all digital circuit blocks, including the digital modem, crystal oscillator, SPI, and register
space. The LPLDO has extremely low quiescent current consumption but limited current supply capability; it is
used only in the IDLE-STANDBY and IDLE-SLEEP modes.
SHUTDOWN
IDLE*
RX
*Five different options for IDLE
Figure 6. State Machine Diagram
Table 10. Operating Modes Response Time
State Mode
Shut Down State
Response Time to RX
Current in State/Mode (µA)
16.8 ms
15 nA
800 µs
800 µs
800 µs
200 µs
200 µs
450 nA
1 µA
1 µA
800 µA
8.5 mA
N/A
18.5 mA
Idle States
Standby Mode
Sleep Mode
Sensor Mode
Ready Mode
Tune Mode
RX State
Rev. 1.0
19
Si4313-B1
3.2.1. SHUTDOWN State
The SHUTDOWN state is the lowest current consumption state of the device with nominally less than 15 nA of
current consumption. The shutdown state may be entered by driving the SDN pin (Pin 20) high. The SDN pin
should be held low in all states except the SHUTDOWN state. In the SHUTDOWN state, the contents of the
registers are lost and there is no SPI access.
When the chip is connected to the power supply, a POR will be initiated after the falling edge of SDN.
3.2.2. IDLE State
There are fivefour different modes in the IDLE state which may be selected by "Register 07h. Operating Mode and
Function Control 1". All modes have a tradeoff between current consumption and response time to TX/RX mode.
This tradeoff is shown in Table 10. After the POR event, SWRESET, or exiting from the SHUTDOWN state the chip
will default to the IDLE-READY mode. After a POR event the interrupt registers must be read to properly enter the
SLEEP, SENSOR, or STANDBY mode and to control the 32 kHz clock correctly.
3.2.2.1. STANDBY Mode
STANDBY mode has the lowest current consumption of the five IDLE states with only the LPLDO enabled to
maintain the register values. In this mode the registers can be accessed in both read and write mode. The
STANDBY mode can be entered by writing 0h to "Register 07h. Operating Mode and Function Control 1". If an
interrupt has occurred (i.e., the nIRQ pin = 0) the interrupt registers must be read to achieve the minimum current
consumption. Additionally, the ADC should not be selected as an input to the GPIO in this mode as it will cause
excess current consumption.
3.2.2.2. SLEEP Mode
In SLEEP mode the LPLDO is enabled along with the Wake-Up-Timer, which can be used to accurately wake-up
the radio at specified intervals. See "8.4. Wake-Up Timer and 32 kHz Clock Source" on page 36 for more
information on the Wake-Up-Timer. SLEEP mode is entered by setting enwt = 1 (40h) in "Register 07h. Operating
Mode and Function Control 1". If an interrupt has occurred (i.e., the nIRQ pin = 0) the interrupt registers must be
read to achieve the minimum current consumption. Also, the ADC should not be selected as an input to the GPIO
in this mode as it will cause excess current consumption.
3.2.2.3. SENSOR Mode
In SENSOR mode the Low Battery Detector may be enabled in addition to the LPLDO and Wake-Up-Timer. The
Low Battery Detector can be enabled by setting enlbd = 1 in "Register 07h. Operating Mode and Function Control
1". See "8.3. Low Battery Detector" on page 34 for more information on this feature. If an interrupt has occurred
(i.e., the nIRQ pin = 0) the interrupt registers must be read to achieve the minimum current consumption.
3.2.2.4. READY Mode
READY Mode is designed to give a fast transition time to TXRX mode with reasonable current consumption. In this
mode the Crystal oscillator remains enabled reducing the time required to switch to TX or RX mode by eliminating
the crystal start-up time. READY mode is entered by setting xton = 1 in "Register 07h. Operating Mode and
Function Control 1". To achieve the lowest current consumption state the crystal oscillator buffer should be
disabled in “Register 62h. Crystal Oscillator Control and Test.” To exit READY mode, bufovr (bit 1) of this register
must be set back to 0.
3.2.2.5. TUNE Mode
In TUNE mode the PLL remains enabled in addition to the other blocks enabled in the IDLE modes. This will give
the fastest response to TXRX mode as the PLL will remain locked but it results in the highest current consumption.
This mode of operation is designed for frequency hopping spread spectrum systems (FHSS). TUNE mode is
entered by setting pllon = 1 in "Register 07h. Operating Mode and Function Control 1". It is not necessary to set
xton to 1 for this mode, the internal state machine automatically enables the crystal oscillator.
20
Rev. 1.0
Si4313-B1
3.2.3. RX State
The RX state may be entered from any of the Idle modes when the rxon bit is set to 1 in 'Register 07h. Operating
Mode and Function Control 1'. A built-in sequencer takes care of all the actions required to transition from one of
the IDLE modes to the RX state. The following sequence of events will occur automatically to get the chip into RX
mode when going from STANDBY mode to RX mode by setting the rxon bit:
1. Enable the main digital LDO and the Analog LDOs.
2. Start up crystal oscillator and wait until ready (controlled by internal timer).
3. Enable PLL.
4. Calibrate VCO (this action is skipped when the vcocal bit is "0", default value is "1").
5. Wait until PLL settles to required receive frequency (controlled by internal timer).
6. Enable receive circuits: LNA, mixers, and ADC.
7. Calibrate ADC (RC calibration).
8. Enable receive mode in the digital modem.
Depending on the configuration of the radio all or some of the following functions will be performed automatically by
the digital modem: AGC, AFC (optional), update status registers, bit synchronization, packet handling (optional)
including sync word, header check, and CRC.
3.2.4. Device Status
Add
R/W
Func/Description
D7
D6
D5
02
R
Device Status
ffovfl
ffunfl
D4
D3
D2
rxffem Reserved freqerr
D1
D0
cps[1]
cps[2]
POR
Def
—
The operational status of the Si4313 can be read from the Device Status register, 'Register 02h'
3.3. Interrupts
The Si4313 is capable of generating an interrupt signal when certain events occur. The chip notifies the
microcontroller that an interrupt event has occurred by setting the nIRQ output pin LOW = 0. This interrupt signal
will be generated when any one (or more) of the interrupt events (corresponding to the Interrupt Status bits) shown
below occur. The nIRQ pin will remain low until the microcontroller reads the Interrupt Status Register(s) (Registers
03h-04h) containing the active Interrupt Status bit. The nIRQ output signal will then be reset until the next change in
status is detected. The interrupts must be enabled by the corresponding enable bit in the Interrupt Enable
Registers (Registers 05h-06h). All enabled interrupt bits will be cleared when the microcontroller reads the interrupt
status register. If the interrupt is not enabled when the event then it will not trigger the nIRQ pin, but the status may
still be read at anytime in the Interrupt Status registers.
Add R/W Func/Description
D7
D6
D5
D4
D3
03
R
Interrupt Status 1
ifferr
Reserved
Reserved
irxffafull
iext
04
R
Interrupt Status 2
iswdet
ipreaval
ipreainval
irssi
iwut
05
R/W Interrupt Enable 1
enfferr
Reserved
Reserved
06
R/W Interrupt Enable 1 enswdet enpreaval enpreainval
D2
D1
Reserved Reserved
ilbd
ichiprdy
enrxffafull enext Reserved Reserved
Rev. 1.0
enrssi
enwut
enlbd
enchiprdy
D0
POR
Def
Reserved
—
ipor
—
Reserved
00h
enpor
01h
21
Si4313-B1
3.4. System Timing
Figure 7. RX Timing
The VCO will automatically calibrate at every frequency change or power-up. The PLL T0 time is to allow for bias
settling of the VCO. The PLL TS time is for the settling time of the PLL, which has a default setting of 100 µs. The
total time for PLL T0, PLL CAL, and PLL TS under all conditions is 200 µs. In certain applications, the PLL T0 time
and the PLL CAL may be skipped for faster turnaround time. Contact applications support if faster turnaround time
is desired.
3.5. Frequency Control
To calculate the necessary frequency register settings, use the Silicon Labs' Wireless Design Suite (WDS) or Excel
Calculator available from the product web page. These methods offer a simple, quick interface to determine the
correct settings based on the application requirement.
Add
R/W
Function/Description
Data
D7
POR
Default
D6
D5
D4
D3
D2
D1
D0
sbsel
hbsel
fb[4]
fb[3]
fb[2]
fb[1]
fb[0]
35h
75
R/W
Frequency Band Select
76
R/W
Nominal Carrier Frequency 1
fc[15]
fc[14]
fc[13]
fc[12]
fc[11]
fc[10]
fc[9]
fc[8]
BBh
77
R/W
Nominal Carrier Frequency 0
fc[7]
fc[6]
fc[5]
fc[4]
fc[3]
fc[2]
fc[1]
fc[0]
80h
3.5.1. Automatic State Transition for Frequency Change
If registers 79h or 7Ah are changed in RX mode, the state machine will automatically transition the chip back to
tune and change the frequency. This feature is useful to reduce the number of SPI commands required in a
Frequency Hopping System. In turn, this reduces microcontroller activity, thereby reducing current consumption.
3.5.2. Frequency Offset Adjustment
When the AFC is disabled, the frequency offset can be adjusted manually by fo[9:0] in registers 73h and 74h. The
frequency offset adjustment and the AFC are both implemented by shifting the Synthesizer Local Oscillator
frequency. This register is a signed register; so, in order to get a negative offset, it is necessary to take the twos
22
Rev. 1.0
Si4313-B1
complement of the positive offset number. The offset can be calculated with the following formula:
Desired Offset = 156.25 Hz   hbsel + 1   fo  9:0 
Desired Offset
fo  9:0  = ---------------------------------------------------------------156.25 Hz   hbsel + 1 
The adjustment range is ±160 kHz in high band and ±80 kHz in low band. For example, to compute an offset of
+50 kHz in high band mode, fo[9:0] should be set to 0A0h. For an offset of –50 kHz in high band mode, the fo[9:0]
register should be set to 360h.
Add
R/W
Func/Description
D7
D6
D5
D4
D3
D2
D1
D0
POR Def
73
R/W
Frequency Offset
fo[7]
fo[6]
fo[5]
fo[4]
fo[3]
fo[2]
fo[1]
fo[0]
00h
74
R/W
Frequency Offset
Rsvd
Rsvd
Rsvd
Rsvd
Rsvd
Rsvd
fo[9]
fo[8]
00h
3.5.3. Auto Frequency Control (AFC)
All AFC settings can be easily obtained from the excel settings calculator or by using the WDS Chip Configurator.
This is the recommended method to program all AFC settings. This section is intended to describe the operation of
the AFC in more detail to help understand the trade-offs of using AFC.The receiver supports automatic frequency
control (AFC) to compensate for frequency differences between the transmitter and receiver reference frequencies.
These differences can be caused by the absolute accuracy and temperature dependencies of the reference
crystals. Due to frequency offset compensation in the modem, the receiver is tolerant to frequency offsets up to
±0.25 times the IF bandwidth when the AFC is disabled. When the AFC is enabled, the received signal will be
centered in the pass-band of the IF filter, providing optimal sensitivity and selectivity over a wider range of
frequency offsets up to ±0.35 times the IF bandwidth. The trade-off of receiver sensitivity (at 1% PER) versus
carrier offset and the impact of AFC are illustrated in Figure 8.
Figure 8. Sensitivity at 1% PER vs. Carrier Frequency Offset
When AFC is enabled, the preamble length needs to be long enough to settle the AFC. In general, one byte of
preamble is sufficient to settle the AFC. Disabling the AFC allows the preamble to be shortened from 40 bits to 32
bits. Note that with the AFC disabled, the preamble length must still be long enough to settle the receiver and to
detect the preamble (see "6.2. Preamble Length" on page 30). The AFC corrects the detected frequency offset by
changing the frequency of the Fractional-N PLL. When the preamble is detected, the AFC will freeze for the
remainder of the packet. The AFC loop includes a bandwidth limiting mechanism improving the rejection of out of
band signals. When the AFC loop is enabled, its pull-in-range is determined by the bandwidth limiter value
Rev. 1.0
23
Si4313-B1
(AFCLimiter) which is located in register 2Ah.
AFC_pull_in_range = ±AFCLimiter[7:0] x (hbsel+1) x 625 Hz
The AFC Limiter register is an unsigned register and its value can be obtained from the EZRadioPRO Register
Calculator spreadsheet or from WDS.
The amount of error correction feedback to the Fractional-N PLL before the preamble is detected is controlled from
afcgearh[2:0]. The default value 000 relates to a feedback of 100% from the measured frequency error and is
advised for most applications. Every bit added will half the feedback but will require a longer preamble to settle.
The AFC operates as follows. The frequency error of the incoming signal is measured over a period of two bit
times, after which it corrects the local oscillator via the Fractional-N PLL. After this correction, some time is allowed
to settle the Fractional-N PLL to the new frequency before the next frequency error is measured. The duration of
the AFC cycle before the preamble is detected can be programmed with shwait[2:0]. It is advised to use the default
value 001, which sets the AFC cycle to 4 bit times (2 for measurement and 2 for settling).
The AFC correction value may be read from register 2Bh. The value read can be converted to kHz with the
following formula:
AFC Correction = 156.25Hz x (hbsel +1) x afc_corr[7: 0]
Frequency Correction
24
RX
TX
AFC disabled
Freq Offset Register
Freq Offset Register
AFC enabled
AFC
Freq Offset Register
Rev. 1.0
Si4313-B1
4. Modulation Options
All modulation options are programmed in "Register 71h. Modulation Mode Control 2."
4.1. Modulation Type
The Si4313 can be configured to support three alternative modulation options: Gaussian Frequency Shift Keying
(GFSK), Frequency Shift Keying (FSK), and On-Off Keying (OOK). The type of modulation is selected with the
modtyp[1:0] bits in "Register 71h. Modulation Mode Control 2".
modtyp[1:0]
Modulation Source
00
Reserved
01
OOK
10
FSK
11
GFSK
4.2. FIFO Mode
In FIFO mode, the integrated FIFO is used to receive the data. The FIFO is accessed via "Register 7Fh. FIFO
Access" with burst read capability. The FIFO may be configured specific to the application packet size, etc. (see "6.
Data Handling" on page 29 for further information).
In RX mode, the preamble detection threshold and sync needs to be programmed so that the modem knows when
to start filling data into the FIFO. When the FIFO is being used, the data being loaded into or out of the FIFO can
still be observed by configuring the GPIO, which can be useful during development.
4.3. Direct Mode
In many system implementations, it may not be desirable to use a FIFO, and, for this scenario, a “Direct Mode”,
which bypasses the FIFOs entirely, is provided. In Direct Mode, the RX data and RX clock are programmed directly
to the GPIO and used by the microcontroller to process the data without using the FIFO. In direct mode, the
preamble detection threshold (Reg 35h) still needs to be programmed. Once the preamble is detected, algorithms
internal to the modem change. It is not required that the sync be programmed when direct mode is used for RX.
4.3.1. Direct Mode using SPI or nIRQ Pins
In certain applications, it may be desirable to minimize the connections to the microcontroller or to preserve the
GPIOs for other uses. For these cases, it is possible to use the SPI pins and nIRQ as the modulation clock and
data. The SDO pin can be configured to be the data clock by programming trclk = 10. If the nSEL pin is LOW, then
the function of the pin will be SPI data output. If the pin is high and trclk is 10, then, during the RX mode, the data
clock will be available on the SDO pin. If trclk[1:0] is set to 11 and no interrupts are enabled in registers 05 or 06h,
the nIRQ pin can also be used as the RX data clock.
The SDI pin can be configured to be the data source for RX if dtmod = 01. Similarly, if nSEL is LOW, the pin will
function as SPI data-in; if nSEL is HIGH, it will be the received demodulated data.
Rev. 1.0
25
Si4313-B1
5. Internal Functional Blocks
This section provides an overview of some of the key blocks of the internal radio architecture.
5.1. RX LNA
The input frequency range for the LNA is 240–960 MHz. The LNA provides gain with a noise figure low enough to
suppress the noise of the following stages. The LNA has one step of gain control that is controlled by the analog
gain control (AGC) algorithm. The AGC algorithm adjusts the gain of the LNA and PGA so the receiver can handle
signal levels from sensitivity to +5 dBm with optimal performance.
5.2. RX I-Q Mixer
The output of the LNA is fed internally to the input of the receive mixer. The receive mixer is implemented as an I-Q
mixer that provides both I and Q channel outputs to the programmable gain amplifier. The mixer consists of two
double-balanced mixers whose RF inputs are driven in parallel. Local oscillator (LO) inputs are driven in
quadrature, and separate I and Q Intermediate Frequency (IF) outputs drive the programmable gain amplifier. The
receive LO signal is supplied by an integrated VCO and PLL synthesizer operating between 240 and 960 MHz.
The necessary quadrature LO signals are derived from the divider at the VCO output.
5.3. Programmable Gain Amplifier
The Programmable Gain Amplifier (PGA) provides the necessary gain to boost the signal level into the dynamic
range of the ADC. The PGA must also have enough gain switching to allow for large input signals to ensure a
linear RSSI range up to –20 dBm. The PGA has steps of 3 dB that are controlled by the AGC algorithm in the
digital modem.
5.4. ADC
The amplified IQ IF signals are digitized using an Analog-to-Digital Converter (ADC), which allows for low current
consumption and high dynamic range. The band-pass response of the ADC provides exceptional rejection of out of
band blockers.
5.5. Digital Modem
Using high-performance ADCs allows channel filtering, image rejection, and demodulation to be performed in the
digital domain, resulting in reduced area while increasing flexibility. The digital modem performs the following
functions:
Channel selection filter
TX modulation
 RX demodulation
 AGC
 Preamble detector
 Invalid preamble detector
 Radio signal strength indicator (RSSI)
 Automatic frequency compensation (AFC)
The digital channel filter and demodulator are optimized for ultra low power consumption and are highly
configurable. Supported modulation types are GFSK, FSK, and OOK. The channel filter can be configured to
support bandwidths ranging from 620 kHz down to 2.6 kHz. A large variety of data rates are supported ranging
from 0.123 up to 256 kbps. The AGC algorithm is implemented digitally using an advanced control loop optimized
for fast response time.


The configurable preamble detector is used to improve the reliability of the sync-word detection. The sync-word
detector is only enabled when a valid preamble is detected, significantly reducing the probability of false detection.
The received signal strength indicator (RSSI) provides a measure of the signal strength received on the tuned
channel. The resolution of the RSSI is 0.5 dB. This high resolution RSSI enables accurate channel power
measurements for clear channel assessment (CCA), and carrier sense (CS), and listen before talk (LBT)
functionality.
26
Rev. 1.0
Si4313-B1
Frequency mistuning caused by crystal inaccuracies can be compensated by enabling the digital automatic
frequency control (AFC) in receive mode.
5.6. Synthesizer
An integrated Sigma Delta () Fractional-N PLL synthesizer capable of operating from 240–960 MHz is provided
on-chip. Using a  synthesizer has many advantages; it provides flexibility in choosing data rate, deviation,
channel frequency, and channel spacing.
The PLL and  modulator scheme is designed to support any desired frequency and channel spacing in the range
from 240–960 MHz with a frequency resolution of 156.25 Hz (Low band) or 312.5 Hz (High band).
Table 11. PLL Synthesizer Block Diagram
The reference frequency to the PLL is 10 MHz. The PLL utilizes a differential L-C VCO with integrated on-chip
inductors. The output of the VCO is followed by a configurable divider that divides down the signal to the desired
output frequency band. The modulus of this divider stage is controlled dynamically by the output from the 
modulator. The tuning resolution is sufficient to tune to the commanded frequency with a maximum accuracy of
312.5 Hz anywhere in the range between 240–960 MHz.
5.6.1. VCO
The output of the VCO is automatically divided down to the correct output frequency depending on the hbsel and
fb[4:0] fields in "Register 75h. Frequency Band Select". In receive mode, the LO frequency is automatically shifted
downwards by the IF frequency of 937.5 kHz, allowing receive operation on the same frequency. The VCO
integrates the resonator inductor and tuning varactor; so, no external VCO components are required.
The VCO uses a capacitance bank to cover the wide frequency range specified. The capacitance bank will
automatically be calibrated every time the synthesizer is enabled. In certain fast hopping applications, this might
not be desirable; so, the VCO calibration may be skipped by setting the appropriate register.
5.7. Crystal Oscillator
The Si4313 includes an integrated 30 MHz crystal oscillator with a fast start-up time of less than 600 µs when a
suitable parallel resonant crystal is used. The design is differential with the required crystal load capacitance
integrated on-chip to minimize the number of external components. By default, all that is required off-chip is the
30 MHz crystal.
The crystal load capacitance can be digitally programmed to accommodate crystals with various load capacitance
requirements and to adjust the frequency of the crystal oscillator. The tuning of the crystal load capacitance is
programmed through the xlc[6:0] field of "Register 09h. 30 MHz Crystal Oscillator Load Capacitance." The total
internal capacitance is 12.5 pF and is adjustable in approximately 127 steps (97fF/step). The xtalshift bit provides a
coarse shift in frequency but is not binary with xlc[6:0].
The crystal frequency adjustment can be used to compensate for crystal production tolerances. Utilizing the onchip temperature sensor and suitable control software, the temperature dependency of the crystal can be
canceled.
Rev. 1.0
27
Si4313-B1
The typical value of the total on-chip capacitance Cint can be calculated as follows:
Cint = 1.8 pF + 0.085 pF x xlc[6:0] + 3.7 pF x xtalshift
Note that the coarse shift bit xtalshift is not binary with xlc[6:0]. The total load capacitance Cload seen by the crystal
can be calculated by adding the sum of all external parasitic PCB capacitances Cext to Cint. If the maximum value
of Cint (16.3 pF) is not sufficient, an external capacitor can be added for exact tuning. Additional information on
calculating Cext and crystal selection guidelines is provided in “AN417: Si4x3x Family Crystal Oscillator.”
If AFC is disabled then the synthesizer frequency may be further adjusted by programming the Frequency Offset
field fo[9:0]in "Register 73h. Frequency Offset 1" and "Register 74h. Frequency Offset 2", as discussed in "3.5.
Frequency Control" on page 22.
The crystal oscillator frequency is divided down internally and may be output to the microcontroller through one of
the GPIO pins for use as the System Clock. In this fashion, only one crystal oscillator is required for the entire
system and the BOM cost is reduced. The available clock frequencies and GPIO configuration are discussed
further in "8.2. Microcontroller Clock" on page 33.
The Si4313 may also be driven with an external 30 MHz clock signal through the XOUT pin. When driving with an
external reference or using a TCXO, the XTAL load capacitance register should be set to 0.
Add R/W Function/Description
09
R/W
Crystal Oscillator Load
Capacitance
D7
D6
D5
D4
D3
D2
D1
D0
POR Def.
xtalshift
xlc[6]
xlc[5]
xlc[4]
xlc[3]
xlc[2]
xlc[1]
xlc[0]
7Fh
5.8. Regulators
There are a total of six regulators integrated onto the Si4313. With the exception of the digital regulator, all
regulators are designed to operate with only internal decoupling. The digital regulator requires an external 1 µF
decoupling capacitor. All regulators are designed to operate with an input supply voltage from +1.8 to +3.6 V.
A supply voltage should only be connected to the VDD pins. No voltage should be forced on the digital regulator
outputs.
28
Rev. 1.0
Si4313-B1
6. Data Handling
6.1. RX FIFO
A 64 byte FIFO is integrated into the chip for RX, as shown below. "Register 7Fh. FIFO Access" is used to access
the FIFO. As described in "3.1. Serial Peripheral Interface" on page 17, a burst read from address 7Fh will read
data from the RX FIFO.
Figure 9. FIFO Threshold
The RX FIFO has one programmable threshold called the FIFO Almost Full Threshold, rxafthr[5:0]. When the
incoming RX data reaches the Almost Full Threshold, an interrupt will be generated to the microcontroller via the
nIRQ pin. The microcontroller will then need to read the data from the RX FIFO.
Add
R/W
08
R/W
7E
R/W
Func/
Description
D7
D6
D5
D4
D3
D2
D1
rxmpk
Reserved
enldm
ffclrrx
rxafthr[4]
rxafthr[3]
Operating & FuncReserved Reserved Reserved
tion Control 2
RX FIFO Control
Reserved Reserved rxafthr[5]
rxafthr[2] rxafthr[1]
D0
POR
Def
Reserved 00h
rxafthr[0]
37h
The RX FIFO pointers may be reset with the ffclrrx bit in "Register 08h. Operating Mode and Function Control 2".
The ffclrrx bit does not delete the data in the FIFO, it only resets the FIFO pointers. All interrupts may be enabled
by setting the Interrupt Enabled bits in "Register 05h. Interrupt Enable 1" and "Register 06h. Interrupt Enable 2,". If
the interrupts are not enabled, the function will not generate an interrupt on the nIRQ pin, but the bits will still be
read correctly in the Interrupt Status registers.
Rev. 1.0
29
Si4313-B1
6.2. Preamble Length
The preamble detection threshold determines the number of valid preamble bits the radio must receive to qualify a
valid preamble. The preamble threshold should be adjusted depending on the nature of the application. The
required preamble length threshold will depend on when receive mode is entered in relation to the start of the
transmitted packet and the length of the transmit preamble. With a shorter-than-recommended preamble detection
threshold, the probability of false detection is directly related to how long the receiver operates on noise before the
transmit preamble is received. False detection on noise may cause the actual packet to be missed. The preamble
detection threshold is programmed in register 35h. For most applications with a preamble length longer than 32
bits, the default value of 20 is recommended for the preamble detection threshold. A shorter Preamble Detection
Threshold Table 12 lists the recommended preamble detection threshold and preamble length for various modes.
Table 12. Minimum Receiver Settling Time
Approx. Receiver Settling Recommended Preamble Recommended Preamble
Time
Length with 8-bit
Length with 20-bit
Detection Threshold
Detection Threshold
(G)FSK AFC Disabled
1 byte
20 bits
32 bits
(G)FSK AFC Enabled
2 byte
28 bits
40 bits
OOK
2 byte
3 byte
4 byte
*Note: The recommended preamble length and the preamble detection threshold may be shortened when
occasional packet errors are tolerable.
6.3. Invalid Preamble Detector
When scanning channels in a frequency hopping system it is desirable to determine if a channel is valid in the
minimum amount of time. The preamble detector can output an invalid preamble detect signal. which can be used
to identify the channel as invalid. After a configurable time set in Register 60h[7:4], an invalid preamble detect
signal is asserted indicating an invalid channel. The period for evaluating the signal for invalid preamble is defined
as (inv_pre_th[3:0] x 4) x Bit Rate Period. The preamble detect and invalid preamble detect signals are available in
"Register 03h. Interrupt/Status 1" and “Register 04h. Interrupt/Status 2.”
30
Rev. 1.0
Si4313-B1
7. RX Modem Configuration
A Microsoft Excel (WDS) parameter calculator or Wireless Development Suite (WDS) calculator is provided to
determine the proper settings for the modem. The calculator can be found on http://www.silabs.com or on the CD
provided with the demo kits. An application note is available to describe how to use the calculator and to provide
advanced descriptions of the modem settings and calculations via registers 1C-25h. The modulation index is equal
to twice the peak deviation divided by the data rate (Rb).
Rev. 1.0
31
Si4313-B1
8. Auxiliary Functions
8.1. Smart Reset
The Si4313 contains an enhanced integrated SMART RESET or POR circuit. The POR circuit contains both a
classic level threshold reset as well as a slope detector, POR. This reset circuit was designed to produce a reliable
reset signal under any circumstances. Reset will be initiated if any of the following conditions occurs:
Initial power on, VDD starts from GND: reset is active till VDD reaches VRR (see table).
 When VDD decreases below VLD for any reason: reset is active till VDD reaches VRR.
 A software reset via Register 08h. "Operating Mode and Function Control 2," where reset is active for time
TSWRST.
 On the rising edge of a VDD glitch when the supply voltage exceeds the time functioned limit of Figure 10.

VDD nom.
VDD(t)
reset limit:
0.4V+t*0.2V/ms
actual VDD(t)
showing glitch
0.4V
Reset
TP
t=0,
VDD starts to rise
t
reset:
Vglitch>=0.4+t*0.2V/ms
Figure 10. POR Glitch Parameters
Table 13. POR Parameters
Parameter
Symbol
Comment
Min
Typ
Max
Unit
Release Reset Voltage
VRR
0.85
1.3
1.75
V
Power-On VDD Slope
SVDD
Tested VDD Slope Region
0.03
300
V/ms
Low VDD Limit
VLD
VLD<VRR
0.7
1.3
V
Software Reset Pulse
TSWRST
470
µs
Threshold Voltage
VTSD
0.4
V
Reference Slope
K
0.2
V/ms
VDD Glitch Reset Pulse
TP
1
50
Also occurs after SDN, and initial
power on
5
16
40
ms
The reset will initialize all registers to their default values. The reset signal is also available for output and use by
the microcontroller by using the default setting for GPIO_0. The inverted reset signal is available by default on
GPIO_1.
32
Rev. 1.0
Si4313-B1
8.2. Microcontroller Clock
The Si4313 can divide its 30 MHz clock down internally, which can then be output to the microcontroller through
GPIO2. Additionally, a 32.768 kHz clock signal can also be derived from an internal RC Oscillator or an external
32 kHz Crystal. The GPIO2 default is the microcontroller clock with a 1 MHz microcontroller clock output.
This feature is useful to lower BOM cost by using only one crystal in the system. The system clock frequency is
selectable from one of eight options listed in Table 14.
Table 14. System Clock Frequency Options
Add
0A
R/W
mclk[2:0]
Clock Frequency
000
30 MHz
001
15 MHz
010
10 MHz
011
4 MHz
100
3 MHz
101
2 MHz
110
1 MHz
111
32.768 kHz
Func/
Description
R/W Microcontroller Output Clock
D7 D6
D5
D4
D3
clkt[1]
clkt[0]
enlfc
D2
D1
D0
mclk[2] mclk[1] mclk[0]
POR
Def
06h
Except for the 32.768 kHz option, all other frequencies are derived by dividing the Crystal Oscillator frequency. The
32.768 kHz clock signal is derived from an internal RC Oscillator or an external 32 kHz Crystal, depending on
which is selected. The GPIO2 default is the microcontroller clock with a 1 MHz microcontroller clock output.
If the microcontroller clock option is being used, there may be a need for a system clock for the microcontroller
while the Si4313 is in SLEEP mode. Since the crystal oscillator is disabled in SLEEP mode in order to save current,
the low-power 32.768 kHz clock can be automatically switched to become the microcontroller clock. This feature is
called enable low frequency clock and is enabled by the enlfc bit in Register 0Ah. Microcontroller Output Clock.
When enlfc = 1 and the chip is in SLEEP mode, the 32.768 kHz clock will be provided to the microcontroller as the
system clock, regardless of the setting of mclk[2:0]. For example, if mclk[2:0] = 000, 30 MHz will be provided
through the GPIO output pin to the microcontroller as the system Clock in all IDLE or RX states. When the chip
enters SLEEP mode, the system clock will automatically switch to 32.768 kHz from the RC oscillator or 32.768
crystal.
Rev. 1.0
33
Si4313-B1
Another available feature for the microcontroller clock is the clock tail, clkt[1:0] in Register 0Ah. Microcontroller
Output Clock. If the low frequency clock feature is not enabled (enlfc = 0), the system clock to the microcontroller is
disabled in SLEEP mode. However, it may be useful to provide a few extra cycles for the microcontroller to
complete its operation prior to the shutdown of the system clock signal. Setting the clkt[1:0] field will provide
additional cycles of the system clock before it shuts off.
clkt[1:0]
Clock Frequency
00
0 cycles
01
128 cycles
10
256 cycles
11
512 cycles
If an interrupt is triggered, the microcontroller clock will remain enabled regardless of the selected mode. As soon
as the interrupt is read, the state machine will move to the selected mode. For instance, if the chip is commanded
to SLEEP mode but an interrupt has occurred, the 30 MHz crystal will be disabled until the interrupt has been
cleared.
8.3. Low Battery Detector
A low battery detector (LBD) with digital readout is integrated into the chip. A digital threshold may be programmed
into the lbdt[4:0] field in "Register 1Ah. Low Battery Detector Threshold". When the digitized battery voltage
reaches this threshold, an interrupt will be generated on the nIRQ pin to the microcontroller. The microcontroller will
then confirm the interrupt source by reading "Register 03h. Interrupt/Status 1" and "Register 04h. Interrupt/Status
2."
If the LBD is enabled while the chip is in SLEEP mode, it will automatically enable the RC oscillator, which
periodically turns on the LBD circuit to measure the battery voltage. The battery voltage may also be read out
through "Register 1Bh. Battery Voltage Level" at any time when the LBD is enabled. The low battery detect function
is enabled by setting enlbd = 1 in "Register 07h. Operating Mode and Function Control 1".
Add
R/W
Func/
Description
D7
1A
R/W
Low Battery Detector
Threshold
1B
R
Battery Voltage Level
D6
D5
D4
D3
D2
D1
lbdt[4] lbdt[3] lbdt[2] lbdt[1]
0
0
0
D0
POR Def
lbdt[0]
14h
vbat[4] vbat[3] vbat[2] vbat[1] vbat[0]
—
The LBD output is digitized by a 5-bit ADC. When the LBD function is enabled (enlbd = 1 in "Register 07h.
Operating Mode and Function Control 1"), the battery voltage may be read at any time by reading "Register 1Bh.
Battery Voltage Level". A battery voltage threshold may be programmed in “Register 1Ah. Low Battery Detector
Threshold". When the battery voltage level drops below the battery voltage threshold, an interrupt is generated on
the nIRQ pin to the microcontroller if the LBD interrupt is enabled in "Register 06h. Interrupt Enable 2". The
microcontroller will then need to verify the interrupt by reading the interrupt status register, addresses 03 and 04h.
The LSB step size for the LBD ADC is 50 mV, with the ADC range demonstrated in Table 15. If the LBD is enabled,
the LBD and ADC will automatically be enabled every 1 s for approximately 250 µs to measure the voltage which
minimizes the current consumption in Sensor mode. Before an interrupt is activated, four consecutive readings are
required.
Battery Voltage = 1.7 + 50 mV  ADC VALUE
34
Rev. 1.0
Si4313-B1
Table 15. LBD ADC Range
ADC Value
VDD Voltage [V]
0
<1.7
1
1.7–1.75
2
1.75–1.8
—
—
29
3.1–3.15
30
3.15–3.2
31
>3.2
Rev. 1.0
35
Si4313-B1
8.4. Wake-Up Timer and 32 kHz Clock Source
The chip contains an integrated wake-up timer which can be used to periodically wake the chip from SLEEP mode.
The wake-up timer runs from the internal 32.768 kHz RC Oscillator. The wake-up timer can be configured to run
when in SLEEP mode. If enwt = 1 in "Register 07h. Operating Mode and Function Control 1" when entering SLEEP
mode, the wake-up timer will count for a time specified defined in Registers 14–16h, "Wake Up Timer Period." At
the expiration of this period an interrupt will be generated on the nIRQ pin if this interrupt is enabled. The
microcontroller will then need to verify the interrupt by reading the Registers 03h–04h, "Interrupt Status 1 & 2". The
wake-up timer value may be read at any time by the wtv[15:0] read only registers 17h–18h.
The formula for calculating the Wake-Up Period is the following:
4  M  2R
ms
32 . 768
WUT 
WUT Register
Description
wtr[4:0]
R Value in Formula
wtm[15:0]
M Value in Formula
Use of the D variable in the formula is only necessary if finer resolution is required than can be achieved by using
the R value.
Add R/W Function/Description
D7
D6
D5
D4
D3
D2
D1
D0
POR Def.
wtr[4]
wtr[3]
wtr[2]
wtr[1]
wtr[0]
03h
14
R/W
Wake-Up Timer Period 1
15
R/W
Wake-Up Timer Period 2
wtm[15] wtm[14] wtm[13] wtm[12] wtm[11] wtm[10] wtm[9] wtm[8]
00h
16
R/W
Wake-Up Timer Period 3
wtm[7]
wtm[6]
wtm[5]
wtm[4]
wtm[3]
wtm[2]
wtm[1] wtm[0]
00h
17
R
Wake-Up Timer Value 1
wtv[15]
wtv[14]
wtv[13]
wtv[12]
wtv[11]
wtv[10]
wtv[9]
wtv[8]
—
18
R
Wake-Up Timer Value 2
wtv[7]
wtv[6]
wtv[5]
wtv[4]
wtv[3]
wtv[2]
wtv[1]
wtv[0]
—
There are two different methods for utilizing the wake-up timer (WUT) depending on if the WUT interrupt is enabled
in “Register 06h. Interrupt Enable 2.” If the WUT interrupt is enabled then nIRQ pin will go low when the timer
expires. The chip will also change state so that the 30 MHz XTAL is enabled so that the microcontroller clock
output is available for the microcontroller to use to process the interrupt. The other method of use is to not enable
the WUT interrupt and use the WUT GPIO setting. In this mode of operation the chip will not change state until
commanded by the microcontroller. The different modes of operating the WUT and the current consumption
impacts are demonstrated in Figure 11.
A 32 kHz XTAL may also be used for better timing accuracy. By setting the x32 ksel bit in Register 07h "Operating
& Function Control 1", GPIO0 is automatically reconfigured so that an external 32 kHz XTAL may be connected to
this pin. In this mode, the GPIO0 is extremely sensitive to parasitic capacitance, so only the XTAL should be
connected to this pin with the XTAL physically located as close to the pin as possible. Once the x32 ksel bit is set,
all internal functions such as WUT, micro-controller clock, and LDC mode will use the 32 kHz XTAL and not the
32 kHz RC oscillator.
The 32 kHz XTAL accuracy is comprised of both the XTAL parameters and the internal circuit. The XTAL accuracy
can be defined as the XTAL initial error + XTAL aging + XTAL temperature drift + detuning from the internal
oscillator circuit. The error caused by the internal circuit is typically less than 10 ppm.
36
Rev. 1.0
Si4313-B1
Interrupt Enable enwut =1 ( Reg 06h)
WUT Period
GPIOX =00001
nIRQ
SPI Interrupt
Read
Chip State
Sleep
Current
Consumption
Ready
Sleep
Ready
1.5 mA
Sleep
1.5 mA
Sleep
1.5 mA
1 uA
1 uA
Ready
1 uA
Interrupt Enable enwut =0 ( Reg 06h)
WUT Period
GPIOX =00001
nIRQ
SPI Interrupt
Read
Chip State
Sleep
Current
Consumption
1 uA
Figure 11. WUT Interrupt and WUT Operation
Rev. 1.0
37
Si4313-B1
8.5. GPIO Configuration
Three general purpose IOs (GPIOs) are available. Numerous functions such as specific interrupts, TRSW control,
microcontroller output, etc. can be routed to the GPIO pins as shown in the tables below. When in shutdown mode
all the GPIO pads are pulled low.
Note: The ADC should not be selected as an input to the GPIO in standby or sleep modes and will cause excess current consumption.
Add R/W Function/Des
cription
D7
D6
D5
D4
D3
D2
D1
D0
POR Def.
0B
R/W
GPIO0
Configuration
gpio0drv[1] gpio0drv[0]
pup0
gpio0[4] gpio0[3] gpio0[2] gpio0[1] gpio0[0]
00h
0C
R/W
GPIO1
Configuration
gpio1drv[1] gpio1drv[0]
pup1
gpio1[4] gpio1[3] gpio1[2] gpio1[1] gpio1[0]
00h
0D
R/W
GPIO2
Configuration
gpio2drv[1] gpio2drv[0]
pup2
gpio2[4] gpio2[3] gpio2[2] gpio2[1] gpio2[0]
00h
0E
R/W
I/O Port
Configuration
extitst[2]
extitst[1] extitst[0]
itsdo
dio2
dio1
dio0
00h
The GPIO settings for GPIO1 and GPIO2 are the same as for GPIO0 with the exception of the 00000 default
setting. The default settings for each GPIO are listed below:
GPIO
00000—Default Setting
GPIO0
POR
GPIO1
POR Inverted
GPIO2
Microcontroller Clock
For a complete list of the available GPIOs see “AN440: EZRadioPRO Detailed Register Descriptions”.
The GPIO drive strength may be adjusted with the gpioXdrv[1:0] bits. Setting a higher value will increase the drive
strength and current capability of the GPIO by changing the driver size. Special care should be taken in setting the
drive strength and loading on GPIO2 when the microcontroller clock is used. Excess loading or inadequate drive
may contribute to increased spurious emissions.
38
Rev. 1.0
Si4313-B1
8.6. RSSI and Clear Channel Assessment
Received signal strength indicator (RSSI) is an estimate of the signal strength in the channel to which the receiver
is tuned. The RSSI value can be read from an 8-bit register with 0.5 dB resolution per bit. Figure 12 demonstrates
the relationship between input power level and RSSI value. The absolute value of the RSSI will change slightly
depending on the modem settings. The RSSI may be read at anytime, but an incorrect error may rarely occur. The
RSSI value may be incorrect if read during the update period. The update period is approximately 10 ns every
4 Tb. For 10 kbps, this would result in a 1 in 40,000 probability that the RSSI may be read incorrectly. This
probability is extremely low, but to avoid this, one of the following options is recommended: majority polling,
reading the RSSI value within 1 Tb of the RSSI interrupt, or using the RSSI threshold described in the next
paragraph for Clear Channel Assessment (CCA).
Add R/W
Function/Description
D7
D6
D5
D4
D3
D2
D1
D0
POR Def.
26
R
Received Signal Strength Indicator
rssi[7]
rssi[6]
rssi[5]
rssi[4]
rssi[3]
rssi[2]
rssi[1]
rssi[0]
—
27
R/W
RSSI Threshold for Clear Channel Indicator
rssith[7]
rssith[6]
rssith[5]
rssith[4]
rssith[3]
rssith[2]
rssith[1]
rssith[0]
00h
For CCA, threshold is programmed into rssith[7:0] in "Register 27h. RSSI Threshold for Clear Channel Indicator."
After the RSSI is evaluated in the preamble, a decision is made if the signal strength on this channel is above or
below the threshold. If the signal strength is above the programmed threshold then the RSSI status bit, irssi, in
"Register 04h. Interrupt/Status 2" will be set to 1. The RSSI status can also be routed to a GPIO line by configuring
the GPIO configuration register to GPIOx[3:0] = 1110.
RSSI vs Input Power
250
200
RSSI
150
100
50
0
-120
-100
-80
-60
-40
-20
0
20
In Pow [dBm]
Figure 12. RSSI Value vs. Input Power
Rev. 1.0
39
Si4313-B1
9. Reference Design
Reference designs, including recommended schematics, BOM, and layouts for many common applications, are
available at www.silabs.com.
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Figure 13. Reference Test Card
10. Customer Support
Technical support for the complete family of Silicon Labs wireless products is available by accessing the wireless
section of the Silicon Labs' website at www.silabs.com/wireless. For answers to common questions please visit the
wireless Knowledge Base at www.silabs.com/support/knowledgebase.
10.1. RX LNA Matching
All that is required is a 150 pF coupling capacitor between antenna and RX input.
40
Rev. 1.0
Si4313-B1
11. Register Descriptions
Table 16. Register Descriptions
Add
R/W
Function/Desc
Data
D7
D6
D5
D4
D3
D2
D1
D0
POR
Default
01
R
Device Version
0
0
0
vc[4]
vc[3]
vc[2]
vc[1]
vc[0]
06h
02
R
Device Status
ffovfl
ffunfl
rxffem
headerr
Reserved
Reserved
cps[1]
cps[0]
—
03
R
Interrupt Status 1
ifferr
Reserved
Reserved
irxffafull
iext
Reserved
Reserved
Reserved
—
04
R
Interrupt Status 2
iswdet
ipreaval
ipreainval
irssi
iwut
ilbd
ichiprdy
ipor
—
05
R/W
Interrupt Enable 1
enfferr
Reserved
Reserved
enrxffafull
enext
Reserved
Reserved
Reserved
00h
06
R/W
Interrupt Enable 2
enswdet
enpreaval
enpreainval
enrssi
enwut
enlbd
enchiprdy
enpor
03h
07
R/W
Operating & Function Control 1
swres
enlbd
enwt
x32ksel
Reserved
rxon
pllon
xton
01h
08
R/W
Operating & Function Control 2
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
ffclrrx
Reserved
00h
09
R/W
Crystal Oscillator Load
Capacitance
xtalshft
xlc[6]
xlc[5]
xlc[4]
xlc[3]
xlc[2]
xlc[1]
xlc[0]
7Fh
0A
R/W
Microcontroller Output Clock
Reserved
Reserved
clkt[1]
clkt[0]
enlfc
mclk[2]
mclk[1]
mclk[0]
06h
0B
R/W
GPIO0 Configuration
gpio0drv[1]
gpio0drv[0]
pup0
gpio0[4]
gpio0[3]
gpio0[2]
gpio0[1]
gpio0[0]
00h
0C
R/W
GPIO1 Configuration
gpio1drv[1]
gpio1drv[0]
pup1
gpio1[4]
gpio1[3]
gpio1[2]
gpio1[1]
gpio1[0]
00h
0D
R/W
GPIO2 Configuration
gpio2drv[1]
gpio2drv[0]
pup2
gpio2[4]
gpio2[3]
gpio2[2]
gpio2[1]
gpio2[0]
00h
0E
R/W
I/O Port Configuration
Reserved
extitst[2]
extitst[1]
extitst[0]
itsdo
dio2
dio1
dio0
00h
0F
R/W
ADC Configuration
adcstart/adcdone
adcsel[2]
adcsel[1]
adcsel[0]
adcref[1]
adcref[0]
adcgain[1]
adcgain[0]
00h
10
R/W
ADC Sensor Amplifier Offset
Reserved
Reserved
Reserved
Reserved
adcoffs[3]
adcoffs[2]
adcoffs[1]
adcoffs[0]
00h
11
R
ADC Value
adc[7]
adc[6]
adc[5]
adc[4]
adc[3]
adc[2]
adc[1]
adc[0]
—
12
R/W
Temperature Sensor Control
tsrange[1]
tsrange[0]
entsoffs
entstrim
tstrim[3]
tstrim[2]
tstrim[1]
tstrim[0]
20h
13
R/W
Temperature Value Offset
tvoffs[7]
tvoffs[6]
tvoffs[5]
tvoffs[4]
tvoffs[3]
tvoffs[2]
tvoffs[1]
tvoffs[0]
00h
14
R/W
Wake-Up Timer Period 1
Reserved
Reserved
Reserved
wtr[4]
wtr[3]
wtr[2]
wtr[1]
wtr[0]
03h
15
R/W
Wake-Up Timer Period 2
wtm[15]
wtm[14]
wtm[13]
wtm[12]
wtm[11]
wtm[10]
wtm[9]
wtm[8]
00h
16
R/W
Wake-Up Timer Period 3
wtm[7]
wtm[6]
wtm[5]
wtm[4]
wtm[3]
wtm[2]
wtm[1]
wtm[0]
01h
17
R
Wake-Up Timer Value 1
wtv[15]
wtv[14]
wtv[13]
wtv[12]
wtv[11]
wtv[10]
wtv[9]
wtv[8]
—
18
R
Wake-Up Timer Value 2
wtv[7]
wtv[6]
wtv[5]
wtv[4]
wtv[3]
wtv[2]
wtv[1]
wtv[0]
—
lbdt[4]
lbdt[3]
lbdt[2]
lbdt[1]
lbdt[0]
14h
19
1A
Reserved
R/W Low Battery Detector Threshold
Reserved
Reserved
Reserved
1B
R
Battery Voltage Level
0
0
0
vbat[4]
vbat[3]
vbat[2]
vbat[1]
vbat[0]
—
1C
R/W
IF Filter Bandwidth
dwn3_bypass
ndec[2]
ndec[1]
ndec[0]
filset[3]
filset[2]
filset[1]
filset[0]
01h
1D
R/W
AFC Loop Gearshift Override
afcbd
enafc
afcgearh[2]
afcgearh[1]
afcgearh[0]
1p5 bypass
matap
ph0size
40h
1E
R/W
AFC Timing Control
swait_timer[1]
swait_timer[0]
shwait[2]
shwait[1]
shwait[0]
anwait[2]
anwait[1]
anwait[0]
0Ah
1F
R/W
Clock Recovery Gearshift
Override
Reserved
Reserved
crfast[2]
crfast[1]
crfast[0]
crslow[2]
crslow[1]
crslow[0]
03h
20
R/W
Clock Recovery Oversampling
Ratio
rxosr[7]
rxosr[6]
rxosr[5]
rxosr[4]
rxosr[3]
rxosr[2]
rxosr[1]
rxosr[0]
64h
21
R/W
Clock Recovery Offset 2
rxosr[10]
rxosr[9]
rxosr[8]
stallctrl
ncoff[19]
ncoff[18]
ncoff[17]
ncoff[16]
01h
22
R/W
Clock Recovery Offset 1
ncoff[15]
ncoff[14]
ncoff[13]
ncoff[12]
ncoff[11]
ncoff[10]
ncoff[9]
ncoff[8]
47h
23
R/W
Clock Recovery Offset 0
ncoff[7]
ncoff[6]
ncoff[5]
ncoff[4]
ncoff[3]
ncoff[2]
ncoff[1]
ncoff[0]
AEh
24
R/W
Clock Recovery Timing Loop
Gain 1
Reserved
Reserved
Reserved
rxncocomp
crgain2x
crgain[10]
crgain[9]
crgain[8]
02h
25
R/W
Clock Recovery Timing Loop
Gain 0
crgain[7]
crgain[6]
crgain[5]
crgain[4]
crgain[3]
crgain[2]
crgain[1]
crgain[0]
8Fh
26
R
Received Signal Strength Indicator
rssi[7]
rssi[6]
rssi[5]
rssi[4]
rssi[3]
rssi[2]
rssi[1]
rssi[0]
—
27
R/W
RSSI Threshold for Clear
Channel Indicator
rssith[7]
rssith[6]
rssith[5]
rssith[4]
rssith[3]
rssith[2]
rssith[1]
rssith[0]
1Eh
Rev. 1.0
41
Si4313-B1
Table 16. Register Descriptions (Continued)
Add
2A
R/W
R/W
Function/Desc
AFC Limiter
Data
D7
D6
D5
D4
D3
D2
D1
D0
Afclim[7]
Afclim[6]
Afclim[5]
Afclim[4]
Afclim[3]
Afclim[2]
Afclim[1]
Afclim[0]
POR
Default
00h
2B
R
AFC Correction Read
afc_corr[9]
afc_corr[8]
afc_corr[7]
afc_corr[6]
afc_corr[5]
afc_corr[4]
afc_corr[3]
afc_corr[2]
00h
2C
R/W
OOK Counter Value 1
afc_corr[9]
afc_corr[9]
ookfrzen
peakdeten
madeten
ookcnt[10]
ookcnt[9]
ookcnt[8]
18h
2D
R/W
OOK Counter Value 2
ookcnt[7]
ookcnt[6]
ookcnt[5]
ookcnt[4]
ookcnt[3]
ookcnt[2]
ookcnt[1]
ookcnt[0]
BCh
2E
R/W
Slicer Peak Hold
Reserved
attack[2]
attack[1]
attack[0]
decay[3]
decay[2]
decay[1]
decay[0]
26h
R/W
FIFO Configuration
fiforx
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
8Dh
2F
30
Reserved
31-34
Reserved
35
R/W
Preamble Detection Control
preath[4]
preath[3]
preath[2]
preath[1]
preath[0]
rssi_off[2]
rssi_off[1]
rssi_off[0]
2Ah
36
R/W
Sync Word 3
sync[31]
sync[30]
sync[29]
sync[28]
sync[27]
sync[26]
sync[25]
sync[24]
2Dh
37
R/W
Sync Word 2
sync[23]
sync[22]
sync[21]
sync[20]
sync[19]
sync[18]
sync[17]
sync[16]
D4h
38
R/W
Sync Word 1
sync[15]
sync[14]
sync[13]
sync[12]
sync[11]
sync[10]
sync[9]
sync[8]
00h
39
R/W
Sync Word 0
sync[7]
sync[6]
sync[5]
sync[4]
sync[3]
sync[2]
sync[1]
sync[0]
00h
R/W
ADC8 Control
Reserved
Reserved
adc8[5]
adc8[4]
adc8[3]
adc8[2]
adc8[1]
adc8[0]
10h
chfiladd[3]
chfiladd[2]
chfiladd[1]
chfiladd[0]
00h
clkhyst
enbias2x
enamp2x
bufovr
enbuf
24h
lnagain
pga3
pga2
pga1
pga0
20h
0Ch
3A-4E
4F
Reserved
50-5F
60
Reserved
R/W
Channel Filter Coefficient
Address
Inv_pre_th[3]
R/W
Crystal Oscillator/Control Test
pwst[2]
Inv_pre_th[2] Inv_pre_th[1] Inv_pre_th[0]
61
62
Reserved
pwst[1]
63-68
69
pwst[0]
Reserved
R/W
AGC Override 1
Reserved
sgi
agcen
70
R/W
Modulation Mode Control 1
Reserved
Reserved
Reserved
Reserved
manppol
enmaninv
enmanch
Reserved
71
R/W
Modulation Mode Control 2
rxclk[1]
rxclk[0]
dtmod[1]
dtmod[0]
eninv
fd[8]
modtyp[1]
modtyp[0]
00h
73
R/W
Frequency Offset 1
fo[7]
fo[6]
fo[5]
fo[4]
fo[3]
fo[2]
fo[1]
fo[0]
00h
74
R/W
Frequency Offset 2
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
fo[9]
fo[8]
00h
75
R/W
Frequency Band Select
Reserved
sbsel
hbsel
fb[4]
fb[3]
fb[2]
fb[1]
fb[0]
75h
76
R/W
Nominal Carrier Frequency 1
fc[15]
fc[14]
fc[13]
fc[12]
fc[11]
fc[10]
fc[9]
fc[8]
BBh
77
R/W
Nominal Carrier Frequency 0
fc[7]
fc[6]
fc[5]
fc[4]
fc[3]
fc[2]
fc[1]
fc[0]
80h
79
R/W
Frequency Hopping Channel
Select
fhch[7]
fhch[6]
fhch[5]
fhch[4]
fhch[3]
fhch[2]
fhch[1]
fhch[0]
00h
7A
R/W
Frequency Hopping Step Size
fhs[7]
fhs[6]
fhs[5]
fhs[4]
fhs[3]
fhs[2]
fhs[1]
fhs[0]
00h
6A-6C
Reserved
78
Reserved
7B
Reserved
7E
R/W
RX FIFO Control
Reserved
Reserved
rxafthr[5]
rxafthr[4]
rxafthr[3]
rxafthr[2]
rxafthr[1]
rxafthr[0]
37h
7F
R/W
FIFO Access
fifod[7]
fifod[6]
fifod[5]
fifod[4]
fifod[3]
fifod[2]
fifod[1]
fifod[0]
—
Note: Detailed register descriptions are available in “AN589: Si4313 Detailed Register Descriptions.”
42
Rev. 1.0
Si4313-B1
VDD 1
nSEL
nIRQ
XOUT
XIN
SDN
12. Pin Descriptions: Si4313
20 19 18 17 16
NC 2
15 SCLK
NC 3
14 SDI
GND
PAD
RX 4
13 SDO
8
9
GPIO_0
GPIO_2
10 11 NC
VDR
7
GPIO_1
12 VDD_DIG
6
NC
NC 5
Pin
Pin Name
I/O
Description
1
VDD_RF
VDD
+1.8 to +3.6 V supply voltage input to all analog +1.7 V regulators. The recommended VDD supply voltage
is +3.3 V.
2, 3
NC
—
No Connect.
4
RX
—
RV input pin to LNA. See application schematic.
5
NC
—
No Connect. Not connected internally to any circuitry.
6
NC
O
No Connect
7
GPIO_0
I/O
8
GPIO_1
I/O
I/O
General Purpose Digital I/O that may be configured through the registers to perform various functions
including: Microcontroller Clock Output, FIFO status, POR, Wake-Up timer, Low Battery Detect, etc. See
the SPI GPIO Configuration Registers, Address 0Bh, 0Ch, and 0Dh for more information.
9
GPIO_2
10
VDR
O
Regulated Output Voltage of the Digital 1.7 V Regulator. A 1 µF decoupling capacitor is required.
11
NC
—
Internally this pin is tied to the paddle of the package. This pin should be left unconnected or connected to
GND only.
12
VDD_DIG
VDD
+1.8 to +3.6 V supply voltage input to the Digital +1.7 V Regulator. The recommended VDD supply voltage
is +3.3 V.
13
SDO
O
0–VDD V digital output that provides a serial readback function of the internal control registers.
14
SDI
I
Serial Data input. 0–VDD V digital input. This pin provides the serial data stream for the 4-line serial data
bus.
15
SCLK
I
Serial Clock input. 0–VDD V digital input. This pin provides the serial data clock function for the 4-line
serial data bus. Data is clocked into the Si4313 on positive edge transitions.
16
nSEL
I
Serial Interface Select input. 0– VDD V digital input. This pin provides the Select/Enable function for the 4line serial data bus. The signal is also used to signify burst read/write mode.
17
nIRQ
O
General Microcontroller Interrupt Status output. When the Si4313 exhibits anyone of the Interrupt Events
the nIRQ pin will be set low=0. Please see the Control Logic registers section for more information on the
Interrupt Events. The Microcontroller can then determine the state of the interrupt by reading a corresponding SPI Interrupt Status Registers, Address 03h and 04h. No external resistor pull-up is required,
but it may be desirable if multiple interrupt lines are connected.
18
XOUT
O
Crystal Oscillator Output. Connect to an external 30 MHz crystal or to an external signal source.
19
XIN
I
Crystal Oscillator Input. Connect to an external 30 MHz crystal or leave floating if driving XOUT with
external signal source or TCXO.
20
SDN
I
Shutdown input pin. 0–VDD V digital input. SDN should be = 0 in all modes except Shutdown mode. When
SDN =1 the chip will be completely shutdown and the contents of the registers will be lost.
PKG
PADDLE_GND
GND
The exposed metal paddle on the bottom of the Si4313 supplies the RF and circuit ground(s) for the entire
chip. It is very important that a good solder connection is made between this exposed metal paddle and
the ground plane of the PCB underlying the Si4313.
Rev. 1.0
43
Si4313-B1
13. Ordering Information
Part Number
Description
Package Type
Operating Temperature
Si4313-B1-FM
ISM Receiver
QFN-20
Pb-free
–40 to 85 °C
*Note: Add an (R) at the end of the device part number to denote tape and reel option; 2500 quantity per reel.
44
Rev. 1.0
Si4313-B1
14. Package Outline: Si4313-B1
Figure 14 illustrates the package details for the Si4313-B1. Table 17 lists the values for the dimensions shown in
the illustration.
Figure 14. 20-Pin Quad Flat No-Lead (QFN)
Table 17. Package Dimensions
Symbol
A
A1
b
D
D2
e
E
E2
L
aaa
bbb
ccc
ddd
eee
Min
0.80
0.00
0.18
2.55
2.50
0.30
—
—
—
—
—
Millimeters
Nom
0.85
0.02
0.25
4.00 BSC
2.60
0.50 BSC
4.00 BSC
2.60
0.40
—
—
—
—
—
Max
0.90
0.05
0.30
2.65
2.70
0.50
0.10
0.10
0.08
0.10
0.10
Notes:
1. All dimensions are shown in millimeters (mm) unless otherwise noted.
2. Dimensioning and tolerancing per ANSI Y14.5M-1994.
3. This drawing conforms to the JEDEC Solid State Outline MO-220,
Variation VGGD-8.
4. Recommended card reflow profile is per the JEDEC/IPC J-STD-020C
specification for Small Body Components.
Rev. 1.0
45
Si4313-B1
15. Landing Pattern: 20-Pin QFN
Figure 15 shows the recommended landing pattern details for the Si4313-B1 in a 20-Pin QFN package. Table 18
lists the values for the dimensions shown in the illustration.
Figure 15. 20-Pin QFN Landing Pattern
46
Rev. 1.0
Si4313-B1
Table 18. PCB Land Pattern Dimensions
Symbol
Millimeters
Min
Max
C1
3.90
4.00
C2
3.90
4.00
E
0.50 REF
X1
0.20
0.30
X2
2.65
2.75
Y1
0.65
0.75
Y2
2.65
2.75
Notes:
General
1. All dimensions shown are in millimeters (mm) unless otherwise noted.
2. This land pattern design is based on IPC-7351 guidelines.
Solder Mask Design
3. All metal pads are to be non-solder mask defined (NSMD). Clearance
between the solder mask and the metal pad is to be 60 µm minimum, all
the way around the pad.
Stencil Design
4. A stainless steel, laser-cut and electro-polished stencil with trapezoidal
walls should be used to assure good solder paste release.
5. The stencil thickness should be 0.125 mm (5 mils).
6. The ratio of stencil aperture to land pad size should be 1:1 for the
perimeter pads.
7. A 2x2 array of 1.10 x 1.10 mm openings on 1.30 mm pitch should be
used for the center ground pad.
Card Assembly
8. A No-Clean, Type-3 solder paste is recommended.
9. The recommended card reflow profile is per the JEDEC/IPC J-STD-020
specification for small body components.
Rev. 1.0
47
Si4313-B1
16. Top Marking: 20-Pin QFN
Figure 16. Si4313 Top Marking
16.1. Top Mark Explanation
Mark Method:
YAG Laser
Line 1 Marking:
X = Part Number
0 = Si4313
Line 2 Marking:
R = Die Revision
B = Revision B1
TTTTT = Internal Code
Internal tracking code.
YY = Year
WW = Workweek
Assigned by the Assembly House. Corresponds to the last
significant digit of the year and workweek of the mold date.
Line 3 Marking:
48
Rev. 1.0
Si4313-B1
DOCUMENT CHANGE LIST
Revision 0.5 to Revision 1.0










Updated table in "3.2.4. Device Status" on page 21.
Updated table in "3.3. Interrupts" on page 21.
Updated "3.5.3. Auto Frequency Control (AFC)" on
page 23.
Updated "4.2. FIFO Mode" on page 25.
Updated "5.5. Digital Modem" on page 26.
Updated "6.1. RX FIFO" on page 29.
Deleted “Low Duty Cycle Mode” section.
Deleted “Application Notes and Reference Material”
section.
Updated "11. Register Descriptions" on page 41.
Updated "12. Pin Descriptions: Si4313" on page 43.
Rev. 1.0
49
Si4313-B1
CONTACT INFORMATION
Silicon Laboratories Inc.
400 West Cesar Chavez
Austin, TX 78701
Tel: 1+(512) 416-8500
Fax: 1+(512) 416-9669
Toll Free: 1+(877) 444-3032
Please visit the Silicon Labs Technical Support web page:
https://www.silabs.com/support/pages/contacttechnicalsupport.aspx
and register to submit a technical support request.
The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice.
Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from
the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features
or parameters. Silicon Laboratories reserves the right to make changes without further notice. Silicon Laboratories makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Silicon Laboratories assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. Silicon Laboratories products are not designed, intended, or authorized for use in applications intended to
support or sustain life, or for any other application in which the failure of the Silicon Laboratories product could create a situation where personal injury or death may occur. Should Buyer purchase or use Silicon Laboratories products for any such unintended or unauthorized application, Buyer shall indemnify and hold Silicon Laboratories harmless against all claims and damages.
Silicon Laboratories and Silicon Labs are trademarks of Silicon Laboratories Inc.
Other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders.
50
Rev. 1.0