SCAN16602 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE ® Outputs General Description Features The SCAN16602 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with separate output enable and latch enable control signals. The byte-wide output enable controls are complimentary to allow direction control with a single R/W line and no additional logic. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST). IEEE 1149.1 (JTAG) Compliant 2.7V to 3.6V VCC Operation TRI-STATE outputs for bus-oriented applications Dual byte-wide data for bus applications Power down high Impedance inputs and outputs Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCANH16602, SCANH162602 versions) n Optional 25Ω series resistors in outputs to minimize noise and eliminate termination resistors (SCAN162602, SCANH162602 versions) n Supports live insertion/withdrawal n Includes CLAMP and HIGHZ instructions n n n n n n Block Diagram 20051802 TRI-STATE ® is a registered trademark of National Semiconductor Corporation. © 2003 National Semiconductor Corporation DS200518 www.national.com SCAN16602 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs July 2003 SCAN16602 Pin Descriptions Pin Description Name A10-A17, A20-A27 Normal-function A-bus I/O ports. See function table for normal-mode logic. B10-B17, B20-B27 Normal-function B-bus I/O ports. See function table for normal-mode logic. CLKAB1, CLKBA1, CLKAB2, CLKBA2 Normal-function clock inputs.See function table for normal-mode logic. GND Ground VCC Supply Voltage LEAB1, LEBA1, LEAB2, LEBA2 Normal-function latch enables. See function table for normal-mode logic. OEAB1, OEBA1, OEAB2, OEBA2 Normal-function output enables. See function table for normal-mode logic. TDO The Test Data Output to support IEEE Std 1149.1-1990. TDO is the serial output for shifting data through the instruction register or selected data register. TMS The Test Mode Select input to support IEEE Std 1149.1-1990. TMS directs the device through it’s TAP controller states. An internal pull-up forces TMS high if left unconnected. TCK The Test Clock input to support IEEE Std 1149.1-1990. Test operations of the device are synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. TDI The Test Data Input to support IEEE Std 1149.1-1990. TDI is the serial input to shift data through the instruction register or the selected data register. An internal pull-up resistor forces TDI high if left unconnected. TRST The Test Reset Input to support IEEE Std 1149.1-1990. TRST is the asynchronous reset pin which will force the TAP controller to it’s initialization state when active. An internal pullup resistor forces TRST high if left unconnected. BGA Pinout 1 2 3 4 5 6 7 8 A A10 A12 A14 A16 A20 A22 A24 A26 B A11 A13 A15 A17 A21 A23 A25 A27 C TRST CLKAB1 LEAB1 OEAB1 GND CLKAB2 LEAB2 OEAB2 D TMS GND VCC GND VCC GND TDI TDO E TCK GND VCC VCC GND GND N/C VCC F CLKBA1 LEBA1 OEBA1 GND N/C CLKBA2 LEBA2 OEBA2 G B11 B13 B15 B17 B21 B23 B25 B27 H B10 B12 B14 B16 B20 B22 B24 B26 www.national.com 2 SCAN16602 Connection Diagram 20051803 Top View See NS Package Number SLC64A Truth Tables Functional Description In the normal mode, these devices are 16-bit universal bus transceivers that combine D-type latches and D-type flipflops to allow data flow in transparent, latched, or clocked modes. They can be used as two 8-bit transceivers, or as one 16-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP may affect the normal functional operation of the universal bus transceivers. When the TAP is activated, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990. Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A data is stored on a low-to-high transition of CLKAB. When OEAB is LOW, the B outputs are active. When OEAB is HIGH, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the OEBA, LEBA, and CLKBA inputs. The output enables are complimentary to facilitate the use of a single R/W signal without additional logic. Five dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), test clock (TCK), and test reset (TRST). All testing and scan operations are synchronized to the TAP interface. For details about the sequence of boundary scan cells in the SCAN16602, please refer to the BSDL (Boundary Scan Description Language) file available on our website at http:// www.national.com/scan. Function Table for A to B Data Flow Inputs Outputs OEAB LEAB CLKAB A B L L L X B0 (Note 1) L L ↑ L L H L L ↑ H L H X L L L H X H H H X X X Z Function Table for B to A Data Flow Inputs OEBA LEBA Outputs CLKBA B A A0 (Note 1) H L L X H L ↑ L L H L ↑ H H H H X L L H H X H H L X X X Z H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial (HIGH or LOW, inputs may not float) Z = High Impedance Note 1: Output level before the indicated steady-state input conditions were established. 3 www.national.com SCAN16602 Absolute Maximum Ratings Supply Voltage (VCC) Package Derating (Note 2) 16.1mW/˚C above 25˚C −0.5V to +4.6V ESD (Min) DC Input Diode Current (IIK) VI = −0.5V −50 mA Recommended Operating Conditions DC Output Diode Current (IOK) VO = −0.5V −50 mA DC Input Voltage (VI) −0.5V to 4.6V DC Output Voltage (VO) −0.5V to 4.6V Supply Voltage (VCC) SCAN16602 ± 50 mA DC Output Source/Sink Current (IO) DC VCC or Ground Current ± 100 mA Per Supply Pin Junction Temperature +150˚C Storage Temperature −65˚C to +150˚C Input Voltage (VI) 0V to 3.6V Output Voltage (VO) 0V to 3.6V Industrial −40˚C to +85˚C Note 2: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of SCAN circuits outside databook specifications. 220 ˚C Thermal Resistance BGA θJA 2.7V to 3.6V Operating Temperature (TA) Lead Temperature (Solder, 4sec) 64L BGA 2000V 62˚C/W DC Electrical Characteristics Symbol Parameter Industrial VCC (V) Min VIH Minimum High Input Voltage VIL Maximum Low Input Voltage VOH Minimum High Output Voltage All Outputs, All Options 2.7 2.0 3.6 2.0 2.7 V VOUT = 0.1V V VOUT = 0.1V or VCC −0.1V 0.8 IOUT = −100 µA 2.2 V VIN = VIL or VIH, IOH = −12mA 3.0 2.2 V VIN = VIL or VIH IOH = −24mA Minimum High Output Voltage A and B Ports: SCAN16602 and SCANH16602 options 2.7 2.2 V VIN = VIL or VIH IOH = −12mA 3.0 2.2 V VIN = VIL or VIH IOH = −24mA Minimum High Output Voltage A and B Ports: SCAN162602 and SCANH162602 options (25Ω series resistor options) 2.7 2.2 V VIN = VIL or VIH IOH = -4mA 3.0 2.2 V VIN = VIL or VIH IOH = -12mA Maximum Low Output Voltage All Outputs, All Options 2.7 V IOUT = 100 µA Maximum Low Output Voltage TDO Outputs, All Options Maximum Low Output Voltage A and B Ports: SCAN16602 and SCANH16602 Options 2.7 2.5 3.6 3.4 2.7 or VCC −0.1V V Minimum High Output Voltage TDO Outputs, All Options www.national.com Conditions Max 0.8 3.6 VOL Units TA = −40˚C to +85˚C 0.2 3.6 0.2 2.7 0.4 V VIN = VIL or VIH, IOL = 12mA 3.0 0.55 V VIN = VIL or VIH, IOL = 24mA 2.7 0.4 V VIN = VIL or VIH, IOL = 12mA 3.0 0.55 V VIN = VIL or VIH, IOL = 24mA 4 Symbol (Continued) Parameter Industrial VCC (V) Min Maximum Low Output Voltage A and B Ports: SCAN162602 and SCANH162602 Options (25Ω series resistor options) Units Conditions TA = −40˚C to +85˚C Max 2.7 0.4 V VIN = VIL or VIH, IOL = 4mA 3.0 0.6 V VIN = VIL or VIH, IOL = 12mA ± 5.0 µA VI = VCC, GND -250 µA VIN = GND ± 10.0 µA VI (OE) = VIL, VIH VI = VCC, GND VO = VCC, GND µA VI = 0.8V or 2.0V -1.5 V IIN = -18mA 0.0 ± 10.0 µA VO = VCC, GND Maximum Quiescent Supply Current 3.6 20 µA Maximum ICC Per Input 3.6 0.5 mA IIN Maximum Input Leakage Current 3.6 IILR Input Low Current 3.6 IOZ Maximum I/O Leakage Current 3.6 II(HOLD) Bus Hold Input Minimum Drive Hold Current (Note 3) 2.7 3.6 ± 500 VIKL Input Clamp Diode Voltage 2.7 IOFF Power-off Leakage Current ICC ICCt -20 ± 35 VI = 0 to 3.6V VI = VCC–0.6V Note 3: Applies to devices with Bus Hold feature only. Noise Specifications Applies to SCAN16602 and SCANH16602 options, CL = 30pF, RL = 500Ω to GND Symbol Parameter VCC (V) Industrial Units TA = 25˚C Typical Limits VOLP Quiet Output Maximum Dynamic VOL (Note 4) 3.3 1.2 V VOLV Quiet Output Minimum Dynamic VOL (Note 4) 3.3 -1.5 V VOHP Quiet Output Maximum Dynamic VOH (Note 5) 3.3 VOH + 0.9 V VOHV Quiet Output Minimum Dynamic VOH (Note 5) 3.3 VOH - 1.5 V 5 www.national.com SCAN16602 DC Electrical Characteristics SCAN16602 Noise Specifications Applies to SCAN162602 and SCANH162602 options, CL = 30pF, RL = 500Ω to GND Symbol Parameter Industrial VCC (V) Units TA = 25˚C Typical Limits VOLP Quiet Output Maximum Dynamic VOL (Note 4) 3.3 0.5 V VOLV Quiet Output Minimum Dynamic VOL (Note 4) 3.3 -0.4 V VOHP Quiet Output Maximum Dynamic VOH(Note 5) 3.3 VOH + 0.5 V VOHV Quiet Output Minimum Dynamic VOH (Note 5) 3.3 VOH - 0.5 V Note 4: Maximum number of outputs is defined as n. (n-1) outputs are switched LOW while the quiet output is monitored in a LOW (VOL) state. Also, (n-1) outputs are switched HIGH while the quiet output is monitored in a LOW (VOL) state. Note 5: Maximum number of outputs is defined as n. (n-1) outputs are switched LOW while the quiet output is monitored in a HIGH (VOH) state. Also, (n-1) outputs are switched HIGH while the quiet output is monitored in a HIGH (VOH) state. AC Electrical Characteristics Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified. Symbol Parameter SCAN16602, SCANH16602 Units CL = 30 pF RL = 500Ω to GND Min Max tPLH, Propagation Delay 5.5 tPHL A to B, B to A 5.5 tPLH, Propagation Delay 6.0 6.0 tPHL CLKAB to B, CLKBA to A tPLH, Propagation Delay 6.0 tPHL LEAB to B, LEBA to A 6.0 tPLZ, Disable Time, OEAB to B, OEBA to A 7.5 tPHZ tPZL, ns ns ns ns 7.5 Enable Time, OEAB to B, OEBA to A 7.5 tPZH ns 7.5 AC Electrical Characteristics Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified. Symbol Parameter SCAN162602 Units CL = 30 pF RL = 500Ω to GND Min Max tPLH, Propagation Delay 6.0 tPHL A to B, B to A 6.0 tPLH, Propagation Delay 6.5 tPHL CLKAB to B, CLKBA to A 6.5 tPLH, Propagation Delay 6.5 tPHL LEAB to B, LEBA to A 6.5 tPLZ, Disable Time, OEAB to B, OEBA to A 8.0 tPHZ tPZL, ns ns ns 8.0 Enable Time, OEAB to B, OEBA to A 8.0 tPZH www.national.com ns 8.0 6 ns Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified. Symbol Parameter SCANH162602 Units CL = 30 pF RL = 500Ω to GND Min Max tPLH, Propagation Delay 6.0 tPHL A to B, B to A 6.0 tPLH, Propagation Delay 6.5 6.5 tPHL CLKAB to B, CLKBA to A tPLH, Propagation Delay 6.5 tPHL LEAB to B, LEBA to A 6.5 tPLZ, Disable Time, OEAB to B, OEBA to A 8.0 tPHZ tPZL, ns ns ns ns 8.0 Enable Time, OEAB to B, OEBA to A 8.0 tPZH ns 8.0 AC Operating Requirements Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified Symbol Parameter All Options Units TA = −40˚C to +85˚C CL = 30 pF, RL = 500Ω to GND Guaranteed Minimum tS Setup Time, A to CLKAB or B to CLKBA 1.5 ns tH Hold Time, A to CLKAB or B to CLKBA 2.0 ns tS Setup Time, A to LEAB or B to LEBA 1.5 ns tH Hold Time, A to LEAB or B to LEBA 2.5 ns tW Pulse Width, CLKAB or CLKBA, high or low 2.0 ns tW Pulse Width, LEAB or LEBA high 2.0 ns fmax Maximum CLKAB or CLKBA Clock Frequency 250 MHz AC Operating Requirements can Test Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified Symbol Parameter All Options Units TA = −40˚C to +85˚C CL = 30 pF, RL = 500Ω to GND Guaranteed Minimum tS Setup Time, H or L, TMS to TCK 2.0 ns tH Hold Time, H or L, TCK to TMS 1.0 ns tS Setup Time, H or L, TDI to TCK 1.0 ns tH Hold Time, H or L, TCK to TDI 2.0 ns tW Pulse Width TCK High or Low 10 ns tW Pulse Width TRST, Low 2.5 ns fmax Maximum TCK Clock Frequency 25 MHz tREC Recovery Time, TRST to TCK 2.0 ns 7 www.national.com SCAN16602 AC Electrical Characteristics SCAN16602 Capacitance and I/O Characteristics Refer to National’s website for IBIS models at http://www.national.com/scan Device ID Register Ordering Code Features Device ID Manufacturer & LSB SCAN16602SM No bus hold, no series resistor FC30 01F SCANH16602SM With bus hold only FC31 01F SCAN162602SM With 25Ω series resistors in outputs FC32 01F SCANH162602SM With 25Ω series resistors and bus hold FC33 01F www.national.com 8 inches (millimeters) unless otherwise noted 64-Lead Ball Grid Array Package Order Number SCAN16602SM, SCANH16602SM, SCAN162602SM, SCANH162602SM NS Package Number SLC64A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Americas Customer Support Center Email: [email protected] Tel: 1-800-272-9959 www.national.com National Semiconductor Europe Customer Support Center Fax: +49 (0) 180-530 85 86 Email: [email protected] Deutsch Tel: +49 (0) 69 9508 6208 English Tel: +44 (0) 870 24 0 2171 Français Tel: +33 (0) 1 41 91 8790 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Asia Pacific Customer Support Center Email: [email protected] National Semiconductor Japan Customer Support Center Fax: 81-3-5639-7507 Email: [email protected] Tel: 81-3-5639-7560 National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications. SCAN16602 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs Physical Dimensions