MIL-S-19500/65B
19 March 1970
SUPERSEDING
MIL.S.19500/65A
19 A@
MILfTARY
SEMICONDUCTOR
1963
SPECIFICATION
DEVICE, TRANSISTOR,
NPN, GERMANIUM,
SWITCHING
TYPE 2N3BS
This
specification
partnmnk
is
and A~mcics
mundalcvy for
uc
of the Department
by all Deof Defense.
1. SCOPE
1.1 Scope.
This
specification
covers the detnil requirements
for n NPN, germanium,
low-power
switching
transistor.
1.2 PhysicaJ dimemions.
See figure 1 (TO.5)
1.3 Maximum ratingn.
fq. Al
Vcflo
VCER
VEBO
lc
Tstg
mW
,fdc
Vdc
Vdc
mAdc
“c
150
25
’20
15
200
.65 tO+100
1/ Dmate linearly 2 mW~ C for TA >25”
C.
1.4 Primary electrical chnmcteristk-x.
Limih
Cobo
VCB = 6 Vdc
lE=I)
100 kHz <f<lMHz
Min
Max
VCB = 6 Vdc
]E = 1 rnAdc
Pf
*UIIZ
..
5
60
20
2. APPLICABLE
fbfh
bf7E
VCE = 0.5 Vdc
[C= 30 mAdc
60
180
ton
k
[f
wec
psec
psec
.
.
1
0.7
0.7
DOCUMENTS
2.1 The following documents, of the issue i“ effect on date of invitation
form a part of the apecificntion to the extent specified herein.
for bids or request for proposal,
FSC 5961
I
MILS.1950W6513
SPECIFICATfON
mfsaTARY
‘WIL.S.19SO0 .%mimnd.ctor Dmiux, General Spccifimtion for.
6T4NDARD
MILfTAllY
MI L-3TD.750.
Test h%ethds for Setico.d.ctor
(Copi= of,pcificaiio.,,
Dmicc8.
stmdnr&, drawings, nnd public.tiom
required by suppliers in connection with
npecilic procurmne.1 fmwtimw sbo.ld be obtrined from the procuring wthity
off,w.
or as directed by thecontrwting
3. REQOIREMENTS
3.1 Generid. Req.iremc.tssball
3.2 Ahbrmiations.
defi. edi. MIL.S.19500,
beinmcurdmcewitb
MI L.S. f9500, andnsspccified herein.
mmbofs. .nd definitions, The abbre.i.tiom.
“
wmbo[s. nnd ddinitiom
used herein wc
3.3 Design. construction, and physical dimensions. Transislora shrill he of the design, construction, and
phyticd dimemiom shown on fig,cc 1.
3.3.1 Tennind.lcad lcng(h. Tcrmind-lmd hmgth(~) olber thm lhntspecificd in figure I rn~yhcfurnishcd
when so stipulated under ccmtrm!t o, order (w 6..? where the dmiccs covered herein wc required direclly for
partic.lax eq.ipmmt. circuit installation or for nttlom.tic.wcmbly -techniqtte programs. !Vherc other lead lengths
me required mtd prmided, il dud) not be cons{ntcd os .dvcrsdy affecting the qurdifkd.pmd.ct
device, or mpplimlde JAN mmrking.
m.t.s
of the
●1
3.4 Performance charmtwistics. Perfornmnce chnrmteristics droll b. osspecified in tables 1,0, md 01
3.5 Mmkimg. The following marking specified in MI L. S.19500
trnnskt.rm
theoplio.
mmy Ix omitted
from the body of lhe
of the mmufncturer:
(.) Country of origin.
(b) Mm. fwturcrk identilic.tion.
4. QUALITY
4.1 %npfing
specified hcmin.
ASSURANCE
and inspection. Smnplingmd
4.2 Qualificdion
LsMcs I, 0, and Of.
4.3 Quality
PROVISIONS
inspection. Qudifk.tion
ccmformmce
iqwctio.
shrill be in mcordonce with MIL.S.19300,
inspection sb.dl conskt of Ihccxnmi.atio.s
inspection. Q.dity
conformance iq.xtion
md us
andtatsspcificdin
sbnll consist oigrcmp
A, B,md
C
~FctiO~.
4.3,1 Croup A impaction. Gro.p Ahspcctio.
shdlco&t
oftbeex.mination~
.ndtab8pcified
I
int&lel.
2
●
MffS-19500/63B
4.3.2 croup B impeclicm. Gro.p B inspection &O comist of the examinations md tcsti.spwificd in talde.fL
4.3,3 (kwp C inspection. Group C insp.mtion shafl consist of the exnrnimmions and tests sp-wifiti
flf. Tkis inspection shalt be ccmducted on the initial lot andthercaftm every 6 month, d.rimgpmductic,m
.4i3A
Gm.p
“B and .gmtip
C .tif..te$l .uamplu, ‘Snn@es out k..
in tile
.kem subjciled .to group tB, S40.houm
!ifm!tmt,rnmyfbe ctiuuf
m tit.
1,000 hours in order to eatisfy group C fife. test requiremmib. l’twx. enmpk
sfmfl bepredesignated. and sfudl remain subjected to ttm group C 1,000.ho.r .cccptancc cml.otio. after they have
~d
the grcmp B, 340.hour acccptm,cc mitmia. The cummlzdivetold of failures fc,und during S40.hmn test r,nd
during the subwqucnt intend
up to 1,000 hours shall be computed for 1.000:hour accept.mce criteria.
4A Merhub of mnminnb‘m nnd ten. Msth.ds of exnmin.tion rindtest nhdf be as specified i“ tsbles i, 11,
and m.
5. PREPAR,4’TSON FOR DEWVERY
5.1 %. hUL.S.19500,
wction 5.
6. NOTt?.5
specified in MI L.S.19500 we spplicahlc to lhis specification
6.1 Notes. I%. “.tes
6.2 Ordering datn. Procurement docume.k
~ified
should specify the following
6.3 Changes from prmious iwe.
&terista
length if other thm
me mt .wd in lhis re,ision to identify chmges with rcs~ct to
the prmious ismm,due to tie extensiwxtcss of the dumges.
,0
I
.3
●
Twminnl.lmd
in figure 1 (mc 3.3.1),
L---
MfL-S-19W0/65B
TADLS L Crow A in,mction
—
—
—
MIL-STD-750
Exmmiw.t!on .,
Limits
,.,,
Srmb.al
—
Subglwup I
Visual md meJmniml em fin,tion
Bmakdmm vdqc,
tin
m..
—
unit
—
10
—
2071
2
Subgwp
—
.’rm
Detail,
5
3m11
WdLxtm to k
Km .-d.
D,
BVCD(
?s
Vd.
BV ~B[
15
Vd.
Bvc.,
20
Vd.
[c= 10 ,Ade
Bmnkdmim vmlt~ ,
CIlitfcr to k
3026
Bmtkdmm WIW.
3011
Bias.xmd. D,
lE = 10 jtAd.
CC4kctm ,0 .dtir
Fornrdumcn
Forward-.(
t trm,fer rado
3076
VCE = 0.75 Vdc; lC = 20o m,\dc
‘FE
30
tmmfm r,tio
3076
\tcE = 0.5 Vd.: ~ = 30 imAd.
‘FE
60
3E(=t)
Bnt.etitlcr
vc.fq
(mturaizd)
3C66
Tea: c,md. A, 1~ = 200 mAdc,
lB=l Orr,Adc
BM.xmitter
mlt~
(Wuratcd)
3W16
rat mmd, A: ~=
ID= 4.niAde
100 mAdq
1.5
Td.
).8
Vd.
1
x-x
5
Subgroup 3
stitdling
180
par.rmlc.:
—
Turn-an timz
32.51
b!
Storlgc tinlc
3251
4
1.7
“xc
Fall dm
3’251
[I
),7
P*C
Subpup
10
4
3061
%.! ,md. 0, V ~B = 1 \,dc
lEBO
5
,Adc
GdLWt.r to bnw cutoff -“1
3036
Kim omd, D, V~B = 1 \rd.
4x0
5
, Ad=
Smdl+d
dwt.artit
forward-n
t ti,fer-,,tio
cutoff frequcnq
3301
VCB= 6 Vd<lE=
‘hfb
OF
3236
Emitter to h
rir~t
cutoff CUncnt
O.lPU1 ~Pri~=
1 mAdc
5
%60
io
h!llz
10
0[
—
TA3LE fl. cm.p
B in+mvtion
tslL-sTD-750
Emmimtim
Liml ,,
or t..t
LTPD
Ik,thcd
D-toil.
S“mb.al
Subgmwp 1
S%ydcal &xtiau
lo”
M..
Unit
2D
2W6
.
(*. !@m 1)
—..—.——.
—.. —.—
4
..
.
. .——.
.—
___
-
6ULS195W.55B
TA3LE U.
Croup B impa:wn
Con,ir
—
Limits
MIL-STD-750
Emmimtio.
a
t..t
—
LWD
D.t.il.
Iki.
—
Subgroup
1051
chock
Cycfhg)
Chwk
Hemwtfc
Mtitum
unit
—
2026
(ternpr.tlm
‘lllcrmal
MO.
—
10
2
sdiemhw~
llwmaf
—
(g!ml
,kuin)
seal
.
—
1056
1071
dtmce
Test c-d, B, exql
T ~x = 10I7 +0”, -5°C, 1 cydc
—
Tat mmd.G m !1 for fin, lkakm,
lea, cad. A, C, D O, F {o,
Ie?lb
XIV’
1021
.
—
—
.tm
i=,
End pointi
Emit&r to law akoff -111
3WJI
Em mmd. D: VGB = 15 \<d.
lEBO
C&cIO,
km
,0 k
cutoff aim”,
3036
Du cad.
Forwanf..mr.”t
Irlndf.r ratio
3076
\,cE = 0.75 VifG Ic = 200 mAdc
Subpmp
Calmult
hFE
30
—
—
vA<
10
uAd
10
3
Shack
2016
Vibretion, tide
0, VCB = 25 \<de
10
fmqucncy
❑cmk,.lio,l
Nonuymting, 500 G. 1 nwx;
5610na in .xh mi.mlmi.m:
F.,. Y,. Y2md Z,
2056
2006
—
10.000 Gin CA otimlatim:
X,, Y,, Y2and Z,
End P&b,
(km
m mll,go”fl 2)
Subgroup
TmniIId
,imngfh
10
4
(lead
fatigue)
2036
lb:
1071
Tcnicmd. G O, H for rne kokm
test cad A, C. D m Ffor
pm 1.*
m.d.
E
Fnd prnnh:
Hermetic
seal
Subgrw.n
tid ptinb:
(sum . al&Oup
●
20
.5
Slt.tmo+m (ramicm)
2)
—
1o11
,,.7
,Irn
/=.
~,L5.19sgm3Lf
TABLS
ES Group
B L+@ion
Continued
—
UIL-STD-750
@mtmtl.m
or I*S*
.TPfI
D,,nlls
Whr,d
—
.hbpup
7
6
U(.
1032
cutoff -.1
3061
Lh
[email protected]
1
y
Limifs
—
—
k’
—
unit
—
1ma
15
,Adc
lCBO
20
pAdc
Min
—
●
QwJmtinl)
Smd ptila,
Emitter to h
eond. D, VEB= 15 \,dc
Callector ,. b=
m loff CUrrcnf
3036
Dim cad.
Forwsrd.amcnt
tiansfm ratio
3076
\rcE = 0.75 Vd., lC = Xll mAdc
B=25 Vd.
7
Subgroup
Stcldy.mte
D: I,c
‘FE
7
ofmmtio” tifc
1027
\,cB =25 \,d.,
PT= 150 mW, tine = SSObmm
(we .4,3..s)
Fnd pints:
(Same m ,ubwup
6)
I
I
TAflLE UI. Group C inspmtkm
—
Exominoti.n
Subgroup
S,mbol
—
Mi”
—
—
—
—
Max
—
1
[email protected]~rHhmIi(c
1031
(.-.wd.d.d
Tw=““””c @““.$,”)
unit
—
o
.-
Fad poinw
(Sarm u subgroup 6 of
group U)
Sub~oup
I
I
w I*SI
Whod
—
Limi,s
MIL-STD-7WI
(
Slc.dy.mc
Opmio.
2
Iifc
1026
Fad pan&
(Sam m subgroup 6 of
youp B)
6
●
MIL.S.19500{63B
h
SEATING
PLANE
,
D?A
!,
— ‘-
G
H
MAX
0
NOTES:
1.
2.
3.
4.
5.
6.
Metric equivalents (to the nearest .01 mm) are given. for general in formdion crdy and are based upon 1 inch .25.4 mm.
Measured in the zoce beyond .250 (6.35 mm) from the seating Diane.
hkasured in the zone .050 (1.27 mm) and :250 (6.35 mm) from the seating plane.
Variations on dimension B in this zone shall not exceed .010 (.25 mx).
Outline in this zone is not controlled.
When measured in a gaging Diane .054 +.001, -.000 (1.37 +.03, -.03 mm) below the seating plane of lhe hansislor
maximum diameter leads s?ali be within .007 (.11 mm),of Cleil hue kcafiofl relative to a maximum width tab. .%!aller
diarceiet leads shall Ian within the outliae 3! Ihe maximum dicmeter lead tolerance. Figure 2jpreferred measured
method.
7.
The base shall be electrically connected to .&e case.
8. Measured horn the maximum diameler of ihe actual device.
9. All 3 leads.
FSCURE 1. Physical dimensions
●
of transistor
7
typ e 2N388
(TO-5).
‘AGEOuTL’NE~
OPTIONAL
L
!
I 1
1
I
AGE
LANE
J
NOTES:
1. The following
gaging procedure shall be used: The use of
a pin shaigh{ener p!ior (o inselfion in ihc gage k Permi>
sible. The device being masured shall be inserted until
ils seafine Dl,me is .125i.010 [3.18:.25 mm) from the seal.
ing surfa<e’of the gage. A spacer may be used 10 obtain
Ihe .125 (3.18 mm) distance from the gage sml prior 10 force
application.
A force Of 8 oz +.0s QZ shall then be aPQlied
parallel and symmetrical 10 the device’s cylitirical
axis.
When examimd visuslly aflel OIe force application (Ihe
force need not be remwed) the seating plane of the device
shall be sealed against lh? gage.
2. The location of the lab locator, wilhin the limits of dim C,
will be determined by Ihe lab and Ilange dimension of the
device being ckcked.
!. Mehic equivalents (10 the nearest .01 mm) are given for
general in forimlion only and are based upon I inch= ?.5.4mm.
FIGURE 2.
Gage for lead and tab location for transistor
8
type 2N388.
UIL-S-19500165B
SCOPE TEKTRONIX
514AD
wITH PI?T3EE CR EQuIVALENT
—
loon
ID V
20 v
10 v
-J-_
FCGURE3.
switching time test circuit.
Custcdam:
Army
EL
Nwy
EC
Agcn 1:
Air Force .85
DSA
Review ..tivities:
ES
(Project 5961 -0160)
Mu, Ml
Navy S11
Amy
Air Forcc. 11,17
DSA ES
user .3Ctivities
Army SM
Nnvy CC, MC, OS, AS
AI Force. 13, 15.19,70,80
.-—
9